JPH08153666A - Organic material remover - Google Patents

Organic material remover

Info

Publication number
JPH08153666A
JPH08153666A JP29620794A JP29620794A JPH08153666A JP H08153666 A JPH08153666 A JP H08153666A JP 29620794 A JP29620794 A JP 29620794A JP 29620794 A JP29620794 A JP 29620794A JP H08153666 A JPH08153666 A JP H08153666A
Authority
JP
Japan
Prior art keywords
cassette
wafer
treatment
robot
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29620794A
Other languages
Japanese (ja)
Inventor
Akiisa Inada
暁勇 稲田
Sumio Yamaguchi
純男 山口
Masao Kako
雅郎 加来
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP29620794A priority Critical patent/JPH08153666A/en
Publication of JPH08153666A publication Critical patent/JPH08153666A/en
Pending legal-status Critical Current

Links

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE: To secure the same functions and performance as the prior art without requiring a transfer stage in one robot by a method wherein a treatment chamber and a cassette are vertically and opposingly arranged and the robot is arranged therebetween. CONSTITUTION: Treatment chambers 1, 1, are provided with means for heating a wafer and means for introducing ozone gas. A robot 2 has three degrees of freedom: namely a vertical direction, a rotation, and a front and back direction, and vacuum-chucks a wafer to carry between a cassette and a treatment chamber. A process is started from a cassette 3, and a wafer is entered into the treatment chambers 1, 1', and ozone gas is flown thereinto to perform a resist remove process. The wafer over with treatment is received in the same slot of the cassette 3. These are repeated, and when all wafers in the cassette 3 are over with treatment, a treatment of a cassette 3' is next started. Meanwhile, the cassette 3 is changed over and a new cassette having an untreated wafer is arranged in a location of the cassette 3 located previously.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体製造装置に係り、
特に、ウェハ上の有機物的汚染の洗浄や、レジスト除去
に利用可能な有機物除去装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus,
In particular, the present invention relates to an organic substance removing device that can be used for cleaning organic contaminants on a wafer and removing a resist.

【0002】[0002]

【従来の技術】半導体製造装置のスループットを高くす
るため、処理室数を複数とし、それら処理室を平面上に
配置していた。従来例を図1に示す。
2. Description of the Related Art In order to increase the throughput of a semiconductor manufacturing apparatus, the number of processing chambers is plural and the processing chambers are arranged on a plane. A conventional example is shown in FIG.

【0003】図1において1,1′は処理室、2,2′
はウェハ搬送ロボット、3,3′はウェハ収納カセッ
ト、4は受け渡しステージである。カセット3,3′に
はウェハが例えば25枚ずつ収納されており、収納され
ているウェハから順次ロボット2,2′により処理室
1,1′へ入れられて有機物除去処理が行われる。ステ
ージ4は処理室1′へウェハを入れる時にロボット2か
らロボット2′への引き渡し時に使用される。カセット
3内のウェハの処理が終了した後、カセット3′内のウ
ェハに対して同様の処理が行われる。またこの間に処理
を終了したカセット3は取替えられ、カセット3′の処
理を終了した後、再びカセット3の処理を行うことによ
り、処理を継続することが出来る。
In FIG. 1, 1, 1'is a processing chamber and 2, 2 '
Is a wafer transfer robot, 3 and 3'is a wafer storage cassette, and 4 is a delivery stage. For example, 25 wafers are stored in each of the cassettes 3 and 3 ′, and the stored wafers are sequentially put into the processing chambers 1 and 1 ′ by the robots 2 and 2 ′ to perform the organic substance removal processing. The stage 4 is used when the wafer is transferred from the robot 2 to the robot 2'when the wafer is put into the processing chamber 1 '. After the processing of the wafers in the cassette 3 is completed, the same processing is performed on the wafers in the cassette 3 '. Further, the cassette 3 which has been processed during this period is replaced, and after the processing of the cassette 3'is completed, the processing of the cassette 3 is performed again, so that the processing can be continued.

【0004】この様な従来技術において、高いスループ
ットが得られる。
In such a conventional technique, high throughput can be obtained.

【0005】[0005]

【発明が解決しようとする課題】しかし、従来技術では
処理室やカセットを平面上に配置しておりまたロボット
を2台使用し、受け渡しステージをも必要としているた
め、装置の面積が大きくなってしまい、且つ高価になる
という欠点があった。
However, in the prior art, since the processing chamber and the cassette are arranged on a plane, two robots are used, and a transfer stage is also required, the area of the apparatus becomes large. There is a drawback that it is expensive and expensive.

【0006】本発明の目的はこれらの欠点を解決するこ
とにある。
The object of the present invention is to overcome these drawbacks.

【0007】[0007]

【課題を解決するための手段】図2は本発明の一実施例
の有機物除去装置を示し、(a)は正面図、(b)は側
面図である。
2A and 2B show an organic substance removing apparatus according to an embodiment of the present invention, wherein FIG. 2A is a front view and FIG. 2B is a side view.

【0008】図2において処理室1,1′及びカセット
3,3′は垂直方向に配置され、ロボット2はこれら処
理室及びカセットの間に設置されている。
In FIG. 2, the processing chambers 1 and 1'and the cassettes 3 and 3'are vertically arranged, and the robot 2 is installed between these processing chambers and cassettes.

【0009】ロボット2は垂直,回転,前後の三自由度
を持っておりカセットと処理室の間でウェハを搬送す
る。
The robot 2 has three degrees of freedom in vertical, rotation, and front / rear directions, and transfers a wafer between the cassette and the processing chamber.

【0010】[0010]

【作用】処理室及びカセットを垂直方向に並べ、且つ対
向させ、この間にロボットを設置することにより、ロボ
ット1台で且つ受け渡しステージを必要とすることなく
従来と同様の機能,性能を確保することができる。
By aligning the processing chamber and the cassette in the vertical direction and facing each other, and installing the robot between them, it is possible to secure the same function and performance as the conventional one robot without needing a transfer stage. You can

【0011】[0011]

【実施例】本発明の一実施例を図2により説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIG.

【0012】図2において処理室1,1′にはウェハを
加熱する手段とオゾンガスを導入する手段を備えてい
る。ロボット2は垂直,回転,前後の三自由度を持って
おり、ウェハを真空吸着してカセットと処理室間で搬送
する。カセット3,3′はウェハを例えば25枚収納す
ることが出来る。カセット3から処理を開始し、ウェハ
を処理室1,1′に入れて300℃に加熱し、5%のオ
ゾンガスを流入してレジスト除去処理をする。ウェハ1
枚当たり1分で処理を終了し、処理終了後のウェハはカ
セット3の同一スロットに収納される。これを繰返し、
カセット3内のウェハ全ての処理が完了すると、次にカ
セット3′の処理を開始する。この間にカセット3を取
替え未処理ウェハが入った新しいカセットが先ほどのカ
セット3の位置に設置される。この様にして連続してレ
ジスト除去処理を行う。
In FIG. 2, processing chambers 1 and 1'have means for heating the wafer and means for introducing ozone gas. The robot 2 has three degrees of freedom: vertical, rotating, and front / rear, and vacuum sucks a wafer to transfer it between the cassette and the processing chamber. The cassettes 3 and 3'can store, for example, 25 wafers. The process is started from the cassette 3, the wafer is placed in the process chambers 1 and 1 ', heated to 300 ° C., and 5% ozone gas is introduced to perform the resist removal process. Wafer 1
The processing is completed in 1 minute per wafer, and the wafers after the processing are stored in the same slot of the cassette 3. Repeat this,
When the processing of all the wafers in the cassette 3 is completed, the processing of the cassette 3'is started next. During this time, the cassette 3 is replaced and a new cassette containing unprocessed wafers is installed at the position of the previous cassette 3. In this way, the resist removing process is continuously performed.

【0013】ロボット2を垂直方向に動く台の上に設置
し、ロボットが垂直方向にその腕を伸ばすときにこの台
も同方向に動くことにより腕の移動速度を速くすること
はスループットの向上に効果がある。
The robot 2 is installed on a vertically movable table, and when the robot extends its arm in the vertical direction, this table also moves in the same direction to increase the moving speed of the arm, thereby improving the throughput. effective.

【0014】[0014]

【発明の効果】本発明によれば従来の約半分の装置面積
とすることが出来る。またロボットが1台で且つ受け渡
しステージを必要としないで従来と同等の性能を得られ
る。
According to the present invention, the device area can be reduced to about half that of the conventional device. Further, the same performance as the conventional one can be obtained without the need of a transfer stage with only one robot.

【図面の簡単な説明】[Brief description of drawings]

【図1】従来技術の装置の説明図。FIG. 1 is an illustration of a prior art device.

【図2】本発明の装置の説明図。FIG. 2 is an explanatory diagram of a device of the present invention.

【符号の説明】[Explanation of symbols]

1,1′…処理室、2,2′…ロボット、3,3′…カ
セット、4…受け渡しステージ、5…ロボット移動台。
1, 1 '... processing chamber, 2, 2' ... robot, 3, 3 '... cassette, 4 ... transfer stage, 5 ... robot moving base.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】複数の処理室を垂直方向に並べ、処理室数
と同数の被処理物収納容器を垂直方向に並べ、前記処理
室と対向する位置に設置し、前記処理室と前記被処理物
収納容器との間に被処理物を搬送する機構を設置したこ
とを特徴とする有機物除去装置。
1. A plurality of processing chambers are arranged in a vertical direction, and the same number of processing object storage containers as the number of processing chambers are arranged in a vertical direction, and the processing chambers and the processing objects are installed in a position facing the processing chambers. An organic substance removing device, characterized in that a mechanism for transporting an object to be treated is installed between the substance storing container.
【請求項2】請求項1において、前記被処理物搬送機構
が垂直,回転,前後の三自由度を有し、前記被処理物搬
送機構を載置した台が垂直方向に動く有機物除去装置。
2. The organic substance removing device according to claim 1, wherein the workpiece transport mechanism has three degrees of freedom in vertical, rotation, and front / rear directions, and a table on which the workpiece transport mechanism is mounted moves vertically.
JP29620794A 1994-11-30 1994-11-30 Organic material remover Pending JPH08153666A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29620794A JPH08153666A (en) 1994-11-30 1994-11-30 Organic material remover

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29620794A JPH08153666A (en) 1994-11-30 1994-11-30 Organic material remover

Publications (1)

Publication Number Publication Date
JPH08153666A true JPH08153666A (en) 1996-06-11

Family

ID=17830564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29620794A Pending JPH08153666A (en) 1994-11-30 1994-11-30 Organic material remover

Country Status (1)

Country Link
JP (1) JPH08153666A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100651018B1 (en) * 2004-03-10 2006-11-29 다이니폰 스크린 세이조우 가부시키가이샤 Apparatus and method for removing organic contamination adsorbed onto substrate, and apparatus and method for measuring thickness of thin film formed on substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100651018B1 (en) * 2004-03-10 2006-11-29 다이니폰 스크린 세이조우 가부시키가이샤 Apparatus and method for removing organic contamination adsorbed onto substrate, and apparatus and method for measuring thickness of thin film formed on substrate

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