JP2022505739A - 電気的な動作手段の状態解析 - Google Patents
電気的な動作手段の状態解析 Download PDFInfo
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- JP2022505739A JP2022505739A JP2021522393A JP2021522393A JP2022505739A JP 2022505739 A JP2022505739 A JP 2022505739A JP 2021522393 A JP2021522393 A JP 2021522393A JP 2021522393 A JP2021522393 A JP 2021522393A JP 2022505739 A JP2022505739 A JP 2022505739A
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- 238000004458 analytical method Methods 0.000 title claims abstract description 7
- 238000005259 measurement Methods 0.000 claims abstract description 47
- 238000000034 method Methods 0.000 claims abstract description 40
- 238000012360 testing method Methods 0.000 claims abstract description 39
- 238000012546 transfer Methods 0.000 claims abstract description 36
- 230000005540 biological transmission Effects 0.000 claims abstract description 23
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- 230000008878 coupling Effects 0.000 claims description 25
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- 238000005859 coupling reaction Methods 0.000 claims description 25
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- 239000003990 capacitor Substances 0.000 claims description 12
- 238000004364 calculation method Methods 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 230000006870 function Effects 0.000 description 30
- 230000001939 inductive effect Effects 0.000 description 10
- 230000006978 adaptation Effects 0.000 description 5
- 238000012544 monitoring process Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
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- 238000001914 filtration Methods 0.000 description 3
- 238000013507 mapping Methods 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 238000010292 electrical insulation Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000000275 quality assurance Methods 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
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- 238000010801 machine learning Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
- G01R31/083—Locating faults in cables, transmission lines, or networks according to type of conductors in cables, e.g. underground
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
- Locating Faults (AREA)
Abstract
Description
AE 評価ユニット
KK カップリングコンデンサ
KE カップリングユニット
AS 接続箇所
SC シールド
SE コア
Claims (15)
- 電気的な動作手段の状態解析のための方法であって、
-動作手段へ試験電圧を印加すること、
-動作手段の接続箇所(AS)での測定信号を検出すること、
-動作手段での部分放電の箇所から接続箇所(AS)への信号伝達を特徴付ける伝達パラメータを測定信号に依存して算出すること、
-部分放電の少なくとも1つの特性量を伝達パラメータに依存して特定すること
を含む方法。 - 伝達パラメータの算出が、線形予測符号化のための方法による測定信号の処理を含むことを特徴とする請求項1に記載の方法。
- 伝達パラメータの算出が仮想的なフィルタのフィルタ係数の算出を含み、フィルタが、信号伝達を近似的にエミュレートすることを特徴とする請求項1又は2に記載の方法。
- 伝達パラメータの算出が、測定信号の離散化及び/又はデジタル化を含むことを特徴とする請求項1~3のいずれか1項に記載の方法。
- 部分放電の少なくとも1つの特性量が、部分放電を引き起こす1つ又は複数のエラー源の少なくとも1つの特性量を含むことを特徴とする請求項1~4のいずれか1項に記載の方法。
- 1つ又は複数のエラー源の少なくとも1つの特性量が、エラー源の数又は部分放電へのエラー源のうち1つの相対的な寄与を含むことを特徴とする請求項5に記載の方法。
- 理論的な入力信号及び伝達パラメータに依存した応答信号の生成を更に含むことを特徴とする請求項1~6のいずれか1項に記載の方法。
- 部分放電の少なくとも1つの特性量が、部分放電の見かけ上の充電についての値を含むことを特徴とする請求項7に記載の方法。
- 部分放電の少なくとも1つの特性量が、部分放電のエラー箇所を含むことを特徴とする請求項7又は8に記載の方法。
- エラー箇所の特定が、動作手段の静電容量及び/又はインダクタンスに依存して行われることを特徴とする請求項9に記載の方法。
- 動作手段が、
-ケーブル、特にシールドされたケーブル、例えば高電圧ケーブル、
-ガス絶縁開閉装置(GIS)、
-ガス絶縁伝送ライン(GIL)、
-電力変換装置、又は
-ステップスイッチ若しくは電力変換装置の他の構成要素
を含むことを特徴とする請求項1~10のいずれか1項に記載の方法。 - 評価装置(AE)を含む、電気的な動作手段の状態解析のための試験装置であって、評価装置が、
-動作手段の接続箇所(AS)での測定信号を検出するために、
-動作手段での部分放電の箇所から接続箇所(AS)への信号伝達を特徴付ける伝達パラメータを測定信号に依存して算出するために、
-部分放電の少なくとも1つの特性量を伝達パラメータに依存して特定するために
設置されている試験装置。 - 試験電圧を動作手段へ印加する高電圧源(HV)を更に含むことを特徴とする請求項12に記載の試験装置。
- カップリングユニット(KE)を更に含んでおり、該カップリングユニットが、接続箇所(AS)及び評価ユニット(AE)にカップリング可能であるとともに、測定信号を評価ユニット(AE)へ提供するように設置されていることを特徴とする請求項12又は13に記載の試験装置。
- カップリングユニット(KE)と接続箇所(AS)の間で接続可能なカップリングコンデンサ(KK)を更に含んでいることを特徴とする請求項12~14のいずれか1項に記載の試験装置。
Applications Claiming Priority (3)
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DE102018126743.6A DE102018126743B3 (de) | 2018-10-26 | 2018-10-26 | Zustandsanalyse eines elektrischen Betriebsmittels |
DE102018126743.6 | 2018-10-26 | ||
PCT/EP2019/079037 WO2020084058A1 (de) | 2018-10-26 | 2019-10-24 | Zustandsanalyse eines elektrischen betriebsmittels |
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JP2022505739A true JP2022505739A (ja) | 2022-01-14 |
JP7544693B2 JP7544693B2 (ja) | 2024-09-03 |
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US (1) | US20210356507A1 (ja) |
EP (1) | EP3870983B1 (ja) |
JP (1) | JP7544693B2 (ja) |
KR (1) | KR20210081414A (ja) |
CN (1) | CN112912741A (ja) |
BR (1) | BR112021006275A2 (ja) |
CA (1) | CA3112370A1 (ja) |
DE (1) | DE102018126743B3 (ja) |
WO (1) | WO2020084058A1 (ja) |
ZA (1) | ZA202101650B (ja) |
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DE102020108382B4 (de) * | 2020-03-26 | 2021-12-09 | Maschinenfabrik Reinhausen Gmbh | System für eine Kabelstrecke, Übertragungssystem zum Übertragen von elektrischer Energie und Verfahren zum Betrieb des Systems |
CN112098781A (zh) * | 2020-07-23 | 2020-12-18 | 国网天津市电力公司 | 基于MATLAB/Simulink技术的高压电缆局放信号传输模型建立方法 |
DE102020122792B4 (de) | 2020-09-01 | 2022-11-03 | Maschinenfabrik Reinhausen Gmbh | Vorrichtung, System und Verfahren zur Bestimmung von Fehlersignalfenstern in einem Messsignal |
Citations (11)
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US4887041A (en) * | 1988-02-17 | 1989-12-12 | University Of Connecticut | Method and instrumentation for the detection, location and characterization of partial discharges and faults in electric power cables |
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US20140043035A1 (en) * | 2010-02-02 | 2014-02-13 | Omicron Electronics Gmbh | Method of locating faults on a cable |
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US20150316599A1 (en) * | 2014-04-11 | 2015-11-05 | Hagenuk Kmt Kabelmesstechnik Gmbh | Method and apparatus for spatially resolved diagnosis |
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- 2019-10-24 KR KR1020217016062A patent/KR20210081414A/ko unknown
- 2019-10-24 WO PCT/EP2019/079037 patent/WO2020084058A1/de unknown
- 2019-10-24 CA CA3112370A patent/CA3112370A1/en active Pending
- 2019-10-24 BR BR112021006275A patent/BR112021006275A2/pt unknown
- 2019-10-24 US US17/287,118 patent/US20210356507A1/en active Pending
- 2019-10-24 JP JP2021522393A patent/JP7544693B2/ja active Active
- 2019-10-24 CN CN201980068768.3A patent/CN112912741A/zh active Pending
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US4887041A (en) * | 1988-02-17 | 1989-12-12 | University Of Connecticut | Method and instrumentation for the detection, location and characterization of partial discharges and faults in electric power cables |
US6420879B2 (en) * | 1998-02-02 | 2002-07-16 | Massachusetts Institute Of Technology | System and method for measurement of partial discharge signals in high voltage apparatus |
US20110125701A1 (en) * | 2009-11-20 | 2011-05-26 | Indian Institute Of Science | System and Method of Using Multi Pattern Viterbi Algorithm for Joint Decoding of Multiple Patterns |
US20140043035A1 (en) * | 2010-02-02 | 2014-02-13 | Omicron Electronics Gmbh | Method of locating faults on a cable |
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BR112021006275A2 (pt) | 2021-07-06 |
WO2020084058A1 (de) | 2020-04-30 |
EP3870983B1 (de) | 2023-12-20 |
ZA202101650B (en) | 2022-11-30 |
CN112912741A (zh) | 2021-06-04 |
KR20210081414A (ko) | 2021-07-01 |
DE102018126743B3 (de) | 2020-01-09 |
US20210356507A1 (en) | 2021-11-18 |
EP3870983A1 (de) | 2021-09-01 |
EP3870983C0 (de) | 2023-12-20 |
JP7544693B2 (ja) | 2024-09-03 |
CA3112370A1 (en) | 2020-04-30 |
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