JPH0462946A - Mounting method of ic chip on liquid-crystal display panel - Google Patents

Mounting method of ic chip on liquid-crystal display panel

Info

Publication number
JPH0462946A
JPH0462946A JP17500690A JP17500690A JPH0462946A JP H0462946 A JPH0462946 A JP H0462946A JP 17500690 A JP17500690 A JP 17500690A JP 17500690 A JP17500690 A JP 17500690A JP H0462946 A JPH0462946 A JP H0462946A
Authority
JP
Japan
Prior art keywords
chip
crystal display
display panel
connection
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17500690A
Other languages
Japanese (ja)
Inventor
Toshio Sakata
坂田 敏夫
Toshiaki Suketa
助田 俊明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17500690A priority Critical patent/JPH0462946A/en
Publication of JPH0462946A publication Critical patent/JPH0462946A/en
Pending legal-status Critical Current

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  • Wire Bonding (AREA)

Abstract

PURPOSE:To enhance the production yield of a liquid-crystal display panel by a method wherein, after the operation state of an IC chip has been confirmed, a resin for connection is heated to a hardening temperature to obtain a regular connection state. CONSTITUTION:A transparent electrode (ITO) is formed on a glass substrate 1; and electrode terminal parts 11, 12 for drive use are formed at its end. A liquid-crystal display panel 10 is manufactured by using two substrates of the above execution. Several tens of bumps 20 are formed on the rear of an IC chip 2 which is mounted on the electrode terminal parts 11, 12 for drive use. A lighting test of the liquid-crystal display panel 10 is first executed in a state that a resin 3 for connection use is semi-hardened and temporarily connected (in an electrically conductive state); and the operation state of the IC chip 1 is confirmed. That is to say, a mounting method composed of the following is used: it is confirmed that the IC is operated normally and that the bumps 20 are connected to prescribed positions; after that, the resin 3 for connection use is heated to a hardening temperature ; and a regularly connected state is obtained. Consequently, when it is found that the IC is not operated normally or that the bumps 20 are not connected to the prescribed positions, the IC chip 2 in a temporarily connected state is detached by using, e.g., a demounting tool 50 for exclusive use and is replaced.

Description

【発明の詳細な説明】 〔概要〕 液晶表示パネルへのICチップの実装方法に関し、チッ
プ・オン・グラス(COG)方式におけるICチップの
実装の安定性と接続にともなうIC不良を早期に除去す
ることにより液晶表示パネルの品質。
[Detailed Description of the Invention] [Summary] Regarding a method of mounting an IC chip on a liquid crystal display panel, the present invention relates to a method of mounting an IC chip on a liquid crystal display panel, and provides stability in mounting an IC chip in a chip-on-glass (COG) method and early removal of IC defects caused by connection. Depending on the quality of the LCD display panel.

信頼性および歩留りの向」二を目的とし、液晶表示パネ
ルのガラス基板上の駆動電極端子部に接続用樹脂を用い
てICチップを直接搭載接続する液晶表示パネルへのI
Cチップの実装方法において、前記接続用樹脂が半硬化
の仮接続状態で液晶表示パネルの点灯試験を行い、前記
ICチップの動作状態を確認したあとで前記接続用樹脂
を硬化温度に」二げて本接続状態にするように液晶表示
パネルへのICチップの実装方法を構成する。
With the aim of improving reliability and yield, we have developed an integrated circuit for liquid crystal display panels in which IC chips are directly mounted and connected to the drive electrode terminals on the glass substrate of the liquid crystal display panel using a connecting resin.
In the C chip mounting method, a lighting test is performed on the liquid crystal display panel in a temporarily connected state where the connecting resin is semi-hardened, and after confirming the operating state of the IC chip, the connecting resin is heated to a curing temperature. The method for mounting the IC chip on the liquid crystal display panel is configured so that the IC chip is brought into the final connected state.

〔産業上の利用分野〕[Industrial application field]

本発明は高密度電極端子列を有する液晶表示パネルへの
ICチップの実装方法、とくに、チップ・オン・グラス
(COG)方式におけるICチップの実装方法の改良に
関する。
The present invention relates to a method for mounting an IC chip on a liquid crystal display panel having a high-density electrode terminal array, and particularly to an improvement in a method for mounting an IC chip in a chip-on-glass (COG) method.

近年、表示装置の発展は目覚ましく、とくに、平面デイ
スプレィは薄型・軽量などの点から急速に普及してきた
。なかでも液晶表示装置は駆動電圧が低く、低価格であ
ることからパソコンやワープロなどOA機器分野への導
入が活発である。
In recent years, the development of display devices has been remarkable, and in particular, flat displays have rapidly become popular due to their thinness and light weight. Among them, liquid crystal display devices have a low driving voltage and are inexpensive, so they are being actively introduced into the field of office automation equipment such as personal computers and word processors.

これらの用途に用いられる液晶表示パネルは、文字表示
や図形表示が求められるので必然的に大画面、多画素、
高精細の方向へ向かっており、液晶表示パネルの表示用
ライン電極の端子数は、数100本以上に達するものが
あり、駆動回路、たとえば、ドライバICとの接続に関
する問題はますます重要になってきている。
Liquid crystal display panels used for these applications are required to display characters and graphics, so they must have large screens, many pixels,
As we move toward higher definition, the number of display line electrode terminals in LCD panels can reach several hundred or more, and issues related to connection with drive circuits, such as driver ICs, are becoming increasingly important. It's coming.

〔従来の技術〕[Conventional technology]

液晶表示装置は、一般に2枚のガラス基板にストライプ
状の透明電極(ITO: In2O3−3n02)を形
成し、画電極面を対面させ、かつ、互いに直交させ10
μm程度の間隔をあけて張り合わせる。そして、前記2
枚のガラスパネルが作るギャップに液晶を注入して電圧
を印加すると、液晶の電気光学効果と両側に配設した偏
光板により両ストライプ状電極の交点が光スィッチとな
って画素を構成し明暗の表示が行なわれる。
Generally, a liquid crystal display device has stripe-shaped transparent electrodes (ITO: In2O3-3n02) formed on two glass substrates, with the picture electrode surfaces facing each other and perpendicular to each other.
Paste them together with an interval of approximately μm. And the above 2
When liquid crystal is injected into the gap created by two glass panels and a voltage is applied, the intersection of both striped electrodes becomes an optical switch due to the electro-optical effect of the liquid crystal and the polarizing plates placed on both sides, forming a pixel and changing the brightness and darkness. Display is performed.

ストライプ状状の透明電極の末端は駆動電極端子部を構
成しており、それぞれ駆動回路に適宜接続され動作時に
両ストライプ状電極の交点が駆動制御されるようになっ
ている。
The ends of the striped transparent electrodes constitute drive electrode terminals, which are connected to drive circuits as appropriate so that the intersections of both striped electrodes are driven and controlled during operation.

駆動電極端子部の駆動回路への接続方法として現在量も
多く使用されているのは、TABケーブル(Tape 
Auto−mated Bonding)を使用する。
The currently widely used method for connecting the drive electrode terminals to the drive circuit is the TAB cable (Tape cable).
Auto-mated Bonding).

いわゆる、TAB方式であるが、液晶表示装置自体の大
画面化、高精細化、軽量化などの要求から、今後はガラ
ス基板上の駆動電極端子部に直接ICチップを搭載接続
する方法、いわゆる、C0G(チップ・オン・グラス)
実装方式に移行していく方向にある。
This is the so-called TAB method, but due to demands for larger screens, higher definition, and lighter weight of liquid crystal display devices, in the future, a method of mounting and connecting IC chips directly to the drive electrode terminals on the glass substrate, the so-called TAB method, will be adopted. C0G (Chip on Glass)
The trend is to move toward a mounting method.

第4図は液晶表示パネルへのICチップのCOG実装の
例を示す図で、同図(イ)は平面図、同図(ロ)はA−
A断面図(部分拡大図)である。
Figure 4 shows an example of COG mounting of an IC chip on a liquid crystal display panel, where (a) is a plan view and (b) is an A-
It is A sectional view (partially enlarged view).

図中、IOは液晶表示パネルで、たとえば、大きさ20
0 mmX300 mmの2枚のガラス基板lにITO
からなるストライプ状の透明電極(図示せず)を形成し
、その上に同じく図示してない配向膜を設け、配向膜面
を内側にし両ストライプ状電極をX−Yマトリクス交点
が形成されるように直交させてスペーサを挟んで基板周
縁部をシールし、基板間に形成されたギャップの中に液
晶を注入して封止したものであり、両ストライプ状電極
の多数の交点が形成する領域が表示面を構成する。両ガ
ラス基板は端部をそれぞれ張り出させてあり、その部分
に駆動電極端子部11(ストライプ状電極側)および1
2(電源・信号線側)が形成されている。
In the figure, IO is a liquid crystal display panel, for example, size 20
ITO on two glass substrates of 0 mm x 300 mm
A striped transparent electrode (not shown) is formed, and an alignment film (also not shown) is provided on top of the striped transparent electrode (not shown), and both striped electrodes are placed so that the alignment film surface is on the inside so that an X-Y matrix intersection is formed. The peripheral edge of the substrate is sealed with a spacer sandwiched between the substrates, and liquid crystal is injected into the gap formed between the substrates, and the area formed by the many intersections of both striped electrodes is Configure the display surface. Both glass substrates have their respective ends protruded, and drive electrode terminal portions 11 (stripe electrode side) and 1
2 (power supply/signal line side) is formed.

2は駆動用のICチップで、裏面にバンプ20.たとえ
ば、金バンプが形成されている。駆動用のICはそれぞ
れのストライプ状電極を数10〜100本以上毎にグル
ープ化して駆動するようにしている。
2 is a driving IC chip with bumps 20. For example, gold bumps are formed. The driving IC drives the striped electrodes by grouping them into groups of several tens to 100 or more.

4は、たとえば、フレキシブルプリント板で電源および
信号線の配線パターン40が布設されている。
4 is, for example, a flexible printed board on which a wiring pattern 40 for power and signal lines is laid.

ICチップ2と駆動電極端子部11および12との接続
は、同図(ロ)に示したように接続用樹脂3゜たとえば
、Uv硬化樹脂(あるいは熱硬化性樹脂)を前記バンプ
20を覆ってコートしたあと、たとえば、ICチップ2
の上から圧力をかけながらガラス基板lの下から紫外線
を照射してUv硬化樹脂を硬化し電気的に、また、機械
的に接続して点灯試験その他の試験を行っている。
The connection between the IC chip 2 and the drive electrode terminal parts 11 and 12 is made by covering the bumps 20 with a connecting resin 3°, for example, UV curing resin (or thermosetting resin), as shown in FIG. After coating, for example, IC chip 2
While applying pressure from above, ultraviolet rays are irradiated from below the glass substrate l to cure the UV curing resin, electrically and mechanically connected, and lighting tests and other tests are performed.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかし、前記従来のICチップ2の実装方法では接続用
樹脂3.たとえば、U■硬化樹脂が硬化して接続が完了
したあとで点灯試験などを行ったときに、ICチップ2
が不良であることがわかったり。
However, in the conventional IC chip 2 mounting method, the connection resin 3. For example, when performing a lighting test after the U■ hardening resin has hardened and the connection has been completed, the IC chip 2
was found to be defective.

あるいは、接続に不具合個所があってもそのICチップ
を取り替えることができず、強いて取り外すと駆動用電
極端子部11.12が破壊され、いずれの場合も高価な
液晶表示パネル全体が不良になり、大きな仕損を生じる
という重大な問題があり、その解決が必要であった。
Or, even if there is a defect in the connection, the IC chip cannot be replaced, and if it is forcibly removed, the drive electrode terminal parts 11 and 12 will be destroyed, and in either case, the entire expensive liquid crystal display panel will be defective. There was a serious problem that caused a large amount of waste, and it needed to be resolved.

〔課題を解決するための手段〕 上記の課題は、液晶表示パネルIOのガラス基板l上の
駆動電極端子部11.12に接続用樹脂3を用いてIC
チップ2を直接搭載接続する液晶表示パネルへのICチ
ップの実装方法において、前記接続用樹脂3が半硬化の
仮接続状態で液晶表示パネルIOの点灯試験を行い、前
記ICチップ2の動作状態を確認したあとで前記接続用
樹脂3を硬化温度に上げて本接続状態にする液晶表示パ
ネルへのICチップの実装方法により解決することがで
きる。
[Means for solving the problem] The above problem is solved by using the connection resin 3 on the drive electrode terminal portion 11.12 on the glass substrate l of the liquid crystal display panel IO.
In a method of mounting an IC chip on a liquid crystal display panel in which a chip 2 is directly mounted and connected, a lighting test is performed on the liquid crystal display panel IO in a temporarily connected state in which the connecting resin 3 is semi-hardened to check the operating state of the IC chip 2. This problem can be solved by a method of mounting an IC chip on a liquid crystal display panel in which, after confirmation, the connection resin 3 is raised to a curing temperature to bring it into the final connection state.

〔作用〕[Effect]

本発明方法によれば、接続用樹脂3.たとえば、熱硬化
性樹脂が、先ず、半硬化の仮接続状態(電気的導通状態
にある)において液晶表示パネル10の点灯試験を行い
、前記ICチップ2の動作状態を確認、すなわち、IC
が正常に動作すること、バンプ20が所定の位置に接続
されていることを確認したあとで前記接続用樹脂3を硬
化温度に上げて本接続状態にする実装方法を用いるので
、もし、ICが正常に動作しなかったり、バンプ20が
所定の位置に接続されていないことがわかった場合には
仮接続状態のICチップ2を、たとえば、専用の取り外
し工具50で取り外して交換できるので液晶表示パネル
IOの仕損が大巾に低減されるのである。
According to the method of the present invention, connecting resin 3. For example, first, a lighting test is performed on the liquid crystal display panel 10 in a temporarily connected state where the thermosetting resin is semi-cured (in an electrically conductive state), and the operating state of the IC chip 2 is confirmed.
After confirming that the IC operates normally and that the bumps 20 are connected to the predetermined positions, the connection resin 3 is raised to a curing temperature to bring it into the final connection state. If it is found that the IC chip 2 does not operate normally or that the bump 20 is not connected to the predetermined position, the temporarily connected IC chip 2 can be removed and replaced using a special removal tool 50, so the LCD panel IO failures are greatly reduced.

〔実施例〕〔Example〕

先ず、大きさが200 mmX300 mmで、厚さ1
゜1mmの透明なガラス基板を用い、その上にIn2O
、−3nO2の混合酸化物からなるストライプ状の透明
電極(ITO)を形成する。その末端に形成された駆動
用電極端子部11.12の電極ピッチは100μm、電
極端子中は50μm程度である。以上の2枚の基板を用
いて通常の方法に従って液晶表示パネルIOを作製する
First, the size is 200 mm x 300 mm and the thickness is 1
A 1 mm transparent glass substrate is used, and In2O is placed on it.
A striped transparent electrode (ITO) made of a mixed oxide of -3nO2 is formed. The electrode pitch of the driving electrode terminal portions 11 and 12 formed at the ends thereof is 100 μm, and the pitch of the electrode terminals is approximately 50 μm. A liquid crystal display panel IO is manufactured using the above two substrates according to a conventional method.

駆動用電極端子部11.12の上に実装するICチップ
2は液晶表示パネルを駆動するための専用のドライバI
Cで、裏面に、たとえば、Au被覆されたバンプ20が
数10個形成されたもので、バンプ20の大きさは、た
とえば、30μm角で高さが7μm程度のものである。
The IC chip 2 mounted on the driving electrode terminal portion 11.12 is a dedicated driver I for driving the liquid crystal display panel.
For example, several tens of Au-coated bumps 20 are formed on the back surface of C, and the size of the bumps 20 is, for example, about 30 μm square and about 7 μm high.

接続用樹脂3としてはエポキシ系の熱硬化性樹脂を用い
、バンプ20を覆ってコートしたあとICチップ2の上
面から圧力、たとえば、20kg/cm2の圧力をかけ
ながら加熱して接続を行った。このような加圧・加熱に
は、たとえば、公知のウェッジ型のパルスヒータを用い
て行えばよい。
An epoxy-based thermosetting resin was used as the connection resin 3, which was coated to cover the bumps 20, and then heated while applying pressure from the top surface of the IC chip 2, for example, 20 kg/cm2, to make the connection. Such pressurization and heating may be performed using, for example, a known wedge-type pulse heater.

なお、接続抵抗と加熱温度、加熱時間の関係を知るため
に、予めはり同様の形状の接続抵抗測定用の試料を作製
して種々条件を変えながら測定評価した。
In order to find out the relationship between connection resistance, heating temperature, and heating time, samples for connection resistance measurement were prepared in advance in the same shape as the beams, and measurements and evaluations were conducted while changing various conditions.

第1図は接続抵抗と加熱温度の関係を示す図で、縦軸に
接続抵抗を横軸に加熱温度をとっである。
FIG. 1 is a diagram showing the relationship between connection resistance and heating temperature, with connection resistance plotted on the vertical axis and heating temperature plotted on the horizontal axis.

なお、加圧は20kg/cm2.加熱時間は10秒間の
一定値とした。すなわち、接続抵抗は160℃になると
急激に低下し、170°C以上ではは望一定の低い値と
なる。また、図中のAは各加熱温度におけるICチップ
の取り外しの可否を○および×で示したもので、○は取
り外し可能を示し、×は取り外し不可であることを示す
。一方、Bは接続用樹脂3の中の気泡の有無を同様に○
および×で示したもので、○は気泡がないことを示し、
×は気泡が抜けないで残っていることを示している。接
続用樹脂層の中に気泡が存在すると接続性能が低下する
ので気泡が十分抜けて無くなっていることが好ましい条
件である。図かられかるように加熱温度が180℃以下
であればICチップの取り外しが可能であり、また、加
熱温度が180℃以上であれば気泡が十分抜けることが
わかる。
The pressurization is 20kg/cm2. The heating time was a constant value of 10 seconds. That is, the connection resistance rapidly decreases when the temperature reaches 160°C, and reaches a desirably low value above 170°C. In addition, A in the figure indicates whether or not the IC chip can be removed at each heating temperature by ○ and ×, where ○ indicates that it is removable and × indicates that it is not removable. On the other hand, B also indicates the presence or absence of air bubbles in the connecting resin 3.
and ×, ○ indicates no bubbles,
× indicates that bubbles remain without being removed. Since the presence of air bubbles in the connecting resin layer reduces the connection performance, it is a preferable condition that the air bubbles are sufficiently removed. As can be seen from the figure, if the heating temperature is 180° C. or lower, the IC chip can be removed, and if the heating temperature is 180° C. or higher, air bubbles can be sufficiently removed.

第2図は接続抵抗と加熱時間の関係を示す図で、縦軸に
接続抵抗を横軸に加熱時間をとっである。
FIG. 2 is a diagram showing the relationship between connection resistance and heating time, in which the vertical axis represents the connection resistance and the horizontal axis represents the heating time.

なお、加圧は20kg/am2.加熱温度は180℃の
一定値とした。すなわち、接続抵抗は10秒間になると
急激に低下し、15秒以上でははり一定の低い値となる
。また、図中のAは各加熱時間におけるICチップの取
り外しの可否を○および×で示したもので、○は取り外
し可能を示し、×は取り外し不可であることを示す。一
方、Bは接続用樹脂3の中の気泡の有無を同様にOおよ
び×で示したもので、○は気泡がないことを示し、×は
気泡が抜けないで残っていることを示している。図から
れかるように加熱時間が10秒以下であればICチップ
の取り外しが可能であり、また、加熱時間が10秒以上
であれば気泡が十分抜けることがわかる。
In addition, the pressurization is 20 kg/am2. The heating temperature was kept at a constant value of 180°C. That is, the connection resistance rapidly decreases after 10 seconds, and becomes a constant low value after 15 seconds. Further, A in the figure indicates whether or not the IC chip can be removed at each heating time using ○ and ×. ○ indicates that it is removable, and × indicates that it is not removable. On the other hand, B shows the presence or absence of air bubbles in the connecting resin 3 by indicating the presence or absence of air bubbles in the connecting resin 3 using O and ×. ○ indicates that there are no air bubbles, and × indicates that air bubbles remain without being removed. . As can be seen from the figure, if the heating time is 10 seconds or less, the IC chip can be removed, and if the heating time is 10 seconds or more, air bubbles can be removed sufficiently.

以上の実施例の測定結果から本実施例に用いたエポキシ
系の熱硬化性樹脂では、ICチップの仮接続条件は加熱
温度が約180°C1加熱時間が約10秒間、加圧力が
約20kg/am2であればよいことがわかる。
From the measurement results of the above examples, the conditions for temporarily connecting the IC chip with the epoxy thermosetting resin used in this example are a heating temperature of approximately 180°C, a heating time of approximately 10 seconds, and a pressure of approximately 20 kg/cm. It can be seen that am2 is sufficient.

なお、上記の仮接続条件は実施例に用いたエポキシ系の
熱硬化−性樹脂についてのものであり、したがって、こ
れに限定されるものではなく使用する接続用樹脂3の種
類により同様に測定評価してそれぞれ最適の仮接続条件
を決めればよい。
Note that the above temporary connection conditions are for the epoxy thermosetting resin used in the examples, and are therefore not limited to these, and may be similarly measured and evaluated depending on the type of connection resin 3 used. Then, the optimum temporary connection conditions can be determined.

上記のごと<ICチップ20の仮接続後に点灯試験その
他必要な試験を行い、正常動作を確認したら使用してい
る接続用樹脂3の正常の硬化接続条件。
As mentioned above < After the temporary connection of the IC chip 20, conduct a lighting test and other necessary tests, and if normal operation is confirmed, the connection resin 3 used is normally cured and connected.

たとえば、前記実施例のエポキシ系の熱硬化性樹脂の場
合には加熱温度が約190°C9加熱時間が約20秒間
、加圧力が約20kg/cm2で本接続を行えばよい。
For example, in the case of the epoxy thermosetting resin of the above embodiment, the main connection may be performed at a heating temperature of about 190° C., a heating time of about 20 seconds, and a pressing force of about 20 kg/cm 2 .

一方、ICチップ20の仮接続後に点灯試験などで正常
動作が得られない場合には、たとえば、後記する取り外
し工具でICチップの交換を行い同様の手順により実装
を行えばよい。
On the other hand, if normal operation is not obtained in a lighting test or the like after the temporary connection of the IC chip 20, the IC chip may be replaced using a removal tool, which will be described later, and then mounted using the same procedure.

第3図は仮接続したICチップの取り外し工具の例を示
す図である。図中、5はICチップの取り外し工具の外
観を示し、その下端にはICチップ20に嵌合する金属
製の枠状体50があり、枠状体50に連結して加熱ヒー
タ51.たとえば、パルスヒータが設けられている。加
熱ヒータ5Iは電線52を通じて図示してない電源制御
部に接続されている。加熱ヒータ51の上部には把手5
3が設けられている。
FIG. 3 is a diagram showing an example of a tool for removing temporarily connected IC chips. In the figure, reference numeral 5 shows the external appearance of the IC chip removal tool, and at its lower end there is a metal frame-shaped body 50 that fits into the IC chip 20, and a heater 51 connected to the frame-shaped body 50. For example, a pulse heater is provided. The heater 5I is connected to a power control section (not shown) through an electric wire 52. There is a handle 5 on the top of the heater 51.
3 is provided.

もし、点灯試験などで取り外しが必要となったICチッ
プがあれば、前記取り外し工具5の枠状体50を該IC
チップに嵌合し、加熱ヒータ51て、たとえば、前記実
施例のエポキシ系の熱硬化性樹脂の場合には140〜1
45℃に加熱して把手53を回すことにより、該ICチ
ップを静かに回転しながら容易に取り外すことができる
If there is an IC chip that needs to be removed for a lighting test or the like, the frame 50 of the removal tool 5 is removed from the IC chip.
For example, in the case of the epoxy thermosetting resin of the above embodiment, the heating temperature is 140 to 1.
By heating the IC chip to 45° C. and turning the handle 53, the IC chip can be easily removed while being gently rotated.

本実施例方法を適用することにより、ICチップの実装
にともなう不良は従来に比較して1/10程度に減少し
、その結果、液晶表示パネルの仕損が大巾に低減された
By applying the method of this embodiment, the number of defects associated with the mounting of IC chips was reduced to about 1/10 compared to the conventional method, and as a result, the number of defects in liquid crystal display panels was significantly reduced.

なお、上記実施例は一例を示したものであり、本発明の
趣旨に添うものであれば、使用する素材や接続硬化条件
およびそれらの組み合わせ、あるいは、各部分の構成な
どは適宜最適なものを選択使用してよいことは言うまで
もない。
The above-mentioned embodiments are merely examples, and the materials used, connection curing conditions, combinations thereof, and configurations of each part may be optimized as appropriate, as long as they comply with the spirit of the present invention. It goes without saying that you can use it selectively.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば接続用樹脂3.た
とえば、熱硬化性樹脂が、先ず、半硬化の仮接続状態(
電気的導通状態にある)において液晶表示パネル10の
点灯試験を行い、前記ICチップ2の動作状態を確認、
すなわち、ICが正常に動作すること、バンプ20が所
定の位置に接続されていることを確認したあとで前記接
続用樹脂3を硬化温度に上げて本接続状態にする実装方
法を用いるので、もし、ICが正常に動作しなかったり
、バンプ20が所定の位置に接続されていないことがわ
かった場合には仮接続状態のICチップ2を、たとえば
、専用の取り外し工具50で取り外して交換できるので
液晶表示パネル10の製造歩留りが大巾に向上し、液晶
表示装置の品質向上と価格の低下に寄与するところが極
めて大きい。
As explained above, according to the present invention, the connecting resin 3. For example, a thermosetting resin is first placed in a semi-cured, temporarily connected state (
conducting a lighting test on the liquid crystal display panel 10 (in an electrically conductive state) to check the operating state of the IC chip 2;
In other words, after confirming that the IC operates normally and that the bumps 20 are connected to predetermined positions, a mounting method is used in which the connection resin 3 is raised to a curing temperature to bring it into the final connection state. If it is found that the IC does not operate normally or that the bump 20 is not connected to the predetermined position, the temporarily connected IC chip 2 can be removed and replaced using a special removal tool 50, for example. The manufacturing yield of the liquid crystal display panel 10 is greatly improved, which greatly contributes to improving the quality and lowering the price of liquid crystal display devices.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は接続抵抗と加熱温度の関係を示す図、第2図は
接続抵抗と加熱時間の関係を示す図、第3図は仮接続し
たICチップの取り外し工具の例を示す図、 第4図は液晶表示パネルへのICチップのCOG実装の
例を示す図である。 図において、 lはガラス基板、 2はICチップ、 3は接続用樹脂、 4はフレキシブルプリント板、 5は取り外し工具、 10は液晶表示パネル、 11、12は駆動用電極端子部、 20はバンプである。 非零≦黙(賠) く鎖 背余芹目(に))
Figure 1 is a diagram showing the relationship between connection resistance and heating temperature, Figure 2 is a diagram showing the relationship between connection resistance and heating time, Figure 3 is a diagram showing an example of a tool for removing temporarily connected IC chips, and Figure 4 is a diagram showing the relationship between connection resistance and heating time. The figure shows an example of COG mounting of an IC chip on a liquid crystal display panel. In the figure, l is a glass substrate, 2 is an IC chip, 3 is a connection resin, 4 is a flexible printed board, 5 is a removal tool, 10 is a liquid crystal display panel, 11 and 12 are drive electrode terminals, and 20 is a bump. be. non-zero≦silence (compensation)

Claims (1)

【特許請求の範囲】  液晶表示パネル(10)のガラス基板(1)上の駆動
電極端子部(11、12)に接続用樹脂(3)を用いて
ICチップ(2)を直接搭載接続する液晶表示パネルへ
のICチップの実装方法において、 前記接続用樹脂(3)が半硬化の仮接続状態で液晶表示
パネル(10)の点灯試験を行い、前記ICチップ(2
)の動作状態を確認したあとで前記接続用樹脂(3)を
硬化温度に上げて本接続状態にすることを特徴とした液
晶表示パネルへのICチップの実装方法。
[Claims] A liquid crystal display in which an IC chip (2) is directly mounted and connected to drive electrode terminal portions (11, 12) on a glass substrate (1) of a liquid crystal display panel (10) using a connecting resin (3). In the method for mounting an IC chip on a display panel, a lighting test is performed on the liquid crystal display panel (10) in a temporarily connected state in which the connecting resin (3) is semi-hardened, and the IC chip (2) is
) After confirming the operating state of the connecting resin (3), the connecting resin (3) is raised to a curing temperature to bring it into the final connected state.
JP17500690A 1990-07-02 1990-07-02 Mounting method of ic chip on liquid-crystal display panel Pending JPH0462946A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17500690A JPH0462946A (en) 1990-07-02 1990-07-02 Mounting method of ic chip on liquid-crystal display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17500690A JPH0462946A (en) 1990-07-02 1990-07-02 Mounting method of ic chip on liquid-crystal display panel

Publications (1)

Publication Number Publication Date
JPH0462946A true JPH0462946A (en) 1992-02-27

Family

ID=15988568

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17500690A Pending JPH0462946A (en) 1990-07-02 1990-07-02 Mounting method of ic chip on liquid-crystal display panel

Country Status (1)

Country Link
JP (1) JPH0462946A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5620078A (en) * 1994-12-09 1997-04-15 Tsubakimoto Chain Co. Stroke control device for an actuator rod of a linear actuator
US5669264A (en) * 1995-06-15 1997-09-23 Tsubakimoto Chain, Co. Apparatus for preventing urging rotation of a ball screw shaft for a linear working machine
US5739887A (en) * 1994-10-21 1998-04-14 Hitachi, Ltd. Liquid crystal display device with reduced frame portion surrounding display area
US5760357A (en) * 1994-12-09 1998-06-02 Tsubakimoto Chain, Co. Thrust detecting device of a linear actuator
JP2012121139A (en) * 2012-03-08 2012-06-28 Lintec 21:Kk Peeling tool and peeling method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5739887A (en) * 1994-10-21 1998-04-14 Hitachi, Ltd. Liquid crystal display device with reduced frame portion surrounding display area
US5620078A (en) * 1994-12-09 1997-04-15 Tsubakimoto Chain Co. Stroke control device for an actuator rod of a linear actuator
US5760357A (en) * 1994-12-09 1998-06-02 Tsubakimoto Chain, Co. Thrust detecting device of a linear actuator
US5669264A (en) * 1995-06-15 1997-09-23 Tsubakimoto Chain, Co. Apparatus for preventing urging rotation of a ball screw shaft for a linear working machine
JP2012121139A (en) * 2012-03-08 2012-06-28 Lintec 21:Kk Peeling tool and peeling method

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