FI791414A - I kretsen kopplad digital testapparat - Google Patents

I kretsen kopplad digital testapparat

Info

Publication number
FI791414A
FI791414A FI791414A FI791414A FI791414A FI 791414 A FI791414 A FI 791414A FI 791414 A FI791414 A FI 791414A FI 791414 A FI791414 A FI 791414A FI 791414 A FI791414 A FI 791414A
Authority
FI
Finland
Prior art keywords
testapparat
kretsen
kopplad
digital
kretsen kopplad
Prior art date
Application number
FI791414A
Other languages
English (en)
Inventor
Douglas W Raymond
Thomas C Garrett
Original Assignee
Zehntel Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zehntel Inc filed Critical Zehntel Inc
Publication of FI791414A publication Critical patent/FI791414A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
FI791414A 1978-05-05 1979-05-02 I kretsen kopplad digital testapparat FI791414A (fi)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/903,160 US4216539A (en) 1978-05-05 1978-05-05 In-circuit digital tester

Publications (1)

Publication Number Publication Date
FI791414A true FI791414A (fi) 1979-11-06

Family

ID=25417033

Family Applications (1)

Application Number Title Priority Date Filing Date
FI791414A FI791414A (fi) 1978-05-05 1979-05-02 I kretsen kopplad digital testapparat

Country Status (12)

Country Link
US (1) US4216539A (fi)
JP (1) JPS54146940A (fi)
AU (1) AU525707B2 (fi)
CA (1) CA1141436A (fi)
DE (1) DE2918053A1 (fi)
DK (1) DK183979A (fi)
FI (1) FI791414A (fi)
FR (1) FR2425078A1 (fi)
GB (1) GB2020439B (fi)
IT (1) IT1116589B (fi)
NO (1) NO791508L (fi)
SE (1) SE437431B (fi)

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US4870354A (en) * 1988-08-11 1989-09-26 Zehntel, Inc. Apparatus for contacting a printed circuit board with an array of test probes
US6304987B1 (en) 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
US4998250A (en) * 1988-09-08 1991-03-05 Data I/O Corporation Method and apparatus for determining an internal state of an electronic component
US4949341A (en) * 1988-10-28 1990-08-14 Motorola Inc. Built-in self test method for application specific integrated circuit libraries
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FR2648916B1 (fr) * 1989-06-27 1991-09-06 Cit Alcatel Agencement de test de cartes a circuit imprime et son application au test de cartes a circuit imprime formant un equipement de multiplexage-demultiplexage de signaux numeriques
JP3005250B2 (ja) 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド バスモニター集積回路
US5045782A (en) * 1990-01-23 1991-09-03 Hewlett-Packard Company Negative feedback high current driver for in-circuit tester
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US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
US5442644A (en) * 1993-07-01 1995-08-15 Unisys Corporation System for sensing the state of interconnection points
US5596715A (en) * 1993-07-06 1997-01-21 Digital Equipment Corporation Method and apparatus for testing high speed busses using gray-code data
US5539753A (en) * 1995-08-10 1996-07-23 International Business Machines Corporation Method and apparatus for output deselecting of data during test
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US6408413B1 (en) 1998-02-18 2002-06-18 Texas Instruments Incorporated Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6311311B1 (en) 1999-08-19 2001-10-30 International Business Machines Corporation Multiple input shift register (MISR) signatures used on architected registers to detect interim functional errors on instruction stream test
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
US6449576B1 (en) * 2000-03-29 2002-09-10 International Business Machines Corporation Network processor probing and port mirroring
DE10042620B4 (de) * 2000-08-30 2005-05-04 Infineon Technologies Ag Anordnung zum Testen eines Speichermoduls
JP2002131392A (ja) * 2000-10-24 2002-05-09 Ando Electric Co Ltd アナログ・ディジタル特性試験回路
DE10148157B4 (de) * 2001-09-28 2006-05-18 Infineon Technologies Ag Programmgesteuerte Einheit
US6948153B2 (en) * 2001-11-13 2005-09-20 Prometric Method and system for computer based testing using an amalgamated resource file
US20040153911A1 (en) * 2002-12-24 2004-08-05 Alon Regev Testing of a CAM
US20050289323A1 (en) 2004-05-19 2005-12-29 Kar-Lik Wong Barrel shifter for a microprocessor
US8307342B2 (en) * 2008-05-14 2012-11-06 Honeywell International Inc. Method, apparatus, and system for automatic test generation from statecharts
US20100192128A1 (en) * 2009-01-27 2010-07-29 Honeywell International Inc. System and methods of using test points and signal overrides in requirements-based test generation
RU200558U1 (ru) * 2020-01-23 2020-10-29 Василий Львович Зотов Устройство для диагностики электронных схем

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Also Published As

Publication number Publication date
DE2918053A1 (de) 1979-11-15
SE7903873L (sv) 1979-11-06
GB2020439A (en) 1979-11-14
IT1116589B (it) 1986-02-10
JPS54146940A (en) 1979-11-16
JPS638435B2 (fi) 1988-02-23
US4216539A (en) 1980-08-05
DK183979A (da) 1979-12-10
DE2918053C2 (fi) 1988-03-10
FR2425078B1 (fi) 1985-05-17
AU525707B2 (en) 1982-11-25
IT7948942A0 (it) 1979-05-04
FR2425078A1 (fr) 1979-11-30
AU4632779A (en) 1979-12-20
CA1141436A (en) 1983-02-15
SE437431B (sv) 1985-02-25
NO791508L (no) 1979-11-06
GB2020439B (en) 1982-12-15

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Legal Events

Date Code Title Description
FG Patent granted

Owner name: CO!PERATIEVE VERENIGING SUIKER UNIE U.A.

BB Publication of examined application
MM Patent lapsed
FD Application lapsed

Owner name: ZEHNTEL, INC.