JPH0346588A - Laser receiver - Google Patents

Laser receiver

Info

Publication number
JPH0346588A
JPH0346588A JP1181300A JP18130089A JPH0346588A JP H0346588 A JPH0346588 A JP H0346588A JP 1181300 A JP1181300 A JP 1181300A JP 18130089 A JP18130089 A JP 18130089A JP H0346588 A JPH0346588 A JP H0346588A
Authority
JP
Japan
Prior art keywords
output
photodetector
reference light
signal
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1181300A
Other languages
Japanese (ja)
Inventor
Yorio Oomichi
大道 寓男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1181300A priority Critical patent/JPH0346588A/en
Publication of JPH0346588A publication Critical patent/JPH0346588A/en
Pending legal-status Critical Current

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Led Devices (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To make the photoelectric conversion sensitivity constant even if a sensitivity characteristic of an APD is varied by allowing a reference light to be made incident and monitoring directly photosensitivity of the APD, setting an operating voltage, and also, correcting a level variation of the reference light caused by a temperature. CONSTITUTION:When a control bias signal 5 is inputted before several masec of an emission of a laser light, a changeover switch 6 is closed and a high voltage 4 for a photodetector increases gradually an APD applied voltage of a photodetector 1. On the other hand, by the signal 5, a gate circuit 14 allows a reference signal and a clock signal to pass through they are applied to a reference light source 9 through a driving circuit 11, and its output goes into the detector 1 and outputted through an amplifier 2. In this case, when the output of the light source 9 is compensated 12 so as to become constant against a temperature, even if sensitivity of an APD is varied due to a temperature variation, a voltage applied to the APD rises until an output level of the amplifier 2 reaches a threshold of a comparator 8, and according ly, photoelectric conversion sensitivity rises. Subsequently, when it reaches a threshold, the optical comparator 8 operates,and by its signal, a switch 6 is opened, the voltage rise of the detector 1 stops, and simultaneously, the light source 9 stops its operation.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、パルスレーザ光を用いた測距装置(4) に用いられ、目標からのレーザ反射光を電気信号に変換
するレーザ受信器に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a laser receiver used in a distance measuring device (4) using pulsed laser light and converting laser reflected light from a target into an electrical signal. It is something.

〔従来の技術〕[Conventional technology]

第4図はこの種の従来装置を示す構成図で9図中(1)
は受信されたレーザ光を光電変換する光検出器、(2]
は光検出器(1)からの信号を増幅する増幅器。
Figure 4 is a configuration diagram showing this type of conventional device. (1) in Figure 9
is a photodetector that photoelectrically converts the received laser light, (2)
is an amplifier that amplifies the signal from the photodetector (1).

(3)は測距装置において距離を計数するためのストッ
プ信号、(4)は光検出器用高圧、C5)は光検出器に
高圧を加える期間を制御するバイアス制御信号。
(3) is a stop signal for counting distance in the distance measuring device, (4) is a high voltage for the photodetector, and C5 is a bias control signal that controls the period of applying high voltage to the photodetector.

(61はバイアス制御信号(5)によって開閉される切
替スイッチ、(7)は光検出器用高圧14+を分配して
所定の動作電圧を作る高圧分配回路、(8)は増幅器(
2)の出力信号を2値化するコンパレータ、(9)はコ
ンパレータ(8)の2値容された出力を計数し、高圧分
配回路+71 i動作させるカウンタ回路である。
(61 is a changeover switch that is opened and closed by the bias control signal (5), (7) is a high voltage distribution circuit that distributes the high voltage 14+ for the photodetector to create a predetermined operating voltage, and (8) is an amplifier (
2) is a comparator that converts the output signal into a binary value; (9) is a counter circuit that counts the binary output of the comparator (8) and operates the high voltage distribution circuit +71i.

−膜内に、光検出器(1)の充電変換素子としてアバラ
ンシェフォトダイオード(以下APDと呼ぶ)が用しら
れる。
- In the membrane, an avalanche photodiode (hereinafter referred to as APD) is used as a charge conversion element of the photodetector (1).

上記APDは光電変換感度が動作時の温度で変化するた
め1周囲温度に応じてAPDに印加する動作電圧を可変
させることで光電変換感度を一定にして用いる。
Since the photoelectric conversion sensitivity of the APD changes depending on the temperature during operation, the photoelectric conversion sensitivity is kept constant by varying the operating voltage applied to the APD in accordance with the ambient temperature.

上記従来装置にかけるAPDO光電変換感度の補償方法
を以下に説明する。測距装置においてパルスレーザ光が
発射される数m5ec前にバイアス制御信号(5)を加
えて、切替スイッチ(6)を閉じて。
A method of compensating for the APDO photoelectric conversion sensitivity applied to the above conventional device will be described below. A few m5ec before the pulsed laser beam is emitted from the range finder, apply the bias control signal (5) and close the changeover switch (6).

APDに光検出器用高圧(4)を印加する。APDの印
加電圧は0から所定の時定数で上昇してゆく過程で、ブ
レークダウン現象を生じて、雑音電流が急増する。
Apply photodetector high voltage (4) to the APD. In the process of increasing the voltage applied to the APD from 0 with a predetermined time constant, a breakdown phenomenon occurs and the noise current increases rapidly.

上記雑音電流は電圧に変換され、増幅器(2)を経てコ
ンパレータ(8)で2個化される。この2値化された雑
音の数を計数し、所定の計数値に達した時に切替スイッ
チ+61 ’i開状態にすると同時に高圧分配回路(7
)を動作させ、一定比率だけ電圧を下げる。
The noise current is converted into voltage, passed through an amplifier (2), and divided into two voltages by a comparator (8). The number of this binary noise is counted, and when it reaches a predetermined count value, the selector switch +61'i is opened and at the same time the high voltage distribution circuit (7
) and lower the voltage by a certain ratio.

以上の動作により、常にレーザ発射前に、APDの動作
電圧をブレークダウン電圧より一定個だけ低い値に設定
できる。
By the above operation, the operating voltage of the APD can always be set to a value lower than the breakdown voltage by a certain amount before laser emission.

一般のAPDで光電変換感度を一定にするために変化さ
せる動作電圧の温度変化率は約2.2V/”Cで、ブレ
ークダウン電圧の温度変化率は約2.4v/℃である。
In a general APD, the temperature change rate of the operating voltage that is changed to keep the photoelectric conversion sensitivity constant is about 2.2 V/''C, and the temperature change rate of the breakdown voltage is about 2.4 V/''C.

従ってブレークダウン電圧を検知して動作電圧を設定す
ることで、温度変化に対してAPDO光電変換感度を一
定にできる。
Therefore, by detecting the breakdown voltage and setting the operating voltage, the APDO photoelectric conversion sensitivity can be kept constant against temperature changes.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上記従来装置は、APDの動作電圧をブレークダウン電
圧から一定の比率だけ下げた値として因るため、APD
が別のものになったときに、光電変換感度が一定となら
ない。即ち、装置間で光電変換感度が異なることになる
ため、大巾な感度変化がないように使用するAPDを選
定しなければならないという課題があった。
In the conventional device described above, since the operating voltage of the APD is determined by lowering the breakdown voltage by a certain ratio, the APD
The photoelectric conversion sensitivity does not become constant when the value changes to something else. That is, since the photoelectric conversion sensitivity differs between devices, there is a problem in that the APD to be used must be selected so that there is no large sensitivity change.

この発明は、かかる課題を解決する手段として。This invention is a means to solve this problem.

基準光源を用いて、APDO光感度を直接モニタして、
APDの動作電圧を決めることで、APDの選定が不必
要なレーザ受信器を得ることを目的としている。
Directly monitor APDO photosensitivity using a reference light source,
The purpose is to obtain a laser receiver that does not require APD selection by determining the operating voltage of the APD.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係わるレーザ受信器は、基準光を発生させ、
APDに入射する手段と、その信号レベ(7) ルを検知しAPDの動作電圧を設定する手段と。
A laser receiver according to the present invention generates a reference light,
A means for inputting the signal to the APD, and a means for detecting the signal level (7) and setting the operating voltage of the APD.

上記基準光のレベルが温度変化しても補正できる基準光
レベル補正手段とを具備したものである。
The present invention is equipped with a reference light level correction means that can correct the level of the reference light even if the level of the reference light changes with temperature.

〔作用〕[Effect]

この発明によ、9.  APDの感度特性が変わっても
、常に一定の光電変換感度が得られる。
According to this invention, 9. Even if the sensitivity characteristics of the APD change, a constant photoelectric conversion sensitivity can always be obtained.

〔実施例〕〔Example〕

第1図はこの発明の第1の実施例を、第2図はこの発明
の第2の実施例を、また第3図はこの発明の第3の実施
例をそれぞれ示す構成図で、(1)〜f61.  (8
1は従来装置と同一のものである。
FIG. 1 is a block diagram showing a first embodiment of this invention, FIG. 2 is a second embodiment of this invention, and FIG. 3 is a block diagram showing a third embodiment of this invention. )~f61. (8
1 is the same as the conventional device.

図において(9)は発光ダイオードや半導体レーザ等で
実現でき、測距装置のパルスレーザ光と同一の波長成分
を含む光を発生する基準光源、αOは基準光源f91の
発光成分からパルスレーザ光と同一の波長成分のみを透
過する干渉フィルタ、αDは基準光源の出力光をパルス
変調する駆動回路、tiのは基準光源の発光効率が温度
で変化するのを補償するため温度を検知し、駆動回路卸
の駆動条件を変える信号を発生する温度補償回路、α4
は基準光源の(8) 出力光をパルス変調する基準クロック信号を発生する基
準クロック発生器、 Cl3はバイアス制a信号(5)
で上記基準クロック信号を駆動回路aυに供給し。
In the figure, (9) is a reference light source that can be realized with a light emitting diode or semiconductor laser, etc. and generates light containing the same wavelength component as the pulsed laser light of the range finder, and αO is the pulsed laser light from the emission component of the reference light source f91. αD is an interference filter that transmits only the same wavelength components, αD is a drive circuit that pulse-modulates the output light of the reference light source, and ti is a drive circuit that detects temperature to compensate for changes in luminous efficiency of the reference light source due to temperature. α4, a temperature compensation circuit that generates a signal that changes the driving conditions of the wholesaler
is the reference light source's (8) reference clock generator that generates a reference clock signal that pulse-modulates the output light, and Cl3 is the bias control a signal (5)
and supplies the reference clock signal to the drive circuit aυ.

コンパレータ(8)の信号で駆動回路αDの動作を停止
させるゲート回路、α場は基準光源(9)の出力光を反
射及び透過できるハーフミラ−9a[9は温度変化のな
いシリコンフォトダイオード等で実現されハフミラーa
!9の反射先金検出し電気信号に変換する基準光検出器
、Qnは基準光源の出力光を減衰させる党フィルタ、 
aSは光フィルタaDの透過光を光検出器(1)に導く
光ファイバー、 (19は基準光出力検出器aeからの
信号を平均化するレベル検出回路、CXJは2値化スレ
シホールドレベルが外部信号で所定値に可変できる機能
有する可変コンパレータである。
A gate circuit that stops the operation of the drive circuit αD by the signal of the comparator (8), and the α field is a half mirror 9a that can reflect and transmit the output light of the reference light source (9) [9 is realized by a silicon photodiode, etc. that does not change in temperature. huff mirror a
! 9 is a reference photodetector that detects the reflected tip metal and converts it into an electrical signal; Qn is a filter that attenuates the output light of the reference light source;
aS is an optical fiber that guides the transmitted light of the optical filter aD to the photodetector (1), (19 is a level detection circuit that averages the signal from the reference optical output detector ae, and CXJ is a binary threshold level that is set externally. This is a variable comparator that has the function of being able to vary to a predetermined value using a signal.

上記第1図を用いて、第1図〜第3図に共通する動作を
説明する。レーザ光が発射される前数m5ecに側倒バ
イアス信号(5)が入力されると、切替スイッチ(6)
が閉じて光検出器用高圧+41が光検出器(1)に印加
されAPDの印加電圧は除々に増加する。−力制御バイ
アス信号(51によりゲート回路α4が増幅器(2)の
通過帯域内の周期を有する基準クロック信号を通過させ
て駆動勘路卸を通して基準光源(9)に印加される。基
準光源(9)の出力はパルス変調され、光検出器(1)
に入り、増幅器(2)を介してパルス信号として出力さ
れる。この時、基準光源(9)の出力を温度補償回路α
3を用いて温度変化に対して一定となるようにしておけ
ば、温度変化によシリAPDの光電変換感度が変化して
も、 増幅器(2)ノ出力レベルがコンパレータ(8)
の2値化スレシホールドレベルに達する1で、APDに
印加される電圧は上昇をする。即ち光電変換感度は上昇
する。
Operations common to FIGS. 1 to 3 will be explained using FIG. 1 above. When the side bias signal (5) is input several meters before the laser beam is emitted, the changeover switch (6)
is closed, the photodetector high voltage +41 is applied to the photodetector (1), and the voltage applied to the APD gradually increases. - The force control bias signal (51 causes the gate circuit α4 to pass a reference clock signal having a period within the passband of the amplifier (2) and is applied to the reference light source (9) through the drive circuit. ) is pulse-modulated, and the output of the photodetector (1)
The signal enters the circuit and is output as a pulse signal via an amplifier (2). At this time, the output of the reference light source (9) is adjusted to the temperature compensation circuit α
3 to keep it constant against temperature changes, even if the photoelectric conversion sensitivity of the serial APD changes due to temperature changes, the output level of the amplifier (2) will be the same as that of the comparator (8).
1 reaches the binarization threshold level of 1, the voltage applied to the APD increases. That is, photoelectric conversion sensitivity increases.

そしてコンパレータ(8)の2値化スレシホールドに達
した時、コンパレータ(81は動作し、その信号により
切替スイッチ+61は開放となシ、光検出器(1)の電
圧上昇は止する。又同時に基準光源(9)の動作は停止
される。上記動作により、APDの印加電圧は温度変化
にかかわらず、又、APDの 1個づつの特性のバラツ
キに関係なく一定の光電変換感度となるように設定され
る。この発明の場合、厳密に言えば、増幅器(2)を含
む受信システム全体の受信感度が決することになるが、
測距装置として見る場合、受信システム全体で感度が一
定になればよしので問題はない。
When the binarization threshold of the comparator (8) is reached, the comparator (81) is activated, and the changeover switch +61 is not opened due to its signal, and the voltage increase of the photodetector (1) is stopped. At the same time, the operation of the reference light source (9) is stopped. Through the above operation, the applied voltage of the APD maintains a constant photoelectric conversion sensitivity regardless of temperature changes and regardless of variations in the characteristics of each APD. In the case of this invention, strictly speaking, the receiving sensitivity of the entire receiving system including the amplifier (2) is determined.
When viewed as a distance measuring device, there is no problem as long as the sensitivity is constant throughout the receiving system.

第2因は、基準光源(9)の出力の温度変化を補正する
基準光レベル補正手段として温度センサを含む温度補償
回路03を用いずに、基準光源(9)の出力の1部をハ
ーフミラ−α9で基準光出力検出器00で検出し、その
平均価をレベル検出回路α9で検出し。
The second reason is that a part of the output of the reference light source (9) is converted into a half mirror without using the temperature compensation circuit 03 including a temperature sensor as a reference light level correction means for correcting temperature changes in the output of the reference light source (9). α9 is detected by the reference light output detector 00, and its average value is detected by the level detection circuit α9.

基準光の出力が一定になるように駆動回路Qllの駆動
条件を変えるようにしたものである。この方式の場合は
、基準光の出力が小さすぎると他の増幅器等が必要とな
るため基準光源+91の出力は大きくなるように駆動さ
せる。
The driving conditions of the driving circuit Qll are changed so that the output of the reference light is constant. In this method, if the output of the reference light is too small, another amplifier or the like is required, so the output of the reference light source +91 is driven to be large.

そして、光検出器filへ基準光を入力する光路内に光
フィルタ0゛n及びファイバー佃を用いて基準光の出力
レベルを低下させている。ファイバー〇槌は基準光源(
9)、干渉フィルタ0[1,)・−フミラー(LS。
The output level of the reference light is lowered by using an optical filter 0'n and a fiber tube in the optical path for inputting the reference light to the photodetector fil. The fiber 〇 mallet is the reference light source (
9), interference filter 0[1,) - humirar (LS.

基準光検出器ae、フィルタanで構成される部分が光
検出器(11の近くVC!!I[瞳できなくなる場合に
有効(11) となる。
The part consisting of the reference photodetector ae and the filter an is the photodetector (11), which is effective when the VC!!I [pupil cannot be detected] near the photodetector (11).

第3図は、第2図にかけるレベル検出回路0の出力を駆
動回路0υに入力せずに、2値化スレシホールドレベル
が可変できる回路を有する可変コンパレータ■に入力さ
せることで1等価的に基準光源(9)の出力レベルの変
動を補償させるようにしたものである。
Figure 3 shows that the output of the level detection circuit 0 shown in Figure 2 is not inputted to the drive circuit 0υ, but is inputted to a variable comparator ■ that has a circuit that can vary the binarization threshold level. This is to compensate for fluctuations in the output level of the reference light source (9).

図では省略したが、一般に光検出器(1)は目標からの
レーザ反射光を集光する受信光学系の焦点位置にAPD
がぐるように配置され、受信光学系内には使用するパル
スレーザ光の波長成分のみ透過させる干渉フィルタが用
いられている。
Although not shown in the figure, the photodetector (1) is generally placed at the focal position of the receiving optical system that collects the laser reflected light from the target.
The receiving optical system includes an interference filter that transmits only the wavelength component of the pulsed laser light to be used.

従って第1色〜第3図に用いた干渉フィルタa1は上記
受信光学系内の干渉フィルタを用いても良いことは言う
1でもな−。
Therefore, it goes without saying that the interference filter a1 used in the first to third colors may be the interference filter in the receiving optical system.

〔発明の効果〕〔Effect of the invention〕

この発明は以上説明した通り、常にレーザ受信器の受信
感度を一定にするようにAPDの動作電圧を変化させて
いるので、APDの特性バラツキに依存しなくなり、A
PDの選定の必要がなくな(12) なるという効果を有する。
As explained above, in this invention, since the operating voltage of the APD is always changed so as to keep the receiving sensitivity of the laser receiver constant, it is no longer dependent on variations in the characteristics of the APD.
This has the effect of eliminating the need for PD selection (12).

又、レーザ発射の直前に毎回感度を検定していることに
なるので、オンラインでの異常監視が可能になる効果を
有する。
Furthermore, since the sensitivity is verified every time immediately before laser emission, it has the effect of making it possible to monitor abnormalities online.

【図面の簡単な説明】[Brief explanation of drawings]

第1図〜第3図はこの発明の第1.第2および第3の実
施例を示す図、第4図は従来のレーザ受信器を示す構成
図である。 図においてfilは光検出器、(2)は増幅器、(3)
はストップ信号、C4)は光検出器用高圧、(5)はバ
イアス制御信号、C6)は切替スイッチ、(7)は高圧
分配器。 (8)はコンパレータ、C9)は基準光源、 filは
干渉フィルタ、 Qllは駆動回路、αaは温度補償回
路、(I3は基準クロック発生器、a◆はゲート[gJ
路、 aSはハーフミラ−9αQは基準光出力検出器、
a7)は光フィルタ。 αaは光ファイバー、aSはレベル検出回路、(イ)は
可変コンパレータである。 なお2図中同一符号は同−又は相当部分を示す。
FIGS. 1 to 3 show the first example of this invention. Figures illustrating the second and third embodiments, and FIG. 4 are configuration diagrams illustrating a conventional laser receiver. In the figure, fil is a photodetector, (2) is an amplifier, and (3)
is a stop signal, C4) is a high voltage for the photodetector, (5) is a bias control signal, C6) is a changeover switch, and (7) is a high voltage distributor. (8) is a comparator, C9) is a reference light source, fil is an interference filter, Qll is a drive circuit, αa is a temperature compensation circuit, (I3 is a reference clock generator, a◆ is a gate [gJ
aS is a half mirror, 9αQ is a reference light output detector,
a7) is an optical filter. αa is an optical fiber, aS is a level detection circuit, and (A) is a variable comparator. Note that the same reference numerals in the two figures indicate the same or equivalent parts.

Claims (3)

【特許請求の範囲】[Claims] (1)目標からのレーザ反射光を受信する光検出器と、
上記光検出器の出力を増幅する増幅器と、上記増幅器の
出力信号を2値化するコンパレータと、上記光検出器内
のAPD(アバランシエフオトダイオード)に印加する
高電圧をレーザ光が発射される前の所定期間出力される
バイアス制御信号により通電し、又上記コンパレータの
出力信号によりしゃ断する切替スイッチと、所定の強さ
の基準光を上記光検出器に発生する基準光源と、上記基
準光源を駆動する駆動回路と、上記基準光をパルス変調
させる基準クロック信号を発生する基準クロック発生回
路と、上記基準クロック信号を上記バイアス制御信号に
より上記駆動回路に印加し、又、上記コンパレータの出
力信号により停止させるごとく上記駆動回路の動作を制
御するゲート回路と、基準光源の出力光から使用するレ
ーザ光と同一の波長成分の光のみを透過する干渉フィル
タと、温度を検知し、上記基準光源の出力を温度変化に
対して一定となるように補正する温度補償回路とを具備
したレーザ受信器。
(1) A photodetector that receives laser reflected light from the target;
A laser beam is emitted to apply a high voltage to an amplifier that amplifies the output of the photodetector, a comparator that binarizes the output signal of the amplifier, and an APD (avalanche photodiode) in the photodetector. a changeover switch that is energized by a bias control signal output for a predetermined period of time and cut off by an output signal of the comparator; a reference light source that generates a reference light of a predetermined intensity to the photodetector; a reference clock generation circuit that generates a reference clock signal that pulse-modulates the reference light; a reference clock generation circuit that applies the reference clock signal to the drive circuit according to the bias control signal; a gate circuit that controls the operation of the drive circuit to stop it; an interference filter that transmits only light having the same wavelength component as the laser beam to be used from the output light of the reference light source; and an interference filter that detects the temperature and controls the output of the reference light source. A laser receiver equipped with a temperature compensation circuit that corrects the temperature so that it remains constant against temperature changes.
(2)目標からのレーザ反射光を受信する光検出器と、
上記光検出器の出力を増幅する増幅器と、上記増幅器の
出力信号を2値化するコンパレータと、上記光検出器内
のAPD(アバランシエフオトダイオード)に印加する
高電圧をレーザ光が発射される前の所定期間出力される
バイアス制御信号により通電し、又上記コンパレータの
出力信号によりしゃ断する切替スイッチと、所定の強さ
の基準光を上記光検出器に発生する基準光源と、上記基
準光源を駆動する駆動回路と、上記基準光をパルス変調
させる基準クロック信号を発生する基準クロック発生回
路と、上記基準クロック信号を上記バイアス制御信号に
より上記駆動回路に印加し、又、上記コンパレータの出
力信号により停止させるごとく上記駆動回路の動作を制
御するゲート回路と、基準光源の出力光から使用するレ
ーザ光と同一の波長成分の光のみを透過する干渉フィル
タと、上記基準光源の出力光の、部分を反射させるハー
フミラーと、上記ハーフミラーの反射光を検知する基準
光出力検知器と、上記基準光出力検出器の出力を平均化
するレベル検出回路とを具備し、上記レベル検出回路の
出力信号が一定となるように上記基準光源の駆動条件を
変えるようにするとともに、上記ハーフミラーと上記光
検出器の間に光ファイバーと光フィルタとを具備したこ
とを特徴とするレーザ受信器。
(2) a photodetector that receives laser reflected light from the target;
A laser beam is emitted to apply a high voltage to an amplifier that amplifies the output of the photodetector, a comparator that binarizes the output signal of the amplifier, and an APD (avalanche photodiode) in the photodetector. a changeover switch that is energized by a bias control signal output for a predetermined period of time and cut off by an output signal of the comparator; a reference light source that generates a reference light of a predetermined intensity to the photodetector; a reference clock generation circuit that generates a reference clock signal that pulse-modulates the reference light; a reference clock generation circuit that applies the reference clock signal to the drive circuit according to the bias control signal; a gate circuit that controls the operation of the drive circuit so as to stop it; an interference filter that transmits only light having the same wavelength component as the laser beam to be used from the output light of the reference light source; and a part of the output light of the reference light source. It comprises a half mirror for reflecting, a reference light output detector for detecting the reflected light of the half mirror, and a level detection circuit for averaging the output of the reference light output detector, and the output signal of the level detection circuit is A laser receiver characterized in that driving conditions of the reference light source are changed so as to be constant, and an optical fiber and an optical filter are provided between the half mirror and the photodetector.
(3)目標からのレーザ反射光を受信する光検出器と、
上記光検出器の出力を増幅する増幅器と、上記増幅器の
出力信号を2値化し、2値化スレシホールドレベルが可
変できる可変コンパレータと、上記光検出器内のAPD
(アバランシエフオトダイオード)に印加する高電圧を
レーザ光が発射される前の所定期間出力されるバイアス
制御信号により通電し、又上記コンパレータの出力信号
によりしゃ断する切替スイッチと、所定の強さの基準光
を上記光検出器に発生する基準光源と、上記基準光源を
駆動する駆動回路と、上記基準光をパルス変調させる基
準クロック信号を発生する基準クロック発生回路と、上
記基準クロック信号を上記バイアス制御信号によ力上記
駆動回路に印加し、又上記コンパレータの出力信号によ
り停止させるごとく上記駆動回路の動作を制御するゲー
ト回路と、基準光源の出力光から使用するレーザ光と同
一の波長成分の光のみを透過する干渉フィルタと、上記
基準光源の出力光の1部分を反射させるハーフミラーと
、上記ハーフミラーの反射光を検知する基準光出力検知
器と、上記基準光出力検出器の出力を平均化し、その出
力信号により上記可変コンパレータの2値化スレシホー
ルドレベルを可変するレベル検出回路と、上記ハーフミ
ラーと上記光検出器との間に設けられた光ファイバおよ
び光フィルタとを具備したことを特徴とするレーザ受信
器。
(3) a photodetector that receives laser reflected light from the target;
an amplifier that amplifies the output of the photodetector; a variable comparator that binarizes the output signal of the amplifier and can vary the binarization threshold level; and an APD in the photodetector.
The high voltage applied to the avalanche photodiode is energized by a bias control signal output for a predetermined period before the laser beam is emitted, and is cut off by the output signal of the comparator. a reference light source that generates reference light to the photodetector; a drive circuit that drives the reference light source; a reference clock generation circuit that generates a reference clock signal that pulse-modulates the reference light; A gate circuit that controls the operation of the drive circuit by applying a control signal to the drive circuit and stopping it by the output signal of the comparator; an interference filter that transmits only light; a half mirror that reflects a portion of the output light of the reference light source; a reference light output detector that detects the reflected light of the half mirror; A level detection circuit that averages and varies a binarization threshold level of the variable comparator using the output signal thereof, and an optical fiber and an optical filter provided between the half mirror and the photodetector. A laser receiver characterized by:
JP1181300A 1989-07-13 1989-07-13 Laser receiver Pending JPH0346588A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1181300A JPH0346588A (en) 1989-07-13 1989-07-13 Laser receiver

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1181300A JPH0346588A (en) 1989-07-13 1989-07-13 Laser receiver

Publications (1)

Publication Number Publication Date
JPH0346588A true JPH0346588A (en) 1991-02-27

Family

ID=16098270

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1181300A Pending JPH0346588A (en) 1989-07-13 1989-07-13 Laser receiver

Country Status (1)

Country Link
JP (1) JPH0346588A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5272334A (en) * 1991-10-17 1993-12-21 Kabushiki Kaisha Toshiba Device for detecting a temperature distribution having a laser source with temperature and wavelength adjusting means
JP2001165654A (en) * 1999-12-07 2001-06-22 Topcon Corp Range finder and method of regulating light receiving part of range finder
JP2010286448A (en) * 2009-06-15 2010-12-24 Nippon Signal Co Ltd:The Optical range finder
KR20200062729A (en) * 2018-11-27 2020-06-04 현대오트론 주식회사 LIDAR apparatus and its signal processing method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5272334A (en) * 1991-10-17 1993-12-21 Kabushiki Kaisha Toshiba Device for detecting a temperature distribution having a laser source with temperature and wavelength adjusting means
JP2001165654A (en) * 1999-12-07 2001-06-22 Topcon Corp Range finder and method of regulating light receiving part of range finder
JP4630413B2 (en) * 1999-12-07 2011-02-09 株式会社トプコン Distance measuring machine and light receiving unit adjusting method of distance measuring machine
JP2010286448A (en) * 2009-06-15 2010-12-24 Nippon Signal Co Ltd:The Optical range finder
KR20200062729A (en) * 2018-11-27 2020-06-04 현대오트론 주식회사 LIDAR apparatus and its signal processing method

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