JP7278826B2 - Detection sensor, measurement device, and sample preparation device - Google Patents

Description

Embodiments of the present invention relate to detection sensors, measurement devices, and sample preparation devices.

A technique is known in which a target substance is captured by metal microparticles and the target substance is optically detected. In the preparation of a sample for detection in such detection, for example, after the metal microparticles and the sample containing the target substance are mixed, the substance to be detected containing the metal microparticles bound to the target substance is extracted by filtering using a filter. be done. A sample for detection is prepared by separating the extracted substance to be detected from the filter and adding it to the surface of the detection sensor.

JP 2008-157923 A

A detection sensor, a measurement device, and a sample preparation device capable of reliably detecting an object to be detected are provided.

An embodiment is a flat detection sensor provided with a surface on which the object to be detected is deposited and the electromagnetic wave is irradiated, which is used in a detection device that detects an object to be detected based on changes in reflectance or transmittance of electromagnetic waves. . The detection sensor separates the detectable substance into the solution from a filter placed in the solution in which the detectable substance is captured, and deposits the separated detectable substance on the surface, An ultrasonic wave generating element disposed on the surface and integrated with the detection sensor for generating ultrasonic waves upward from the surface. A pattern including an uneven portion is formed on the surface of the detection sensor. The ultrasonic wave generating element is arranged on the surface so as to surround the outer circumference of the entire pattern, or arranged side by side with the uneven portion of the pattern.

FIG. 1 is a diagram showing an example of a measuring device including a detection sensor according to an embodiment. FIG. 2 is a diagram for explaining the principle of detection by the detection device. FIG. 3 is a diagram showing an example of the relationship between the frequency of electromagnetic waves detected by the detection device and the reflectance. FIG. 4 is a diagram showing an example of an object to be detected. FIG. 5A is a top view showing an example of a detection sensor. FIG. 5B is a cross-sectional view showing an example of a detection sensor; FIG. 6A is a flow chart showing an example of sample preparation. FIG. 6B is a diagram illustrating how the sample is prepared. FIG. 7 is a top view showing another example of the detection sensor. FIG. 8A is a cross-sectional view showing another example of the detection sensor. FIG. 8B is a top view showing another example of the detection sensor. FIG. 9 is a diagram illustrating how a sample is prepared in the prior art.

Each embodiment of the present invention will be described with reference to the drawings. Note that one or more examples of other expressions may be attached to each element that can be expressed in multiple ways. However, this does not negate the fact that elements not otherwise labeled may be expressed differently, nor does it limit the use of other expressions not illustrated. Also, each drawing schematically illustrates an embodiment, and the dimensions of each element shown in the drawing may differ from the description of the embodiment.

A measuring device including a detection sensor according to the present embodiment detects an object to be detected including an object to be measured such as bacteria in a sample, and measures the amount of the object to be measured. The measuring device irradiates the detection sensor with an electromagnetic wave of a predetermined frequency, and detects the electromagnetic wave reflected by the detection sensor. The measuring device measures the reflectance of the detection sensor before adding the substance to be detected and the reflectance of the detection sensor after adding the substance to be detected. The measuring device measures the presence or amount of the object to be measured from the change in reflectance before and after the addition.

FIG. 1 is a diagram showing an example of a measuring device 1. As shown in FIG. The measurement device 1 has a detection device 10 and a control device 20 . The detection device 10 and the control device 20 are electrically connected. The control device 20 includes a processor such as a CPU (Central Processing Unit), ASIC (Application Specific Integrated Circuit), or FPGA (Field programmable Gate Array). The control device 20 controls various operations and performs various calculations in each section of the detection device 10 described below.

The detection device 10 has an electromagnetic wave generation source 11 , a reflection section 12 , a detection sensor 13 , a stage 14 , a detector 15 and a sample introduction section 16 . These may be arranged in one housing as the detection device 10 .

The electromagnetic wave generation source 11 is configured to output an electromagnetic wave of a predetermined frequency based on a control signal from the control device 20 as an irradiating section that irradiates the surface of the detection sensor 13 with electromagnetic waves. The frequency of the electromagnetic wave output by the electromagnetic wave generation source 11 is determined according to the frequency characteristics of the detection sensor 13 , which is determined according to the structure of the detection sensor 13 . The electromagnetic waves to be output may be X-rays, ultraviolet rays, visible rays, infrared rays, microwaves, radio waves, and the like. For example, the electromagnetic wave generation source 11 may be a light source that generates electromagnetic waves in the wavelength ranges of ultraviolet, visible, and infrared. The electromagnetic wave generation source 11 may be, for example, a terahertz light source that emits electromagnetic waves having a frequency of about several terahertz.

The reflector 12 is, for example, a mirror. The reflecting section 12 has, for example, a first reflecting surface 12A and a second reflecting surface 12B. The reflector 12 is provided inside the detection device 10 at a predetermined angle with respect to the electromagnetic wave generation source 11, the detection sensor 13 at the detection position (for example, the position of the detection sensor 13 indicated by the solid line in FIG. 1), and the detector 15. are placed in For example, the first reflecting surface 12A is arranged to reflect the electromagnetic wave output from the electromagnetic wave generating source 11 toward the detection sensor 13 at the detection position, and the second reflecting surface 12B reflects the electromagnetic wave from the detection sensor 13. It is arranged so as to reflect the emitted electromagnetic wave toward the detector 15 . That is, the reflector 12 adjusts the optical path (advancing direction) of the electromagnetic wave output from the electromagnetic wave generation source 11 . In addition, the reflector 12 adjusts the optical path (advancing direction) of the electromagnetic waves reflected by the surface of the detection sensor 13 .

The detection sensor 13 has a surface on which an object to be detected is placed. The detection sensor 13 is arranged on the stage 14 . Stage 14 holds detection sensor 13 thereon. The stage 14 has a range of motion in the X, Y and Z directions shown in FIG. The stage 14 is operated by a drive unit (not shown) including a motor and the like. The stage 14 is moved by receiving a control signal from the control device 20 and driving the driving section. The stage 14 is movable in the X direction and the Y direction by the drive unit in order to irradiate the electromagnetic wave reflected by the reflection unit 12 to an arbitrary position on the surface of the detection sensor 13 . In addition, the stage 14 can be moved in the Z direction by a driving section in order to adjust the focal position of the electromagnetic waves irradiated to the detection sensor 13 .

The stage 14 is guided to the sample introduction section 16 by movement in the X direction. In FIG. 1, the sample introduction section 16, and the detection sensor 13 and the stage 14 located in the sample introduction section 16 are indicated by broken lines. The stage 14 (and the detection sensor 13 arranged thereon) can move, for example, to the detection position indicated by the solid line in FIG. 1 and the sample introduction position indicated by the broken line in FIG. The detection position is a position where an object to be detected is detected by irradiating the detection sensor 13 with electromagnetic waves. The sample introduction position is a position where an operation of introducing a detection sample including an object to be detected into the detection sensor 13 is performed.

The sample introduction unit 16 can access the outside of the detection device 10, for example, to introduce a sample onto the surface of the detection sensor 13, place the detection sensor 13 on the stage 14, and remove and replace the detection sensor 13. It has become. The introduction of the sample and the placement, removal, replacement, etc. of the detection sensor 13 may be controlled by the control device 20 or may be performed manually.

The detector 15 detects reflected waves, which are electromagnetic waves reflected by the detection sensor 13 . The detector 15 detects the intensity of electromagnetic waves as energy. The detector 15 is configured to output a detection signal indicating the intensity of the detected electromagnetic wave to the control device 20 . That is, the detector 15 detects a characteristic change (for example, a change in the reflectance of the electromagnetic wave) due to the electromagnetic wave emitted from the electromagnetic wave source 11 being reflected by the detection sensor 13 .

A detection operation by the detection device 10 will be described.
For example, in the detection device 10 , the stage 14 is moved to the sample introduction section 16 by the operation of a drive section (not shown) based on the control signal from the control device 20 . The sample introduction unit 16 introduces the sample onto the surface of the detection sensor 13 and arranges the detection sensor 13 on the stage 14 .

By the operation of the drive section based on the control signal from the control device 20, the stage 14 and the detection sensor 13 thereon are moved to the detection position where the electromagnetic wave reflected by the reflection section 12 is irradiated onto the desired position on the surface of the detection sensor 13. be moved.

Electromagnetic wave source 11 outputs electromagnetic wave L<b>1 based on a control signal from control device 20 . The output electromagnetic wave L1 is reflected by the reflecting unit 12, and the reflected electromagnetic wave L2 is irradiated to the object to be detected on the surface of the detection sensor 13. FIG. The irradiated electromagnetic wave L2 is reflected by the detection sensor 13 and returns to the reflecting section 12 as the electromagnetic wave L3, and the reflected wave L4, which is the electromagnetic wave reflected again by the reflecting section 12, reaches the detector 15. Detector 15 detects the intensity of reflected wave L4 and outputs a detection signal corresponding to the detected intensity to control device 20 .

FIG. 2 is a diagram for explaining the principle of detection by the detection device 10. As shown in FIG. As shown on the left side of FIG. 2, the detection device 10 irradiates the detection sensor 13 with an electromagnetic wave to detect the intensity of the reflected wave when the detection sample is not introduced into the detection sensor 13, and detects the intensity of the reflected wave. to the control device 20. For example, the measuring device 1 uses the ratio of the intensity of the reflected wave detected in this case to the intensity of the irradiated electromagnetic wave as the reference reflectance. Further, as shown in the center or right of FIG. 2, the detection device 10 irradiates the detection sensor 13 with an electromagnetic wave and detects the intensity of the reflected wave when the detection sample is introduced into the detection sensor 13. , outputs a detection signal corresponding to the detected intensity to the control device 20 .

In the example shown in FIG. 3, the frequency of the electromagnetic wave output by the electromagnetic wave generating source 11 is assumed to be frequency F1. At this time, the reflectance of the detection sensor 13 when there is no object to be detected (indicated by the dashed line 31) is acquired from the detection signal of the detector 15 as the first reflectance R1. The first reflectance R1 is the reference reflectance described above. In addition, the reflectance of the detection sensor 13 when there is an object to be detected (indicated by the dashed-dotted line 32 and the solid line 33) is the second reflectance R2 and the third reflectance R3, respectively, of the detector 15. It is obtained from the detected signal. The control device 20 identifies the presence or absence of the object to be detected based on the presence or absence of such change in reflectance detected by the detector 15 . In addition, the control device 20 specifies the amount or characteristics of the measurement object included in the object to be detected based on the amount of change in reflectance from the reference reflectance. That is, the control device 20 identifies the presence or absence of the object to be measured in the object or measures the amount based on the characteristic change (change in reflectance or transmittance) of the electromagnetic wave detected by the detector 15 .

For example, as the amount of the object to be detected increases, the amount of change in reflectance from the reference reflectance increases. The control device 20 measures the amount of the measurement object based on the amount of change. For example, in the case of FIGS. 2 and 3, since the amount of change with respect to the first reflectance R1, which is the reference reflectance, is greater for the third reflectance R3 than for the second reflectance R2, the amount of the object to be measured is greater in the case shown on the right side of FIG. 2 than in the case shown in the middle of FIG.

For example, the control device 20 compares the detection signal of the reflected wave when the detection sample is not introduced into the detection sensor 13 and the detection signal of the reflected wave when the detection sample is introduced, so that the detection sample is detected on the detection sensor 13. Determine if an object exists. The control device 20 may determine that there is no detected object if the two compared detection signals match or if the difference between the two detection signals is equal to or less than a predetermined threshold. If the difference between the two compared detection signals is greater than a predetermined threshold, the control device 20 may determine that the object is detected, and may calculate the amount of the object to be measured based on the difference. The control device 20 calculates the amount of the object to be measured from, for example, a relational expression between the characteristic change (change in frequency characteristic) of the electromagnetic wave and the amount of the object to be measured for the detection sensor 13, which is stored in advance in a memory (not shown). Calculate The detection results and calculation results may be output from the control device 20 to an external device such as a display device.

FIG. 4 is a diagram showing an example of an object 41 to be detected contained in a detection sample. The object 41 to be detected is a magnetic particle 42 mixed in a solvent such as water and an object 43 to be measured, which are combined by a chemical reaction or the like. That is, the object 41 to be detected is composed of the magnetic particles 42 and the object 43 to be measured. The magnetic particles 42 may be magnetic bodies such as magnetic beads. The measurement object 43 is, for example, bacteria. For example, the surfaces of the magnetic particles 42 are previously subjected to surface modification with which the object 43 to be measured specifically reacts. In FIG. 4 , an antibody that specifically binds to the object 43 to be measured is immobilized on the magnetic particles 42 . The antibody binds the magnetic particles 42 and the object 43 to be measured.

The configuration of the detection sensor 13 will be described in detail with reference to FIGS. 5A and 5B. FIG. 5A is a top view showing an example of the detection sensor 13. FIG. FIG. 5B is a cross-sectional view showing an example of the detection sensor 13. As shown in FIG. FIG. 5B shows a cross section along line VB-VB shown in FIG. 5A.

The detection sensor 13 has a first membrane 17 , a second membrane 18 and a third membrane 21 . The first film 17 and the third film 21 are made of gold, for example. Conductors other than gold, such as metals such as silver, copper, nickel, chromium, and germanium, or semiconductors may also be used. The first film 17 and the third film 21 may have a structure comprising multiple layers. The second film 18 is made of, for example, an inorganic material such as silicon or an organic material such as polyethylene. For example, second membrane 18 may comprise a layer such as chromium or titanium as an adhesion layer with first membrane 17 .

In the detection sensor 13, a first membrane 17 with air gaps is provided on a second membrane 18 without air gaps. As shown in FIG. 5A, a large number of, for example, C-shaped voids 19 are formed side by side in the first film 17 . Thus, the surface of the detection sensor 13 is formed with a pattern including uneven portions. The detection sensor 13 shown in FIGS. 5A and 5B is representative of a metamaterial resonator and is called a complementary split ring resonator.

A complementary split-ring resonator exhibits characteristic reflection characteristics when irradiated with an electromagnetic wave in a predetermined frequency band. That is, when an electromagnetic wave is irradiated, the portion of the first film 17 having the C-shaped void 19 electrically behaves like an LC circuit. Therefore, at frequencies near the resonant frequency of this LC circuit, the radiated electromagnetic wave interacts strongly with the complementary split ring resonator and is absorbed. As a result, the complementary split-ring resonator exhibits a reflective characteristic with reduced reflectivity near the resonant frequency of the LC circuit.

When a substance to be detected adheres to the complementary split ring resonator, the substance changes mainly the capacitive component of the LC circuit. As a result, the resonant frequency of the LC circuit changes. As described with reference to FIG. 3, the frequency characteristic of reflectance changes depending on whether or not there is an object to be detected in the complementary split ring resonator.

By utilizing this frequency characteristic change, the complementary split ring resonator functions as the detection sensor 13 . For example, the frequency of the electromagnetic wave output by the electromagnetic wave generation source 11 of the detection device 10 is set to a frequency near the resonance frequency of the LC circuit. The electromagnetic waves output from the electromagnetic wave generation source 11 are applied to the detection sensor 13 . The detector 15 detects electromagnetic waves reflected by the detection sensor 13 . The control device 20 identifies the presence or absence or amount of a substance on the detection sensor 13 based on the intensity of the detected electromagnetic waves.

Note that the configuration of the detection sensor 13 described above is an example. The shape of the gap of the detection sensor 13 is not limited to the C type, and the arrangement of the gap is not limited to that shown in the drawing. The shape of the voids may be any other shape, and the voids may be arranged regularly or periodically.

Although the configuration and detection principle of the detection device 10 that detects an object to be detected by detecting changes in the reflectance of electromagnetic waves have been described, the detection device is not limited to this. A device that detects an object using changes in the frequency characteristics of electromagnetic waves may be used. For example, as the detection device, a detection device that detects an object to be detected based on the reflection characteristics of the back surface of the detection sensor, a detection device that detects the object to be detected based on the transmission characteristics of the detection sensor, and other detection devices are used. you can

The detection sensor 13 has an ultrasonic wave generating element 51 . That is, the detection sensor 13 and the ultrasonic wave generating element 51 are integrated. For example, a rectangular ultrasonic wave generating element 51 is arranged on the first film 17 of the detection sensor 13 so as to surround the C-shaped air gap 19, and a third film 21 is arranged on the ultrasonic wave generating element 51. is formed. That is, the ultrasonic wave generating element 51 is arranged on the surface of the detection sensor 13 so as to surround the outer periphery of the entire pattern including the uneven portions, and is sandwiched between the first film 17 and the third film 21 .

The ultrasonic wave generating element 51 is driven by applying a voltage from the first film 17 and the third film 21 acting as electrodes by a driving circuit (not shown) based on a control signal from the control device 20. . The ultrasonic wave generating element 51 may be a piezoelectric actuator made of a piezoelectric material such as piezoelectric ceramics with a piezoelectric strain constant d31 or d33. The ultrasonic wave generating element 51 has, for example, a vibration mode of d31 (a vibration mode in which the ultrasonic wave generating element 51 expands and contracts in the thickness direction, that is, the Z direction) or a vibration mode of d33 (the length direction of the ultrasonic wave generating element 51, that is, the X direction). A vibration mode that stretches or stretches in the Y direction) is used to generate ultrasound in the Z direction.

Now, in normal sample preparation, after the sample containing the object 43 to be measured is mixed with the solution containing the magnetic particles 42 to form the object 41 to be detected, the steps of filtering, washing, separating, extracting and dropping are carried out. will be Each step will be described with reference to FIG. Each step may be performed by the measuring device 1 under the control of the control device 20, or may be performed manually. Note that when the measurement device 1 prepares a sample, the measurement device 1 may be called a sample preparation device.

First, filtering by the filter 100 is performed. The filter 100 is a general filter medium composed of a flat substrate 101 provided with a large number of holes 102 . The hole 102 is a through hole penetrating the base material 101 . The size of the hole 102, that is, the hole diameter, does not allow passage of the object to be detected 41 consisting of the magnetic particles 42 and the object 43 to be measured, but allows passage of the magnetic particles 42 not bound to the object 43 to be measured, ie, contaminants. is set to For example, the control device 20 moves the solution containing the magnetic particles 42 to which the measurement object 43 is bound and the single magnetic particles 42 to which the measurement object 43 is not bound to the filter 100, and the solution is transferred to the filter 100. Added. As a result, a filtering process is performed. Due to filtering, the object 41 to be detected mainly remains on the base material 101 of the filter 100 .

Subsequently, the filtered filter 100 is washed. For example, the controller 20 adds a solution such as a buffer solution to the filtered filter 100 . By this addition, the single magnetic particles 42 remaining in the filter 100 after filtering pass through the holes 102, and the filter 100 is washed. Pure water or the like may be used instead of the buffer solution. After cleaning, the object 41 to be detected remains as a residue on the substrate 101 of the filter 100 .

After cleaning, the object to be detected 41 is separated from the filter 100 . By exposing the filter 100 with the object to be detected 41 remaining to the solution 110 , the object to be detected 41 is separated from the filter 100 . For example, the control device 20 moves the filter 100 with the object 41 remaining thereon into the solution 110 , thereby separating the object 41 from the filter 100 .

After the object to be detected 41 is separated, a droplet or a predetermined amount of solution containing the object to be detected 41 is extracted from the solution 110 , and the droplet or a predetermined amount of solution is dropped onto the detection sensor 13 . This completes the preparation of the detection sample.

When the object 41 to be detected is separated from the filter 100, the object 41 to be detected may remain attached to the filter 100, or may adhere to the filter 100 once separated, and may not be separated from the filter 100. . If such an object 41 to be detected exists, the amount of the object 41 to be detected contained in a droplet or a predetermined amount of solution dropped onto the detection sensor 13 may decrease. Therefore, an error may occur in the detection result.

In this embodiment, the ultrasonic wave generating element 51 formed on the detection sensor 13 generates ultrasonic waves in the solution 110 when the object 41 to be detected is separated from the filter 100 . The generated ultrasonic waves dissociate all of the object 41 captured by the filter 100 into the solution 110 .

6A and 6B are diagrams for explaining sample preparation in this embodiment. FIG. 6A is a flow chart showing an example of sample preparation. FIG. 6B is a diagram illustrating how the sample is prepared.

In ACT1, controller 20 performs filtering by filter 100 as described above. The control device 20 moves the solution containing the magnetic particles 42 to which the measurement object 43 is bound and the single magnetic particles 42 to which the measurement object 43 is not bound to the filter 100, and adds the solution to the filter 100. . As a result, a filtering process is performed. Due to the filtering of ACT1, the object 41 to be detected mainly remains on the base material 101 of the filter 100 .

In ACT2, controller 20 performs cleaning of filter 100 after filtering as described above. Due to the cleaning of ACT2, the object to be detected 41 remains as a residue on the base material 101 of the filter 100 .

In ACT 3 , the control device 20 moves the filter 100 with the object 41 to be detected into the solution 110 . Here, a detection sensor 13 having an ultrasonic wave generating element 51 is arranged on the bottom surface of the container containing the solution 110 . In the solution 110 , for example, the filter surface to which the object 41 to be detected is attached faces the ultrasonic wave generating element 51 . The control device 20 causes the ultrasonic wave generating element 51 to generate an ultrasonic wave U by transmitting a drive signal to a drive circuit (not shown). The generated ultrasonic waves U cause the particles in the solution 110 to vibrate. Vibration is transmitted to the object to be detected 41 attached to the filter 100 , thereby separating the object to be detected 41 from the filter 100 . The separated object 41 to be detected settles in the solution 110 and deposits on the detection sensor 13, for example. By taking out the detection sensor 13 with the substance 41 to be detected deposited on the surface from the solution 110, preparation of the detection sample is completed.

In this way, the control device 20, as a control unit of the sample preparation device, causes the ultrasonic wave generating element 51 to generate ultrasonic waves, and the generated ultrasonic waves cause the object 41 to be detected from the filter 100 that has been captured. Separating the object 41 to acquire the detection sensor 13 on the surface of which the object 41 is arranged is controlled.

As described above, in this embodiment, the ultrasonic wave generating element 51 is formed on the detection sensor 13 . When the object 41 to be detected is separated from the filter 100 , the ultrasonic wave generation element 51 generates ultrasonic waves in the solution 110 , thereby affecting the filter 100 with the ultrasonic waves. The ultrasonic waves dissociate all the detected objects 41 captured by the filter 100 . The object 41 to be detected can be reliably separated from the filter 100 . Therefore, it is possible to provide the detection sensor 13 and the measuring device 1 that can reliably detect the detection object 41 by extracting all the detection object 41 captured by the filter 100 into the solution 110 .

In addition, the ultrasonic wave generating element 51 of the detection sensor 13 arranged on the bottom surface of the container containing the solution 110 generates ultrasonic waves, and the object 41 to be detected adhering to the filter 100 is deposited on the detection sensor 13. do. It is possible to eliminate the steps of extraction and dropping in the normal sample preparation process. Shortening of the time required for sample preparation in the sample preparation device is expected.

In this embodiment, the detection sensor 13 and the ultrasonic wave generating element 51 are integrated. By integrating, the first film 17 made of a conductor can be used as an electrode for applying a voltage to the film constituting the detection sensor 13 and the ultrasonic wave generating element 51 .

The shape and arrangement of the ultrasonic wave generating elements provided in the detection sensor 13 are not limited to those shown in FIGS. 5A and 5B. FIG. 7 is a top view showing another example of the detection sensor 13. FIG. For example, a circular ultrasonic wave generating element 51A may be arranged to surround the C-shaped gap 19 . That is, the ultrasonic wave generating element 51A may be arranged on the surface of the detection sensor 13 so as to surround the outer periphery of the entire pattern including the uneven portion. An annular ultrasonic wave generating element 51 may be provided on the outer circumference of the pattern (for example, the C-shaped gap 19 ) provided in the detection sensor 13 so as to surround the gap 19 .

FIG. 8A is a cross-sectional view showing another example of the detection sensor 13. FIG. FIG. 8B is a top view showing another example of the detection sensor 13. FIG. A plurality of ultrasonic wave generating elements 51B may be arranged so as to line up with a pattern such as the C-shaped void 19 provided in the detection sensor 13 . For example, in FIGS. 8A and 8B, C-shaped voids 19 and ultrasonic wave generating elements 51B are arranged alternately (every other). By arranging the ultrasonic wave generating element 51B between the C-shaped gaps 19, objects to be detected are likely to gather there when ultrasonic waves are generated. Various arrangements other than the alternating arrangement are possible.

While several embodiments of the invention have been described, these embodiments have been presented by way of example and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, replacements, and modifications can be made without departing from the scope of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, and are included in the scope of the invention described in the claims and equivalents thereof.
The invention described in the original claims of the present application is appended below.
[1]
What is claimed is: 1. A detection sensor that is used in a detection device that detects an object to be detected based on changes in reflectance or transmittance of an electromagnetic wave, and that has a surface irradiated with the electromagnetic wave, the detection sensor having an ultrasonic wave generating element.
[2]
A pattern including an uneven portion is formed on the surface of the detection sensor,
The detection sensor according to [1], wherein the ultrasonic wave generating element is arranged on the surface so as to surround the outer circumference of the entire pattern.
[3]
A pattern including an uneven portion is formed on the surface of the detection sensor,
The detection sensor according to [1], wherein the ultrasonic wave generating element is arranged on the surface side by side with the uneven portion of the pattern.
[4]
The detection sensor according to any one of [1] to [3], wherein the ultrasonic wave generating element is made of a piezoelectric material.
[5]
The detection sensor according to any one of [1] to [4];
an irradiation unit that irradiates the object on the surface with an electromagnetic wave;
a detector that detects changes in reflectance or transmittance of the electromagnetic wave;
and a control unit that identifies the presence or absence of a measurement object in the object or measures the amount thereof based on the characteristic change of the electromagnetic wave detected by the detector.
[6]
A detection sensor that is used in a detection device that detects an object to be detected based on changes in the reflectance or transmittance of the electromagnetic wave and that has a surface irradiated with the electromagnetic wave, the detection sensor including an ultrasonic wave generating element;
generating ultrasonic waves from the ultrasonic wave generating element;
separating the detected object from a filter in which the detected object is captured by the generated ultrasonic wave to obtain the detection sensor having the detected object disposed on the surface;
A sample preparation device, comprising a controller that controls the

DESCRIPTION OF SYMBOLS 1... Measuring apparatus, 10... Detecting apparatus, 11... Electromagnetic wave source, 12... Reflecting part, 13... Detection sensor, 14... Stage, 15... Detector, 16... Sample introduction part, 20... Control device, 41... To be detected Object, 42...Magnetic particles, 43...Object to be measured, 51...Ultrasonic wave generating element.

Claims (4)

A flat detection sensor having a surface on which the object to be detected is deposited and the electromagnetic wave is irradiated, the sensor being used in a detection device that detects an object to be detected by a change in the reflectance or transmittance of an electromagnetic wave, the detection sensor comprising: positioned on the surface to cause the analyte to separate into the solution from a filter in which the analyte is trapped, and to deposit the separated analyte on the surface. An ultrasonic wave generating element integrated with the detection sensor and generating an ultrasonic wave upward from the surface of the detection sensor, a pattern including an uneven portion is formed on the surface of the detection sensor, and the ultrasonic wave The detection sensor, wherein the generating element is arranged on the surface so as to surround the outer periphery of the entire pattern, or arranged side by side with the uneven portion of the pattern. 2. The detection sensor of claim 1 , wherein the ultrasonic wave generating element is made of piezoelectric material. A detection sensor according to claim 1 or 2 ;
an irradiation unit that irradiates the electromagnetic wave to the object on the surface;
a detector that detects changes in reflectance or transmittance of the electromagnetic wave;
and a control unit that identifies the presence or absence of a measurement object in the object or measures the amount thereof based on the characteristic change of the electromagnetic wave detected by the detector. A flat plate-shaped detection sensor having an ultrasonic wave generating element on a surface on which the object to be detected is deposited and the electromagnetic wave is irradiated, for use in a detection device that detects an object to be detected based on changes in reflectance or transmittance of electromagnetic waves. A pattern including an uneven portion is formed on the surface, and the ultrasonic wave generating element is arranged on the surface so as to surround the outer periphery of the entire pattern, or the unevenness of the pattern is arranged on the surface. The bottom surface of a container containing a solution so that the ultrasonic wave generating element faces the filter surface of the filter on which the object to be detected is attached, which is arranged side by side with the part and traps the object to be detected. a detection sensor arranged with the ultrasonic wave generating element facing upward;
generating ultrasonic waves from the ultrasonic wave generating element;
separating the object to be detected from the filter by the generated ultrasonic wave to obtain the detection sensor having the object to be detected on the surface;
A sample preparation device, comprising a controller that controls the

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