CN112506774A - Testability optimization method and device, electronic equipment and storage medium - Google Patents
Testability optimization method and device, electronic equipment and storage medium Download PDFInfo
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Abstract
One or more embodiments in the present application provide a testability optimization method, apparatus, electronic device, and storage medium, including: acquiring the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to the request user; judging whether the service logic switch state of the logic unit is an open state or not; if yes, judging whether the request user accords with the list information of the logic unit; and if so, performing testability modification on the logic unit. The application can flexibly reform the testability of the logic unit while solving the testability problem, can achieve the universal testability requirement by carrying out corresponding configuration modification on the service logic switch and the list information, and effectively improves the test efficiency.
Description
Technical Field
One or more embodiments of the present application relate to the field of software testing technologies, and in particular, to a testability optimization method, apparatus, electronic device, and storage medium.
Background
In the prior art, in the process of testing the environment under the line, because the testing environment is generally maintained by a test or a developer, and the stability of the testing environment does not affect an external real user, even if the testability problem exists, the problem can be solved by modifying codes again to bypass related business logic or by a plurality of modes such as mock. Common testability problems such as "mutual kicking" during multi-client login generally bypass the test environment by directly removing the relevant logic, which results in high test cost, high code intrusiveness and low test efficiency.
Disclosure of Invention
In view of the above, one or more embodiments of the present application are directed to a method, an apparatus, an electronic device and a storage medium for optimizing testability, so as to solve at least one of the above problems in the prior art.
In view of the above, one or more embodiments of the present application provide a testability optimization method, including:
acquiring the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to a request user;
judging whether the service logic switch state of the logic unit is an open state or not;
if yes, judging whether the request user accords with the list information of the logic unit;
and if so, performing testability modification on the logic unit.
Optionally, the obtaining the service logic switch state and the list information of the logic unit further includes:
acquiring an original logic unit;
determining the original logic cell with testability problems as the logic cell.
Optionally, the obtaining the service logic switch state and the list information of the logic unit further includes:
creating a service logic switch and the list information; the service logic switch is associated with the service logic switch state;
and hot loading the service logic switch state and the list information to the logic unit.
Optionally, the hot loading the service logic switch state and the list information to the logic unit specifically includes:
creating a loading thread;
acquiring and updating the service logic switch state and the list information according to preset time;
and hot loading the service logic switch state and the list information to the logic unit.
Optionally, the hot loading the service logic switch state and the list information to the logic unit specifically includes:
and thermally loading the service logic switch state and the list information to the logic unit through a distributed card publish-subscribe message system.
Optionally, the logic unit includes: original logic;
the judging whether the service logic switch state of the logic unit is an open state further includes:
if not, executing the original logic.
Optionally, the determining whether the requesting user conforms to the list information of the logic unit further includes:
if not, executing the original logic.
Based on the same inventive concept, one or more embodiments of the present application further provide a testability optimization apparatus, including:
the acquisition module is configured to acquire the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to a request user;
the first judgment module is configured to judge whether the service logic switch state of the logic unit is an on state;
the second judgment module is configured to judge whether the request user accords with the list information of the logic unit if the request user accords with the list information of the logic unit;
and the execution module is configured to perform testability improvement on the logic unit if the execution module is configured to perform testability improvement on the logic unit.
Based on the same inventive concept, one or more embodiments of the present application further provide an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement any one of the methods for optimizing testability described above.
Based on the same inventive concept, one or more embodiments of the present application further propose a non-transitory computer-readable storage medium storing computer instructions for causing the computer to perform the testability optimization method of any one of the above.
As can be seen from the above, one or more embodiments of the present application provide a testability optimization method, including: acquiring the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to a request user; judging whether the service logic switch state of the logic unit is an open state or not; if yes, judging whether the request user accords with the list information of the logic unit; and if so, performing testability modification on the logic unit. The method provided by the application can solve the problem of testability by judging whether the service logic switch state and the request user accord with the list information or not, can flexibly modify the testability of the logic unit, can meet the universal testability requirement by correspondingly modifying the configuration on the service logic switch and the list information, effectively improves the test efficiency, can thermally load the change of the service logic switch state and the list information to the logic unit without code change or service restart, and avoids the influence on the service stability.
Drawings
In order to more clearly illustrate one or more embodiments or prior art solutions in the present application, the drawings that are needed in the description of the embodiments or prior art will be briefly described below, and it is obvious that the drawings in the description below are only one or more embodiments in the present application, and that other drawings can be obtained by those skilled in the art without inventive effort from these drawings.
FIG. 1 is a flow diagram of a method for optimizing testability according to one or more embodiments of the present application;
FIG. 2 is a schematic diagram illustrating an application scenario of a testability optimization method according to one or more embodiments of the present application;
FIG. 3 is a schematic diagram of a testability optimization device according to one or more embodiments of the present application;
fig. 4 is a schematic structural diagram of an electronic device in one or more embodiments of the present application.
Detailed Description
For the purpose of promoting a better understanding of the objects, aspects and advantages of the present disclosure, reference is made to the following detailed description taken in conjunction with the accompanying drawings.
It is to be noted that unless otherwise defined, technical or scientific terms used in one or more embodiments of the present application shall have the ordinary meaning as understood by one of ordinary skill in the art to which this disclosure belongs. The use of "first," "second," and similar terms in one or more embodiments of the present application does not denote any order, quantity, or importance, but rather the terms are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
As described in the background section, in the prior art, in the process of testing an online environment, because a test environment is generally maintained by a test or a developer, and the stability of the test environment does not affect an external real user, even if there is a testability problem, the problem can be solved by modifying code again to bypass a related business logic or by mock and other ways. However, the applicant finds out through research that common testability problems such as mutual kicking during login of multiple clients are generally bypassed by directly removing relevant logics, but in a production environment test process, reasonable business logics and safety considerations need to be kept, and the problems of high online test cost, high code intrusiveness and low test efficiency are caused by the prior art, which cannot be bypassed or solved in a mock manner.
The applicant finds out through research that in the prior art, there are four common schemes, namely: aiming at the test environment, the code structure directly bypasses the related judgment logic, and if a scene of 'multi-client login mutual kicking', the 'mutual kicking' logic is directly annotated; scheme II: aiming at the test environment, the problem is solved in a mock mode, for example, the logic of 'mutual kicking' in the scene of 'multi-client login mutual kicking' is replaced by the logic of 'no mutual kicking'; the third scheme is as follows: for the online environment, giving up the means of parallel automatic execution, and covering the serial single devices one by one; and the scheme is as follows: aiming at the online environment, the problem is solved by configuring the online white list, but the service is required to be restarted to reload the white list every time the online white list is changed. However, the prior art has poor universality, is not universal on and off the line, can bypass and utilize mock by logic implemented under the line, and is not suitable for on-line and serial coverage on the line, and has low execution efficiency under the line; the method is characterized in that the original code is involved in intrusion and transformation no matter in a logic bypass mode or a mock mode, and the intrusion to the original code is high; due to the testability problem of the online environment, the serial single-device coverage efficiency is low; if the invasion of the offline code is directly copied to the online carelessly, the online service is influenced; meanwhile, if the on-line white list is configured, the white list needs to be restarted each time the white list is reloaded, the service may be unavailable due to the restarting process, the SLA (also referred to as service level agreement) of the service may be affected, the testing cost may also become high, and the flexibility is poor. Therefore, the method provided by the application judges whether the service logic switch state of the service logic unit is the opening state and whether the request user accords with the list information by acquiring the service logic switch state and the list information of the service logic unit, if the service logic switch state is the opening state and the request user accords with the list information, the testability transformation is carried out on the logic unit, so that whether the request user needs to execute the original logic of the logic unit or avoid the original logic in a test environment or a production environment is controlled, the test efficiency is improved, the change of the service logic switch state and the list information can be thermally loaded to the logic unit without code change or service restart, and the influence on the service stability is avoided.
Hereinafter, the technical means of the present disclosure will be described in further detail with reference to specific examples.
Referring to fig. 1, a testability optimization method provided in one or more embodiments of the present application specifically includes the following steps:
s101: acquiring the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to the requesting user.
In this embodiment, a service logic switch state and list information of the logic unit need to be acquired, where the service logic switch state corresponds to the requesting user. Specifically, the logic units need to be sorted out first, a service logic switch is formulated for each logic unit, and the list information corresponding to the service logic switch is maintained, and the query of the service logic switch and the list information is provided through the micro service interface.
In some optional embodiments, the logic unit is sorted out, the original logic unit needs to be acquired before the service logic switch state and the list information of the logic unit are acquired, the logic unit is sorted out in a testability problem driving mode, all testability problems are acquired, the original logic unit which can affect the testability is sorted out from the original logic unit, and the original logic unit with the testability problems is determined as the logic unit.
It should be noted that, for example, the key decision point of the testability problem of multi-client login mutual kicking is to recognize the multi-client login and then execute the logic of mutual kicking, so in this scenario, the service logic switch needs to be customized in the decision branch of multi-client login, that is, the acquisition logic of the service logic switch is added. The service logic switch is acquired through a micro service interface provided by a switch and list management system, wherein the switch and list management micro service provides a switch and list management platform for a requesting user, the requesting user can configure the testability modification switch on the platform, a corresponding list is configured for each service logic switch, and a micro service interface can be provided for a calling party to acquire the corresponding switch and list configuration.
In some optional embodiments, referring to fig. 2, before obtaining the service logic switch state and the list information of the logic unit, in order to avoid restarting the service when the list information and the service logic switch state are updated, a cached hot loading logic needs to be created. The method comprises the steps of creating service logic switches and list information, wherein each service logic switch is associated with the service logic switch state of the service logic switch, then configuring the list information for the service logic switch state, specifically, creating the list information of the service logic switch opening state, creating mapping of the service logic switches and the list information, providing an API (application programming interface) for adding, deleting and modifying the service logic switches and the list information through a service logic switch and list management system, storing the service logic switch state and the list information at a bottom layer, and when the service logic switches and the list information are updated, hot loading the service logic switches and the list information to a cache for a logic unit to obtain.
It should be noted that, the service logic switch state and the list information are hot-loaded to the logic unit, and the service logic switch state and the list information may be obtained and updated according to a preset time by creating an individual thread, for example, the preset time may be one minute, the service logic switch state and the list information are obtained and updated every minute, and whether the obtained service logic switch state and the list information are the same as the service logic switch state and the list information already stored in the cache is determined, and if the obtained service logic switch state and the list information are the same, the obtained service logic switch state and the list information do not need to be hot-loaded to the logic unit; and if the service logic switch state and the list information are different, loading the acquired service logic switch state and the list information into a cache for a program to use so as to realize hot loading of the acquired service logic switch state and the list information into a logic unit through the cache.
Specifically, when the service logic switch state and the list information configuration in the service logic switch and list management system are updated, the service logic switch and list management system sends an asynchronous message to the distributed card publish-subscribe message system, and the method provided by the application completes the update of data in the cache through the distributed card publish-subscribe message system by subscribing to consume the card messages, that is, the service logic switch state and the list information are hot-loaded to the logic unit.
S102: and judging whether the service logic switch state of the logic unit is an open state.
S103: if yes, judging whether the request user accords with the list information of the logic unit.
In this embodiment, referring to fig. 2, it is determined whether the service logic switch state of the logic unit is in an on state through step S102, and if so, it is further determined whether the requesting user conforms to the list information of the logic unit through step S103. Specifically, the original logic unit includes: in the original logic, after determining whether the service logic switch state of the logic unit is in the on state through step S102, if not, the original logic is executed, for example, in the testability problem of mutual kicking in multi-client login, if the service logic switch state of the logic unit is not in the on state, the original logic is executed after recognizing that the multi-client login, that is, the mutual kicking logic is executed.
It should be understood that before determining whether the requesting user is in line with the list information of the logic unit, the list information corresponding to the service logic switch determined in step S102 needs to be acquired, the list information corresponding to the service logic switch is used as the list information of the logic unit, and then step S103 is performed to determine whether the requesting user is in line with the list information of the logic unit, that is, whether the requesting user is in the list information corresponding to the service logic switch is determined.
S104: and if so, performing testability modification on the logic unit.
In this embodiment, referring to fig. 2, after determining whether the requesting user conforms to the list information of the logical unit in step S103, if so, the testability modification is performed on the logical unit. Specifically, if the requesting user accords with the list information of the logic unit, the original logic is not executed, and the original logic is modified or skipped, so that the testability modification of the logic unit is realized. For example, in the testability problem of multi-client login mutual kicking, if the requesting user conforms to the list information of the logic unit, the mutual kicking logic in the original logic can be skipped, and the testability improvement of the logic unit is realized.
It can be understood that if the requesting user does not conform to the list information of the logical unit, i.e. the requesting user is not in the list information of the logical unit, the original logic is executed. For example, in the testability problem of multi-client log-in mutual kicking, if the requesting user does not conform to the list information of the logic unit, the mutual kicking logic in the original logic is executed.
In some optional implementation manners, many scenes in the business process have the processes of sending a short message verification method, inputting a picture verification code, relying on face recognition and the like, and when the production environment executes automation, because the automation process does not involve in manual work, the problems of inconvenience in obtaining the short message verification code, the picture verification code and face recognition exist, so that the automation cannot be carried out or the carrying difficulty is large, and the method provided by the application can effectively solve the problems in the production environment or the test environment, so that the implementation threshold of on-line automation is reduced.
It should be noted that, in actual work, there may be time window limitations for part of services, for example, a specific prompt window, for example, only a tuesday and a thursday can initiate a prompt, and further, for example, the air customer service can be connected only by working day time, and the time window limitations may cause that these processes cannot be covered when the release performs production regression, and the testability optimization method provided by the present application can flexibly select to bypass such limitations through multi-step judgment, thereby ensuring the testability of production.
As can be seen from the above, one or more embodiments of the present application provide a testability optimization method, including: acquiring the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to a request user; judging whether the service logic switch state of the logic unit is an open state or not; if yes, judging whether the request user accords with the list information of the logic unit; and if so, performing testability modification on the logic unit. The method provided by the application can solve the problem of testability by judging whether the service logic switch state and the request user accord with the list information or not, can flexibly modify the testability of the logic unit, can meet the universal testability requirement by correspondingly modifying the configuration on the service logic switch and the list information, effectively improves the test efficiency, can thermally load the change of the service logic switch state and the list information to the logic unit without code change or service restart, and avoids the influence on the service stability.
It is to be appreciated that the method can be performed by any apparatus, device, platform, cluster of devices having computing and processing capabilities.
It should be noted that the method of one or more embodiments of the present disclosure may be performed by a single device, such as a computer or server. The method of the embodiment can also be applied to a distributed scene and completed by the mutual cooperation of a plurality of devices. In such a distributed scenario, one of the devices may perform only one or more steps of the method of one or more embodiments of the present disclosure, and the devices may interact with each other to complete the method.
It should be noted that the above description describes certain embodiments of the present disclosure. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.
Based on the same inventive concept, one or more embodiments of the present application further provide a testability optimization apparatus, which, with reference to fig. 3, includes:
the acquisition module is configured to acquire the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to a request user;
the first judgment module is configured to judge whether the service logic switch state of the logic unit is an on state;
the second judgment module is configured to judge whether the request user accords with the list information of the logic unit if the request user accords with the list information of the logic unit;
and the execution module is configured to perform testability improvement on the logic unit if the execution module is configured to perform testability improvement on the logic unit.
In some optional embodiments, the obtaining the service logic switch state and the list information of the logic unit further includes:
acquiring an original logic unit;
determining the original logic cell with testability problems as the logic cell.
In some optional embodiments, the obtaining the service logic switch state and the list information of the logic unit further includes:
creating a service logic switch and the list information; the service logic switch is associated with the service logic switch state;
and hot loading the service logic switch state and the list information to the logic unit.
In some optional embodiments, the hot loading the service logic switch state and the list information to the logic unit specifically includes:
creating a loading thread;
acquiring and updating the service logic switch state and the list information according to preset time;
and hot loading the service logic switch state and the list information to the logic unit.
In some optional embodiments, the hot loading the service logic switch state and the list information to the logic unit specifically includes:
and thermally loading the service logic switch state and the list information to the logic unit through a distributed card publish-subscribe message system.
In some optional embodiments, the logic unit includes: original logic;
the judging whether the service logic switch state of the logic unit is an open state further includes:
if not, executing the original logic.
In some optional embodiments, the determining whether the requesting user conforms to the list information of the logical unit further includes:
if not, executing the original logic.
For convenience of description, the above devices are described as being divided into various modules by functions, and are described separately. Of course, the functionality of the modules may be implemented in the same one or more software and/or hardware implementations in implementing one or more embodiments of the present description.
The apparatus of the foregoing embodiment is used to implement the corresponding method in the foregoing embodiment, and has the beneficial effects of the corresponding method embodiment, which are not described herein again.
Based on the same inventive concept, corresponding to any of the above embodiments, one or more embodiments of the present specification further provide an electronic device, which includes a memory, a processor, and a computer program stored in the memory and running on the processor, and when the processor executes the computer program, the testability optimization method described in any of the above embodiments is implemented.
Fig. 4 is a schematic diagram illustrating a more specific hardware structure of an electronic device according to this embodiment, where the electronic device may include: a processor 410, a memory 420, an input/output interface 430, a communication interface 440, and a bus 450. Wherein processor 410, memory 420, input/output interface 430, and communication interface 440 are communicatively coupled to each other within the device via bus 450.
The processor 410 may be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an Application Specific Integrated Circuit (ASIC), or one or more Integrated circuits, and is configured to execute related programs to implement the technical solutions provided in the embodiments of the present specification.
The Memory 420 may be implemented in the form of a ROM (Read Only Memory), a RAM (Random Access Memory), a static storage device, a dynamic storage device, or the like. The memory 420 may store an operating system and other application programs, and when the technical solution provided by the embodiments of the present specification is implemented by software or firmware, the relevant program codes are stored in the memory 420 and called to be executed by the processor 410.
The input/output interface 430 is used for connecting an input/output module to realize information input and output. The i/o module may be configured as a component in a device (not shown) or may be external to the device to provide a corresponding function. The input device may include a keyboard, a mouse, a touch screen, a microphone, various sensors, etc., and the output device may include a display, a speaker, a vibrator, an indicator light, etc.
The communication interface 440 is used for connecting a communication module (not shown in the figure) to realize communication interaction between the device and other devices. The communication module can realize communication in a wired mode (such as USB, network cable and the like) and also can realize communication in a wireless mode (such as mobile network, WIFI, Bluetooth and the like).
It should be noted that although the above-mentioned device only shows the processor 410, the memory 420, the input/output interface 430, the communication interface 440 and the bus 450, in a specific implementation, the device may also include other components necessary for normal operation. In addition, those skilled in the art will appreciate that the above-described apparatus may also include only those components necessary to implement the embodiments of the present description, and not necessarily all of the components shown in the figures.
The electronic device of the foregoing embodiment is used to implement the corresponding method in the foregoing embodiment, and has the beneficial effects of the corresponding method embodiment, which are not described herein again.
Based on the same inventive concept, corresponding to any of the above-described embodiment methods, one or more embodiments of the present specification further provide a non-transitory computer-readable storage medium storing computer instructions for causing the computer to perform the testability optimization method according to any of the above-described embodiment.
Non-transitory computer readable storage media of the present embodiments, including both non-transitory and non-transitory, removable and non-removable media, may implement the information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device.
The computer instructions stored in the storage medium of the above embodiment are used to enable the computer to execute the testability optimization method according to any of the above embodiments, and have the beneficial effects of the corresponding method embodiment, which are not described herein again.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the spirit of the present disclosure, features from the above embodiments or from different embodiments may also be combined, steps may be implemented in any order, and there are many other variations of different aspects of one or more embodiments in this application as described above, which are not provided in detail for the sake of brevity.
In addition, well-known power/ground connections to Integrated Circuit (IC) chips and other components may or may not be shown in the provided figures, for simplicity of illustration and discussion, and so as not to obscure one or more embodiments of the disclosure. Furthermore, devices may be shown in block diagram form in order to avoid obscuring the understanding of one or more embodiments of the present description, and this also takes into account the fact that specifics with respect to implementation of such block diagram devices are highly dependent upon the platform within which the one or more embodiments of the present description are to be implemented (i.e., specifics should be well within purview of one skilled in the art). Where specific details (e.g., circuits) are set forth in order to describe example embodiments of the disclosure, it should be apparent to one skilled in the art that one or more embodiments of the disclosure can be practiced without, or with variation of, these specific details. Accordingly, the description is to be regarded as illustrative instead of restrictive.
While the present disclosure has been described in conjunction with specific embodiments thereof, many alternatives, modifications, and variations of these embodiments will be apparent to those of ordinary skill in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic ram (dram)) may use the discussed embodiments.
It is intended that the one or more embodiments of the present application embrace all such alternatives, modifications and variations as fall within the broad scope of the appended claims. Therefore, any omissions, modifications, substitutions, improvements, and the like that may be made without departing from the spirit and principles of one or more embodiments of the present disclosure are intended to be included within the scope of the present disclosure.
Claims (10)
1. A method for optimizing testability, comprising:
acquiring the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to a request user;
judging whether the service logic switch state of the logic unit is an open state or not;
if yes, judging whether the request user accords with the list information of the logic unit;
and if so, performing testability modification on the logic unit.
2. The method for optimizing testability according to claim 1, wherein the obtaining the service logic switch status and the list information of the logic unit further comprises:
acquiring an original logic unit;
determining the original logic cell with testability problems as the logic cell.
3. The method for optimizing testability according to claim 1, wherein the obtaining the service logic switch status and the list information of the logic unit further comprises:
creating a service logic switch and the list information; the service logic switch is associated with the service logic switch state;
and hot loading the service logic switch state and the list information to the logic unit.
4. The method according to claim 3, wherein the hot loading of the service logic switch state and the list information to the logic unit specifically comprises:
creating a loading thread;
acquiring and updating the service logic switch state and the list information according to preset time;
and hot loading the service logic switch state and the list information to the logic unit.
5. The method according to claim 3, wherein the hot loading of the service logic switch state and the list information to the logic unit specifically comprises:
and thermally loading the service logic switch state and the list information to the logic unit through a distributed card publish-subscribe message system.
6. The method of optimizing testability according to claim 1, wherein the logic unit comprises: original logic;
the judging whether the service logic switch state of the logic unit is an open state further includes:
if not, executing the original logic.
7. The method of claim 6, wherein the determining whether the requesting user complies with the logic unit list information further comprises:
if not, executing the original logic.
8. A testability optimization device, comprising:
the acquisition module is configured to acquire the service logic switch state and the list information of the logic unit; the service logic switch state corresponds to a request user;
the first judgment module is configured to judge whether the service logic switch state of the logic unit is an on state;
the second judgment module is configured to judge whether the request user accords with the list information of the logic unit if the request user accords with the list information of the logic unit;
and the execution module is configured to perform testability improvement on the logic unit if the execution module is configured to perform testability improvement on the logic unit.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the method according to any of claims 1 to 7 when executing the program.
10. A non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the method of any one of claims 1 to 7.
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| CN202011411005.5A CN112506774A (en) | 2020-12-03 | 2020-12-03 | Testability optimization method and device, electronic equipment and storage medium |
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| CN202011411005.5A CN112506774A (en) | 2020-12-03 | 2020-12-03 | Testability optimization method and device, electronic equipment and storage medium |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114896270A (en) * | 2022-06-07 | 2022-08-12 | 平安科技（深圳）有限公司 | Function switch state modification method, device, equipment and storage medium |
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| US3409878A (en) * | 1966-03-18 | 1968-11-05 | Rca Corp | Controlling interchanges between a computer and many communications lines |
| CN105871919A (en) * | 2016-06-12 | 2016-08-17 | 北京六间房科技有限公司 | Network application firewall system and realization method thereof |
| CN111209306A (en) * | 2020-01-02 | 2020-05-29 | 北京字节跳动网络技术有限公司 | Business logic judgment method and device, electronic equipment and storage medium |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3409878A (en) * | 1966-03-18 | 1968-11-05 | Rca Corp | Controlling interchanges between a computer and many communications lines |
| CN105871919A (en) * | 2016-06-12 | 2016-08-17 | 北京六间房科技有限公司 | Network application firewall system and realization method thereof |
| CN111209306A (en) * | 2020-01-02 | 2020-05-29 | 北京字节跳动网络技术有限公司 | Business logic judgment method and device, electronic equipment and storage medium |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114896270A (en) * | 2022-06-07 | 2022-08-12 | 平安科技（深圳）有限公司 | Function switch state modification method, device, equipment and storage medium |
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