JPH0230748A - Formation of fine pattern - Google Patents

Formation of fine pattern

Info

Publication number
JPH0230748A
JPH0230748A JP17917888A JP17917888A JPH0230748A JP H0230748 A JPH0230748 A JP H0230748A JP 17917888 A JP17917888 A JP 17917888A JP 17917888 A JP17917888 A JP 17917888A JP H0230748 A JPH0230748 A JP H0230748A
Authority
JP
Japan
Prior art keywords
substrate
mask
metallic film
lift
metal film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17917888A
Other languages
Japanese (ja)
Inventor
Yoshinori Takeuchi
喜則 武内
Takeshi Idota
健 井戸田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP17917888A priority Critical patent/JPH0230748A/en
Publication of JPH0230748A publication Critical patent/JPH0230748A/en
Pending legal-status Critical Current

Links

Landscapes

  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

PURPOSE:To rapidly form a fine pattern of metallic film by vapor-depositing a metallic film onto a substrate on which a lift off mask is previously formed, allowing the metallic film on the masked part alone to adhere to a sheet while leaving the metallic film on the substrate, and then peeling off the above sheet. CONSTITUTION:A patterned lift off mask 1 is formed on the surface of a substrate 2. A metallic film 3 (e.g., of gold) is formed on the above mask 1 by means of vapor deposition, etc. Subsequently, the above substrate 2 is immersed in a solvent or etchant to undergo the removal of the above mask 1. Then, a pressure sensitive adhesive sheet 4 is stuck over the whole surface of the above metallic film 3, and this sheet 4 is peeled off. By this method, the metallic film 3 on the above mask 1 alone is allowed to adhere to the above sheet 4 and is peeled off, and the metallic film 3 directly vapor-deposited onto the substrate 2 is left, by which the fine pattern can be formed.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、半導体装置をはじめとする金属膜微細パター
ンを有する全ての装置の微細パターン形成方法に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Field of Application) The present invention relates to a method for forming fine patterns for all devices having fine metal film patterns, including semiconductor devices.

(従来の技術) 従来から行なわれている金属膜の微細パターン形成方法
は、大別してリフトオフ法とエツチング法の2種がある
。リフトオフ法の概略工程断面図を第2図に示す。第2
図(a)は、パターニングしたリフトオフマスク11を
表面に形成した基板12上に、金属膜13を蒸着等によ
って形成したものの断面図である。基板12を、リフト
オフマスク11を除去することのできる溶剤またはエツ
チング液に浸し、超音波振動を印加する。すると、第2
図(b)に示すように、リフトオフマスク11が除去さ
れるとともに、リフトオフマスク11上の金属膜13が
剥離して、金属膜のパターニングができるのである。
(Prior Art) Conventional methods for forming fine patterns on metal films can be roughly divided into two types: lift-off method and etching method. A schematic process cross-sectional view of the lift-off method is shown in FIG. Second
Figure (a) is a cross-sectional view of a metal film 13 formed by vapor deposition or the like on a substrate 12 on which a patterned lift-off mask 11 is formed. The substrate 12 is immersed in a solvent or etching solution capable of removing the lift-off mask 11, and ultrasonic vibrations are applied. Then, the second
As shown in Figure (b), the lift-off mask 11 is removed and the metal film 13 on the lift-off mask 11 is peeled off, allowing patterning of the metal film.

第3図は、エツチング法の概略工程断面図である。同図
において、基板12上に、金属膜13を蒸着等により形
成する〔第3図(a))、この上にマスク材料を積層後
、マスク材料をパターニングし、マスク14を形成する
〔第3図(b)〕。マスク14を利用して金属膜13を
エツチングすれば、第3図(c)に示すように、金属膜
13のパターニングができる。
FIG. 3 is a schematic process sectional view of the etching method. In the figure, a metal film 13 is formed on a substrate 12 by vapor deposition or the like [FIG. 3(a)], a mask material is laminated thereon, and then the mask material is patterned to form a mask 14 [FIG. 3(a)]. Figure (b)]. By etching the metal film 13 using the mask 14, the metal film 13 can be patterned as shown in FIG. 3(c).

(発明が解決しようとする課題) 従来より行なわれている2種の金属膜微細パターン形成
方法のうち、エツチング法には次の欠点があった。
(Problems to be Solved by the Invention) Of the two conventional methods for forming fine metal film patterns, the etching method has the following drawbacks.

第1には、予め金属膜を基板全面に形成するため、金属
膜を形成しなくともよい部分の基板表面を変質させてし
まうことが多い。
First, since a metal film is formed on the entire surface of the substrate in advance, the quality of the substrate surface is often altered in areas where the metal film does not need to be formed.

第2に、ウェットエツチング法、ドライエツチング法に
かかわらず、金属膜をエツチングするときに、エツチン
グする部分の基板表面を変質させたり、損傷を与えたり
してしまうことである。
Second, regardless of wet etching or dry etching, when etching a metal film, the surface of the substrate to be etched may be altered or damaged.

一方、リフトオフ法では、金属膜を形成しなくともよい
部分はりフトオフマスクで保護されているので、上記の
エツチング法にみられた欠点はない。しかし、金属膜を
超音波振動により剥離する工程において、速やかに全て
のパターンを剥離するのは極めて困難であり、第2図(
b)に示すように、完全にリフトオフが行なわれないこ
とがある。
On the other hand, in the lift-off method, the portion where the metal film does not need to be formed is protected by a lift-off mask, so there is no drawback seen in the above-mentioned etching method. However, in the process of peeling off the metal film using ultrasonic vibration, it is extremely difficult to quickly peel off all the patterns, as shown in Figure 2 (
As shown in b), the lift-off may not be completed completely.

したがって、超音波振動印加時間を長くしたり、強い超
音波振動を印加する必要がある。しかし、前者は製品の
スループットを悪化させるし、後者は基板の破壊を招く
恐れがある。また、それでも完全にパターニングされな
い場合もある。
Therefore, it is necessary to lengthen the ultrasonic vibration application time or apply strong ultrasonic vibration. However, the former may deteriorate product throughput, and the latter may lead to destruction of the substrate. Moreover, even then, the pattern may not be completely formed.

本発明の目的は、従来の欠点を解消し、金属膜を形成し
なくともよい部分の基板表面を変質させることなく、し
かも、速やかに完全な金属膜微細パターンを形成する微
細パターン形成方法を提供することである。
An object of the present invention is to provide a fine pattern forming method that eliminates the conventional drawbacks and quickly forms a complete fine metal film pattern without altering the surface of the substrate in areas where no metal film is required. It is to be.

(課題を解決するための手段) 本発明の微細パターン形成方法は、表面にパターニング
されたりフトオフマスクを形成した基板上に金属膜を蒸
着し、溶剤またはエツチング液でリフトオフマスクを除
去したのちに、基板表面に粘着性シートを貼り付け、こ
のシートを再び剥離するものである。
(Means for Solving the Problems) The fine pattern forming method of the present invention involves depositing a metal film on a substrate whose surface has been patterned or having a lift-off mask formed thereon, and removing the lift-off mask using a solvent or etching solution. An adhesive sheet is pasted on the surface and this sheet is peeled off again.

(作 用) 本発明においては、リフトオフマスクを形成した基板上
に金属膜を蒸着するため、リフトオフマスク下の基板表
面は、エツチング法の場合のように変質することはない
。リフトオフマスク除去後、粘着性シートを貼り付ける
と、この粘着性シートに金属膜がしっかりと付着する。
(Function) In the present invention, since a metal film is deposited on a substrate on which a lift-off mask is formed, the surface of the substrate under the lift-off mask is not altered unlike in the case of the etching method. After removing the lift-off mask, if an adhesive sheet is attached, the metal film will firmly adhere to the adhesive sheet.

再び粘着性シートを剥離すると、リフトオフマスクのあ
った部分の金属膜が粘着性シートに付着したまま剥離す
る。
When the adhesive sheet is peeled off again, the metal film in the area where the lift-off mask was will be peeled off while remaining attached to the adhesive sheet.

基板上の金属膜は、基板と金属間の密着性が極めてよい
ので、基板上にそのまま残される。
Since the metal film on the substrate has extremely good adhesion between the substrate and the metal, it remains as it is on the substrate.

本発明の微細パターン形成方法では、粘着性シートの貼
り付け、再剥離だけで、完全な金属膜微細パターンが速
やかに形成できる。
In the fine pattern forming method of the present invention, a complete metal film fine pattern can be quickly formed simply by pasting and repeeling the adhesive sheet.

(実施例) 本発明の一実施例を第1図に基づいて説明する。(Example) An embodiment of the present invention will be described based on FIG.

第1図は、本発明の微細パターン、形成方法の工程を示
す断面図である。同図(、)は、パターニングしたレジ
ストリフトオフマスク1を表面に形成した化合物半導体
基板であるInP基板2上に、金属膜として、例えば金
3を蒸着等によって形成したものの断面図である。これ
をアセトンに浸してレジストリフトオフマスク1を除去
したのち、粘着性シート4を金3の表面全面に貼り付け
る6次に。
FIG. 1 is a cross-sectional view showing the steps of the fine pattern and forming method of the present invention. The figure ( ) is a cross-sectional view of a metal film, for example, gold 3, formed by vapor deposition or the like on an InP substrate 2, which is a compound semiconductor substrate, on which a patterned resist lift-off mask 1 is formed. After soaking this in acetone and removing the resist lift-off mask 1, the adhesive sheet 4 is attached to the entire surface of the gold 3 in the sixth step.

粘着性シート4を第1図(b)に示すように再剥離すれ
ば、レジストリフトオフマスク1上にあった金3は、粘
着性シート4に付着したままInP基板2より速やかに
剥離することができる。この方法によって、1μ麓以下
の金属膜微細パターン形成も十分に可能である。
If the adhesive sheet 4 is peeled off again as shown in FIG. 1(b), the gold 3 on the resist lift-off mask 1 can be quickly peeled off from the InP substrate 2 while remaining attached to the adhesive sheet 4. can. By this method, it is fully possible to form a fine pattern of a metal film of 1 μm or less.

半導体レーザ等に用いるInP等の化合物半導体上へは
超微細な電極パターン等の形成が必要とされているが、
本発明の方法によれば、半導体の変質の恐れがなく、速
やかに金属パターンを確実に形成することができ、化合
物半導体装置の製造に極めて好都合である。なお、本発
明は化合物半導体に限らず、他の装置への適用も可能で
ある。
It is necessary to form ultrafine electrode patterns on compound semiconductors such as InP used in semiconductor lasers, etc.
According to the method of the present invention, a metal pattern can be quickly and reliably formed without fear of deterioration of the semiconductor, and is extremely convenient for manufacturing compound semiconductor devices. Note that the present invention is not limited to compound semiconductors and can be applied to other devices.

(発明の効果) 本発明によれば、最終的に金属膜を除去する部分の基板
表面を変質させることがなく、完全な金属膜微細パター
ンを速やかに形成することができ、その実用上の効果は
極めて大である6
(Effects of the Invention) According to the present invention, a complete metal film fine pattern can be quickly formed without altering the surface of the substrate where the metal film is finally removed, and its practical effects is extremely large6

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例における微細パターン形成方
法の工程断面図、第2図は従来技術によるエツチング法
の工程断面図、第3図は従来技術によるリフトオフ法の
概略工程断面図である。 1・・・レジストリフトオフマスク、  2・・・In
P基板、  3・・・金、 4・・・粘着性シート。 第 図 第 図 (b) 心為請
FIG. 1 is a process sectional view of a fine pattern forming method according to an embodiment of the present invention, FIG. 2 is a process sectional view of an etching method according to a conventional technique, and FIG. 3 is a schematic process sectional view of a lift-off method according to a conventional technique. . 1... Resist lift-off mask, 2... In
P substrate, 3... Gold, 4... Adhesive sheet. Figure (b)

Claims (1)

【特許請求の範囲】[Claims]  表面にパターニングされたリフトオフマスクを形成し
た基板上に金属膜を蒸着し、溶剤またはエッチング液で
前記リフトオフマスクを除去したのちに、基板表面に粘
着性シートを貼り付け、前記粘着性シートを再び剥離す
ることを特徴とする微細パターン形成方法。
A metal film is deposited on a substrate with a patterned lift-off mask formed on the surface, and after removing the lift-off mask with a solvent or etching solution, an adhesive sheet is attached to the substrate surface, and the adhesive sheet is peeled off again. A fine pattern forming method characterized by:
JP17917888A 1988-07-20 1988-07-20 Formation of fine pattern Pending JPH0230748A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17917888A JPH0230748A (en) 1988-07-20 1988-07-20 Formation of fine pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17917888A JPH0230748A (en) 1988-07-20 1988-07-20 Formation of fine pattern

Publications (1)

Publication Number Publication Date
JPH0230748A true JPH0230748A (en) 1990-02-01

Family

ID=16061300

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17917888A Pending JPH0230748A (en) 1988-07-20 1988-07-20 Formation of fine pattern

Country Status (1)

Country Link
JP (1) JPH0230748A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6482493B1 (en) 1998-04-04 2002-11-19 Lg Electronics Inc. Optical disc and method and apparatus of fabricating master disc for the same
WO2008118456A1 (en) * 2007-03-28 2008-10-02 Eastman Kodak Company An oled patterning method
CN113493894A (en) * 2020-04-01 2021-10-12 株式会社日本显示器 Apparatus and method for manufacturing vapor deposition mask

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6482493B1 (en) 1998-04-04 2002-11-19 Lg Electronics Inc. Optical disc and method and apparatus of fabricating master disc for the same
WO2008118456A1 (en) * 2007-03-28 2008-10-02 Eastman Kodak Company An oled patterning method
US7662663B2 (en) 2007-03-28 2010-02-16 Eastman Kodak Company OLED patterning method
CN113493894A (en) * 2020-04-01 2021-10-12 株式会社日本显示器 Apparatus and method for manufacturing vapor deposition mask
CN113493894B (en) * 2020-04-01 2023-12-01 株式会社日本显示器 Vapor deposition mask manufacturing device and method

Similar Documents

Publication Publication Date Title
JP3189719B2 (en) Manufacturing method of surface acoustic wave device
JPH0230748A (en) Formation of fine pattern
JP3132898B2 (en) Manufacturing method of surface acoustic wave device
JPS62149138A (en) Manufacture of semiconductor device
JPS5849018B2 (en) Method of forming electrode pattern
JP2564045B2 (en) Semiconductor chip manufacturing method
JPS59165425A (en) Pattern formation
JP2543891B2 (en) Method of forming fine pattern
JPS62149125A (en) Manufacture of semiconductor device
JPH05283383A (en) Manufacture of semiconductor device
JPS61224713A (en) Formation of conductor pattern
JP2850740B2 (en) Lead frame bump forming method
JPH04124822A (en) Manufacture of semiconductor device
JPS6127638A (en) Thin film processing method
JPH07142951A (en) Manufacture of surface acoustic wave device
JPH02202030A (en) Manufacture of semiconductor device
JPS6116527A (en) Manufacture of metallic electrode
JPH08186115A (en) Method for metal film forming
JPS61256729A (en) Formation of conductor pattern
JPS5984550A (en) Manufacture of semiconductor device
JPH0653922B2 (en) Metal film patterning method
JPS60175425A (en) Selective etching method
JPH04329634A (en) Formation of metal film pattern
JPH0350828A (en) Method of forming gold wiring
JPH05315323A (en) Wiring patterns of semiconductor substrate and its formation