DE102008009600A1 - Facet mirror e.g. field facet mirror, for use as bundle-guiding optical component in illumination optics of projection exposure apparatus, has single mirror tiltable by actuators, where object field sections are smaller than object field - Google Patents
Facet mirror e.g. field facet mirror, for use as bundle-guiding optical component in illumination optics of projection exposure apparatus, has single mirror tiltable by actuators, where object field sections are smaller than object field Download PDFInfo
- Publication number
- DE102008009600A1 DE102008009600A1 DE102008009600A DE102008009600A DE102008009600A1 DE 102008009600 A1 DE102008009600 A1 DE 102008009600A1 DE 102008009600 A DE102008009600 A DE 102008009600A DE 102008009600 A DE102008009600 A DE 102008009600A DE 102008009600 A1 DE102008009600 A1 DE 102008009600A1
- Authority
- DE
- Germany
- Prior art keywords
- mirror
- individual
- facet mirror
- facet
- field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0825—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
Die Erfindung betrifft einen Facettenspiegel zum Einsatz als bündelführende optische Komponente in einer Projektionsbelichtungsanlage für die Mikro-Lithographie.The The invention relates to a facet mirror for use as a bundle-conducting optical component in a projection exposure apparatus for the micro-lithography.
Derartige
Facettenspiegel sind bekannt aus der
Es ist eine Aufgabe der vorliegenden Erfindung, einen Facettenspiegel der eingangs genannten Art weiterzubilden, dass durch den Einsatz dieses Facettenspiegels in der Projektionsbelichtungsanlage die Variabilität bei der Einstellung verschiedener Beleuchtungsgeometrien eines mit der Projektionsbelichtungsanlage zu belichtenden Objektfeldes erhöht ist.It It is an object of the present invention to provide a facet mirror further develop the type mentioned that through the use this facet mirror in the projection exposure system the Variability when setting different lighting geometries a to be exposed with the projection exposure system object field is increased.
Diese Aufgabe ist erfindungsgemäß gelöst durch einen Facettenspiegel mit den im Anspruch 1 oder mit den im Anspruch 4 angegebenen Merkmalen.These The object is achieved by a faceted mirror with the in claim 1 or with in the claim 4 specified characteristics.
Die erfindungsgemäße Unterteilung des Facettenspiegels in eine Vielzahl von Einzelspiegeln, die unabhängig voneinander verkippt werden können, ermöglicht eine variable Vorgabe von Unterteilungen des Facettenspiegels in Einzelspiegel-Gruppen. Dies kann dazu genutzt werden, Gruppierungen mit verschiedenen Berandungen zu erzeugen, um auf diese Weise beispielsweise eine Anpassung an die Form eines auszuleuchtenden Objektfeldes zu gewährleisten. Die individuelle Ansteuerbarkeit der Einzelspiegel gewährleistet, dass eine Vielzahl verschiedener Beleuchtungen des Objektfeldes möglich wird, ohne hierbei Licht durch Abschattungen zu verlieren. Insbesondere ist eine Anpassung einer Beleuchtungsoptik, innerhalb der der Facettenspiegel einsetzbar ist, an optische Parameter einer Strahlungsquelle möglich, beispielsweise an eine Strahldivergenz oder an eine Intensitätsverteilung über den Strahlquerschnitt. Der Facettenspiegel kann so ausgeführt sein, dass mehrere Einzelspiegel-Gruppen jeweils für sich das gesamte Objektfeld ausleuchten. Es können mehr als zehn, mehr als 50 oder auch mehr als 100 derartiger Einzelspiegel-Gruppen beim erfindungsgemäßen Facettenspiegel vorgesehen sein.The subdivision of the facet mirror according to the invention into a variety of individual mirrors, which are independent of each other can be tilted, allows a variable Specification of subdivisions of the facet mirror into individual mirror groups. This can be used to groupings with different boundaries for example, to adapt to this To ensure the shape of an illuminated object field. The individual controllability of the individual mirrors ensures that a variety of different illuminations of the object field becomes possible without light by shadowing to lose. In particular, an adaptation of a lighting optical system, within which the facet mirror can be used, to optical parameters a radiation source possible, for example, to a Beam divergence or an intensity distribution over the beam cross section. The facet mirror can do this be that multiple individual mirror groups each for themselves illuminate the entire object field. There can be more than ten, more than 50 or even more than 100 such individual mirror groups be provided in the facet mirror according to the invention.
Bei Einzelspiegeln nach Anspruch 2 können die zugeordneten Einzelspiegel-Ausleuchtungskanäle das Objektfeld getrennt voneinander ausleuchten oder es kann eine gezielte Überlappung zwischen den Einzelspiegel-Ausleuchtungskanälen bereitgestellt werden. Das Objektfeld kann von mehr als zwei Einzelspiegel-Ausleuchtungskanälen ausgeleuchtet werden, beispielsweise von mehr als zehn Einzelspiegel-Ausleuchtungskanälen.at Individual mirrors according to claim 2, the associated Single-mirror illumination channels separate the object field illuminate each other or it can be a targeted overlap provided between the individual mirror illumination channels become. The object field may consist of more than two single-mirror illumination channels be illuminated, for example, more than ten individual mirror illumination channels.
Die Vorteile eines Facettenspiegels nach Anspruch 4 entsprechen denen, die vorstehend im Zusammenhang mit dem Facettenspiegel nach Anspruch 1 erläutert wurden.The Advantages of a facet mirror according to claim 4 correspond to those the above in connection with the facet mirror according to claim 1 were explained.
Ein Facettenspiegel nach Anspruch 5 wird insbesondere als Feldfacettenspiegel in einer Beleuchtungsoptik der Projektionsbelichtungsanlage eingesetzt. Je nach Größe und Form der Einzelspiegel-Gruppen kann eine entsprechende Größe und Form des auszuleuchtenden Objektfeldes resultieren. Bei rechteckigem Objektfeld stimmt dann das Facetten-Aspektverhältnis der Einzelfacetten mit dem Feld-Aspektverhältnis überein.One Facet mirror according to claim 5, in particular as a field facet mirror used in an illumination optical system of the projection exposure system. Depending on the size and shape of the individual mirror groups can be an appropriate size and shape of the illuminated Object field result. For rectangular object field then true the facet aspect ratio of the individual facets with the Field aspect ratio match.
Anstelle von Einzelfacetten, deren Form der vollen Form des Objektfeldes entspricht, können auch Einzelfacetten bzw. Einzelspiegel-Gruppierungen realisiert werden, die Halbfeldern entsprechen, also einem Feld mit halber Erstreckung längs einer Objektfelddimension. Je zwei solcher Halbfelder werden dann zur Beleuchtung des gesamten Objektfeldes zusammengesetzt.Instead of of single facets whose shape is the full form of the object field can also be single facets or single mirror groupings be realized, which correspond to half fields, so a field with half extent along an object field dimension. Each two such half-fields are then used to illuminate the entire Object field composed.
Gruppenformen nach den Ansprüchen 6 und 7 sind gut an derzeitige Objektfeldgeometrien angepasst. Eine bogenförmige, ringförmige oder kreisförmige Einhüllende kann dabei auch durch pixelweise Annäherung erfolgen, indem aus einer rasterartigen Einzelspiegel-Anordnung eine Einzelspiegel-Gruppe ausgewählt wird, deren Berandung der gewünschten Einhüllenden angenähert ist.group forms according to claims 6 and 7 are good at current object field geometries customized. An arcuate, annular or circular envelope can also by pixel-by-pixel approximation done by a grid-like single-mirror arrangement a single-mirror group is selected, whose boundary approximated to the desired envelope is.
Ein Facettenspiegel nach Anspruch 8 kommt insbesondere als Pupillenfacettenspiegel in einer Beleuchtungsoptik der Projektionsbelichtungsanlage zum Einsatz.One Facet mirror according to claim 8 comes in particular as a pupil facet mirror in an illumination optical system of the projection exposure apparatus for Commitment.
Bevorzugt
werden innerhalb der Beleuchtungsoptik sowohl ein erfindungsgemäß in
Einzelspiegel unterteilter Feldfacettenspiegel als auch ein erfindungsgemäß in
Einzelspiegel unterteilter Pupillenfacettenspiegel eingesetzt. Es
kann dann eine bestimmte Beleuchtungswinkelverteilung, also ein
Beleuchtungssetting, durch entsprechende Gruppierung der Einzelspiegel-Gruppen
auf dem Feldfacettenspiegel und den Pupillenfacettenspiegeln praktisch
ohne Lichtverlust realisiert werden. Erfindungsgemäß in
Einzelspiegel unterteilt sein kann auch ein spekularer Reflektor
nach Art desjenigen, der beispielsweise in der
Eine
Ausführung nach Anspruch 9 kann auf der Basis konstruktiver
Lösungen realisiert werden, die aus dem Bereich von Mikrospiegel-Arrays
bereits bekannt sind. Ein Mikrospiegel-Array ist beispielsweise
beschrieben in der
Ein Einzelspiegel nach Anspruch 10 ist konstruktiv mit vergleichsweise geringem Aufwand realisierbar. Auch mit derart plan ausgeführten Einzelspiegeln lassen sich Einzelspiegel-Gruppen mit insgesamt angenähert gekrümmten Reflexionsflächen realisieren. Alternativ ist es möglich, die Einzelspiegel des Facettenspiegels gekrümmt, insbesondere elliptisch gekrümmt, auszuführen, sodass die Einzelspiegel für das Beleuchtungs- beziehungsweise Abbildungslicht eine bündelformende Wirkung haben. Die Einzelspiegel sind dabei insbesondere konkav gekrümmt. Der Facettenspiegel kann insbesondere als Multiellipsoidspiegel ausgeführt sein. Anstelle von gekrümmten Einzelspiegeln können derartige gekrümmte Einzelspiegel wiederum durch Einzelspieget-Gruppen mit planen Reflexionsflächen ersetzt werden, wobei die nichtplanen Oberflächen eines derart ersetzten gekrümmten Einzelspiegels durch ein Polyeder von Mikrofacetten approximiert werden.One Single mirror according to claim 10 is constructive with comparatively little effort feasible. Even with such plan running Single mirrors can be approximated individual mirror groups with a total realize curved reflecting surfaces. alternative is it possible to use the individual mirrors of the facet mirror curved, in particular elliptically curved, execute, so that the individual mirrors for the lighting or Imaging light have a bundle-forming effect. The Individual mirrors are in particular concavely curved. The facet mirror can be used in particular as a multi-ellipsoidal mirror be executed. Instead of curved individual mirrors can turn such curved individual mirror by single-mirror groups with flat reflection surfaces be replaced, the non-planar surfaces of such a replaced curved single mirror by a polyhedron be approximated by microfacets.
Eine Verlagerbarkeit nach Anspruch 11 erhöht die Variabilität bei der Vorgabe bestimmter Topographien der Reflexionsfläche des Facettenspiegels. Es ist dann nicht nur eine Gruppierung möglich, sondern auch innerhalb der jeweiligen Gruppierungen die Vorgabe bestimmter Reflexionsflächenkrümmungen und -freiformen, die eine gewünschte abbildende oder in sonstiger Weise bündelformende Wirkung haben.A Displaceability according to claim 11 increases the variability when specifying certain topographies of the reflection surface of the facet mirror. It is then not just a grouping possible, but also within the respective groupings the specification of certain Reflection surface curvatures and free-formations that a desired imaging or otherwise bundle-forming Have effect.
Eine Anordnung nach Anspruch 12 kann ebenfalls auf der Basis von konstruktiven Lösungen, die aus dem Bereich der Mikrospiegel-Arrays bekannt sind, realisiert werden.A Arrangement according to claim 12 can also be based on constructive Solutions known from the field of micromirror arrays are to be realized.
Eine Ansteuerung nach Anspruch 13 gewährleistet eine schnelle und je nach Vorgabe individuelle Ansteuerung der Einzelspiegel.A Control according to claim 13 ensures a fast and, depending on the specification, individual activation of the individual mirrors.
Eine reihenweise, also insbesondere zeilen- oder spaltenweise Ansteuerung nach Anspruch 14 ermöglicht eine unaufwändige gemeinsame Ansteuerung von Einzelspiegeln, falls dies, beispielsweise zur Gruppierung oder zur gemeinsamen Ausblendung von Einzelspiegeln, erforderlich ist.A row by row, ie in particular row-wise or column-by-column control according to claim 14 allows an unobtrusive common control of individual mirrors, if this, for example for Grouping or for the common suppression of individual mirrors, is required.
Eine Ausgestaltung nach Anspruch 15 ermöglicht eine Korrektur einer Homogenität der Objektfeldausleuchtung, was die Intensität der Ausleuchtung über das Objektfeld angeht. Alternativ oder zusätzlich ist möglich, eine Pupillenausleuchtung über die individuelle Ansteuerung der Einzelspiegel vorzugeben, sodass eine Intensitätsverteilung der Ausleuchtung einer Pupillenebene über die Ansteuerung der Einzelspiegel vorgegeben werden kann.A Embodiment according to claim 15 enables a correction a homogeneity of the object field illumination, what the intensity the illumination of the object field. alternative or additionally it is possible to have a pupil illumination over to specify the individual control of the individual mirrors, so an intensity distribution of the illumination of a pupil plane over the control of the individual mirror can be specified.
Ein planer Träger nach Anspruch 16 vereinfacht die Herstellung des Facettenspiegels. Eine plane Anordnung des Trägers des Facettenspiegels kann durch eine entsprechende Formung von Beleuchtungs- oder Abbildungslicht vor dem Facettenspiegel erreicht werden.One Plain support according to claim 16 simplifies the production of the facet mirror. A plane arrangement of the carrier of the facet mirror can be achieved by appropriate shaping of illumination or imaging light before the facet mirror.
Die Vorteile einer Beleuchtungsoptik nach Anspruch 17 entsprechen denen, die vorstehend unter Bezugnahme auf den erfindungsgemäßen Facettenspiegel bereits ausgeführt wurden.The Advantages of a lighting optical system according to claim 17 correspond to those those with reference to the invention Facet mirrors have already been executed.
Eine Beleuchtungsoptik nach Anspruch 18 kann beispielsweise die Vorteile eines aus Einzelspiegeln aufgebauten Feldfacettenspiegels mit denen eines aus Einzelspiegeln aufgebauten Pupillenfacettenspiegels vereinen. Die Einstellung verschiedenster Beleuchtungssettings praktisch ohne Lichtverlust ist möglich. Der Pupillenfacettenspiegel kann eine größere Anzahl von Einzelspiegeln aufweisen als der vorgelagerte Feldfacettenspiegel. Mit dem vorgelagerten Feldfacettenspiegel lassen sich dann verschiedene Ausleuchtungsformen des Pupillenfacettenspiegels und damit verschiedene Beleuchtungssettings der Beleuchtungsoptik realisieren, soweit die Facetten zur Umstellung entsprechend aktorisch verlagert, insbesondere verkippt, werden können.A Illumination optics according to claim 18, for example, the advantages a built-up of individual mirrors field facet mirror with those unite a pupil facet mirror built from individual mirrors. The setting of various lighting settings practically without Light loss is possible. The pupil facet mirror may have a have larger numbers of individual mirrors than the upstream field facet mirror. With the upstream field facet mirror can then be different illumination forms of the pupil facet mirror and thus different illumination settings of the illumination optics realize, as far as the facets for conversion accordingly aktorisch be shifted, in particular tilted, can be.
Eine abschnittsweise Objektfeldbeleuchtung nach Anspruch 19 führt zu einer nochmals vergrößerten Flexibilität bei der Objektfeldausleuchtung, die zu einem weiteren Korrektur-Freiheitsgrad führt. Durch relative Verschiebung der ausgeleuchteten Objektfeldabschnitte innerhalb des Objektfeldes kann entsprechend eine Korrektur der Objektfeldausleuchtung erzielt werden.A Sectionally object field illumination according to claim 19 leads to a further increased flexibility in the object field illumination, which leads to another degree of correction leads. By relative displacement of the illuminated Object field sections within the object field can be correspondingly a correction of the object field illumination can be achieved.
Die Vorteile einer Beleuchtungsoptik mit einem Feldfacettenspiegel nach Anspruch 20 entsprechen denen, die vorstehend im Zusammenhang mit der Beleuchtungsoptik nach Anspruch 18 bereits erläutert wurden.The Advantages of a lighting optics with a field facet mirror after Claim 20 correspond to those described above in connection with the Illumination optics according to claim 18 have already been explained.
Die Vorteile einer Projektionsbelichtungsanlage nach Anspruch 21 entsprechen denen, die vorstehend bereits diskutiert wurden.The Advantages of a projection exposure system according to claim 21 correspond those already discussed above.
Eine Projektionsbelichtungsanlage nach Anspruch 22 ermöglicht eine hohe Strukturauflösung.A Projection exposure system according to claim 22 allows a high structure resolution.
Ein spekularer Reflektor nach Anspruch 23 vermindert die Anzahl der innerhalb einer Beleuchtungsoptik notwendigen Reflexionen des Beleuchtungslichts. Dies erhöht die Gesamttransmission der Beleuchtungsoptik.A specular reflector according to claim 23 reduces the number of necessary within an illumination optical reflections of the lighting tung light. This increases the overall transmission of the illumination optics.
Eine diskrete Ausleuchtung nach Anspruch 24 ermöglicht es, die Einzelspiegel des spekularen Reflektors beabstandet zueinander anzuordnen. Zwischen den Einzelspiegeln ist dann Platz beispielsweise für Aufhänge- und Verlagerungsmechaniken sowie für Verlagerungsaktoren der Einzelspiegel.A discrete illumination according to claim 24 allows the Individual mirror of the specular reflector spaced to arrange each other. Between the individual mirrors is then room for example for Suspension and displacement mechanisms as well as for Displacement factors of the individual mirrors.
Ein Facettenspiegel nach Anspruch 25 kann beispielsweise als Kollektor-Facettenspiegel ausgeführt sein. Ein derartiger Kollektor-Facettenspiegel, der insbesondere Ellipsoid-Einzelspiegel aufweisen kann, ist auch prinzipiell bei nicht mit einem spekularen Reflektor arbeitenden Beleuchtungsoptiken einsetzbar.One Facet mirror according to claim 25, for example, as a collector facet mirror be executed. Such a collector facet mirror, the In particular, ellipsoidal individual mirror may have, is also in principle when not working with a specular reflector illumination optics used.
Wenn der spekulare Reflektor nach Anspruch 26 mehr Einzelspiegel aufweist als der vorgelagerte Facettenspiegel, lassen sich mit dem vorgelagerten Facettenspiegel verschiedene Ausleuchtungsformen des spekularen Reflektors und damit verschiedene Beleuchtungssettings der Beleuchtungsoptik realisieren.If the specular reflector according to claim 26 has more individual mirrors as the upstream facet mirror, can be compared with the upstream Facet mirror different forms of illumination of the specular Reflectors and thus different illumination settings of the illumination optics realize.
Ein Kollektor nach Anspruch 27 vermindert die Anforderungen an die Bündelformung des Beleuchtungslichts durch den nachgeordneten Facettenspiegel.One Collector according to claim 27 reduces the requirements for the bundle forming of the illumination light by the downstream facet mirror.
Ein Kollektor nach Anspruch 28 ist im Vergleich zu einem Facettenspiegel in seiner Herstellung unaufwändiger.One A collector according to claim 28 is compared to a facet mirror in his production less expensive.
Ein Winkel zwischen der Scanrichtung und der langen Feldachse nach Anspruch 29 vermeidet bzw. vermindert Beleuchtungsinhomogonitäten bei einer abschnittsweisen Ausleuchtung des Objektfeldes. Dieser Winkel liegt beispielsweise bei 10°. Auch andere Winkel, beispielsweise im Bereich zwischen 1 und 3°, im Bereich von 3 und 5°, im Bereich zwischen 5 und 7° oder im Bereich zwischen 7 und 9°, sind möglich. Prinzipiell sind auch Winkel möglich, die größer sind als 10°. Alternativ ist es möglich, die Objektfeldabschnitte so anzuordnen, dass längs einer Scanrichtung keine durchgehenden Begrenzungen zwischen den Objektfeldabschnitten vorliegen.One Angle between the scanning direction and the long field axis according to claim 29 avoids or reduces illumination inhomogeneities in a section-wise illumination of the object field. This Angle is for example at 10 °. Other angles, for example in the range between 1 and 3 °, in the range from 3 and 5 °, in the range between 5 and 7 ° or in the range between 7 and 9 °, are possible. in principle angles are also possible, the larger are as 10 °. Alternatively, it is possible to use the object field sections to arrange so that along a scan direction no continuous There are boundaries between the object field sections.
Die Vorteile eines Herstellungsverfahrens nach Anspruch 30 und eines mikrostrukturierten Bauteils nach Anspruch 31 entsprechen denen, die vorstehend unter Bezugnahme auf die Ansprüche 1 bis 29 bereits erläutert wurden. Es lassen sich mikrostrukturierte Bauteile mit hohen Integrationsdichten bis hin in den Sub-Mikrometer-Bereich realisieren.The Advantages of a manufacturing method according to claim 30 and a microstructured component according to claim 31 correspond to those those with reference to claims 1 to 29 already explained. It can be microstructured Components with high integration densities down to the sub-micron range realize.
Ausführungsbeispiele der Erfindung werden nachfolgend anhand der Zeichnung näher erläutert. Es zeigen:embodiments The invention will be described below with reference to the drawing explained. Show it:
Bei
der Strahlungsquelle
Die
EUV-Strahlung
Nach
dem Feldfacettenspiegel
Der
Feldfacettenspiegel
Eine
Einzelspiegel-Spalte
Zur
Erleichterung der Beschreibung von Lagebeziehungen ist in der
Bei der Projektionsbelichtung werden der Retikelhalter und der Waferhalter synchronisiert zueinander in y-Richtung gescannt. Auch ein kleiner Winkel zwischen der Scanrichtung und der y-Richtung ist möglich, wie noch erläutert wird.at The projection exposure becomes the reticle holder and the wafer holder synchronized with each other in the y-direction scanned. Also a small angle between the scanning direction and the y-direction is possible as will be explained.
In
x-Richtung hat die Reflexionsfläche
Je
nach Ausführung des Feldfacettenspiegels
Jeder
der Einzelspiegel
Die
Aktuatoren
Jeder
der Einzelspiegel
Zusätzlich
ist mittels der Aktuatoren
Entsprechende
Formgestaltungen, wie vorstehend unter Bezugnahme auf die
Durch
die individuelle Ansteuerung der Aktuatoren
Durch
entsprechende Zusammenfassung der Ansteuerungen durch die Steuereinrichtung
Innerhalb
jeder der Einzelspiegel-Gruppen
Die
Einzelspiegel
Auch
die Einzelspiegel
Die
Jede
der Einzelspiegel-Gruppen
Innerhalb
jeder der Einzelspiegel-Gruppen
Die
Einzelspiegel-Gruppen
Eine
minimale Breite eines Rings einer solcherart einstellbaren Beleuchtungsverteilung
ist vorgegeben durch die Breite der Einzelspiegel-Gruppen
Damit
die Abbildung der Feld-Einzelfacetten in das Objektfeld
Eine
Ausleuchtung nach
Bei
der Gruppierung der Feldfacettenspiegels
Bei
der Gruppierung des Feldfacettenspiegels
Die
Einzelspiegel-Gruppen
Die
Einzelspiegel-Gruppen
Das
Aspektverhältnis der Einzelspiegel-Gruppen
Der
Pupillenfacettenspiegel
Bei
der Gruppierung der Einzelspiegel
Die
Gruppierungen nach den
Mit
der Parkettierung nach
Der
Strahlungsquelle
Im
Unterschied zum Beleuchtungssystem
Innerhalb
einer der vorstehend beschriebenen Einzelspiegel-Gruppen des Feldfacettenspiegels
Entsprechend
können auch innerhalb einer der vorstehend beschriebenen
Einzelspiegel-Gruppen des Pupillenfacettenspiegels
Entsprechend
können auch Einzelfacetten von auf den spekularen Reflektor
Der
Strahlungsquelle
Nach
der Zwischenfokusebene
Die
Strahlungsquelle
Dem
Kollektorfacettenspiegel
In
jeweils einem der Brennpunkte eines der Ellipsoid-Einzelspiegel
Ausgehend
von den Quellbildern
Die
Objektfeldabschnitte
Der
spekulare Reflektor
Das
Objektfeld
In
der
Durch
diese Mischung der Nachbarschaftsbeziehungen nach
Eine
Mischzuordnung der Ellipsoid-Einzelspiegel
Die
Anzahl der Einzelspiegel
Auch
die Einzelspiegel
In
den
Die
Aktuatoren des Kollektorfacettenspiegels
Der
Kollektorfacettenspiegel
Bei
einer weiteren Herstellungsvariante ist es möglich, den
Kollektorfacettenspiegel
Die
Strahlungsquelle
Die
Ellipsoid-Einzelspiegel
Prinzipiell
können die Mikrospiegel, die die gekrümmten Flächen
der Ellipsoid-Einzelspiegel
Derartige
Mikrospiegel können beispielsweise nach Art eines Mikrospiegel-Arrays
(MMA-Arrays) realisiert werden, bei dem die einzelnen Spiegel mittels
seitlich angebrachter Federgelenke beweglich gelagert sind und elektrostatisch
aktuiert werden können. Derartige Mikrospiegelanordnungen
sind dem Fachmann unter dem Stichwort „MEMS" (mikroelektromechanische
Systeme) beispielsweise aus der
Bei
den vorstehend beschriebenen Ausführungsbeispielen stellen
die Einzelspiegel
Eine
Scanrichtung yscan, mit der der Waferhalter
und der Retikelhalter bei der Projektionsbelichtung mit der Projektionsbelichtungsanlage
Alternativ
ist es möglich, die Objektfeldabschnitte so anzuordnen,
dass längs einer Scanrichtung keine durchgehenden Begrenzungen
zwischen den Objektfeldabschnitten vorliegen. Eine derartig Anordnung
gegeneinander versetzt sich überlagernder Objektfeldabschnitte
ergibt sich beispielsweise, wenn das Objektfeld
Eine
entsprechende Homogenisierung kann auch erreicht werden, wenn die
Objektfeldabschnitte Berandungsformen mit nicht zur Scanrichtung
parallelen Kanten aufweisen. Dies kann beispielsweise durch trapezförmige
oder rautenförmige Einzelspiegel
Die
Einzelspiegel
Die
Einzelspiegel-Ausleuchtungskanäle können im Falle
eines Pupillenfacettenspiegels mit nicht in Einzelspiegeln unterteilten
Pupillenfacetten gruppenweise von ein und derselben Pupillenfacette
zum Objektfeld
Bei
den Ausführungen, bei denen sowohl der Feldfacettenspiegel
als auch der Pupillenfacettenspiegel in Einzelspiegel
ZITATE ENTHALTEN IN DER BESCHREIBUNGQUOTES INCLUDE IN THE DESCRIPTION
Diese Liste der vom Anmelder aufgeführten Dokumente wurde automatisiert erzeugt und ist ausschließlich zur besseren Information des Lesers aufgenommen. Die Liste ist nicht Bestandteil der deutschen Patent- bzw. Gebrauchsmusteranmeldung. Das DPMA übernimmt keinerlei Haftung für etwaige Fehler oder Auslassungen.This list The documents listed by the applicant have been automated generated and is solely for better information recorded by the reader. The list is not part of the German Patent or utility model application. The DPMA takes over no liability for any errors or omissions.
Zitierte PatentliteraturCited patent literature
- - US 6438199 B1 [0002, 0074, 0129] - US 6438199 B1 [0002, 0074, 0129]
- - US 6658084 B2 [0002, 0074] - US 6658084 B2 [0002, 0074]
- - US 2006/0132747 A1 [0012, 0111] US 2006/0132747 A1 [0012, 0111]
- - US 7061582 B2 [0013] US 7061582 B2 [0013]
- - US 6859515 B2 [0056] - US 6859515 B2 [0056]
- - EP 1225481 A [0056] - EP 1225481 A [0056]
- - DE 102006036064 A1 [0060] - DE 102006036064 A1 [0060]
- - DE 102007008702 [0136] - DE 102007008702 [0136]
- - EP 1289273 A1 [0139] - EP 1289273 A1 [0139]
Zitierte Nicht-PatentliteraturCited non-patent literature
- - Istvan Reimann: „Parkette, geometrisch betrachtet", in „Mathematisches Mosaik", Köln (1977) [0013] - Istvan Reimann: "Parquet, geometrically considered", in "Mathematisches Mosaik", Cologne (1977) [0013]
- - Jan Gulberg: „Mathematics-From the birth of numbers", New York/London (1997) [0013] - Jan Gulberg: "Mathematics-From the birth of numbers", New York / London (1997) [0013]
- - Istvan Reimann: "Parkette, geometrisch betrachtet", in „Mathematisches Mosaik", Köln (1977) [0059] - Istvan Reimann: "Parquet, geometrically considered", in "Mathematisches Mosaik", Cologne (1977) [0059]
- - Jan Gulberg: „Mathematics-From the birth of numbers", New York/London (1997) [0059] - Jan Gulberg: "Mathematics-From the birth of numbers", New York / London (1997) [0059]
- - Farhad Salmassi et al., Applied Optics, Volume 45, Nr. 11, S. 2404 bis 2408 [0134] Salahad et al., Applied Optics, Vol. 45, No. 11, pp. 2404 to 2408 [0134]
Claims (31)
Priority Applications (14)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102008009600A DE102008009600A1 (en) | 2008-02-15 | 2008-02-15 | Facet mirror e.g. field facet mirror, for use as bundle-guiding optical component in illumination optics of projection exposure apparatus, has single mirror tiltable by actuators, where object field sections are smaller than object field |
KR1020147002581A KR101591610B1 (en) | 2008-02-15 | 2009-02-06 | Facet mirror for use in a projection exposure apparatus for microlithography |
CN2009801053643A CN101946190B (en) | 2008-02-15 | 2009-02-06 | Facet mirror for use in a projection exposure apparatus for microlithography |
KR1020107020158A KR101593712B1 (en) | 2008-02-15 | 2009-02-06 | Facet mirror for use in a projection exposure apparatus for microlithography |
JP2010546247A JP5487118B2 (en) | 2008-02-15 | 2009-02-06 | Faceted mirror used in projection exposure equipment for microlithography |
EP09709960.0A EP2243047B1 (en) | 2008-02-15 | 2009-02-06 | Facet mirror for use in a projection exposure apparatus for microlithography |
PCT/EP2009/000825 WO2009100856A1 (en) | 2008-02-15 | 2009-02-06 | Facet mirror for use in a projection exposure apparatus for microlithography |
CN201310194962.0A CN103293665B (en) | 2008-02-15 | 2009-02-06 | The facet mirror that the projection exposure apparatus of micro-lithography uses |
TW098104633A TWI603154B (en) | 2008-02-15 | 2009-02-13 | Facet mirror for use in a projection exposure apparatus for microlithography |
TW104102293A TWI639892B (en) | 2008-02-15 | 2009-02-13 | Facet mirror for use in a projection exposure apparatus for microlithography |
US12/848,603 US9411241B2 (en) | 2008-02-15 | 2010-08-02 | Facet mirror for use in a projection exposure apparatus for microlithography |
JP2014033165A JP2014140047A (en) | 2008-02-15 | 2014-02-24 | Facet mirror for microlithographic projection exposure apparatus |
JP2016020985A JP6121581B2 (en) | 2008-02-15 | 2016-02-05 | Faceted mirror used in projection exposure equipment for microlithography |
US15/202,104 US9996012B2 (en) | 2008-02-15 | 2016-07-05 | Facet mirror for use in a projection exposure apparatus for microlithography |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102008009600A DE102008009600A1 (en) | 2008-02-15 | 2008-02-15 | Facet mirror e.g. field facet mirror, for use as bundle-guiding optical component in illumination optics of projection exposure apparatus, has single mirror tiltable by actuators, where object field sections are smaller than object field |
Publications (1)
Publication Number | Publication Date |
---|---|
DE102008009600A1 true DE102008009600A1 (en) | 2009-08-20 |
Family
ID=40874073
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102008009600A Ceased DE102008009600A1 (en) | 2008-02-15 | 2008-02-15 | Facet mirror e.g. field facet mirror, for use as bundle-guiding optical component in illumination optics of projection exposure apparatus, has single mirror tiltable by actuators, where object field sections are smaller than object field |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE102008009600A1 (en) |
Cited By (358)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010003169A1 (en) * | 2010-03-23 | 2011-02-10 | Carl Zeiss Smt Ag | Field facet mirror for use in illumination lens in illumination system of projection exposure system, during extreme UV-projection-lithography to manufacture semiconductor chip, has reference bodies arranged in reference levels with vectors |
DE102009045135A1 (en) * | 2009-09-30 | 2011-03-31 | Carl Zeiss Smt Gmbh | Illumination optics for microlithography |
DE102009045694A1 (en) * | 2009-10-14 | 2011-04-28 | Carl Zeiss Smt Gmbh | Illumination optics for microlithography and illumination system and projection exposure apparatus with such illumination optics |
DE102009054540A1 (en) * | 2009-12-11 | 2011-06-16 | Carl Zeiss Smt Gmbh | Illumination optics for EUV microlithography |
DE102010001388A1 (en) * | 2010-01-29 | 2011-08-04 | Carl Zeiss SMT GmbH, 73447 | Facet mirror for use in microlithography |
WO2011144389A1 (en) * | 2010-05-18 | 2011-11-24 | Carl Zeiss Smt Gmbh | Illumination optics for a metrology system for examining an object using euv illumination light and metrology system comprising an illumination optics of this type |
DE102010029765A1 (en) * | 2010-06-08 | 2011-12-08 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
DE102010030089A1 (en) * | 2010-06-15 | 2011-12-15 | Carl Zeiss Smt Gmbh | Illumination optics for micro lithography and projection exposure apparatus with such an illumination optics |
DE102010025222A1 (en) | 2010-06-23 | 2011-12-29 | Carl Zeiss Smt Gmbh | Controllable mirror assembly for use as non-contact activatable passive component in optical system for projection exposure apparatus for microlithography, has light source that delivers light beam alignable on actuator element |
DE102010040811A1 (en) | 2010-09-15 | 2012-03-15 | Carl Zeiss Smt Gmbh | Imaging optics |
DE102010041623A1 (en) | 2010-09-29 | 2012-03-29 | Carl Zeiss Smt Gmbh | mirror |
DE102011006003A1 (en) | 2011-03-24 | 2012-05-16 | Carl Zeiss Smt Gmbh | Illumination optics for use in extreme UV-projection exposure system to illuminate illuminating field in reticle plane for manufacturing microstructured component, has aperture diaphragm adapting main beam direction relative to field |
DE102011004326A1 (en) * | 2011-02-17 | 2012-08-23 | Carl Zeiss Smt Gmbh | Optical assembly for projection exposure system used in manufacture of micro structured component, has controllably driven components to control reflected partial beams so that beam intensity distribution variations of light is varied |
DE102011081914A1 (en) | 2011-08-31 | 2012-09-06 | Carl Zeiss Smt Gmbh | Illumination optics for use in optical system of projection exposure system for illuminating e.g. lithography mask, for manufacturing memory chips, has facet mirror whose facets uncouple partial beam incident on energy sensor |
DE102011082065A1 (en) | 2011-09-02 | 2012-09-27 | Carl Zeiss Smt Gmbh | Field facet-mirror array for microlithography manufacturing of microchip, has total reflecting surface with two regions displaced against each other and forming diffraction structure for diffraction of radiation in preset wavelength range |
WO2012126803A1 (en) | 2011-03-21 | 2012-09-27 | Carl Zeiss Smt Gmbh | Array of controllable mirrors |
DE102011077223A1 (en) | 2011-06-08 | 2012-12-13 | Carl Zeiss Smt Gmbh | measuring system |
DE102012200733A1 (en) | 2012-01-19 | 2013-01-24 | Carl Zeiss Smt Gmbh | Mirror assembly for optical system e.g. microlithographic projection exposure apparatus, has radiator whose sections are designed in such way that relative contribution of sections compensate to temperature-induced deformation |
EP2551715A1 (en) | 2011-07-27 | 2013-01-30 | Selex Sistemi Integrati S.p.A. | Height-adjustable phase plate for generating optical vortices |
DE102012200658A1 (en) | 2012-01-18 | 2013-02-07 | Carl Zeiss Smt Gmbh | Mirror assembly e.g. pupil facet mirror, for optical system of micro-lithographic projection exposure system, has carrier for individual mirrors, and vibration excitation unit designed such that mirrors displace vibration oscillation |
DE102012200732A1 (en) | 2012-01-19 | 2013-02-28 | Carl Zeiss Smt Gmbh | Mirror assembly for optical system of microlithography projection exposure apparatus used for manufacture of LCD, has fixing elements and solid-portion joints that are arranged on opposite sides of carrier |
DE102012210073A1 (en) | 2012-06-15 | 2013-04-25 | Carl Zeiss Smt Gmbh | Illumination optics for projection exposure system for extreme UV projection lithography for manufacturing micro or nano-structured component, has partial optics designed such that light strikes on facet mirror with convergent optical path |
DE102012207511A1 (en) | 2012-05-07 | 2013-05-08 | Carl Zeiss Smt Gmbh | Facet mirror e.g. field facet mirror, for channel-wise reflection of light radiation in UV micro-lithographic projection exposure system, has displaceable micro mirrors whose facet reflecting surfaces exhibit specific area |
DE102012213937A1 (en) | 2012-08-07 | 2013-05-08 | Carl Zeiss Smt Gmbh | Mirror exchange array of set structure for illumination optics used in e.g. scanner for performing microlithography, has single mirrors of mirror exchange array unit that are set with high reflecting coating portion |
DE102012207572A1 (en) | 2012-05-08 | 2013-05-08 | Carl Zeiss Smt Gmbh | Illumination optics of optical system used in scanner for performing microlithography, has lighting channels whose total intensity in region of optical field is adapted by tilting specific number of individual mirrors to preset value |
DE102011086345A1 (en) | 2011-11-15 | 2013-05-16 | Carl Zeiss Smt Gmbh | mirror |
DE102012200736A1 (en) | 2012-01-19 | 2013-07-25 | Carl Zeiss Smt Gmbh | Mirror arrangement, in particular for use in a microlithographic projection exposure apparatus |
DE102012201235A1 (en) * | 2012-01-30 | 2013-08-01 | Carl Zeiss Smt Gmbh | Method for setting a lighting geometry for a lighting optics for EUV projection lithography |
DE102012204273A1 (en) * | 2012-03-19 | 2013-09-19 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
DE102012224022A1 (en) | 2012-12-20 | 2013-10-31 | Carl Zeiss Smt Gmbh | Arrangement for actuation of optical element in optical system, has actuator for exerting force on optical element, where actuator is arranged within vacuum-tight housing, and optical element is arranged outside the housing |
DE102012208064A1 (en) * | 2012-05-15 | 2013-11-21 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
DE102012010093A1 (en) | 2012-05-23 | 2013-11-28 | Carl Zeiss Smt Gmbh | facet mirror |
WO2013174680A2 (en) | 2012-05-22 | 2013-11-28 | Carl Zeiss Smt Gmbh | Adjustment device and mask inspection device with such an adjustment device |
DE102012209412A1 (en) * | 2012-06-04 | 2013-12-05 | Carl Zeiss Smt Gmbh | Optical method for measuring angular position of facet of facet mirror for extreme UV (EUV) lithography, involves detecting actual angular positions of facets in preset spectrum of angular positions with respect to reference axis |
WO2014012929A1 (en) | 2012-07-17 | 2014-01-23 | Carl Zeiss Smt Gmbh | Illumination optical unit |
DE102012216502A1 (en) | 2012-09-17 | 2014-03-20 | Carl Zeiss Smt Gmbh | mirror |
DE102013211269A1 (en) | 2013-06-17 | 2014-04-30 | Carl Zeiss Smt Gmbh | Illumination optics for illuminating structured object such as lithographic mask or wafer, mounted in metrology system, has an energy sensor designed for monitoring the lighting total light dose which hits on the facet mirrors |
US8717541B2 (en) | 2008-09-30 | 2014-05-06 | Carl Zeiss Smt Gmbh | Field facet mirror for an illumination optics of a projection exposure apparatus for EUV microlithography |
WO2014082830A1 (en) | 2012-11-29 | 2014-06-05 | Carl Zeiss Smt Gmbh | Arrangement for actuating at least one optical element in an optical system |
WO2014139787A1 (en) | 2013-03-13 | 2014-09-18 | Carl Zeiss Smt Gmbh | Arrangement for the actuation of at least one element in an optical system |
DE102014208984A1 (en) | 2014-05-13 | 2014-10-02 | Carl Zeiss Smt Gmbh | module |
DE102013218130A1 (en) | 2013-09-11 | 2015-03-12 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
WO2015036226A1 (en) * | 2013-09-11 | 2015-03-19 | Carl Zeiss Smt Gmbh | Illumination optics and illumination system for euv projection lithography |
DE102013224435A1 (en) | 2013-11-28 | 2015-05-28 | Carl Zeiss Smt Gmbh | Measuring arrangement for measuring optical properties of a reflective optical element, in particular for microlithography |
WO2015114043A1 (en) | 2014-01-30 | 2015-08-06 | Carl Zeiss Smt Gmbh | Method for producing a mirror element |
WO2015124471A1 (en) | 2014-02-21 | 2015-08-27 | Carl Zeiss Smt Gmbh | Subassembly of an optical system, in particular in a microlithographic projection exposure apparatus |
DE102014203187A1 (en) * | 2014-02-21 | 2015-08-27 | Carl Zeiss Smt Gmbh | Illumination optics for projection lithography |
DE102014219648A1 (en) | 2014-09-29 | 2015-10-15 | Carl Zeiss Smt Gmbh | Method for producing a mirror element |
DE102014216802A1 (en) * | 2014-08-25 | 2016-02-25 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
DE102014217610A1 (en) * | 2014-09-03 | 2016-03-03 | Carl Zeiss Smt Gmbh | Illumination optics for projection lithography |
DE102014217612A1 (en) * | 2014-09-03 | 2016-03-03 | Carl Zeiss Smt Gmbh | Illumination optics for the projection lithograph |
WO2016034424A1 (en) * | 2014-09-03 | 2016-03-10 | Carl Zeiss Smt Gmbh | Illumination optical unit for projection lithography |
DE102014215452A1 (en) | 2014-08-05 | 2016-04-07 | Carl Zeiss Smt Gmbh | Tilting an optical element |
DE102015201870A1 (en) | 2015-02-03 | 2016-08-04 | Carl Zeiss Smt Gmbh | Arrangement for position manipulation of an element, in particular in an optical system |
DE102015202800A1 (en) | 2015-02-17 | 2016-08-18 | Carl Zeiss Smt Gmbh | Assembly of an optical system, in particular a microlithographic projection exposure apparatus |
DE102016205695A1 (en) | 2015-04-09 | 2016-10-13 | Carl Zeiss Smt Gmbh | Mask for projection lithography |
DE102015223621A1 (en) | 2015-11-30 | 2016-10-27 | Carl Zeiss Smt Gmbh | Damping arrangement in a system, in particular in a microlithographic projection exposure apparatus |
DE102015208514A1 (en) * | 2015-05-07 | 2016-11-10 | Carl Zeiss Smt Gmbh | Facet mirror for EUV projection lithography and illumination optics with such a facet mirror |
WO2016188810A1 (en) * | 2015-05-22 | 2016-12-01 | Carl Zeiss Smt Gmbh | Pupil facet mirror |
DE102016223657A1 (en) | 2016-11-29 | 2017-01-12 | Carl Zeiss Smt Gmbh | Assembly of an optical system, in particular in a microlithographic projection exposure apparatus |
DE102015225510A1 (en) | 2015-12-16 | 2017-01-12 | Carl Zeiss Smt Gmbh | Mirror element, in particular for a microlithographic projection exposure apparatus |
DE102015216443A1 (en) | 2015-08-27 | 2017-03-02 | Carl Zeiss Smt Gmbh | Arrangement of a device for protecting a to be arranged in an object plane reticle against contamination |
DE102016212262A1 (en) | 2016-07-05 | 2017-06-22 | Carl Zeiss Smt Gmbh | Arrangement for regulating the position of a mirror arrangement |
DE102016220669A1 (en) | 2016-10-21 | 2017-08-31 | Carl Zeiss Smt Gmbh | Mirror arrangement, in particular for a microlithographic projection exposure apparatus |
DE102017210218A1 (en) | 2017-06-20 | 2017-10-05 | Carl Zeiss Smt Gmbh | Mirror arrangement, in particular for a microlithographic projection exposure apparatus |
DE102014207894B4 (en) | 2014-04-28 | 2018-03-29 | Carl Zeiss Ag | Illumination optics, measuring system for characterizing at least one component of an exposure system and method for characterizing at least one component of an exposure system |
DE102018202931A1 (en) | 2018-02-27 | 2018-04-19 | Carl Zeiss Smt Gmbh | Device and method for assembling or disassembling an assembly, in particular for a microlithographic projection exposure apparatus |
DE102017210206A1 (en) | 2017-06-19 | 2018-04-26 | Carl Zeiss Smt Gmbh | Assembly, in particular in a microlithographic projection exposure apparatus |
DE102018207107A1 (en) | 2018-05-08 | 2018-06-28 | Carl Zeiss Smt Gmbh | mirror |
DE102017211864A1 (en) | 2017-07-11 | 2018-07-19 | Carl Zeiss Smt Gmbh | Assembly, in particular in a microlithographic projection exposure apparatus |
DE102017220586A1 (en) | 2017-11-17 | 2019-05-23 | Carl Zeiss Smt Gmbh | Pupil facet mirror, illumination optics and optical system for a projection exposure apparatus |
DE102018201170A1 (en) | 2018-01-25 | 2019-07-25 | Carl Zeiss Smt Gmbh | Imaging optics for EUV microlithography |
DE102018216934A1 (en) | 2018-10-02 | 2019-09-05 | Carl Zeiss Smt Gmbh | Assembly, in particular in a microlithographic projection exposure apparatus |
WO2020057873A1 (en) | 2018-09-21 | 2020-03-26 | Carl Zeiss Smt Gmbh | Assembly of an optical system, more particularly in a projection microlithography system, and method for operating such an optical system |
DE102020213837A1 (en) | 2020-11-04 | 2021-08-19 | Carl Zeiss Smt Gmbh | Facet mirror device |
DE102020213416A1 (en) | 2020-10-23 | 2021-10-07 | Carl Zeiss Smt Gmbh | Projection exposure system with a heating device and a polarizer |
DE102020204669A1 (en) | 2020-04-14 | 2021-10-14 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
DE102021101523B3 (en) | 2021-01-25 | 2021-10-14 | Carl Zeiss IQS Deutschland GmbH | Device for producing an adhesive connection between components of a lithography system, method for producing an adhesive connection between components of a lithography system and lithography system |
DE102020212569A1 (en) | 2020-10-06 | 2021-12-09 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102021200114A1 (en) | 2021-01-08 | 2021-12-30 | Carl Zeiss Smt Gmbh | Mirror projection optics, method for checking an optical element, optical element and lithography system |
DE102021201257A1 (en) | 2021-02-10 | 2021-12-30 | Carl Zeiss Smt Gmbh | Method and device for determining a spectrum of radiation, computer program product and lithography system |
DE102021202849A1 (en) | 2021-03-24 | 2022-01-05 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102020212229B3 (en) | 2020-09-29 | 2022-01-20 | Carl Zeiss Smt Gmbh | Aperture device for delimiting a beam path between a light source and an illumination optics of a projection exposure system for projection lithography |
DE102020209141A1 (en) | 2020-07-21 | 2022-01-27 | Carl Zeiss Smt Gmbh | Method for operating an optical system for microlithography, and optical system |
WO2022043226A1 (en) | 2020-08-27 | 2022-03-03 | Carl Zeiss Smt Gmbh | Pupil facet mirror for an illumination optical unit of a projection exposure apparatus |
DE102020211096A1 (en) | 2020-09-02 | 2022-03-03 | Carl Zeiss Smt Gmbh | Field facet for a field facet mirror of a projection exposure system |
DE102021205104A1 (en) | 2021-05-19 | 2022-03-03 | Carl Zeiss Smt Gmbh | Projection exposure system with a deformable element and method for producing an element |
DE102021202770A1 (en) | 2021-03-22 | 2022-03-03 | Carl Zeiss Smt Gmbh | Process for generating a plasma and projection exposure system for semiconductor lithography |
DE102020211359A1 (en) | 2020-09-10 | 2022-03-10 | Carl Zeiss Smt Gmbh | Assembly of an optical system for microlithography |
DE102021202802B3 (en) | 2021-03-23 | 2022-03-24 | Carl Zeiss Smt Gmbh | Projection exposure system with a device for determining the concentration of atomic hydrogen |
DE102020212367A1 (en) | 2020-09-30 | 2022-03-31 | Carl Zeiss Smt Gmbh | Optical component |
DE102020212351A1 (en) | 2020-09-30 | 2022-03-31 | Carl Zeiss Smt Gmbh | Micromirror array for an illumination-optical component of a projection exposure system |
DE102020212927A1 (en) | 2020-10-14 | 2022-04-14 | Carl Zeiss Smt Gmbh | SUPPORT OF AN OPTICAL ELEMENT |
DE102021203723A1 (en) | 2021-04-15 | 2022-04-21 | Carl Zeiss Smt Gmbh | CONNECTION ARRANGEMENT, PROJECTION EXPOSURE EQUIPMENT AND METHOD |
DE102021209098A1 (en) | 2021-08-19 | 2022-05-25 | Carl Zeiss Smt Gmbh | PROTECTIVE HOSE AND PROJECTION EXPOSURE SYSTEM |
DE102021206953A1 (en) | 2021-07-02 | 2022-06-02 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD OF OPERATING AN OPTICAL SYSTEM |
DE102020215906A1 (en) | 2020-12-15 | 2022-06-15 | Carl Zeiss Smt Gmbh | Attenuation device, optical assembly and projection exposure system |
DE102022200400A1 (en) | 2022-01-14 | 2022-06-30 | Carl Zeiss Smt Gmbh | CONNECTION OF COMPONENTS OF AN OPTICAL DEVICE |
DE102021213864A1 (en) | 2021-12-07 | 2022-07-07 | Carl Zeiss Smt Gmbh | Method and device for protecting an adhesive joint |
DE102021205149B3 (en) | 2021-05-20 | 2022-07-07 | Carl Zeiss Smt Gmbh | Method and device for qualifying a faceted mirror |
DE102021210104A1 (en) | 2021-09-14 | 2022-07-07 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
DE102021204582B3 (en) | 2021-05-06 | 2022-07-07 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102021212993A1 (en) | 2021-01-08 | 2022-07-14 | Carl Zeiss Smt Gmbh | Method for measuring an absorption of an electromagnetic radiation by an optical element, device for measuring a transformation property of an optical element and lithography system |
WO2022148698A1 (en) | 2021-01-08 | 2022-07-14 | Carl Zeiss Smt Gmbh | Optical device and method for controlling an optical device |
DE102021200131A1 (en) | 2021-01-11 | 2022-07-14 | Carl Zeiss Smt Gmbh | Assembly with a decoupling joint for the mechanical mounting of an element |
DE102022203999A1 (en) | 2022-04-26 | 2022-07-21 | Carl Zeiss Smt Gmbh | Method for calibrating a diffractive measurement structure, device for calibrating a diffractive measurement structure and lithography system |
DE102021213096A1 (en) | 2021-01-28 | 2022-07-28 | Carl Zeiss Smt Gmbh | METHOD OF MAKING A MECHANICAL SYSTEM FOR A LITHOGRAPHY PLANT |
DE102021201001A1 (en) | 2021-02-03 | 2022-08-04 | Carl Zeiss Smt Gmbh | Method for manufacturing an optical element, apparatus for manufacturing an optical element, optical element and lithography system |
DE102021201203A1 (en) | 2021-02-09 | 2022-08-11 | Carl Zeiss Smt Gmbh | SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102021208801B3 (en) | 2021-08-11 | 2022-08-11 | Carl Zeiss Smt Gmbh | Projection exposure system and method for laying out an adhesive layer |
DE102021205809B3 (en) | 2021-06-09 | 2022-08-18 | Carl Zeiss Smt Gmbh | Method for screwing an actuator-sensor module of a projection exposure system |
DE102021201396A1 (en) | 2021-02-15 | 2022-08-18 | Carl Zeiss Smt Gmbh | Process for producing a multi-part mirror of a projection exposure system for microlithography |
DE102021213458A1 (en) | 2021-11-30 | 2022-08-18 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102021201689A1 (en) | 2021-02-23 | 2022-08-25 | Carl Zeiss Smt Gmbh | Optical assembly, method for deforming an optical element and projection exposure system |
DE102021208563A1 (en) | 2021-08-06 | 2022-09-01 | Carl Zeiss Smt Gmbh | DEVICE AND METHOD FOR DETERMINING A TEMPERATURE IN A LITHOGRAPHY PLANT |
DE102021213441A1 (en) | 2021-11-29 | 2022-09-15 | Carl Zeiss Smt Gmbh | METHOD OF MAKING AN OPTICAL SYSTEM |
DE102021212823A1 (en) | 2021-03-15 | 2022-09-15 | Carl Zeiss Smt Gmbh | SUPPORTING A COMPONENT OF AN OPTICAL IMAGE DEVICE |
DE102021202502A1 (en) | 2021-03-15 | 2022-09-15 | Carl Zeiss Smt Gmbh | Device for changing a shape of a surface of an object |
DE102022206198A1 (en) | 2022-06-21 | 2022-09-15 | Carl Zeiss Smt Gmbh | Method and device for qualifying a component of a projection exposure system for semiconductor lithography |
DE102022203745A1 (en) | 2022-04-13 | 2022-09-15 | Carl Zeiss Smt Gmbh | EUV collector for an EUV projection exposure system |
DE102022207348A1 (en) | 2022-07-19 | 2022-09-15 | Carl Zeiss Smt Gmbh | PROCEDURE AND ADJUSTMENT KIT |
DE102021202769A1 (en) | 2021-03-22 | 2022-09-22 | Carl Zeiss Smt Gmbh | Optical assembly and method for its manufacture, method for deforming an optical element and projection exposure system |
WO2022200209A1 (en) | 2021-03-25 | 2022-09-29 | Carl Zeiss Smt Gmbh | Measurement device for interferometric measurement of a surface shape |
WO2022200210A1 (en) | 2021-03-25 | 2022-09-29 | Carl Zeiss Smt Gmbh | Measuring device for interferometrically measuring a surface form |
DE102022207689A1 (en) | 2022-07-27 | 2022-09-29 | Carl Zeiss Smt Gmbh | Method, device and computer program product for identifying contamination in components of an EUV lithography system |
DE102021203475A1 (en) | 2021-04-08 | 2022-10-13 | Carl Zeiss Smt Gmbh | Process for producing a mirror of a projection exposure system for microlithography |
WO2022218750A1 (en) | 2021-04-15 | 2022-10-20 | Carl Zeiss Smt Gmbh | Actuator-sensor device and lithography apparatus |
DE102022108541A1 (en) | 2021-04-23 | 2022-10-27 | Carl Zeiss Jena Gmbh | Process for the production of a test element and test element |
DE102022200726A1 (en) | 2021-04-23 | 2022-10-27 | Carl Zeiss Smt Gmbh | Method for determining a reflection property of an optical element to be examined, device for determining a reflection property of an optical element to be examined, computer program product and lithography system |
DE102021204265A1 (en) | 2021-04-29 | 2022-11-03 | Carl Zeiss Smt Gmbh | Method for cleaning a surface of an element and cleaning device |
DE102022209852A1 (en) | 2022-09-19 | 2022-11-10 | Carl Zeiss Smt Gmbh | THERMAL ACTUATOR ARRANGEMENT |
DE102022201007A1 (en) | 2022-01-31 | 2022-11-17 | Carl Zeiss Smt Gmbh | Device for connecting at least a first and a second module component, module of a lithography system, optical element and lithography system |
DE102022209854A1 (en) | 2022-09-20 | 2022-11-17 | Carl Zeiss Smt Gmbh | CONNECTION ARRANGEMENT |
DE102021210708A1 (en) | 2021-09-24 | 2022-11-24 | Carl Zeiss Smt Gmbh | DOSING DEVICE AND METHOD FOR MANUFACTURING A LITHOGRAPHY PLANT |
DE102021205278A1 (en) | 2021-05-21 | 2022-11-24 | Carl Zeiss Smt Gmbh | Adjustable spacer, optical system, projection exposure apparatus and method |
DE102022210229A1 (en) | 2022-09-27 | 2022-11-24 | Carl Zeiss Smt Gmbh | Magnet system and method for low-friction mounting and/or influencing the position of an optical element |
DE102022210356A1 (en) | 2022-09-29 | 2022-11-24 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY PLANT WITH AN OPTICAL SYSTEM AND METHOD FOR MANUFACTURING AN OPTICAL SYSTEM |
DE102022200205B3 (en) | 2022-01-11 | 2022-11-24 | Carl Zeiss Smt Gmbh | EUV projection exposure system and method for removing foreign bodies |
DE102021205426A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Optical device, method for setting a target deformation and lithography system |
DE102021205425A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Optical device, method for setting a target deformation and lithography system |
WO2022248433A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Projection exposure apparatus and method for designing a component of a projection exposure apparatus |
DE102022210132A1 (en) | 2022-09-26 | 2022-12-01 | Carl Zeiss Smt Gmbh | Component for a projection exposure system for semiconductor lithography and method for producing the component |
DE102022210289A1 (en) | 2022-09-28 | 2022-12-01 | Carl Zeiss Smt Gmbh | Device and method for positioning an optical element, measuring device for measuring an optical surface and lithography system |
DE102022200264A1 (en) | 2022-01-12 | 2022-12-15 | Carl Zeiss Smt Gmbh | Device for tilting a mirror, optical component, optical assembly, method for tilting a mirror, method for producing a device for tilting a mirror and EUV projection exposure system |
DE102021214665A1 (en) | 2021-12-20 | 2022-12-15 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography with a temperature control structure |
DE102022203929A1 (en) | 2021-06-16 | 2022-12-22 | Carl Zeiss Smt Gmbh | Device for positioning a first component of an optical system, component of an optical system, optical device and lithography system |
DE102021206427A1 (en) | 2021-06-22 | 2022-12-22 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102022211799A1 (en) | 2022-11-08 | 2022-12-29 | Carl Zeiss Smt Gmbh | MANIPULATOR, OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
DE102022115356A1 (en) | 2021-06-24 | 2022-12-29 | Carl Zeiss Smt Gmbh | Device for temperature control of a component |
DE102022204833A1 (en) | 2021-07-02 | 2023-01-05 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND METHOD OF MANUFACTURING AN OPTICAL SYSTEM |
DE102022203150A1 (en) | 2022-03-31 | 2023-01-05 | Carl Zeiss Smt Gmbh | Optical device, method for detecting a temperature distribution and lithography system |
DE102022201304A1 (en) | 2022-02-08 | 2023-01-05 | Carl Zeiss Smt Gmbh | Method for determining the end of a warm-up phase of an optical element |
DE102022200976A1 (en) | 2022-01-31 | 2023-01-05 | Carl Zeiss Smt Gmbh | Calibration bodies and methods for calibration |
DE102022212136A1 (en) | 2022-11-15 | 2023-01-12 | Carl Zeiss Smt Gmbh | Process for determining image errors in high-resolution imaging systems using wavefront measurement |
DE102021207522A1 (en) | 2021-07-15 | 2023-01-19 | Carl Zeiss Smt Gmbh | Device and method for coating a component for a projection exposure system and component of a projection exposure system |
DE102021210470B3 (en) | 2021-09-21 | 2023-01-19 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102022200277A1 (en) | 2022-01-13 | 2023-01-26 | Carl Zeiss Smt Gmbh | Method, device, preparation method and preparation device for producing a base body, base body, optical element and lithography system |
DE102022202355A1 (en) | 2022-03-09 | 2023-02-02 | Carl Zeiss Smt Gmbh | Micromirror assembly, manufacturing method for manufacturing a micromirror assembly and method for tilting a mirror surface |
WO2023012330A1 (en) | 2021-08-06 | 2023-02-09 | Carl Zeiss Smt Gmbh | Temperature measuring device, lithography apparatus and method for measuring a temperature |
DE102022213752A1 (en) | 2022-12-16 | 2023-02-09 | Carl Zeiss Smt Gmbh | Interferometer device for measuring a surface, method for interferometric measuring of a surface and lithography system |
DE102021208628A1 (en) | 2021-08-09 | 2023-02-09 | Carl Zeiss Smt Gmbh | SUPPORT OF AN OPTICAL ELEMENT |
WO2023016870A1 (en) | 2021-08-13 | 2023-02-16 | Carl Zeiss Smt Gmbh | Optical element, projection optical unit and projection exposure apparatus |
DE102021208843A1 (en) | 2021-08-12 | 2023-02-16 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography with a connecting element |
DE102021120747A1 (en) | 2021-08-10 | 2023-02-16 | Carl Zeiss Sms Ltd. | Method of removing a particle from a mask system |
DE102021208664A1 (en) | 2021-08-10 | 2023-02-16 | Carl Zeiss Smt Gmbh | Mirror for a microlithographic projection exposure system |
DE102022202116A1 (en) | 2022-03-02 | 2023-02-23 | Carl Zeiss Smt Gmbh | SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
WO2023020741A1 (en) | 2021-08-19 | 2023-02-23 | Carl Zeiss Smt Gmbh | Optical system and projection exposure apparatus |
DE102022206065B3 (en) | 2022-06-15 | 2023-02-23 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
DE102022121000A1 (en) | 2021-08-23 | 2023-02-23 | Carl Zeiss Smt Gmbh | Mirror arrangement for an EUV projection exposure system with a protective device for protecting the optical active surface and EUV projection exposure system |
DE102022213810A1 (en) | 2022-12-16 | 2023-02-23 | Carl Zeiss Smt Gmbh | Method for monitoring a lens of a lithography system, optical device for a lithography system and lithography system |
DE102022202241A1 (en) | 2022-03-04 | 2023-03-02 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102022202424A1 (en) | 2022-03-10 | 2023-03-02 | Carl Zeiss Smt Gmbh | Process and test system for the analysis of sealing systems |
DE102022203254B3 (en) | 2022-04-01 | 2023-03-02 | Carl Zeiss Smt Gmbh | WATER-CONDUCTING SYSTEM, PROJECTION EXPOSURE SYSTEM AND MEASURING DEVICE |
DE102021210103B3 (en) | 2021-09-14 | 2023-03-02 | Carl Zeiss Smt Gmbh | PROCESS, OPTICAL SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102022206126A1 (en) | 2022-06-20 | 2023-03-09 | Carl Zeiss Smt Gmbh | Component for use in a projection exposure system |
DE102023200146A1 (en) | 2023-01-11 | 2023-03-09 | Carl Zeiss Smt Gmbh | METHOD AND ADJUSTMENT SYSTEM FOR ADJUSTING A POSITION OF A FACETED MIRROR OF A LITHOGRAPHY PLANT |
DE102022204387A1 (en) | 2021-08-24 | 2023-03-16 | Carl Zeiss Smt Gmbh | Method and device for cleaning a surface to be cleaned, element for the lithography and/or semiconductor industry and lithography system |
DE102021210577A1 (en) | 2021-09-23 | 2023-03-23 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
DE102022203881A1 (en) | 2022-04-20 | 2023-04-13 | Carl Zeiss Smt Gmbh | CIRCUIT BOARD FOR AN OPTICAL SYSTEM, OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND METHOD FOR MANUFACTURING A CIRCUIT BOARD FOR AN OPTICAL SYSTEM |
DE102022205758A1 (en) | 2021-10-07 | 2023-04-13 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROCESS |
DE102021211619A1 (en) | 2021-10-14 | 2023-04-20 | Carl Zeiss Smt Gmbh | EUV multiple mirror array |
DE102023201860A1 (en) | 2023-03-01 | 2023-04-20 | Carl Zeiss Smt Gmbh | Assembly and method of connecting two components |
DE102021211626A1 (en) | 2021-10-14 | 2023-04-20 | Carl Zeiss Smt Gmbh | EUV multiple mirror array |
DE102022204580A1 (en) | 2022-05-11 | 2023-04-20 | Carl Zeiss Smt Gmbh | METHOD OF MAKING OR OPERATION OF A MIRROR IN A LITHOGRAPHY PLANT |
DE102022207545A1 (en) | 2022-07-25 | 2023-04-27 | Carl Zeiss Smt Gmbh | Optical component |
DE102022205227A1 (en) | 2022-05-25 | 2023-04-27 | Carl Zeiss Smt Gmbh | Optical device, method for determining an actual deformation, method for setting a target deformation and lithography system |
DE102021212394A1 (en) | 2021-11-03 | 2023-05-04 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND PROCESS |
DE102021212553A1 (en) | 2021-11-08 | 2023-05-11 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND PROCESS |
DE102022210796A1 (en) | 2021-11-11 | 2023-05-11 | Carl Zeiss Smt Gmbh | Method for initializing a component of a projection exposure system for semiconductor lithography |
EP4184251A1 (en) | 2021-11-23 | 2023-05-24 | Carl Zeiss SMT GmbH | Method of assembling a facet mirror |
WO2023088651A1 (en) | 2021-11-18 | 2023-05-25 | Carl Zeiss Smt Gmbh | Optical system, projection exposure system and method |
DE102021213612A1 (en) | 2021-12-01 | 2023-06-01 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, TEST EQUIPMENT, LITHOGRAPHY PLANT, ARRANGEMENT AND PROCEDURE |
DE102021213610A1 (en) | 2021-12-01 | 2023-06-01 | Carl Zeiss Smt Gmbh | METHOD, OPTICAL SYSTEM, TEST EQUIPMENT AND ARRANGEMENT |
DE102022208231B3 (en) | 2022-08-08 | 2023-06-07 | Carl Zeiss Smt Gmbh | CONTROL DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY PLANT |
WO2023104658A1 (en) | 2021-12-10 | 2023-06-15 | Carl Zeiss Smt Gmbh | Projection exposure apparatus comprising a correction determination module |
WO2023117584A1 (en) | 2021-12-23 | 2023-06-29 | Carl Zeiss Smt Gmbh | Method and drying device |
DE102022209791B3 (en) | 2022-09-19 | 2023-07-06 | Carl Zeiss Smt Gmbh | EUV collector for an EUV projection exposure system |
DE102022213100A1 (en) | 2022-01-13 | 2023-07-13 | Carl Zeiss Smt Gmbh | ACTUATOR/SENSOR DEVICE, OPTICS MODULE AND LITHOGRAPHY PLANT |
DE102022208651A1 (en) | 2022-01-12 | 2023-07-13 | Carl Zeiss Smt Gmbh | Assembly of an optical system for microlithography |
DE102022213113A1 (en) | 2022-01-18 | 2023-07-20 | Carl Zeiss Smt Gmbh | Method for monitoring an adjustment setting, interferometric measuring device, hologram device and lithography system |
DE102022212378A1 (en) | 2022-01-24 | 2023-07-27 | Carl Zeiss Smt Gmbh | Device for holding and cooling an optic body, method for producing an optic body, cooling method for cooling an optic body, optical element and lithography system |
DE102023205587A1 (en) | 2023-06-15 | 2023-07-27 | Carl Zeiss Smt Gmbh | Device for semiconductor lithography, method for manufacturing a joint body for a sensor of a lithography system and lithography system |
DE102022211909A1 (en) | 2022-01-25 | 2023-07-27 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD OF OPERATING AN OPTICAL SYSTEM |
DE102023200212A1 (en) | 2022-02-01 | 2023-08-03 | Carl Zeiss Smt Gmbh | Projection exposure system and method for manipulating vibrations |
DE102023200336A1 (en) | 2022-02-08 | 2023-08-10 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography with a connecting element |
DE102022201301A1 (en) | 2022-02-08 | 2023-08-10 | Carl Zeiss Smt Gmbh | EUV projection exposure system with a heating device |
DE102022212721A1 (en) | 2022-02-16 | 2023-08-17 | Carl Zeiss Smt Gmbh | PROCEDURE |
DE102022209398A1 (en) | 2022-09-09 | 2023-08-31 | Carl Zeiss Smt Gmbh | Assembly of an optical system and method for thermally influencing an optical element |
DE102022208204A1 (en) | 2022-08-08 | 2023-08-31 | Carl Zeiss Smt Gmbh | Process for compensating for aberrations in an EUV projection exposure system |
DE102023201200A1 (en) | 2022-03-01 | 2023-09-07 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102022210024A1 (en) | 2022-09-22 | 2023-09-07 | Carl Zeiss Smt Gmbh | Method and device for qualifying a computer-generated hologram, regularization method and lithography system |
DE102023201812A1 (en) | 2022-03-09 | 2023-09-14 | Carl Zeiss Smt Gmbh | Method and device for releasing an adhesive bond |
DE102022211334A1 (en) | 2022-10-26 | 2023-09-14 | Carl Zeiss Smt Gmbh | Method for controlling an actuator and actuator |
DE102022212167A1 (en) | 2022-11-16 | 2023-09-14 | Carl Zeiss Smt Gmbh | EUV source module for an EUV projection exposure system |
DE102023201828A1 (en) | 2022-03-14 | 2023-09-14 | Carl Zeiss Smt Gmbh | Plug holder, heating device and projection exposure system |
DE102023201560A1 (en) | 2022-03-21 | 2023-09-21 | Carl Zeiss Smt Gmbh | COMPONENT AND PROJECTION EXPOSURE SYSTEM |
DE102022209922A1 (en) | 2022-09-21 | 2023-09-21 | Carl Zeiss Smt Gmbh | REFLECTOMETER DEVICE, MEASURING ARRANGEMENT, METHOD FOR PRODUCING AN OPTICAL REFERENCE ELEMENT AND METHOD FOR MEASURING A SAMPLE OF A LITHOGRAPHY SYSTEM |
DE102022116698B3 (en) | 2022-07-05 | 2023-09-21 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102022202938A1 (en) | 2022-03-24 | 2023-09-28 | Carl Zeiss Smt Gmbh | ARRANGEMENT AND PROJECTION EXPOSURE SYSTEM |
DE102022202989A1 (en) | 2022-03-25 | 2023-09-28 | Carl Zeiss Smt Gmbh | Optical device, method for measuring an actual tilt of an optical surface of an optical element and lithography system |
DE102022203369A1 (en) | 2022-04-05 | 2023-10-05 | Carl Zeiss Smt Gmbh | Arrangement, method and computer program product for calibrating facet mirrors |
DE102022203298A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Method and device for chemically processing a surface |
WO2023186960A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Control device, optical system, lithography installation and method |
WO2023187148A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Drive device, optical system and lithography apparatus |
DE102022203299A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Procedure for checking the quality of a screw connection |
DE102022203433A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | CONNECTING COMPONENTS OF AN OPTICAL DEVICE |
WO2023194220A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Device and method for aligning two components |
DE102022203393A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Device and method for aligning two components |
DE102022212377A1 (en) | 2022-11-21 | 2023-10-12 | Carl Zeiss Smt Gmbh | SEALING DEVICE, METHOD AND USE |
WO2023194146A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Actively tiltable optical element |
DE102022207546B3 (en) | 2022-07-25 | 2023-10-12 | Carl Zeiss Smt Gmbh | Facet mirror assembly, lighting optics, optical system, projection exposure system, method for producing a microstructured component and component |
WO2023198732A1 (en) | 2022-04-13 | 2023-10-19 | Carl Zeiss Smt Gmbh | Connecting components of an optical device |
WO2023208556A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | Method for measuring an illumination angle distribution on an object field and illumination optics unit having an illumination channel allocation intended therefor |
WO2023208894A1 (en) | 2022-04-29 | 2023-11-02 | Carl Zeiss Smt Gmbh | Optical component for a lithography apparatus |
DE102022212257A1 (en) | 2022-11-17 | 2023-11-02 | Carl Zeiss Smt Gmbh | Method for producing a base body and base body with a lightweight structure and projection exposure system |
DE102022204098A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | Illumination optics for projection lithography |
DE102022204044A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | SUPPORTING COMPONENTS OF AN OPTICAL DEVICE |
DE102022204643A1 (en) | 2022-05-12 | 2023-11-16 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM AND METHOD FOR PRODUCING AN OPTICAL SYSTEM |
DE102022212120A1 (en) | 2022-11-15 | 2023-11-23 | Carl Zeiss Smt Gmbh | METHOD AND FIBER INJECTION DEVICE |
DE102023203580A1 (en) | 2022-05-31 | 2023-11-30 | Carl Zeiss Smt Gmbh | Coolant line for providing a fluid for temperature control of components |
DE102022214283A1 (en) | 2022-06-07 | 2023-12-07 | Carl Zeiss Smt Gmbh | Optical system for a lithography system and lithography system |
DE102022205815A1 (en) | 2022-06-08 | 2023-12-14 | Carl Zeiss Smt Gmbh | Component for a projection exposure system for semiconductor lithography and projection exposure system |
DE102022213987A1 (en) | 2022-12-20 | 2023-12-14 | Carl Zeiss Smt Gmbh | Method for assembling an optical assembly, optical assembly and projection exposure system |
WO2023241878A1 (en) | 2022-06-15 | 2023-12-21 | Carl Zeiss Smt Gmbh | Method for compensating actuator effects of actuators |
WO2023247170A1 (en) | 2022-06-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
WO2023247238A1 (en) | 2022-06-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
DE102023200423A1 (en) | 2023-01-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | COOLING DEVICE FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR DAMPENING A PRESSURE Fluctuation of a LIQUID IN A LIQUID LINE OF A COOLING DEVICE OF A LITHOGRAPHY SYSTEM |
WO2023247496A1 (en) | 2022-06-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | Device and method for treating the surface of an optical element of a lithography system in an atomic layer deposition process or an atomic layer etching process |
DE102023204960A1 (en) | 2022-06-30 | 2024-01-04 | Carl Zeiss Smt Gmbh | Method for operating a lithography system and lithography system |
WO2024008352A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical assembly, projection exposure system for semiconductor lithography and method |
WO2024008674A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Base element for an optical element with a linking shape and method for producing a base element of an optical element and projection exposure system |
DE102022207027A1 (en) | 2022-07-11 | 2024-01-11 | Carl Zeiss Smt Gmbh | DEVICE AND METHOD FOR PROVIDING SENSOR DATA OF AN OPTICAL SYSTEM, OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM |
DE102023201137A1 (en) | 2023-02-13 | 2024-01-11 | Carl Zeiss Smt Gmbh | Arrangement and method for protecting an adhesive connection |
WO2024008732A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Method for controlling a position of an optical component of a lithography system |
DE102023206334A1 (en) | 2022-07-11 | 2024-01-11 | Carl Zeiss Smt Gmbh | CONTROL DEVICE AND OPTICAL SYSTEM |
DE102022116695A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Base body for an optical element and method for producing a base body for an optical element and projection exposure system |
WO2024008677A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical element with vibration-reducing sections of fluid lines, projection exposure system, and method for producing a base element of an optical element |
WO2024008360A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical element and projection exposure system for semiconductor lithography |
WO2024008676A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Method for producing a base element of an optical element for semiconductor lithography, base element, optical element and projection exposure system |
DE102022116694A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Method for producing a base body of an optical element, base body and projection exposure system for semiconductor lithography |
DE102022207123A1 (en) | 2022-07-12 | 2024-01-18 | Carl Zeiss Smt Gmbh | Pin for a clamping system |
DE102022207312A1 (en) | 2022-07-18 | 2024-01-18 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102022207148A1 (en) | 2022-07-13 | 2024-01-18 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102023201546B3 (en) | 2023-02-22 | 2024-01-25 | Carl Zeiss Smt Gmbh | Method for decoating an optical surface, device for decoating an optical surface and lithography system |
DE102023205175A1 (en) | 2022-07-22 | 2024-01-25 | Carl Zeiss Smt Gmbh | Method for determining an overall center of gravity of a distribution of light intensities |
DE102022207555A1 (en) | 2022-07-25 | 2024-01-25 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM AND METHOD FOR PRODUCING AN OPTICAL SYSTEM |
DE102022207687A1 (en) | 2022-07-27 | 2024-02-01 | Carl Zeiss Smt Gmbh | Method and device for inspecting a component, computer-implemented method and lithography system |
DE102022207884A1 (en) | 2022-07-29 | 2024-02-01 | Carl Zeiss Smt Gmbh | Measuring device, method for interferometric measurement, processing method, optical element and lithography system |
DE102022208206A1 (en) | 2022-08-08 | 2024-02-08 | Carl Zeiss Smt Gmbh | Method for stabilizing an adhesive connection of an optical assembly |
DE102022208010A1 (en) | 2022-08-03 | 2024-02-08 | Carl Zeiss Smt Gmbh | Device and method for applying a fluid and component |
DE102022208239A1 (en) | 2022-08-08 | 2024-02-08 | Carl Zeiss Smt Gmbh | Device and method for sensory measurement of chemical and/or physical properties of an adhesive layer and/or a medium contacting the adhesive layer, as well as method for producing a corresponding device and method for sensory measurement |
DE102022208286A1 (en) | 2022-08-09 | 2024-02-15 | Carl Zeiss Smt Gmbh | Method for producing a base body for semiconductor lithography, optical element and projection exposure system |
DE102023201840A1 (en) | 2023-03-01 | 2024-02-22 | Carl Zeiss Smt Gmbh | Assembly for semiconductor technology and projection exposure system |
DE102022208738A1 (en) | 2022-08-24 | 2024-02-29 | Carl Zeiss Smt Gmbh | Device and method for aligning two components |
DE102023203506A1 (en) | 2022-09-12 | 2024-03-14 | Carl Zeiss Smt Gmbh | Vacuum chamber for components for semiconductor lithography and method for automated cleaning of the vacuum chamber |
DE102023206503A1 (en) | 2022-09-14 | 2024-03-14 | Carl Zeiss Smt Gmbh | Imaging optics |
DE102022209453A1 (en) | 2022-09-09 | 2024-03-14 | Carl Zeiss Smt Gmbh | Fiber strand for a sector heater, sector heater and projection device |
WO2024052300A1 (en) | 2022-09-09 | 2024-03-14 | Carl Zeiss Smt Gmbh | Illumination system, radiation source apparatus, method for illuminating a reticle, and lithography system |
DE102023208854A1 (en) | 2022-09-20 | 2024-03-21 | Carl Zeiss Smt Gmbh | COOLING DEVICE FOR COOLING A POSITION-SENSITIVE COMPONENT OF A LITHOGRAPHY SYSTEM |
WO2024056600A1 (en) | 2022-09-13 | 2024-03-21 | Carl Zeiss Smt Gmbh | Method to adjust an illumination beam path within an illumination optics and illumination optics having an adjustment system |
DE102022209908A1 (en) | 2022-09-21 | 2024-03-21 | Carl Zeiss Smt Gmbh | Facet mirror, lighting optics, arrangement of a facet mirror, projection exposure system and method for producing a nanostructured component |
DE102022209868A1 (en) | 2022-09-20 | 2024-03-21 | Carl Zeiss Smt Gmbh | OPTICAL ASSEMBLY, OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023203830A1 (en) | 2023-04-25 | 2024-03-28 | Carl Zeiss Smt Gmbh | SPACING DEVICE, OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD |
WO2024061599A1 (en) | 2022-09-23 | 2024-03-28 | Carl Zeiss Smt Gmbh | Guiding of components of an optical device |
DE102022210274A1 (en) | 2022-09-28 | 2024-03-28 | Carl Zeiss Smt Gmbh | MEASURING DEVICE AND MEASURING METHOD FOR MEASURING A VOLTAGE DROPPING IN AN OPTICAL SYSTEM, OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM |
DE102022210037A1 (en) | 2022-09-23 | 2024-03-28 | Carl Zeiss Smt Gmbh | Arrangement for tempering at least a partial area of an optical element |
DE102022210171A1 (en) | 2022-09-27 | 2024-03-28 | Carl Zeiss Smt Gmbh | OPTICAL ELEMENT, OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102022210158A1 (en) | 2022-09-26 | 2024-03-28 | Carl Zeiss Smt Gmbh | Arrangement, method and computer program product for calibrating facet mirrors |
DE102022125354A1 (en) | 2022-09-30 | 2024-04-04 | Asml Netherlands B.V. | Cooling device for cooling a position-sensitive component of a lithography system |
DE102023203897A1 (en) | 2023-04-27 | 2024-04-04 | Carl Zeiss Smt Gmbh | METHOD FOR PRODUCING A COMPONENT OF A LITHOGRAPHY SYSTEM, COMPONENT AND LITHOGRAPHY SYSTEM |
DE102023203832A1 (en) | 2023-04-25 | 2024-04-04 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102022211226A1 (en) | 2022-10-24 | 2024-04-25 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography and process |
DE102023200329B3 (en) | 2023-01-17 | 2024-05-02 | Carl Zeiss Smt Gmbh | Optical assembly, method for assembling the optical assembly and projection exposure system |
DE102023208302A1 (en) | 2022-11-02 | 2024-05-02 | Carl Zeiss Smt Gmbh | SYSTEM FOR A LITHOGRAPHY SYSTEM AND LITHOGRAPHY SYSTEM |
DE102023207047A1 (en) | 2022-10-27 | 2024-05-02 | Carl Zeiss Smt Gmbh | COOLING LINE DEVICE FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR CONTROLLING A PRESSURE OF A COOLING LIQUID IN A COOLING LINE OF A LITHOGRAPHY SYSTEM |
DE102023208848A1 (en) | 2022-11-07 | 2024-05-08 | Carl Zeiss Smt Gmbh | LIGHTING SYSTEM FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR OPERATING A LIGHTING SYSTEM OF A LITHOGRAPHY SYSTEM |
DE102022211696A1 (en) | 2022-11-07 | 2024-05-08 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM |
DE102023208851A1 (en) | 2022-11-08 | 2024-05-08 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102024200329A1 (en) | 2024-01-15 | 2024-05-08 | Carl Zeiss Smt Gmbh | Device and method for filtering a cooling lubricant, processing device and lithography system |
DE102022211875A1 (en) | 2022-11-09 | 2024-05-16 | Carl Zeiss Smt Gmbh | Method for correcting local surface elevations on reflective surfaces |
DE102022212168A1 (en) | 2022-11-16 | 2024-05-16 | Carl Zeiss Smt Gmbh | EUV optics module for an EUV projection exposure system |
DE102022212277A1 (en) | 2022-11-18 | 2024-05-23 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
DE102023204394A1 (en) | 2023-05-11 | 2024-05-23 | Carl Zeiss Smt Gmbh | Method for minimizing pressure fluctuations and projection exposure system |
DE102022212279A1 (en) | 2022-11-18 | 2024-05-23 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
DE102022212463A1 (en) | 2022-11-22 | 2024-05-23 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR OPERATING AN OPTICAL SYSTEM OF A LITHOGRAPHY SYSTEM |
DE102023205426A1 (en) | 2023-06-12 | 2024-05-29 | Carl Zeiss Smt Gmbh | Module with two joining partners for a projection exposure system for semiconductor lithography, projection exposure system and process |
DE102023206565A1 (en) | 2023-07-11 | 2024-05-29 | Carl Zeiss Smt Gmbh | WATER-BEARING SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102022212537A1 (en) | 2022-11-24 | 2024-05-29 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY DEVICE WITH AN OPTICAL SYSTEM AND ARRANGEMENT WITH AN OPTICAL SYSTEM |
DE102023206344A1 (en) | 2023-07-04 | 2024-06-06 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
WO2024120941A1 (en) | 2022-12-09 | 2024-06-13 | Carl Zeiss Smt Gmbh | Mirror socket, optical system and projection exposure apparatus |
WO2024126469A1 (en) | 2022-12-15 | 2024-06-20 | Carl Zeiss Smt Gmbh | Cooling device for a lithography system |
DE102023116898A1 (en) | 2023-06-27 | 2024-06-20 | Carl Zeiss Smt Gmbh | Optical module and projection exposure system |
WO2024125829A1 (en) | 2022-12-13 | 2024-06-20 | Carl Zeiss Smt Gmbh | Method for producing a mirror of a microlithographic projection exposure apparatus |
DE102023205570A1 (en) | 2023-06-14 | 2024-06-27 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102022214184A1 (en) | 2022-12-21 | 2024-06-27 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023116899A1 (en) | 2023-06-27 | 2024-06-27 | Carl Zeiss Smt Gmbh | Optical module and projection exposure system |
DE102023116896A1 (en) | 2023-06-27 | 2024-07-04 | Carl Zeiss Smt Gmbh | Method for improving the imaging properties of an optical module, control, optical module and projection exposure system |
DE102023116893A1 (en) | 2023-06-27 | 2024-07-04 | Carl Zeiss Smt Gmbh | Device and method for compensating pendulum forces |
DE102023100393A1 (en) | 2023-01-10 | 2024-07-11 | Carl Zeiss Smt Gmbh | Mirror socket, optical system and projection exposure system |
DE102023206428A1 (en) | 2023-07-06 | 2024-07-11 | Carl Zeiss Smt Gmbh | Apparatus and method for producing an optical element and lithography system |
DE102023116894A1 (en) | 2023-06-27 | 2024-07-18 | Carl Zeiss Smt Gmbh | Method for receiving an optical element, optical module and projection exposure system |
DE102023200235A1 (en) | 2023-01-12 | 2024-07-18 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM |
WO2024149822A1 (en) | 2023-01-12 | 2024-07-18 | Carl Zeiss Smt Gmbh | Optical system, lithography apparatus, and method for producing an optical system |
DE102023200422A1 (en) | 2023-01-20 | 2024-07-25 | Carl Zeiss Smt Gmbh | Module for a projection exposure system, method and projection exposure system |
DE102023207630A1 (en) | 2023-08-09 | 2024-07-25 | Carl Zeiss Smt Gmbh | Optical assembly and projection exposure system |
DE102023204481A1 (en) | 2023-05-12 | 2024-07-25 | Carl Zeiss Smt Gmbh | Method for automated defect characterization of optical elements |
DE102023206042A1 (en) | 2023-06-27 | 2024-08-01 | Carl Zeiss Smt Gmbh | Control device |
DE102023208980A1 (en) | 2023-09-15 | 2024-08-01 | Carl Zeiss Smt Gmbh | MEMS micromirror unit and facet mirror |
DE102023200970A1 (en) | 2023-02-07 | 2024-08-08 | Carl Zeiss Smt Gmbh | OPTICAL ELEMENT WITH POLISHED COATING |
DE102023207629A1 (en) | 2023-08-09 | 2024-08-08 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023200933A1 (en) | 2023-02-06 | 2024-08-08 | Carl Zeiss Smt Gmbh | COOLING DEVICE FOR COOLING A POSITION-SENSITIVE COMPONENT OF A LITHOGRAPHY SYSTEM AND LITHOGRAPHY SYSTEM |
DE102023210779A1 (en) | 2023-02-08 | 2024-08-08 | Carl Zeiss Smt Gmbh | Storage device for storing an optical module on a support frame |
DE102023201138A1 (en) | 2023-02-13 | 2024-08-14 | Carl Zeiss Smt Gmbh | SYSTEM WITH A LITHOGRAPHY DEVICE AND A NUMBER OF ELECTRONIC MODULES AND METHOD FOR OPERATING A SYSTEM |
WO2024170221A1 (en) | 2023-02-16 | 2024-08-22 | Carl Zeiss Smt Gmbh | Mechatronic element, mirror, mirror arrangement and method for production of same |
DE102023209608A1 (en) | 2023-09-29 | 2024-09-05 | Carl Zeiss Smt Gmbh | Projection exposure system with exchangeable modules comprising optical elements |
DE102023201859A1 (en) | 2023-03-01 | 2024-09-05 | Carl Zeiss Smt Gmbh | OPTICAL ASSEMBLY, OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023201858A1 (en) | 2023-03-01 | 2024-09-05 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023202127A1 (en) | 2023-03-09 | 2024-09-12 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023128365A1 (en) | 2023-10-17 | 2024-09-12 | Asml Netherlands B.V. | Method and control device for controlling a position of a substrate holder of a lithography system, positioning system and lithography system |
WO2024188648A1 (en) | 2023-03-13 | 2024-09-19 | Carl Zeiss Smt Gmbh | Device and method for measuring a component, and lithography system |
DE102023202493A1 (en) | 2023-03-21 | 2024-09-26 | Carl Zeiss Smt Gmbh | CONTROL DEVICE, OPTICAL SYSTEM, LITHOGRAPHY DEVICE AND METHOD |
DE102023209257A1 (en) | 2023-09-22 | 2024-09-26 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102024202011A1 (en) | 2023-03-23 | 2024-09-26 | Carl Zeiss Smt Gmbh | Device and method for removing a component bonded to a surface of an optical element of a lithography system; lithography system for semiconductor lithography |
WO2024208849A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
WO2024208851A2 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
DE102023203205A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Method for producing a MEMS mirror array and MEMS mirror array |
DE102023203224A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging EUV optics for imaging an object field into an image field |
WO2024213535A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | Lithography system and method for operating a lithography system |
DE102024200575A1 (en) | 2023-04-17 | 2024-10-17 | Carl Zeiss Smt Gmbh | connector assembly |
WO2024213622A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | Mems mirror, micromirror array and illumination system for a lithography system, lithography system, and method for producing a lithography system |
DE102023210888A1 (en) | 2023-04-17 | 2024-10-17 | Carl Zeiss Smt Gmbh | Method for multiple exposure of an object using an illumination optics |
DE102023203339A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | LITHOGRAPHY SYSTEM AND METHOD FOR OPERATING A LITHOGRAPHY SYSTEM |
DE102023203520A1 (en) | 2023-04-18 | 2024-10-24 | Carl Zeiss Smt Gmbh | projection exposure system |
DE102023136592A1 (en) | 2023-12-22 | 2024-10-24 | Carl Zeiss Smt Gmbh | Optical element and projection exposure system |
DE102023203731A1 (en) | 2023-04-24 | 2024-10-24 | Carl Zeiss Smt Gmbh | Device and method for checking a component and lithography system |
DE102024200212A1 (en) | 2023-04-25 | 2024-10-31 | Carl Zeiss Smt Gmbh | shielding element, optical system and projection exposure system |
DE102023203941A1 (en) | 2023-04-27 | 2024-10-31 | Carl Zeiss Smt Gmbh | Methods for post-processing and handling of MEMS chips |
DE102023203870A1 (en) | 2023-04-26 | 2024-10-31 | Carl Zeiss Smt Gmbh | BEARING DEVICE FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR POSITIONING AN OPTICAL COMPONENT OF A LITHOGRAPHY SYSTEM |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10053587A1 (en) * | 2000-10-27 | 2002-05-02 | Zeiss Carl | Lighting system with variable adjustment of the illumination |
EP1225481A2 (en) | 2001-01-23 | 2002-07-24 | Carl Zeiss Semiconductor Manufacturing Technologies Ag | Collector for an illumination system with wavelength of 193 nm |
US6438199B1 (en) | 1998-05-05 | 2002-08-20 | Carl-Zeiss-Stiftung | Illumination system particularly for microlithography |
US20030038225A1 (en) * | 2001-06-01 | 2003-02-27 | Mulder Heine Melle | Lithographic apparatus, device manufacturing method, device manufactured thereby, control system, computer program, and computer program product |
EP1289273A1 (en) | 2001-08-28 | 2003-03-05 | Siemens Aktiengesellschaft | Scanning camera |
US6859515B2 (en) | 1998-05-05 | 2005-02-22 | Carl-Zeiss-Stiftung Trading | Illumination system, particularly for EUV lithography |
US20050270513A1 (en) * | 2002-03-18 | 2005-12-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US6977718B1 (en) * | 2004-03-02 | 2005-12-20 | Advanced Micro Devices, Inc. | Lithography method and system with adjustable reflector |
US7061582B2 (en) | 2002-09-19 | 2006-06-13 | Samsung Electronics Co., Ltd. | Exposure apparatus including micro mirror array and exposure method using the same |
US20060132747A1 (en) | 2003-04-17 | 2006-06-22 | Carl Zeiss Smt Ag | Optical element for an illumination system |
DE102006036064A1 (en) | 2006-08-02 | 2008-02-07 | Carl Zeiss Smt Ag | Illumination system for a projection exposure apparatus with wavelengths ≦ 193 nm |
-
2008
- 2008-02-15 DE DE102008009600A patent/DE102008009600A1/en not_active Ceased
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6438199B1 (en) | 1998-05-05 | 2002-08-20 | Carl-Zeiss-Stiftung | Illumination system particularly for microlithography |
US6859515B2 (en) | 1998-05-05 | 2005-02-22 | Carl-Zeiss-Stiftung Trading | Illumination system, particularly for EUV lithography |
DE10053587A1 (en) * | 2000-10-27 | 2002-05-02 | Zeiss Carl | Lighting system with variable adjustment of the illumination |
US6658084B2 (en) | 2000-10-27 | 2003-12-02 | Carl Zeiss Smt Ag | Illumination system with variable adjustment of the illumination |
EP1225481A2 (en) | 2001-01-23 | 2002-07-24 | Carl Zeiss Semiconductor Manufacturing Technologies Ag | Collector for an illumination system with wavelength of 193 nm |
US20030038225A1 (en) * | 2001-06-01 | 2003-02-27 | Mulder Heine Melle | Lithographic apparatus, device manufacturing method, device manufactured thereby, control system, computer program, and computer program product |
EP1289273A1 (en) | 2001-08-28 | 2003-03-05 | Siemens Aktiengesellschaft | Scanning camera |
US20050270513A1 (en) * | 2002-03-18 | 2005-12-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7061582B2 (en) | 2002-09-19 | 2006-06-13 | Samsung Electronics Co., Ltd. | Exposure apparatus including micro mirror array and exposure method using the same |
US20060132747A1 (en) | 2003-04-17 | 2006-06-22 | Carl Zeiss Smt Ag | Optical element for an illumination system |
US6977718B1 (en) * | 2004-03-02 | 2005-12-20 | Advanced Micro Devices, Inc. | Lithography method and system with adjustable reflector |
DE102006036064A1 (en) | 2006-08-02 | 2008-02-07 | Carl Zeiss Smt Ag | Illumination system for a projection exposure apparatus with wavelengths ≦ 193 nm |
Non-Patent Citations (4)
Title |
---|
Farhad Salmassi et al., Applied Optics, Volume 45, Nr. 11, S. 2404 bis 2408 |
Istvan Reimann: "Parkette, <?page 6?>geometrisch betrachtet", in "Mathematisches Mosaik", Köln (1977) |
Istvan Reimann: "Parkette, geometrisch betrachtet", in "Mathematisches Mosaik", Köln (1977) |
Jan Gulberg: "Mathematics-From the birth of numbers", New York/London (1997) |
Cited By (564)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9304406B2 (en) | 2008-09-30 | 2016-04-05 | Carl Zeiss Smt Gmbh | Field facet mirror for an illumination optics of a projection exposure apparatus for EUV microlithography |
US8717541B2 (en) | 2008-09-30 | 2014-05-06 | Carl Zeiss Smt Gmbh | Field facet mirror for an illumination optics of a projection exposure apparatus for EUV microlithography |
DE102009045135A1 (en) * | 2009-09-30 | 2011-03-31 | Carl Zeiss Smt Gmbh | Illumination optics for microlithography |
US9235137B2 (en) | 2009-09-30 | 2016-01-12 | Carl Zeiss Smt Gmbh | Illumination optical unit for microlithography |
DE102009045694B4 (en) * | 2009-10-14 | 2012-03-29 | Carl Zeiss Smt Gmbh | Illumination optics for microlithography and illumination system and projection exposure apparatus with such illumination optics |
DE102009045694A1 (en) * | 2009-10-14 | 2011-04-28 | Carl Zeiss Smt Gmbh | Illumination optics for microlithography and illumination system and projection exposure apparatus with such illumination optics |
US7969556B2 (en) | 2009-10-14 | 2011-06-28 | Carl Zeiss Smt Gmbh | Illumination optical system for microlithography and illumination system and projection exposure system with an illumination optical system of this type |
DE102009054540B4 (en) * | 2009-12-11 | 2011-11-10 | Carl Zeiss Smt Gmbh | Illumination optics for EUV microlithography |
DE102009054540A1 (en) * | 2009-12-11 | 2011-06-16 | Carl Zeiss Smt Gmbh | Illumination optics for EUV microlithography |
US8395754B2 (en) | 2009-12-11 | 2013-03-12 | Carl Zeiss Smt Gmbh | Illumination optical unit for EUV microlithography |
DE102010001388A1 (en) * | 2010-01-29 | 2011-08-04 | Carl Zeiss SMT GmbH, 73447 | Facet mirror for use in microlithography |
DE102010003169A1 (en) * | 2010-03-23 | 2011-02-10 | Carl Zeiss Smt Ag | Field facet mirror for use in illumination lens in illumination system of projection exposure system, during extreme UV-projection-lithography to manufacture semiconductor chip, has reference bodies arranged in reference levels with vectors |
US9110225B2 (en) | 2010-05-18 | 2015-08-18 | Carl Zeiss Smt Gmbh | Illumination optics for a metrology system for examining an object using EUV illumination light and metrology system comprising an illumination optics of this type |
WO2011144389A1 (en) * | 2010-05-18 | 2011-11-24 | Carl Zeiss Smt Gmbh | Illumination optics for a metrology system for examining an object using euv illumination light and metrology system comprising an illumination optics of this type |
DE102010029765A1 (en) * | 2010-06-08 | 2011-12-08 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
DE102010030089A1 (en) * | 2010-06-15 | 2011-12-15 | Carl Zeiss Smt Gmbh | Illumination optics for micro lithography and projection exposure apparatus with such an illumination optics |
US9933704B2 (en) | 2010-06-15 | 2018-04-03 | Carl Zeiss Smt Gmbh | Microlithography illumination optical system and microlithography projection exposure apparatus including same |
DE102010025222A1 (en) | 2010-06-23 | 2011-12-29 | Carl Zeiss Smt Gmbh | Controllable mirror assembly for use as non-contact activatable passive component in optical system for projection exposure apparatus for microlithography, has light source that delivers light beam alignable on actuator element |
WO2012034995A2 (en) | 2010-09-15 | 2012-03-22 | Carl Zeiss Smt Gmbh | Imaging optical system |
US9366968B2 (en) | 2010-09-15 | 2016-06-14 | Carl Zeiss Smt Gmbh | Anamorphically imaging projection lens system and related optical systems, projection exposure systems and methods |
US10007187B2 (en) | 2010-09-15 | 2018-06-26 | Carl Zeiss Smt Gmbh | Imaging optical system |
EP4071535A1 (en) | 2010-09-15 | 2022-10-12 | Carl Zeiss SMT GmbH | Imaging optical system |
DE102010040811A1 (en) | 2010-09-15 | 2012-03-15 | Carl Zeiss Smt Gmbh | Imaging optics |
US9568832B2 (en) | 2010-09-15 | 2017-02-14 | Carl Zeiss Smt Gmbh | Anamorphically imaging projection lens system and related optical systems, projection exposure systems and methods |
DE102010041623A1 (en) | 2010-09-29 | 2012-03-29 | Carl Zeiss Smt Gmbh | mirror |
WO2012041807A1 (en) | 2010-09-29 | 2012-04-05 | Carl Zeiss Smt Gmbh | Mirror, optical system for euv projection exposure system and method of producing a component |
US10274649B2 (en) | 2010-09-29 | 2019-04-30 | Carl Zeiss Smt Gmbh | Mirror and related EUV systems and methods |
DE102011004326A1 (en) * | 2011-02-17 | 2012-08-23 | Carl Zeiss Smt Gmbh | Optical assembly for projection exposure system used in manufacture of micro structured component, has controllably driven components to control reflected partial beams so that beam intensity distribution variations of light is varied |
DE102011005840A1 (en) | 2011-03-21 | 2012-09-27 | Carl Zeiss Smt Gmbh | A controllable multi-mirror arrangement, optical system with a controllable multi-mirror arrangement and method for operating a controllable multi-mirror arrangement |
WO2012126803A1 (en) | 2011-03-21 | 2012-09-27 | Carl Zeiss Smt Gmbh | Array of controllable mirrors |
DE102011006003A1 (en) | 2011-03-24 | 2012-05-16 | Carl Zeiss Smt Gmbh | Illumination optics for use in extreme UV-projection exposure system to illuminate illuminating field in reticle plane for manufacturing microstructured component, has aperture diaphragm adapting main beam direction relative to field |
WO2012168272A1 (en) | 2011-06-08 | 2012-12-13 | Carl Zeiss Smt Gmbh | Measuring system |
US9482968B2 (en) | 2011-06-08 | 2016-11-01 | Carl Zeiss Smt Gmbh | Measuring system |
DE102011077223A1 (en) | 2011-06-08 | 2012-12-13 | Carl Zeiss Smt Gmbh | measuring system |
EP2551715A1 (en) | 2011-07-27 | 2013-01-30 | Selex Sistemi Integrati S.p.A. | Height-adjustable phase plate for generating optical vortices |
DE102011081914A1 (en) | 2011-08-31 | 2012-09-06 | Carl Zeiss Smt Gmbh | Illumination optics for use in optical system of projection exposure system for illuminating e.g. lithography mask, for manufacturing memory chips, has facet mirror whose facets uncouple partial beam incident on energy sensor |
DE102011082065A1 (en) | 2011-09-02 | 2012-09-27 | Carl Zeiss Smt Gmbh | Field facet-mirror array for microlithography manufacturing of microchip, has total reflecting surface with two regions displaced against each other and forming diffraction structure for diffraction of radiation in preset wavelength range |
US9658533B2 (en) | 2011-11-15 | 2017-05-23 | Carl Zeiss Smt Gmbh | Arrangement of a mirror |
DE102011086345A1 (en) | 2011-11-15 | 2013-05-16 | Carl Zeiss Smt Gmbh | mirror |
WO2013072377A2 (en) | 2011-11-15 | 2013-05-23 | Carl Zeiss Smt Gmbh | Arrangement of a mirror |
DE102012200658A1 (en) | 2012-01-18 | 2013-02-07 | Carl Zeiss Smt Gmbh | Mirror assembly e.g. pupil facet mirror, for optical system of micro-lithographic projection exposure system, has carrier for individual mirrors, and vibration excitation unit designed such that mirrors displace vibration oscillation |
DE102012200733A1 (en) | 2012-01-19 | 2013-01-24 | Carl Zeiss Smt Gmbh | Mirror assembly for optical system e.g. microlithographic projection exposure apparatus, has radiator whose sections are designed in such way that relative contribution of sections compensate to temperature-induced deformation |
DE102012200736A1 (en) | 2012-01-19 | 2013-07-25 | Carl Zeiss Smt Gmbh | Mirror arrangement, in particular for use in a microlithographic projection exposure apparatus |
DE102012200732A1 (en) | 2012-01-19 | 2013-02-28 | Carl Zeiss Smt Gmbh | Mirror assembly for optical system of microlithography projection exposure apparatus used for manufacture of LCD, has fixing elements and solid-portion joints that are arranged on opposite sides of carrier |
DE102012201235B4 (en) * | 2012-01-30 | 2013-08-29 | Carl Zeiss Smt Gmbh | Method for setting a lighting geometry for a lighting optics for EUV projection lithography |
US8514372B1 (en) | 2012-01-30 | 2013-08-20 | Carl Zeiss Smt Gmbh | Method for setting an illumination geometry for an illumination optical unit for EUV projection lithography |
KR101388406B1 (en) * | 2012-01-30 | 2014-04-22 | 칼 짜이스 에스엠티 게엠베하 | Method for setting an illumination geometry for an illumination optical unit for EUV projection lithography |
DE102012201235A1 (en) * | 2012-01-30 | 2013-08-01 | Carl Zeiss Smt Gmbh | Method for setting a lighting geometry for a lighting optics for EUV projection lithography |
DE102012204273A1 (en) * | 2012-03-19 | 2013-09-19 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
DE102012204273B4 (en) * | 2012-03-19 | 2015-08-13 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
US9280061B2 (en) | 2012-03-19 | 2016-03-08 | Carl Zeiss Smt Gmbh | Illumination optical unit for EUV projection lithography |
US9612537B2 (en) | 2012-03-19 | 2017-04-04 | Carl Zeiss Smt Gmbh | Illumination optical unit for EUV projection lithography |
DE102012207511A1 (en) | 2012-05-07 | 2013-05-08 | Carl Zeiss Smt Gmbh | Facet mirror e.g. field facet mirror, for channel-wise reflection of light radiation in UV micro-lithographic projection exposure system, has displaceable micro mirrors whose facet reflecting surfaces exhibit specific area |
DE102012207572A1 (en) | 2012-05-08 | 2013-05-08 | Carl Zeiss Smt Gmbh | Illumination optics of optical system used in scanner for performing microlithography, has lighting channels whose total intensity in region of optical field is adapted by tilting specific number of individual mirrors to preset value |
DE102012208064A1 (en) * | 2012-05-15 | 2013-11-21 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
US10126658B2 (en) | 2012-05-15 | 2018-11-13 | Carl Zeiss Smt Gmbh | Illumination optical unit for EUV projection lithography |
DE102012208514A1 (en) | 2012-05-22 | 2013-11-28 | Carl Zeiss Smt Gmbh | Adjustment device and mask inspection device with such an adjustment device |
WO2013174680A2 (en) | 2012-05-22 | 2013-11-28 | Carl Zeiss Smt Gmbh | Adjustment device and mask inspection device with such an adjustment device |
WO2013174644A1 (en) | 2012-05-23 | 2013-11-28 | Carl Zeiss Smt Gmbh | Facet mirror |
US10599041B2 (en) | 2012-05-23 | 2020-03-24 | Carl Zeiss Smt Gmbh | Facet mirror |
DE102012010093A1 (en) | 2012-05-23 | 2013-11-28 | Carl Zeiss Smt Gmbh | facet mirror |
DE102012209412A1 (en) * | 2012-06-04 | 2013-12-05 | Carl Zeiss Smt Gmbh | Optical method for measuring angular position of facet of facet mirror for extreme UV (EUV) lithography, involves detecting actual angular positions of facets in preset spectrum of angular positions with respect to reference axis |
DE102012210073A1 (en) | 2012-06-15 | 2013-04-25 | Carl Zeiss Smt Gmbh | Illumination optics for projection exposure system for extreme UV projection lithography for manufacturing micro or nano-structured component, has partial optics designed such that light strikes on facet mirror with convergent optical path |
US9891530B2 (en) | 2012-07-17 | 2018-02-13 | Carl Zeiss Smt Gmbh | Illumination optical unit |
DE102012212453A1 (en) | 2012-07-17 | 2014-01-23 | Carl Zeiss Smt Gmbh | illumination optics |
WO2014012929A1 (en) | 2012-07-17 | 2014-01-23 | Carl Zeiss Smt Gmbh | Illumination optical unit |
DE102012213937A1 (en) | 2012-08-07 | 2013-05-08 | Carl Zeiss Smt Gmbh | Mirror exchange array of set structure for illumination optics used in e.g. scanner for performing microlithography, has single mirrors of mirror exchange array unit that are set with high reflecting coating portion |
DE102012216502A1 (en) | 2012-09-17 | 2014-03-20 | Carl Zeiss Smt Gmbh | mirror |
US9665011B2 (en) | 2012-11-29 | 2017-05-30 | Carl Zeiss Smt Gmbh | Arrangement for actuating at least one optical element in an optical system |
WO2014082830A1 (en) | 2012-11-29 | 2014-06-05 | Carl Zeiss Smt Gmbh | Arrangement for actuating at least one optical element in an optical system |
US10303065B2 (en) | 2012-11-29 | 2019-05-28 | Carl Zeiss Smt Gmbh | Arrangement for actuating at least one optical element in an optical system |
DE102012221831A1 (en) | 2012-11-29 | 2014-06-05 | Carl Zeiss Smt Gmbh | Arrangement for actuating at least one optical element in an optical system |
DE102012224022A1 (en) | 2012-12-20 | 2013-10-31 | Carl Zeiss Smt Gmbh | Arrangement for actuation of optical element in optical system, has actuator for exerting force on optical element, where actuator is arranged within vacuum-tight housing, and optical element is arranged outside the housing |
WO2014139787A1 (en) | 2013-03-13 | 2014-09-18 | Carl Zeiss Smt Gmbh | Arrangement for the actuation of at least one element in an optical system |
US9651772B2 (en) | 2013-03-13 | 2017-05-16 | Carl Zeiss Smt Gmbh | Arrangement for the actuation of at least one element in an optical system |
DE102013204305A1 (en) | 2013-03-13 | 2014-09-18 | Carl Zeiss Smt Gmbh | Arrangement for the actuation of at least one element in an optical system |
DE102013211269A1 (en) | 2013-06-17 | 2014-04-30 | Carl Zeiss Smt Gmbh | Illumination optics for illuminating structured object such as lithographic mask or wafer, mounted in metrology system, has an energy sensor designed for monitoring the lighting total light dose which hits on the facet mirrors |
DE102013218130A1 (en) | 2013-09-11 | 2015-03-12 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
US9841683B2 (en) | 2013-09-11 | 2017-12-12 | Carl Zeiss Smt Gmbh | Illumination optical unit for EUV projection lithography |
US9915874B2 (en) | 2013-09-11 | 2018-03-13 | Carl Zeiss Smt Gmbh | Illumination optical unit and illumination system for EUV projection lithography |
WO2015036226A1 (en) * | 2013-09-11 | 2015-03-19 | Carl Zeiss Smt Gmbh | Illumination optics and illumination system for euv projection lithography |
CN105706003B (en) * | 2013-09-11 | 2019-06-28 | 卡尔蔡司Smt有限责任公司 | Illumination optics device and lighting system for EUV projection lithography |
CN105706003A (en) * | 2013-09-11 | 2016-06-22 | 卡尔蔡司Smt有限责任公司 | Illumination optics and illumination system for EUV projection lithography |
US9709494B2 (en) | 2013-11-28 | 2017-07-18 | Carl Zeiss Smt Gmbh | Measuring arrangement for measuring optical properties of a reflective optical element, in particular for microlithography |
WO2015078861A1 (en) | 2013-11-28 | 2015-06-04 | Carl Zeiss Smt Gmbh | Measuring arrangement for measuring optical properties of a reflective optical element, in particular for microlithography |
DE102013224435A1 (en) | 2013-11-28 | 2015-05-28 | Carl Zeiss Smt Gmbh | Measuring arrangement for measuring optical properties of a reflective optical element, in particular for microlithography |
US10423073B2 (en) | 2014-01-30 | 2019-09-24 | Carl Zeiss Smt Gmbh | Method for producing a mirror element |
WO2015114043A1 (en) | 2014-01-30 | 2015-08-06 | Carl Zeiss Smt Gmbh | Method for producing a mirror element |
DE102014201622A1 (en) | 2014-01-30 | 2015-08-20 | Carl Zeiss Smt Gmbh | Method for producing a mirror element |
WO2015124471A1 (en) | 2014-02-21 | 2015-08-27 | Carl Zeiss Smt Gmbh | Subassembly of an optical system, in particular in a microlithographic projection exposure apparatus |
DE102014203144A1 (en) | 2014-02-21 | 2015-08-27 | Carl Zeiss Smt Gmbh | Assembly of an optical system, in particular in a microlithographic projection exposure apparatus |
US9897924B2 (en) | 2014-02-21 | 2018-02-20 | Carl Zeiss Smt Gmbh | Illumination optical unit for projection lithography |
EP4276539A2 (en) | 2014-02-21 | 2023-11-15 | Carl Zeiss SMT GmbH | Illumination optical unit for projection lithography |
DE102014203187A1 (en) * | 2014-02-21 | 2015-08-27 | Carl Zeiss Smt Gmbh | Illumination optics for projection lithography |
CN106030415B (en) * | 2014-02-21 | 2020-02-21 | 卡尔蔡司Smt有限责任公司 | Illumination optical unit for projection lithography |
CN106030415A (en) * | 2014-02-21 | 2016-10-12 | 卡尔蔡司Smt有限责任公司 | Illumination optical unit for projection lithography |
DE102014207894B4 (en) | 2014-04-28 | 2018-03-29 | Carl Zeiss Ag | Illumination optics, measuring system for characterizing at least one component of an exposure system and method for characterizing at least one component of an exposure system |
DE102014208984A1 (en) | 2014-05-13 | 2014-10-02 | Carl Zeiss Smt Gmbh | module |
DE102015200532A1 (en) | 2014-05-13 | 2015-11-19 | Carl Zeiss Smt Gmbh | module |
US10215953B2 (en) | 2014-08-05 | 2019-02-26 | Carl Zeiss Smt Gmbh | Tilting an optical element |
US10495845B2 (en) | 2014-08-05 | 2019-12-03 | Carl Zeiss Smt Gmbh | Tilting an optical element |
DE102014215452A1 (en) | 2014-08-05 | 2016-04-07 | Carl Zeiss Smt Gmbh | Tilting an optical element |
US10018917B2 (en) | 2014-08-25 | 2018-07-10 | Carl Zeiss Smt Gmbh | Illumination optical unit for EUV projection lithography |
DE102014216802A1 (en) * | 2014-08-25 | 2016-02-25 | Carl Zeiss Smt Gmbh | Illumination optics for EUV projection lithography |
WO2016034435A1 (en) * | 2014-09-03 | 2016-03-10 | Carl Zeiss Smt Gmbh | Illumination optical assembly for projection lithography |
DE102014217610A1 (en) * | 2014-09-03 | 2016-03-03 | Carl Zeiss Smt Gmbh | Illumination optics for projection lithography |
DE102014217612A1 (en) * | 2014-09-03 | 2016-03-03 | Carl Zeiss Smt Gmbh | Illumination optics for the projection lithograph |
US9977335B2 (en) | 2014-09-03 | 2018-05-22 | Carl Zeiss Smt Gmbh | Illumination optical unit for projection lithography |
US9915875B2 (en) | 2014-09-03 | 2018-03-13 | Carl Zeiss Smt Gmbh | Illumination optical assembly for projection lithography |
WO2016034424A1 (en) * | 2014-09-03 | 2016-03-10 | Carl Zeiss Smt Gmbh | Illumination optical unit for projection lithography |
US9996010B2 (en) | 2014-09-03 | 2018-06-12 | Carl Zeiss Smt Gmbh | Illumination optical assembly for projection lithography |
DE102014219648A1 (en) | 2014-09-29 | 2015-10-15 | Carl Zeiss Smt Gmbh | Method for producing a mirror element |
US10108097B2 (en) | 2015-02-03 | 2018-10-23 | Carl Zeiss Smt Gmbh | Arrangement for manipulating the position of an element |
DE102015201870A1 (en) | 2015-02-03 | 2016-08-04 | Carl Zeiss Smt Gmbh | Arrangement for position manipulation of an element, in particular in an optical system |
WO2016131758A1 (en) | 2015-02-17 | 2016-08-25 | Carl Zeiss Smt Gmbh | Assembly of an optical system, in particular of a microlithographic projection exposure apparatus |
DE102015202800A1 (en) | 2015-02-17 | 2016-08-18 | Carl Zeiss Smt Gmbh | Assembly of an optical system, in particular a microlithographic projection exposure apparatus |
DE102016205695A1 (en) | 2015-04-09 | 2016-10-13 | Carl Zeiss Smt Gmbh | Mask for projection lithography |
DE102015208514A1 (en) * | 2015-05-07 | 2016-11-10 | Carl Zeiss Smt Gmbh | Facet mirror for EUV projection lithography and illumination optics with such a facet mirror |
US10488567B2 (en) | 2015-05-07 | 2019-11-26 | Carl Zeiss Smt Gmbh | Faceted mirror for EUV projection lithography and illumination optical unit with same |
WO2016177599A1 (en) * | 2015-05-07 | 2016-11-10 | Carl Zeiss Smt Gmbh | Faceted mirror for euv projection lithography and illumination optical unit comprising such a faceted mirror |
WO2016188810A1 (en) * | 2015-05-22 | 2016-12-01 | Carl Zeiss Smt Gmbh | Pupil facet mirror |
WO2017032896A1 (en) | 2015-08-27 | 2017-03-02 | Carl Zeiss Smt Gmbh | Arrangement of a device for protecting a reticle, arranged in an object plane, from soiling |
DE102015216443A1 (en) | 2015-08-27 | 2017-03-02 | Carl Zeiss Smt Gmbh | Arrangement of a device for protecting a to be arranged in an object plane reticle against contamination |
DE102015223621A1 (en) | 2015-11-30 | 2016-10-27 | Carl Zeiss Smt Gmbh | Damping arrangement in a system, in particular in a microlithographic projection exposure apparatus |
US10598921B2 (en) | 2015-12-16 | 2020-03-24 | Carl Zeiss Smt Gmbh | Mirror element, in particular for a microlithographic projection exposure apparatus |
DE102015225510A1 (en) | 2015-12-16 | 2017-01-12 | Carl Zeiss Smt Gmbh | Mirror element, in particular for a microlithographic projection exposure apparatus |
DE102016212262A1 (en) | 2016-07-05 | 2017-06-22 | Carl Zeiss Smt Gmbh | Arrangement for regulating the position of a mirror arrangement |
DE102016220669A1 (en) | 2016-10-21 | 2017-08-31 | Carl Zeiss Smt Gmbh | Mirror arrangement, in particular for a microlithographic projection exposure apparatus |
DE102016223657A1 (en) | 2016-11-29 | 2017-01-12 | Carl Zeiss Smt Gmbh | Assembly of an optical system, in particular in a microlithographic projection exposure apparatus |
DE102017214441A1 (en) | 2016-11-29 | 2018-05-30 | Carl Zeiss Smt Gmbh | Assembly of an optical system, in particular in a microlithographic projection exposure apparatus |
DE102017210206A1 (en) | 2017-06-19 | 2018-04-26 | Carl Zeiss Smt Gmbh | Assembly, in particular in a microlithographic projection exposure apparatus |
DE102018201877A1 (en) | 2017-06-20 | 2018-12-20 | Carl Zeiss Smt Gmbh | Mirror arrangement, in particular for a microlithographic projection exposure apparatus |
DE102017210218A1 (en) | 2017-06-20 | 2017-10-05 | Carl Zeiss Smt Gmbh | Mirror arrangement, in particular for a microlithographic projection exposure apparatus |
DE102017211864A1 (en) | 2017-07-11 | 2018-07-19 | Carl Zeiss Smt Gmbh | Assembly, in particular in a microlithographic projection exposure apparatus |
DE102017220586A1 (en) | 2017-11-17 | 2019-05-23 | Carl Zeiss Smt Gmbh | Pupil facet mirror, illumination optics and optical system for a projection exposure apparatus |
WO2019096654A1 (en) | 2017-11-17 | 2019-05-23 | Carl Zeiss Smt Gmbh | Pupil facet mirror, optical system and illumination optics for a projection lithography system |
WO2019145125A1 (en) | 2018-01-25 | 2019-08-01 | Carl Zeiss Smt Gmbh | Imaging optical unit for euv microlithography |
DE102018201170A1 (en) | 2018-01-25 | 2019-07-25 | Carl Zeiss Smt Gmbh | Imaging optics for EUV microlithography |
US11422470B2 (en) | 2018-01-25 | 2022-08-23 | Carl Zeiss Smt Gmbh | Imaging optical unit for EUV microlithography |
DE102018202931A1 (en) | 2018-02-27 | 2018-04-19 | Carl Zeiss Smt Gmbh | Device and method for assembling or disassembling an assembly, in particular for a microlithographic projection exposure apparatus |
DE102018207107A1 (en) | 2018-05-08 | 2018-06-28 | Carl Zeiss Smt Gmbh | mirror |
DE102018123328B4 (en) | 2018-09-21 | 2022-09-08 | Carl Zeiss Smt Gmbh | Subassembly of an optical system, in particular in a microlithographic projection exposure system, and method for operating such an optical system |
WO2020057873A1 (en) | 2018-09-21 | 2020-03-26 | Carl Zeiss Smt Gmbh | Assembly of an optical system, more particularly in a projection microlithography system, and method for operating such an optical system |
DE102018216934A1 (en) | 2018-10-02 | 2019-09-05 | Carl Zeiss Smt Gmbh | Assembly, in particular in a microlithographic projection exposure apparatus |
DE102020204669A1 (en) | 2020-04-14 | 2021-10-14 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
WO2021209165A1 (en) | 2020-04-14 | 2021-10-21 | Carl Zeiss Smt Gmbh | Component of an optical system |
DE102020209141A1 (en) | 2020-07-21 | 2022-01-27 | Carl Zeiss Smt Gmbh | Method for operating an optical system for microlithography, and optical system |
WO2022017678A1 (en) | 2020-07-21 | 2022-01-27 | Carl Zeiss Smt Gmbh | Method for operating an optical system for microlithography, and optical system |
WO2022043226A1 (en) | 2020-08-27 | 2022-03-03 | Carl Zeiss Smt Gmbh | Pupil facet mirror for an illumination optical unit of a projection exposure apparatus |
DE102020210829A1 (en) | 2020-08-27 | 2022-03-03 | Carl Zeiss Smt Gmbh | Pupil facet mirror for an illumination optics of a projection exposure system |
WO2022048925A1 (en) | 2020-09-02 | 2022-03-10 | Carl Zeiss Smt Gmbh | Field facet for a field facet mirror of a projection exposure system |
DE102020211096A1 (en) | 2020-09-02 | 2022-03-03 | Carl Zeiss Smt Gmbh | Field facet for a field facet mirror of a projection exposure system |
WO2022053237A1 (en) | 2020-09-10 | 2022-03-17 | Carl Zeiss Smt Gmbh | Assembly of an optical system for microlithography |
DE102020211359A1 (en) | 2020-09-10 | 2022-03-10 | Carl Zeiss Smt Gmbh | Assembly of an optical system for microlithography |
NL2029213A (en) | 2020-09-29 | 2022-05-24 | Zeiss Carl Smt Gmbh | Stop apparatus for delimiting a beam path between a light source and an illumination optical unit of a projection exposure apparatus for projection lithography |
WO2022069125A1 (en) | 2020-09-29 | 2022-04-07 | Carl Zeiss Smt Gmbh | Stop apparatus for delimiting a beam path between a light source and an illumination optical unit of a projection exposure apparatus for projection lithography |
DE102020212229B3 (en) | 2020-09-29 | 2022-01-20 | Carl Zeiss Smt Gmbh | Aperture device for delimiting a beam path between a light source and an illumination optics of a projection exposure system for projection lithography |
DE102020212367A1 (en) | 2020-09-30 | 2022-03-31 | Carl Zeiss Smt Gmbh | Optical component |
DE102020212351A1 (en) | 2020-09-30 | 2022-03-31 | Carl Zeiss Smt Gmbh | Micromirror array for an illumination-optical component of a projection exposure system |
WO2022069427A1 (en) | 2020-09-30 | 2022-04-07 | Carl Zeiss Smt Gmbh | Optical component |
WO2022069426A1 (en) | 2020-09-30 | 2022-04-07 | Carl Zeiss Smt Gmbh | Digital micromirror device for an illumination optical component of a projection exposure system |
DE102020212569A1 (en) | 2020-10-06 | 2021-12-09 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102020212927A1 (en) | 2020-10-14 | 2022-04-14 | Carl Zeiss Smt Gmbh | SUPPORT OF AN OPTICAL ELEMENT |
WO2022079015A1 (en) | 2020-10-14 | 2022-04-21 | Carl Zeiss Smt Gmbh | Support for an optical element |
DE102020213416A1 (en) | 2020-10-23 | 2021-10-07 | Carl Zeiss Smt Gmbh | Projection exposure system with a heating device and a polarizer |
WO2022084066A1 (en) | 2020-10-23 | 2022-04-28 | Carl Zeiss Smt Gmbh | Projection exposure apparatus comprising a heating device and a polarizer |
DE102020213837A1 (en) | 2020-11-04 | 2021-08-19 | Carl Zeiss Smt Gmbh | Facet mirror device |
WO2022128869A1 (en) | 2020-12-15 | 2022-06-23 | Carl Zeiss Smt Gmbh | Damping device, optical assembly, and projection exposure system |
DE102020215906A1 (en) | 2020-12-15 | 2022-06-15 | Carl Zeiss Smt Gmbh | Attenuation device, optical assembly and projection exposure system |
DE102021200114A1 (en) | 2021-01-08 | 2021-12-30 | Carl Zeiss Smt Gmbh | Mirror projection optics, method for checking an optical element, optical element and lithography system |
DE102021200113A1 (en) | 2021-01-08 | 2022-07-14 | Carl Zeiss Smt Gmbh | Optical device, method for controlling an optical device, computer program product and lithography system |
DE102021212993A1 (en) | 2021-01-08 | 2022-07-14 | Carl Zeiss Smt Gmbh | Method for measuring an absorption of an electromagnetic radiation by an optical element, device for measuring a transformation property of an optical element and lithography system |
WO2022148698A1 (en) | 2021-01-08 | 2022-07-14 | Carl Zeiss Smt Gmbh | Optical device and method for controlling an optical device |
DE102021200131A1 (en) | 2021-01-11 | 2022-07-14 | Carl Zeiss Smt Gmbh | Assembly with a decoupling joint for the mechanical mounting of an element |
WO2022148569A1 (en) | 2021-01-11 | 2022-07-14 | Carl Zeiss Smt Gmbh | Assembly having a decoupling joint for mechanically mounting an element |
DE102021101523B3 (en) | 2021-01-25 | 2021-10-14 | Carl Zeiss IQS Deutschland GmbH | Device for producing an adhesive connection between components of a lithography system, method for producing an adhesive connection between components of a lithography system and lithography system |
DE102021213096A1 (en) | 2021-01-28 | 2022-07-28 | Carl Zeiss Smt Gmbh | METHOD OF MAKING A MECHANICAL SYSTEM FOR A LITHOGRAPHY PLANT |
WO2022167466A1 (en) | 2021-02-03 | 2022-08-11 | Carl Zeiss Smt Gmbh | Method for manufacturing an optical element, apparatus for manufacturing an optical element, optical element, and lithography system |
DE102021201001A1 (en) | 2021-02-03 | 2022-08-04 | Carl Zeiss Smt Gmbh | Method for manufacturing an optical element, apparatus for manufacturing an optical element, optical element and lithography system |
WO2022171538A1 (en) | 2021-02-09 | 2022-08-18 | Carl Zeiss Smt Gmbh | System and projection exposure apparatus |
DE102021201203A1 (en) | 2021-02-09 | 2022-08-11 | Carl Zeiss Smt Gmbh | SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102021201257A1 (en) | 2021-02-10 | 2021-12-30 | Carl Zeiss Smt Gmbh | Method and device for determining a spectrum of radiation, computer program product and lithography system |
WO2022171469A1 (en) | 2021-02-15 | 2022-08-18 | Carl Zeiss Smt Gmbh | Method for producing a multi-part mirror of a projection illumination system for microlithography |
DE102021201396A1 (en) | 2021-02-15 | 2022-08-18 | Carl Zeiss Smt Gmbh | Process for producing a multi-part mirror of a projection exposure system for microlithography |
WO2022180004A1 (en) | 2021-02-23 | 2022-09-01 | Carl Zeiss Smt Gmbh | Optical assembly, method for deforming an optical element, and projection exposure system |
DE102021201689A1 (en) | 2021-02-23 | 2022-08-25 | Carl Zeiss Smt Gmbh | Optical assembly, method for deforming an optical element and projection exposure system |
DE102021212823A1 (en) | 2021-03-15 | 2022-09-15 | Carl Zeiss Smt Gmbh | SUPPORTING A COMPONENT OF AN OPTICAL IMAGE DEVICE |
DE102021202502B4 (en) | 2021-03-15 | 2023-01-19 | Carl Zeiss Smt Gmbh | Device and method for changing a shape of a surface of an object |
DE102021202502A1 (en) | 2021-03-15 | 2022-09-15 | Carl Zeiss Smt Gmbh | Device for changing a shape of a surface of an object |
DE102021202770A1 (en) | 2021-03-22 | 2022-03-03 | Carl Zeiss Smt Gmbh | Process for generating a plasma and projection exposure system for semiconductor lithography |
DE102021202769A1 (en) | 2021-03-22 | 2022-09-22 | Carl Zeiss Smt Gmbh | Optical assembly and method for its manufacture, method for deforming an optical element and projection exposure system |
WO2022200203A1 (en) | 2021-03-22 | 2022-09-29 | Carl Zeiss Smt Gmbh | Optical assembly and method for the production thereof, method for deforming an optical element, and projection exposure apparatus |
NL2031384A (en) | 2021-03-23 | 2022-09-28 | Zeiss Carl Smt Gmbh | Projection exposure apparatus having a device for determining the concentration of atomic hydrogen |
DE102021202802B3 (en) | 2021-03-23 | 2022-03-24 | Carl Zeiss Smt Gmbh | Projection exposure system with a device for determining the concentration of atomic hydrogen |
DE102021202849A1 (en) | 2021-03-24 | 2022-01-05 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
WO2022200210A1 (en) | 2021-03-25 | 2022-09-29 | Carl Zeiss Smt Gmbh | Measuring device for interferometrically measuring a surface form |
DE102021202909A1 (en) | 2021-03-25 | 2022-09-29 | Carl Zeiss Smt Gmbh | Measuring device for interferometric measuring of a surface shape |
DE102021202911A1 (en) | 2021-03-25 | 2022-09-29 | Carl Zeiss Smt Gmbh | Measuring device for interferometric measuring of a surface shape |
WO2022200209A1 (en) | 2021-03-25 | 2022-09-29 | Carl Zeiss Smt Gmbh | Measurement device for interferometric measurement of a surface shape |
DE102021203475A1 (en) | 2021-04-08 | 2022-10-13 | Carl Zeiss Smt Gmbh | Process for producing a mirror of a projection exposure system for microlithography |
WO2022214290A1 (en) | 2021-04-08 | 2022-10-13 | Carl Zeiss Smt Gmbh | Method for producing a mirror of a microlithographic projection exposure apparatus |
DE102021203723A1 (en) | 2021-04-15 | 2022-04-21 | Carl Zeiss Smt Gmbh | CONNECTION ARRANGEMENT, PROJECTION EXPOSURE EQUIPMENT AND METHOD |
WO2022218750A1 (en) | 2021-04-15 | 2022-10-20 | Carl Zeiss Smt Gmbh | Actuator-sensor device and lithography apparatus |
DE102021203721A1 (en) | 2021-04-15 | 2022-10-20 | Carl Zeiss Smt Gmbh | ACTUATOR-SENSOR DEVICE AND LITHOGRAPHY PLANT |
DE102022108541A1 (en) | 2021-04-23 | 2022-10-27 | Carl Zeiss Jena Gmbh | Process for the production of a test element and test element |
DE102022200726A1 (en) | 2021-04-23 | 2022-10-27 | Carl Zeiss Smt Gmbh | Method for determining a reflection property of an optical element to be examined, device for determining a reflection property of an optical element to be examined, computer program product and lithography system |
DE102021204265A1 (en) | 2021-04-29 | 2022-11-03 | Carl Zeiss Smt Gmbh | Method for cleaning a surface of an element and cleaning device |
DE102021204582B3 (en) | 2021-05-06 | 2022-07-07 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102021205104A1 (en) | 2021-05-19 | 2022-03-03 | Carl Zeiss Smt Gmbh | Projection exposure system with a deformable element and method for producing an element |
DE102021205149B3 (en) | 2021-05-20 | 2022-07-07 | Carl Zeiss Smt Gmbh | Method and device for qualifying a faceted mirror |
DE102021205278B4 (en) | 2021-05-21 | 2023-05-17 | Carl Zeiss Smt Gmbh | Adjustable spacer, optical system, projection exposure apparatus and method |
DE102021205278A1 (en) | 2021-05-21 | 2022-11-24 | Carl Zeiss Smt Gmbh | Adjustable spacer, optical system, projection exposure apparatus and method |
WO2022248374A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Optical apparatus, method for setting a target deformation, and lithography system |
DE102021205368A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Component for a projection exposure system for semiconductor lithography and method for designing the component |
WO2022248369A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Optical device, method for adjusting a setpoint deformation and lithography system |
WO2022248433A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Projection exposure apparatus and method for designing a component of a projection exposure apparatus |
DE102021205425A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Optical device, method for setting a target deformation and lithography system |
DE102021205426A1 (en) | 2021-05-27 | 2022-12-01 | Carl Zeiss Smt Gmbh | Optical device, method for setting a target deformation and lithography system |
DE102021205809B3 (en) | 2021-06-09 | 2022-08-18 | Carl Zeiss Smt Gmbh | Method for screwing an actuator-sensor module of a projection exposure system |
DE102022203929A1 (en) | 2021-06-16 | 2022-12-22 | Carl Zeiss Smt Gmbh | Device for positioning a first component of an optical system, component of an optical system, optical device and lithography system |
WO2022268775A1 (en) | 2021-06-22 | 2022-12-29 | Carl Zeiss Smt Gmbh | Projection exposure apparatus for semiconductor lithography |
DE102021206427A1 (en) | 2021-06-22 | 2022-12-22 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102022115356A1 (en) | 2021-06-24 | 2022-12-29 | Carl Zeiss Smt Gmbh | Device for temperature control of a component |
DE102022204833A1 (en) | 2021-07-02 | 2023-01-05 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND METHOD OF MANUFACTURING AN OPTICAL SYSTEM |
DE102021206953A1 (en) | 2021-07-02 | 2022-06-02 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD OF OPERATING AN OPTICAL SYSTEM |
DE102021207522A1 (en) | 2021-07-15 | 2023-01-19 | Carl Zeiss Smt Gmbh | Device and method for coating a component for a projection exposure system and component of a projection exposure system |
WO2023285422A1 (en) | 2021-07-15 | 2023-01-19 | Carl Zeiss Smt Gmbh | Device and method for coating a component for a projection lithography system and component of a projection lithography system |
DE102021208563A1 (en) | 2021-08-06 | 2022-09-01 | Carl Zeiss Smt Gmbh | DEVICE AND METHOD FOR DETERMINING A TEMPERATURE IN A LITHOGRAPHY PLANT |
WO2023012330A1 (en) | 2021-08-06 | 2023-02-09 | Carl Zeiss Smt Gmbh | Temperature measuring device, lithography apparatus and method for measuring a temperature |
DE102021208562A1 (en) | 2021-08-06 | 2023-02-09 | Carl Zeiss Smt Gmbh | TEMPERATURE MEASUREMENT DEVICE, LITHOGRAPHY EQUIPMENT AND METHOD OF MEASURING A TEMPERATURE |
DE102021208628A1 (en) | 2021-08-09 | 2023-02-09 | Carl Zeiss Smt Gmbh | SUPPORT OF AN OPTICAL ELEMENT |
WO2023016961A1 (en) | 2021-08-09 | 2023-02-16 | Carl Zeiss Smt Gmbh | Support for an optical element |
DE102021208664A1 (en) | 2021-08-10 | 2023-02-16 | Carl Zeiss Smt Gmbh | Mirror for a microlithographic projection exposure system |
WO2023016681A1 (en) | 2021-08-10 | 2023-02-16 | Carl Zeiss Smt Gmbh | Mirror for a microlithographic projection exposure apparatus |
US11774870B2 (en) | 2021-08-10 | 2023-10-03 | Carl Zeiss Smt Gmbh | Method for removing a particle from a mask system |
DE102021120747B4 (en) | 2021-08-10 | 2024-07-11 | Carl Zeiss Sms Ltd. | Method for removing a particle from a mask system |
DE102021120747A1 (en) | 2021-08-10 | 2023-02-16 | Carl Zeiss Sms Ltd. | Method of removing a particle from a mask system |
DE102021208801B3 (en) | 2021-08-11 | 2022-08-11 | Carl Zeiss Smt Gmbh | Projection exposure system and method for laying out an adhesive layer |
WO2023016701A1 (en) | 2021-08-11 | 2023-02-16 | Carl Zeiss Smt Gmbh | Projection exposure system, and method for designing an adhesive layer |
WO2023016758A1 (en) | 2021-08-12 | 2023-02-16 | Carl Zeiss Smt Gmbh | Projection exposure apparatus for semiconductor lithography having a connecting element |
DE102021208843A1 (en) | 2021-08-12 | 2023-02-16 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography with a connecting element |
WO2023016870A1 (en) | 2021-08-13 | 2023-02-16 | Carl Zeiss Smt Gmbh | Optical element, projection optical unit and projection exposure apparatus |
DE102021208879A1 (en) | 2021-08-13 | 2023-02-16 | Carl Zeiss Smt Gmbh | OPTICAL ELEMENT, PROJECTION OPTICS AND PROJECTION EXPOSURE SYSTEM |
DE102021209099A1 (en) | 2021-08-19 | 2023-02-23 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102021209098A1 (en) | 2021-08-19 | 2022-05-25 | Carl Zeiss Smt Gmbh | PROTECTIVE HOSE AND PROJECTION EXPOSURE SYSTEM |
WO2023020741A1 (en) | 2021-08-19 | 2023-02-23 | Carl Zeiss Smt Gmbh | Optical system and projection exposure apparatus |
DE102022121000A1 (en) | 2021-08-23 | 2023-02-23 | Carl Zeiss Smt Gmbh | Mirror arrangement for an EUV projection exposure system with a protective device for protecting the optical active surface and EUV projection exposure system |
DE102022121000B4 (en) | 2021-08-23 | 2024-03-07 | Carl Zeiss Smt Gmbh | Mirror arrangement for an EUV projection exposure system with a protective device for protecting the optical effective surface and EUV projection exposure system |
DE102022204387A1 (en) | 2021-08-24 | 2023-03-16 | Carl Zeiss Smt Gmbh | Method and device for cleaning a surface to be cleaned, element for the lithography and/or semiconductor industry and lithography system |
DE102021210103B3 (en) | 2021-09-14 | 2023-03-02 | Carl Zeiss Smt Gmbh | PROCESS, OPTICAL SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102021210104A1 (en) | 2021-09-14 | 2022-07-07 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
DE102021210470B3 (en) | 2021-09-21 | 2023-01-19 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102021210577A1 (en) | 2021-09-23 | 2023-03-23 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
WO2023046560A1 (en) | 2021-09-23 | 2023-03-30 | Carl Zeiss Smt Gmbh | Method for determining a position of a mirror |
DE102021210708A1 (en) | 2021-09-24 | 2022-11-24 | Carl Zeiss Smt Gmbh | DOSING DEVICE AND METHOD FOR MANUFACTURING A LITHOGRAPHY PLANT |
DE102022205758A1 (en) | 2021-10-07 | 2023-04-13 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROCESS |
DE102021211626A1 (en) | 2021-10-14 | 2023-04-20 | Carl Zeiss Smt Gmbh | EUV multiple mirror array |
WO2023061713A1 (en) | 2021-10-14 | 2023-04-20 | Carl Zeiss Smt Gmbh | Multi-mirror array |
DE102021211619A1 (en) | 2021-10-14 | 2023-04-20 | Carl Zeiss Smt Gmbh | EUV multiple mirror array |
WO2023061845A1 (en) | 2021-10-14 | 2023-04-20 | Carl Zeiss Smt Gmbh | Euv multi-mirror arrangement |
DE102021212394A1 (en) | 2021-11-03 | 2023-05-04 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND PROCESS |
WO2023078781A1 (en) | 2021-11-03 | 2023-05-11 | Carl Zeiss Smt Gmbh | Optical system, lithography apparatus and method |
DE102021212553A1 (en) | 2021-11-08 | 2023-05-11 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND PROCESS |
WO2023079148A1 (en) | 2021-11-08 | 2023-05-11 | Carl Zeiss Smt Gmbh | Optical system, lithography apparatus and method |
DE102022210796A1 (en) | 2021-11-11 | 2023-05-11 | Carl Zeiss Smt Gmbh | Method for initializing a component of a projection exposure system for semiconductor lithography |
DE102021212971A1 (en) | 2021-11-18 | 2023-05-25 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
WO2023088651A1 (en) | 2021-11-18 | 2023-05-25 | Carl Zeiss Smt Gmbh | Optical system, projection exposure system and method |
DE102021213168A1 (en) | 2021-11-23 | 2023-05-25 | Carl Zeiss Smt Gmbh | PROCEDURE |
US11841620B2 (en) | 2021-11-23 | 2023-12-12 | Carl Zeiss Smt Gmbh | Method of assembling a facet mirror of an optical system |
EP4184251A1 (en) | 2021-11-23 | 2023-05-24 | Carl Zeiss SMT GmbH | Method of assembling a facet mirror |
DE102021213441A1 (en) | 2021-11-29 | 2022-09-15 | Carl Zeiss Smt Gmbh | METHOD OF MAKING AN OPTICAL SYSTEM |
DE102021213458A1 (en) | 2021-11-30 | 2022-08-18 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102021213612A1 (en) | 2021-12-01 | 2023-06-01 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, TEST EQUIPMENT, LITHOGRAPHY PLANT, ARRANGEMENT AND PROCEDURE |
DE102021213610A1 (en) | 2021-12-01 | 2023-06-01 | Carl Zeiss Smt Gmbh | METHOD, OPTICAL SYSTEM, TEST EQUIPMENT AND ARRANGEMENT |
WO2023099456A1 (en) | 2021-12-01 | 2023-06-08 | Carl Zeiss Smt Gmbh | Optical system, test device, lithography apparatus, arrangement and method |
WO2023099432A1 (en) | 2021-12-01 | 2023-06-08 | Carl Zeiss Smt Gmbh | Method, optical system, test device and arrangement |
DE102021213864A1 (en) | 2021-12-07 | 2022-07-07 | Carl Zeiss Smt Gmbh | Method and device for protecting an adhesive joint |
DE102021214139A1 (en) | 2021-12-10 | 2023-06-15 | Carl Zeiss Smt Gmbh | Projection exposure system with a correction determination module |
WO2023104658A1 (en) | 2021-12-10 | 2023-06-15 | Carl Zeiss Smt Gmbh | Projection exposure apparatus comprising a correction determination module |
DE102021214665A1 (en) | 2021-12-20 | 2022-12-15 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography with a temperature control structure |
DE102021214981A1 (en) | 2021-12-23 | 2023-06-29 | Carl Zeiss Smt Gmbh | PROCESS AND DRYING DEVICE |
WO2023117584A1 (en) | 2021-12-23 | 2023-06-29 | Carl Zeiss Smt Gmbh | Method and drying device |
DE102022200205B3 (en) | 2022-01-11 | 2022-11-24 | Carl Zeiss Smt Gmbh | EUV projection exposure system and method for removing foreign bodies |
DE102022200264A1 (en) | 2022-01-12 | 2022-12-15 | Carl Zeiss Smt Gmbh | Device for tilting a mirror, optical component, optical assembly, method for tilting a mirror, method for producing a device for tilting a mirror and EUV projection exposure system |
DE102022208651A1 (en) | 2022-01-12 | 2023-07-13 | Carl Zeiss Smt Gmbh | Assembly of an optical system for microlithography |
DE102022200277A1 (en) | 2022-01-13 | 2023-01-26 | Carl Zeiss Smt Gmbh | Method, device, preparation method and preparation device for producing a base body, base body, optical element and lithography system |
DE102022213100A1 (en) | 2022-01-13 | 2023-07-13 | Carl Zeiss Smt Gmbh | ACTUATOR/SENSOR DEVICE, OPTICS MODULE AND LITHOGRAPHY PLANT |
DE102022200400A1 (en) | 2022-01-14 | 2022-06-30 | Carl Zeiss Smt Gmbh | CONNECTION OF COMPONENTS OF AN OPTICAL DEVICE |
DE102022213113A1 (en) | 2022-01-18 | 2023-07-20 | Carl Zeiss Smt Gmbh | Method for monitoring an adjustment setting, interferometric measuring device, hologram device and lithography system |
DE102022212378A1 (en) | 2022-01-24 | 2023-07-27 | Carl Zeiss Smt Gmbh | Device for holding and cooling an optic body, method for producing an optic body, cooling method for cooling an optic body, optical element and lithography system |
DE102022211909A1 (en) | 2022-01-25 | 2023-07-27 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD OF OPERATING AN OPTICAL SYSTEM |
DE102022212449A1 (en) | 2022-01-31 | 2023-08-03 | Carl Zeiss Smt Gmbh | Device for connecting at least a first and a second module component, module of a lithography system, optical element and lithography system |
DE102022201007A1 (en) | 2022-01-31 | 2022-11-17 | Carl Zeiss Smt Gmbh | Device for connecting at least a first and a second module component, module of a lithography system, optical element and lithography system |
DE102022200976A1 (en) | 2022-01-31 | 2023-01-05 | Carl Zeiss Smt Gmbh | Calibration bodies and methods for calibration |
DE102023200212A1 (en) | 2022-02-01 | 2023-08-03 | Carl Zeiss Smt Gmbh | Projection exposure system and method for manipulating vibrations |
DE102022201304A1 (en) | 2022-02-08 | 2023-01-05 | Carl Zeiss Smt Gmbh | Method for determining the end of a warm-up phase of an optical element |
WO2023151891A1 (en) | 2022-02-08 | 2023-08-17 | Carl Zeiss Smt Gmbh | Heating device for a projection exposure system and projection exposure system |
DE102022201301A1 (en) | 2022-02-08 | 2023-08-10 | Carl Zeiss Smt Gmbh | EUV projection exposure system with a heating device |
DE102023200336A1 (en) | 2022-02-08 | 2023-08-10 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography with a connecting element |
DE102022212721A1 (en) | 2022-02-16 | 2023-08-17 | Carl Zeiss Smt Gmbh | PROCEDURE |
DE102023201200A1 (en) | 2022-03-01 | 2023-09-07 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102022202116A1 (en) | 2022-03-02 | 2023-02-23 | Carl Zeiss Smt Gmbh | SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102022202241A1 (en) | 2022-03-04 | 2023-03-02 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE EQUIPMENT |
DE102023201812A1 (en) | 2022-03-09 | 2023-09-14 | Carl Zeiss Smt Gmbh | Method and device for releasing an adhesive bond |
DE102022202355A1 (en) | 2022-03-09 | 2023-02-02 | Carl Zeiss Smt Gmbh | Micromirror assembly, manufacturing method for manufacturing a micromirror assembly and method for tilting a mirror surface |
DE102022202424A1 (en) | 2022-03-10 | 2023-03-02 | Carl Zeiss Smt Gmbh | Process and test system for the analysis of sealing systems |
DE102023201828A1 (en) | 2022-03-14 | 2023-09-14 | Carl Zeiss Smt Gmbh | Plug holder, heating device and projection exposure system |
DE102023201560A1 (en) | 2022-03-21 | 2023-09-21 | Carl Zeiss Smt Gmbh | COMPONENT AND PROJECTION EXPOSURE SYSTEM |
WO2023180241A1 (en) | 2022-03-24 | 2023-09-28 | Carl Zeiss Smt Gmbh | Arrangement and projection exposure system |
DE102022202938A1 (en) | 2022-03-24 | 2023-09-28 | Carl Zeiss Smt Gmbh | ARRANGEMENT AND PROJECTION EXPOSURE SYSTEM |
WO2023180393A1 (en) | 2022-03-25 | 2023-09-28 | Carl Zeiss Smt Gmbh | Optical device, method for measuring an actual tilt of an optical surface of an optical element, and lithography system |
DE102022202989A1 (en) | 2022-03-25 | 2023-09-28 | Carl Zeiss Smt Gmbh | Optical device, method for measuring an actual tilt of an optical surface of an optical element and lithography system |
DE102022203150A1 (en) | 2022-03-31 | 2023-01-05 | Carl Zeiss Smt Gmbh | Optical device, method for detecting a temperature distribution and lithography system |
WO2023187148A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Drive device, optical system and lithography apparatus |
DE102022203299A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Procedure for checking the quality of a screw connection |
DE102022203254B3 (en) | 2022-04-01 | 2023-03-02 | Carl Zeiss Smt Gmbh | WATER-CONDUCTING SYSTEM, PROJECTION EXPOSURE SYSTEM AND MEASURING DEVICE |
DE102022203298A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Method and device for chemically processing a surface |
WO2023186960A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Control device, optical system, lithography installation and method |
DE102022203255A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | CONTROL DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM |
WO2023186964A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | Method and device for the chemical treatment of a surface |
DE102022203257A1 (en) | 2022-04-01 | 2023-10-05 | Carl Zeiss Smt Gmbh | CONTROL DEVICE, OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD |
WO2023194374A1 (en) | 2022-04-05 | 2023-10-12 | Carl Zeiss Smt Gmbh | Arrangement, method and computer program product for calibrating facet mirrors |
DE102022203369A1 (en) | 2022-04-05 | 2023-10-05 | Carl Zeiss Smt Gmbh | Arrangement, method and computer program product for calibrating facet mirrors |
DE102022203433A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | CONNECTING COMPONENTS OF AN OPTICAL DEVICE |
WO2023194145A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Connection of components of an optical device |
WO2023194220A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Device and method for aligning two components |
DE102022203393A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Device and method for aligning two components |
WO2023194146A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Actively tiltable optical element |
DE102022203438A1 (en) | 2022-04-06 | 2023-10-12 | Carl Zeiss Smt Gmbh | Optical arrangement, optical module, optical imaging device and method, method for supporting an optical element, with an actively tiltable optical element |
DE102022203438B4 (en) | 2022-04-06 | 2023-12-07 | Carl Zeiss Smt Gmbh | Optical arrangement, optical module, optical imaging device and method, method for supporting an optical element, with an actively tiltable optical element |
DE102023201556A1 (en) | 2022-04-13 | 2023-10-19 | Carl Zeiss Smt Gmbh | EUV collector for an EUV projection exposure system |
DE102022203745A1 (en) | 2022-04-13 | 2022-09-15 | Carl Zeiss Smt Gmbh | EUV collector for an EUV projection exposure system |
WO2023198732A1 (en) | 2022-04-13 | 2023-10-19 | Carl Zeiss Smt Gmbh | Connecting components of an optical device |
DE102022203758A1 (en) | 2022-04-13 | 2023-10-19 | Carl Zeiss Smt Gmbh | CONNECTING COMPONENTS OF AN OPTICAL DEVICE |
DE102022203881A1 (en) | 2022-04-20 | 2023-04-13 | Carl Zeiss Smt Gmbh | CIRCUIT BOARD FOR AN OPTICAL SYSTEM, OPTICAL SYSTEM, LITHOGRAPHY EQUIPMENT AND METHOD FOR MANUFACTURING A CIRCUIT BOARD FOR AN OPTICAL SYSTEM |
DE102022203999A1 (en) | 2022-04-26 | 2022-07-21 | Carl Zeiss Smt Gmbh | Method for calibrating a diffractive measurement structure, device for calibrating a diffractive measurement structure and lithography system |
DE102022204098A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | Illumination optics for projection lithography |
DE102022204095A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | Method for measuring an illumination angle distribution on an object field and illumination optics with a predetermined illumination channel assignment |
WO2023208556A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | Method for measuring an illumination angle distribution on an object field and illumination optics unit having an illumination channel allocation intended therefor |
DE102022204044A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | SUPPORTING COMPONENTS OF AN OPTICAL DEVICE |
WO2023208590A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | Supporting components of an optical device |
WO2023208557A1 (en) | 2022-04-27 | 2023-11-02 | Carl Zeiss Smt Gmbh | Illumination optical unit for projection lithography |
DE102022204268A1 (en) | 2022-04-29 | 2023-11-02 | Carl Zeiss Smt Gmbh | Optical component for a lithography system |
WO2023208894A1 (en) | 2022-04-29 | 2023-11-02 | Carl Zeiss Smt Gmbh | Optical component for a lithography apparatus |
DE102022204580A1 (en) | 2022-05-11 | 2023-04-20 | Carl Zeiss Smt Gmbh | METHOD OF MAKING OR OPERATION OF A MIRROR IN A LITHOGRAPHY PLANT |
WO2023217738A1 (en) | 2022-05-12 | 2023-11-16 | Carl Zeiss Smt Gmbh | Optical system, lithography apparatus having an optical system, and method for producing an optical system |
DE102022204643A1 (en) | 2022-05-12 | 2023-11-16 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM AND METHOD FOR PRODUCING AN OPTICAL SYSTEM |
DE102022205227A1 (en) | 2022-05-25 | 2023-04-27 | Carl Zeiss Smt Gmbh | Optical device, method for determining an actual deformation, method for setting a target deformation and lithography system |
DE102023203580A1 (en) | 2022-05-31 | 2023-11-30 | Carl Zeiss Smt Gmbh | Coolant line for providing a fluid for temperature control of components |
DE102022214283A1 (en) | 2022-06-07 | 2023-12-07 | Carl Zeiss Smt Gmbh | Optical system for a lithography system and lithography system |
DE102022205815A1 (en) | 2022-06-08 | 2023-12-14 | Carl Zeiss Smt Gmbh | Component for a projection exposure system for semiconductor lithography and projection exposure system |
WO2023237452A1 (en) | 2022-06-08 | 2023-12-14 | Carl Zeiss Smt Gmbh | Component for a projection exposure apparatus for semiconductor lithography and projection exposure apparatus |
DE102022206065B3 (en) | 2022-06-15 | 2023-02-23 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
WO2023241878A1 (en) | 2022-06-15 | 2023-12-21 | Carl Zeiss Smt Gmbh | Method for compensating actuator effects of actuators |
WO2023247496A1 (en) | 2022-06-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | Device and method for treating the surface of an optical element of a lithography system in an atomic layer deposition process or an atomic layer etching process |
WO2023247238A1 (en) | 2022-06-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
WO2023247170A1 (en) | 2022-06-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
DE102022206126A1 (en) | 2022-06-20 | 2023-03-09 | Carl Zeiss Smt Gmbh | Component for use in a projection exposure system |
DE102022206198A1 (en) | 2022-06-21 | 2022-09-15 | Carl Zeiss Smt Gmbh | Method and device for qualifying a component of a projection exposure system for semiconductor lithography |
DE102023204960A1 (en) | 2022-06-30 | 2024-01-04 | Carl Zeiss Smt Gmbh | Method for operating a lithography system and lithography system |
DE102022116699A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical element and projection exposure system for semiconductor lithography |
DE102022116698B3 (en) | 2022-07-05 | 2023-09-21 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
DE102022116695A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Base body for an optical element and method for producing a base body for an optical element and projection exposure system |
DE102022206832A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | METHOD FOR CONTROLLING A POSITION OF AN OPTICAL COMPONENT OF A LITHOGRAPHY SYSTEM |
DE102022116694A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Method for producing a base body of an optical element, base body and projection exposure system for semiconductor lithography |
WO2024008360A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical element and projection exposure system for semiconductor lithography |
WO2024008677A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical element with vibration-reducing sections of fluid lines, projection exposure system, and method for producing a base element of an optical element |
WO2024008674A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Base element for an optical element with a linking shape and method for producing a base element of an optical element and projection exposure system |
WO2024008676A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Method for producing a base element of an optical element for semiconductor lithography, base element, optical element and projection exposure system |
DE102022116700A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical assembly, projection exposure system for semiconductor lithography and process |
DE102022116696A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Base body for an optical element with a connection geometry and method for producing a base body of an optical element and projection exposure system |
WO2024008732A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Method for controlling a position of an optical component of a lithography system |
DE102022116693A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical element with vibration-reducing sections of fluid lines and method for producing a base body of an optical element and projection exposure system |
WO2024008352A1 (en) | 2022-07-05 | 2024-01-11 | Carl Zeiss Smt Gmbh | Optical assembly, projection exposure system for semiconductor lithography and method |
WO2024013190A1 (en) | 2022-07-11 | 2024-01-18 | Carl Zeiss Smt Gmbh | Apparatus and method for providing sensor data of an optical system, optical system and lithography apparatus having an optical system |
DE102022207027A1 (en) | 2022-07-11 | 2024-01-11 | Carl Zeiss Smt Gmbh | DEVICE AND METHOD FOR PROVIDING SENSOR DATA OF AN OPTICAL SYSTEM, OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM |
DE102023206334A1 (en) | 2022-07-11 | 2024-01-11 | Carl Zeiss Smt Gmbh | CONTROL DEVICE AND OPTICAL SYSTEM |
DE102022207123A1 (en) | 2022-07-12 | 2024-01-18 | Carl Zeiss Smt Gmbh | Pin for a clamping system |
WO2024012749A1 (en) | 2022-07-12 | 2024-01-18 | Carl Zeiss Smt Gmbh | Pin for a tensioning system |
DE102022207148A1 (en) | 2022-07-13 | 2024-01-18 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography |
WO2024013177A1 (en) | 2022-07-13 | 2024-01-18 | Carl Zeiss Smt Gmbh | Projection exposure apparatus for semiconductor lithography |
DE102022207312A1 (en) | 2022-07-18 | 2024-01-18 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
WO2024017836A1 (en) | 2022-07-18 | 2024-01-25 | Carl Zeiss Smt Gmbh | Optical system and projection exposure apparatus |
DE102023204369A1 (en) | 2022-07-19 | 2024-01-25 | Carl Zeiss Smt Gmbh | METHOD AND ADJUSTMENT ELEMENT SET |
DE102022207348A1 (en) | 2022-07-19 | 2022-09-15 | Carl Zeiss Smt Gmbh | PROCEDURE AND ADJUSTMENT KIT |
DE102023205175A1 (en) | 2022-07-22 | 2024-01-25 | Carl Zeiss Smt Gmbh | Method for determining an overall center of gravity of a distribution of light intensities |
WO2024022899A1 (en) | 2022-07-25 | 2024-02-01 | Carl Zeiss Smt Gmbh | Facet mirror assembly |
DE102022207546B3 (en) | 2022-07-25 | 2023-10-12 | Carl Zeiss Smt Gmbh | Facet mirror assembly, lighting optics, optical system, projection exposure system, method for producing a microstructured component and component |
DE102022207555A1 (en) | 2022-07-25 | 2024-01-25 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM AND METHOD FOR PRODUCING AN OPTICAL SYSTEM |
WO2024023010A1 (en) | 2022-07-25 | 2024-02-01 | Carl Zeiss Smt Gmbh | Optical system, lithography machine having an optical system, and method for producing an optical system |
DE102022207545A1 (en) | 2022-07-25 | 2023-04-27 | Carl Zeiss Smt Gmbh | Optical component |
WO2024022835A1 (en) | 2022-07-27 | 2024-02-01 | Carl Zeiss Smt Gmbh | Method, device, and computer-implemented method for inspecting a component, in particular a component of a lithography system, and lithography system |
DE102022207687A1 (en) | 2022-07-27 | 2024-02-01 | Carl Zeiss Smt Gmbh | Method and device for inspecting a component, computer-implemented method and lithography system |
DE102022207689A1 (en) | 2022-07-27 | 2022-09-29 | Carl Zeiss Smt Gmbh | Method, device and computer program product for identifying contamination in components of an EUV lithography system |
DE102023206102A1 (en) | 2022-07-27 | 2024-02-01 | Carl Zeiss Smt Gmbh | Method, device and computer program product for identifying contamination in components of an EUV lithography system |
DE102022207884B4 (en) | 2022-07-29 | 2024-02-15 | Carl Zeiss Smt Gmbh | Measuring device, method for interferometric measurement, processing method, optical element and lithography system |
DE102022207884A1 (en) | 2022-07-29 | 2024-02-01 | Carl Zeiss Smt Gmbh | Measuring device, method for interferometric measurement, processing method, optical element and lithography system |
DE102022208010A1 (en) | 2022-08-03 | 2024-02-08 | Carl Zeiss Smt Gmbh | Device and method for applying a fluid and component |
WO2024028170A1 (en) | 2022-08-03 | 2024-02-08 | Carl Zeiss Smt Gmbh | Device and method for applying a fluid, and component |
DE102022208231B3 (en) | 2022-08-08 | 2023-06-07 | Carl Zeiss Smt Gmbh | CONTROL DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY PLANT |
DE102022208239A1 (en) | 2022-08-08 | 2024-02-08 | Carl Zeiss Smt Gmbh | Device and method for sensory measurement of chemical and/or physical properties of an adhesive layer and/or a medium contacting the adhesive layer, as well as method for producing a corresponding device and method for sensory measurement |
DE102022208204A1 (en) | 2022-08-08 | 2023-08-31 | Carl Zeiss Smt Gmbh | Process for compensating for aberrations in an EUV projection exposure system |
WO2024033083A1 (en) | 2022-08-08 | 2024-02-15 | Carl Zeiss Smt Gmbh | Method for stabilizing an adhesive connection of an optical assembly, optical assembly and projection exposure apparatus for semiconductor lithography |
WO2024033320A1 (en) | 2022-08-08 | 2024-02-15 | Carl Zeiss Smt Gmbh | Drive device, optical system and lithography apparatus |
DE102022208206A1 (en) | 2022-08-08 | 2024-02-08 | Carl Zeiss Smt Gmbh | Method for stabilizing an adhesive connection of an optical assembly |
WO2024033081A1 (en) | 2022-08-08 | 2024-02-15 | Carl Zeiss Smt Gmbh | Device and method for sensor-based measurement of chemical and/or physical properties of an adhesive layer and/or of a medium in contact with the adhesive layer, and method for producing a corresponding device and method for sensorbased measurement |
DE102022208286A1 (en) | 2022-08-09 | 2024-02-15 | Carl Zeiss Smt Gmbh | Method for producing a base body for semiconductor lithography, optical element and projection exposure system |
DE102022208738A1 (en) | 2022-08-24 | 2024-02-29 | Carl Zeiss Smt Gmbh | Device and method for aligning two components |
WO2024052059A1 (en) | 2022-09-09 | 2024-03-14 | Carl Zeiss Smt Gmbh | Fiber strand for a sector heater, sector heater and projection device |
DE102022209398A1 (en) | 2022-09-09 | 2023-08-31 | Carl Zeiss Smt Gmbh | Assembly of an optical system and method for thermally influencing an optical element |
DE102022209453A1 (en) | 2022-09-09 | 2024-03-14 | Carl Zeiss Smt Gmbh | Fiber strand for a sector heater, sector heater and projection device |
WO2024052300A1 (en) | 2022-09-09 | 2024-03-14 | Carl Zeiss Smt Gmbh | Illumination system, radiation source apparatus, method for illuminating a reticle, and lithography system |
DE102023203506A1 (en) | 2022-09-12 | 2024-03-14 | Carl Zeiss Smt Gmbh | Vacuum chamber for components for semiconductor lithography and method for automated cleaning of the vacuum chamber |
WO2024056600A1 (en) | 2022-09-13 | 2024-03-21 | Carl Zeiss Smt Gmbh | Method to adjust an illumination beam path within an illumination optics and illumination optics having an adjustment system |
DE102023206503A1 (en) | 2022-09-14 | 2024-03-14 | Carl Zeiss Smt Gmbh | Imaging optics |
DE102023203420A1 (en) | 2022-09-19 | 2024-03-21 | Carl Zeiss Smt Gmbh | THERMAL ACTUATOR ARRANGEMENT |
DE102022209852A1 (en) | 2022-09-19 | 2022-11-10 | Carl Zeiss Smt Gmbh | THERMAL ACTUATOR ARRANGEMENT |
DE102022209791B3 (en) | 2022-09-19 | 2023-07-06 | Carl Zeiss Smt Gmbh | EUV collector for an EUV projection exposure system |
DE102022209854A1 (en) | 2022-09-20 | 2022-11-17 | Carl Zeiss Smt Gmbh | CONNECTION ARRANGEMENT |
DE102023203575A1 (en) | 2022-09-20 | 2024-03-21 | Carl Zeiss Smt Gmbh | CONNECTION ARRANGEMENT |
DE102023208854A1 (en) | 2022-09-20 | 2024-03-21 | Carl Zeiss Smt Gmbh | COOLING DEVICE FOR COOLING A POSITION-SENSITIVE COMPONENT OF A LITHOGRAPHY SYSTEM |
DE102022209868A1 (en) | 2022-09-20 | 2024-03-21 | Carl Zeiss Smt Gmbh | OPTICAL ASSEMBLY, OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
WO2024061905A1 (en) | 2022-09-20 | 2024-03-28 | Carl Zeiss Smt Gmbh | Optical assembly, optical system and projection exposure apparatus |
DE102022209908A1 (en) | 2022-09-21 | 2024-03-21 | Carl Zeiss Smt Gmbh | Facet mirror, lighting optics, arrangement of a facet mirror, projection exposure system and method for producing a nanostructured component |
DE102022209922A1 (en) | 2022-09-21 | 2023-09-21 | Carl Zeiss Smt Gmbh | REFLECTOMETER DEVICE, MEASURING ARRANGEMENT, METHOD FOR PRODUCING AN OPTICAL REFERENCE ELEMENT AND METHOD FOR MEASURING A SAMPLE OF A LITHOGRAPHY SYSTEM |
WO2024061733A1 (en) | 2022-09-21 | 2024-03-28 | Carl Zeiss Smt Gmbh | Facet mirror, illumination optical unit, arrangement of a facet mirror, projection exposure apparatus and method for producing a nanostructured component |
DE102022210024A1 (en) | 2022-09-22 | 2023-09-07 | Carl Zeiss Smt Gmbh | Method and device for qualifying a computer-generated hologram, regularization method and lithography system |
DE102022210035A1 (en) | 2022-09-23 | 2024-03-28 | Carl Zeiss Smt Gmbh | MANAGEMENT OF COMPONENTS OF AN OPTICAL DEVICE |
WO2024061579A1 (en) | 2022-09-23 | 2024-03-28 | Carl Zeiss Smt Gmbh | Assembly for annealing at least a portion of an optical element |
WO2024061599A1 (en) | 2022-09-23 | 2024-03-28 | Carl Zeiss Smt Gmbh | Guiding of components of an optical device |
DE102022210037A1 (en) | 2022-09-23 | 2024-03-28 | Carl Zeiss Smt Gmbh | Arrangement for tempering at least a partial area of an optical element |
DE102022210158A1 (en) | 2022-09-26 | 2024-03-28 | Carl Zeiss Smt Gmbh | Arrangement, method and computer program product for calibrating facet mirrors |
DE102022210132A1 (en) | 2022-09-26 | 2022-12-01 | Carl Zeiss Smt Gmbh | Component for a projection exposure system for semiconductor lithography and method for producing the component |
WO2024068430A1 (en) | 2022-09-26 | 2024-04-04 | Carl Zeiss Smt Gmbh | Arrangement, method and computer program product for system-integrated calibration of a facet mirror of a microlithographic illumination system |
DE102022210171A1 (en) | 2022-09-27 | 2024-03-28 | Carl Zeiss Smt Gmbh | OPTICAL ELEMENT, OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
WO2024068194A1 (en) | 2022-09-27 | 2024-04-04 | Carl Zeiss Smt Gmbh | Optical element for a projection exposure system, optical system comprising same and projection exposure system comprising the optical element and/or the optical system |
DE102022210229A1 (en) | 2022-09-27 | 2022-11-24 | Carl Zeiss Smt Gmbh | Magnet system and method for low-friction mounting and/or influencing the position of an optical element |
DE102022210274A1 (en) | 2022-09-28 | 2024-03-28 | Carl Zeiss Smt Gmbh | MEASURING DEVICE AND MEASURING METHOD FOR MEASURING A VOLTAGE DROPPING IN AN OPTICAL SYSTEM, OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM |
DE102022210289A1 (en) | 2022-09-28 | 2022-12-01 | Carl Zeiss Smt Gmbh | Device and method for positioning an optical element, measuring device for measuring an optical surface and lithography system |
WO2024068686A1 (en) | 2022-09-28 | 2024-04-04 | Carl Zeiss Smt Gmbh | Measuring device and measuring method for measuring a voltage dropping in an optical system, optical system, and lithography system |
DE102022210356A1 (en) | 2022-09-29 | 2022-11-24 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY PLANT WITH AN OPTICAL SYSTEM AND METHOD FOR MANUFACTURING AN OPTICAL SYSTEM |
DE102022125354A1 (en) | 2022-09-30 | 2024-04-04 | Asml Netherlands B.V. | Cooling device for cooling a position-sensitive component of a lithography system |
WO2024068138A1 (en) | 2022-09-30 | 2024-04-04 | Carl Zeiss Smt Gmbh | Cooling device for cooling a position-sensitive component of a lithography system |
DE102022211226A1 (en) | 2022-10-24 | 2024-04-25 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography and process |
WO2024088871A1 (en) | 2022-10-24 | 2024-05-02 | Carl Zeiss Smt Gmbh | Projection exposure system for semiconductor lithography and method |
DE102022211334A1 (en) | 2022-10-26 | 2023-09-14 | Carl Zeiss Smt Gmbh | Method for controlling an actuator and actuator |
DE102023207047A1 (en) | 2022-10-27 | 2024-05-02 | Carl Zeiss Smt Gmbh | COOLING LINE DEVICE FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR CONTROLLING A PRESSURE OF A COOLING LIQUID IN A COOLING LINE OF A LITHOGRAPHY SYSTEM |
DE102023208302A1 (en) | 2022-11-02 | 2024-05-02 | Carl Zeiss Smt Gmbh | SYSTEM FOR A LITHOGRAPHY SYSTEM AND LITHOGRAPHY SYSTEM |
DE102023208848A1 (en) | 2022-11-07 | 2024-05-08 | Carl Zeiss Smt Gmbh | LIGHTING SYSTEM FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR OPERATING A LIGHTING SYSTEM OF A LITHOGRAPHY SYSTEM |
DE102022211696A1 (en) | 2022-11-07 | 2024-05-08 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM WITH AN OPTICAL SYSTEM |
WO2024099957A1 (en) | 2022-11-07 | 2024-05-16 | Carl Zeiss Smt Gmbh | Optical system and lithography apparatus having at least one optical system |
DE102023208851A1 (en) | 2022-11-08 | 2024-05-08 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102022211799A1 (en) | 2022-11-08 | 2022-12-29 | Carl Zeiss Smt Gmbh | MANIPULATOR, OPTICAL SYSTEM, PROJECTION EXPOSURE EQUIPMENT AND PROCESS |
WO2024099676A1 (en) | 2022-11-09 | 2024-05-16 | Carl Zeiss Smt Gmbh | Method for correcting local surface elevations on reflective surfaces |
DE102022211875A1 (en) | 2022-11-09 | 2024-05-16 | Carl Zeiss Smt Gmbh | Method for correcting local surface elevations on reflective surfaces |
DE102022212120A1 (en) | 2022-11-15 | 2023-11-23 | Carl Zeiss Smt Gmbh | METHOD AND FIBER INJECTION DEVICE |
WO2024104806A1 (en) | 2022-11-15 | 2024-05-23 | Carl Zeiss Smt Gmbh | Method for determining image errors of high-resolution imaging systems by wave front measurement |
DE102022212136A1 (en) | 2022-11-15 | 2023-01-12 | Carl Zeiss Smt Gmbh | Process for determining image errors in high-resolution imaging systems using wavefront measurement |
DE102022212168A1 (en) | 2022-11-16 | 2024-05-16 | Carl Zeiss Smt Gmbh | EUV optics module for an EUV projection exposure system |
WO2024104849A1 (en) | 2022-11-16 | 2024-05-23 | Carl Zeiss Smt Gmbh | Euv optics module for an euv projection exposure apparatus |
DE102022212167A1 (en) | 2022-11-16 | 2023-09-14 | Carl Zeiss Smt Gmbh | EUV source module for an EUV projection exposure system |
DE102022212257A1 (en) | 2022-11-17 | 2023-11-02 | Carl Zeiss Smt Gmbh | Method for producing a base body and base body with a lightweight structure and projection exposure system |
DE102022212279A1 (en) | 2022-11-18 | 2024-05-23 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
WO2024104719A1 (en) | 2022-11-18 | 2024-05-23 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
WO2024104727A1 (en) | 2022-11-18 | 2024-05-23 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
DE102022212277A1 (en) | 2022-11-18 | 2024-05-23 | Carl Zeiss Smt Gmbh | Assembly of an optical system |
DE102022212377A1 (en) | 2022-11-21 | 2023-10-12 | Carl Zeiss Smt Gmbh | SEALING DEVICE, METHOD AND USE |
DE102022212463A1 (en) | 2022-11-22 | 2024-05-23 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR OPERATING AN OPTICAL SYSTEM OF A LITHOGRAPHY SYSTEM |
WO2024110450A1 (en) | 2022-11-22 | 2024-05-30 | Carl Zeiss Smt Gmbh | Optical system, lithography unit, and method for operating an optical system of a lithography unit |
DE102022212537A1 (en) | 2022-11-24 | 2024-05-29 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY DEVICE WITH AN OPTICAL SYSTEM AND ARRANGEMENT WITH AN OPTICAL SYSTEM |
WO2024110635A1 (en) | 2022-11-24 | 2024-05-30 | Carl Zeiss Smt Gmbh | Optical system, lithography apparatus comprising an optical system, and arrangement comprising an optical system |
WO2024120941A1 (en) | 2022-12-09 | 2024-06-13 | Carl Zeiss Smt Gmbh | Mirror socket, optical system and projection exposure apparatus |
WO2024125829A1 (en) | 2022-12-13 | 2024-06-20 | Carl Zeiss Smt Gmbh | Method for producing a mirror of a microlithographic projection exposure apparatus |
US12117731B2 (en) | 2022-12-13 | 2024-10-15 | Carl Zeiss Smt Gmbh | Method for producing a mirror of a microlithographic projection exposure apparatus |
DE102022213681A1 (en) | 2022-12-15 | 2024-06-20 | Carl Zeiss Smt Gmbh | COOLING DEVICE FOR A LITHOGRAPHY SYSTEM |
WO2024126469A1 (en) | 2022-12-15 | 2024-06-20 | Carl Zeiss Smt Gmbh | Cooling device for a lithography system |
DE102022213810A1 (en) | 2022-12-16 | 2023-02-23 | Carl Zeiss Smt Gmbh | Method for monitoring a lens of a lithography system, optical device for a lithography system and lithography system |
WO2024126205A1 (en) | 2022-12-16 | 2024-06-20 | Carl Zeiss Smt Gmbh | Interferometer device for measuring a surface, method for interferometrically measuring a surface, and lithography system |
DE102023211387A1 (en) | 2022-12-16 | 2024-06-27 | Carl Zeiss Smt Gmbh | Method for monitoring a lens of a lithography system, optical device for a lithography system and lithography system |
DE102022213752A1 (en) | 2022-12-16 | 2023-02-09 | Carl Zeiss Smt Gmbh | Interferometer device for measuring a surface, method for interferometric measuring of a surface and lithography system |
DE102022213987A1 (en) | 2022-12-20 | 2023-12-14 | Carl Zeiss Smt Gmbh | Method for assembling an optical assembly, optical assembly and projection exposure system |
DE102022214184A1 (en) | 2022-12-21 | 2024-06-27 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
WO2024132352A1 (en) | 2022-12-21 | 2024-06-27 | Carl Zeiss Smt Gmbh | Optical system and projection exposure apparatus |
DE102023100393A1 (en) | 2023-01-10 | 2024-07-11 | Carl Zeiss Smt Gmbh | Mirror socket, optical system and projection exposure system |
DE102023200146A1 (en) | 2023-01-11 | 2023-03-09 | Carl Zeiss Smt Gmbh | METHOD AND ADJUSTMENT SYSTEM FOR ADJUSTING A POSITION OF A FACETED MIRROR OF A LITHOGRAPHY PLANT |
WO2024149822A1 (en) | 2023-01-12 | 2024-07-18 | Carl Zeiss Smt Gmbh | Optical system, lithography apparatus, and method for producing an optical system |
WO2024149823A1 (en) | 2023-01-12 | 2024-07-18 | Carl Zeiss Smt Gmbh | Optical system and lithography system |
DE102023200235A1 (en) | 2023-01-12 | 2024-07-18 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND LITHOGRAPHY SYSTEM |
DE102023200234A1 (en) | 2023-01-12 | 2024-07-18 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM, LITHOGRAPHY DEVICE AND METHOD FOR PRODUCING AN OPTICAL SYSTEM |
DE102023200329B3 (en) | 2023-01-17 | 2024-05-02 | Carl Zeiss Smt Gmbh | Optical assembly, method for assembling the optical assembly and projection exposure system |
DE102023200422A1 (en) | 2023-01-20 | 2024-07-25 | Carl Zeiss Smt Gmbh | Module for a projection exposure system, method and projection exposure system |
DE102023200423A1 (en) | 2023-01-20 | 2023-12-28 | Carl Zeiss Smt Gmbh | COOLING DEVICE FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR DAMPENING A PRESSURE Fluctuation of a LIQUID IN A LIQUID LINE OF A COOLING DEVICE OF A LITHOGRAPHY SYSTEM |
WO2024153656A1 (en) | 2023-01-20 | 2024-07-25 | Carl Zeiss Smt Gmbh | Module for a projection exposure apparatus, method, and projection exposure apparatus |
DE102023200933A1 (en) | 2023-02-06 | 2024-08-08 | Carl Zeiss Smt Gmbh | COOLING DEVICE FOR COOLING A POSITION-SENSITIVE COMPONENT OF A LITHOGRAPHY SYSTEM AND LITHOGRAPHY SYSTEM |
WO2024165318A1 (en) | 2023-02-07 | 2024-08-15 | Carl Zeiss Smt Gmbh | Optical element having a polishing layer, lithography apparatus comprising the optical element, and method for producing the optical element |
DE102023200970A1 (en) | 2023-02-07 | 2024-08-08 | Carl Zeiss Smt Gmbh | OPTICAL ELEMENT WITH POLISHED COATING |
DE102023210779A1 (en) | 2023-02-08 | 2024-08-08 | Carl Zeiss Smt Gmbh | Storage device for storing an optical module on a support frame |
DE102023201137A1 (en) | 2023-02-13 | 2024-01-11 | Carl Zeiss Smt Gmbh | Arrangement and method for protecting an adhesive connection |
DE102023201138A1 (en) | 2023-02-13 | 2024-08-14 | Carl Zeiss Smt Gmbh | SYSTEM WITH A LITHOGRAPHY DEVICE AND A NUMBER OF ELECTRONIC MODULES AND METHOD FOR OPERATING A SYSTEM |
WO2024170251A1 (en) | 2023-02-13 | 2024-08-22 | Carl Zeiss Smt Gmbh | System having a lithography apparatus and a number of electronics modules, and method for operating a system |
DE102023201315A1 (en) | 2023-02-16 | 2024-08-22 | Carl Zeiss Smt Gmbh | Mechatronic element, mirror, mirror arrangement and method for their manufacture |
WO2024170221A1 (en) | 2023-02-16 | 2024-08-22 | Carl Zeiss Smt Gmbh | Mechatronic element, mirror, mirror arrangement and method for production of same |
DE102023201546B3 (en) | 2023-02-22 | 2024-01-25 | Carl Zeiss Smt Gmbh | Method for decoating an optical surface, device for decoating an optical surface and lithography system |
DE102023201859A1 (en) | 2023-03-01 | 2024-09-05 | Carl Zeiss Smt Gmbh | OPTICAL ASSEMBLY, OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023201858A1 (en) | 2023-03-01 | 2024-09-05 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023201840A1 (en) | 2023-03-01 | 2024-02-22 | Carl Zeiss Smt Gmbh | Assembly for semiconductor technology and projection exposure system |
WO2024179820A1 (en) | 2023-03-01 | 2024-09-06 | Carl Zeiss Smt Gmbh | Optical system and projection exposure system |
WO2024179896A1 (en) | 2023-03-01 | 2024-09-06 | Carl Zeiss Smt Gmbh | Optical assembly, optical system and projection exposure apparatus |
DE102023201860A1 (en) | 2023-03-01 | 2023-04-20 | Carl Zeiss Smt Gmbh | Assembly and method of connecting two components |
DE102023202127A1 (en) | 2023-03-09 | 2024-09-12 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
WO2024188648A1 (en) | 2023-03-13 | 2024-09-19 | Carl Zeiss Smt Gmbh | Device and method for measuring a component, and lithography system |
DE102023202241A1 (en) | 2023-03-13 | 2024-09-19 | Carl Zeiss Smt Gmbh | Device and method for measuring a component and lithography system |
DE102023202493A1 (en) | 2023-03-21 | 2024-09-26 | Carl Zeiss Smt Gmbh | CONTROL DEVICE, OPTICAL SYSTEM, LITHOGRAPHY DEVICE AND METHOD |
WO2024194297A1 (en) | 2023-03-21 | 2024-09-26 | Carl Zeiss Smt Gmbh | Control device, optical system, lithography installation and method |
DE102024202011A1 (en) | 2023-03-23 | 2024-09-26 | Carl Zeiss Smt Gmbh | Device and method for removing a component bonded to a surface of an optical element of a lithography system; lithography system for semiconductor lithography |
DE102023203224A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging EUV optics for imaging an object field into an image field |
DE102023203225A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging EUV optics for imaging an object field into an image field |
DE102023203223A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging EUV optics for imaging an object field into an image field |
WO2024208851A2 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
WO2024208849A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
DE102023203205A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Method for producing a MEMS mirror array and MEMS mirror array |
WO2024208960A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Method for producing a mems mirror array, and mems mirror array |
WO2024208850A1 (en) | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Imaging euv optical unit for imaging an object field into an image field |
DE102023203339A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | LITHOGRAPHY SYSTEM AND METHOD FOR OPERATING A LITHOGRAPHY SYSTEM |
WO2024213535A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | Lithography system and method for operating a lithography system |
DE102023203338A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | LITHOGRAPHY SYSTEM AND METHOD FOR OPERATING A LITHOGRAPHY SYSTEM |
WO2024213622A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | Mems mirror, micromirror array and illumination system for a lithography system, lithography system, and method for producing a lithography system |
DE102023203337A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | MEMS MIRROR, MICROMIRROR ARRAY AND ILLUMINATION SYSTEM FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR PRODUCING A LITHOGRAPHY SYSTEM |
WO2024213632A1 (en) | 2023-04-13 | 2024-10-17 | Carl Zeiss Smt Gmbh | Lithography apparatus and method for operating a lithography apparatus |
DE102023210888A1 (en) | 2023-04-17 | 2024-10-17 | Carl Zeiss Smt Gmbh | Method for multiple exposure of an object using an illumination optics |
DE102024200575A1 (en) | 2023-04-17 | 2024-10-17 | Carl Zeiss Smt Gmbh | connector assembly |
DE102023203520A1 (en) | 2023-04-18 | 2024-10-24 | Carl Zeiss Smt Gmbh | projection exposure system |
DE102023203731A1 (en) | 2023-04-24 | 2024-10-24 | Carl Zeiss Smt Gmbh | Device and method for checking a component and lithography system |
WO2024223274A1 (en) | 2023-04-24 | 2024-10-31 | Carl Zeiss Smt Gmbh | Apparatus and method for checking a component, and lithography system |
DE102023203832A1 (en) | 2023-04-25 | 2024-04-04 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023203830A1 (en) | 2023-04-25 | 2024-03-28 | Carl Zeiss Smt Gmbh | SPACING DEVICE, OPTICAL SYSTEM, LITHOGRAPHY SYSTEM AND METHOD |
DE102024200212A1 (en) | 2023-04-25 | 2024-10-31 | Carl Zeiss Smt Gmbh | shielding element, optical system and projection exposure system |
DE102023203870A1 (en) | 2023-04-26 | 2024-10-31 | Carl Zeiss Smt Gmbh | BEARING DEVICE FOR A LITHOGRAPHY SYSTEM, LITHOGRAPHY SYSTEM AND METHOD FOR POSITIONING AN OPTICAL COMPONENT OF A LITHOGRAPHY SYSTEM |
DE102023203941A1 (en) | 2023-04-27 | 2024-10-31 | Carl Zeiss Smt Gmbh | Methods for post-processing and handling of MEMS chips |
DE102023203897A1 (en) | 2023-04-27 | 2024-04-04 | Carl Zeiss Smt Gmbh | METHOD FOR PRODUCING A COMPONENT OF A LITHOGRAPHY SYSTEM, COMPONENT AND LITHOGRAPHY SYSTEM |
WO2024223102A1 (en) | 2023-04-27 | 2024-10-31 | Carl Zeiss Smt Gmbh | Methods for post-processing and for handling of mems chips |
DE102023204394A1 (en) | 2023-05-11 | 2024-05-23 | Carl Zeiss Smt Gmbh | Method for minimizing pressure fluctuations and projection exposure system |
DE102023204481A1 (en) | 2023-05-12 | 2024-07-25 | Carl Zeiss Smt Gmbh | Method for automated defect characterization of optical elements |
DE102023205426A1 (en) | 2023-06-12 | 2024-05-29 | Carl Zeiss Smt Gmbh | Module with two joining partners for a projection exposure system for semiconductor lithography, projection exposure system and process |
DE102023205570A1 (en) | 2023-06-14 | 2024-06-27 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102024200324A1 (en) | 2023-06-15 | 2024-03-07 | Carl Zeiss Smt Gmbh | Component for semiconductor lithography, method for producing a joint body for a sensor of a lithography system and lithography system |
DE102023205587A1 (en) | 2023-06-15 | 2023-07-27 | Carl Zeiss Smt Gmbh | Device for semiconductor lithography, method for manufacturing a joint body for a sensor of a lithography system and lithography system |
DE102023116893A1 (en) | 2023-06-27 | 2024-07-04 | Carl Zeiss Smt Gmbh | Device and method for compensating pendulum forces |
DE102023116894A1 (en) | 2023-06-27 | 2024-07-18 | Carl Zeiss Smt Gmbh | Method for receiving an optical element, optical module and projection exposure system |
DE102023116896A1 (en) | 2023-06-27 | 2024-07-04 | Carl Zeiss Smt Gmbh | Method for improving the imaging properties of an optical module, control, optical module and projection exposure system |
DE102023206042A1 (en) | 2023-06-27 | 2024-08-01 | Carl Zeiss Smt Gmbh | Control device |
DE102023116898A1 (en) | 2023-06-27 | 2024-06-20 | Carl Zeiss Smt Gmbh | Optical module and projection exposure system |
DE102023116899A1 (en) | 2023-06-27 | 2024-06-27 | Carl Zeiss Smt Gmbh | Optical module and projection exposure system |
DE102023206344A1 (en) | 2023-07-04 | 2024-06-06 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023206428A1 (en) | 2023-07-06 | 2024-07-11 | Carl Zeiss Smt Gmbh | Apparatus and method for producing an optical element and lithography system |
DE102023206565A1 (en) | 2023-07-11 | 2024-05-29 | Carl Zeiss Smt Gmbh | WATER-BEARING SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023207629A1 (en) | 2023-08-09 | 2024-08-08 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023207630A1 (en) | 2023-08-09 | 2024-07-25 | Carl Zeiss Smt Gmbh | Optical assembly and projection exposure system |
DE102023208980A1 (en) | 2023-09-15 | 2024-08-01 | Carl Zeiss Smt Gmbh | MEMS micromirror unit and facet mirror |
DE102023209257A1 (en) | 2023-09-22 | 2024-09-26 | Carl Zeiss Smt Gmbh | OPTICAL SYSTEM AND PROJECTION EXPOSURE SYSTEM |
DE102023209608A1 (en) | 2023-09-29 | 2024-09-05 | Carl Zeiss Smt Gmbh | Projection exposure system with exchangeable modules comprising optical elements |
DE102023128365A1 (en) | 2023-10-17 | 2024-09-12 | Asml Netherlands B.V. | Method and control device for controlling a position of a substrate holder of a lithography system, positioning system and lithography system |
DE102023136592A1 (en) | 2023-12-22 | 2024-10-24 | Carl Zeiss Smt Gmbh | Optical element and projection exposure system |
DE102024200329A1 (en) | 2024-01-15 | 2024-05-08 | Carl Zeiss Smt Gmbh | Device and method for filtering a cooling lubricant, processing device and lithography system |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE102008009600A1 (en) | Facet mirror e.g. field facet mirror, for use as bundle-guiding optical component in illumination optics of projection exposure apparatus, has single mirror tiltable by actuators, where object field sections are smaller than object field | |
DE102011003928B4 (en) | Illumination optics for projection lithography | |
DE102006036064A1 (en) | Illumination system for a projection exposure apparatus with wavelengths ≦ 193 nm | |
DE102008001511A1 (en) | Illumination optics for EUV microlithography and illumination system and projection exposure apparatus with such illumination optics | |
DE10343333A1 (en) | Illumination system for microlithography projection exposure system, has mirror arrangement with array of individual mirrors that is controlled individually by changing angular distribution of light incident on mirror arrangement | |
DE102012204273B4 (en) | Illumination optics for EUV projection lithography | |
EP1499925A2 (en) | Lighting system, particularly for use in extreme ultraviolet (euv) lithography | |
DE10053587A1 (en) | Lighting system with variable adjustment of the illumination | |
WO1999057732A9 (en) | Lighting system, especially for extreme ultraviolet lithography | |
DE102012220597A1 (en) | Illumination optics for EUV projection lithography | |
DE102009032194A1 (en) | Optical mirror for reflection of radiation, has mirror substrate with multiple mirror elements, which represent sections of total-mirror surface separated by gaps | |
DE102012207866A1 (en) | Assembly for a projection exposure machine for EUV projection lithography | |
DE102013219057A1 (en) | Facet mirror for a projection exposure machine | |
DE29915847U1 (en) | Control of the lighting distribution in the exit pupil of an EUV lighting system | |
DE102012208064A1 (en) | Illumination optics for EUV projection lithography | |
DE102011082065A1 (en) | Field facet-mirror array for microlithography manufacturing of microchip, has total reflecting surface with two regions displaced against each other and forming diffraction structure for diffraction of radiation in preset wavelength range | |
DE102018214223A1 (en) | Pupil facet mirror | |
EP4179388A1 (en) | Optical illumination system for guiding euv radiation | |
DE102012201235B4 (en) | Method for setting a lighting geometry for a lighting optics for EUV projection lithography | |
DE102015224597A1 (en) | Field facet mirror for EUV projection lithography | |
DE102011006003A1 (en) | Illumination optics for use in extreme UV-projection exposure system to illuminate illuminating field in reticle plane for manufacturing microstructured component, has aperture diaphragm adapting main beam direction relative to field | |
DE102012213937A1 (en) | Mirror exchange array of set structure for illumination optics used in e.g. scanner for performing microlithography, has single mirrors of mirror exchange array unit that are set with high reflecting coating portion | |
DE102018201457A1 (en) | Illumination optics for projection lithography | |
DE102013218749A1 (en) | Illumination system and illumination optics for EUV projection lithography | |
DE102016201317A1 (en) | Illumination optics for EUV projection lithography |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ON | Later submitted papers | ||
OP8 | Request for examination as to paragraph 44 patent law | ||
8127 | New person/name/address of the applicant |
Owner name: CARL ZEISS SMT GMBH, 73447 OBERKOCHEN, DE |
|
R002 | Refusal decision in examination/registration proceedings | ||
R003 | Refusal decision now final |
Effective date: 20120915 |