CN110058056A - A kind of nonstandard test fixture - Google Patents
A kind of nonstandard test fixture Download PDFInfo
- Publication number
- CN110058056A CN110058056A CN201811562456.1A CN201811562456A CN110058056A CN 110058056 A CN110058056 A CN 110058056A CN 201811562456 A CN201811562456 A CN 201811562456A CN 110058056 A CN110058056 A CN 110058056A
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- nonstandard
- adapter
- side port
- test fixture
- setting
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1253—Measuring galvano-magnetic properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a kind of nonstandard test fixtures, which is characterized in that including the sample placement unit for placing material sample, nonstandard adapter 1 and nonstandard adapter 2；Wherein, sample placement unit is between nonstandard adapter 1 and nonstandard adapter 2；The interior side port of the nonstandard adapter 1, the interior side port of nonstandard adapter 2 are connect with the sample placement unit, and the exterior side port of the nonstandard adapter 1, the exterior side port of nonstandard adapter 2 are used as test end face, for outputing test data.And nonstandard fixture can choose the size of inner and outer conductor arbitrarily in order to sample processing in the present invention, so that the sample preparation difficulty of material sample be greatly reduced, and then effectively improve the testing efficiency and measuring accuracy of material electromagnetic parameter.
Description
Technical field
The present invention relates to a kind of nonstandard test fixtures, are used for material measuring electromagnetic parameters, belong to microwave engineering, material electromagnetism
Parameter testing technical field.
Background technique
With the development of material science and microwave engineering, electromagnetic compatibility technology, the effect of electromagnetic wave transparent material, absorbing material becomes
It is very significant, therefore the measuring technique of research material electromagnetic parameter also becomes more and more important.To radio frequency absorbing material performance
Simulation calculation in, the measurement of dielectric constant and magnetic conductivity is crucial reasonably select material, device etc..
Related, the mesh of the measurement method of electromagnetic parameter and form, dispersion characteristics and the frequency range of application of measured material etc.
Preceding common measurement method both at home and abroad has Resonant-cavity Method, free-space Method, open circuit termination coaxial axis method and Transmission line method etc..Its
In, what is be widely used is " transmission/bounce technique " (Transmission/Reflection method), abbreviation TR method.Because
It has the characteristics that measure that bandwidth, measurement accuracy are high, are suitable for coaxial and Wave guide system and simple to operation.
The currently used electromagnetic parameters software based on TR method (i.e. transmission bounce technique) is surveyed according to Network Analyzer
The S parameter of examination directly calculates the electromagnetic parameter of specimen material, i.e. relative dielectric constant εrWith relative permeability μr.Existing software
Calculation process is as shown in Figure 1.
The shortcomings that existing scheme: existing software for calculation is only applicable to the test system using standard transmission line or waveguide fixture
System, if there is special-shaped or nonstandard structure to occur in test fixture, it will produced to the accuracy of the calculated result of material electromagnetic parameter
Raw larger impact.
Summary of the invention
Test fixture in the prior art there are aiming at the problem that, the purpose of the present invention is to provide a kind of applicability is wider array of
Nonstandard test fixture.
The technical solution of the present invention is as follows:
A kind of nonstandard test fixture, which is characterized in that including the sample placement unit for placing material sample, nonstandard turn
Connector 1 and nonstandard adapter 2；Wherein, sample placement unit is between nonstandard adapter 1 and nonstandard adapter 2；It is described non-
The interior side port of the interior side port, nonstandard adapter 2 of marking adapter 1 is connect with the sample placement unit, the nonstandard adapter 1
Exterior side port, nonstandard adapter 2 exterior side port as test end face, for outputing test data.
Further, the sample placement unit includes the coaxial line being made of setting-out inner conductor and setting-out outer conductor, institute
Coaxial line is stated for being connected and fixed sample to be tested；The coaxial line is electrically connected with the nonstandard adapter 1, nonstandard adapter 2.
Further, the coaxial line passes through the interior side port of flange and the nonstandard adapter 1, nonstandard adapter 2
Interior side port is connected and fixed.
Further, the setting-out outer conductor is equipped with several positioning screw holes, will be to test sample for cooperating with set screw
Product are fixed between the setting-out outer conductor and the setting-out inner conductor.
Further, the interior side port of the nonstandard adapter 1, nonstandard adapter 2 interior side port be respectively with it is described
The matched coaxial configuration of coaxial line.
Further, the inner conductor of the inner conductor of the nonstandard adapter 1, nonstandard adapter 2 is put with described by screw thread
The connection of sample inner conductor.
Further, one end of the setting-out inner conductor is equipped with locating slot, the other end is equipped with positioning protrusion, and described nonstandard turn
The interior side port of connector 1 is equipped with to be equipped with the matched locating slot of the positioning protrusion, the interior side port of the nonstandard adapter 2
With the matched positioning protrusion of locating slot of the setting-out inner conductor.
Further, the characteristic impedance of the coaxial line is 50 ohm.
Further, the exterior side port of the nonstandard adapter 1, nonstandard adapter 2 exterior side port be equipped with standard N-type connect
Mouthful.
The hardware of nonstandard test fixture of the invention constitutes as shown in Figure 2.From figure 2 it can be seen that by uniform transmission line
The S parameter (referred to as, [S] _ dut) for the sample placement unit that (off-standard size) and material sample are constituted, is for calculating material
The core data of electromagnetic parameter.But it is really contained in the S parameter (referred to as, [S] _ measure) that test end surface measurement obtains non-
Mark adapter 1 S parameter (referred to as, [S] _ connector1) and nonstandard adapter 2 S parameter (abbreviation, [S] _
Connector2 information).If the data of [S] _ measure is directly used to calculate material electromagnetic parameter, will certainly generate very
Big calculating error.
At test initial stage, if to nonstandard adapter 1 and nonstandard adapter 2 carry out T-shaped state (Through state, i.e., it is direct-connected
State), 3 kinds of surveys under R state (Reflect state, i.e. reflective condition) and L state (Line state, i.e. extended line state)
It tries (TRL state is as shown in Figure 3), and the test data under three state is imported in fixture calibration module, then fixture calibrating die
Block will calculate the S parameter of nonstandard adapter 1 and nonstandard adapter 2, i.e. and [S] _ connector1 and [S] _
connector2.The data of [S] _ connector1 and [S] _ connector2 are utilized, fixture calibration module will use De- embedding
Algorithm is eliminated [the S] _ connector1 for including in [S] _ measure data and [S] _ connector2 information, and then is counted
Core data [S] _ dut needed for calculating electromagnetic parameter.Software for calculation utilization [S] _ dut can accurately calculate the electromagnetism of material
Parameter.
The data handling procedure for the De- embedding algorithm that fixture calibration module uses is as shown in Figure 4.Firstly, known S is joined
Number [S] _ measure, [S] _ connector1 and [S] _ connector2 be converted to corresponding transmission matrix [T] _ measure,
[T] _ connector1 and [T] _ connector2.Then, be calculated with formula 1 out the transmission matrix [T] of device under test DUT _
Dut, wherein [T] _ connector1-1It is the inverse matrix of [T] _ connector1, [T] _ connector2-1Be [T] _
The inverse matrix of connector2.Finally, transmission matrix [T] _ dut is converted to S parameter to get core data [S] _ dut has been arrived.
[T] _ dut=[T] _ connector1-1*[T]_measure-1*[T]_connector2-1Formula (1)
Calculation process of the invention is as shown in Figure 5.
In above-mentioned calculating process, fixture calibration module can calculate the S parameter of nonstandard adapter.This can be used as this
One additional function of invention carries out the S parameter test of various nonstandard adapters.
In order to realize the TRL calibration algorithm in this set test method, the present invention devises a set of nonstandard test fixture, nonstandard
The specific structure of test fixture is as shown in Figure 6.Setting-out inner conductor and setting-out outer conductor constitute setting-out coaxial line, and material sample is put
It sets among setting-out inner conductor and setting-out outer conductor, set screw is screwed into positioning screw hole to fixed material sample in setting-out
Position in coaxial line.The outer diameter of setting-out inner conductor and the internal diameter of setting-out outer conductor can freely be chosen, but should protect as far as possible
The particular-trade impedance for demonstrate,proving setting-out coaxial line is 50 ohm.
Nonstandard adapter 1 and nonstandard adapter 2 are used to realize the transition of setting-out coaxial line to standard N-type interface, to guarantee
The N-type coaxial cable that standard can be used in vector network analyzer is tested.Nonstandard adapter 1 and nonstandard adapter 2 it is interior
Conductor is connect by screw thread with setting-out inner conductor, to realize the electrical contact of inner conductor.Nonstandard adapter 1 and nonstandard adapter 2
Outer conductor connect with setting-out outer conductor by locating flange, to realize the electrical contact of outer conductor.
This set test fixture is by flexible combination, three state needed for TRL calibration may be implemented, structure such as Fig. 7 institute
Show.As shown in Fig. 7 (a), nonstandard adapter 1 and nonstandard adapter 2 are docked, and the T-shaped state in Fig. 3 (a) can be realized.Such as Fig. 7 (b)
Known, nonstandard adapter 1 connects a short-circuit face with each comfortable terminal of nonstandard adapter 2, and the R shape in Fig. 3 (b) can be realized
State.As shown in Fig. 7 (c), nonstandard adapter 1 is connected with nonstandard adapter 2 by setting-out coaxial line, Fig. 3 (c) can be realized
In L state.
Compared with prior art, the positive effect of the present invention are as follows:
By introducing TRL calibration algorithm, solves the problems, such as that conventional test methodologies are limited to standard test fixture, widen
The optional range of test fixture, in order to cooperate the calibration algorithm present invention to devise a set of corresponding nonstandard test fixture；In addition, by
In by the lesser limitation of standard fixture size, very big difficulty usually is brought to the sample making course of material sample, and in the present invention
Nonstandard fixture can arbitrarily choose the size of inner and outer conductor in order to sample processing, so that the sample preparation of material sample be greatly reduced
Difficulty, and then effectively improve the testing efficiency and measuring accuracy of material electromagnetic parameter.
Detailed description of the invention
Fig. 1 is existing software calculation flow chart；
Fig. 2 is that nonstandard test fixture constitutes figure；
Fig. 3 is nonstandard adapter TRL state diagram, in which:
(a) it is T-shaped state, (b) is R state, (c) is L state；
Fig. 4 is De- embedding algorithm data process flow diagram；
Fig. 5 is the test method flow chart using the nonstandard test fixture of the present invention；
Fig. 6 is nonstandard test fixture structure chart, in which:
(a) it is front view (left side) and cross-sectional view (right side), (b) is side view；
Fig. 7 is nonstandard test fixture TRL state diagram, in which:
(a) it is T-shaped state, (b) is R state, (c) is L state.
Specific embodiment
Software for calculation of the invention can be write based on MATLAB.Software includes data transmission module, fixture calibration
Module, TR computing module and data are shown and memory module.Software for calculation is counted by network and vector network analyzer
According to communication, control and computing function are realized.The framework relationship of software for calculation and vector network analyzer and nonstandard test fixture
As shown in Fig. 6.
The operating method of software for calculation the following steps are included:
1) software for calculation is run, counted by the test frequency of system display interface setting vector network analyzer, measurement,
The length and thickness of sample of intermediate-frequency bandwidth and test fixture.
2) S parameter at this time is tested in the case where " T-shaped state " shown in nonstandard adapter 1 and 2 is in Fig. 3 (a)
([S] _ T) and the communication and storage for completing data.
3) S parameter at this time is tested in the case where " R state " shown in nonstandard adapter 1 and 2 is in Fig. 3 (b)
([S] _ R) and the communication and storage for completing data.
4) S parameter at this time is tested in the case where " L state " shown in nonstandard adapter 1 and 2 is in Fig. 3 (c)
([S] _ L) and the communication and storage for completing data.
5) sample to be tested is mounted in nonstandard fixture, is under test mode shown in Fig. 6 (a), test S ginseng at this time
Number ([S] _ measure) and the communication and storage for completing data.
6) software first with [S] _ T, [S] _ R and [S] _ L calculate the S parameter [S] of nonstandard adapter 1 and 2 _
Connector1 and [S] _ connector2.Then using De- embedding algorithm eliminate [S] _ measure in include [S] _
Connector1 and [S] _ connector2 information, obtain core data [S] _ dut.Finally [S] _ dut is used to calculate sample
The electromagnetic parameter of material, i.e. relative dielectric constant εrWith relative permeability μr。
In conclusion being not intended to limit the scope of the present invention the above is only preferable implementation method of the invention.It is all
Within the spirit and principles in the present invention, any modification, equivalent substitution, improvement and etc. done should be included in guarantor of the invention
Within the scope of shield.
Claims (9)
1. a kind of nonstandard test fixture, which is characterized in that including the sample placement unit for placing material sample, nonstandard switching
First 1 and nonstandard adapter 2；Wherein, sample placement unit is between nonstandard adapter 1 and nonstandard adapter 2；Described nonstandard turn
The interior side port of connector 1, nonstandard adapter 2 interior side port connect with the sample placement unit, the nonstandard adapter 1 it is outer
The exterior side port conduct test end face of side ports, nonstandard adapter 2, for outputing test data.
2. nonstandard test fixture as described in claim 1, which is characterized in that the sample placement unit includes by leading in setting-out
The coaxial line that body and setting-out outer conductor are constituted, the coaxial line is for being connected and fixed sample to be tested；The coaxial line with it is described non-
Mark adapter 1, nonstandard adapter 2 is electrically connected.
3. nonstandard test fixture as claimed in claim 2, which is characterized in that the coaxial line passes through flange and described nonstandard turn
The interior side port of connector 1, nonstandard adapter 2 interior side port be connected and fixed.
4. nonstandard test fixture as claimed in claim 2, which is characterized in that the setting-out outer conductor is equipped with several positioning spiral shells
Hole cooperates for set screw and sample to be tested is fixed between the setting-out outer conductor and the setting-out inner conductor.
5. nonstandard test fixture as claimed in claim 2, which is characterized in that the interior side port of the nonstandard adapter 1, nonstandard
The interior side port of adapter 2 be respectively and the matched coaxial configuration of the coaxial line.
6. nonstandard test fixture as claimed in claim 5, which is characterized in that the inner conductor of the nonstandard adapter 1, nonstandard turn
The inner conductor of connector 2 is connect by screw thread with the setting-out inner conductor.
7. the nonstandard test fixture as described in claim 2 or 5, which is characterized in that one end of the setting-out inner conductor is equipped with fixed
Position slot, the other end are equipped with positioning protrusion, and the interior side port of the nonstandard adapter 1 is equipped with and the matched positioning of the positioning protrusion
Slot, the interior side port of the nonstandard adapter 2 are equipped with the matched positioning protrusion of locating slot with the setting-out inner conductor.
8. nonstandard test fixture as claimed in claim 2, which is characterized in that the characteristic impedance of the coaxial line is 50 ohm.
9. nonstandard test fixture as described in claim 1, which is characterized in that the exterior side port of the nonstandard adapter 1, nonstandard
The exterior side port of adapter 2 is equipped with standard N-type interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811562456.1A CN110058056B (en) | 2018-12-20 | 2018-12-20 | Non-standard test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811562456.1A CN110058056B (en) | 2018-12-20 | 2018-12-20 | Non-standard test fixture |
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| Publication Number | Publication Date |
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| CN110058056A true CN110058056A (en) | 2019-07-26 |
| CN110058056B CN110058056B (en) | 2021-09-14 |
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| CN201811562456.1A Active CN110058056B (en) | 2018-12-20 | 2018-12-20 | Non-standard test fixture |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323651A (en) * | 2020-04-22 | 2020-06-23 | 广西科技大学 | Clamp suitable for impedance measurement under high-temperature and high-frequency conditions |
| CN112345912A (en) * | 2020-09-25 | 2021-02-09 | 曙光信息产业(北京)有限公司 | Material characteristic testing method and device, electronic equipment and storage medium |
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| CN107091847A (en) * | 2017-06-01 | 2017-08-25 | 厦门大学 | A kind of dielectric material measuring electromagnetic parameters device and measuring method |
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| US5446393A (en) * | 1993-05-21 | 1995-08-29 | Schaefer; Richard K. | Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin |
| CN201926719U (en) * | 2010-08-25 | 2011-08-10 | 上海市计量测试技术研究院 | Flange coaxial test device for shielding effectiveness of plane type shielding materials |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323651A (en) * | 2020-04-22 | 2020-06-23 | 广西科技大学 | Clamp suitable for impedance measurement under high-temperature and high-frequency conditions |
| CN112345912A (en) * | 2020-09-25 | 2021-02-09 | 曙光信息产业(北京)有限公司 | Material characteristic testing method and device, electronic equipment and storage medium |
| CN112345912B (en) * | 2020-09-25 | 2024-05-31 | 曙光信息产业(北京)有限公司 | Material characteristic testing method, device, electronic equipment and storage medium |
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| CN110058056B (en) | 2021-09-14 |
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