JPH06299313A - Solder plating device for semiconductor lead frame - Google Patents

Solder plating device for semiconductor lead frame

Info

Publication number
JPH06299313A
JPH06299313A JP11226293A JP11226293A JPH06299313A JP H06299313 A JPH06299313 A JP H06299313A JP 11226293 A JP11226293 A JP 11226293A JP 11226293 A JP11226293 A JP 11226293A JP H06299313 A JPH06299313 A JP H06299313A
Authority
JP
Japan
Prior art keywords
treatment
washing
lead frame
solder plating
treatment means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11226293A
Other languages
Japanese (ja)
Inventor
Akihisa Hongo
明久 本郷
Masahiro Hoshino
雅博 星野
Masahiko Hara
雅彦 原
Kenichi Suzuki
憲一 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Priority to JP11226293A priority Critical patent/JPH06299313A/en
Publication of JPH06299313A publication Critical patent/JPH06299313A/en
Pending legal-status Critical Current

Links

Landscapes

  • Coating With Molten Metal (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To provide the solder plating device for semiconductor lead frames capable of lessening the burden of waste liquid treatment equipment. CONSTITUTION:This solder plating device includes an alkaline degreasing treatment device 1 for removing the grease on the surfaces of the semiconductor lead frames, an etching treatment means 3 for subjecting the semiconductor lead frames to an etching treatment, a solder plating treatment member 6 for subjecting the lead frames to a solder plating treatment and washing treatment means 20, 40, 70 for washing the semiconductor lead frames with water after the respective liquid chemical treatments. The washing treatment means 20, 40, 70 are provided with two first and second washing tanks A, B. A water supply and drain route for the first washing tank A and a water supply and drain route for the second washing tank B are respectively separately and independently composed. The concentration waste liquid and dilute waste liquid drained from both washing tanks A, B are treated by the treatment means different respectively.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体リードフレーム
の外装部分に半田メッキ処理を施す半導体リードフレー
ム半田メッキ装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor lead frame solder plating apparatus for applying a solder plating treatment to the exterior portion of a semiconductor lead frame.

【0002】[0002]

【従来技術】図2は従来のこの種の半導体リードフレー
ム半田メッキ装置の構成を示す図である。同図に示すよ
うに、この半導体リードフレーム半田メッキ装置は、ア
ルカリ脱脂処理手段1と、水洗処理手段2と、エッチン
グ処理手段3と、水洗処理手段4と、プレディップ処理
手段5と、半田メッキ処理手段6と、水洗処理手段7
と、湯洗処理手段8と、ブロー処理手段9と、乾燥処理
手段10を具備して構成されている。
2. Description of the Related Art FIG. 2 is a diagram showing the structure of a conventional semiconductor lead frame solder plating apparatus of this type. As shown in the figure, this semiconductor lead frame solder plating apparatus includes an alkali degreasing treatment means 1, a water washing treatment means 2, an etching treatment means 3, a water washing treatment means 4, a pre-dip treatment means 5, and solder plating. Treatment means 6 and washing treatment means 7
And a hot water washing means 8, a blowing means 9, and a drying means 10.

【0003】ここでまずアルカリ脱脂処理手段1は、機
械加工等において脂の付着したリードフレームから該脂
を除去する処理手段であり、通常脱脂液を収容する液槽
にリードフレームを浸漬することによって脱脂を行うよ
うに構成されている。
First, the alkaline degreasing treatment means 1 is a treatment means for removing the fat from the lead frame to which the fat adheres during machining or the like. Normally, by dipping the lead frame in a liquid tank containing a degreasing liquid. It is configured to degrease.

【0004】次に水洗処理手段2は、前記脱脂処理手段
1で付着した脱脂液を水洗いによって除去する処理手段
である。具体的には同図に示すように、第1と第2の2
つの水洗槽a,bを配設し、第2の水洗槽bに新水を供
給し、第2の水洗槽bでオーバーフローした水を第1の
水洗槽aに導入し、さらに第1の水洗槽aでオーバーフ
ローした水を装置から排出するように構成されている。
なおこの排水は全て排液処理設備によって処理される。
そしてリードフレームはまず第1の水洗槽a内に浸漬し
て水洗いされ、次に第2の水洗槽b内に浸漬してさらに
水洗いされる。
Next, the water washing treatment means 2 is a treatment means for removing the degreasing liquid adhered by the degreasing treatment means 1 by washing with water. Specifically, as shown in the figure, the first and second 2
The two washing tanks a and b are provided, new water is supplied to the second washing tank b, the water overflowed in the second washing tank b is introduced into the first washing tank a, and the first washing tank is further washed. The water overflowed in the tank a is configured to be discharged from the device.
All of this wastewater is treated by the wastewater treatment facility.
The lead frame is first immersed in the first washing tank a to be washed with water, and then immersed in the second washing tank b to be further washed with water.

【0005】次にエッチング処理手段3は前記水洗後の
リードフレームにエッチング処理を施す手段であり、通
常エッチング液を収容した液槽にリードフレームを所定
時間浸漬して処理される。
Next, the etching treatment means 3 is a means for performing an etching treatment on the lead frame after being washed with water, and is usually treated by immersing the lead frame in a liquid tank containing an etching liquid for a predetermined time.

【0006】次に水洗処理手段4も前記水洗処理手段2
と同様の構成であり、2つの水洗槽a,bを具備し、前
記エッチング処理の終了したリードフレームからエッチ
ング液を水洗いによって除去する処理手段である。
Next, the washing treatment means 4 is also the washing treatment means 2
It is a processing means having the same structure as that of (1) and having two water washing tanks a and b, and removing the etching liquid from the lead frame after the etching treatment by water washing.

【0007】次にプレディップ処理手段5は半田メッキ
処理の直前の処理手段で、通常メッキ液と同じ酸性の液
を収容した液槽に浸漬するように構成されている。この
プレディップ処理は、水洗いによっても除去されなかっ
たごく僅かのエッチング液がリードフレーム表面に酸化
膜を形成するのでこの酸化膜を除去するためと、該表面
に付着するその他の不純物を除去するためと、さらにプ
レディップ液にメッキ液と同じ液を用いることによって
メッキ液の濃度を所定の値に維持するために行うもので
ある。
Next, the pre-dip processing means 5 is a processing means immediately before the solder plating processing, and is constructed so as to be immersed in a liquid tank containing the same acidic liquid as the normal plating liquid. This pre-dip treatment is performed to remove this oxide film and other impurities that adhere to the surface because a very small amount of etching solution that has not been removed by washing forms an oxide film on the surface of the lead frame. In addition, the same solution as the plating solution is used as the pre-dip solution to maintain the concentration of the plating solution at a predetermined value.

【0008】次に半田メッキ処理手段6はリードフレー
ムの外装部分に半田メッキ処理を行う処理手段であり、
メッキ液中で半田材を陽極、リードフレームを陰極とし
て通電するように構成されている。
Next, the solder plating processing means 6 is a processing means for performing solder plating processing on the exterior portion of the lead frame.
The solder material is used as an anode and the lead frame is used as a cathode in the plating solution so that electricity is applied.

【0009】次に水洗処理手段7も前記水洗処理手段2
と同様の構成であり、2つの水洗槽a,bを具備し、前
記半田メッキ処理により付着したメッキ液を除去する処
理手段である。
Next, the washing treatment means 7 is also the washing treatment means 2
This is a processing means having the same structure as the above, and having two water washing tanks a and b, and removing the plating liquid attached by the solder plating processing.

【0010】そしてメッキ液を除去したリードフレーム
は、湯洗処理手段8で湯洗され、ブロー処理手段9でブ
ローされた後に、乾燥処理手段10で乾燥される。
The lead frame from which the plating liquid has been removed is washed with hot water by the hot water treatment means 8, blown by the blow treatment means 9, and then dried by the dry treatment means 10.

【0011】[0011]

【発明が解決しようとする課題】上述のように半導体リ
ードフレームの半田メッキ装置では、各薬液処理の後に
(即ちアルカリ脱脂処理とエッチング処理と半田メッキ
処理の後に)、前工程の薬液が次工程の薬液と混合する
ことを避けるため、必ず水洗処理手段が挿入されてい
る。また水洗処理手段においてリードフレームを水洗槽
a,bに浸漬すると、該リードフレームに付着した薬液
が水中に持ち出され、このため排水中の薬液のイオン濃
度は高くなる。
As described above, in the semiconductor lead frame solder plating apparatus, after each chemical treatment (that is, after alkali degreasing treatment, etching treatment, and solder plating treatment), the chemical treatment in the previous step is performed. In order to avoid mixing with the above chemical solution, a washing treatment means is always inserted. Further, when the lead frame is dipped in the water washing tanks a and b in the water washing treatment means, the chemical solution adhering to the lead frame is taken out into the water, so that the ion concentration of the chemical solution in the waste water becomes high.

【0012】ところで従来この水洗処理手段から排出さ
れた水は全て排水として排液処理設備で処理されてい
た。
By the way, conventionally, all the water discharged from the water washing means has been treated as drainage in a drainage treatment facility.

【0013】このため薬液の水洗槽a,bの水への持ち
出し量が多いと、排液処理設備の負荷が多くなり、該設
備のイニシャルコスト,ランニングコストが高くなると
いう問題点があった。
Therefore, if the amount of the chemical solution brought out to the water in the water washing tanks a and b is large, the load of the drainage treatment facility increases, and the initial cost and running cost of the facility increase.

【0014】本発明は上述の点に鑑みてなされたもので
あり、その目的は、排液処理設備の負担を少なくするこ
とのできる半導体リードフレーム半田メッキ装置を提供
することにある。
The present invention has been made in view of the above points, and an object thereof is to provide a semiconductor lead frame solder plating apparatus capable of reducing the burden on the drainage treatment facility.

【0015】[0015]

【課題を解決するための手段】上記問題点を解決するた
め本発明は、少なくとも半導体リードフレームにエッチ
ング処理を施すエッチング処理手段と、半田メッキ処理
を施す半田メッキ処理手段と、各薬液処理の後に半導体
リードフレームを水洗いする水洗処理手段とを具備する
半導体リードフレーム半田メッキ装置において、前記水
洗処理手段は、薬液処理後の半導体リードフレームを浸
漬する第1の水洗槽と該第1の水洗槽に浸漬した半導体
リードフレームを再び浸漬する第2の水洗槽の2槽の水
洗槽を設け、両水洗槽への水の供給排水経路を別々に独
立させて構成した。
In order to solve the above problems, the present invention provides an etching treatment means for performing an etching treatment on at least a semiconductor lead frame, a solder plating treatment means for performing a solder plating treatment, and after each chemical treatment. In a semiconductor lead frame solder plating apparatus including a washing treatment means for washing a semiconductor lead frame with water, the washing treatment means includes a first washing tank for immersing the semiconductor lead frame after the chemical treatment and a first washing tank. A second rinsing tank, which is a second rinsing tank for immersing the immersed semiconductor lead frame again, was provided, and water supply / drain paths for the both rinsing tanks were separately configured.

【0016】[0016]

【作用】第1の水洗槽から排水される濃厚系排液と第2
の水洗槽から排水される希釈系排液を、それぞれ別々に
効率良く処理できる。
[Function] The concentrated drainage liquid discharged from the first washing tank and the second
The diluted effluent discharged from the water washing tank can be efficiently treated separately.

【0017】[0017]

【実施例】以下、本発明の1実施例を図面に基づいて詳
細に説明する。図1は本発明の半導体リードフレーム半
田メッキ装置の1構成例を示す図である。同図において
図2と同一符号を付した部分は同一又は相当部分を示
す。図1に示すようにこの半導体リードフレーム半田メ
ッキ装置は、アルカリ脱脂処理手段1と、水洗処理手段
20と、エッチング処理手段3と、水洗処理手段40
と、プレディップ処理手段5と、半田メッキ処理手段6
と、水洗処理手段70と、湯洗処理手段8と、ブロー処
理手段9と、乾燥処理手段10を具備して構成されてい
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the drawings. FIG. 1 is a diagram showing one configuration example of a semiconductor lead frame solder plating apparatus of the present invention. In the figure, the parts denoted by the same reference numerals as those in FIG. 2 indicate the same or corresponding parts. As shown in FIG. 1, this semiconductor lead frame solder plating apparatus has an alkaline degreasing treatment means 1, a water washing treatment means 20, an etching treatment means 3, and a water washing treatment means 40.
And pre-dip processing means 5 and solder plating processing means 6
A washing treatment means 70, a hot water washing means 8, a blow treatment means 9, and a drying treatment means 10.

【0018】そしてこの実施例においても、前記図2に
示す従来例と同様に、まずアルカリ脱脂処理手段1によ
ってリードフレーム表面に付着していた脂が除去され、
次に水洗処理手段20によってリードフレームに付着し
た脱脂液を水洗いし、次にエッチング処理手段3によっ
てエッチング処理が施され、次に水洗処理装置40によ
ってリードフレームに付着したエッチング液を水洗い
し、次にプレディップ処理手段5を介して半田メッキ処
理手段6によってリードフレームの外装部分に半田メッ
キ処理を行い、次に水洗処理手段7によってリードフレ
ームに付着したメッキ液を除去し、次に湯洗処理手段8
で湯洗し、ブロー処理手段9でブローされた後に、乾燥
処理手段10で乾燥される。
Also in this embodiment, as in the prior art example shown in FIG. 2, the alkaline degreasing means 1 first removes the grease adhering to the surface of the lead frame,
Next, the degreasing liquid adhering to the lead frame is washed with water by the water washing treatment means 20, and then the etching treatment is performed by the etching treatment means 3, and then the etching liquid attached to the lead frame is washed with water by the water washing treatment device 40. Then, the outer plating of the lead frame is subjected to the solder plating treatment by the solder plating treatment means 6 through the pre-dip treatment means 5, the plating solution adhering to the lead frame is removed by the water washing treatment means 7, and then the hot water washing treatment is performed. Means 8
After being washed with hot water and blown by the blow processing means 9, it is dried by the drying processing means 10.

【0019】そしてこの実施例にかかる半導体リードフ
レーム半田メッキ装置において前記図2に示す従来例と
相違する点は、3つの水洗処理手段20,40,70の
構造である。
The semiconductor lead frame solder plating apparatus according to this embodiment is different from the conventional example shown in FIG. 2 in the structure of the three washing treatment means 20, 40, 70.

【0020】この実施例においては、水洗処理手段2
0,40,70を構成する水洗槽をそれぞれ第1と第2
の水洗槽A,Bに分け、第1の水洗槽Aと第2の水洗槽
Bにそれぞれ別々に新水を供給し、また両水洗槽A,B
からオーバーフローして排出される排液もそれぞれ別々
に処理することとした。即ち2つの水洗槽A,Bの水の
供給排水経路を各々独立せしめたのである。
In this embodiment, the washing treatment means 2
The washing tanks that make up 0, 40, and 70 are the first and second washing tanks, respectively.
Of the washing tanks A and B, and fresh water is separately supplied to the first washing tank A and the second washing tank B.
It was decided to separately treat the drainage liquids that overflowed and discharged. That is, the water supply / drain paths of the two washing tanks A and B are made independent.

【0021】そして第1の水洗槽Aからオーバーフロー
して排出される排液(即ち薬液処理後のリードフレーム
を最初に水洗いするため薬液の持ち出しが多くイオン濃
度の高い排液)は、濃厚系排液として濃厚系排液処理手
段で処理する。即ち、濃厚系排液は濃縮装置等で固化等
して処理する。
The discharged liquid overflowing from the first water-washing tank A and discharged (that is, the discharged liquid having a large amount of chemical solution taken out and having a high ion concentration because the lead frame after the chemical solution treatment is first washed with water) is concentrated It is treated as a liquid by a concentrated drainage treatment means. That is, the concentrated effluent is treated by solidifying it with a concentrating device or the like.

【0022】一方第2の水洗槽Bからオーバーフローし
て排出される排液(即ち第1の水洗槽Aですでに一度水
洗いされたリードフレームを再び水洗いするものであり
希釈化されたイオン濃度の低い排液)は、希釈系排液と
して上記濃厚系排液とは別に希釈系排液処理手段で処理
する。即ち、希釈系排液は従来の排液処理設備に流して
処理する。つまり希釈系排液のみを従来の排液処理設備
で処理することとしたので、排液処理設備の負荷がかな
り少なくなり、該設備のイニシャルコスト,ランニング
コストの低減と、設備規模の小型化が図れる。
On the other hand, the drainage liquid overflowing and discharged from the second washing tank B (that is, the lead frame which has already been washed once in the first washing tank A is washed again with the diluted ion concentration Low effluent) is treated as a diluted effluent by a diluted effluent treatment means separately from the concentrated effluent. That is, the diluted waste liquid is processed by flowing it into the conventional waste liquid treatment equipment. In other words, since it is decided to process only the diluted system waste liquid with the conventional waste liquid treatment equipment, the load of the waste fluid treatment equipment is considerably reduced, the initial cost and running cost of the equipment are reduced, and the equipment scale is reduced. Can be achieved.

【0023】[0023]

【発明の効果】以上詳細に説明したように、本発明にか
かる半導体リードフレーム半田メッキ装置によれば、水
洗処理手段の水洗槽を、第1と第2の水洗槽に分離し且
つそれぞれ独立に水を流すこととしたので、第1の水洗
槽から排水される濃厚系排液を従来の排液処理設備とは
別の効率的な濃厚系排液処理手段によって処理し、第2
の水洗槽から排水される希釈系排液のみを従来の排液処
理設備によって処理することができ、このため排液処理
設備のイニシャルコスト,ランニングコストの低減化が
図れ、また排液処理設備の小型化が図れる。
As described above in detail, according to the semiconductor lead frame solder plating apparatus of the present invention, the rinsing tank of the rinsing processing means is divided into the first and second rinsing tanks and each is independent. Since the water is allowed to flow, the concentrated drainage discharged from the first flush tank is treated by an efficient concentrated drainage treatment means different from the conventional drainage treatment equipment, and the second
Only diluted effluent drained from the water washing tank can be treated by the conventional effluent treatment equipment, which can reduce the initial cost and running cost of the effluent treatment equipment. Can be miniaturized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の半導体リードフレーム半田メッキ装置
の1構成例を示す図である。
FIG. 1 is a diagram showing one configuration example of a semiconductor lead frame solder plating apparatus of the present invention.

【図2】従来の半導体リードフレーム半田メッキ装置の
構成を示す図である。
FIG. 2 is a diagram showing a configuration of a conventional semiconductor lead frame solder plating apparatus.

【符号の説明】[Explanation of symbols]

1 アルカリ脱脂処理手段 3 エッチング処理手段 5 プレディップ処理手段 6 半田メッキ処理手段 8 湯洗処理手段 9 ブロー処理手段 10 乾燥処理手段 20,40,70 水洗処理手段 A 第1の水洗槽 B 第2の水洗槽 1 Alkali degreasing treatment means 3 Etching treatment means 5 Predip treatment means 6 Solder plating treatment means 8 Hot water washing treatment means 9 Blow treatment means 10 Drying treatment means 20, 40, 70 Water washing treatment means A First water washing tank B Second Wash tank

───────────────────────────────────────────────────── フロントページの続き (72)発明者 鈴木 憲一 東京都大田区羽田旭町11番1号 株式会社 荏原製作所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Kenichi Suzuki 11-1 Haneda Asahi-cho, Ota-ku, Tokyo Inside EBARA CORPORATION

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 少なくとも半導体リードフレームにエッ
チング処理を施すエッチング処理手段と、半田メッキ処
理を施す半田メッキ処理手段と、各薬液処理の後に半導
体リードフレームを水洗いする水洗処理手段とを具備す
る半導体リードフレーム半田メッキ装置において、 前記水洗処理手段は、薬液処理後の半導体リードフレー
ムを浸漬する第1の水洗槽と該第1の水洗槽に浸漬した
半導体リードフレームを再び浸漬する第2の水洗槽の2
槽の水洗槽を設け、両水洗槽への水の供給排水経路を別
々に独立させて構成したことを特徴とする半導体リード
フレーム半田メッキ装置。
1. A semiconductor lead comprising at least an etching treatment means for performing an etching treatment on a semiconductor lead frame, a solder plating treatment means for performing a solder plating treatment, and a washing treatment means for washing the semiconductor lead frame with water after each chemical treatment. In the frame solder plating apparatus, the water washing treatment means includes a first water washing tank for immersing the semiconductor lead frame after the chemical solution treatment and a second water washing tank for immersing the semiconductor lead frame immersed in the first water washing tank again. Two
A semiconductor lead frame solder plating device characterized in that a water washing tank is provided, and water supply / drain paths for both water washing tanks are separately configured.
JP11226293A 1993-04-14 1993-04-14 Solder plating device for semiconductor lead frame Pending JPH06299313A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11226293A JPH06299313A (en) 1993-04-14 1993-04-14 Solder plating device for semiconductor lead frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11226293A JPH06299313A (en) 1993-04-14 1993-04-14 Solder plating device for semiconductor lead frame

Publications (1)

Publication Number Publication Date
JPH06299313A true JPH06299313A (en) 1994-10-25

Family

ID=14582305

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11226293A Pending JPH06299313A (en) 1993-04-14 1993-04-14 Solder plating device for semiconductor lead frame

Country Status (1)

Country Link
JP (1) JPH06299313A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3728816A1 (en) * 1986-08-29 1988-03-31 Maeda Shell Service Co FILTERS CONNECTED IN SERIES FOR COMPRESSED AIR
JP2008031519A (en) * 2006-07-28 2008-02-14 Kowa Industry Co Ltd Hot-dip galvanizing method and galvanized article
CN104651769A (en) * 2015-01-29 2015-05-27 深圳市六一八工业自动化设备有限公司 LED tin immersion process

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3728816A1 (en) * 1986-08-29 1988-03-31 Maeda Shell Service Co FILTERS CONNECTED IN SERIES FOR COMPRESSED AIR
JP2008031519A (en) * 2006-07-28 2008-02-14 Kowa Industry Co Ltd Hot-dip galvanizing method and galvanized article
CN104651769A (en) * 2015-01-29 2015-05-27 深圳市六一八工业自动化设备有限公司 LED tin immersion process

Similar Documents

Publication Publication Date Title
JP3338134B2 (en) Semiconductor wafer processing method
JP3154814B2 (en) Semiconductor wafer cleaning method and cleaning apparatus
JPH06299313A (en) Solder plating device for semiconductor lead frame
JPH10303171A (en) Method and device for wet-treating semiconductor wafer
JPS61247034A (en) Cleaning method of semiconductor slice
JPH0722364A (en) Method and equipment for cleaning wafer
JPH0536661A (en) Cleaning method
JP3404871B2 (en) Color filter manufacturing method and TFT circuit manufacturing method
JPS634617A (en) Cleaning method
JPS58132934A (en) Method of washing semiconductor wafer
JPH05217988A (en) Washing device
JP3099907B2 (en) Semiconductor processing equipment
JPH07221061A (en) Semiconductor treatment device
JPH05160104A (en) Wet treatment method and equipment for semiconductor wafer
JPH09312276A (en) Cleaning of substrate
JPH10172947A (en) Single tank-type cleaning method and device therefor
JPH05166773A (en) Washing method and device of semiconductor substrate
JPH04290432A (en) Semiconductor manufacturing device
JPH0927469A (en) Semiconductor device manufacturing method
JPH06252313A (en) Semiconductor lead frame plating device
KR100223285B1 (en) A cleaning method of semiconductor device
JP3756321B2 (en) Substrate processing apparatus and method
JPH11247000A (en) Plating apparatus
JP2908157B2 (en) Circuit board etching method and etching apparatus
KR970063554A (en) Wet chemical liquid equipment