CN111342454A - Method and system for analyzing big data of low voltage cause at platform area outlet - Google Patents
Method and system for analyzing big data of low voltage cause at platform area outlet Download PDFInfo
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
A method and a system for analyzing big data of a station area outlet low voltage cause are provided, wherein a station area acquisition device is used for acquiring three-phase electrical quantity at a power supply outlet side, and a transformer substation bus voltage acquisition device is used for acquiring three-phase or two-phase bus voltage data; storing the preprocessed time sequence data into a background database, and dividing the time sequence data into a distribution room operation data table and a bus voltage data table; generating a transformer area outlet low-voltage event and a bus low-voltage event for the collected transformer area outlet voltage data and 10kV bus voltage data, and defaulting the reason of each transformer area outlet low-voltage event to be a 10kV line grid structure problem; and automatically analyzing the reason of the low voltage at the outlet of the transformer area by using the voltage data at the outlet of the transformer area and the voltage data of the bus. The system is a computer device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor. The invention obtains the cause of the low-voltage event at the outlet of the transformer area by utilizing a big data technology, and can provide auxiliary reference for planning and running of the power distribution network.
Description
Technical Field
The invention relates to a method and a system for analyzing big data of a low-voltage cause at an outlet of a transformer area, belonging to the technical field of power distribution and utilization.
Background
The platform area outlet low-voltage treatment is one of key works of operation and maintenance departments of power supply enterprises all the time, the platform area outlet low voltage directly influences the quality of the power supply voltage of users, and how to accurately find out the reason of the platform area outlet low voltage in time has important significance for power supply enterprises to scientifically and accurately make platform area outlet low-voltage treatment measures.
At present, the analysis of the low voltage at the outlet of the transformer area is mainly performed by field personnel in a manual investigation mode, on one hand, from managers, the overall situation of the low voltage at the outlet of the transformer area cannot be accurately mastered according to the result of the manual investigation of the low voltage at the outlet of the transformer area, which is not beneficial to the accurate establishment of the low voltage at the outlet of the transformer area and scientific investment, on the other hand, from field operation and maintenance personnel, the comprehensive analysis of the low voltage at the outlet needs to be performed in a manual investigation mode, and the workload of the low voltage at the outlet of the transformer area is large, and meanwhile, the real reason of the low voltage at the outlet of the transformer area cannot be timely mastered, so that the low voltage at the outlet of the transformer area repeatedly.
Disclosure of Invention
The invention aims to solve the problem of manually carrying out on-site inspection of the outlet low voltage of a transformer area, and provides a method and a system for analyzing the large data of the outlet low voltage cause of the transformer area.
The technical scheme of the invention is that the method for analyzing the big data of the low voltage cause at the outlet of the transformer area utilizes a transformer area acquisition device to acquire three-phase voltage, current and active electric quantity at the outlet side of a power supply, and utilizes a transformer substation bus voltage acquisition device to acquire three-phase or two-phase bus voltage data; preprocessing the acquired data, storing the time sequence data into a background database, and dividing the time sequence data into a distribution room operation data table and a bus voltage data table; generating a transformer area outlet low-voltage event and a bus low-voltage event for the collected transformer area outlet voltage data and 10kV bus voltage data, and defaulting the reason of each transformer area outlet low-voltage event to be a 10kV line grid structure problem; and automatically analyzing the reason of the low voltage at the outlet of the transformer area by using the voltage data at the outlet of the transformer area and the voltage data of the bus.
The generation event rule and the method of the platform area outlet low voltage are as follows:
and taking the minimum value of the outlet three-phase voltage of each acquisition point transformer area, setting a field dt _ minvlot, if the minimum values of the outlet three-phase voltages of the transformer areas for one hour or more are less than 198V, generating a transformer area outlet low-voltage event, newly adding a transformer area outlet low-voltage reason field dt _ lowvlot _ replay, setting the default value to be 10kV line grid problems, and setting the default value to be 6.
The generation event rule and the method for the 10kV bus outlet low voltage are as follows:
and (3) taking the minimum value of the three-phase voltage of the 10kV bus at each acquisition point, setting a field bs _ minvlot, and if the minimum value of the voltage of the 10kV bus for one hour or more is less than 9.5kV, generating a bus low-voltage event.
The automatic analysis platform area outlet low voltage reason is carried out in two steps:
firstly, preliminarily analyzing the reasons of low voltage at the outlet of the platform area;
secondly, further analyzing the reasons of low voltage at the outlet of the transformer area;
the reasons for the low voltage at the outlet of the primary analysis zone are as follows:
(1) when a low-voltage event occurs, if the acquisition point of the distribution room is smaller than 24 points, the acquisition problem of the distribution room collector is judged, the dt _ lowvlot _ reason field in the low-voltage event at the outlet of the distribution room is reset to be 0, the acquisition problem of the distribution room collector is shown, and if the acquisition point of the distribution room is not larger than 24 points, the step (2) is carried out;
(2) calculating the three-phase voltage average value of each acquisition point when a low-voltage event occurs, judging whether the three-phase voltage average values are all larger than 198V when the event occurs, if so, judging that the three-phase unbalance problem of the transformer area exists, resetting dt _ lowvlot _ reason field of the outlet voltage low-voltage event of the transformer area to be 1, representing that the three-phase load unbalance problem of the transformer area exists, and otherwise, entering the step (3);
(3) calculating whether the defect problems of poor contact, phase failure and the like exist when the low-voltage event occurs, wherein the judgment rule is shown as sub-flows ①, ② and ③, if so, judging that the transformer area is the defect problems of phase failure and poor contact, resetting '2' in a dt _ lowvlot _ replay field of the low-voltage event at the outlet of the transformer area to represent the defect problems of phase failure and poor contact of the transformer area, and otherwise, entering the second step;
① if there is a u at a certain collection point within the event occurrence timea+ub-uc|<50V and max (u)a,ub,uc)>198V, judging the platform area to be the problem of phase failure and poor contact, wherein the Yyn0 distribution defect is the C phase, and the Dyn11 distribution defect is the A phase;
② if there is a u at a certain collection point within the event occurrence timea+uc-ub|<50V and max (u)a,ub,uc)>198V, judging the platform area to be the problem of phase failure and poor contact, wherein the Yyn0 transformation defect is the B phase, and the Dyn11 transformation defect is the C phase;
③ if there is a u at a certain collection point within the event occurrence timec+ub-ua|<50V and max (u)a,ub,uc)>198V, judging the platform area to be the problem of phase failure and poor contact, wherein the Yyn0 transformation defect is the phase A, and the Dyn11 transformation defect is the phase B;
wherein: u. ofa、ub、ucThree phase outlet voltage data sequences for the station outlets a, b, c during a low voltage event.
The reason for further analyzing the low voltage at the outlet of the platform area is as follows:
(1) grouping the low-voltage events at the outlets of the transformer area by day by taking the 10kV lines as containers, and searching all low-voltage events at the outlets of the transformer area, which are caused by the grid structure problem of the 10kV lines; whether a 10kV bus low-voltage event exists in each event outlet low-voltage time or not is judged, if yes, the reason of the outlet low-voltage event at the moment of the transformer area is judged to be the bus low-voltage problem, and a dt _ lowvlot _ reacon field of the transformer area outlet low-voltage event is reset to be '4', which indicates that the transformer area outlet low-voltage is caused by the bus low-voltage problem;
(2) grouping the transformer area outlet low-voltage events by day by taking a 10kV line as a container, searching for an event that all transformer area outlet low-voltage reasons are phase failure and poor contact defect problems dt _ lowvlot _ reason, wherein the field value of the event is '2', if 2 or more transformer area low-voltage events are phase failure and poor contact defect problems, judging that the 10kV line is disconnected and the poor contact defect problems, resetting a related transformer area outlet low-voltage event dt _ lowvlot _ reason word to be '5', and indicating that the related transformer area outlet low voltage is caused by the 10kV line defect problems;
(3) grouping the station outlet low-voltage events by days by taking a 10kV line as a container, searching for an event of which the value of the field of the low voltage event dt _ lowvlot _ reason of all station outlet is 6 because of a 10kV line grid structure problem, judging the related station as a distribution transformer gear problem if distribution transformers of less than 2 stations exist, and resetting the word of the low voltage event dt _ lowvlot _ reason of the related station outlet to be 3.
The method comprises the steps of collecting three-phase voltage, current and active electric quantity on the power supply outlet side, wherein the sampling interval is generally 15 minutes or 30 minutes; the three-phase or two-phase bus voltage data are collected, and the collection interval is generally 15 minutes or 30 minutes.
The method for preprocessing the acquired data comprises the following steps:
the method comprises the steps that field data such as outlet three-phase voltage, field three-phase current, bus voltage and the like of a platform area cannot be specified to be null, and for the platform area, if only one field data of the three-phase voltage and the three-phase current of a certain acquisition point is null, the data of the acquisition point is deleted; for 10kV bus voltage, if only two or three field data of three-phase voltage of a certain acquisition point are null, deleting the data of the acquisition point data; and after data preprocessing, respectively sequencing the transformer area data and the 10kV bus voltage in an ascending order according to the acquisition time.
A station-exit low-voltage cause big data analysis system, the system being a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor executes the program to perform the steps of:
(1) three-phase voltage, current, reactive power and active power electrical quantity data and three-phase or two-phase bus voltage data at the power supply outlet side are collected and stored in a database;
(2) preprocessing the acquired data, and respectively sequencing the transformer area data and the 10kV bus voltage in an ascending order according to acquisition time after preprocessing the data;
(3) generating an event of a platform area outlet low voltage, taking the minimum value of the outlet three-phase voltage of each acquisition point platform area, setting a field dt _ minvlot, if the minimum values of the outlet three-phase voltages of the platform areas for one hour or more are less than 198V continuously, generating the event of the platform area outlet low voltage, newly adding a platform area outlet low voltage reason field dt _ lowvlot _ reacon, setting the default value to be 10kV line grid problems, and setting the field dt _ minvlot to be 6%;
(4) generating an event at a low voltage of a bus, and generating an event rule at a low voltage of a 10kV bus outlet: taking the minimum value of the three-phase voltage of the 10kV bus at each acquisition point, setting a field bs _ minvlot, and if the minimum value of the voltage of the 10kV bus is less than 9.5kV for one hour or more continuously;
(5) preliminary analysis of the cause of low voltage at the outlet of the area
When a low-voltage event occurs, if the acquisition point of the distribution room is smaller than 24 points, the acquisition problem of the distribution room collector is judged, the dt _ lowvlot _ reason field in the low-voltage event at the outlet of the distribution room is reset to be 0, the acquisition problem of the distribution room collector is shown, and if the acquisition point of the distribution room is not larger than 24 points, the next step is carried out;
calculating the three-phase voltage average value of each acquisition point when a low-voltage event occurs, judging whether the three-phase voltage average values are all larger than 198V when the event occurs, if so, judging that the three-phase unbalance problem of the transformer area exists, resetting dt _ lowvlot _ reason field of the low-voltage event at the outlet of the transformer area to be 1, representing that the three-phase load unbalance problem of the transformer area exists, and otherwise, entering the next step;
calculating whether the defect problems of poor contact, phase failure and the like exist when the low-voltage event occurs, judging the rule as a sub-flow, if so, judging that the fault problem of phase failure and poor contact exists in the transformer area, and resetting a dt _ lowvlot _ reacon field of the outlet low-voltage event of the transformer area to be 2 to represent the fault problem of phase failure and poor contact of the transformer area;
(6) further analyzing the reason of low voltage at the outlet of the platform area
Grouping the low-voltage events at the outlets of the transformer area by day by taking the 10kV lines as containers, and searching all low-voltage events at the outlets of the transformer area, which are caused by the grid structure problem of the 10kV lines; whether a 10kV bus low-voltage event exists in the event outlet low-voltage time of each time; if the bus low-voltage problem exists, the reason of the outlet low-voltage event at the moment of the platform area is judged as the bus low-voltage problem, and the dt _ lowvlot _ reason field of the outlet low-voltage event of the platform area is reset to be 4, which indicates that the outlet low-voltage of the platform area is caused by the bus low-voltage problem;
grouping the transformer area outlet low-voltage events by day by taking a 10kV line as a container, searching for an event that all transformer area outlet low-voltage reasons are phase failure and poor contact defect problems dt _ lowvlot _ reason, wherein the field value of the event is '2', if 2 or more transformer area low-voltage events are phase failure and poor contact defect problems, judging that the 10kV line is disconnected and the poor contact defect problems, resetting a related transformer area outlet low-voltage event dt _ lowvlot _ reason word to be '5', and indicating that the related transformer area outlet low voltage is caused by the 10kV line defect problems;
grouping the low-voltage events at the outlets of the transformer areas by day by taking a 10kV line as a container, searching for the event of which the value of the field of the low-voltage event dt _ lowvlot _ reason of all the outlets of the transformer areas is 6 because of the grid structure problem of the 10kV line again, judging the transformer area to be a transformer gear problem if the transformer area has less than 2 transformer areas, and resetting the word dt _ lowvlot _ reason of the low-voltage event dt _ lowvlot _ reason of the outlet of the transformer area to be 3;
(7) forming the final low voltage event reasons of all the platform zone outlets according to the above, and storing the final low voltage event reasons into a database; and performing statistical analysis on all outlet low-voltage events in the statistical period to obtain 7 types of statistical results such as the problem of a platform outlet low-voltage collector, the problem of three-phase imbalance, the problem of platform area defects, unreasonable gears, the problem of 10kV line defects, the problem of low bus voltage, the problem of 10kV line net racks and the like.
The method for analyzing the large data of the station area outlet low voltage cause has the advantages that compared with the traditional method for analyzing the station area outlet low voltage cause and manually checking, 10kV line parameters do not need to be considered, automatic analysis of 7 types of reasons of the station area outlet low voltage can be realized only by using the station area outlet data and the 10kV line data, the types of analysis results are multiple, the accuracy is high, and the practical requirement is met. The invention fully utilizes the existing electric acquisition device of the electric energy meter in the transformer area and the bus voltage acquisition of the transformer substation, does not need to add new hardware, and realizes the analysis of the low voltage cause of the transformer area through the executable program code of the computer.
The method is only suitable for analyzing the cause of the low voltage at the outlet of the transformer area, provides 7 types of cause judgment rules of the cause of the low voltage at the outlet of the transformer area, obtains the cause of the low voltage event at the outlet of the transformer area each time by utilizing a big data technology, and can provide auxiliary reference for planning and running of the power distribution network.
Drawings
FIG. 1 is a flow chart of a method for analyzing big data of a low voltage cause at an outlet of a distribution room.
Detailed Description
The specific embodiment of the present invention is shown in the flow chart of fig. 1.
The method for analyzing the big data of the low voltage cause at the outlet of the transformer area comprises the following steps:
first, data acquisition
In this embodiment, the area outlet voltage data collected by the area collection device and the 10kV bus voltage data collected by the substation bus voltage collection device are stored in a background database and divided into an area operation data table (pb _ operation _ data) and a bus voltage data table (bs _ operation _ data).
Second, data preprocessing
In this embodiment, the collected data is preprocessed:
the method comprises the steps that field data such as outlet three-phase voltage, field three-phase current, bus voltage and the like of a platform area cannot be specified to be null, and for the platform area, if only one field data of the three-phase voltage and the three-phase current of a certain acquisition point is null, the data of the acquisition point is deleted; for 10kV bus voltage, if two or three field data of the three-phase voltage of a certain acquisition point are null, the data of the acquisition point are deleted. And after data preprocessing, respectively sequencing the transformer area data and the 10kV bus voltage in an ascending order according to the acquisition time.
Third, generating low voltage event
Determining and analyzing the time period of the outlet low voltage, generating a corresponding low voltage event according to the outlet voltage of the transformer area and the voltage data of the 10kV bus, and judging the low voltage event as follows:
(1) the platform outlet low voltage generation event rule is as follows: the method comprises the steps of taking the minimum value of outlet three-phase voltage of each acquisition point transformer area, setting a field (dt _ minvlot), if the minimum value of outlet three-phase voltage of each transformer area for one hour or more is smaller than 198V, generating a transformer area outlet low-voltage event, adding a transformer area outlet low-voltage reason field (dt _ lowvlot _ reason), and setting a default value of 10kV line grid problems (the numerical value is '6').
(2)10kV bus outlet low voltage generation event rule: and (3) taking the minimum value of the three-phase voltage of the 10kV bus at each acquisition point, setting a field (bs _ minvlot), and if the minimum value of the voltage of the 10kV bus for one hour or more is less than 9.5kV, generating a bus low-voltage event.
Fourthly, preliminarily analyzing the reason of low voltage at the outlet of the platform area
(1) When a low-voltage event occurs, if the acquisition point of the distribution room is smaller than 24 points, the acquisition problem of the distribution room collector is judged, the dt _ lowvlot _ reason field in the low-voltage event at the outlet of the distribution room is reset to be 0, the acquisition problem of the distribution room collector is shown, and if the acquisition point of the distribution room is not larger than 24 points, the step (2) is carried out;
(2) calculating the three-phase voltage average value of each acquisition point when a low-voltage event occurs, judging whether the three-phase voltage average values are all larger than 198V when the event occurs, if so, judging that the three-phase unbalance problem of the transformer area exists, resetting dt _ lowvlot _ reason field of the outlet voltage low-voltage event of the transformer area to be 1, representing that the three-phase load unbalance problem of the transformer area exists, and otherwise, entering the step (3);
(3) calculating whether the defect problems of poor contact, phase failure and the like exist when the low-voltage event occurs, wherein the judgment rule is shown as sub-flows ①, ② and ③, if so, judging that the transformer area is the defect problems of phase failure and poor contact, resetting dt _ lowvlot _ reason field of the low-voltage event at the outlet of the transformer area to be 2, indicating the defect problems of phase failure and poor contact of the transformer area, and otherwise, entering the step five;
① if there is a u at a certain collection point within the event occurrence timea+ub-uc|<50V and max (u)a,ub,uc)>198V, the mesa region is judged to be the phase failure and poor contact defect (Yyn0 distribution defect is C phase, Dyn11 distribution defect is A phase);
② if there is a u at a certain collection point within the event occurrence timea+uc-ub|<50V and max (u)a,ub,uc)>198V, the mesa region is judged to be the phase failure and poor contact defect (Yyn0 distribution defect is B phase, Dyn11 distribution defect is C phase);
③ if there is a u at a certain collection point within the event occurrence timec+ub-ua|<50V and max (u)a,ub,uc)>198V, it was judged that the mesa region was phase loss and defective contact (Yyn0 transformation defect was phase A, Dyn11 transformation defect was phase B).
Wherein: u. ofa、ub、ucThree phase outlet voltage data sequences for the station outlets a, b, c during a low voltage event.
Fifthly, further analyzing the reason of low voltage at the outlet of the platform area
(1) Grouping the low-voltage events at the outlet of the transformer area by day by taking a 10kV line as a container, searching for all low-voltage events at the outlet of the transformer area, which are caused by the grid structure problem of the 10kV line, judging whether a low-voltage event of a 10kV bus exists within the low-voltage time of the outlet of each event, if so, judging the low-voltage event at the outlet of the transformer area at the moment as the low-voltage problem of the bus, and resetting the dt _ lowvlot _ reason field of the low-voltage event at the outlet of the transformer area to be 4, which indicates that the low-voltage at the outlet of the transformer area is caused by the low-voltage problem of the bus.
(2) Grouping the low-voltage events at the outlets of the transformer areas by days by taking a 10kV line as a container, searching for all the events of which the low-voltage reasons are the problems of phase failure and poor contact defects (the value of a dt _ lowvlot _ reason field is '2'), judging that the line failure and the poor contact defects of the 10kV line exist if 2 or more low-voltage events at the outlets of the transformer areas are the problems of phase failure and poor contact defects, resetting a dt _ lowvlot _ reason word of the low-voltage event at the outlet of the related transformer area to '5', and indicating that the low voltage at the outlet of the related transformer area is caused by the problems of the 10kV line defects.
(3) Grouping the station outlet low-voltage events by days by taking a 10kV line as a container, searching for all the events of which the reason of the station outlet low voltage is the 10kV line grid structure problem (the dt _ lowvlot _ reason field value is '6') again, if distribution changes of less than 2 stations exist, judging the related station as the distribution change gear problem, and resetting the dt _ lowvlot _ reason word of the related station outlet low-voltage event to '3'.
Sixthly, forming a platform area outlet low voltage reason analysis result
And forming final reasons of all outlet low-voltage events of the transformer area according to the fourth step and the fifth step, storing the final reasons into a database, performing statistical analysis on all outlet low-voltage events in a statistical period according to actual needs to obtain 7 types of statistical results such as a transformer area outlet low-voltage collector problem, a three-phase imbalance problem, a transformer area defect problem, an unreasonable gear, a 10kV line defect problem, a low bus voltage, a 10kV line grid structure problem and the like, and for the reason of the low-voltage event generated each time, operation and maintenance personnel can specifically conduct low-voltage reason reexamination.
Verification of examples
To verify the effectiveness of the analysis method for the low voltage cause at the outlet of the transformer area in this embodiment, for example, 7 months and 1 day in 2019 of a company in a certain county of a certain province, the partial analysis results are as follows:
the station area outlet low voltage reason result is calculated based on the station area operation data and the 10kV line bus operation data, and the accuracy of the large data station area outlet low voltage reason analysis result reaches 100% through field verification, so that the practical engineering requirement is met.
Claims (8)
1. A transformer area outlet low voltage cause big data analysis method is characterized in that a transformer area acquisition device is used for acquiring three-phase voltage, current and active electric quantity at a power supply outlet side, and a transformer substation bus voltage acquisition device is used for acquiring three-phase or two-phase bus voltage data; preprocessing the acquired data, storing the time sequence data into a background database, and dividing the time sequence data into a distribution room operation data table and a bus voltage data table; generating a transformer area outlet low-voltage event and a bus low-voltage event for the collected transformer area outlet voltage data and 10kV bus voltage data, and defaulting the reason of each transformer area outlet low-voltage event to be a 10kV line grid structure problem; and automatically analyzing the reason of the low voltage at the outlet of the transformer area by using the voltage data at the outlet of the transformer area and the voltage data of the bus.
2. The method for analyzing big data of cause of station exit low voltage according to claim 1, wherein the generating event rule and method of the station exit low voltage are as follows:
and taking the minimum value of the outlet three-phase voltage of each acquisition point transformer area, setting a field dt _ minvlot, if the minimum values of the outlet three-phase voltages of the transformer areas for one hour or more are less than 198V, generating a transformer area outlet low-voltage event, newly adding a transformer area outlet low-voltage reason field dt _ lowvlot _ replay, setting the default value to be 10kV line grid problems, and setting the default value to be 6.
3. The method for analyzing the big data of the cause of the low voltage at the platform area outlet according to claim 1, wherein the rule and the method for generating the event of the low voltage at the outlet of the 10kV bus are as follows:
and (3) taking the minimum value of the three-phase voltage of the 10kV bus at each acquisition point, setting a field bs _ minvlot, and if the minimum value of the voltage of the 10kV bus for one hour or more is less than 9.5kV, generating a bus low-voltage event.
4. The method for analyzing the big data of the cause of the low voltage at the platform outlet according to claim 1, wherein the automatic analysis of the cause of the low voltage at the platform outlet is performed in two steps:
firstly, preliminarily analyzing the reasons of low voltage at the outlet of the platform area;
secondly, further analyzing the reasons of low voltage at the outlet of the transformer area;
the reasons for the low voltage at the outlet of the primary analysis zone are as follows:
(1) when a low-voltage event occurs, if the acquisition point of the distribution room is smaller than 24 points, the acquisition problem of the distribution room collector is judged, the dt _ lowvlot _ reason field in the low-voltage event at the outlet of the distribution room is reset to be 0, the acquisition problem of the distribution room collector is shown, and if the acquisition point of the distribution room is not larger than 24 points, the step (2) is carried out;
(2) calculating the three-phase voltage average value of each acquisition point when a low-voltage event occurs, judging whether the three-phase voltage average values are all larger than 198V when the event occurs, if so, judging that the three-phase unbalance problem of the transformer area exists, resetting dt _ lowvlot _ reason field of the outlet voltage low-voltage event of the transformer area to be 1, representing that the three-phase load unbalance problem of the transformer area exists, and otherwise, entering the step (3);
(3) calculating whether the problems of poor contact and poor contact exist or not when the low-voltage event occurs, wherein the judgment rule is shown as sub-flows ①, ② and ③, if so, judging that the transformer area is the problems of poor contact and poor contact, resetting '2' to the dt _ lowvlot _ replay field of the low-voltage event at the outlet of the transformer area, and indicating the problems of poor contact and poor phase of the transformer area, otherwise, entering the second step;
① if there is a u at a certain collection point within the event occurrence timea+ub-uc|<50V and max (u)a,ub,uc)>198V, judging the platform area to be the problem of phase failure and poor contact, wherein the Yyn0 distribution defect is the C phase, and the Dyn11 distribution defect is the A phase;
② if there is a u at a certain collection point within the event occurrence timea+uc-ub|<50V and max (u)a,ub,uc)>198V, judging the platform area to be the problem of phase failure and poor contact, wherein the Yyn0 transformation defect is the B phase, and the Dyn11 transformation defect is the C phase;
③ if there is a u at a certain collection point within the event occurrence timec+ub-ua|<50V and max (u)a,ub,uc)>198V, judging the platform area to be the problem of phase failure and poor contact, wherein the Yyn0 transformation defect is the phase A, and the Dyn11 transformation defect is the phase B;
wherein: u. ofa、ub、ucThree phase outlet voltage data sequences for the station outlets a, b, c during a low voltage event.
5. The method for analyzing big data of cause of low voltage at exit of station area according to claim 4, wherein the cause of low voltage at exit of station area is further analyzed as follows:
(1) grouping the low-voltage events at the outlets of the transformer area by day by taking the 10kV lines as containers, and searching all low-voltage events at the outlets of the transformer area, which are caused by the grid structure problem of the 10kV lines; whether a 10kV bus low-voltage event exists in each event outlet low-voltage time or not is judged, if yes, the reason of the outlet low-voltage event at the moment of the transformer area is judged to be the bus low-voltage problem, and a dt _ lowvlot _ reacon field of the transformer area outlet low-voltage event is reset to be '4', which indicates that the transformer area outlet low-voltage is caused by the bus low-voltage problem;
(2) grouping the transformer area outlet low-voltage events by day by taking a 10kV line as a container, searching for an event that all transformer area outlet low-voltage reasons are phase failure and poor contact defect problems dt _ lowvlot _ reason, wherein the field value of the event is '2', if 2 or more transformer area low-voltage events are phase failure and poor contact defect problems, judging that the 10kV line is disconnected and the poor contact defect problems, resetting a related transformer area outlet low-voltage event dt _ lowvlot _ reason word to be '5', and indicating that the related transformer area outlet low voltage is caused by the 10kV line defect problems;
(3) grouping the station outlet low-voltage events by days by taking a 10kV line as a container, searching for an event of which the value of the field of the low voltage event dt _ lowvlot _ reason of all station outlet is 6 because of a 10kV line grid structure problem, judging the related station as a distribution transformer gear problem if distribution transformers of less than 2 stations exist, and resetting the word of the low voltage event dt _ lowvlot _ reason of the related station outlet to be 3.
6. The method for analyzing the cause big data of the low voltage at the platform outlet according to claim 1, wherein the three-phase voltage, the current and the active electric quantity at the power supply outlet are collected, and the sampling interval is generally 15 minutes or 30 minutes; the three-phase or two-phase bus voltage data are collected, and the collection interval is generally 15 minutes or 30 minutes.
7. The analysis method for the big data of the cause of low voltage at the platform outlet according to claim 1, wherein the method for preprocessing the collected data comprises the following steps:
the method comprises the steps that the field data of the three-phase voltage, the three-phase current and the bus voltage of an outlet of a platform area cannot be null, and for the platform area, if only one field data of the three-phase voltage and the three-phase current of a certain acquisition point is null, the data of the acquisition point is deleted; for 10kV bus voltage, if only two or three field data of three-phase voltage of a certain acquisition point are null, deleting the data of the acquisition point data; and after data preprocessing, respectively sequencing the transformer area data and the 10kV bus voltage in an ascending order according to the acquisition time.
8. The system for implementing the analysis method of the table-outlet low-voltage cause big data according to claims 1-7 is a computer device, comprising a memory, a processor and a computer program stored in the memory and running on the processor, wherein the processor executes the program to implement the following steps:
(1) three-phase voltage, current, reactive power and active power electrical quantity data and three-phase or two-phase bus voltage data at the power supply outlet side are collected and stored in a database;
(2) preprocessing the acquired data, and respectively sequencing the transformer area data and the 10kV bus voltage in an ascending order according to acquisition time after preprocessing the data;
(3) generating an event of a platform area outlet low voltage, taking the minimum value of the outlet three-phase voltage of each acquisition point platform area, setting a field dt _ minvlot, if the minimum values of the outlet three-phase voltages of the platform areas for one hour or more are less than 198V continuously, generating the event of the platform area outlet low voltage, newly adding a platform area outlet low voltage reason field dt _ lowvlot _ reacon, setting the default value to be 10kV line grid problems, and setting the field dt _ minvlot to be 6%;
(4) generating an event at a low voltage of a bus, and generating an event rule at a low voltage of a 10kV bus outlet: taking the minimum value of the three-phase voltage of the 10kV bus at each acquisition point, setting a field bs _ minvlot, and if the minimum value of the voltage of the 10kV bus is less than 9.5kV for one hour or more continuously;
(5) preliminary analysis of the cause of low voltage at the outlet of the area
When a low-voltage event occurs, if the acquisition point of the distribution room is smaller than 24 points, the acquisition problem of the distribution room collector is judged, the dt _ lowvlot _ reason field in the low-voltage event at the outlet of the distribution room is reset to be 0, the acquisition problem of the distribution room collector is shown, and if the acquisition point of the distribution room is not larger than 24 points, the next step is carried out;
calculating the three-phase voltage average value of each acquisition point when a low-voltage event occurs, judging whether the three-phase voltage average values are all larger than 198V when the event occurs, if so, judging that the three-phase unbalance problem of the transformer area exists, resetting dt _ lowvlot _ reason field of the low-voltage event at the outlet of the transformer area to be 1, representing that the three-phase load unbalance problem of the transformer area exists, and otherwise, entering the next step;
calculating whether the problems of poor contact and poor contact exist when a low-voltage event occurs, judging the rule as a sub-flow, if so, judging that the transformer area has the problems of poor contact and poor contact, and resetting a dt _ lowvlot _ reacon field of the outlet low-voltage event of the transformer area to be 2 to represent the problems of poor contact and poor contact of the transformer area;
(6) further analyzing the reason of low voltage at the outlet of the platform area
Grouping the low-voltage events at the outlets of the transformer area by day by taking the 10kV lines as containers, and searching all low-voltage events at the outlets of the transformer area, which are caused by the grid structure problem of the 10kV lines; whether a 10kV bus low-voltage event exists in the event outlet low-voltage time of each time; if the bus low-voltage problem exists, the reason of the outlet low-voltage event at the moment of the platform area is judged as the bus low-voltage problem, and the dt _ lowvlot _ reason field of the outlet low-voltage event of the platform area is reset to be 4, which indicates that the outlet low-voltage of the platform area is caused by the bus low-voltage problem;
grouping the transformer area outlet low-voltage events by day by taking a 10kV line as a container, searching for an event that all transformer area outlet low-voltage reasons are phase failure and poor contact defect problems dt _ lowvlot _ reason, wherein the field value of the event is '2', if 2 or more transformer area low-voltage events are phase failure and poor contact defect problems, judging that the 10kV line is disconnected and the poor contact defect problems, resetting a related transformer area outlet low-voltage event dt _ lowvlot _ reason word to be '5', and indicating that the related transformer area outlet low voltage is caused by the 10kV line defect problems;
grouping the low-voltage events at the outlets of the transformer areas by day by taking a 10kV line as a container, searching for the event of which the value of the field of the low-voltage event dt _ lowvlot _ reason of all the outlets of the transformer areas is 6 because of the grid structure problem of the 10kV line again, judging the transformer area to be a transformer gear problem if the transformer area has less than 2 transformer areas, and resetting the word dt _ lowvlot _ reason of the low-voltage event dt _ lowvlot _ reason of the outlet of the transformer area to be 3;
(7) forming the final low voltage event reasons of all the platform zone outlets according to the above, and storing the final low voltage event reasons into a database; and performing statistical analysis on all outlet low-voltage events in the statistical period to obtain 7 types of statistical results of the problem of the platform outlet low-voltage collector, the problem of three-phase imbalance, the problem of platform area defects, unreasonable gears, the problem of 10kV line defects, the problem of low bus voltage and the problem of 10kV line net racks.
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