DE3584117D1 - Verfahren zur ultraschallmessung und dazugehoeriges geraet. - Google Patents

Verfahren zur ultraschallmessung und dazugehoeriges geraet.

Info

Publication number
DE3584117D1
DE3584117D1 DE8585105060T DE3584117T DE3584117D1 DE 3584117 D1 DE3584117 D1 DE 3584117D1 DE 8585105060 T DE8585105060 T DE 8585105060T DE 3584117 T DE3584117 T DE 3584117T DE 3584117 D1 DE3584117 D1 DE 3584117D1
Authority
DE
Germany
Prior art keywords
related device
ultrasonic measurement
ultrasonic
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585105060T
Other languages
English (en)
Inventor
Yoshinori Hayakawa
Tadashi Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Terumo Corp
Original Assignee
Terumo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Terumo Corp filed Critical Terumo Corp
Application granted granted Critical
Publication of DE3584117D1 publication Critical patent/DE3584117D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88—Sonar systems specially adapted for specific applications
    • G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
    • G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
    • G01S15/895—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques characterised by the transmitted frequency spectrum
    • G01S15/8952—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques characterised by the transmitted frequency spectrum using discrete, multiple frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0645—Display representation or displayed parameters, e.g. A-, B- or C-Scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2437—Piezoelectric probes
    • G01N29/245—Ceramic probes, e.g. lead zirconate titanate [PZT] probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88—Sonar systems specially adapted for specific applications
    • G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
    • G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
    • G01S15/8997—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques using synthetic aperture techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/52—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00
    • G01S7/52017—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00 particularly adapted to short-range imaging
    • G01S7/52023—Details of receivers
    • G01S7/52036—Details of receivers using analysis of echo signal for target characterisation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Remote Sensing (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Acoustics & Sound (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Ceramic Engineering (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
DE8585105060T 1984-06-28 1985-04-25 Verfahren zur ultraschallmessung und dazugehoeriges geraet. Expired - Fee Related DE3584117D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59131918A JPS6111658A (ja) 1984-06-28 1984-06-28 超音波測定方法およびその装置

Publications (1)

Publication Number Publication Date
DE3584117D1 true DE3584117D1 (de) 1991-10-24

Family

ID=15069233

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585105060T Expired - Fee Related DE3584117D1 (de) 1984-06-28 1985-04-25 Verfahren zur ultraschallmessung und dazugehoeriges geraet.

Country Status (4)

Country Link
US (1) US4597292A (de)
EP (1) EP0168565B1 (de)
JP (1) JPS6111658A (de)
DE (1) DE3584117D1 (de)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6070381A (ja) * 1983-09-28 1985-04-22 Toshiba Corp 超音波映像化装置
US4736630A (en) * 1985-08-05 1988-04-12 Hitachi, Ltd. Apparatus and method for sending out and receiving ultrasonic wave signals
US4817015A (en) * 1985-11-18 1989-03-28 The United States Government As Represented By The Secretary Of The Health And Human Services High speed texture discriminator for ultrasonic imaging
JPH0666854B2 (ja) * 1986-03-12 1994-08-24 富士写真フイルム株式会社 放射線画像情報記録読取装置
US4908774A (en) * 1986-05-05 1990-03-13 Akademiet For De Tekniske Videnskaber System for ultrasonic examination
JP2647372B2 (ja) * 1987-01-14 1997-08-27 三菱重工業株式会社 開口合成信号処理方法
DE3720219A1 (de) * 1987-06-17 1988-12-29 Betr Forsch Inst Angew Forsch Verfahren zur ueberpruefung von bauteilen
US5099849A (en) * 1988-05-11 1992-03-31 Lunar Corporation Ultrasonic densitometer device and method
US5840029A (en) * 1988-05-11 1998-11-24 Lunar Corporation Imaging ultrasonic densitometer
US5343863A (en) * 1988-05-11 1994-09-06 Lunar Corporation Ultrasonic densitometer device and method
US5483965A (en) * 1988-05-11 1996-01-16 Lunar Corporation Ultrasonic densitometer device and method
US6027449A (en) * 1988-05-11 2000-02-22 Lunar Corporation Ultrasonometer employing distensible membranes
US5042489A (en) * 1988-05-11 1991-08-27 Lunar Corporation Ultrasonic densitometer device and method
US6277076B1 (en) 1988-05-11 2001-08-21 Lunar Corporation Ultrasonic densitometer with pre-inflated fluid coupling membranes
US5054490A (en) * 1988-05-11 1991-10-08 Lunar Corporation Ultrasonic densitometer device and method
US5603325A (en) * 1988-05-11 1997-02-18 Lunar Corporation Ultrasonic densitometer with width compensation
US4930511A (en) * 1988-05-11 1990-06-05 Lunar Radiation, Inc. Ultrasonic densitometer device and method
US5349959A (en) * 1988-05-11 1994-09-27 Lunar Corporation Ultrasonic densitometer device and method
US5111696A (en) * 1989-01-24 1992-05-12 Akademiet For De Tekniske Videnskaber, Svejsecentralen Method of visualizing reflection characteristic in ultrasonic examination
US5426979A (en) * 1990-06-04 1995-06-27 Medicano Systems Ltd. Frequency spectrum apparatus for determining mechanical properties
IL94616A (en) * 1990-06-04 1994-06-24 Medicano Systems Ltd Apparatus and method for calculating the mechanical properties of a solid
US5475613A (en) * 1991-04-19 1995-12-12 Kawasaki Jukogyo Kabushiki Kaisha Ultrasonic defect testing method and apparatus
US5218963A (en) * 1991-10-15 1993-06-15 Lunar Corporation Ultrasonic bone analysis device and method
US5269309A (en) * 1991-12-11 1993-12-14 Fort J Robert Synthetic aperture ultrasound imaging system
US5501222A (en) * 1994-05-13 1996-03-26 Briggs; Keith A. System for imaging a region
US5549002A (en) * 1994-07-01 1996-08-27 General Electric Company Method for detecting and characterizing flaws in engineering materials
US6517487B1 (en) 1995-03-01 2003-02-11 Lunar Corporation Ultrasonic densitometer with opposed single transducer and transducer array
IL116701A0 (en) 1995-10-04 1996-10-16 Sunlight Ultrasound Technologi Ultrasonic device for determining bone characteristics
WO1997036175A1 (fr) * 1996-03-28 1997-10-02 Mitsubishi Denki Kabushiki Kaisha Detecteur de defauts par ultrasons et procede de detection de defauts par ultrasons
US5801312A (en) * 1996-04-01 1998-09-01 General Electric Company Method and system for laser ultrasonic imaging of an object
FR2752461B1 (fr) * 1996-08-14 1998-11-06 Dory Jacques Procede et dispositif pour le traitement de signaux representatifs d'ondes reflechies ou transmises par une structure volumique en vue d'effectuer une exploration et une analyse de cette structure
US6167377A (en) * 1997-03-28 2000-12-26 Dragon Systems, Inc. Speech recognition language models
US7112173B1 (en) 1998-03-03 2006-09-26 Sunlight Medical Ltd. Determination of acoustic velocity in bone
DE112006001786B4 (de) * 2005-07-06 2018-11-29 National Research Council Of Canada Verfahren und System zum Bestimmen von Materialeigenschaften mittels Ultraschalldämpfung
US7353709B2 (en) * 2005-07-06 2008-04-08 National Research Council Of Canada Method and system for determining material properties using ultrasonic attenuation
DE102006027132B4 (de) * 2006-06-02 2010-04-15 BAM Bundesanstalt für Materialforschung und -prüfung Verfahren zum Detektieren von Fehlstellen in Betonbauteilen
US7836769B2 (en) * 2006-08-10 2010-11-23 Akrion Systems Llc Apparatus and method of measuring acoustical energy applied to a substrate
JP5683213B2 (ja) 2009-11-17 2015-03-11 キヤノン株式会社 画像形成装置及び画像形成方法
US9110166B2 (en) * 2011-12-01 2015-08-18 Halliburton Energy Services, Inc. Acoustic imaging
WO2016168605A1 (en) 2015-04-16 2016-10-20 Gentuity, Llc Micro-optic probes for neurology
WO2017040484A1 (en) 2015-08-31 2017-03-09 Gentuity, Llc Imaging system includes imaging probe and delivery devices
CN106932277B (zh) * 2017-04-28 2023-05-12 大连理工大学 基于圆角平面接触理论的界面超声波反射率-压强关系曲线建立方法及加载试验台
JP7160935B2 (ja) 2017-11-28 2022-10-25 ジェンテュイティ・リミテッド・ライアビリティ・カンパニー 撮像システム
US11719672B2 (en) 2020-06-12 2023-08-08 Baker Hughes Oilfield Operations Llc Application specific excitation of ultrasonic probes

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55143476A (en) * 1979-04-26 1980-11-08 Kiyoshi Nakayama Composing method for ultrasonic-wave opening surface
JPS56147082A (en) * 1980-04-17 1981-11-14 Yoshinori Hayakawa Method and device for quantitative ultrasonic inspection using plural frequencies
FI65677C (fi) * 1981-02-09 1984-06-11 Esko Alasaarela Holografisk b-avbildningsmetod
JPS58173539A (ja) * 1982-04-07 1983-10-12 富士通株式会社 超音波による生体組織特性測定方法
JPS59171540A (ja) * 1983-03-18 1984-09-28 富士通株式会社 スペクトル形状利用測定方法
US4546772A (en) * 1983-08-08 1985-10-15 General Electric Company Method and means for determining ultrasonic wave attenuation in tissue using phase locked loop

Also Published As

Publication number Publication date
EP0168565A1 (de) 1986-01-22
JPS6111658A (ja) 1986-01-20
EP0168565B1 (de) 1991-09-18
US4597292A (en) 1986-07-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee