JP3565204B2 - Electronic equipment - Google Patents

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Publication number
JP3565204B2
JP3565204B2 JP2001400103A JP2001400103A JP3565204B2 JP 3565204 B2 JP3565204 B2 JP 3565204B2 JP 2001400103 A JP2001400103 A JP 2001400103A JP 2001400103 A JP2001400103 A JP 2001400103A JP 3565204 B2 JP3565204 B2 JP 3565204B2
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Japan
Prior art keywords
electrode
element mounting
resin
reinforcing member
ceramic substrate
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JP2001400103A
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Japanese (ja)
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JP2003197681A (en
Inventor
純司 藤野
洋一 北村
紀雄 竹内
直 高木
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

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  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Combinations Of Printed Boards (AREA)
  • Wire Bonding (AREA)

Description

【0001】
【発明の属する技術分野】
この発明は、電子装置に関わり、特に、電子装置を構成する複数の基板の接合強度を向上させ、その電気的信頼性を高める技術に関する。
【0002】
【従来の技術】
電子機器の構成部品を実装する際、半導体素子などを固定するセラミック基板とこのセラミック基板を搭載する有機プリント配線基板との接合に、ハンダバンプ(半田ボール)を用いることが一般的に行われている。ところが、ハンダバンプを用いるBGA(Ball Grid Array)基板では、セラミック基板の熱膨張率が3ppm/℃程度であるのに対して、有機プリント配線基板の熱膨張率は20〜60ppm/℃と前者に比べて大きいため、昇温時にはセラミック基板と有機プリント配線基板の熱膨張率差に起因する応力が発生し、この応力により、接合されたハンダバンプやセラミック基板にクラックが発生し、導通不良が生じることがある。
【0003】
このような2種類の熱膨張率の異なる基板の間に発生するクラックや導通不良を防止することを目的にして、様々な手法が提案されている。例えば、図5に示すように、固定棒を用いて2枚の基板の端部を固定する方法が特開平10−209213号公報に開示されている。
【0004】
図5に示されている半導体装置の端部を表す断面図おいて、10はセラミックス製BGA基板、20はプリント基板、21は凹部、30、60はメタライズパッド、40、50は共晶ハンダ、70は高温ハンダボール(バンプ)、80は固定棒、90、110は接合材、100は貫通穴である。セラミックス製BGA基板10の少なくとも2個所以上の角には貫通穴100が形成され、プリント基板20の貫通穴100に相対する箇所には固定棒80が設けられている。
【0005】
プリント基板20に搭載されたセラミックス製BGA基板10は、温度変化で膨張収縮するプリント基板20の変形を、固定棒80を介して抑えることができる。しかし、この方法では、セラミックス製BGA基板10に貫通穴100の形成と、プリント基板20には凹部21の形成が必要で、しかも固定棒80を凹部21に接合するために、高温ハンダボール70とは別に、はんだ付を実施する必要がある。従って、部品点数や工程数が増大するため、製造コストの上昇をまねくことが懸念される。
【0006】
【発明が解決しようとする課題】
本発明は、このような問題点を解決するためになされたもので、部品点数や工程数を大幅に増大させること無く、簡便な方法で、セラミック基板と有機プリント配線基板などのように熱膨張率が異なる基板どうしを多層に積層した場合に生じるクラックの発生を抑制することを目的としている。
【0007】
【課題を解決するための手段】
本発明にかかわる電子装置は、素子搭載面の裏側に第1の電極が形成された素子搭載基板と、素子搭載基板と所定間隔を隔てて対向するように配置され、しかも第1の電極に対向する位置に第2の電極が形成された配線基板と、第1の電極と第2の電極を接合する溶融性部材と、溶融性部材よりも外方に配置され、素子搭載基板の端部とこの端部に対向する配線基板の部位とを接着する樹脂製補強部材を備えてなるものである。
【0008】
また、樹脂製補強部材は、素子搭載基板の側面から外方に向かって裾広がりの形状を有しているものである。
【0009】
また、樹脂製補強部材は、素子搭載基板の全周にわたって適宜間隔をおいて形成されているものである。
【0010】
また、樹脂製補強部材の硬化前の粘度は、5,000cps以上、200,000cps以下である。
【0011】
また、溶融性部材と樹脂製補強部材の間に、溶融性部材から離れて、その周囲を囲むように形成された樹脂製壁部材を備えているものである。
【0012】
【発明の実施の形態】
本発明に係る電子装置の実施の形態1を、図1に示す断面図を用いて説明する。セラミック基板(素子搭載基板)1は、例えば、数枚のセラミックのグリーンシートを積層・焼成したLTCC(Low Temperature Co−fired Ceramic)で、層間には配線パタンが形成されており、この配線パタンを介してセラミック基板1の上面および下面にそれぞれ形成されている素子パッド3とバンプパッド4A(第1の電極)の導通が確保される。
【0013】
セラミック基板1の上面には、シリコンセンサー(歪みセンサーなど)、薄膜磁気ヘッド、半導体素子などの素子2が搭載され、この素子2は素子パッド3と接続されている。素子パッド3とバンプパッド4Aは、セラミックのグリーンシートに銀ペーストなどの電極材を印刷あるいは塗布したのち、焼成することによって形成される。
【0014】
プリント基板(配線基板)7の上面(セラミック基板1と対向する面)には、バンプパッド4Aと対向する位置にバンプパッド4B(第2の電極)が形成されている。プリント基板7にバンプパッド4Bを形成するには通常のプリント印刷の手法を適応できる。
【0015】
バンプパッド4Aとバンプパッド4Bははんだ、ロー材等からなるバンプ(溶融性部材)8で接合されている。セラミック基板1の外周には、セラミック基板1とプリント基板2を接着する補強部材6が、取り囲むように形成されている。
【0016】
セラミック基板1とプリント基板7を接合する手順を、図2(a)〜図2(c)を用いて説明する。先ず、治具(図示せず)を用いて、バンプパッド4Aに重なるようにバンプ8を位置決めし、保持する。セラミック基板1と溶融する前のバンプ8を保持した状態で、全体をバンプ8の融点以上にまで昇温し、バンプパッド4Aにバンプ8の片側を接合する(図2(a)参照)。
【0017】
次いで、バンプ8がバンプパッド4Aに接合されたセラミック基板1を裏返し、バンプ8がバンプパッド4Bと対向するように、セラミック基板1とプリント基板3との位置決めを行う。このように位置決めされた状態で、全体を再び昇温し、バンプ8とバンプパッド4Bを接合させる(図2(b)参照)。
【0018】
次いで、セラミック基板1の外周に、例えば、ニードル9を用いて適度な粘性を有する接着性樹脂を供給し、全体を昇温すると、この樹脂が硬化し、セラミック基板1とプリント基板3を接着する補強部材6が形成される(図2(c)参照)。補強部材6は、接着性樹脂を供給し、硬化させるだけで形成できるので、工程や部品数を大幅に増加することがない。
【0019】
後述する実施例1では、接着性樹脂に粘度が23,000cpsのエポキシ系樹脂を使用しているが、補強部材6の形状を整えるために接着性樹脂にはある程度の粘性が必要で、そのために接着性樹脂の粘度は5,000cps以上であることが望ましい。しかし粘性が高くなるとニードル等から吐出することが困難になるため、粘度は200,000cps以下であることが望ましい。
【0020】
接着性樹脂はセラミック基板1の端部、特に側面に、すなわち補強部材6がセラミック基板1の側面から外方にはみ出るように、供給することが望ましい。セラミック基板1の側面から外方に広がる裾広がりの形状を呈する補強部材6は、セラミック基板1からはみ出ていない場合に比べ、はるかに強固に基板どうしを固定する。
【0021】
接着性樹脂はセラミック基板1とプリント基板3の内部間隙まで供給されていても構わないが、バンプ8に補強部材6が直接触れると、補強部材6にクラックが形成されやすい。この結果、補強部材6の効果が低下する。特に、接着性樹脂に粘性が低いものを使用する場合、外周に供給された樹脂が硬化する前にバンプ8に向かって、セラミック基板1とプリント基板3の間隙を進入し、バンプ8と補強部材6が接触しやすいの、接触を避けるように注意を払う必要がある。
【0022】
そこで、図3(実施の形態2)に示されるように、補強部材6とバンプ8の間に、接着性樹脂の進入を防止する壁部材9をバンプ8の周囲を囲むように設けてもよい。壁部材9は、接着性樹脂の粘度が低い場合でも、接着性樹脂が基板の間隙に進入し、バンプ8に接触すること防ぐ。
【0023】
壁部材9の形成は、補強部材6を形成する前に、バンプ8とバンプパッド4Bを接合する時に行うと工程が簡略化される。このために壁部材9を構成する樹脂の硬化温度は、補強部材6の硬化温度よりも高いことが望ましく、バンプ8の接合温度と同程度であればさらに望ましい。
【0024】
なお、セラミック基板1の周囲を補強部材6で完全に封じることは、セラミック基板1とプリント基板3の間隙に存在する空気、およびバンプ8に発生する熱を閉じ込めることになるので好ましくない。この意味で補強部材6および壁部材9は、適当な隙間を設けて、数箇所に別れて配置されていることが望ましい。ただし、壁部材9の隙間を配置する位置は、固化する前の補強部材6がバンプ8にまで進入できないような位置関係を所有していることが必要である。
【0025】
本発明にかかわる電子装置は、昇温によってセラミック基板1とプリント基板7に反りが生じるように応力が発生しても、補強部材6がセラミック基板1の端部をプリント基板7に強固に固定するため、バンプ8に加わる応力が低減される。このためバンプ8にクラックが入ったり、セラミック基板1に亀裂が入ることを抑制する。その結果、電子装置の電気的信頼性が向上する。
【0026】
また、補強部材6は固化する前は液状であるため、補強部材6がプリント基板3に届かずに未接合不良が生じるといった不都合も生じない。
つぎに、本発明の効果を実施例に基づいて説明する。
【0027】
実施例1.
セラミック基板(30mm×30mm)には、900℃で焼成された厚さ1mmのものを使用した。セラミック基板の中央部には、φ0.5mmのバンプパッド4Aを1mmピッチで729個(27列×27行)形成した。プリント基板(30mm×30mm)には厚さ1.6mmのものを使用し、中央部には、φ0.5mmのバンプパッド4Bを1mmピッチで729個(27列×27行)形成した。
【0028】
バンプ8には融点183℃のはんだ(63Sn−37Pb)を用い、バンプパッド4A、4Bを230℃で接合した。補強部材6にはエポキシ樹脂系封止樹脂(EH0548−8,デクスター社)を用い、150℃で一時間硬化させた。
【0029】
次に、以上のようにして作成した電子装置の耐クラック性を評価するために、ヒートサイクル試験(−40℃〜+125℃、15min./15min.)を行った。図4はヒートサイクル試験を1000サイクル実施した後の電子装置の断面観察写真である。補強部材6がない場合、30サイクル程度経ると、セラミック基板1の内部に拡がるクラックが観察されるが、1000サイクル経た後でも図4に示されるように全くクラックを発見できなかった。
【0030】
実施例2.
実施例2では、図3に示される実施の形態2に基づいて、壁部材9を形成した。壁部材9には粘度50,000cpsのエポキシ樹脂系封止樹脂(CB011−1R,デクスター社)を用いた。
【0031】
先ずバンプパッド4Aとバンプ8が接合されたセラミック基板1をプリント基板に対して位置決めを行った。さらにCB011−1Rをバンプ8の周囲を囲むように塗布し、セラミック基板1とプリント基板3を230℃で一時間硬化させた。このとき、バンプパッド4Bとバンプ8の接合が同時に進行した。
【0032】
次に、エポキシ系封止樹脂(EH0548−8,デクスター社)をセラミック基板1の側面に塗布し、150℃で一時間硬化させて補強部材6を形成した。
以上のように作成した実施の形態2に係る電子装置でも、充分な耐クラック性を確認できた。
【0033】
なお、実施の形態1と2では、熱膨張率の異なる2種類の基板を接合する例を示したが、熱膨張率の等しい基板を接合する場合、例えば素子を搭載するセラミック基板(小)とこのセラミック基板を支持する配線セラミック基板(大)を固定する場合、にも本発明を適用出来ることは言うまでもない。
【0034】
【発明の効果】
本発明にかかわる電子装置は、素子搭載面の裏側に第1の電極が形成された素子搭載基板と、素子搭載基板と所定間隔を隔てて対向するように配置され、しかも第1の電極に対向する位置に第2の電極が形成された配線基板と、第1の電極と第2の電極を接合する溶融性部材と、溶融性部材よりも外方に配置され、素子搭載基板の端部とこの端部に対向する配線基板の部位とを接着する樹脂製補強部材を備えていることにより、溶融性部材等にクラックが発生することを抑制できる。
【0035】
また、樹脂製補強部材は、素子搭載基板の側面から外方に向かって裾広がりの形状を有していることにより、溶融性部材等にクラックが発生することを抑制できる。
【0036】
また、樹脂製補強部材は、素子搭載基板の全周にわたって適宜間隔をおいて形成されていることにより、溶融性部材からの発熱を放散できる。
【0037】
また、樹脂製補強部材の硬化前の粘度は、5,000cps以上、200,000cps以下であることにより、樹脂を吐出し、その形状を整えることが出来る。
【0038】
また、溶融性部材と樹脂製補強部材の間に、溶融性部材から離れて、その周囲を囲むように形成された樹脂製壁部材を備えていることにより、樹脂製補強部材と溶融性部材の接触を防止できる。
【図面の簡単な説明】
【図1】本発明にかかる電子装置(実施の形態1)の断面を表す図である。
【図2】補強樹脂部材を形成する工程を説明するための図である。
【図3】実施の形態2にかかる電子装置の断面を表す図である。
【図4】ヒートサイクル試験を1,000回実施した後の電子装置の断面を表す図(写真)である。
【図5】従来の電子装置(半導体装置)の断面を表す図である。
【符号の説明】
1 セラミック基板(素子搭載基板)、 2 素子、 3 素子パッド、 4A、4B バンプパッド(第1の電極、第2の電極)、 6 補強部材、 7 プリント基板(配線基板)、 8 バンプ(溶融性部材)、 9 壁部材
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to an electronic device, and more particularly to a technique for improving the bonding strength of a plurality of substrates constituting an electronic device and improving the electrical reliability.
[0002]
[Prior art]
When mounting components of electronic devices, it is common practice to use solder bumps (solder balls) to join a ceramic substrate for fixing a semiconductor element and the like to an organic printed wiring board on which the ceramic substrate is mounted. . However, in a BGA (Ball Grid Array) substrate using solder bumps, the thermal expansion coefficient of a ceramic substrate is about 3 ppm / ° C., whereas the thermal expansion coefficient of an organic printed wiring board is 20 to 60 ppm / ° C. Therefore, when the temperature rises, a stress is generated due to the difference in the coefficient of thermal expansion between the ceramic substrate and the organic printed wiring board, and this stress may cause cracks in the joined solder bumps and the ceramic substrate, resulting in poor conduction. is there.
[0003]
Various methods have been proposed for the purpose of preventing cracks and poor conduction occurring between such two types of substrates having different coefficients of thermal expansion. For example, as shown in FIG. 5, a method of fixing the ends of two substrates using a fixing rod is disclosed in Japanese Patent Application Laid-Open No. Hei 10-209213.
[0004]
Oite the cross-sectional view showing an end portion of the semiconductor device shown in FIG. 5, the ceramic-made BGA substrate 10, 20 is a printed circuit board, 21 is concave, 30, 60 metallized pads, 40 and 50 eutectic solder , 70 are high-temperature solder balls (bumps), 80 is a fixing rod, 90 and 110 are bonding materials, and 100 is a through hole. Through holes 100 are formed at at least two corners of the ceramic BGA substrate 10, and fixing bars 80 are provided at positions corresponding to the through holes 100 on the printed circuit board 20.
[0005]
The ceramic BGA substrate 10 mounted on the printed circuit board 20 can suppress the deformation of the printed circuit board 20 that expands and contracts due to a temperature change via the fixing rod 80. However, in this method, it is necessary to form the through hole 100 in the ceramic BGA substrate 10 and to form the concave portion 21 in the printed circuit board 20, and further, to join the fixing rod 80 to the concave portion 21, Separately, soldering must be performed. Therefore, since the number of parts and the number of steps are increased, there is a concern that the manufacturing cost may be increased.
[0006]
[Problems to be solved by the invention]
The present invention has been made in order to solve such a problem, and does not significantly increase the number of parts and the number of steps, and in a simple method, such as a ceramic substrate and an organic printed wiring board, has a thermal expansion. It is an object of the present invention to suppress the occurrence of cracks generated when multiple substrates having different rates are laminated.
[0007]
[Means for Solving the Problems]
An electronic device according to the present invention is arranged such that an element mounting substrate on which a first electrode is formed on the back side of an element mounting surface is opposed to the element mounting substrate at a predetermined distance, and furthermore, opposes the first electrode. A wiring substrate having a second electrode formed at a position where the first electrode and the second electrode are to be joined; and a fusible member that joins the first electrode and the second electrode; It is provided with a resin-made reinforcing member for adhering a part of the wiring board facing the end.
[0008]
The resin-made reinforcing member has a shape that expands from the side surface of the element mounting board outward.
[0009]
The resin reinforcing members are formed at appropriate intervals over the entire circumference of the element mounting board.
[0010]
The viscosity of the resin reinforcing member before curing is 5,000 cps or more and 200,000 cps or less.
[0011]
Further, a resin wall member is provided between the fusible member and the resin reinforcing member so as to be spaced from the fusible member and surround the periphery thereof.
[0012]
BEST MODE FOR CARRYING OUT THE INVENTION
First Embodiment An electronic device according to a first embodiment of the present invention will be described with reference to a cross-sectional view shown in FIG. The ceramic substrate (element mounting substrate) 1 is, for example, an LTCC (Low Temperature Co-fired Ceramic) obtained by laminating and firing several ceramic green sheets, and a wiring pattern is formed between layers. Through this, conduction between the element pads 3 formed on the upper and lower surfaces of the ceramic substrate 1 and the bump pads 4A (first electrodes) is ensured.
[0013]
An element 2 such as a silicon sensor (such as a strain sensor), a thin film magnetic head, or a semiconductor element is mounted on the upper surface of the ceramic substrate 1, and the element 2 is connected to an element pad 3. The element pads 3 and the bump pads 4A are formed by printing or applying an electrode material such as a silver paste on a ceramic green sheet, and then firing.
[0014]
On the upper surface (the surface facing the ceramic substrate 1) of the printed circuit board (wiring substrate) 7, a bump pad 4B (second electrode) is formed at a position facing the bump pad 4A. In order to form the bump pads 4B on the printed board 7, a normal print printing technique can be applied.
[0015]
The bump pad 4A and the bump pad 4B are joined by a bump (fusible member) 8 made of solder, a solder material, or the like. A reinforcing member 6 for bonding the ceramic substrate 1 and the printed board 2 is formed on the outer periphery of the ceramic substrate 1 so as to surround the same.
[0016]
A procedure for joining the ceramic substrate 1 and the printed board 7 will be described with reference to FIGS. 2 (a) to 2 (c). First, the bump 8 is positioned and held using a jig (not shown) so as to overlap the bump pad 4A. While holding the bumps 8 before melting with the ceramic substrate 1, the whole is heated to a temperature equal to or higher than the melting point of the bumps 8, and one side of the bumps 8 is joined to the bump pads 4A (see FIG. 2A).
[0017]
Next, the ceramic substrate 1 with the bump 8 bonded to the bump pad 4A is turned over, and the ceramic substrate 1 and the printed board 3 are positioned so that the bump 8 faces the bump pad 4B. In this state, the entire body is heated again to bond the bump 8 and the bump pad 4B (see FIG. 2B).
[0018]
Next, an adhesive resin having an appropriate viscosity is supplied to the outer periphery of the ceramic substrate 1 using, for example, the needle 9, and when the whole is heated, the resin is cured and the ceramic substrate 1 and the printed substrate 3 are bonded. The reinforcing member 6 is formed (see FIG. 2C). Since the reinforcing member 6 can be formed only by supplying and curing the adhesive resin, the number of steps and the number of components are not significantly increased.
[0019]
In Example 1 described later, an epoxy resin having a viscosity of 23,000 cps is used as the adhesive resin. However, in order to adjust the shape of the reinforcing member 6, the adhesive resin needs to have a certain degree of viscosity. The viscosity of the adhesive resin is desirably 5,000 cps or more. However, it becomes difficult to discharge from a needle or the like as the viscosity increases, so that the viscosity is desirably 200,000 cps or less.
[0020]
It is desirable that the adhesive resin be supplied to the end portion, particularly the side surface of the ceramic substrate 1, that is, such that the reinforcing member 6 protrudes outward from the side surface of the ceramic substrate 1. The reinforcing member 6, which has a flared shape that extends outward from the side surface of the ceramic substrate 1, fixes the substrates much more firmly than when they do not protrude from the ceramic substrate 1.
[0021]
The adhesive resin may be supplied up to the internal gap between the ceramic substrate 1 and the printed circuit board 3, but if the reinforcing member 6 directly touches the bump 8, a crack is easily formed in the reinforcing member 6. As a result, the effect of the reinforcing member 6 decreases. In particular, when a low-viscosity adhesive resin is used, the resin supplied to the outer periphery enters the gap between the ceramic substrate 1 and the printed circuit board 3 toward the bump 8 before the resin hardens, and the bump 8 and the reinforcing member 6 is the most likely to contact, there is a need to pay attention to avoid contact.
[0022]
Therefore, as shown in FIG. 3 (Embodiment 2), a wall member 9 for preventing the adhesive resin from entering may be provided between the reinforcing member 6 and the bump 8 so as to surround the periphery of the bump 8. . The wall member 9 prevents the adhesive resin from entering the gap between the substrates and coming into contact with the bumps 8 even when the viscosity of the adhesive resin is low.
[0023]
If the formation of the wall member 9 is performed when the bump 8 and the bump pad 4B are joined before the formation of the reinforcing member 6, the process is simplified. For this reason, the curing temperature of the resin constituting the wall member 9 is desirably higher than the curing temperature of the reinforcing member 6, and more desirably the same as the joining temperature of the bumps 8.
[0024]
It is not preferable to completely seal the periphery of the ceramic substrate 1 with the reinforcing member 6 because air existing in the gap between the ceramic substrate 1 and the printed board 3 and heat generated in the bumps 8 are confined. In this sense, it is desirable that the reinforcing member 6 and the wall member 9 are separately arranged at several places with an appropriate gap. However, it is necessary that the position where the gap of the wall member 9 is disposed has a positional relationship such that the reinforcing member 6 before solidification cannot enter the bump 8.
[0025]
In the electronic device according to the present invention, the reinforcing member 6 firmly fixes the end of the ceramic substrate 1 to the printed circuit board 7 even if stress is generated so that the ceramic substrate 1 and the printed circuit board 7 are warped by the temperature rise. Therefore, the stress applied to the bump 8 is reduced. For this reason, cracks in the bumps 8 and cracks in the ceramic substrate 1 are suppressed. As a result, the electrical reliability of the electronic device is improved.
[0026]
Further, since the reinforcing member 6 is in a liquid state before it is solidified, there is no inconvenience that the reinforcing member 6 does not reach the printed circuit board 3 and a defective connection occurs.
Next, effects of the present invention will be described based on examples.
[0027]
Embodiment 1 FIG.
A ceramic substrate (30 mm × 30 mm) having a thickness of 1 mm fired at 900 ° C. was used. At the center of the ceramic substrate, 729 (27 columns × 27 rows) bump pads 4A having a diameter of 0.5 mm were formed at a pitch of 1 mm. A printed board (30 mm × 30 mm) having a thickness of 1.6 mm was used, and 729 (27 columns × 27 rows) bump pads 4 B having a diameter of 0.5 mm were formed at a pitch of 1 mm in the center.
[0028]
The bumps 4A and 4B were joined at 230 ° C. by using solder (63Sn-37Pb) having a melting point of 183 ° C. for the bumps 8. An epoxy resin-based sealing resin (EH0548-8, Dexter) was used for the reinforcing member 6 and cured at 150 ° C. for one hour.
[0029]
Next, a heat cycle test (−40 ° C. to + 125 ° C., 15 min./15 min.) Was performed to evaluate the crack resistance of the electronic device prepared as described above. FIG. 4 is a cross-sectional observation photograph of the electronic device after 1000 cycles of the heat cycle test. In the case where the reinforcing member 6 was not provided, cracks extending inside the ceramic substrate 1 were observed after about 30 cycles, but no cracks were found at all even after 1000 cycles as shown in FIG.
[0030]
Embodiment 2. FIG.
In Example 2, the wall member 9 was formed based on Embodiment 2 shown in FIG. For the wall member 9, an epoxy resin-based sealing resin having a viscosity of 50,000 cps (CB011-1R, Dexter) was used.
[0031]
First, the ceramic substrate 1 on which the bump pads 4A and the bumps 8 were bonded was positioned with respect to the printed circuit board. Further, CB011-1R was applied so as to surround the periphery of the bump 8, and the ceramic substrate 1 and the printed substrate 3 were cured at 230 ° C. for one hour. At this time, the bonding of the bump pad 4B and the bump 8 proceeded simultaneously.
[0032]
Next, an epoxy-based sealing resin (EH0548-8, Dexter) was applied to the side surface of the ceramic substrate 1 and cured at 150 ° C. for one hour to form a reinforcing member 6.
Also with the electronic device according to the second embodiment created as described above, sufficient crack resistance was confirmed.
[0033]
In the first and second embodiments, an example is shown in which two types of substrates having different coefficients of thermal expansion are bonded. However, when substrates having the same coefficient of thermal expansion are bonded, for example, a ceramic substrate (small) on which elements are mounted is connected to a small substrate. It is needless to say that the present invention can be applied to the case where the wiring ceramic substrate (large) supporting the ceramic substrate is fixed.
[0034]
【The invention's effect】
An electronic device according to the present invention is arranged such that an element mounting substrate on which a first electrode is formed on the back side of an element mounting surface is opposed to the element mounting substrate at a predetermined distance, and furthermore, opposes the first electrode. A wiring substrate having a second electrode formed at a position where the first electrode and the second electrode are to be joined; and a fusible member that joins the first electrode and the second electrode; The provision of the resin-made reinforcing member for bonding the end portion to the portion of the wiring board facing the end portion can suppress the occurrence of cracks in the fusible member or the like.
[0035]
In addition, since the resin-made reinforcing member has a shape that expands outward from the side surface of the element mounting substrate, cracks can be suppressed in the fusible member and the like.
[0036]
Further, since the resin reinforcing member is formed at appropriate intervals over the entire circumference of the element mounting board, heat generated from the fusible member can be dissipated.
[0037]
In addition, when the viscosity of the resin-made reinforcing member before curing is 5,000 cps or more and 200,000 cps or less, the resin can be discharged and its shape can be adjusted.
[0038]
Further, by providing a resin wall member formed so as to be spaced from and surrounding the fusible member between the fusible member and the resin reinforcing member, the resin reinforcing member and the fusible member Contact can be prevented.
[Brief description of the drawings]
FIG. 1 is a diagram illustrating a cross section of an electronic device (first embodiment) according to the invention.
FIG. 2 is a view for explaining a step of forming a reinforcing resin member.
FIG. 3 is a diagram illustrating a cross section of the electronic device according to the second embodiment.
FIG. 4 is a diagram (photograph) illustrating a cross section of the electronic device after the heat cycle test has been performed 1,000 times.
FIG. 5 is a diagram illustrating a cross section of a conventional electronic device (semiconductor device).
[Explanation of symbols]
Reference Signs List 1 ceramic substrate (element mounting substrate), 2 element, 3 element pad, 4A, 4B bump pad (first electrode, second electrode), 6 reinforcing member, 7 printed board (wiring board), 8 bump (meltability) Member), 9 wall members

Claims (3)

素子搭載面の裏側に第1の電極が形成された素子搭載基板と、前記素子搭載基板と所定間隔を隔てて対向するように配置され、しかも前記第1の電極に対向する位置に第2の電極が形成された配線基板と、前記第1の電極と前記第2の電極を接合する溶融性部材と、前記溶融性部材よりも外方に配置され、前記素子搭載基板の端部とこの端部に対向する前記配線基板の部位とを接着する樹脂製補強部材と、溶融性部材と樹脂製補強部材の間に、前記溶融性部材から離れて、その周囲を囲むように形成された樹脂製壁部材とを備え、樹脂製補強部材は、素子搭載基板の全周にわたって適宜間隔をおいて形成され、樹脂製壁部材は、固化する前の樹脂製補強部材が溶融性部材にまで進入できないような位置に隙間が配置されていることを特徴とする電子装置。An element mounting substrate having a first electrode formed on the back side of the element mounting surface is disposed so as to face the element mounting substrate at a predetermined interval, and a second electrode is provided at a position facing the first electrode. A wiring board on which electrodes are formed, a fusible member for joining the first electrode and the second electrode, and an end disposed on the outer side of the fusible member; A resin reinforcing member that adheres to the portion of the wiring board facing the portion, and a resin resin formed between the fusible member and the resin reinforcing member so as to be separated from the fusible member and surround the periphery thereof. A wall member, and the resin reinforcing members are formed at appropriate intervals over the entire periphery of the element mounting board, and the resin wall members are such that the resin reinforcing members before solidification cannot enter the fusible member. The gap is arranged in a suitable position Electronic devices. 素子搭載面の裏側に第1の電極が形成された素子搭載基板と、前記素子搭載基板と所定間隔を隔てて対向するように配置され、しかも前記第1の電極に対向する位置に第2の電極が形成された配線基板と、前記第1の電極と前記第2の電極を接合する溶融性部材と、前記溶融性部材よりも外方に配置され、前記素子搭載基板の端部とこの端部に対向する前記配線基板の部位とを接着する樹脂製補強部材を備え、樹脂製補強部材は、素子搭載基板の外周を囲むようにかつ全周にわたって適宜間隔をおいて形成され、素子搭載基板の素子搭載面の裏側端部から側面全体にかけて覆うとともに側面から外方に向かって裾広がりの形状を有していることを特徴とする電子装置。 An element mounting substrate having a first electrode formed on the back side of the element mounting surface is disposed so as to face the element mounting substrate at a predetermined interval, and a second electrode is provided at a position facing the first electrode. A wiring board on which electrodes are formed, a fusible member for joining the first electrode and the second electrode, and an end disposed on the outer side of the fusible member; A resin reinforcing member that adheres to a portion of the wiring board facing the portion, wherein the resin reinforcing member is formed so as to surround the outer periphery of the element mounting board and at appropriate intervals over the entire circumference thereof, and be that electronic device characterized in that it has the shape of a flared outwardly from the side covers over the entire side surface from the back end of the element mounting surface. 樹脂製補強部材の断面積は、素子搭載基板側から配線基板側に向かって大きくなることを特徴とする請求項2記載の電子装置。3. The electronic device according to claim 2, wherein the cross-sectional area of the resin reinforcing member increases from the element mounting substrate side to the wiring substrate side.
JP2001400103A 2001-12-28 2001-12-28 Electronic equipment Expired - Lifetime JP3565204B2 (en)

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Publication number Priority date Publication date Assignee Title
US8105871B2 (en) 2006-08-16 2012-01-31 Fujitsu Semiconductor Limited Semiconductor device and manufacturing method of the same

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JP4526813B2 (en) * 2003-12-16 2010-08-18 株式会社フジクラ Manufacturing method of joined body
JP4526814B2 (en) * 2003-12-18 2010-08-18 株式会社フジクラ Manufacturing method of joined body
EP2423955B8 (en) * 2009-04-24 2019-10-09 Panasonic Intellectual Property Management Co., Ltd. Method for mounting semiconductor package component, and structure having semiconductor package component mounted therein
JP5707569B2 (en) * 2009-04-24 2015-04-30 パナソニックIpマネジメント株式会社 Mounting method and mounting structure for semiconductor package components
JP5464897B2 (en) * 2009-04-24 2014-04-09 パナソニック株式会社 Mounting method and mounting structure for semiconductor package components

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8105871B2 (en) 2006-08-16 2012-01-31 Fujitsu Semiconductor Limited Semiconductor device and manufacturing method of the same

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