JP2008104219A - Branching filter - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a high-reliability branching filter, realizing miniaturization, comprising a transmitting SAW filter and a receiving SAW filter. <P>SOLUTION: The branching filter includes a single piezoelectric substrate 110, a transmitting SAW filter 108 being formed on the single piezoelectric substrate 110 and comprising an output connecting terminal, and a receiving SAW filter 109 being formed on the single piezoelectric substrate 110 and comprising an input connecting terminal, wherein the output connecting terminal of the transmitting SAW filter 108 and the input connecting terminal of the receiving SAW filter 109 are provided individually. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a duplexer used in a small mobile communication device such as a mobile phone, and more particularly to a surface acoustic wave (SAW) resonator type filter (hereinafter referred to as a radio frequency (RF) filter). The present invention relates to a duplexer that uses a SAW filter) and can achieve miniaturization and high performance.

  In recent years, development of small and lightweight mobile communication device terminals such as mobile phones has been rapidly progressed. Along with this, miniaturization and higher performance of parts such as a duplexer used in such communication equipment terminals are also demanded. Among these, the SAW duplexer configured using the SAW filter is a device that can greatly contribute to the miniaturization of the mobile communication device terminal, and therefore, the insertion loss of the passband is small, and The attenuation amount in the attenuation band is required to be large.

  A conventional SAW duplexer used for a mobile communication device terminal such as a cellular phone is disclosed in, for example, Japanese Patent Laid-Open No. 6-97661. In this SAW duplexer, an impedance matching line and a transmission filter are connected in series between the antenna terminal and the transmission terminal, and a phase matching circuit and a reception filter are connected in series between the antenna terminal and the reception terminal. It is connected. In addition, both the transmission and reception filters are configured as ladder-type resonator filters using series arm SAW resonators and parallel arm SAW resonators, and have different center frequencies. It is necessary to have a characteristic that the insertion loss is small in the frequency pass band of the filter and the attenuation is large in the frequency stop band attenuation. In order to suppress the mutual influence between the characteristics of the transmission and reception filters, the SAW duplexer as described above ensures insulation between the transmission filter and the reception filter. Yes. In order to ensure such insulation between the two filters, for example, the transmission filter and the reception filter are formed on different piezoelectric substrates, respectively, and when both filters are accommodated in the same package, Both filters are individually accommodated in two cavities (recesses) provided in the package (transmission and reception filters are arranged via the “wall part of the package”) or provided in the package. When the transmission and reception filters are accommodated in a single recess, the two filters are separated from each other with a distance that can ensure the insulation of both filters. Further, the phase matching line and the impedance matching circuit are also formed in the package together with the transmission and reception filters.

  However, the conventional SAW duplexer as described above has the following problems. That is, when the transmission filter and the reception filter are formed on different piezoelectric substrates, and both filters are accommodated in the same package, two cavities (( (Cavity) is provided and both filters are placed in the respective cavities (both filters are arranged through the wall of the package, or even if there is only one cavity, the distance between the two filters must be kept within that cavity. Therefore, considering the area where the two cavities are formed (the area where the package wall is formed) and the distance between the two filters, it is difficult to reduce the size of the duplexer as a whole. To reduce the size of the duplexer, the distance between the two cavities (package wall) or both filters Even narrowing a distance, it becomes impossible to ensure a good insulation.

  In addition, since the transmitting and receiving filters, the phase matching circuit, the impedance matching circuit, and the like are accommodated in the same package, the parasitic impedance of the connection line and the connection line pad when these elements are connected by wiring, The frequency characteristics of the SAW duplexer sometimes changed.

  The duplexer of the present invention includes a single piezoelectric substrate, a transmission SAW filter formed on the single piezoelectric substrate and provided with an output connection terminal, and formed on the single piezoelectric substrate. The reception SAW filter is provided, and the output connection terminal of the transmission SAW filter and the input connection terminal of the reception SAW filter are provided separately.

  According to the duplexer of the present invention, the transmission SAW filter connected between the antenna terminal and the transmission terminal and the transmission SAW filter connected between the antenna terminal and the reception terminal have passband characteristics. A different receiving SAW filter; a frequency characteristic adjusting LC circuit connected between the antenna terminal and the transmitting and receiving SAW filters; and a combination circuit of the branching circuit, the branching circuit being a series arm SAW resonator Since the SAW duplexer configured using the above is realized, the size of the SAW duplexer can be reduced as compared with the conventional duplexer and the frequency characteristics can be improved.

  The duplexer package according to the present invention further includes a SAW filter chip mounting region on which a piezoelectric substrate on which a transmission SAW filter and a reception SAW filter having different frequency passbands are formed is mounted. Since the frequency characteristic adjusting circuit and the demultiplexing circuit related to the filter and the reception SAW filter are formed, a highly reliable miniaturized demultiplexer can be realized.

  Embodiments of the present invention will be described below with reference to the drawings.

  FIG. 1 is a block diagram schematically showing a configuration example of a SAW duplexer in the first embodiment of the present invention. In FIG. 1, the SAW duplexer 100 includes an antenna terminal 101, a transmission terminal 103, and a reception terminal 104. An impedance matching LC circuit 102 is connected to the antenna terminal 101, and a transmission side demultiplexing line (hereinafter referred to as Tx-demultiplexing line) 105 and the impedance matching LC circuit 102 and the transmission terminal 103 are connected. The transmission SAW filter 108 is connected between the impedance matching LC circuit 102 and the reception terminal 104 with a reception side demultiplexing line (hereinafter referred to as Rx-demultiplexing line) 106 and a reception SAW filter 109. Yes. The transmission SAW filter 108 and the reception SAW filter 109 have different frequency passband characteristics. In addition, although the branching circuit 107 is configured by the Tx-demultiplexing line 105 and the Rx-demultiplexing line 106, the Tx-demultiplexing line 105 is not necessarily provided, and may be appropriately provided according to the design. That's fine.

  2 and 3 show specific circuit configuration diagrams in the case where the above-described SAW duplexer 100 includes both the Tx-demultiplexing line 105 and the Rx-demultiplexing line 106. FIG.

  In FIG. 2, the transmission SAW filter 108 includes a ladder SAW resonator having a three-stage configuration that includes two series arm SAW resonators and parallel arm SAW resonators. The series arm SAW resonator is connected between the Tx-demultiplexing line 105 and the transmission terminal 103, and the first stage first series arm SAW resonator (TS1) 108a and the second stage second series arm SAW resonator. (TS2) 108b. On the other hand, the parallel arm SAW resonator is the first stage first parallel connected between the connection point of the first series arm SAW resonator (TS1) 108a and the second series arm SAW resonator (TS2) 108b and the ground potential. The arm SAW resonator (TP1) 108c and the second-stage second parallel arm SAW resonator (TP2) 108d connected between the transmission terminal 103 and the ground potential are included. In addition, each series arm SAW resonator and each parallel arm SAW resonator in the transmission SAW filter 108 are each composed of two SAW resonators.

The reception SAW filter 109 is a five-stage ladder-type SAW resonator composed of three series arm SAW resonators and parallel arm SAW resonators. The series arm SAW resonator is connected between the Rx-demultiplexing line 106 and the receiving terminal 104, the first stage first series arm SAW resonator (RS1) 109a, the second stage second series arm SAW resonance. The second series arm SAW resonator (RS3) 109c of the third stage (RS2) 109b. On the other hand, the parallel arm SAW resonator is a first parallel first stage connected between the connection point of the first series arm SAW resonator (RS1) 109a and the second series arm SAW resonator (RS2) 109b and the ground potential. The second stage connected between the connection point of the arm SAW resonator (RP1) 109d, the second series arm SAW resonator (RS2) 109b, and the third series arm SAW resonator (RS3) 109c and the ground potential. The second parallel arm SAW resonator (RP2) 109e and the third parallel arm SAW resonator (RP3) 109f of the third stage connected between the receiving terminal 104 and the ground potential are included. From the viewpoint of miniaturization of the SAW duplexer 100, the Tx-demultiplexing line 105 uses a series arm SAW resonator (TxS) 105a, and the Rx-demultiplexing line 106 is a parallel arm SAW resonator (RxS) 106a. It is configured using each. The impedance matching LC circuit 102 includes a capacitor _CANT and an inductor _LANT .

  Here, as shown in FIG. 3, in order to achieve further miniaturization of the SAW duplexer 100, the first series arm SAW resonator (TS1) 108a of the transmission SAW filter 108 and the Tx-demultiplexed line 105 The series arm SAW resonator (TxS) 105a is combined to form one combined SAW resonator 108e. Similarly, the first series arm SAW resonator (RS1) 109a of the reception SAW filter 109 and the Rx-demultiplexing line 106 are combined. The parallel arm SAW resonator (RxS) 106a may be combined to form a single combined resonator 109g.

  Next, a schematic perspective view when the SAW filter for transmission 108 and the SAW filter for reception 109 constituting the SAW duplexer 100 described above are formed on the same piezoelectric substrate 110 and mounted on the package substrate 111. Is shown in FIG. Examples of the package substrate 111 include a resin substrate, a low temperature sintered substrate, and an alumina substrate. The package substrate can also be configured as a multilayer package substrate composed of a plurality of substrates, which will be described in detail in the second to fourth embodiments described later. Tx-in and Tx-OUT in FIG. 4A are an input terminal and an output terminal of the transmission SAW filter 108, respectively. Rx-in and Rx-OUT are an input terminal and an output terminal of the reception SAW filter 109, respectively. The output terminal of the transmission SAW filter 108 and the input terminal of the reception SAW filter 109 are both connected to the antenna terminal 101, although not shown. The input terminal of the transmission SAW filter 108 corresponds to the transmission terminal 103 in FIG. 1, and the output terminal of the reception SAW filter 109 corresponds to the reception terminal 104 in FIG. In this case, both the branching circuit 107 and the frequency adjusting LC element 102 are formed outside the piezoelectric substrate 110, that is, on the package substrate 111.

  Next, when the branching circuit 107, the transmission SAW filter 108, and the reception SAW filter 109 are formed on the same piezoelectric substrate 110, the result is as shown in FIG. When the Tx-demultiplexing line 105 and the Rx-demultiplexing line 106 are included as the demultiplexing circuit 107, both demultiplexing lines are preferably provided on the piezoelectric substrate 110. When only the Rx-demultiplexing line 106 is formed as the demultiplexing circuit 107, only the Rx-demultiplexing line 106 may be provided on the piezoelectric substrate 110. In FIG. 4B, illustration of necessary wirings and input / output terminals is omitted, and the Tx-demultiplexing line 105 is indicated by a broken line and the Rx-demultiplexing line 106 is indicated by practice. In the configuration example as shown in FIG. 4B, the impedance matching LC circuit 102 is provided outside the piezoelectric substrate 110.

  Next, when the impedance matching LC circuit 102, the branching circuit 107, the transmission SAW filter 108, and the reception SAW filter 109 are formed on the same piezoelectric substrate 110, the result is as shown in FIG. Similar to the configuration example shown in FIG. 4B, when the Tx-demultiplexing line 105 and the Rx-demultiplexing line are included as demultiplexing circuits, both demultiplexing lines are placed on the piezoelectric substrate 110. Try to provide it. The Tx-demultiplexing line 105 is appropriately provided according to the design as described above. In FIG. 4C as well, necessary wiring and input / output terminals are not shown.

  The Tx-demultiplexing line 105 and the Rx-demultiplexing line 106 in the SAW duplexer 100 as shown in FIGS. 4A to 4C are each configured by a series arm SAW resonator. .

  Next, the operation of the SAW duplexer in the first embodiment of the present invention will be described with reference to FIGS. 5 to 7 and Tables 1 to 3.

  FIG. 5 is a configuration diagram functionally showing each component when the SAW duplexer 100 performs a transmission operation. FIG. 6 is a block diagram showing functional components separately when the SAW duplexer 100 is caused to perform a receiving operation. FIG. 7 is a diagram for explaining the impedance in the SAW duplexer 100.

  In general, the duplexer is used for both transmitting a transmission signal and receiving a reception signal by using only one antenna, and the transmission system circuit and the reception system circuit are directly connected to the antenna. Connected. Therefore, the performance of the duplexer is greatly related to the performance of a small mobile communication device such as a mobile phone.

As shown in FIG. 5, when the SAW duplexer 100 is used as a transmitter, the transmission signal from the power amplifier 113 is sent to the transmission SAW filter 108 via the transmission terminal 103. The frequency band of the transmission signal is limited by the transmission SAW filter 108, and the transmission signal is transmitted to the antenna 112 via the antenna terminal 101, and the transmission signal is transmitted. In this case, the reception system circuit 114 including the Rx-demultiplexing line 106 and the reception SAW 109 can be regarded as a load circuit having the resistor R ₁ together with the antenna 112.

  As shown in FIG. 6, when the SAW duplexer 100 is used as a receiver, the signal received by the antenna 112 is sent to the reception SAW filter 109 via the antenna terminal 101. The reception signal is sent to the reception system circuit 114 via the reception terminal 104 after the frequency band is limited by the reception SAW filter 109. In this case, the transmission system circuit 115 including the Tx-demultiplexing line 105 and the transmission SAW filter 108 can be regarded as a load circuit having the resistor R2 together with the antenna 112.

  As described above, the functional configuration of the SAW duplexer 100 at the time of transmission and reception can be considered as shown in FIGS. 5 and 6, respectively. Therefore, the SAW duplexer 100 is a high-performance duplexer. The requirements for functioning are as follows:

When the SAW 100 demultiplexer is used as a transmitter, as shown in FIG. 5, assuming that the input impedance of the receiving system circuit 114 is Z _r 117, this Z _r 117 is approximately expressed by the following equations (1-1) and (1 -2) must be satisfied.

Z _r × Z _ANT / (Z _r + Z _ANT ) ≈50 (1-1)
Z _r ≈∞ (1-2)
On the other hand, when the SAW 100 demultiplexer is used as a receiver, as shown in FIG. 6, assuming that the input impedance of the transmission system circuit 115 is Z _t 116, this Z _t 116 is approximately expressed by the following equation (1-3) and It is necessary to satisfy the condition (1-4).

Z _t × Z _r / (Z _t + Z _r ) ≈50 (1-3)
Z _r ≈∞ (1-4)
Here, assuming that the transmission band in the mobile phone is 890 MHz to 915 MHz and the reception band is 935 MHz to 960 MHz, in the transmission SAW filter 108 in the transmission system circuit 115 shown in FIG. 6, the series arm SAW resonator 108a and Since the pole frequency can be set to a reception band of 930 MHz to 960 MHz by 108b, the transmission SAW filter 108 in this case can satisfy the approximate expression (1-3) of the input impedance. However, in the reception SAW filter 109 in the reception system circuit 114, the pole frequency cannot be set to a transmission band of 890 MHz to 915 MHz by the serial arm SAW resonators 109a to 109c. Therefore, the approximate expressions (1-1) and (1-2) of the input impedance cannot be satisfied.

  8A is a circuit diagram showing a series arm SAW resonator used in the SAW duplexer of the present invention, and FIG. 8B is a series arm SAW resonator shown in FIG. FIG.

Therefore, a duplexer in which a transmission SAW filter and a reception SAW filter are formed on different piezoelectric substrates as in the prior art, and a transmission SAW filter and a reception SAW filter on the same piezoelectric substrate as in the present invention. In order to compare the impedance characteristics at the time of transmission (see FIG. 5), a simulation was performed with respect to the duplexer formed in FIG. Each of the duplexers targeted for this simulation is a GSM duplexer using a SAW duplexer for mobile phones. Duplexer for the GSM system does not include the Tx- branching circuit 105 and the inductor L _ANT shown in FIG. 2 as a component, having a serial arm SAW resonator 106a as the Rx- diplexer circuit arrangement It has become. And this simulation was performed about 890 MHz, 915 MHz, 935 MHz, and 960 MHz among frequency bands 890 MHz to 960 MHz.

  Both the transmission SAW filter of the conventional GSM duplexer and the transmission SAW filter 108 shown in FIG. 2 have the same configuration as the simulation target. As described above, Table 1 shows the crossing length (μm) and the number of electrode pairs of the SAW resonators constituting the transmission and reception SAW filters in the SAW duplexer 100.

  In Table 1, the serial arm SAW resonators 108a and 108b constituting the transmission SAW filter 108 shown in FIG. 2 are shown as TS1 and TS2, respectively, and the parallel arm SAW resonators 108c and 108d are shown as TP1 and TP2, respectively. . Further, the serial arm SAW resonators 109a to 109c constituting the reception SAW filter 109 shown in FIG. 2 are shown as RS1 to RS3, respectively, and the parallel arm SAW resonators 109d and 109e are shown as RP1 and RP2, respectively.

  Furthermore, in the duplexer according to the present invention, which is the object of this simulation, the Rx-demultiplex line 106 is configured using a series arm SAW resonator 106a. In the conventional duplexer to be simulated, the transmission SAW filter and the reception SAW filter are formed on separate piezoelectric substrates, respectively, and the Rx-demultiplexing line and the frequency adjusting LC circuit are And a separate piezoelectric substrate on which a transmitting SAW filter and a receiving SAW filter are formed are provided on a package substrate.

  Table 2 shows the types of branching circuits, their required parameters, and the impedance values of the respective branching circuits obtained as a result of the simulation. In Table 2, symbols A and B indicate the conventional duplexer configuration, and symbols C to E indicate the duplexer configuration of the present invention. These duplexers are cellular phone duplexers using SAW resonators, and are for GSM (Global System for Mobile communications) systems having a transmission frequency band of 890 MHz to 915 MHz and a reception frequency band of 935 MHz to 960 MHz. It is a vessel.

  In Table 2, in the conventional duplexer A, the branching circuit is a line, the Tx-demultiplexing line is not provided (line length LT = 0 mm), and the Rx-demultiplexing line is provided with a line length LR = 40 mm. The frequency adjustment LC circuit is not provided. Therefore, the input terminal of the transmission SAW filter and the input terminal of the Rx-demultiplexing line are directly connected to the antenna terminal.

  Further, in the conventional duplexer B, the branching circuit is used as a line, and neither the Tx-demultiplexing line nor the Rx-demultiplexing line is provided (line length LT and LR = 0 mm), and the frequency adjusting LC circuit Is not provided. The input terminals of the transmission SAW filter and the reception SAW filter are directly connected to the antenna terminal.

  The three types of duplexers C to E of the present invention to be simulated are not provided with the Tx-demultiplexing line 105 in the circuit configuration shown in FIG. Therefore, the input terminal of the transmission SAW filter is directly connected to the impedance matching LC circuit 102. Further, in these demultiplexers C to E, a series arm SAW resonator 106 a is provided as the RX-demultiplexing circuit 106, and the series arm SAW resonator 106 a is the first-stage series arm of the reception SAW filter 109. The combined resonator 109g is combined with the SAW resonator 109a.

Under the conditions described above, the duplexer C further includes a capacitance component C _ANT (capacitance = 10 pF) and an inductor L _ANT (inductance = 7 nH) as the external impedance matching LC circuit 102. Further, the duplexer D is provided with only the inductor L _ANT (inductance = 7 nH) as the external impedance matching LC circuit 102 without the capacitance component C _ANT . Similarly, the duplexer E includes only the inductor L _ANT (inductance = 10 nH) as the external impedance matching LC circuit 102 without the capacitance component C _ANT . As described above, the duplexers C to E according to the present invention are configured to improve the frequency characteristics by the impedance matching LC circuit 102.

In Table 3, the input impedance Z _r 117 of the transmission SAW filter 108 as shown in FIG. 7 is shown for each specific duplexer B (conventional) and duplexer D (present invention) of the conventional and the present invention. The values of the real part and the imaginary part of Z _t 116 are shown. Table 3 also shows input impedance values when the frequencies are 890 MHz, 915 MHz, 935 MHz, and 960 MHz for each of the transmission and reception SAW filters.

Comparing the input impedance Z _t and Z _r of the duplexer B and D of Table 3, the demultiplexer D of the invention it can be seen that the impedance of the transmission band of the receiving SAW filter is increased. When comparing in detail, in the receiving SAW filter of Table 1, when the frequency f is 890 MHz, the real part is 0.0127 with respect to the input impedance Z _{r in} the case of the conventional duplexer B, The imaginary part is -1.089. In contrast, with respect to the input impedance Z _r of the case of the duplexer D of the present invention, the real part is 3.54, imaginary part is in the 23.20. Thus, it can be seen that the frequency characteristics are greatly improved in the duplexer of the present invention. This is also apparent from the results of impedance characteristics in Table 2. Moreover, it can be seen from the results of the impedance characteristics in Table 2 that the transmission frequency band is 935 MHz to 960 MHz. As described above, the duplexer according to the present invention, which has been subjected to the above-described simulation of impedance characteristics, has been downsized by synthesizing the first-stage series arm SAW resonator of the receiving SAW filter with the Rx-demultiplexing line. It has a configuration. Therefore, the input impedance at the center frequency of the transmission band, which is the most noticeable due to the nature of the mobile phone, that is, the frequency f = 900 MHz will be described below.

From point C 118, shown in FIG. 7, when viewed transmitting and receiving SAW filter side, the combined impedance Z _in is given by the following equation (1-5).

Z _in = Z _t × Z _r / (Z _t + Z _r ) (1-5)
In this case, the input impedances of the transmission SAW filter 108 and the reception SAW filter 109 at the frequency f = 900 MHz are as follows from Table 3.

Z _t (900) = 0.863−j0.626 (1-6)
Z _t (900) = 0.0175−j0.934 (1-7)
Therefore, the impedance Z _in is given by the following equation (1-8) from the point C 118 shown in FIG. 7 to the transmitting / receiving SAW filter side.

Z _in (Tr) (900) = 0.2409−j0.501 (1-8)
When Z _in (Tr) (900) is impedance-corrected only with the inductance L _ANT 102b of the impedance matching LC circuit 102 in the configuration example shown in FIG. 2 of the present invention, the value of the inductance L _ANT is
L _ANT = 4.4 nH (1-9)
It becomes. In this case, if the characteristic impedance does not become a desired value, it is necessary to insert an impedance matching circuit. In practice, this type of mobile phone requires optimum characteristics not only in the frequency f = 900 MHz but also in the transmission band 890 MHz to 915 MHz. This optimum characteristic is usually determined by simulation. In the duplexers D and E shown in Table 2, the result of adjusting the impedance in the transmission band 890 MHz to 915 MHz with only the inductor L _ANT 102b is shown. Further, the duplexer C shown in Table 2 shows the result of adjusting the impedance in the transmission band 890 MHz to 915 MHz by the inductor L _ANT 102b and the capacitor C _ANT 102a. One combination of these inductor L _ANT 102b and capacitor C _ANT 102a values is L _ANT = 7.0 nH and C _ANT = 10.0 pF.

  As is apparent from the results in Table 2, according to the configuration of the duplexer of the present invention, the transmission SAW filter 108 and the reception SAW filter 109 are mounted on the same piezoelectric substrate, and an external impedance matching is performed. It can be seen that by providing the LC circuit 102 for use, the passband characteristics in the SAW duplexer can be improved. Further, since both the transmission SAW filter and the reception SAW filter are formed on the same piezoelectric substrate, when the transmission / reception SAW filters 108 and 109 in the wafer state are diced, the transmission SAW filter 108 and the reception SAW filter are received. There is no need to separate the SAW filter 109. Therefore, the scribe line area on the wafer that has been ensured for separating the transmission SAW filter 108 and the reception SAW filter 109 from the conventional one becomes unnecessary, and more SAW filters can be obtained from one wafer. That is, the yield can be improved.

  On the other hand, the results in Table 3 show that the impedance in the transmission band of the reception SAW filter 109 is increased by the series arm SAW resonator 106a used as the branch line. The improvement of the frequency characteristic depends on the impedance when the filter side is viewed from the point C 118 shown in FIG. That is, it is assumed that this is because the series arm SAW resonator 106 a is inserted as a demultiplexing line into the input terminal of the reception SAW filter 109. The impedance value due to the insertion of the series arm SAW resonator 106a used as the demultiplexing line is adjusted to a necessary impedance value by externally attaching the impedance matching LC circuit 102. This frequency adjusting LC circuit is made into a chip and provided on the package substrate of the transmission / reception SAW filter, or is provided on the piezoelectric substrate forming the transmission / reception SAW filter, thereby reducing the size of the entire duplexer including the SAW resonator. In addition, high performance can be achieved.

  Next, second to fourth embodiments of the present invention will be described with reference to FIGS.

  FIG. 9 is a configuration diagram of the SAW duplexer 200 according to the second embodiment of the present invention, in which transmission / reception SAW filters 206 and 207 are formed on one piezoelectric substrate 208. A multilayer package substrate for mounting the SAW duplexer in the second embodiment will be described with reference to FIGS. 12 (A) to (C).

The SAW duplexer 200 in the second embodiment has the following configuration. First, as shown in FIG. 9, a transmission SAW filter 206 and a reception SAW filter 207 are formed on one piezoelectric substrate 208. Between the antenna terminal 201 connected to the antenna 221 and the reception SAW filter 207, an antenna end matching circuit 202 and a demultiplexing line 205 are provided. Here, the antenna end matching circuit 202 includes a strip line L _ANT 216 as an inductor and an open stub S _ANT 217 as a capacitor. The antenna end matching circuit 202 is connected to the ground potential via a terminal 218.

An output terminal of the power amplifier 215 is connected to the transmission terminal 203, and a transmission input matching circuit 213 is connected between the transmission terminal 203 and the transmission SAW filter 206. Here, the transmission input matching circuit 213 includes a stripline L _T 209 as an inductor and an open stub S _T 210 as a capacitor. The transmission input matching circuit 213 is connected to the ground potential via a terminal 219.

A reception output matching circuit 214 is connected between the reception terminal 204 and the reception SAW filter 207. Here, the reception output matching circuit 214 includes a strip line L _R 211 as an inductor and an open stub S _R 212 as a capacitor. The reception output matching circuit 214 is connected to the ground potential via the terminal 220.

  A configuration when the SAW duplexer 200 configured as described above is mounted on a multilayer package substrate as shown in FIG. 12 will be described below.

  The multilayer package substrate in the present invention is basically composed of package substrates 600 to 800 as shown in FIGS. A cavity 601 is formed in the center of the package substrate 600 as a space for accommodating the piezoelectric substrate 208 on which the transmission / reception SAW filters 206 and 207 are formed. Further, electrode pads 602A to 602H, a transmission terminal 603A, an antenna terminal 603B, and a reception terminal 603C are formed on the package substrate 600, respectively.

A strip line 605 corresponding to the strip line L _T 209 of the transmission input matching circuit 213 is formed between the transmission terminal 603A and the electrode pad 602H. Further, in the package substrate 600, the open stub 604 is connected to the transmission terminal 603A, but it is not necessary to provide it in the second embodiment. On the other hand, the electrode pad 602H is connected to the terminal 806 in the multilayer package substrate, and an open stub 805 corresponding to the open stub ST210 is connected to the terminal 806 in the package substrate 800. The input terminal of the transmission SAW filter 206 is connected to the electrode pad 602H by wire bonding or the like.

A strip line 606A corresponding to the strip line L _ANT 216 of the antenna end matching circuit 202 is formed between the antenna terminal 603B and the electrode pad 602D. The antenna terminal 603B is connected to the output terminal of the transmission SAW filter 206 via the terminal 607, the wiring 606B, and the electrode terminal 602D. Further, as illustrated in FIG. 12C, the terminal 607 is connected to the terminal 803, and is connected to the terminal 804 via the branch line 801 corresponding to the branch line 205. The terminal 804 is connected to the electrode pad 602A in the multilayer package substrate, and the electrode pad 602A is connected to the input terminal of the receiving SAW filter 207 by wire bonding or the like. The antenna terminal 603B is connected to the terminal 802B of the package substrate 800 in the multilayer package substrate, and an open stub 807 corresponding to the open stub S _ANT 217 of the antenna end matching circuit 202 is formed on the package substrate 800. .

A strip line 608 corresponding to the strip line L _R 211 of the reception output matching circuit 214 is formed between the reception terminal 603C and the electrode pad 602E. As shown in FIG. 12C, the receiving terminal 603C is connected to the terminal 802C in the multilayer package substrate, and an open stub 808 corresponding to the open stub S _R 212 is formed on the terminal 802C. Has been.

The electrode pads 602C and 602G on the package substrate 600 are connected to terminals 701A and 701B on the package substrate 700 in the multilayer package substrate, respectively. The terminals 701A and 701B are provided in a ground potential pattern 701 connected to the ground potential V _SS via the terminals 703A to 703C and 703H. Accordingly, the electrode pads 602C and 602G on the package substrate 600 are used as ground potential electrode pads. For example, in the second embodiment, the electrode pad 602C is used as the ground potential electrode pad 218 in the antenna end matching circuit 202, and the electrode pad 602G is used as the ground potential electrode pad 219 in the transmission input matching circuit 213.

Similarly, electrode pads 602B and 602F on the package substrate 600 are connected to terminals 702A and 702B on the package substrate 700 in the multilayer package substrate, respectively. These terminals 702A and 702B are provided in a ground potential pattern 702 connected to the ground potential V _SS via the terminals 703D to 703G. Accordingly, the electrode pads 602B and 602F in the package substrate 600 are used as ground potential electrode pads. For example, in the second embodiment, the electrode pad 602B is used as the ground potential electrode pad 218 in the antenna end matching circuit 202, and the electrode pad 602F is used as the ground potential electrode pad 220 in the reception output matching circuit 214.

  In the package substrate 700, a piezoelectric substrate 208 on which transmission / reception SAW filters 206 and 207 are formed is mounted in the chip mounting region 704. The ground potential pattern 702 in the chip mounting region 704 is provided with a plurality of through holes 705. These through holes 705 are formed in the plurality of through holes 809 provided in the package substrate 800 in the multilayer package substrate. It is connected.

As described above, according to the duplexer package in the second embodiment, the transmission SAW filter 206 and the reception SAW filter 207 are formed on one piezoelectric substrate 208, and the piezoelectric substrate 208 is formed as a multilayer package substrate. Therefore, the entire SAW duplexer can be downsized. Further, strip lines L _T 209 (605), L _R 211 (608) and L _ANT 216 (606A) are formed on the package substrate 700, while the branch line 205 (801) and the open stub ST 210 (805). SR212 (808) and SANT217 (807) are formed on the package substrate 800. That is, since the strip line is formed on a separate package substrate from the demultiplexing line and the open stub, the entire SAW demultiplexer can be further downsized.

  In the package substrate 700, the ground potential patterns for the transmission input matching circuit 213 and the reception output matching circuit 214 are separately provided, so that the transmission SAW filter 206 and the reception SAW filter 207 are separated from each other. It is possible to suppress the deterioration of the frequency characteristics of the SAW duplexer due to mutual interference.

  In addition, since through holes 705 and 809 are provided in the package substrates 700 and 800 in the region where the piezoelectric substrate on which the transmission / reception SAW filters 206 and 207 are formed, the heat from the transmission / reception SAW filters 206 and 207 is efficiently used. It can escape well to the outside of the SAW duplexer, and the reliability of the SAW duplexer can be improved.

  Next, the operation of the SAW duplexer 200 mounted on the multilayer package substrate having the above configuration will be described.

  First, the impedance conversion operation of the connection line of the matching circuit in the duplexer will be described with reference to FIGS. The relationship of the following expressions (2-1) and (2-2) exists between the connection line of FIG. 13 and the equivalent LC circuit of FIG.

L = Z _o × LL / CC (2-1)
C = LL / (CC × Z _o ) (2-2)
Here, Z _o is the characteristic impedance of the connection line, LL is the length (cm) of the connection line, and CC = 3.0 × 10 ¹⁰ . The impedance Z _in of the SAW filter or the branch line including the connection line shown in FIG. 14 is given by the following equation (2-3).

Zin = (Zn + jWL) / (1 + jWC (Zn + jWL)) (2-3)
Here, W = 2πf (f: frequency).

Next, the connection line (strip line L _T 209) of the transmission input matching circuit 213 in the second embodiment of the present invention shown in FIG. 9 will be described specifically. The length of the connection line corresponding to the strip line L _T 209 is 11.85 mm, the line width is 0.1 mm, the substrate thickness is 0.2 mm + 0.2 mm = 0.4 mm, the line thickness is 0.02 mm, and the connection When the dielectric constant of the package substrate on which the line is formed is 5.0 (see Table 4), the characteristic impedance of this connection line is 53.6Ω.

  From the above, the equivalent LC value in FIG. 14 is L = 4.73 nH and C = 1.65 pF as shown in Table 5.

このストリップラインＬ_T２０９（Ｌ＝４．７３ｎＨ、Ｃ＝１．６５ｐＦ）に関して、図１４に示したように、終端インピーダンスＺ_nが変化した場合の入力インピーダンスＺ_inの変化を表６に示す。

Regarding the strip line L _T 209 (L = 4.73 nH, C = 1.65 pF), as shown in FIG. 14, changes in the input impedance Z _in when the termination impedance Z _n is changed are shown in Table 6.

この表６から明らかなように、例えば、終端インピーダンスＺ_nが３０Ωの場合、入力インピーダンスＺ_inは４６．７−ｊ１８．２となっている。すなわち、ストリップライン等の接続線を用いることにより、ＳＡＷ分波器における入力インピーダンスＺ_inを所望の値に設定することができる。

As is apparent from Table 6, for example, when the termination impedance Z _n is 30Ω, the input impedance Z _in is 46.7−j18.2. That is, the input impedance Zin _in the SAW duplexer can be set to a desired value by using a connection line such as a strip line.

Therefore, regarding the SAW duplexer 200 according to the second embodiment of the present invention, the input impedances of the demultiplexing line 205 and the transmission / reception SAW filters 206 and 207 are set low, and the strip lines L _T 209, L _R 211, and L _A desired input impedance can be set at the antenna terminal 201, the transmission terminal 203, and the reception terminal 204 using the _ANT 216. Further, by setting the input impedance low in the demultiplexing line 205, a line with lower loss can be realized. In the second embodiment, the characteristic impedance of the SAW duplexer 200 can be set to 40.2Ω by setting the line width of the branch line to 0.2 mm and the thickness of the substrate to 0.4 mm. The loss of the SAW duplexer is reduced.

Next, the operation of the open stub (open line) of the matching circuit in the duplexer will be described. The impedance Z _inf of this open stub is given by the following equation (2-4).

Z _inf = −jcot (2πLL / λ) (2-4)
Here it will be specifically described open line of the transmission input matching circuit 213 in the second embodiment of the present invention (open stub S _T 210). In the transmission input matching circuit 213, when LL = 10.32 mm, the equivalent capacitance C _inf is 2.63 pF. That is, by using the open stub S _T 210, it is possible to adjust the characteristic impedance of the connection line such as the above-described strip line to a desired value over a predetermined frequency band. That is, the imaginary part of the characteristic impedance value by the connection line can be changed from the plus region to the minus region by the action of the open line (open stub).

  FIG. 10 is a configuration diagram of a SAW duplexer 300 according to the third embodiment of the present invention, in which a demultiplexing line 305, a transmission SAW filter 306, and a reception SAW filter 307 are formed on one piezoelectric substrate 308. Has been. Also in the third embodiment, a multilayer package substrate for mounting a SAW duplexer will be described with reference to FIGS.

The SAW duplexer 300 in the third embodiment has the following configuration. First, as shown in FIG. 10, a demultiplexing line 305, a transmission SAW filter 306, and a reception SAW filter 307 are formed on one piezoelectric substrate 308. The demultiplexing line 305 is provided between the antenna terminal 301 connected to the antenna 321 and the reception SAW filter 307, and the antenna end matching circuit 302 is provided between the antenna terminal 301 and the demultiplexing line 305. It has been. Here, the antenna end matching circuit 302 includes a strip line L _ANT 316 as an inductor and an open stub S _ANT 317 as a capacitor. The antenna end matching circuit 302 is connected to the ground potential via a terminal 318.

An output terminal of a power amplifier 315 is connected to the transmission terminal 303, and a transmission input matching circuit 313 is connected between the transmission terminal 303 and the transmission SAW filter 306. Here, the transmission input matching circuit 313 includes a stripline L _T 309 as an inductor and an open stub S _T 310 as a capacitor. The transmission input matching circuit 313 is connected to the ground potential via a terminal 319.

A reception output matching circuit 314 is connected between the reception terminal 304 and the reception SAW filter 307. Here, the reception output matching circuit 314 includes a strip line L _R 311 as an inductor and an open stub S _R 312 as a capacitor. The reception output matching circuit 314 is connected to the ground potential via the terminal 320.

  A configuration when the SAW duplexer 300 configured as described above is mounted on a multilayer package substrate as shown in FIG. 12 will be described below.

  The multilayer package substrate in the present invention is basically composed of package substrates 600 to 800 as shown in FIGS.

  A cavity 601 is formed in the center of the package substrate 600 as a space for accommodating the piezoelectric substrate 308 on which the transmission / reception SAW filters 306 and 307 are formed. Further, electrode pads 602A to 602H, a transmission terminal 603A, an antenna terminal 603B, and a reception terminal 603C are formed on the package substrate 600, respectively.

A strip line 605 corresponding to the strip line L _T 309 of the transmission input matching circuit 313 is formed between the transmission terminal 603A and the electrode pad 602H. Further, in the package substrate 600, the open stub 604 is connected to the transmission terminal 603A, but it is not necessary to provide it in the third embodiment. On the other hand, the electrode pad 602H is connected to the terminal 806 in the multilayer package substrate, and an open stub 805 corresponding to the open stub ST310 is connected to the terminal 806 in the package substrate 800. The input terminal of the transmission SAW filter 306 is connected to the electrode pad 602H by wire bonding or the like.

A strip line 606A corresponding to the strip line L _ANT 316 of the antenna end matching circuit 302 is formed between the antenna terminal 603B and the electrode pad 602D. The antenna terminal 603B is connected to the output terminal of the transmission SAW filter 306 via the terminal 607, the wiring 606B, and the electrode terminal 602D. On the other hand, in the third embodiment, since the demultiplexing line 305 is formed on the piezoelectric substrate 308 together with the transmission / reception SAW filter, the demultiplexing line 801 shown in FIG. Absent. The antenna terminal 603B is connected to the terminal 802B of the package substrate 800 in the multilayer package substrate, and an open stub 807 corresponding to the open stub S _ANT 317 of the antenna end matching circuit 302 is formed on the package substrate 800. .

A strip line 608 corresponding to the strip line L _R 311 of the reception output matching circuit 314 is formed between the reception terminal 603C and the electrode pad 602E. As shown in FIG. 12C, the receiving terminal 603C is connected to the terminal 802C in the multilayer package substrate, and an open stub 808 corresponding to the open stub S _R 312 is formed on the terminal 802C. Has been.

The electrode pads 602C and 602G on the package substrate 600 are connected to terminals 701A and 701B on the package substrate 700 in the multilayer package substrate, respectively. The terminals 701A and 701B are provided in a ground potential pattern 701 connected to the ground potential V _SS via the terminals 703A to 703C and 703H. Accordingly, the electrode pads 602C and 602G on the package substrate 600 are used as ground potential electrode pads. For example, in the third embodiment, the electrode pad 602C is used as the ground potential electrode pad 318 in the antenna end matching circuit 302, and the electrode pad 602G is used as the ground potential electrode pad 319 in the transmission input matching circuit 313.

Similarly, electrode pads 602B and 602F on the package substrate 600 are connected to terminals 702A and 702B on the package substrate 700 in the multilayer package substrate, respectively. These terminals 702A and 702B are provided in a ground potential pattern 702 connected to the ground potential V _SS via the terminals 703D to 703G. Accordingly, the electrode pads 602B and 602F in the package substrate 600 are used as ground potential electrode pads. For example, in the third embodiment, the electrode pad 602B is used as the ground potential electrode pad 318 in the antenna end matching circuit 302, and the electrode pad 602F is used as the ground potential electrode pad 320 in the reception output matching circuit 314.

  In the package substrate 700, a piezoelectric substrate 308 on which a demultiplexing line 305 and transmission / reception SAW filters 306 and 307 are formed is mounted on the chip mounting region 704. The ground potential pattern 702 in the chip mounting region 704 is provided with a plurality of through holes 705. These through holes 705 are formed in the plurality of through holes 809 provided in the package substrate 800 in the multilayer package substrate. It is connected.

As described above, according to the duplexer package in the third embodiment, the demultiplexing line 305, the transmission SAW filter 306, and the reception SAW filter 307 are formed on one piezoelectric substrate 308, and the piezoelectric substrate Since the 308 is housed in the multilayer package substrate, the entire SAW duplexer can be reduced in size. Further, the strip line _{L T 309 (605), L} R 311 (the 608) and L _ANT 316 (606A) is formed on the package substrate 700 on the one hand, the open stub _{S T 310 (805), S} R 312 (808 ) And S _ANT 317 (807) are formed on the package substrate 800. That is, since the strip line is formed on a separate package substrate from the demultiplexing line and the open stub, the entire SAW demultiplexer can be further downsized. Further, since the demultiplexing line 305 is formed on the piezoelectric substrate 308 with a small loss, the frequency characteristics of the SAW demultiplexer 300 can be further improved.

  In the package substrate 700, the ground potential pattern for each of the transmission input matching circuit 313 and the reception output matching circuit 314 is separately provided, so that the transmission SAW filter 306 and the reception SAW filter 307 are separated from each other. It is possible to suppress the deterioration of the frequency characteristics of the SAW duplexer due to mutual interference.

  Since the through holes 705 and 809 are provided in the package substrate 700 and 800 in the region where the piezoelectric substrate on which the transmission / reception SAW filters 306 and 307 are formed, the heat from the transmission / reception SAW filters 306 and 307 is efficiently used. It is possible to escape to the outside of the SAW duplexer well, and the reliability of the SAW duplexer 300 can be improved.

  FIG. 11 is a configuration diagram of a SAW duplexer 400 according to the fourth embodiment of the present invention, in which a transmission SAW filter 406 and a reception SAW filter 407 are formed on one piezoelectric substrate 408. Also in the fourth embodiment, a multilayer package substrate for mounting a SAW duplexer will be described with reference to FIGS.

The SAW duplexer 400 in the fourth embodiment has the following configuration. First, as shown in FIG. 11, a transmission SAW filter 406 and a reception SAW filter 407 are formed on one piezoelectric substrate 408. Between the antenna terminal 401 connected to the antenna 422 and the reception SAW filter 407, an antenna end matching circuit 402 and a demultiplexing line 405 are provided. Here, the antenna end matching circuit 402 includes a strip line L _ANT 417 as an inductor and an open stub S _ANT 418 as a capacitor. The antenna end matching circuit 402 is connected to the ground potential via a terminal 419.

An output terminal of a power amplifier 416 is connected to the transmission terminal 403, and a transmission input matching circuit 412 is connected between the transmission terminal 403 and the transmission SAW filter 406. Here, the transmission input matching circuit 412 includes a stripline L _T 409 as an inductor and open stubs S _T 410 and S _TS 411 as capacitors. The transmission input matching circuit 412 is connected to the ground potential via a terminal 420.

A reception output matching circuit 415 is connected between the reception terminal 404 and the reception SAW filter 407. Here, the reception output matching circuit 415 includes a strip line L _R 413 as an inductor and an open stub S _R 414 as a capacitor. The reception output matching circuit 415 is connected to the ground potential via the terminal 421.

  A configuration when the SAW duplexer 400 configured as described above is mounted on a multilayer package substrate as shown in FIG. 12 will be described below.

  The multilayer package substrate in the present invention is basically composed of package substrates 600 to 800 as shown in FIGS.

  A cavity 601 is formed in the center of the package substrate 600 as a space for accommodating the piezoelectric substrate 408 on which the transmission / reception SAW filters 406 and 407 are formed. Further, electrode pads 602A to 602H, a transmission terminal 603A, an antenna terminal 603B, and a reception terminal 603C are formed on the package substrate 600, respectively.

A strip line 605 corresponding to the strip line L _T 409 of the transmission input matching circuit 412 is formed between the transmission terminal 603A and the electrode pad 602H. Further, in the package substrate 600, the open stub 604 corresponding to the open stub S _TS 411 is connected to the transmitting terminal 603A. On the other hand, the electrode pad 602H is connected to the terminal 806 in the multilayer package substrate, and an open stub 805 corresponding to the open stub S _T 410 is connected to the terminal 806 in the package substrate 800. The input terminal of the transmission SAW filter 406 is connected to the electrode pad 602H by wire bonding or the like. Further, as illustrated in FIG. 12C, the terminal 607 is connected to the terminal 803, and is connected to the terminal 804 via the branch line 801 corresponding to the branch line 405. The terminal 804 is connected to the electrode pad 602A in the multilayer package substrate, and the electrode pad 602A is connected to the input terminal of the receiving SAW filter 407 by wire bonding or the like.

A strip line 606A corresponding to the strip line L _ANT 417 of the antenna end matching circuit 402 is formed between the antenna terminal 603B and the electrode pad 602D. The antenna terminal 603B is connected to the output terminal of the transmission SAW filter 406 via the terminal 607, the wiring 606B, and the electrode terminal 602D. The antenna terminal 603B is connected to the terminal 802B of the package substrate 800 in the multilayer package substrate, and an open stub 807 corresponding to the open stub S _ANT 418 of the antenna end matching circuit 402 is formed on the package substrate 800. .

A strip line 608 corresponding to the strip line L _R 413 of the reception output matching circuit 415 is formed between the reception terminal 603C and the electrode pad 602E. As shown in FIG. 12C, the receiving terminal 603C is connected to the terminal 802C in the multilayer package substrate, and an open stub 808 corresponding to the open stub S _R 414 is formed on the terminal 802C. Has been.

The electrode pads 602C and 602G on the package substrate 600 are connected to terminals 701A and 701B on the package substrate 700 in the multilayer package substrate, respectively. The terminals 701A and 701B are provided in a ground potential pattern 701 connected to the ground potential V _SS via the terminals 703A to 703C and 703H. Accordingly, the electrode pads 602C and 602G on the package substrate 600 are used as ground potential electrode pads. For example, in the fourth embodiment, the electrode pad 602C is used as the ground potential electrode pad 419 in the antenna end matching circuit 402, and the electrode pad 602G is used as the ground potential electrode pad 420 in the transmission input matching circuit 412.

Similarly, electrode pads 602B and 602F on the package substrate 600 are connected to terminals 702A and 702B on the package substrate 700 in the multilayer package substrate, respectively. These terminals 702A and 702B are provided in a ground potential pattern 702 connected to the ground potential V _SS via the terminals 703D to 703G. Accordingly, the electrode pads 602B and 602F in the package substrate 600 are used as ground potential electrode pads. For example, in the fourth embodiment, the electrode pad 602B is used as the ground potential electrode pad 419 in the antenna end matching circuit 402, and the electrode pad 602F is used as the ground potential electrode pad 421 in the reception output matching circuit 415.

  In the package substrate 700, a piezoelectric substrate 408 on which a demultiplexing line 405 and transmission / reception SAW filters 406 and 407 are formed is mounted on the chip mounting region 704. The ground potential pattern 702 in the chip mounting region 704 is provided with a plurality of through holes 705. These through holes 705 are formed in the plurality of through holes 809 provided in the package substrate 800 in the multilayer package substrate. It is connected.

As described above, according to the duplexer package in the fourth embodiment, the demultiplexing line 405, the transmission SAW filter 406, and the reception SAW filter 407 are formed on one piezoelectric substrate 408, and the piezoelectric substrate Since 408 is accommodated in the multilayer package substrate, the entire SAW duplexer can be reduced in size. Further, the strip line _{L T 409 (605), L} R 413 (the 608) and L _ANT 417 (606A) is formed on the package substrate 700 on the one hand, the open stub _{S T 410 (805), S} R 414 (808 ) And S _ANT 418 (807) are formed on the package substrate 800. That is, since the strip line is formed on a separate package substrate from the demultiplexing line and the open stub, the entire SAW demultiplexer can be further downsized.

  In the package substrate 700, the ground potential patterns for the transmission input matching circuit 412 and the reception output matching circuit 415 are separately provided, so that the transmission SAW filter 406 and the reception SAW filter 407 are separated from each other. It is possible to suppress the deterioration of the frequency characteristics of the SAW duplexer due to mutual interference.

  Since the through holes 705 and 809 are provided in the package substrates 700 and 800 in the region where the piezoelectric substrate on which the transmission / reception SAW filters 406 and 407 are formed, the heat from the transmission / reception SAW filters 406 and 407 is efficiently used. It can escape well to the outside of the SAW duplexer, and the reliability of the SAW duplexer 400 can be improved.

Furthermore, in the fourth embodiment, since the open stub S _TS 411 is provided in the transmission input matching circuit 412, the attenuation amount of the spurious band in the SAW duplexer 400 can be set to a desired value.

It is the block diagram which showed schematically the structural example of the SAW duplexer in the 1st Embodiment of this invention. It is a specific circuit block diagram of the SAW duplexer in the 1st Embodiment of this invention. It is a specific circuit block diagram of the SAW duplexer in the 1st Embodiment of this invention. It is a schematic perspective view when the SAW duplexer according to the first embodiment of the present invention is mounted on a package substrate. FIG. 3 is a functional configuration diagram of a SAW duplexer when a transmission operation is performed in the first embodiment of the present invention. FIG. 3 is a functional configuration diagram of a SAW duplexer when receiving operation is performed in the first embodiment of the present invention. It is a figure explaining the impedance of the SAW duplexer in the 1st Embodiment of this invention. It is the circuit diagram and LC equivalent circuit schematic of the serial arm SAW resonator in the 1st Embodiment of this invention. It is a block diagram of the SAW duplexer in the 2nd Embodiment of this invention. It is a block diagram of the SAW duplexer in the 3rd Embodiment of this invention. It is a block diagram of the SAW duplexer in the 4th Embodiment of this invention. It is a top view of the multilayer package board | substrate for mounting the SAW duplexer in the 2nd Embodiment of this invention. It is a block diagram of the connection line of the matching circuit in a splitter. It is an equivalent LC circuit diagram regarding the connection line of the matching circuit in a duplexer.

Explanation of symbols

100, 200, 300, 400: SAW duplexer 101, 201, 301, 401, 603B, 802B: antenna terminal 102: LC circuit for impedance matching 102a: capacitor 102b: inductor 103, 203, 303, 403, 603A, 802A : Transmission terminal 104, 204, 304, 404, 603C, 802C: Reception terminal 105: Transmission demultiplexing line (Tx-demultiplexing line)
106: Receiving demultiplexing line (Rx-demultiplexing line)
107: demultiplexing circuits 205, 305, 405, 801: demultiplexing lines 108, 206, 306, 406: transmission SAW filters 105a, 106a, 108a-108e, 109a-109g: SAW resonators 109, 207, 307, 407 : SAW filter for reception 110, 208, 308, 408: Piezoelectric substrate 111: Package substrate 112, 221, 321, 422: Antenna 113, 215, 315, 416: Power amplifier 114: Reception system circuit 115: Transmission system circuit 116, 117: Input impedance 202, 302, 402: Antenna end matching circuit 209, 211, 216, 309, 311, 316, 409, 413, 417, 605, 606A, 608: Strip line 210, 212, 217, 310, 312 317, 410 411, 414, 418, 604, 805, 807, 808: Open stub 213, 313, 412: Transmission input matching circuit 214, 314, 415: Reception output matching circuit 218-220, 318-320, 419-421: Ground potential Electrode pads 600, 700, 800: Package substrate 601: Cavity 602a to 602H: Electrode pads 701, 702: Ground potential patterns 701A, 701B, 702A, 702B: Ground potential terminals 703A to 703H:
704: Chip mounting area 705, 809: Through hole

Claims (16)

A single piezoelectric substrate;
A transmission SAW filter formed on the single piezoelectric substrate and provided with an output connection terminal;
A receiving SAW filter formed on the single piezoelectric substrate and provided with an input connection terminal;
The duplexer, wherein the output connection terminal of the transmission SAW filter and the input connection terminal of the reception SAW filter are provided separately. A package substrate comprising a first connection portion and a second connection portion;
The single piezoelectric substrate is mounted on the package substrate;
The output connection terminal of the transmission SAW filter is electrically connected to the first connection portion, and the input connection terminal of the reception SAW filter is electrically connected to the second connection portion. The duplexer according to claim 1, wherein:   The distance between the first connection portion and the second connection portion is greater than the distance between the output connection terminal of the transmission SAW filter and the input connection terminal of the reception SAW filter. The duplexer according to claim 2, wherein the duplexer is large.   The first connection portion is disposed closer to the output connection terminal of the transmission SAW filter than the input connection terminal of the reception SAW filter, and the second connection portion is disposed of the transmission SAW filter. 4. The duplexer according to claim 2, wherein the duplexer is disposed closer to the input connection terminal of the reception SAW filter than to the output connection terminal.   5. The package substrate according to claim 2, wherein the package substrate is rectangular, and the first connection portion and the second connection portion are located diagonally to the package substrate. The duplexer described.   The output connection terminal of the transmission SAW filter and the first connection portion are connected by a first wire, and the input connection terminal and the second connection portion of the reception SAW filter are second. The duplexer according to any one of claims 2 to 5, wherein the duplexer is connected by a wire.   The direction from the output connection terminal of the transmission SAW filter to the first connection portion is different from the direction from the input connection terminal of the reception SAW filter to the second connection portion. The duplexer according to any one of claims 2 to 6, characterized in that:   The direction from the output connection terminal of the transmission SAW filter to the first connection portion is opposite to the direction from the input connection terminal of the reception SAW filter to the second connection portion. The duplexer according to claim 7. A package substrate,
The single piezoelectric substrate is mounted on the package substrate;
2. The component according to claim 1, wherein the output connection terminal of the transmission SAW filter and the input connection terminal of the reception SAW filter are electrically connected to each other on the package substrate. Waver. The single piezoelectric substrate includes a first side and a second side facing each other,
The output connection terminal of the transmission SAW filter is disposed closer to the first side than the second side, and the input connection terminal of the reception SAW filter is closer to the first side than the first side. The duplexer according to any one of claims 1 to 9, wherein the duplexer is disposed close to the second side. The transmission SAW filter includes an input connection terminal;
The reception SAW filter includes an output connection terminal;
The input connection terminal of the transmission SAW filter is disposed closer to the second side than the first side, and the output connection terminal of the reception SAW filter is closer to the second side than the second side. The duplexer according to claim 10, wherein the duplexer is arranged close to the first side.   12. The output connection terminal of the transmission SAW filter and the input connection terminal of the reception SAW filter are electrically connected to an antenna terminal. The duplexer described in 1.   The duplexer according to claim 12, wherein the antenna terminal is formed on the package substrate.   The output connection terminal of the transmission SAW filter and the input connection terminal of the reception SAW filter are electrically connected to each other outside the single piezoelectric substrate. The duplexer according to any one of 13.   15. The transmission SAW filter and the reception SAW filter are each composed of a plurality of series arm SAW resonators and a plurality of parallel arm SAW resonators. The duplexer described in 1.   The transmission SAW filter includes a plurality of first SAW resonators connected to a ground, and the reception SAW filter includes a plurality of second SAW resonators connected to a ground. Item 16. The duplexer according to any one of Items 1 to 15.

Images