FR2163861A5 - - Google Patents
Info
- Publication number
- FR2163861A5 FR2163861A5 FR7143510A FR7143510A FR2163861A5 FR 2163861 A5 FR2163861 A5 FR 2163861A5 FR 7143510 A FR7143510 A FR 7143510A FR 7143510 A FR7143510 A FR 7143510A FR 2163861 A5 FR2163861 A5 FR 2163861A5
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02024—Measuring in transmission, i.e. light traverses the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/35—Mechanical variable delay line
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7143510A FR2163861A5 (fr) | 1971-12-03 | 1971-12-03 | |
| US00309797A US3825348A (en) | 1971-12-03 | 1972-11-27 | Process of optical path modulation and modulator for implementation of the same |
| JP12110472A JPS5633691B2 (fr) | 1971-12-03 | 1972-12-02 | |
| DE2259244A DE2259244C3 (de) | 1971-12-03 | 1972-12-04 | Interferometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7143510A FR2163861A5 (fr) | 1971-12-03 | 1971-12-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FR2163861A5 true FR2163861A5 (fr) | 1973-07-27 |
Family
ID=9086903
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7143510A Expired FR2163861A5 (fr) | 1971-12-03 | 1971-12-03 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3825348A (fr) |
| JP (1) | JPS5633691B2 (fr) |
| DE (1) | DE2259244C3 (fr) |
| FR (1) | FR2163861A5 (fr) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4105336A (en) * | 1976-05-25 | 1978-08-08 | Pond Charles Ray | Electro-optical device for use in improved interferometers |
| US4142797A (en) * | 1977-02-11 | 1979-03-06 | Barnes Engineering Company | Common path interferometer |
| US4289403A (en) * | 1977-03-04 | 1981-09-15 | Isco, Inc. | Optical phase modulation instruments |
| US4397550A (en) * | 1980-02-14 | 1983-08-09 | Agency Of Industrial Science & Technology | Laser doppler velocimeter |
| US4355900A (en) * | 1980-08-08 | 1982-10-26 | The United States Of America As Represented By The Secretary Of The Air Force | Self-calibrating interferometer |
| FR2564198B1 (fr) * | 1984-05-11 | 1986-09-19 | Onera (Off Nat Aerospatiale) | Dispositif d'analyse et de correction de surfaces d'onde en temps reel |
| JPS6159092U (fr) * | 1984-09-24 | 1986-04-21 | ||
| US4773732A (en) * | 1984-12-21 | 1988-09-27 | Max-Planck-Gesellschaft Zur Foederung Der Wissenschaften E.V | Optical interferometric apparatus with an electrically controllable intensity transmission factor |
| WO1986007451A1 (fr) * | 1985-06-12 | 1986-12-18 | The Commonwealth Of Australia, Care Of The Secreta | Interferometre prismatique de direction d'arrivee acousto-optique pour signaux de frequence radio |
| US4735507A (en) * | 1986-07-11 | 1988-04-05 | The Perkin-Elmer Corporation | Imaging coherent radiometer |
| BE1007876A4 (nl) * | 1993-12-17 | 1995-11-07 | Philips Electronics Nv | Stralingsbron-eenheid voor het opwekken van een bundel met twee polarisatierichtingen en twee frequenties. |
| FR2812409B1 (fr) * | 2000-07-28 | 2002-11-01 | Photonetics | Interferometre optique a deux ondes stabilise en temperature et dispositif d'intercalage en longueur d'onde l'incorporant |
| US6842252B1 (en) | 2000-11-15 | 2005-01-11 | Burleigh Products Group, Inc. | Laser wavelength meter |
| US6871022B2 (en) * | 2001-09-14 | 2005-03-22 | Stratos International, Inc. | Cascaded optical multiplexer |
| US6972809B2 (en) * | 2001-12-20 | 2005-12-06 | Sharp Kabushiki Kaisha | Path shifting optical device having polarization correcting section and optical display system including same |
| JP2003302699A (ja) * | 2002-02-05 | 2003-10-24 | Sharp Corp | 画像表示装置および画像シフト素子 |
| WO2005010799A2 (fr) * | 2003-07-16 | 2005-02-03 | Shrenik Deliwala | Codage et reconstruction optiques |
| US8379228B1 (en) * | 2010-02-16 | 2013-02-19 | Alan Douglas Streater | Apparatus for measuring thin film refractive index and thickness with a spectrophotometer |
| JP2013246325A (ja) | 2012-05-25 | 2013-12-09 | Sumitomo Osaka Cement Co Ltd | 光変調器 |
| JP6435799B2 (ja) * | 2014-11-17 | 2018-12-12 | 横河電機株式会社 | 光学装置および測定装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1195839A (en) * | 1966-11-22 | 1970-06-24 | Barringer Research Ltd | Direct Reading Interferometer |
-
1971
- 1971-12-03 FR FR7143510A patent/FR2163861A5/fr not_active Expired
-
1972
- 1972-11-27 US US00309797A patent/US3825348A/en not_active Expired - Lifetime
- 1972-12-02 JP JP12110472A patent/JPS5633691B2/ja not_active Expired
- 1972-12-04 DE DE2259244A patent/DE2259244C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS4864946A (fr) | 1973-09-07 |
| DE2259244B2 (fr) | 1980-07-17 |
| DE2259244C3 (de) | 1981-04-30 |
| DE2259244A1 (de) | 1973-06-20 |
| JPS5633691B2 (fr) | 1981-08-05 |
| US3825348A (en) | 1974-07-23 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |