CN116203342B - Temperature control method for device testing process based on high-low temperature experiment box - Google Patents

Temperature control method for device testing process based on high-low temperature experiment box Download PDF

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CN116203342B
CN116203342B CN202310470806.6A CN202310470806A CN116203342B CN 116203342 B CN116203342 B CN 116203342B CN 202310470806 A CN202310470806 A CN 202310470806A CN 116203342 B CN116203342 B CN 116203342B
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temperature
temperature value
secondary adjustment
data
experiment box
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CN116203342A (en
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虞从军
李明聪
蒋旭
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Chengdu Cavt Technology Co ltd
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Chengdu Cavt Technology Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/003—Environmental or reliability tests
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature

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Abstract

The invention provides a temperature control method based on a device testing process of a high-low temperature experiment box, and relates to the technical field of device testing.

Description

Temperature control method for device testing process based on high-low temperature experiment box
Technical Field
The invention relates to the technical field of device testing, in particular to a temperature control method for a device testing process based on a high-low temperature experiment box.
Background
After the device is produced, high and low temperature experiments are required to eliminate bad devices. During high and low temperature experiments, the device is placed into a high and low temperature experiment box for high temperature or low temperature environment test, and an unstable device can be damaged in the high temperature or low temperature environment test, so that the damaged device is eliminated. However, due to the special material of the device, the material of the device can be damaged when the temperature is too high or too low, so that the waste of the device is caused.
Disclosure of Invention
Aiming at the defects in the prior art, the temperature control method for the device testing process based on the high-low temperature experimental box solves the problem of unstable temperature in the high-low temperature experimental box.
In order to achieve the aim of the invention, the invention adopts the following technical scheme: a temperature control method for a device testing process based on a high-low temperature experimental box, comprising the following steps:
placing the device into a high-low temperature experiment box, collecting current temperature data of the high-low temperature experiment box, and calculating a current temperature value;
setting a target temperature value of a high-low temperature experiment box;
during high-temperature experiments, driving heating equipment in a high-temperature experiment box and a low-temperature experiment box to heat based on the current temperature value and the target temperature value;
during low-temperature experiments, driving refrigeration equipment in a high-low temperature experiment box to perform refrigeration based on the current temperature value and the target temperature value;
and when the current temperature value is equal to the target temperature value, the refrigerating equipment or the heating equipment is stably controlled based on the temperature control model.
Further, the calculating the current temperature value includes:
denoising the current temperature data to obtain denoised data;
and calculating the current temperature value according to the denoising data.
Further, the denoising formula is:
Figure SMS_1
wherein,,
Figure SMS_2
is->
Figure SMS_7
Noise-removed data->
Figure SMS_11
Is->
Figure SMS_4
Noise-removed data->
Figure SMS_6
Is->
Figure SMS_9
Noise-removed data->
Figure SMS_12
Is->
Figure SMS_3
Noise-removed data->
Figure SMS_5
For the amount of denoising data, +.>
Figure SMS_8
Is->
Figure SMS_10
And temperature data.
The beneficial effects of the above further scheme are: the invention uses the denoising data
Figure SMS_15
As the basis of denoising, due to->
Figure SMS_18
Is denoised data and belongs to the data just denoised, therefore, it is +.>
Figure SMS_21
Are similar in data value, according to the proximity +.>
Figure SMS_16
Predicting the change condition of the next data under the data change condition of the denoising data, reducing the noise influence, improving the temperature acquisition precision, facilitating the accurate control of the temperature in the high-low temperature experimental box, and adding the noise into the temperature data>
Figure SMS_20
Is greater than->
Figure SMS_22
When (I)>
Figure SMS_24
Compared with
Figure SMS_14
Growth, in temperature data->
Figure SMS_17
Less than->
Figure SMS_19
When (I)>
Figure SMS_23
Comparison with each otherIn->
Figure SMS_13
And (3) reducing.
Further, the formula for calculating the current temperature value is:
Figure SMS_25
wherein,,
Figure SMS_26
is->
Figure SMS_27
Temperature value->
Figure SMS_28
For the temperature sensor coefficient, < >>
Figure SMS_29
For correction factor +.>
Figure SMS_30
Is->
Figure SMS_31
And denoising the data.
Further, in the high temperature experiment, driving the heating device in the high and low temperature experiment box to heat based on the current temperature value and the target temperature value comprises the following steps:
calculating the difference between the target temperature value and the current temperature value to obtain a first temperature difference
Figure SMS_32
：
Figure SMS_33
Wherein,,
Figure SMS_34
for the target temperature value, < >>
Figure SMS_35
Is->
Figure SMS_36
A plurality of temperature values;
according to a first temperature difference
Figure SMS_37
And driving a heating device in the high-low temperature experiment box to heat based on the first electric power driving model.
Further, the first electric power driving model is:
Figure SMS_38
wherein,,
Figure SMS_40
for the electric power of the heating device, +.>
Figure SMS_44
For the initial electrical power of the heating device, +.>
Figure SMS_45
For the first temperature difference,
Figure SMS_39
for heating time->
Figure SMS_43
For heating correction factor, +.>
Figure SMS_46
For heating compensation coefficient +.>
Figure SMS_47
As hyperbolic tangent function, +.>
Figure SMS_41
As a logarithmic function>
Figure SMS_42
Is natural logarithm.
Further, during the low temperature experiment, based on the current temperature value and the target temperature value, driving the refrigeration equipment in the high and low temperature experiment box to perform refrigeration comprises:
calculating the difference between the target temperature value and the current temperature value to obtain a second temperature difference
Figure SMS_48
：
Figure SMS_49
Wherein,,
Figure SMS_50
for the target temperature value, < >>
Figure SMS_51
Is->
Figure SMS_52
A plurality of temperature values;
according to the second temperature difference
Figure SMS_53
And driving the refrigeration equipment in the high-low temperature experiment box to perform refrigeration based on the second electric power driving model.
Further, the second electric power driving model is:
Figure SMS_54
wherein,,
Figure SMS_56
for the electric power of the refrigerating device, +.>
Figure SMS_60
For the initial electrical power of the refrigeration appliance, +.>
Figure SMS_62
For the second temperature difference, the temperature difference is the second temperature difference,
Figure SMS_57
for the refrigerating time +.>
Figure SMS_59
For the refrigeration correction factor>
Figure SMS_61
For the refrigeration compensation coefficient>
Figure SMS_63
As hyperbolic tangent function, +.>
Figure SMS_55
As a logarithmic function>
Figure SMS_58
Is natural logarithm.
The beneficial effects of the above further scheme are: when the temperature difference is larger, the electric power is higher, the heating and refrigerating speeds are high, but along with the extension of the refrigerating time or the heating time, the temperature gradually approaches to the target temperature, and the electric power is gradually reduced, so that the temperature in the high-low temperature experiment box is not too low or too high, and the temperature is prevented from exceeding the bearing range of the device materials, thereby playing a role in protecting the device.
Further, the temperature control model is:
Figure SMS_64
Figure SMS_65
Figure SMS_66
wherein,,
Figure SMS_92
is->
Figure SMS_102
First buffer memory for secondary adjustment>
Figure SMS_105
For the first scale factor, +>
Figure SMS_72
As a first integral coefficient of the first-order,
Figure SMS_76
for the first differential coefficient->
Figure SMS_81
For the first differential part->
Figure SMS_88
Is->
Figure SMS_82
The temperature difference in secondary adjustment is the difference between the target temperature value and the real-time temperature value, ++>
Figure SMS_85
Is->
Figure SMS_90
Third buffer memory during secondary adjustment>
Figure SMS_93
Is->
Figure SMS_94
Temperature difference during secondary adjustment, ++>
Figure SMS_97
Is->
Figure SMS_98
Third buffer memory during secondary adjustment>
Figure SMS_101
Is->
Figure SMS_80
Second buffer for secondary adjustment,>
Figure SMS_84
for the first adjustment factor, +>
Figure SMS_86
For the second adjustment factor, +>
Figure SMS_89
Is->
Figure SMS_67
Second buffer for secondary adjustment,>
Figure SMS_70
for the second proportionality coefficient, +>
Figure SMS_74
For the second integral coefficient, +.>
Figure SMS_77
For the second differential coefficient->
Figure SMS_91
For the second differential part->
Figure SMS_95
Is->
Figure SMS_104
First buffer memory for secondary adjustment>
Figure SMS_106
Is->
Figure SMS_96
Second buffer for secondary adjustment,>
Figure SMS_99
is->
Figure SMS_100
Third in secondary adjustmentCache (S)/(S)>
Figure SMS_103
Is->
Figure SMS_69
Electric power of executing mechanism in high-low temperature experiment box during secondary adjustment, < >>
Figure SMS_79
Is->
Figure SMS_83
First buffer memory for secondary adjustment>
Figure SMS_87
Is->
Figure SMS_71
Second buffer for secondary adjustment,>
Figure SMS_73
is->
Figure SMS_75
Third buffer memory during secondary adjustment>
Figure SMS_78
Is->
Figure SMS_68
Temperature difference at the time of secondary adjustment.
The beneficial effects of the above further scheme are: the invention sets three parts of buffer, weighting, integrating and differentiating operation is carried out in different stages, and the second buffer is considered
Figure SMS_107
Is considered in its entirety->
Figure SMS_108
And (3) the stability of the model is enhanced.
The technical scheme of the embodiment of the invention has at least the following advantages and beneficial effects: according to the invention, the current temperature value is determined by collecting the current temperature data of the high-low temperature experiment box, the heating equipment is driven to heat during high-temperature experiments, the refrigerating equipment is driven to refrigerate during low-temperature experiments, and after the temperature reaches the target temperature, the refrigerating equipment or the heating equipment is stably controlled through the temperature control model, so that the temperature in the high-low temperature experiment box is stable.
Drawings
Fig. 1 is a flow chart of a temperature control method of a device testing process based on a high and low temperature laboratory box.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
As shown in fig. 1, a temperature control method for a device testing process based on a high-low temperature experimental box comprises the following steps:
s1, placing the device into a high-low temperature experiment box, collecting current temperature data of the high-low temperature experiment box, and calculating a current temperature value;
in S1, calculating the current temperature value includes:
denoising the current temperature data to obtain denoised data;
and calculating the current temperature value according to the denoising data.
The denoising formula is as follows:
Figure SMS_109
wherein,,
Figure SMS_111
is->
Figure SMS_114
Noise-removed data->
Figure SMS_116
Is->
Figure SMS_112
Noise-removed data->
Figure SMS_113
Is->
Figure SMS_118
Noise-removed data->
Figure SMS_119
Is->
Figure SMS_110
Noise-removed data->
Figure SMS_115
For the amount of denoising data, +.>
Figure SMS_117
Is->
Figure SMS_120
And temperature data.
The invention uses the denoising data
Figure SMS_124
As the basis of denoising, due to->
Figure SMS_125
Is denoised data and belongs to the data just denoised, therefore, it is +.>
Figure SMS_129
Are similar in data value, according to the proximity +.>
Figure SMS_121
Predicting the change condition of next data according to the data change condition of each denoising data, reducing the influence of noise and improving the temperatureThe acquisition precision is convenient for accurately controlling the temperature in the high-low temperature experiment box, and the temperature data is +.>
Figure SMS_126
Is greater than->
Figure SMS_128
When (I)>
Figure SMS_131
Compared with->
Figure SMS_123
Growth, in temperature data->
Figure SMS_127
Less than->
Figure SMS_130
When (I)>
Figure SMS_132
Compared with->
Figure SMS_122
And (3) reducing.
The formula for calculating the current temperature value is as follows:
Figure SMS_133
wherein,,
Figure SMS_134
is->
Figure SMS_135
Temperature value->
Figure SMS_136
For the temperature sensor coefficient, < >>
Figure SMS_137
For correction factor +.>
Figure SMS_138
Is->
Figure SMS_139
And denoising the data.
S2, setting a target temperature value of a high-low temperature experiment box;
s3, during high-temperature experiments, driving heating equipment in the high-temperature and low-temperature experiment box to heat based on the current temperature value and the target temperature value;
the step S3 comprises the following steps:
calculating the difference between the target temperature value and the current temperature value to obtain a first temperature difference
Figure SMS_140
：
Figure SMS_141
Wherein,,
Figure SMS_142
for the target temperature value, < >>
Figure SMS_143
Is->
Figure SMS_144
A plurality of temperature values;
according to a first temperature difference
Figure SMS_145
And driving a heating device in the high-low temperature experiment box to heat based on the first electric power driving model.
The first electric power driving model is as follows:
Figure SMS_146
wherein,,
Figure SMS_148
for the purpose of heating the electrical power of the device,/>
Figure SMS_150
for the initial electrical power of the heating device, +.>
Figure SMS_153
For the first temperature difference,
Figure SMS_149
for heating time->
Figure SMS_152
For heating correction factor, +.>
Figure SMS_154
For heating compensation coefficient +.>
Figure SMS_155
As hyperbolic tangent function, +.>
Figure SMS_147
As a logarithmic function>
Figure SMS_151
Is natural logarithm.
S4, during the low-temperature experiment, driving refrigeration equipment in the high-temperature and low-temperature experiment box to refrigerate based on the current temperature value and the target temperature value;
at S4, it includes: calculating the difference between the target temperature value and the current temperature value to obtain a second temperature difference
Figure SMS_156
：
Figure SMS_157
Wherein,,
Figure SMS_158
for the target temperature value, < >>
Figure SMS_159
Is->
Figure SMS_160
A plurality of temperature values;
according to the second temperature difference
Figure SMS_161
And driving the refrigeration equipment in the high-low temperature experiment box to perform refrigeration based on the second electric power driving model.
The second electric power driving model is as follows:
Figure SMS_162
wherein,,
Figure SMS_164
for the electric power of the refrigerating device, +.>
Figure SMS_166
For the initial electrical power of the refrigeration appliance, +.>
Figure SMS_169
For the second temperature difference, the temperature difference is the second temperature difference,
Figure SMS_165
for the refrigerating time +.>
Figure SMS_168
For the refrigeration correction factor>
Figure SMS_170
For the refrigeration compensation coefficient>
Figure SMS_171
As hyperbolic tangent function, +.>
Figure SMS_163
As a logarithmic function>
Figure SMS_167
Is natural logarithm.
When the temperature difference is larger, the electric power is higher, the heating and refrigerating speeds are high, but along with the extension of the refrigerating time or the heating time, the temperature gradually approaches to the target temperature, and the electric power is gradually reduced, so that the temperature in the high-low temperature experiment box is not too low or too high, and the temperature is prevented from exceeding the bearing range of the device materials, thereby playing a role in protecting the device.
And when the current temperature value reaches or exceeds the target temperature value, stably controlling the refrigeration equipment or the heating equipment by adopting the technical scheme of S5.
And S5, stably controlling the refrigerating equipment or the heating equipment based on the temperature control model when the current temperature value is equal to the target temperature value.
In the present embodiment, at the time of the high temperature experiment, the heating apparatus is stably controlled based on the temperature control model in S5. In the low-temperature experiment, in S5, the refrigeration equipment is stably controlled based on the temperature control model.
The temperature control model is as follows:
Figure SMS_172
Figure SMS_173
Figure SMS_174
wherein,,
Figure SMS_190
is->
Figure SMS_192
First buffer memory for secondary adjustment>
Figure SMS_194
For the first scale factor, +>
Figure SMS_177
Is the firstAn integral coefficient is used to determine the integral of the first component,
Figure SMS_180
for the first differential coefficient->
Figure SMS_183
For the first differential part->
Figure SMS_186
Is->
Figure SMS_178
The temperature difference in secondary adjustment is the difference between the target temperature value and the real-time temperature value, ++>
Figure SMS_181
Is->
Figure SMS_188
Third buffer memory during secondary adjustment>
Figure SMS_195
Is->
Figure SMS_200
Temperature difference during secondary adjustment, ++>
Figure SMS_204
Is->
Figure SMS_208
Third buffer memory during secondary adjustment>
Figure SMS_210
Is->
Figure SMS_189
Second buffer for secondary adjustment,>
Figure SMS_191
for the first adjustment factor, +>
Figure SMS_193
For the second adjustment factor, +>
Figure SMS_197
Is->
Figure SMS_175
Second buffer for secondary adjustment,>
Figure SMS_179
for the second proportionality coefficient, +>
Figure SMS_184
For the second integral coefficient, +.>
Figure SMS_187
For the second differential coefficient->
Figure SMS_196
For the second differential part->
Figure SMS_199
Is->
Figure SMS_202
First buffer memory for secondary adjustment>
Figure SMS_207
Is->
Figure SMS_201
Second buffer for secondary adjustment,>
Figure SMS_203
is->
Figure SMS_206
Third buffer memory during secondary adjustment>
Figure SMS_211
Is->
Figure SMS_182
Electric power of executing mechanism in high-low temperature experiment box during secondary adjustment, < >>
Figure SMS_185
Is->
Figure SMS_198
First buffer memory for secondary adjustment>
Figure SMS_205
Is->
Figure SMS_209
Second buffer for secondary adjustment,>
Figure SMS_212
is->
Figure SMS_213
Third buffer memory during secondary adjustment>
Figure SMS_214
Is->
Figure SMS_176
Temperature difference at the time of secondary adjustment.
The actuator comprises: refrigeration equipment and heating equipment.
The invention sets three parts of buffer, weighting, integrating and differentiating operation is carried out in different stages, and the second buffer is considered
Figure SMS_215
Is considered in its entirety->
Figure SMS_216
And (3) the stability of the model is enhanced.
The technical scheme of the embodiment of the invention has at least the following advantages and beneficial effects: according to the invention, the current temperature value is determined by collecting the current temperature data of the high-low temperature experiment box, the heating equipment is driven to heat during high-temperature experiments, the refrigerating equipment is driven to refrigerate during low-temperature experiments, and after the temperature reaches the target temperature, the refrigerating equipment or the heating equipment is stably controlled through the temperature control model, so that the temperature in the high-low temperature experiment box is stable.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (4)

1. The temperature control method for the device testing process based on the high-low temperature experiment box is characterized by comprising the following steps of:
placing the device into a high-low temperature experiment box, collecting current temperature data of the high-low temperature experiment box, and calculating a current temperature value;
setting a target temperature value of a high-low temperature experiment box;
during high-temperature experiments, driving heating equipment in a high-temperature experiment box and a low-temperature experiment box to heat based on the current temperature value and the target temperature value;
during low-temperature experiments, driving refrigeration equipment in a high-low temperature experiment box to perform refrigeration based on the current temperature value and the target temperature value;
when the current temperature value is equal to the target temperature value, based on a temperature control model, performing stable control on the refrigeration equipment or the heating equipment;
during the high temperature experiment, based on the current temperature value and the target temperature value, driving the heating equipment in the high and low temperature experiment box to heat comprises the following steps:
calculating the difference between the target temperature value and the current temperature value to obtain a first temperature difference
Figure QLYQS_1
：
Figure QLYQS_2
Wherein,,
Figure QLYQS_3
for the target temperature value, < >>
Figure QLYQS_4
Is->
Figure QLYQS_5
A plurality of temperature values;
according to a first temperature difference
Figure QLYQS_6
Driving heating equipment in the high-low temperature experiment box to heat based on the first electric power driving model;
the first electric power driving model is as follows:
Figure QLYQS_7
wherein,,
Figure QLYQS_9
for the electric power of the heating device, +.>
Figure QLYQS_13
For the initial electrical power of the heating device, +.>
Figure QLYQS_14
For the first temperature difference, +.>
Figure QLYQS_10
For heating time->
Figure QLYQS_12
For heating correction factor, +.>
Figure QLYQS_15
For heating compensation coefficient +.>
Figure QLYQS_16
As hyperbolic tangent function, +.>
Figure QLYQS_8
As a logarithmic function>
Figure QLYQS_11
Is natural logarithm;
during the low temperature experiment, based on the current temperature value and the target temperature value, driving the refrigeration equipment in the high-low temperature experiment box to refrigerate comprises:
calculating the difference between the target temperature value and the current temperature value to obtain a second temperature difference
Figure QLYQS_17
：
Figure QLYQS_18
Wherein,,
Figure QLYQS_19
for the target temperature value, < >>
Figure QLYQS_20
Is->
Figure QLYQS_21
A plurality of temperature values;
according to the second temperature difference
Figure QLYQS_22
Based on the second electric power driving model, driving refrigeration equipment in the high-low temperature experiment box to refrigerate;
the second electric power driving model is as follows:
Figure QLYQS_23
wherein,,
Figure QLYQS_25
for the electric power of the refrigerating device, +.>
Figure QLYQS_28
For the initial electrical power of the refrigeration appliance, +.>
Figure QLYQS_30
For the second temperature difference, +.>
Figure QLYQS_26
For the refrigerating time +.>
Figure QLYQS_29
For the refrigeration correction factor>
Figure QLYQS_31
For the refrigeration compensation coefficient>
Figure QLYQS_32
As hyperbolic tangent function, +.>
Figure QLYQS_24
As a logarithmic function>
Figure QLYQS_27
Is natural logarithm;
the temperature control model is as follows:
Figure QLYQS_33
Figure QLYQS_34
Figure QLYQS_35
wherein,,
Figure QLYQS_49
is->
Figure QLYQS_51
First buffer memory for secondary adjustment>
Figure QLYQS_54
For the first scale factor, +>
Figure QLYQS_37
For the first integral coefficient, +.>
Figure QLYQS_40
For the first differential coefficient->
Figure QLYQS_41
For the first differential part->
Figure QLYQS_45
Is->
Figure QLYQS_38
The temperature difference in secondary adjustment is the difference between the target temperature value and the real-time temperature value, ++>
Figure QLYQS_42
Is->
Figure QLYQS_46
Third buffer memory during secondary adjustment>
Figure QLYQS_48
Is->
Figure QLYQS_53
The temperature difference during the secondary adjustment is equal to the temperature difference,
Figure QLYQS_57
is->
Figure QLYQS_60
Third buffer memory during secondary adjustment>
Figure QLYQS_64
Is->
Figure QLYQS_55
Second buffer for secondary adjustment,>
Figure QLYQS_58
for the first adjustment factor, +>
Figure QLYQS_62
For the second adjustment factor, +>
Figure QLYQS_71
Is->
Figure QLYQS_36
Second buffer for secondary adjustment,>
Figure QLYQS_44
as a second scaling factor, the first scaling factor,
Figure QLYQS_47
for the second integral coefficient, +.>
Figure QLYQS_52
For the second differential coefficient->
Figure QLYQS_61
For the second differential part->
Figure QLYQS_63
Is->
Figure QLYQS_65
First buffer memory for secondary adjustment>
Figure QLYQS_67
Is->
Figure QLYQS_66
Second buffer for secondary adjustment,>
Figure QLYQS_68
is->
Figure QLYQS_69
A third buffer memory for the secondary adjustment,
Figure QLYQS_70
is->
Figure QLYQS_43
Electric power of executing mechanism in high-low temperature experiment box during secondary adjustment, < >>
Figure QLYQS_50
Is->
Figure QLYQS_56
The first buffer memory is used for the secondary adjustment,
Figure QLYQS_59
is->
Figure QLYQS_72
Second buffer for secondary adjustment,>
Figure QLYQS_73
is->
Figure QLYQS_74
Third buffer memory during secondary adjustment>
Figure QLYQS_75
Is->
Figure QLYQS_39
Temperature difference at the time of secondary adjustment.
2. The method for controlling the temperature of a high and low temperature laboratory box-based device testing process according to claim 1, wherein said calculating a current temperature value comprises:
denoising the current temperature data to obtain denoised data;
and calculating the current temperature value according to the denoising data.
3. The temperature control method for the device testing process based on the high-low temperature experimental box according to claim 2, wherein the denoising formula is as follows:
Figure QLYQS_76
wherein,,
Figure QLYQS_78
is->
Figure QLYQS_83
Noise-removed data->
Figure QLYQS_85
Is->
Figure QLYQS_79
Noise-removed data->
Figure QLYQS_80
Is->
Figure QLYQS_82
The number of data to be denoised is determined,
Figure QLYQS_86
is->
Figure QLYQS_77
Noise-removed data->
Figure QLYQS_81
For the amount of denoising data, +.>
Figure QLYQS_84
Is->
Figure QLYQS_87
And temperature data.
4. The temperature control method for the device testing process based on the high and low temperature laboratory box according to claim 2, wherein the formula for calculating the current temperature value is:
Figure QLYQS_88
wherein,,
Figure QLYQS_89
is->
Figure QLYQS_90
Temperature value->
Figure QLYQS_91
For the temperature sensor coefficient, < >>
Figure QLYQS_92
For correction factor +.>
Figure QLYQS_93
Is->
Figure QLYQS_94
And denoising the data.
CN202310470806.6A 2023-04-27 2023-04-27 Temperature control method for device testing process based on high-low temperature experiment box Active CN116203342B (en)

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Denomination of invention: A Temperature Control Method for Device Testing Process Based on High and Low Temperature Experimental Boxes

Granted publication date: 20230707

Pledgee: China Minsheng Banking Corp Chengdu branch

Pledgor: CHENGDU CAVT TECHNOLOGY CO.,LTD.

Registration number: Y2024980015593