JP4305338B2 - 酸化亜鉛膜のパターニング方法 - Google Patents
酸化亜鉛膜のパターニング方法 Download PDFInfo
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- JP4305338B2 JP4305338B2 JP2004260378A JP2004260378A JP4305338B2 JP 4305338 B2 JP4305338 B2 JP 4305338B2 JP 2004260378 A JP2004260378 A JP 2004260378A JP 2004260378 A JP2004260378 A JP 2004260378A JP 4305338 B2 JP4305338 B2 JP 4305338B2
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- Prior art keywords
- zinc oxide
- oxide film
- etching
- phosphoric acid
- isopropyl alcohol
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Thin Film Transistor (AREA)
Description
2 酸化亜鉛膜
3 レジスト膜
Claims (3)
- 基板上に酸化亜鉛膜を成膜する工程と、前記酸化亜鉛膜上にレジスト膜をパターン形成する工程と、前記レジスト膜をマスクとして、リン酸水溶液にイソプロピルアルコールを添加してなるエッチング液を用いて前記酸化亜鉛膜をパターニングする工程とを有することを特徴とする酸化亜鉛膜のパターニング方法。
- 請求項1に記載の発明において、イソプロピルアルコールの添加率は90%未満であることを特徴とする酸化亜鉛膜のパターニング方法。
- 請求項1に記載の発明において、イソプロピルアルコールの添加率は20〜50%であることを特徴とする酸化亜鉛膜のパターニング方法。
Priority Applications (1)
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JP2004260378A JP4305338B2 (ja) | 2004-09-08 | 2004-09-08 | 酸化亜鉛膜のパターニング方法 |
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JP2004260378A JP4305338B2 (ja) | 2004-09-08 | 2004-09-08 | 酸化亜鉛膜のパターニング方法 |
Publications (2)
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JP2006080172A JP2006080172A (ja) | 2006-03-23 |
JP4305338B2 true JP4305338B2 (ja) | 2009-07-29 |
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JP2004260378A Expired - Fee Related JP4305338B2 (ja) | 2004-09-08 | 2004-09-08 | 酸化亜鉛膜のパターニング方法 |
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JP (1) | JP4305338B2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8003431B2 (en) * | 2009-10-21 | 2011-08-23 | Electronics And Telecommunications Research Institute | Method for antireflection treatment of a zinc oxide film and method for manufacturing solar cell using the same |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5228295B2 (ja) * | 2006-07-21 | 2013-07-03 | カシオ計算機株式会社 | 半導体装置の製造方法 |
JPWO2009028453A1 (ja) * | 2007-08-31 | 2010-12-02 | コニカミノルタホールディングス株式会社 | 薄膜トランジスタ |
JP2010010175A (ja) * | 2008-06-24 | 2010-01-14 | Konica Minolta Holdings Inc | 薄膜トランジスタおよび薄膜トランジスタの製造方法 |
JP2010016037A (ja) * | 2008-07-01 | 2010-01-21 | Konica Minolta Holdings Inc | 薄膜トランジスタの製造方法 |
JP5004885B2 (ja) * | 2008-07-15 | 2012-08-22 | スタンレー電気株式会社 | 半導体構造の加工方法 |
KR101667909B1 (ko) * | 2008-10-24 | 2016-10-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치의 제조방법 |
WO2010047288A1 (en) * | 2008-10-24 | 2010-04-29 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductordevice |
US8741702B2 (en) * | 2008-10-24 | 2014-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
JP5699463B2 (ja) * | 2010-07-06 | 2015-04-08 | 東ソー株式会社 | 窒化ケイ素のエッチング液及びエッチング方法 |
-
2004
- 2004-09-08 JP JP2004260378A patent/JP4305338B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8003431B2 (en) * | 2009-10-21 | 2011-08-23 | Electronics And Telecommunications Research Institute | Method for antireflection treatment of a zinc oxide film and method for manufacturing solar cell using the same |
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Publication number | Publication date |
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JP2006080172A (ja) | 2006-03-23 |
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