JPH08102283A - Quadrupole mass filter - Google Patents
Quadrupole mass filterInfo
- Publication number
- JPH08102283A JPH08102283A JP6261695A JP26169594A JPH08102283A JP H08102283 A JPH08102283 A JP H08102283A JP 6261695 A JP6261695 A JP 6261695A JP 26169594 A JP26169594 A JP 26169594A JP H08102283 A JPH08102283 A JP H08102283A
- Authority
- JP
- Japan
- Prior art keywords
- quadrupole
- voltage
- current component
- voltage generating
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、薬品、食品、環境物質
等の分析に用いられる四重極質量分析装置に備えられる
四重極質量フィルタに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a quadrupole mass filter provided in a quadrupole mass spectrometer used for analyzing chemicals, foods, environmental substances and the like.
【0002】[0002]
【従来の技術】四重極質量フィルタには図3に示すよう
に、z軸を中心に回転対称的にかつ互いに平行配置され
た4本の電極棒11、12、13、14から構成される
四重極10が備えられている。四重極10では、x軸方
向に配置された2本の電極棒12、14を1対とし、y
軸方向に配置された2本の電極棒11、13を他の1対
として、これら両電極対(12、14)、(11、1
3)の間に直流電圧Uと高周波電圧V・cos(ω・t)の重
畳電圧を印加する。四重極10の中心軸であるz軸の一
方の端部から各種イオンを入射させると、一般に、イオ
ンはこの電圧により形成される振動電場により四重極1
0の外に発散する。しかし、直流電圧U及び交流電圧V
がイオンの質量/電荷数(m/z)によって定まる所定
の関係にあるときは、その質量/電荷数を有するイオン
のみは安定的に振動してz軸の他方の端部から出射する
ことができる。従って、四重極10の出口にイオン検出
器を配置しておき、四重極10への印加電圧を適当に設
定することにより、目的の質量のイオンのみを通過させ
る質量フィルタを構成することができる。イオンが四重
極10を通過することのできるU、Vの領域は図4に示
すように略三角形となっており、m/z=M1、M2、M
3と変化するにつれて安定領域は図のように移動するた
め、U及びVを線Lのように変化させることにより、質
量フィルタを通過するイオンを走査することができる。2. Description of the Related Art As shown in FIG. 3, a quadrupole mass filter is composed of four electrode rods 11, 12, 13, 14 arranged rotationally symmetrically about the z-axis and parallel to each other. A quadrupole 10 is provided. In the quadrupole 10, two electrode rods 12 and 14 arranged in the x-axis direction form a pair, and y
The two electrode rods 11 and 13 arranged in the axial direction are regarded as another pair, and these two electrode pairs (12, 14), (11, 1
During 3), the superimposed voltage of the DC voltage U and the high frequency voltage V · cos (ω · t) is applied. When various ions are made incident from one end of the z-axis which is the central axis of the quadrupole 10, the ions are generally caused by an oscillating electric field formed by this voltage.
Divergence out of 0. However, DC voltage U and AC voltage V
Is in a predetermined relationship determined by the mass / charge number (m / z) of ions, only ions having that mass / charge number can oscillate stably and be emitted from the other end of the z-axis. it can. Therefore, by disposing an ion detector at the exit of the quadrupole 10 and appropriately setting the applied voltage to the quadrupole 10, it is possible to configure a mass filter that allows only ions of the target mass to pass. it can. Regions of U and V where ions can pass through the quadrupole 10 are substantially triangular as shown in FIG. 4, and m / z = M1, M2, M
Since the stable region moves as shown in the figure as it changes to 3, it is possible to scan the ions passing through the mass filter by changing U and V as shown by the line L.
【0003】図3(a)に、四重極10の各電極棒11
〜14へのDC/AC重畳電圧の生成回路の具体例を示
す。この例では、直流電圧Uを生成する回路(DC)3
1及び高周波電圧V・cos(ω・t)を生成する回路(H
F)32の他に、HF32とは異なる周波数の小振幅の
交流電圧(摂動電圧)Vaを付加的に印加する摂動電圧
印加回路33が設けられている。この摂動電圧を印加す
ることにより、質量分析の分解能が向上するという効果
が得られる(詳細は特開平4−218251号公報参
照)が、この摂動電圧の付与回路は必須ではなく、これ
を省略することも可能である。なお、図3(a)の回路
を簡略化して図3(b)のように表わす。FIG. 3A shows each electrode rod 11 of the quadrupole 10.
Specific examples of a DC / AC superposed voltage generation circuit for signals # 14 to # 14 are shown below. In this example, the circuit (DC) 3 that generates the DC voltage U
1 and a circuit (H that generates high frequency voltage V · cos (ω · t))
In addition to F) 32, a perturbation voltage application circuit 33 for additionally applying an AC voltage (perturbation voltage) Va of a small amplitude having a frequency different from that of the HF 32 is provided. By applying this perturbation voltage, the effect of improving the resolution of mass spectrometry can be obtained (for details, see Japanese Patent Laid-Open No. 4-218251), but this perturbation voltage application circuit is not essential and is omitted. It is also possible. The circuit of FIG. 3 (a) is simplified and expressed as shown in FIG. 3 (b).
【0004】[0004]
【発明が解決しようとする課題】四重極10の各電極棒
11〜14の寸法は厳密に同一であり、それら相互の位
置関係は厳密に回転対称かつ平行であることが望ましい
が、実際にはそのような組み立てを行なうことは困難で
ある。また、4本の電極棒11〜14は1対のセラミッ
ク製ホルダにより固定されるが、これら電極棒11〜1
4に上記高周波(約1MHz)が印加されると、セラミ
ック製のホルダに誘電損が生じ、熱が発生する。この熱
のためにホルダが膨張したり歪んだりすることによって
も電極棒11〜14の位置関係は変化する。It is desirable that the dimensions of the electrode rods 11 to 14 of the quadrupole 10 are exactly the same, and that the positional relationship between them is strictly rotationally symmetric and parallel to each other. Is difficult to make such an assembly. Further, the four electrode rods 11 to 14 are fixed by a pair of ceramic holders.
When the above high frequency (about 1 MHz) is applied to 4, dielectric loss occurs in the ceramic holder and heat is generated. The positional relationship between the electrode rods 11 to 14 also changes when the holder expands or distorts due to this heat.
【0005】従来の四重極フィルタではこのような場
合、主に交流成分の波高値Vを変化させることにより調
整を行なっていたが、四重極の加工誤差や組立誤差等は
必ずしも十分に補償されず、質量分解能が低下したり感
度が低下する等の問題があった。In such a case, the conventional quadrupole filter mainly adjusts by changing the peak value V of the AC component, but the quadrupole processing error, the assembly error, etc. are not always sufficiently compensated. However, there was a problem that the mass resolution was lowered and the sensitivity was lowered.
【0006】本発明はこのような課題を解決するために
成されたものであり、その目的とするところは、組立誤
差等をより自由にかつ十分に補償することができる四重
極フィルタを提供することにある。The present invention has been made to solve the above problems, and an object of the present invention is to provide a quadrupole filter capable of more freely and sufficiently compensating for assembly errors and the like. To do.
【0007】[0007]
【課題を解決するための手段】上記課題を解決するため
に成された本発明は、中心軸の回りの回転対称位置に4
本の電極棒が中心軸に平行に配置されて成り、中心軸を
挟んで対向する2本の電極と他の2本の電極との間に直
流電圧と交流電圧の重畳電圧を印加することにより所定
の質量を有するイオンのみを通過させる四重極質量フィ
ルタにおいて、4本の各電極棒毎に該重畳電圧を生成す
る回路を設けたことを特徴としている。SUMMARY OF THE INVENTION The present invention, which has been made to solve the above-mentioned problems, has a structure in which a rotationally symmetric position about a central axis is set to 4
Two electrode rods are arranged parallel to the central axis, and by applying a superimposed voltage of DC voltage and AC voltage between two electrodes facing each other across the central axis and the other two electrodes. A quadrupole mass filter that allows only ions having a predetermined mass to pass is characterized in that a circuit for generating the superimposed voltage is provided for each of the four electrode rods.
【0008】[0008]
【作用】各電極棒毎に電圧生成回路が設けられているた
め、各電極毎に直流成分の強度と交流成分の強度の比や
交流成分の周波数、波高等を変化させたり、電極間に位
相差を設けたりすることができる。これら多くのパラメ
ータを適宜変化させることにより、従来よりも広範囲に
四重極の調整を行なうことができ、組立誤差等をより細
かくかつ最適に補償することができるようになる。ま
た、各電極棒毎にこれらのパラメータを変化させつつ通
過イオンを検出することにより、試料の成分や構造に関
して従来よりも広範囲の知見を得ることができるように
なる。[Function] Since a voltage generation circuit is provided for each electrode rod, the ratio of the intensity of the DC component to the intensity of the AC component, the frequency of the AC component, the wave height, etc. can be changed for each electrode, A phase difference can be provided. By appropriately changing many of these parameters, the quadrupole can be adjusted in a wider range than in the past, and the assembling error can be finely and optimally compensated. Further, by detecting passing ions while changing these parameters for each electrode rod, it becomes possible to obtain a wider range of knowledge regarding the components and structure of the sample than in the past.
【0009】なお、本発明に係る四重極フィルタは、四
重極フィルタを1段のみ備えた通常の四重極質量分析装
置の他、前段と後段に四重極フィルタを有するMS/M
S質量分析装置にも使用することができる。The quadrupole filter according to the present invention is an MS / M having a quadrupole filter in the front and rear stages in addition to a normal quadrupole mass spectrometer having only one quadrupole filter.
It can also be used in an S mass spectrometer.
【0010】[0010]
【実施例】本発明の一実施例である四重極フィルタを図
1に示す。本四重極フィルタでは、四重極10を構成す
る各電極棒11〜14に対してそれぞれ1個の電圧生成
回路A〜D(15〜18)が備えられている。各電圧生
成回路15〜18は従来の四重極フィルタに備えられて
いたものと同様のものを使用する。例えば図3(a)に
示したように摂動回路を備えたものの他、上記のように
それを備えないものであってもよい。FIG. 1 shows a quadrupole filter which is an embodiment of the present invention. In this quadrupole filter, one voltage generation circuit A to D (15 to 18) is provided for each of the electrode rods 11 to 14 forming the quadrupole 10. Each of the voltage generating circuits 15 to 18 is the same as that provided in the conventional quadrupole filter. For example, in addition to the one provided with the perturbation circuit as shown in FIG. 3A, it may not be provided with the perturbation circuit as described above.
【0011】各電圧生成回路15〜18はそれぞれに接
続された電極棒11〜14に対して独立に、直流成分
U、交流成分V・cos(ω・t+θ)のDC/AC重畳電圧を
印加する。これら電圧生成回路15〜18は1個の四重
極制御部19に接続されており、四重極制御部19は各
電圧生成回路15〜18に対して別個の直流成分強度
U、交流成分波高値V、周波数ω及び位相θに関する制
御信号を与える。Each of the voltage generating circuits 15 to 18 independently generates a DC / AC superimposed voltage of a DC component U and an AC component V.cos (ω.t + θ) with respect to the electrode rods 11 to 14 respectively connected thereto. Apply. These voltage generation circuits 15-18 are connected to one quadrupole control unit 19, and the quadrupole control unit 19 separates DC component intensity U and AC component wave for each voltage generation circuit 15-18. The control signals for the high value V, the frequency ω and the phase θ are given.
【0012】四重極10の出口にはイオン検出器20が
設けられており、その検出信号はデータ処理部21に送
信される。データ処理部21は、イオン検出信号と四重
極制御部19の走査信号とに基づき、グラフの作成やイ
オンの推定等の処理を行なう。An ion detector 20 is provided at the exit of the quadrupole 10, and its detection signal is transmitted to the data processing section 21. The data processing unit 21 performs processing such as graph creation and ion estimation based on the ion detection signal and the scanning signal from the quadrupole control unit 19.
【0013】本実施例の四重極フィルタでは、四重極制
御部19が各電圧生成回路15〜18に与えるパラメー
タを適宜変更することにより、例えば図2に示すよう
に、第1電極棒A(11)に印加する交流成分22に対
して第2電極棒B(12)に印加する交流成分23の位
相θのみを変化させるという細かい調整が可能となる。
図2の3段目では波高値Vのみ、4段目では周波数ωの
みを変化させた交流成分24、25が示されているが、
これらを適宜組み合わせた波形としてもよい。これらの
細かい調整を適宜組み合わせることにより、電極棒11
〜14の寸法誤差、組立誤差、ホルダの発熱等による寸
法・配置変化等を補償し、正しい質量分析を行なうこと
ができるようになる。また、それに加えて、これらの値
を変化させた場合のイオン検出強度の変化の様子を記録
し、データ解析することにより、試料の成分、構造に関
する新しい情報を得ることができるようになる。In the quadrupole filter of this embodiment, the quadrupole control unit 19 appropriately changes the parameters given to the voltage generation circuits 15 to 18, so that, for example, as shown in FIG. Fine adjustment is possible by changing only the phase θ of the AC component 23 applied to the second electrode rod B (12) with respect to the AC component 22 applied to (11).
In the third row of FIG. 2, only the peak value V is shown, and in the fourth row, the AC components 24 and 25 in which only the frequency ω is changed are shown.
A waveform may be formed by appropriately combining these. By appropriately combining these fine adjustments, the electrode rod 11
The correct mass analysis can be performed by compensating for the dimensional error, the assembly error, the dimensional / arrangement change due to the heat generation of the holder, etc. In addition to this, by recording the state of changes in the detected ion intensity when these values are changed and analyzing the data, it becomes possible to obtain new information regarding the components and structure of the sample.
【0014】[0014]
【発明の効果】従来の四重極フィルタでは4本の電極棒
に対して1個の電圧生成回路しか用いられていなかった
が、本発明に係る四重極フィルタでは各電極棒毎に電圧
生成回路が設けられているため、各電極棒毎にU/V
比、高周波の周波数、位相等を変化させることができ、
組立誤差等に対して従来よりもきめの細かい調整を行な
うことができる。また、各電極棒毎にこれらのパラメー
タを変化させることにより、従来の質量分析では得られ
なかった各種データを得ることができる。In the conventional quadrupole filter, only one voltage generation circuit is used for four electrode rods, but in the quadrupole filter according to the present invention, voltage generation is performed for each electrode rod. Since a circuit is provided, U / V for each electrode rod
You can change the ratio, high frequency, phase, etc.,
It is possible to make finer adjustments than before with respect to assembly errors and the like. Further, by changing these parameters for each electrode rod, various data that cannot be obtained by conventional mass spectrometry can be obtained.
【図1】 本発明の一実施例である四重極フィルタの概
略構成図。FIG. 1 is a schematic configuration diagram of a quadrupole filter that is an embodiment of the present invention.
【図2】 実施例の四重極の各電極棒に印加される交流
成分の波形を示すグラフ。FIG. 2 is a graph showing a waveform of an AC component applied to each quadrupole electrode rod of the example.
【図3】 従来の四重極フィルタの電圧生成回路の一具
体例を示す回路図(a)と、それを簡略化した概略構成
図(b)。FIG. 3 is a circuit diagram (a) showing a specific example of a voltage generation circuit of a conventional quadrupole filter, and a schematic configuration diagram (b) simplified thereof.
【図4】 四重極の安定領域図。FIG. 4 is a quadrupole stable region diagram.
10…四重極 11、12、13、14…電極棒 15、16、17、18…電圧生成回路 19…四重極制御部 20…イオン検出器 21…データ処理部 10 ... Quadrupole 11, 12, 13, 14 ... Electrode rod 15, 16, 17, 18 ... Voltage generation circuit 19 ... Quadrupole control unit 20 ... Ion detector 21 ... Data processing unit
Claims (1)
極棒が中心軸に平行に配置されて成り、中心軸を挟んで
対向する2本の電極と他の2本の電極との間に直流電圧
と交流電圧の重畳電圧を印加することにより所定の質量
を有するイオンのみを通過させる四重極質量フィルタに
おいて、4本の各電極棒毎に該重畳電圧を生成する回路
を設けたことを特徴とする四重極質量フィルタ。1. An electrode comprising four electrode rods arranged parallel to the central axis at rotationally symmetric positions around the central axis, the two electrodes facing each other across the central axis and the other two electrodes. In a quadrupole mass filter that passes only ions having a predetermined mass by applying a superimposed voltage of a DC voltage and an AC voltage between them, a circuit for generating the superimposed voltage is provided for each of the four electrode rods. A quadrupole mass filter characterized in that
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6261695A JPH08102283A (en) | 1994-09-29 | 1994-09-29 | Quadrupole mass filter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6261695A JPH08102283A (en) | 1994-09-29 | 1994-09-29 | Quadrupole mass filter |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH08102283A true JPH08102283A (en) | 1996-04-16 |
Family
ID=17365432
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6261695A Pending JPH08102283A (en) | 1994-09-29 | 1994-09-29 | Quadrupole mass filter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH08102283A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2390222A (en) * | 2003-07-31 | 2003-12-31 | Reliance Gear Company Ltd | Quadrupole Mass Filter |
US6940068B2 (en) | 2002-01-03 | 2005-09-06 | Reliance Gear Company Limited | Quadrupole mass filter |
JP2005259616A (en) * | 2004-03-15 | 2005-09-22 | Shimadzu Corp | Quadruplex pole mass spectrograph |
JP2006278024A (en) * | 2005-03-28 | 2006-10-12 | Shimadzu Corp | Ms/ms mass spectrometer |
DE102005001172B4 (en) * | 2004-07-23 | 2011-05-05 | Agilent Technologies, Inc. (n.d.Ges.d. Staates Delaware), Santa Clara | Apparatus and method for electronically controlling a quadrupole mass spectrometer to improve signal performance at fast sampling rates |
US8188426B2 (en) | 2008-05-22 | 2012-05-29 | Shimadzu Corporation | Quadropole mass spectrometer |
JP2012104424A (en) * | 2010-11-12 | 2012-05-31 | Hitachi High-Technologies Corp | Mass spectrometer |
-
1994
- 1994-09-29 JP JP6261695A patent/JPH08102283A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6940068B2 (en) | 2002-01-03 | 2005-09-06 | Reliance Gear Company Limited | Quadrupole mass filter |
GB2390222A (en) * | 2003-07-31 | 2003-12-31 | Reliance Gear Company Ltd | Quadrupole Mass Filter |
GB2390222B (en) * | 2003-07-31 | 2004-05-19 | Reliance Gear Company Ltd | Quadrupole mass filter |
WO2005013312A3 (en) * | 2003-07-31 | 2006-01-05 | Reliance Gear Company Ltd | Quadrupole mass filter |
JP2005259616A (en) * | 2004-03-15 | 2005-09-22 | Shimadzu Corp | Quadruplex pole mass spectrograph |
DE102005001172B4 (en) * | 2004-07-23 | 2011-05-05 | Agilent Technologies, Inc. (n.d.Ges.d. Staates Delaware), Santa Clara | Apparatus and method for electronically controlling a quadrupole mass spectrometer to improve signal performance at fast sampling rates |
JP2006278024A (en) * | 2005-03-28 | 2006-10-12 | Shimadzu Corp | Ms/ms mass spectrometer |
US8188426B2 (en) | 2008-05-22 | 2012-05-29 | Shimadzu Corporation | Quadropole mass spectrometer |
EP3147935A1 (en) | 2008-05-22 | 2017-03-29 | Shimadzu Corporation | Quadrupole mass spectrometer |
JP2012104424A (en) * | 2010-11-12 | 2012-05-31 | Hitachi High-Technologies Corp | Mass spectrometer |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5521382A (en) | MS/MS type mass analyzer | |
EP2557590B1 (en) | Quadrupole mass spectrometer | |
JP2010530607A (en) | Digital differential electrical mobility separation method and apparatus | |
JPH04218251A (en) | Quadruple pole mass spectrograph | |
Blades | Asymmetric abel inversions on inductively coupled plasma spatial emission profiles collected from a photodiode array | |
JPH08102283A (en) | Quadrupole mass filter | |
US7000471B2 (en) | Angular velocity sensor device | |
US20020005480A1 (en) | Quadrupole mass spectrometer | |
JP3002521B2 (en) | Quadrupole mass spectrometer | |
JPH07240170A (en) | Quadrupole mass spectrometric device | |
JP6816843B2 (en) | Quadrupole mass spectrometer | |
WO2023144944A1 (en) | Mass spectrometer and method for controlling same | |
US4694169A (en) | Mass spectrometer | |
JP3571568B2 (en) | Focus voltage source for mass spectrometer | |
JPH0589826A (en) | Quandripolar mass-spectrometer | |
JPH1027570A (en) | Quadrapole mass spectrometry device | |
WO2024122362A1 (en) | Mass spectrometry device and method for controlling same | |
JPH0582606A (en) | Semiconductor integrated circuit testing device | |
JPH10208692A (en) | Ion trap mass spectrograph | |
JP5293562B2 (en) | Ion trap mass spectrometer | |
RU2625440C2 (en) | Detector of camera elements with regulation scheme | |
JP5423881B2 (en) | Quadrupole mass spectrometer | |
JPH03245451A (en) | Mass analyzer | |
JPS6182650A (en) | Device for measuring ion cleavage reaction | |
JPH1154085A (en) | Multipole mass spectrometer |