JP2001207265A - 成膜装置 - Google Patents

成膜装置

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Publication number
JP2001207265A
JP2001207265A JP2000018887A JP2000018887A JP2001207265A JP 2001207265 A JP2001207265 A JP 2001207265A JP 2000018887 A JP2000018887 A JP 2000018887A JP 2000018887 A JP2000018887 A JP 2000018887A JP 2001207265 A JP2001207265 A JP 2001207265A
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Prior art keywords
gas
pressure
film
film deposition
plasma
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English (en)
Inventor
Takahiro Mizoguchi
高宏 溝口
Koji Yokota
浩二 横田
Yoshito Hayakawa
義人 早川
Makoto Maeda
誠 前田
Hironori Hara
裕紀 原
Masami Kubota
昌実 久保田
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Kubota Corp
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Kubota Corp
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Withdrawn legal-status Critical Current

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Abstract

(57)【要約】 【構成】 はじめに放電限界下限ガス圧よりも十分に高
い第1圧力の非成膜ガス(Ar)をガス導入手段により
成膜チャンバにスパイク導入し、プラズマ生成手段によ
りプラズマを発生させる。その後、第1圧力より低く放
電限界下限ガス圧よりもやや高い第2圧力すなわちプラ
ズマ放電を持続可能な程度の圧力で非成膜ガスを供給
し、プラズマ放電を安定させて持続させる。そして、成
膜時には、非成膜ガスに替えて成膜ガス(C22)を成
膜チャンバに導入する。成膜後には、再び第2圧力の非
成膜ガスに切り替えて、次の成膜までプラズマ放電を持
続させる。 【効果】 非成膜ガスをスパイク導入して、プラズマ放
電を効率よく発生させるようにしたので、より早くプラ
ズマ放電の安定状態を得ることができる。

Description

【発明の詳細な説明】
【0001】
【産業上の利用分野】この発明は成膜装置に関し、特に
たとえばハードディスク,半導体装置,LCD,機械部
品または刃物等の被処理体に対してCVD法により成膜
する、成膜装置に関する。
【0002】
【従来の技術】この種の従来の成膜装置では、成膜チャ
ンバ内に成膜ガスを所定圧力で導入し、これをプラズマ
生成装置でプラズマ化して被処理体の表面に堆積させる
ようにしていた。そして、放電の初期段階には、プラズ
マを効率よく発生させるために、成膜チャンバ内のガス
圧を高めに設定していた。
【0003】この従来技術では、プラズマ放電開始時か
ら成膜ガスを導入していたので、プラズマ放電が不安定
な成膜初期段階に、性能および品質で劣る膜が多量に形
成されるという問題があった。つまり、成膜初期段階に
は、良好な性能および品質が得られるエネルギレベルよ
りも小さいエネルギのプラズマによって膜の堆積が生じ
るため膜の密着性が悪くなり、膜が剥離し易くなってい
た。また、成膜チャンバの内壁等にもこの質の悪い膜が
堆積されるため、パーティクルの発生原因になってい
た。
【0004】そこで、成膜初期段階から安定した膜を形
成するための技術として、たとえば特開平8−4585
7号公報のものが提案されている。この技術は、プラズ
マ放電の開始時に、不活性ガス,窒素ガス,酸素ガス,
水素ガスまたはハロゲンガス等の非成膜ガスのみを一定
圧力で成膜チャンバ内に導入し、この非成膜ガスでプラ
ズマ放電を安定させて持続させ、その後、成膜ガスを成
膜チャンバへ導入するようにしたものである。
【0005】
【発明が解決しようとする課題】上述の従来技術(特開
平8−45857号)では、成膜初期段階に質の悪い膜
が堆積されるのを防止できるものの、非成膜ガスのガス
圧が一定値に設定されていたのでプラズマ放電が安定す
るまでに時間がかかり、生産性が低いという問題があっ
た。
【0006】それゆえに、この発明の主たる目的は、プ
ラズマ放電の安定状態をより早く得ることができるとと
もに、膜質の劣化を防止できる、成膜装置を提供するこ
とである。
【0007】
【課題を解決するための手段】この発明は、被処理体を
収容する成膜チャンバ、非成膜ガスおよび成膜ガスを切
り替えながら成膜チャンバへ連続的に導入するガス導入
手段、非成膜ガスおよび成膜ガスをプラズマ化するプラ
ズマ生成手段、および非成膜ガスおよび成膜ガスの圧力
を制御する圧力制御手段を備え、非成膜ガスを第1圧力
でスパイク導入してプラズマを発生させ、非成膜ガスを
第1圧力より低い第2圧力で導入してプラズマを持続さ
せ、非成膜ガスに替えて成膜ガスを導入して成膜する、
成膜装置である。
【0008】
【作用】たとえば、はじめに放電限界下限ガス圧よりも
十分に高い第1圧力の非成膜ガスをガス導入手段により
成膜チャンバにスパイク導入し、プラズマ生成手段によ
りプラズマを発生させる。その後、第1圧力より低く放
電限界下限ガス圧よりもやや高い第2圧力すなわちプラ
ズマ放電を持続可能な程度の圧力で非成膜ガスを供給
し、プラズマ放電を安定させて持続させる。そして、成
膜時には、非成膜ガスに替えて成膜ガスを成膜チャンバ
に導入する。プラズマ放電は非成膜ガスによって安定し
て持続されるため、非成膜ガスを成膜ガスに切り替えて
もプラズマ放電の安定状態は維持される。成膜後には、
再び第2圧力の非成膜ガスに切り替えて、次の成膜まで
プラズマ放電を持続させる。
【0009】
【発明の効果】この発明によれば、成膜初期段階にたと
えば放電限界下限ガス圧よりも十分に高い第1圧力の非
成膜ガスをスパイク導入して、プラズマ放電を効率よく
発生させるようにしたので、より早くプラズマ放電の安
定状態を得ることができる。
【0010】また、第1圧力より低い第2圧力でプラズ
マ放電を安定させて持続させるようにしたので、高エネ
ルギのプラズマによって装置内部が叩かれるのを防止で
き、装置の耐久性を向上できる。
【0011】この発明の上述の目的,その他の目的,特
徴および利点は、図面を参照して行う以下の実施例の詳
細な説明から一層明らかとなろう。
【0012】
【実施例】図1を参照して、この実施例の成膜装置10
は、たとえばハードディスクの製造工程において、搬送
機12によって順次搬送される被処理体としての基板1
4にダイアモンドライクカーボン(DLC)膜等のよう
な保護膜を成膜するものである。
【0013】ここで、搬送機12は、開口16aを有す
るケーシング16を含み、ケーシング16の内部には、
基板14を搬送する搬送部18が設けられる。搬送部1
8は、上下方向へ変位可能な保持部20を含み、保持部
20の基部には鍔22が形成され、鍔22の上面にはO
リング等のような環状のシール材24が装着される。
【0014】成膜装置10は、基板14の表面に成膜す
るプラズマCVD装置(以下、単に「CVD装置」とい
う。)26を含む。CVD装置26は、基板14を収容
する成膜チャンバ28を含み、成膜チャンバ28の互い
に対向する2つの側面には開口28aが形成され、上面
には排気口28bが形成され、下面には開口28cが形
成される。そして、各開口28aにはプラズマ生成装置
30が取り付けられ、排気口28bには真空ポンプ等の
ような図示しない圧力制御手段(排気手段)が接続され
る。
【0015】プラズマ生成装置30は、たとえば米国特
許第5,858,477号公報において開示されたよう
な周知のものであり、図2からよくわかるように、ガス
導入部32およびプラズマ生成部34を含む。ガス導入
部32は導入管36を含み、導入管36の先端にはプラ
ズマ生成部34を構成するRF電極38が形成される。
また、RF電極38の先方にはプラズマ生成領域を囲む
ようにして磁石40が配置され、さらにその先方にはグ
リッド42が配置される。
【0016】また、ガス導入部32の導入管36には、
図1に示すように、図示しないガス供給源からの成膜ガ
スを導く1つの管路44aと非成膜ガスを導く2つの管
路44bおよび44cとが接続され、管路44aおよび
44cには、各ガスの流量を制御するためのマスフロー
コントローラ(MFC)46が設けられ、管路44bに
は、非成膜ガスをスパイク導入すなわち短時間に高圧で
導入するためのピエゾバルブ48が設けられる。さら
に、各管路44a,44bおよび44cにおけるマスフ
ローコントローラ(MFC)46またはピエゾバルブ4
8の下流側には、導入ガスを切り替えるための切替バル
ブ50が設けられる。なお、ピエゾバルブ48は、トグ
ル式の手動バルブ等のような瞬間的に開閉できる他のバ
ルブに置き換えられてもよい。
【0017】そして、ガス導入部32には、成膜ガスお
よび非成膜ガスのいずれかが、切替バルブ50によって
選択的に供給され、RF電極38にはRF電源52から
電力が印加される。したがって、ガス導入部32からプ
ラズマ生成部34にガス(成膜ガスまたは非成膜ガス)
が導入されると、そのガスがプラズマ化され、磁石40
によって作られる双曲線形磁場54およびグリッド42
を通して成膜チャンバ28内へ導入される。
【0018】なお、基板14にDLC膜を成膜するため
には、アセチレン,メタン,エタン,エチレン,ベンゼ
ンまたはトルエン等のような炭化水素系のガスが成膜ガ
スとして用いられ、プラズマ放電の安定持続のために
は、アルゴン,ヘリウムまたはネオン等の不活性ガス等
が非成膜ガスとして用いられる。
【0019】成膜装置10は、成膜チャンバ28の開口
28cが搬送機12の開口16aに位置的に対応するよ
うにして、搬送機12に固定される。これにより、搬送
機12と成膜チャンバ28とが連通され、CVD装置2
6内へ基板14を搬送するための搬送路56が得られ
る。
【0020】以下には、図3に従って、成膜装置10を
用いて基板14にDLC膜を成膜する方法を説明する。
なお、この実施例では、成膜ガスとしてアセチレン(C
22)を、非成膜ガスとしてアルゴン(Ar)を用いる
ものとする。
【0021】はじめに管路44aの切替バルブ50を閉
鎖するとともに管路44bおよび44cの各切替バルブ
50を開放し、管路44cから一定流量のアルゴンガス
を導入するとともに、ピエゾバルブ48によって管路4
4bから所定量のアルゴンガスを瞬間的に導入する。つ
まり、アルゴンガスをプラズマ放電下限ガス圧(約0.
1〜0.4mTorr)よりも十分に高い第1ガス圧
(約1.5〜5mTorr)でスパイク導入する。そし
て、このスパイク導入のタイミングに合わせてRF電極
38に電力(約300W)を印加し、プラズマを発生さ
せる。
【0022】プラズマが発生した後は、ピエゾバルブ4
8およびその下流の切替バルブ50を閉じることによっ
て、第1圧力より低くかつ放電限界下限ガス圧よりもや
や高い第2圧力(約0.5mTorr)のアルゴンガス
を管路44cから所定時間導入し、プラズマ放電を安定
させる。つまり、比較的低いガス圧でプラズマ放電を安
定させて持続させる。
【0023】プラズマ放電が安定すると、アルゴンガス
(非成膜ガス)に替えて、第1圧力よりも低くかつ第2
圧力より高い第3圧力(約1.5mTorr)のアセチ
レンガス(成膜ガス)を成膜チャンバ28に導入し、R
F電極38に印加する電力を大きくする(約300
W)。そして、搬送機12の保持部20を上昇させて、
保持部20に固定された基板14を成膜チャンバ28内
に搬入し、基板14に対して成膜する。なお、保持部2
0を上昇させると、鍔22に装着されたシール材24が
搬送機12のケーシング16に圧接されて搬送路54が
封鎖されるので、成膜時におけるアセチレンガスの漏洩
は生じない。
【0024】成膜が終わると、基板14を成膜チャンバ
28から搬出し、導入ガスを第3圧力のアセチレンガス
から第2圧力のアルゴンガスに切り替えるとともに、R
F電極38に印加する電力を小さくする(約200
W)。それにより、プラズマ放電の安定状態を持続させ
て、次の成膜が開始されるまで待機する。
【0025】そして、次に処理する基板14が搬送機1
2により搬送されてくると、導入ガスを第2圧力のアル
ゴンガスから第3圧力のアセチレンガスに切り替えると
ともに、RF電極38に印加する電力を大きくし(約3
00W)、成膜チャンバ28内に基板14を搬入して成
膜する。このようにして、成膜およびプラズマ放電の安
定持続を交互に繰り返す。
【0026】この実施例によれば、はじめに非成膜ガス
のスパイク導入によってプラズマを効率よく発生させる
ようにしたので、より早くプラズマの安定放電を得るこ
とができ、生産性を向上できる。
【0027】また、成膜の必要がないときでも、成膜チ
ャンバ28に非成膜ガスを導入してプラズマ放電を安定
状態で持続させるようにしたので、繰り返し成膜を行う
場合には、2回め以降の成膜工程において成膜ガスのス
パイク導入を省略できる。
【0028】さらに、プラズマ放電を安定持続させる際
には、非成膜ガスの圧力を第1圧力よりも低い第2圧力
に設定しているので、成膜装置10の内部が高エネルギ
のプラズマで叩かれるのを防止できる。
【0029】なお、上述の実施例では、この発明をハー
ドディスク基板14に対する成膜に適用した場合を示し
たが、この発明は、半導体装置,LCD,機械部品また
は刃物等のような他の被処理体に対する成膜にも同様に
適用できる。
【図面の簡単な説明】
【図1】この発明の一実施例を示す図解図である。
【図2】図1実施例で用いられるプラズマ生成装置を示
す図解図である。
【図3】ガス圧の経時変化を示すタイミングチャートで
ある。
【符号の説明】
10 …成膜装置 12 …搬送機 14 …基板 26 …プラズマCVD装置 28 …成膜チャンバ 30 …プラズマ生成装置 46 …マスフローコントローラ 48 …ピエゾバルブ 50 …切替バルブ
───────────────────────────────────────────────────── フロントページの続き (72)発明者 早川 義人 兵庫県伊丹市奥畑5丁目10番地 株式会社 クボタ内 (72)発明者 前田 誠 兵庫県伊丹市奥畑5丁目10番地 株式会社 クボタ内 (72)発明者 原 裕紀 兵庫県伊丹市奥畑5丁目10番地 株式会社 クボタ内 (72)発明者 久保田 昌実 兵庫県伊丹市奥畑5丁目10番地 株式会社 クボタ内 Fターム(参考) 4K030 AA09 AA16 BA28 BB12 CA12 EA03 FA02 HA04 JA09 KA30 LA19 5F045 AA08 AB07 AC01 BB08 EE02 EE14 EE19 EH19 EN04

Claims (3)

    【特許請求の範囲】
  1. 【請求項1】被処理体を収容する成膜チャンバ、 非成膜ガスおよび成膜ガスを切り替えながら前記成膜チ
    ャンバへ連続的に導入するガス導入手段、 前記非成膜ガスおよび前記成膜ガスをプラズマ化するプ
    ラズマ生成手段、および前記非成膜ガスおよび前記成膜
    ガスの圧力を制御する圧力制御手段を備え、 前記非成膜ガスを第1圧力でスパイク導入してプラズマ
    を発生させ、前記非成膜ガスを前記第1圧力より低い第
    2圧力で導入して前記プラズマを持続させ、前記非成膜
    ガスに替えて前記成膜ガスを導入して成膜する、成膜装
    置。
  2. 【請求項2】前記成膜ガスを前記第1圧力より低くかつ
    前記第2圧力より高い第3圧力で導入する、請求項1記
    載の成膜装置。
  3. 【請求項3】成膜後、前記成膜ガスに替えて前記非成膜
    ガスを前記第2圧力で連続的に導入する、請求項1また
    は2記載の成膜装置。
JP2000018887A 2000-01-27 2000-01-27 成膜装置 Withdrawn JP2001207265A (ja)

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KR100851237B1 (ko) 2007-03-15 2008-08-20 피에스케이 주식회사 기판 처리 방법
JP2008226891A (ja) * 2007-03-08 2008-09-25 Hitachi High-Technologies Corp プラズマ処理方法
JP2012506151A (ja) * 2008-10-14 2012-03-08 アプライド マテリアルズ インコーポレイテッド プラズマ強化化学気相成長(pecvd)によって共形の非晶質炭素膜を堆積させる方法
JP2014051738A (ja) * 2012-09-05 2014-03-20 Asm Ip Holding Bv プラズマ生成を安定化させる方法
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