CN112595659A - Temperature impact test box capable of realizing instantaneous change of high and low temperatures - Google Patents

Temperature impact test box capable of realizing instantaneous change of high and low temperatures Download PDF

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Publication number
CN112595659A
CN112595659A CN202011570918.1A CN202011570918A CN112595659A CN 112595659 A CN112595659 A CN 112595659A CN 202011570918 A CN202011570918 A CN 202011570918A CN 112595659 A CN112595659 A CN 112595659A
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temperature impact
temperature
low
emitting device
nitrogen
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CN202011570918.1A
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万峰
申屠献忠
董宁
白洪海
戴煦
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Shanghai Hua Mark Mark Detection Technology Co ltd
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Shanghai Hua Mark Mark Detection Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00Investigating resistance of materials to the weather, to corrosion, or to light
    • G01N17/002Test chambers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means

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  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Ecology (AREA)
  • Environmental Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

The invention discloses a temperature impact test box capable of realizing high and low temperature instantaneous change, which comprises: the box body comprises a side box body and a test box, the side box body is arranged on one side wall of the test box, and an airflow circulating channel is arranged between the side box body and the test box; the temperature impact test device comprises a sample fixing device, a high-temperature impact device and a low-temperature impact device, wherein the high-temperature impact device and the low-temperature impact device can carry out high-temperature impact or low-temperature impact on a sample placed on the sample fixing device. The invention relates to a temperature impact test box capable of realizing high and low temperature instantaneous change, which greatly shortens the test time and reduces the test energy consumption.

Description

Temperature impact test box capable of realizing instantaneous change of high and low temperatures
Technical Field
The invention relates to the technical field of high-low temperature impact test equipment, in particular to a temperature impact test box capable of realizing high-low temperature instantaneous change.
Background
In addition to the increasing requirements of products in the electronic industry on quality, the requirements are that a laboratory must completely and truly simulate the actual use condition of the products, even tests performed under the power-on condition, such as lithium leakage tests, but in the test process, certain risks are often accompanied, for example, a sample cannot endure extreme temperature due to materials, and meanwhile, the sample has a certain calorific value, so that the comprehensive effect accelerates the aging of sample insulation, combustion may be generated due to the overhigh local temperature, the test products are completely scrapped, and even a test box is burnt, so that a fire hazard is caused. The existing high-low temperature test chamber can control the humidity, the air pressure and the temperature so as to simulate the test environment. For humidity control, a heater, an evaporator and an air circulation device are generally used to increase or decrease the humidity in the air, but for some products, rain tests are required, and the test box cannot simulate the required conditions.
At present, in the high-low temperature impact test box in the prior art, most of common high-low temperature test boxes are divided into a high-temperature generating device, a low-temperature generating device and a test box body, and alternating high-low temperature impact is carried out on samples placed in the test box body through the high-temperature generating device and the low-temperature generating device in turn.
The high-low temperature impact test box in the prior art needs to quickly adjust the temperature of the whole test box body, and in the adjusting process, the temperature change needs to pass through a slower process, so that the test time is long, and the waste of a large amount of energy is caused because the space of the whole box body is large.
Therefore, a temperature impact test box capable of realizing high and low temperature transient changes, which greatly shortens the test time and reduces the test energy consumption, is needed.
Disclosure of Invention
The invention aims to provide a temperature impact test box capable of realizing high and low temperature instantaneous change, which greatly shortens the test time and reduces the test energy consumption.
In order to achieve the purpose, the technical scheme provided by the invention is as follows: the utility model provides a can realize temperature shock test case of high low temperature transient variation, includes:
the box body comprises a side box body and a test box, the side box body is arranged on one side wall of the test box, and an airflow circulating channel is arranged between the side box body and the test box;
the temperature impact test device comprises a sample fixing device, a high-temperature impact device and a low-temperature impact device, wherein the high-temperature impact device and the low-temperature impact device can carry out high-temperature impact or low-temperature impact on a sample placed on the sample fixing device.
The high-temperature impact device and the low-temperature impact device can perform high-temperature impact or low-temperature impact on the sample placed on the sample fixing device in turn.
The high-temperature impact device is a laser emitting device with adjustable power.
The low-temperature impact device is a nitrogen emission device with adjustable flow.
The sample fixing device is further connected with a driving device, the driving device drives the sample fixing device to rotate, grooves which are arranged in a circumferential mode are distributed in the sample fixing device, and samples are fixed in the grooves.
The laser emitting device and the nitrogen emitting device are arranged above the sample fixing device and are opposite to the groove, and the laser emitting device and the nitrogen emitting device can respectively carry out laser heating or nitrogen refrigeration on the sample placed in the groove.
The driving device includes: the motor control system comprises an upper computer, a PLC (programmable logic controller), a frequency converter and a motor which are sequentially connected, wherein the upper computer is provided with a man-machine operation interface, the man-machine operation interface is used for inputting working parameters and transmitting control instructions to the PLC through the upper computer, and the PLC is used for controlling the starting, stopping and rotating speed of the motor through the frequency converter.
Still including being used for installing laser emission device and nitrogen gas emitter's fixed plate, laser emission device and nitrogen gas emitter install in the lower surface of fixed plate still includes the liquid nitrogen pipeline, and the liquid nitrogen pipeline is laid the upper surface of fixed plate, and one end is connected with outside liquid nitrogen air supply, the other end with nitrogen gas emitter connects.
The laser emitting devices and the nitrogen emitting devices are circumferentially arranged on the lower surface of the fixing plate, and each groove is aligned with one laser emitting device or one nitrogen emitting device.
The temperature sensor is also connected with a data acquisition card and is connected to a computer through the data acquisition card, and the computer acquires temperature change information in the groove through the data acquisition card.
Compared with the prior art, the temperature impact test box capable of realizing the instantaneous change of high and low temperatures comprises the temperature impact test device, the temperature impact test device comprises a high-temperature impact device and a low-temperature impact device, and the high-temperature impact device and the low-temperature impact device can perform high-temperature impact or low-temperature impact on a sample placed on the sample fixing device. According to the invention, alternating high-temperature and low-temperature impact can be rapidly carried out on the sample fixed in the groove through the high-temperature impact device and the low-temperature impact device, the impact temperature can be changed instantly or slowly, different test requirements are met, instant high temperature or low temperature can be really realized, the temperature in the whole test box does not need to be subjected to cold-hot alternation, the energy consumption can be greatly reduced, and the test time can be greatly shortened.
The invention will become more apparent from the following description when taken in conjunction with the accompanying drawings, which illustrate embodiments of the invention.
Drawings
Fig. 1 is a schematic cross-sectional view of an embodiment of a temperature impact test chamber capable of achieving transient variations of high and low temperatures according to the present invention.
Fig. 2 is a schematic view of a sample fixing device of the temperature impact test chamber capable of realizing the transient variation of high and low temperatures shown in fig. 1.
Fig. 3 is a schematic block circuit diagram of the driving apparatus.
Fig. 4 is a schematic block diagram of a temperature acquisition circuit.
Detailed Description
Embodiments of the present invention will now be described with reference to the drawings, wherein like element numerals represent like elements. As described above, referring to fig. 1, 2, and 3, the present invention provides a temperature impact test chamber 100 capable of realizing instantaneous changes of high and low temperatures, including:
the box body 1 comprises a side box body 2 and a test box 3, wherein the side box body 2 is arranged on one side wall of the test box 3, and an airflow circulating channel is arranged between the side box body 2 and the test box 3; specifically, the gas in the test chamber 3 can be temperature-regulated through the side chamber body 2, and the temperature-regulated gas returns to the test chamber 3 again, more specifically, a heater 21 and an evaporator 22 can be arranged in the side chamber body 2, the heater 21 plays a heating role, the evaporator 22 plays a cooling role, and the heater 21 or the evaporator 22 can be selected to work according to the test requirement, so as to regulate the test environment temperature in the test chamber 3. Or the gas inside the test chamber 3 may circulate with the outside air through the side chamber body 2, and an external high-temperature gas or low-temperature gas may be introduced, or the pressure inside the test chamber 3 may be adjusted.
Referring to fig. 1, a temperature impact test apparatus 4, the temperature impact test apparatus 4 includes a sample fixing apparatus 41, a high temperature impact apparatus 42, and a low temperature impact apparatus 43, and the high temperature impact apparatus 42 and the low temperature impact apparatus 43 may perform high temperature impact or low temperature impact on a sample placed on the sample fixing apparatus 41. As shown in fig. 1, the temperature impact test device 4 is disposed inside the test chamber 3, so that the temperature impact test device 4 can be isolated from the outside during operation, an independent and adjustable test atmosphere can be created for the temperature impact test device 4, and cross contamination with the external environment is avoided.
In one embodiment, the high temperature impact device 42 and the low temperature impact device 43 can perform high temperature impact or low temperature impact on the sample placed on the sample fixing device 41 in turn. Specifically, for the sample on the same sample fixing device 41, the high temperature impact device 42 and the low temperature impact device 43 can impact alternately, the time interval for switching the high temperature impact device 42 or the low temperature impact device 43 can be performed in a very short time, or can be performed in a longer time, the time interval is freely controlled, and the output power of the high temperature impact device 42 and the output power of the low temperature impact device 43 can be adjusted. In one embodiment, the high temperature impact device 42 is a laser emitting device with adjustable power. The laser emitting device has the advantages of being concentrated in energy, good in directivity and capable of reducing interference on irrelevant targets as far as possible, in addition, due to the fact that the power of the laser emitting device is adjustable, the temperature range generated by the laser emitting device is wide, the temperature generated by laser is easy to reach ten thousand degrees centigrade, most tests only need a few hundred degrees of high temperature, the high temperature generated by the laser emitting device can meet all high temperature test requirements, and in general, the laser emitting device with extremely small power can meet most test requirements.
In one embodiment, the low temperature impact device 43 is a nitrogen gas emitting device with adjustable flow rate. The material that nitrogen gas emitter launched is nitrogen gas, and nitrogen gas derives from outside nitrogen cylinder, and liquid nitrogen absorbs a large amount of heat at gasification in-process, can make the temperature of sample carry out the cooling in the twinkling of an eye to minus below 200 degrees, consequently need be right the tolerance of the nitrogen gas that nitrogen gas emitter launched out is controlled to reach the purpose of controlling its cooling, prevent that the temperature is too low.
Therefore, it should be noted that, by performing high and low temperature impacts on the sample by the laser emitting device and the nitrogen emitting device described in the above two embodiments, the temperature environment of the sample can be changed instantly, and in fact, the temperature environment of the sample can also be changed slowly, depending on the magnitude of the power of the high temperature impacting device 42 and the low temperature impacting device 43, and depending on the magnitude of the power of the two devices and the magnitude of the rate of change of the power.
In the embodiment shown in fig. 1 and 2, the sample fixing device 41 is further connected to a driving device, the driving device drives the sample fixing device 41 to rotate, the sample fixing device 41 is provided with grooves 45 arranged in a circumferential manner, and the samples are fixed in the grooves 45. In the embodiment shown in fig. 2, a circle of the grooves 45 is exemplarily shown, in practical applications, the number of the circles of the grooves 45 may be multiple, and in addition, the inner walls of the grooves 45 need to be designed as heat-insulating inner walls, so that mutual interference of temperatures between the grooves 45 can be prevented, energy loss can also be reduced, and energy consumption can be reduced. In the embodiment shown in fig. 1, the laser emitting device and the nitrogen emitting device are disposed above the sample fixing device 41 and directly face the groove 45, and the laser device and the nitrogen emitting device can respectively perform laser heating or nitrogen cooling on the sample placed in the groove 45. Specifically, the laser emitting device and the nitrogen emitting device are arranged in a circumferential shape, and may also be arranged in one or more circles corresponding to the circumferentially arranged grooves 45, corresponding to the number of circles of the grooves 45, that is, one laser emitting device or one nitrogen emitting device is correspondingly arranged above each groove 45.
In the embodiment shown in fig. 3, the driving means 44 comprises: the system comprises an upper computer 441, a PLC 442, a frequency converter 443 and a motor 444 which are sequentially connected, wherein the upper computer 441 is provided with a man-machine interface 445, the man-machine interface 445 is used for inputting working parameters and converting the working parameters into control instructions through the upper computer 441 to be transmitted to the PLC 442, and the PLC 442 controls the starting, stopping and rotating speed of the motor 444 through the frequency converter 443.
In the embodiment shown in fig. 1, the device further includes a fixing plate 46 for mounting the laser emitting device and the nitrogen emitting device, the laser emitting device and the nitrogen emitting device are mounted on the lower surface of the fixing plate 46, and the device further includes a liquid nitrogen pipeline, the liquid nitrogen pipeline is arranged on the upper surface of the fixing plate 46, one end of the liquid nitrogen pipeline is connected with an external liquid nitrogen source, and the other end of the liquid nitrogen pipeline is connected with the nitrogen emitting device. It should be noted that the nitrogen gas emission device must be provided with the liquid nitrogen pipeline, the liquid nitrogen pipeline is connected from an external liquid nitrogen source, the laser emission device only needs to be provided with a conductive cable inside the fixing plate 46, the laser emission device is directly arranged on the lower surface of the fixing plate 46, and the laser emission device 46 may be a laser emission gun with adjustable power.
In the embodiment shown in fig. 1, the laser emitting devices and the nitrogen emitting devices are circumferentially arranged on the lower surface of the fixing plate 46, and each of the grooves 45 is aligned with one of the laser emitting devices or the nitrogen emitting devices. Thus, the test performed on the sample in each of the grooves 45 is independent, and some grooves may be subjected to high temperature shock and some grooves may be subjected to low temperature shock.
In one embodiment, as shown in fig. 4, a temperature sensing device 47 is further disposed at the bottom of the recess 45, and the temperature sensing device 47 is further connected to a data acquisition card 48 and connected to a computer 49 through the data acquisition card 48, and the computer 49 acquires information on temperature change in the recess 45 through the data acquisition card 48. The temperature profile of the recess 45 can be displayed well by the computer 49 and can be further networked or connected to a printer for output by the printer.
The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the scope of the present invention, therefore, the present invention is not limited by the appended claims.

Claims (10)

1. The utility model provides a can realize temperature shock test case of high low temperature transient variation which characterized in that includes:
the box body comprises a side box body and a test box, the side box body is arranged on one side wall of the test box, and an airflow circulating channel is arranged between the side box body and the test box;
the temperature impact test device comprises a sample fixing device, a high-temperature impact device and a low-temperature impact device, wherein the high-temperature impact device and the low-temperature impact device can carry out high-temperature impact or low-temperature impact on a sample placed on the sample fixing device.
2. The temperature impact test chamber capable of realizing instant change of high and low temperatures according to claim 1, wherein the high temperature impact device and the low temperature impact device can perform high temperature impact or low temperature impact on the sample placed on the sample fixing device in turn.
3. The temperature impact test chamber capable of realizing instantaneous changes of high and low temperatures according to claim 1, wherein the high temperature impact device is a laser emitting device with adjustable power.
4. The temperature impact test chamber capable of realizing high and low temperature transient variation as claimed in claim 3, wherein the low temperature impact device is a nitrogen gas emitting device with adjustable flow rate.
5. The temperature impact test chamber for realizing instant change of high and low temperatures as claimed in claim 4, wherein the sample fixing device is further connected with a driving device, the driving device drives the sample fixing device to rotate, the sample fixing device is provided with a plurality of circumferentially arranged grooves, and the samples are fixed in the grooves.
6. The temperature impact test chamber capable of realizing instant change of high and low temperatures according to claim 5, wherein the laser emitting device and the nitrogen emitting device are disposed above the sample fixing device and face the groove, and the laser device and the nitrogen emitting device can respectively perform laser heating or nitrogen cooling on the sample placed in the groove.
7. The temperature impact test chamber capable of realizing transient variation of high and low temperatures according to claim 1, wherein the driving device comprises: the motor control system comprises an upper computer, a PLC (programmable logic controller), a frequency converter and a motor which are sequentially connected, wherein the upper computer is provided with a man-machine operation interface, the man-machine operation interface is used for inputting working parameters and transmitting control instructions to the PLC through the upper computer, and the PLC is used for controlling the starting, stopping and rotating speed of the motor through the frequency converter.
8. The temperature impact test box capable of realizing instantaneous changes of high and low temperatures according to claim 5, further comprising a fixing plate for mounting the laser emitting device and the nitrogen emitting device, wherein the laser emitting device and the nitrogen emitting device are mounted on the lower surface of the fixing plate, and further comprising a liquid nitrogen pipeline, the liquid nitrogen pipeline is arranged on the upper surface of the fixing plate, one end of the liquid nitrogen pipeline is connected with an external liquid nitrogen source, and the other end of the liquid nitrogen pipeline is connected with the nitrogen emitting device.
9. The temperature impact test chamber capable of realizing instant change of high and low temperatures according to claim 5, wherein the laser emitting devices and the nitrogen emitting devices are circumferentially arranged on the lower surface of the fixing plate, and each groove is aligned with one laser emitting device or one nitrogen emitting device.
10. The temperature impact test chamber capable of realizing instant change of high and low temperatures according to claim 5, wherein a temperature sensing device is further disposed at the bottom of the groove, and the temperature sensing device is further connected with a data acquisition card and connected to a computer through the data acquisition card, and the computer acquires information of temperature change in the groove through the data acquisition card.
CN202011570918.1A 2020-12-26 2020-12-26 Temperature impact test box capable of realizing instantaneous change of high and low temperatures Pending CN112595659A (en)

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CN202011570918.1A CN112595659A (en) 2020-12-26 2020-12-26 Temperature impact test box capable of realizing instantaneous change of high and low temperatures

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Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030066639A1 (en) * 2001-10-09 2003-04-10 Jeng-Yau Wang Flexible and mobile high transition rate of temperature test devices
JP2009216660A (en) * 2008-03-12 2009-09-24 Espec Corp Environment testing method and environment testing device
CN101551682A (en) * 2009-04-30 2009-10-07 重庆哈丁科技有限公司 Intelligent high-low temperature test box temperature control system
CN103433082A (en) * 2013-07-09 2013-12-11 广州国技试验仪器有限公司 High-low temperature impact test box with humidifying and heating functions
CN106680308A (en) * 2017-02-23 2017-05-17 四川大学 Atmosphere laser heating in-situ thermal shock/fatigue test device
CN106769594A (en) * 2016-12-05 2017-05-31 中国科学院力学研究所 A kind of thermal fatigue test method
CN207153719U (en) * 2017-09-12 2018-03-30 东莞市高天试验设备有限公司 A kind of low temperature impact test box
CN207610997U (en) * 2017-12-27 2018-07-13 中科瑞测(天津)科技有限公司 A kind of low temperature impact test box
CN109211708A (en) * 2018-10-30 2019-01-15 中国航空工业集团公司沈阳飞机设计研究所 A kind of low temperature impact test device and its test method
CN109773357A (en) * 2019-03-27 2019-05-21 深圳市大德激光技术有限公司 The device of nitrogen protection when a kind of welding for laser galvanometer system
CN110836827A (en) * 2019-11-06 2020-02-25 南京航空航天大学 Non-contact thermal shock high-temperature mechanical testing device
CN210742082U (en) * 2019-10-23 2020-06-12 朱顺 Temperature impact test box

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030066639A1 (en) * 2001-10-09 2003-04-10 Jeng-Yau Wang Flexible and mobile high transition rate of temperature test devices
JP2009216660A (en) * 2008-03-12 2009-09-24 Espec Corp Environment testing method and environment testing device
CN101551682A (en) * 2009-04-30 2009-10-07 重庆哈丁科技有限公司 Intelligent high-low temperature test box temperature control system
CN103433082A (en) * 2013-07-09 2013-12-11 广州国技试验仪器有限公司 High-low temperature impact test box with humidifying and heating functions
CN106769594A (en) * 2016-12-05 2017-05-31 中国科学院力学研究所 A kind of thermal fatigue test method
CN106680308A (en) * 2017-02-23 2017-05-17 四川大学 Atmosphere laser heating in-situ thermal shock/fatigue test device
CN207153719U (en) * 2017-09-12 2018-03-30 东莞市高天试验设备有限公司 A kind of low temperature impact test box
CN207610997U (en) * 2017-12-27 2018-07-13 中科瑞测(天津)科技有限公司 A kind of low temperature impact test box
CN109211708A (en) * 2018-10-30 2019-01-15 中国航空工业集团公司沈阳飞机设计研究所 A kind of low temperature impact test device and its test method
CN109773357A (en) * 2019-03-27 2019-05-21 深圳市大德激光技术有限公司 The device of nitrogen protection when a kind of welding for laser galvanometer system
CN210742082U (en) * 2019-10-23 2020-06-12 朱顺 Temperature impact test box
CN110836827A (en) * 2019-11-06 2020-02-25 南京航空航天大学 Non-contact thermal shock high-temperature mechanical testing device

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