CN107144627A - Conductive solids Non-Destructive Testing circuit and the continuous stress quantitative evaluating method based on it - Google Patents
Conductive solids Non-Destructive Testing circuit and the continuous stress quantitative evaluating method based on it Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/83—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/18—Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
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Abstract
The present invention discloses a kind of conductive solids Non-Destructive Testing circuit and the continuous stress quantitative evaluating method based on it, and nondestructive testing signal is obtained by conductor Non-Destructive Testing circuit；By way of experiment and numerical simulation are combined, stress distribution continuous to conductive solids carries out qualitative assessment；Specially：It is determined by experiment nondestructive testing signal and the relational expression of external load；The regularity of distribution of electrical conductivity is obtained by piezoresistive effect, the relation between continuous stress distribution and external load is obtained by mathematical calculation model；According to the external force size of estimation, the stress at the conductor any point is obtained；So as to realize the qualitative assessment to the continuous stress distribution of conductive solids, earlier damage prediction of the present processes to conductive solids lays the foundation, it can be used for realizing in the health forecast of conductor and semiconductor key member, for ensureing that the safety of key structure has very important significance.
Description
Technical field
The invention belongs to conductive solids stress field of non destructive testing, more particularly to a kind of continuous stress detection.
Background technology
Common parts of (partly) the conductive solids component as engineering in practice, are widely used in traffic, Aero-Space, core
In the key equipment of many engineering fields such as energy, electric power, its security and durability produce important shadow to key equipment performance
Ring.And (partly) conductive solids component can be inevitably generated residual processing in the fabrication process under the conditions of cold worked and answer
Power, and welding residual stress and stress concentration can be produced in installation process.The stress of above-mentioned (partly) conductive solids component is non-
Even distribution can be impacted to the performance of hardware with security：One side stress non-uniform Distribution can cause appearance to neglect
Machining deformation slightly, generation influence is used on follow-up Product Assembly and product；Another aspect stress non-uniform Distribution also can be
Cause local stress constantly to increase in the presence of extraneous load, crackle appearance is ultimately resulted in, to the complete of (partly) conductive solids component
Whole property brings influence.
The detection method of detection stress non-uniform Distribution, which is divided into, at present damages and lossless two kinds of detection methods.Conventional damages
Detection method is both needed to destroy component, have impact on the performance of component in itself, therefore progressively can be taken in engineer applied by Non-Destructive Testing
Generation.
Conventional stress lossless detection method has ultrasound, X-ray, vortex, Magnetic Memory and Barkhausen noise etc. at present
Detection method.X-ray method is confined to skin stress detection, and then component must be destroyed for deep layer detection；Magnetic memory method
For nonmagnetic substance, then effect is unsatisfactory with Barkhausen Noise；Eddy detection technology because piezoresistive effect presence,
Using the relation and EDDY CURRENT principle existed between stress and electrical conductivity, total body surface to hardware stress state can be achieved
Levy, but how to be Non-Destructive Testing key issue urgently to be resolved hurrily to the quantitatively characterizing of component any point stress.
(1) Eddy Current Nondestructive Testing principle
As shown in figure 1, excitation coil of the exciting current by probe, generates alternating magnetic field B around excitation coil1,
When detection probe is close to hardware, the alternating magnetic field B generated1Can be in measurand surface and near surface (skin depth
In the range of) vortex is induced, the vortex can generate alternating magnetic field B again2.Know according to the law of electromagnetic induction, B2With B1Direction phase
Instead, superposition magnetic field can be formed under the collective effect of excitation coil Induced magnetic field and vortex Induced magnetic field.Detection coil impedance will
Changed in the presence of superposition magnetic field.This change can be stated by formula (1)：
Z~(N, I, r1,r2,l,h,t,σ,μ,f) (1)
In formula, t, μ, σ are respectively tested body thickness, magnetic conductivity and electrical conductivity, r1、r2, h be respectively internal coil diameter, external diameter and
Highly；N is coil turn, and I, f are respectively excitation signal amplitude and frequency；L is lift-off height.
Therefore it can be seen that by formula (1), when all parameters in addition to measured body conductivityσ are known, impedance z is σ's
Unitary variant function.Thus nondestructive detecting technology of vortex can realize the detection to hardware electrical conductivity.
(2) piezoresistive effect
When (partly) conductor is being acted on by external force, appearance and size and resistivity can change, and then cause resistance value
Change, this effect is referred to as piezoresistive effect.By taking rectangle (partly) conductor as an example, its resistance value can be expressed as
In formula, ρ is (partly) conductor resistance rate (Ω mm2/m)；L is (partly) conductor length (m)；W is (partly) conductor width
(m)；Th is (partly) conductor thickness (m).
If (partly) conductor is deformed upon in length direction, four influence factors length l, width w, thickness th of its resistance
It can change with electricalresistivityρ, cause the relative change of resistance to turn to：
Length direction strain stress：
Width is strained with thickness direction：
In formula, μ is (partly) conductor Poisson's ratio；When negative sign represents (partly) conductor length value increase, thickness value and width value are equal
Reduce.
It can be obtained by formula (3)~(6)
Wherein, 1+2 μ are caused by (partly) conductor geometrical variations；Caused by the change of (partly) conductor resistance rate.
For metallic conductor, its piezoresistive effect is made up of two parts, and a part is (partly) conductor geometry under external force
Caused by change in size, another part is (partly) caused by the change of conductor resistance rate.When nondestructive detecting technology of vortex is applied to
During (partly) conductor stress mornitoring, by the actual size of hardware is far longer than the covered scope of vortex in metallic conductor,
Therefore the influence that the change of the metallic conductor resistance value caused by geometrical variations is produced to eddy current testing signal is negligible not
Meter；For semiconductor, piezoresistive effect is mainly as caused by change in resistance.
The content of the invention
The present invention makes full use of advantage of the nondestructive detecting technology of vortex in terms of hardware stress identification, and by itself and number
Value analogy method is fully merged, and proposes a kind of conductive solids Non-Destructive Testing circuit and the continuous stress qualitative assessment side based on it
Method.
The technical solution adopted by the present invention is：Conductive solids Non-Destructive Testing circuit, including：Detection probe, test specimen,
Two modules；The detection probe is fixed on test specimen surface；The detection probe at least includes：First module, excitation coil
And Magnetic Sensor；First module is used to produce the sinusoidal excitation signal of fixed frequency and provide for excitation coil accurately to swash
Encourage signal；Space after the pumping signal input stimulus coil between excitation coil and test specimen forms couple electromagnetic
；The Magnetic Sensor is located inside excitation coil, for the coupled magnetic field intensity to be converted into voltage signal；
Second module is connected with Magnetic Sensor, for being amplified to the voltage signal that Magnetic Sensor is exported at filtering
Reason, obtains the first lossless analog signal.
Further, in addition to the 3rd module, the 3rd module is connected with the second module, for being exported to the second module
The first lossless analog signal be acquired processing and obtain the second nondestructive testing signal.
Another technical scheme of the application is：Continuous stress quantitative evaluating method based on the circuit, including：
S1, it is determined by experiment nondestructive testing signal and the relational expression of external load；
S=KF+a；
Wherein, S represents the second nondestructive testing signal；F represents external load；K represents coefficient；A is constant；
S2, according to piezoresistive effect, obtain external force effect under, the distribution of conductivity of the test specimen is；
Wherein, σ0Represent neutral line electrical conductivity；H represents target factor；σ represents resistivity variation；Represent that x is any transversal
Face；Z represents any point on arbitrary cross section；
S3, by carrying out Computer Simulation to the distribution of conductivity of the obtained test specimens of step S2, that is estimated is outer
Portion's magnitude of load；
S4, the external load size obtained according to step S3, obtain the continuous stress in any point.
Further, the step S1 include it is following step by step：
S11, according to the Material Physics attribute of test specimen make test block；
Detection probe obtains different magnetic induction intensity signals when S12, application different loads；
S13, repeat step S2 several times, obtain the relation S=KF+a of the second nondestructive testing signal S and external load, this
The determination coefficient of relational expression is Rs0。
Further, the step S3 is specially：
S31, by carrying out Computer Simulation to the distribution of conductivity of the obtained test specimens of step S2, obtain h and take difference
During value, external force F and measuring point magnetic induction intensity value Bz relation curve；
S32, set h=h1Curve and the determination coefficient of test data are Rs1, h=h2The determination coefficient of curve and experimental data
For Rs2；
S33, try to achieve satisfaction | Rs1-Rs0| ＜ λ and | Rs2-Rs0| ＜ λ Rs1With Rs2Corresponding h1With h2Value set；
Wherein, λ is the less numerical value fixed；
S34, the h for obtaining step S331With h2Value set in maximum as h higher limit, minimum value is used as h
Lower limit；
The electricity for the test specimen that S35, higher limit and lower limit according to the obtained h of step S34, and step S2 are obtained
Conductance is distributed, and obtains the higher limit and lower limit of corresponding external load；
S36, averaged by higher limit and lower limit to the obtained external loads of step S35, that is estimated is outer
Portion's magnitude of load.
Beneficial effects of the present invention：Conductive solids Non-Destructive Testing circuit proposed by the present invention and continuous stress based on it are determined
Measure appraisal procedure, experiment and by way of numerical simulation is combined, obtain stress and Eddy Current Nondestructive Testing magnetic induction intensity it
Between relation；The regularity of distribution of electrical conductivity is obtained by piezoresistive effect, by mathematical calculation model obtain continuous stress distribution with
Relation between external load；By estimating external force size, the stress at (partly) conductor any point is somebody's turn to do；So as to realize to inciting somebody to action
The qualitative assessment of the continuous stress distribution of (partly) conductive solids, earlier damage prediction of the present processes to (partly) conductive solids is established
Fixed basis, he can be used for realizing in the health forecast for building conductor and semiconductor key, the safety for ensureing key structure
Have very important significance.
Brief description of the drawings
Fig. 1 is Non-Destructive Testing schematic diagram；
Fig. 2 is the modularized circuit schematic diagram of the quantitative evaluating method of the continuously distributed stress of conductive solids；
Fig. 3 is external force F and measuring point magnetic induction intensity value Bz relation curve；
The three-point bending test schematic diagram that Fig. 4 provides for the embodiment of the present application；
The Bending moment distribution schematic diagram that Fig. 5 provides for the embodiment of the present application；
Fig. 6 is the stress distribution schematic diagram on any cross section of simply supported beam that the embodiment of the present application is provided.
Embodiment
For ease of skilled artisan understands that the technology contents of the present invention, enter one to present invention below in conjunction with the accompanying drawings
Step explaination.
It is illustrated in figure 2 the modularized circuit schematic diagram of the quantitative evaluating method of the continuously distributed stress of conductive solids；This Shen
Technical scheme please is：Conductive solids Non-Destructive Testing circuit, including：Detection probe, test specimen, the second module, the 3rd module；
The detection probe is fixed on test specimen surface；The detection probe at least includes：First module, excitation coil and magnetic are passed
Sensor；First module provides accurate pumping signal for producing the sinusoidal excitation signal of fixed frequency for excitation coil；
Space after the pumping signal input stimulus coil between excitation coil and test specimen forms coupled electromagnetic field；The magnetic
Sensor is located inside excitation coil, for the coupled magnetic field intensity to be converted into voltage signal；
Second module is connected with Magnetic Sensor, for being amplified to the voltage signal that Magnetic Sensor is exported at filtering
Reason, obtains the first nondestructive testing signal；3rd module is connected with the second module, for entering to the signal that the second module is exported
Row acquisition process, obtains the second nondestructive testing signal；
Also include the 4th module, the 4th module is connected with the 3rd module, for exported according to the 3rd module second
Nondestructive testing signal calculates the stress at test specimen any point, another technology that specific processing procedure is proposed in the application
It is described in detail in scheme, another technical scheme of the application is：A kind of conductive solids based on the modularized circuit is continuous
Distributed stress quantitative evaluating method, specifically includes following steps：
S1, it is determined by experiment nondestructive testing signal and the relational expression of external load；Found by studying, work as external load
When F application point and eddy-current nondestructive detection system detection signal S collection points are determined, external load F and Eddy Current Nondestructive Testing telecommunications
Linear distribution relation is presented in number S, and as shown in phantom in Figure 3, ★ is experimental data.I.e.
S=KF+a (8)
Wherein, S represents the second nondestructive testing signal；F represents external load；K represents coefficient；A is constant；
Specifically include it is following step by step：
S11, according to the Material Physics attribute of test specimen make test block；
Detection probe obtains different magnetic induction intensity signals when S12, application different loads；
S13, repeat step S2 several times, obtain S and external load F relation S=KF+a, the determination coefficient of this relational expression
For Rs0。
S2, linear relationship is presented from the resistivity variation under piezoresistive effect, uniaxial stressed state and stress.Therefore
Under external force, the distribution of conductivity of the metallic conductor may be set to；
Wherein, σ0Represent neutral line electrical conductivity；H represents target factor；σ represents resistivity variation；Represent that x is any transversal
Face；Z represents any point on arbitrary cross section；
Three-point bending test shown in Fig. 4, bending moment diagram of the Non-Destructive Testing coil on the underface of F in Fig. 4, test specimen is with x
=0 interface is symmetrical, and maximal bending moment position is external load F positions, and is reduced to zero at freely-supported position.Take right side
It is research object to divide beam, and its Bending moment distribution is as shown in Figure 5.According to mechanics of materials knowledge, on any cross section of simply supported beam shown in Fig. 4
Stress distribution it is as shown in Figure 6.The stress of neutral line is zero, more than neutral line is for tension below compression, neutral line.Cause
The stress of any point z on this any cross section x can be expressed as：
In formula, l is the length of metallic conductor；M represents moment of flexure；IzRepresent rotary inertia.
S3, by carrying out Computer Simulation to the distribution of conductivity of the obtained test specimens of step S2, that is estimated is outer
Portion's magnitude of load；The step S3 is specially：
S31, by carrying out Computer Simulation to the distribution of conductivity of the obtained test specimens of step S2, obtain h and take difference
During value, external force F and measuring point magnetic induction intensity value Bz relation curve；
S32, as shown in figure 3, setting h=h1Curve and the determination coefficient of test data are Rs1, h=h2Curve and experimental data
Determination coefficient be Rs2；
S33, try to achieve satisfaction | Rs1-Rs0| ＜ λ and | Rs2-Rs0| ＜ λ Rs1With Rs2Corresponding h1With h2Value set；
Wherein, λ is the less numerical value fixed；λ is smaller, and h scope is smaller, and testing result is more accurate；Therefore can be with
According to detection it needs to be determined that λ value.
S34, the h for obtaining step S331With h2Value set in maximum as h higher limit, minimum value is used as h
Lower limit；
The electricity for the test specimen that S35, higher limit and lower limit according to the obtained h of step S34, and step S2 are obtained
Conductance is distributed, and obtains the higher limit and lower limit of corresponding external load；
S36, averaged by higher limit and lower limit to the obtained external loads of step S35, that is estimated is outer
Portion's magnitude of load.
For purposes of illustration only, as shown in fig. 6, when λ takes 0.01, taking one of which h in the present embodiment1=1/300, h2=1/350
As being calculated exemplified by h bound；H can be obtained1F when=1/3001=138N, h2F when=1/3502=163N, then with F1=
138N and F2=163N obtains F as the bound of external forcem=150.5N.The now empirical curve in the actual value such as figure of external force
It show Fe=149N, both errors are 1%, it is known that logical the present processes to external force size with actual value be to connect very much
Near, so as to also demonstrate the validity of the application method.
S4, the external load size obtained according to step S3, the stress at any point is obtained according to formula (10).
The inventive method can be used for realizing in the health forecast for building conductive solids and semiconducting solid key, for protecting
The safety of barrier key structure has very important significance；By way of experiment and numerical simulation are combined, estimation external force is big
It is small, so as to be somebody's turn to do the stress at (partly) conductor any point；So as to realize to (partly) the continuous stress distribution of conductive solids is determined
Amount is assessed.
One of ordinary skill in the art will be appreciated that embodiment described here is to aid in reader and understands this hair
Bright principle, it should be understood that protection scope of the present invention is not limited to such especially statement and embodiment.For ability
For the technical staff in domain, the present invention can have various modifications and variations.Within the spirit and principles of the invention, made
Any modification, equivalent substitution and improvements etc., should be included within scope of the presently claimed invention.
Claims (5)
1. conductive solids Non-Destructive Testing circuit, it is characterised in that including：Detection probe, test specimen, the second module；The inspection
Probing head is fixed on test specimen surface；The detection probe at least includes：First module, excitation coil and Magnetic Sensor；
First module provides accurate pumping signal for producing the sinusoidal excitation signal of fixed frequency for excitation coil；It is described to swash
Encourage the space after signal input stimulus coil between excitation coil and test specimen and form coupled electromagnetic field；The Magnetic Sensor
Inside excitation coil, for the coupled magnetic field intensity to be converted into voltage signal；
Second module is connected with Magnetic Sensor, for being amplified filtering process to the voltage signal that Magnetic Sensor is exported,
Obtain the first lossless analog signal.
2. conductive solids Non-Destructive Testing circuit according to claim 1, it is characterised in that described also including the 3rd module
3rd module is connected with the second module, and is obtained for being acquired processing to the first lossless analog signal that the second module is exported
Two nondestructive testing signals.
3. the continuously distributed stress quantitative evaluating method of a kind of conductive solids based on circuit according to claim 2, its feature
It is, including：
S1, it is determined by experiment nondestructive testing signal and the relational expression of external load；
S=KF+a；
Wherein, S represents the second nondestructive testing signal；F represents external load；K represents coefficient；A is constant；
S2, according to piezoresistive effect, obtain external force effect under, the distribution of conductivity of the test specimen is；
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Wherein, σ0Represent neutral line electrical conductivity；H represents target factor；σ represents electrical conductivity；Represent any cross sections of x；Z represents to appoint
Any point anticipated on cross section；
S3, by carrying out Computer Simulation to the distribution of conductivity of the obtained test specimens of step S2, the outside load estimated
Lotus size；
S4, the external load size obtained according to step S3, obtain the continuous stress in any point.
4. the continuously distributed stress quantitative evaluating method of a kind of conductive solids according to claim 3, it is characterised in that described
Step S1 include it is following step by step：
S11, according to the Material Physics attribute of test specimen make test block；
Detection probe obtains different magnetic induction intensity signals when S12, application different loads；
S13, repeat step S2 several times, obtain Non-Destructive Testing magnetic induction intensity signal S and external load F relation S=KF+a,
The determination coefficient of this relational expression is Rs0。
5. the continuously distributed stress quantitative evaluating method of a kind of conductive solids according to claim 3, it is characterised in that described
Step S3 is specially：
S31, by carrying out Computer Simulation to the distribution of conductivity of the obtained test specimens of step S2, when obtaining h and taking different value,
External force F and measuring point magnetic induction intensity value BzRelation curve；
S32, set h=h1Curve and the determination coefficient of test data are Rs1, h=h2Curve and the determination coefficient of experimental data are
Rs2；
S33, try to achieve satisfaction | Rs1-Rs0| ＜ λ and | Rs2-Rs0| ＜ λ Rs1With Rs2Corresponding h1With h2Value set；
Wherein, λ is the less numerical value fixed；
S34, the h for obtaining step S331With h2Value set in maximum as h higher limit, minimum value is used as h lower limits
Value；
The electrical conductivity for the test specimen that S35, higher limit and lower limit according to the obtained h of step S34, and step S2 are obtained
Distribution, obtains the higher limit and lower limit of corresponding external load；
S36, averaged by higher limit and lower limit to the obtained external loads of step S35, the outside load estimated
Lotus size.
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| CN110108787A (en) * | 2019-05-07 | 2019-08-09 | 电子科技大学 | A kind of rotating metallic component electromagnetic nondestructive device based on dynamic raw vortex |
| CN111289811A (en) * | 2018-12-07 | 2020-06-16 | 中南大学 | Method for detecting quality of conductor pole based on continuous information |
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| CN108195931A (en) * | 2017-12-21 | 2018-06-22 | 西安交通大学 | The spot probe of metal component damage check and visualization quantitative evaluating method |
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| CN108802185A (en) * | 2018-06-26 | 2018-11-13 | 哈尔滨工业大学 | Metal material defects detection sensor based on impulse eddy current and electromagnetic acoustic |
| CN108802185B (en) * | 2018-06-26 | 2020-12-29 | 哈尔滨工业大学 | Metal material defect detection sensor based on pulse eddy current and electromagnetic ultrasound |
| CN111289811A (en) * | 2018-12-07 | 2020-06-16 | 中南大学 | Method for detecting quality of conductor pole based on continuous information |
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