DE3864885D1 - Einrichtung zum messen von strahlung und spektrometer mit einer solchen einrichtung. - Google Patents

Einrichtung zum messen von strahlung und spektrometer mit einer solchen einrichtung.

Info

Publication number
DE3864885D1
DE3864885D1 DE8888200710T DE3864885T DE3864885D1 DE 3864885 D1 DE3864885 D1 DE 3864885D1 DE 8888200710 T DE8888200710 T DE 8888200710T DE 3864885 T DE3864885 T DE 3864885T DE 3864885 D1 DE3864885 D1 DE 3864885D1
Authority
DE
Germany
Prior art keywords
spectrometer
measuring radiation
radiation
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888200710T
Other languages
English (en)
Inventor
Hendrik Johannes Jan Bolk
Georges Charles Petr Zieltjens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Malvern Panalytical BV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3864885D1 publication Critical patent/DE3864885D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE8888200710T 1987-04-22 1988-04-13 Einrichtung zum messen von strahlung und spektrometer mit einer solchen einrichtung. Expired - Lifetime DE3864885D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8700949A NL8700949A (nl) 1987-04-22 1987-04-22 Inrichting voor het meten van stralingsquanta, impulsonderscheidingsinrichting geschikt voor gebruik in en spectrometer voorzien van een dergelijke inrichting.

Publications (1)

Publication Number Publication Date
DE3864885D1 true DE3864885D1 (de) 1991-10-24

Family

ID=19849895

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888200710T Expired - Lifetime DE3864885D1 (de) 1987-04-22 1988-04-13 Einrichtung zum messen von strahlung und spektrometer mit einer solchen einrichtung.

Country Status (5)

Country Link
US (1) US4922442A (de)
EP (1) EP0288116B1 (de)
JP (1) JP2713420B2 (de)
DE (1) DE3864885D1 (de)
NL (1) NL8700949A (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5067090A (en) * 1989-05-01 1991-11-19 Schlumberger Technology Corporation Nuclear spectroscopy method and apparatus for digital pulse height analysis
EP0568141A3 (de) * 1992-04-28 1999-05-19 Koninklijke Philips Electronics N.V. Röntgenanalysegerät mit verringerter Messtotzeit und für die Anwendung in einem solchen Röntgenanalysegerät geeignetes Detektorleseschaltungsmittel
JPH0627245A (ja) * 1992-04-28 1994-02-04 Philips Electron Nv Ｘ線分析装置およびこのようなｘ線分析装置に用いるに好適な検出器読み取り回路手段
EP0626591B1 (de) * 1993-03-24 1998-09-16 Koninklijke Philips Electronics N.V. Strahlungsuntersuchungsgerät
JPH07229861A (ja) * 1994-02-16 1995-08-29 Dkk Corp 放射線分析装置
US6269144B1 (en) 1998-03-04 2001-07-31 William P. Dube Method and apparatus for diffraction measurement using a scanning x-ray source
JP4160275B2 (ja) * 2001-05-28 2008-10-01 浜松ホトニクス株式会社 エネルギー測定方法及び測定装置
WO2008072181A2 (en) * 2006-12-13 2008-06-19 Koninklijke Philips Electronics N.V. Apparatus, imaging device and method for counting x-ray photons
CN101680956B (zh) * 2007-06-19 2013-02-13 皇家飞利浦电子股份有限公司 用于多谱光子计数读出电路的数字脉冲处理
JP5517584B2 (ja) * 2009-12-08 2014-06-11 株式会社日立ハイテクノロジーズ 電子顕微鏡
JP5076012B1 (ja) 2011-05-20 2012-11-21 株式会社リガク 波長分散型蛍光ｘ線分析装置
AU2018202912B1 (en) * 2018-04-27 2019-06-20 Southern Innovation International Pty Ltd Input count rate estimation in radiation pulse detectors

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US30904A (en) * 1860-12-11 Crosscut-sawing machine
US3984689A (en) * 1974-11-27 1976-10-05 G. D. Searle & Co. Scintillation camera for high activity sources
US4593198A (en) * 1982-11-18 1986-06-03 Digital Scintigraphics, Inc. Pulse pile-up discrimination system
US4535242A (en) * 1983-03-03 1985-08-13 Siemens Gammasonics, Inc. Method and a circuit for processing pulses of a pulse train
FR2546632B1 (fr) * 1983-05-27 1985-07-12 Thomson Csf Procede de traitement des impulsions delivrees par une gammacamera et gammacamera mettant en oeuvre ce procede
FR2552552B1 (fr) * 1983-09-27 1986-02-07 Commissariat Energie Atomique Dispositif de constitution d'un histogramme en temps reel
US4599690A (en) * 1983-11-09 1986-07-08 Siemens Gammasonics, Inc. Method and circuit for correcting count rate losses of radiation events
IT1198771B (it) * 1984-01-27 1988-12-21 Mario Alcidi Metodo e dispositivo per l'abbattimento dell'effetto pile-up in contatori a scintillazione
US4692626A (en) * 1984-06-20 1987-09-08 Westphal Georg P Nuclear and X-ray spectrometry and low-pass filter and filtering method therefor
US4677300A (en) * 1984-08-03 1987-06-30 Harshaw/Filtrol Partnership Radiation detection and acquisition system
US4675526A (en) * 1985-04-15 1987-06-23 Rogers Joel G Method and apparatus for 3-D encoding

Also Published As

Publication number Publication date
JP2713420B2 (ja) 1998-02-16
JPS63281040A (ja) 1988-11-17
EP0288116B1 (de) 1991-09-18
EP0288116A1 (de) 1988-10-26
NL8700949A (nl) 1988-11-16
US4922442A (en) 1990-05-01

Similar Documents

Publication Publication Date Title
DE58904606D1 (de) Winkelmessvorrichtung.
DE58900461D1 (de) Mehrkoordinatenmess- und pruefeinrichtung.
DE58901879D1 (de) Koordinatenmessgeraet.
DE58900833D1 (de) Positionsmesseinrichtung.
DE3675373D1 (de) Entwicklungsgeraet und bilderzeugungsgeraet mit einer derartigen vorrichtung.
DE3676505D1 (de) Messgeraet.
FI104217B (fi) Mittauslaite
DE69001445D1 (de) Maehvorrichtung.
DE68908094D1 (de) Teilchenmessvorrichtung.
DE3852946D1 (de) Immuno-Agglutinationsmessgerät.
DE69024016D1 (de) Messvorrichtung.
DE58901912D1 (de) Winkelmessgeraet.
DE3864885D1 (de) Einrichtung zum messen von strahlung und spektrometer mit einer solchen einrichtung.
DE69019212D1 (de) Strahlungsmessvorrichtung.
DE59107161D1 (de) SQUID-Messeinrichtung mit Abschirmmitteln
DE68900525D1 (de) Waegevorrichtung mit dehnungsmessstreifen.
DE58904338D1 (de) Positionsmesseinrichtung.
DE58906947D1 (de) Vorrichtung zum Befestigen von Schalt- und Messgeräten.
DE68908430D1 (de) Messgeraet.
DE3675848D1 (de) Entfernungsmessgeraet.
DE3678533D1 (de) Maehvorrichtung.
ATA69788A (de) Winkelmessgeraet
DE3677585D1 (de) Mess- und regelvorrichtung.
DE3574909D1 (de) Geraet zum messen von schwachen stroemen mit hohem dynamikbereich.
DE3676028D1 (de) Messgeraet.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL

8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8327 Change in the person/name/address of the patent owner

Owner name: PANALYTICAL B.V., ALMELO, NL

8339 Ceased/non-payment of the annual fee