CN110849541B - High and low temperature pulsating pressure tracing method and device - Google Patents
High and low temperature pulsating pressure tracing method and device Download PDFInfo
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- CN110849541B CN110849541B CN201911190321.1A CN201911190321A CN110849541B CN 110849541 B CN110849541 B CN 110849541B CN 201911190321 A CN201911190321 A CN 201911190321A CN 110849541 B CN110849541 B CN 110849541B
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- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L27/00—Testing or calibrating of apparatus for measuring fluid pressure
- G01L27/002—Calibrating, i.e. establishing true relation between transducer output value and value to be measured, zeroing, linearising or span error determination
- G01L27/005—Apparatus for calibrating pressure sensors
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Abstract
The invention relates to a high-temperature and low-temperature pulsating pressure tracing method and device, belonging to the technical field of metering. The core of the invention is that the pulsating pressure is converted into dynamic force by the force transmission mechanism, the standard dynamic force measurement system can trace the static force standard and the dynamic force standard of the upper-level metering mechanism, and the tracing relation is clear. The method overcomes the problem that the pulse pressure calibration tracing under high and low temperature conditions cannot be carried out due to the absence of high and low temperature standard pressure sensors in the existing pulse pressure relative method calibration, and fills the blank of the pulse pressure tracing method under high and low temperature conditions.
Description
Technical Field
The invention relates to a high-temperature and low-temperature pulsating pressure tracing method and device, belonging to the technical field of metering.
Background
With the development of scientific technology, the measurement of dynamic parameters becomes more and more important. The dynamic pressure test is widely applied to the field of national defense and military industry such as aerospace, weapons and the like, and the actual working environment of the dynamic pressure test is often in severe environments such as high temperature or low temperature and the like. The pulsating pressure is the most common dynamic pressure, and is required to be measured in occasions such as pressure monitoring in an aircraft engine and a gas turbine, real-time pressure measurement in a combustion chamber, stratospheric flight of an aircraft, various simulation tests by using a wind tunnel and the like. The existing pulsating pressure calibration is carried out in a laboratory at normal temperature, the influence caused by temperature change is not considered, and errors inevitably exist in the calibration result. The source tracing mode of the pulsating pressure under the normal temperature environment is to trace the source of a standard pressure sensor to a laboratory dynamic pressure standard, and because no standard pressure sensor which can be used under the high and low temperature environments exists, the source tracing mode under the normal temperature environment can not be adopted to trace the source of the pulsating pressure calibration under the high and low temperature environments, and the accuracy and reliability of the measurement of the pulsating pressure under the high and low temperature environments can not be ensured.
Disclosure of Invention
The invention aims to solve the problem that the prior art cannot carry out pulse pressure calibration tracing in high and low temperature environments, and provides a method and a device for carrying out pulse pressure calibration tracing in high and low temperature environments, which can ensure the accuracy of high and low temperature pulse pressure calibration and the tracing reliability under high and low temperature conditions.
The invention converts the pulsating pressure into the dynamic force through the force transmission mechanism at high and low temperatures through the corresponding relation between the static pressure and the static force at normal temperature and at high and low temperatures and between the pulsating pressure and the dynamic force at normal temperature. The standard dynamic force measuring system can trace the static force and dynamic force standard of the upper-level metering mechanism, and the static pressure can trace the normal-temperature and high-low-temperature static pressure standard of the upper-level metering mechanism, so that the pulse pressure calibration can be traced under high and low temperature environments.
The purpose of the invention is realized by the following technical scheme:
a method for calibrating and tracing pulsating pressure in high and low temperature environments comprises the following steps:
step one, obtaining a corresponding relation between pulsating pressure and dynamic force at normal temperature;
step two, obtaining the corresponding relations between the static pressure and the static force under the conditions of normal temperature and high and low temperatures respectively
By comparing the relationship between static pressure and static force at high and low temperatures and normal temperature, the corrected value X1 of the corresponding relationship between pressure and force in high and low temperature environment is obtained.
Step three, obtaining the corresponding relation between the pulsating pressure and the dynamic force under the high and low temperature environment,
the pulsating pressure is converted into dynamic force, and the standard dynamic force measuring system can trace the static force standard and the dynamic force standard of the upper-level metering mechanism.
The dynamic pressure is a pulsating pressure.
The device for realizing the method comprises the following steps: a standard dynamic force sensor [1], a force transmission mechanism [2], a pressure sensor [3], a standard digital pressure gauge [4], a cavity [5] and a temperature box [6 ]. A pressure sensor [3] is arranged on the side wall of the chamber [5], and the bottom of the chamber [5] can move up and down; the standard digital pressure gauge [4] is connected with the chamber [5] and is used for measuring the pressure in the chamber [5 ]; the standard dynamic force sensor [1] and the force transmission mechanism [2] are sequentially connected with the top of the cavity [5 ]; the incubator [6] is arranged outside the chamber [5] and provides high and low temperature environment for the chamber [5 ].
The device comprises the following measurement methods:
at normal temperature, the chamber [5] is sealed]Applying a pulsating signal through a pressure sensor [3]]Measurement Chamber [5]Internal pulsating pressure passing through force-transmitting mechanism [2]]Transmitted to a standard dynamic force sensor [1]]To clarify the corresponding relationship between dynamic force and pulsating pressure at normal temperature
By means of a standard digital pressure gauge [4]]Measurement Chamber [5]Internal static pressure, pressure passing through force-transmitting mechanism [2]]Transmitted to a standard dynamic force sensor [1]]Obtaining the corresponding relation between the static force and the static pressure under the normal temperature condition
Take away the pressure sensor [3]Temperature box [6]]Heating or cooling is carried out, and the chamber (5) is controlled]The temperature of (2). By means of a standard digital pressure gauge [4]]Measurement Chamber [5]Internal static pressure, pressure passing through force-transmitting mechanism [2]]Transmitted to a standard dynamic force sensor [1]]Obtaining the static force and the static force under the conditions of high and low temperatureCorresponding relation of state pressure
Comparing the corresponding relation between the static force and the static pressure in the high-low temperature environment and the normal temperature environment to obtain the influence value X1 of the high-low temperature on the corresponding relation between the static force and the static pressure. And correcting the corresponding relation between the dynamic force and the pulsating pressure by using X1 to obtain the pulsating pressure in the high and low temperature environment. The pulsating pressure is converted into dynamic force, and the standard dynamic force measuring system can trace the static force standard and the dynamic force standard of the upper-level metering mechanism.
Advantageous effects
The invention discloses a method and a device for calibrating and tracing pulsating pressure in high and low temperature environments, and solves the problems that the conventional pulsating pressure calibrating device cannot realize dynamic pressure calibration in the high and low temperature environments, and the source tracing cannot be performed in a calibrating method adopted at normal temperature because high and low temperature standard pressure sensors are not available. The dynamic pressure (pulsating pressure) is converted into dynamic force, and the pulsating pressure calibration traceability in the high-temperature environment and the low-temperature environment is realized by utilizing the corresponding relation between the static force and the static pressure in the high-temperature environment, the low-temperature environment and the normal-temperature environment and the dynamic force and the dynamic pressure in the normal-temperature environment.
Drawings
FIG. 1 is a schematic diagram of the principles of the present invention;
fig. 2 shows an implementation of the correspondence relationship between the physical quantities in the normal temperature environment.
The pressure sensor comprises 1-a standard force sensor, 2-a force transmission mechanism, 3-a pressure sensor, 4-a standard digital pressure gauge, 5-a cavity and 6-a temperature box.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1, the high and low temperature pulsating pressure tracing method includes the following measurement processes of the device in normal temperature and low temperature environments:
under the room temperature of 23.5 ℃ in the laboratory, the frequency f is applied to the chamber (5)1By means of a pressure sensor (3) measuring the pulsating pressure P in the chamber (5)f1The pulsating pressure is transmitted to the standard dynamic force sensor (1) through the force transmission mechanism (2), and the standard dynamic force sensor (1) senses the dynamic force Ff1To clarify the corresponding relationship between dynamic force and pulsating pressure at normal temperature
Measuring the static pressure P in the chamber (5) by means of a standard digital pressure gauge (4)1The pressure in the chamber is transmitted to a standard dynamic force sensor (1) through a force transmission mechanism (2), and the standard dynamic force sensor (1) senses a static force F1Obtaining the corresponding relation between the static force and the static pressure under the normal temperature condition
And taking away the pressure sensor (3), and sealing the mounting hole by using a special plug. Cooling by a temperature box (6), and controlling the temperature of the chamber (5) to be T1. After 30 minutes of temperature stabilization, the static pressure P in the chamber (5) is measured by a standard digital pressure gauge (4)2The standard dynamic force sensor (1) senses the static force F2Obtaining the corresponding relation between the static force and the static pressure under the low temperature condition
When compared with normal temperature environment
In a low temperature environment
Considering the influence of temperature variation, the relationship between static force and static pressure has variation delta1. Applying a frequency f to the chamber (5)1The pulsating pressure is generated in the chamber (5) and is transmitted to the standard dynamic force sensor (1) through the force transmission mechanism (2), and the standard dynamic force sensor (1) senses the dynamic force Ff2. The pulsating pressure P in the chamber (5) is not provided with a pressure sensor which can be used for measuring the pulsating pressure in the low-temperature environmentf2Is unknown. Using known movementsDynamic force Ff2And a change amount delta at low temperature1To obtain
In this embodiment, the standard digital pressure (4) is traceable to the static pressure standard, the pressure sensor (3) is traceable to the dynamic pressure standard, and the standard dynamic force sensor (1) is traceable to the dynamic pressure standard and the static force standard, so that the tracing of the pulsating pressure in the high and low temperature environments is realized through the obtained corresponding relationship between the pulsating pressure and the dynamic force.
Conclusion
The method and the device for calibrating and tracing the pulsating pressure under the high-temperature and low-temperature environments, which are provided by the patent, are combined with the working environment of the current pulsating pressure measurement, so that the tracing chain is clear, and the feasibility is strong. The method breaks through the existing pulse pressure calibration tracing method, can not be applied to the limitation of high-temperature and low-temperature pulse pressure calibration due to the fact that high-temperature and low-temperature standard pressure sensors for measuring pulse pressure are not arranged, solves the problem that the pulse pressure calibration under the high-temperature and low-temperature environments can not be realized at present, and guarantees the accuracy and reliability of the measurement result of the pulse pressure under the special environment. The above detailed description is intended to illustrate the objects, aspects and advantages of the present invention, and it should be understood that the above detailed description is only exemplary of the present invention and is not intended to limit the scope of the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (1)
1. A high and low temperature pulsation pressure tracing method is characterized in that: a tracing method for high and low temperature pulsating pressure comprises the following steps:
step one, obtaining a corresponding relation between pulsating pressure and dynamic force at normal temperature;
step two, obtaining the corresponding relations between the static pressure and the static force under the conditions of normal temperature and high and low temperatures respectively
Obtaining a corrected value X1 of the corresponding relation of the high-temperature environment and the low-temperature environment to the pressure and the force by comparing the relation of the static pressure and the static force at the high temperature, the low temperature and the normal temperature;
step three, obtaining the corresponding relation between the pulsating pressure and the force value under the high and low temperature environment,
the device for realizing the tracing method of the high and low temperature pulsating pressure comprises the following steps: the device comprises a standard dynamic force sensor (1), a force transmission mechanism (2), a pressure sensor (3), a standard digital pressure gauge (4), a cavity (5) and an incubator (6); the side wall of the chamber (5) is provided with the pressure sensor (3), and the bottom of the chamber (5) can move up and down; the standard digital pressure gauge (4) is connected with the chamber (5) and is used for measuring the pressure in the chamber (5); the standard dynamic force sensor (1) and the force transmission mechanism (2) are sequentially connected with the top of the cavity (5); the incubator (6) is arranged outside the chamber (5) and provides a high-temperature and low-temperature environment for the chamber (5);
the device comprises the following measurement processes:
under the condition of normal temperature, the pressure in the cavity (5) is measured through a standard digital pressure gauge (4), the pressure is transmitted to a standard dynamic force sensor (1) through a force transmission mechanism (2), and the corresponding relation between static force and static pressure under the condition of normal temperature is obtained
To the chamber (5)) Pulsating pressure is applied, the pulsating pressure in the cavity (5) is measured through the pressure sensor (3), the pulsating pressure is transmitted to the standard dynamic force sensor (1) through the force transmission mechanism (2), and the corresponding relation between the dynamic force and the pulsating pressure at normal temperature is obtained
Taking away the pressure sensor (3), heating or cooling by using an incubator (6), and controlling the temperature of the chamber (5); the pressure in the cavity (5) is measured through a standard digital pressure gauge (4), the pressure is transmitted to a standard dynamic force sensor (1) through a force transmission mechanism (2), and the corresponding relation between the static force and the static pressure under the conditions of high temperature and low temperature is obtained
Comparing the corresponding relation between the static force and the static pressure in the high-low temperature environment and the normal temperature environment to obtain an influence value X1 of the high-low temperature on the corresponding relation between the static force and the static pressure; and correcting the corresponding relation between the dynamic force and the pulsating pressure by using X1 to obtain the pulsating pressure in the high and low temperature environment.
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| CN112179612A (en) * | 2020-09-27 | 2021-01-05 | 中国航空工业集团公司北京长城计量测试技术研究所 | Dynamic pressure sensor |
| CN112304489B (en) * | 2020-10-26 | 2022-03-29 | 中国航空工业集团公司北京长城计量测试技术研究所 | High-low temperature dynamic pressure generation method and device |
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| CN112326110B (en) * | 2020-11-08 | 2022-07-12 | 中国航空工业集团公司北京长城计量测试技术研究所 | High-low temperature sine pressure calibration device based on pressure-force value conversion |
| CN112326111B (en) * | 2020-11-08 | 2022-07-12 | 中国航空工业集团公司北京长城计量测试技术研究所 | High-low temperature sine pressure calibration device |
| CN113447234A (en) * | 2021-04-27 | 2021-09-28 | 中国空气动力研究与发展中心设备设计与测试技术研究所 | Wind tunnel electronic pressure scanning valve traceability device and traceability method thereof |
| CN115326285B (en) * | 2022-10-13 | 2023-03-24 | 中国空气动力研究与发展中心设备设计与测试技术研究所 | Low-temperature pulsating pressure calibration device |
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