CN103308776B - A kind of test circuit of capacitance plate and method of testing thereof - Google Patents
A kind of test circuit of capacitance plate and method of testing thereof Download PDFInfo
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- CN103308776B CN103308776B CN201310167385.6A CN201310167385A CN103308776B CN 103308776 B CN103308776 B CN 103308776B CN 201310167385 A CN201310167385 A CN 201310167385A CN 103308776 B CN103308776 B CN 103308776B
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Abstract
The invention discloses a kind of test circuit and method of testing thereof of capacitance plate, described method of testing comprises: controller receives outside test signal, starts charge-discharge circuit; Charge-discharge circuit successively charges to each measured capacitance; The count value that each measured capacitance produces in charging or discharge process is converted to the capacitance of each measured capacitance by controller, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, be then qualified, if this capacitance is not within the scope of predetermined capacitance, be then defective.The whole test duration is short, and efficiency is high, and eliminates manual testing's capacitance plate or fractographic trouble, cost of labor is low, and precision is high, simultaneously, directly can converse the capacitance of each measured capacitance of capacitance plate, can the electrical specification of capacitance plate more intuitively judge.
Description
Technical field
The present invention relates to a kind of test circuit and method of testing thereof of capacitance plate.
Background technology
Existing factory end can shield the logical of sensor line by testing capacitor, short, disconnected method mainly contains, method one: directly ride on sensor line with multitester probe and test, because present pickup wire route ITO makes, the connecting line width be connected with ITO is below 30 microns or 30 microns, spacing is between the lines also below 30 microns, and the resistance value of ITO material is large, article one, the resistance of passage is more than 8K ohm, above phenomenon determines the measuring accuracy with multitester probe, the performance accuracy of tester and eyesight all cannot be accurate, test out the logical of sensor easily, short, disconnected phenomenon, and what obtain when measuring is a resistance value, the capacitive sensing amount of sensor can not be reacted, cannot be judged the response characteristic of sensor.Method two: microscopic method, that the method gone between by microscope amplification sensor is carried out Physics View to touch-screen and looked into, this method measures screen with or without short circuit or open circuit by seeing to look between sensor, sight need be carried out to each position of screen to look into, survey crew workload is large, speed is comparatively slow, cannot judge the electrical specification of screen.
Summary of the invention
The invention provides a kind of test circuit and method of testing thereof of capacitance plate, which overcome the existing deficiency of background technology.
One of the present invention's technical scheme adopted solving its technical matters is:
A kind of test circuit of capacitance plate, described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, it is characterized in that, comprise: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200).
Among one preferred embodiment: also comprise: for showing the display (600) of the capacitance of measured capacitance, described display (600) signal connection control device (500).
Among one preferred embodiment: also comprise: gauge tap (700), described gauge tap (700) is connected between the electrode of capacitance plate and charge-discharge circuit (100).
Among one preferred embodiment: described charge-discharge circuit is a capacitor.
The present invention solves two of the technical scheme adopted of its technical matters: the method for testing applying the capacitance plate of above-mentioned test circuit, is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, the count value that each measured capacitance produces in charging or discharge process is converted to the capacitance of each measured capacitance by controller, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, be then qualified, if this capacitance is not within the scope of predetermined capacitance, be then defective.
The present invention solves three of the technical scheme adopted of its technical matters: the method for testing applying the capacitance plate of above-mentioned test circuit, is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
The present invention solves four of the technical scheme adopted of its technical matters: the method for testing applying the capacitance plate of above-mentioned test circuit, is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, repeats step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
Above-mentioned technical scheme is compared with background technology, and its tool has the following advantages:
1. this test circuit structure is simple, cost is low, be applicable to most factory to use, popularity rate is high, and apply the method for testing of this test circuit, charge-discharge circuit is adopted to charge to measured capacitance or discharge, because the electrode size of capacitance plate is little, be microsecond rank to the time needed for its charge or discharge, make the whole test duration short, efficiency is high, and eliminate manual testing's capacitance plate or fractographic trouble, cost of labor is low, precision is high, simultaneously, directly can converse the capacitance of each measured capacitance of capacitance plate, can the electrical specification of capacitance plate more intuitively judge.
2. charge-discharge circuit adopts capacitor, and capacitor is directly to electrode charge or the electric discharge of measured capacitance, and discharge and recharge is effective, and efficiency is higher, and cost is also lower.
3. the capacitance of measured capacitance is scaled by the count value of charging process, also the count value by discharge process converts, or, also the weighted mean value by charging and discharging process converts, also repeated charge can be carried out to measured capacitance and the mode calculating the mean value of discharge and recharge converts, thus, can set different test modes according to different capacitance plates, compatibility is strong.
Accompanying drawing explanation
Below in conjunction with drawings and Examples, the invention will be further described.
Fig. 1 depicts the electrical block diagram of the test circuit of a kind of capacitance plate of a preferred embodiment.
Fig. 2 depicts the control flow chart of controller.
Fig. 3 depicts the process flow diagram of method of testing.
Embodiment
Please refer to Fig. 1, an a kind of preferred embodiment of test circuit of capacitance plate, the test circuit of described a kind of capacitance plate, it comprises charge-discharge circuit 100, pulse oscillator 200, counter 300, storer 400, controller 500 and display 600.
Described capacitance plate has conductive layer, and this conductive layer is made up of many strip electrodes, forms a measured capacitance 800 between electrode and ground.In FIG, measured capacitance 800 number is set to two, not as limit, can be set to multiple, is as the criterion with the virtual electrode quantity of capacitance plate.
Described charge-discharge circuit 100 is for carrying out charge or discharge to measured capacitance.In the present embodiment, described charge-discharge circuit 100 is a capacitor.The electrode tip of this charge-discharge circuit 100 and measured capacitance, controller 500, counter 300 and pulse oscillator 200 are electrically connected.
Described pulse oscillator 200 is for producing pulse when measured capacitance 800 charge or discharge, and itself and counter 300 and controller 500 are electrically connected.
Described counter 300 is for calculating the umber of pulse of pulse oscillator 200, and itself and controller 500 and storer 400 are electrically connected.
Described storer 400 is for the numerical value of memory counter 300, and itself and controller 500 are electrically connected.
Described display 600 is for showing the capacitance of measured capacitance, and it is connected with controller 500 signal.
The numbers translate of counter 300 can be the capacitance of measured capacitance 800 by described controller 500.
In the present embodiment, this test circuit also comprises gauge tap 700, and described gauge tap 700 is connected between the electrode tip of measured capacitance and charge-discharge circuit 100.
A kind of specific embodiment one of method of testing of capacitance plate:
A method of testing for capacitance plate, comprising:
Step 10, test control sends test signal, and controller receives test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the umber of pulse of counter priority paired pulses oscillator counts, also namely, the count value of counter can be converted into the duration of charging of measured capacitance, stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in storer, and now, meeting automatic clear when counter prepares to count the vibration number of next measured capacitance;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, the umber of pulse of counter priority paired pulses oscillator counts, electric discharge is stopped when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer, meeting automatic clear when counter prepares to count the vibration number of next measured capacitance;
Step 40, the count value that each measured capacitance produces in charging or discharge process is converted to the capacitance of each measured capacitance by controller, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, be then qualified, if this capacitance is not within the scope of predetermined capacitance, be then defective.In the present embodiment, the capacitance of each measured capacitance shows by display, and test result also shows by display.In the present embodiment, controller conversed each measured capacitance capacitance and after test result is judged, start communicating interrupt immediately, also be, by gauge tap, measured capacitance and charge-discharge circuit are disconnected, then the capacitance of measured capacitance and test result are delivered to display show.
A kind of specific embodiment two of method of testing of capacitance plate:
A method of testing for capacitance plate, comprising:
Step 10, test control sends test signal, and controller receives test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the umber of pulse of counter priority paired pulses oscillator counts, charging is stopped when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer, meeting automatic clear when counter prepares to count the vibration number of next measured capacitance;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, the umber of pulse of counter priority paired pulses oscillator counts, electric discharge is stopped when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer, meeting automatic clear when counter prepares to count the vibration number of next measured capacitance;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.In the present embodiment, the capacitance of each measured capacitance shows by display, and test result also shows by display.In the present embodiment, controller conversed each measured capacitance capacitance and after test result is judged, start communicating interrupt immediately, also be, by gauge tap, measured capacitance and charge-discharge circuit are disconnected, then the capacitance of measured capacitance and test result are delivered to display show.
A kind of specific embodiment three of method of testing of capacitance plate:
A method of testing for capacitance plate, comprising:
Step 10, test control sends test signal, and controller receives test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the umber of pulse of counter priority paired pulses oscillator counts, charging is stopped when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer, meeting automatic clear when counter prepares to count the vibration number of next measured capacitance;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, the umber of pulse of counter priority paired pulses oscillator counts, electric discharge is stopped when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer, meeting automatic clear when counter prepares to count the vibration number of next measured capacitance;
Step 40, repeats step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.In the present embodiment, the capacitance of each measured capacitance shows by display, and test result also shows by display.In the present embodiment, controller conversed each measured capacitance capacitance and after test result is judged, start communicating interrupt immediately, also be, by gauge tap, measured capacitance and charge-discharge circuit are disconnected, then the capacitance of measured capacitance and test result are delivered to display show.
The above, be only present pre-ferred embodiments, therefore can not limit scope of the invention process according to this, the equivalence change namely done according to the scope of the claims of the present invention and description with modify, all should still belong in scope that the present invention contains.
Claims (12)
1. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, the count value that each measured capacitance produces in charging or discharge process is converted to the capacitance of each measured capacitance by controller, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, be then qualified, if this capacitance is not within the scope of predetermined capacitance, be then defective.
2. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), the test circuit of this capacitance plate also comprises: for showing the display (600) of the capacitance of measured capacitance, described display (600) signal connection control device (500),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, the count value that each measured capacitance produces in charging or discharge process is converted to the capacitance of each measured capacitance by controller, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, be then qualified, if this capacitance is not within the scope of predetermined capacitance, be then defective.
3. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), the test circuit of this capacitance plate also comprises: gauge tap (700), and described gauge tap (700) is connected between the electrode of capacitance plate and charge-discharge circuit (100),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, the count value that each measured capacitance produces in charging or discharge process is converted to the capacitance of each measured capacitance by controller, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, be then qualified, if this capacitance is not within the scope of predetermined capacitance, be then defective.
4. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), described charge-discharge circuit (100) is a capacitor,
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, the count value that each measured capacitance produces in charging or discharge process is converted to the capacitance of each measured capacitance by controller, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, be then qualified, if this capacitance is not within the scope of predetermined capacitance, be then defective.
5. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
6. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), the test circuit of this capacitance plate also comprises: for showing the display (600) of the capacitance of measured capacitance, described display (600) signal connection control device (500),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
7. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), the test circuit of this capacitance plate also comprises: gauge tap (700), and described gauge tap (700) is connected between the electrode of capacitance plate and charge-discharge circuit (100),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
8. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), described charge-discharge circuit (100) is a capacitor,
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
9. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, repeats step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
10. the method for testing of capacitance plate, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), the test circuit of this capacitance plate also comprises: for showing the display (600) of the capacitance of measured capacitance, described display (600) signal connection control device (500),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, repeats step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
The method of testing of 11. capacitance plates, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), the test circuit of this capacitance plate also comprises: gauge tap (700), and described gauge tap (700) is connected between the electrode of capacitance plate and charge-discharge circuit (100),
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, repeats step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
The method of testing of 12. capacitance plates, it is characterized in that: described capacitance plate has conductive layer, this conductive layer is made up of many strip electrodes, a measured capacitance (800) is formed between electrode and ground, the test circuit of this capacitance plate comprises: for carrying out the charge-discharge circuit (100) of charge or discharge to measured capacitance, for producing the pulse oscillator (200) of pulse when measured capacitance (800) charge or discharge, for calculating the counter (300) of the umber of pulse of pulse oscillator (200), for the numerical value of memory counter (300) storer (400) and can be the controller (500) of the capacitance of measured capacitance (800) by the numbers translate of counter (300), described controller (500) electrical connection charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), electrode electrical connection charge-discharge circuit (100) of capacitance plate, counter (300) electrical connection charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) electrical connection pulse oscillator (200), described charge-discharge circuit (100) is a capacitor,
This method of testing comprises:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, and the umber of pulse of counter priority paired pulses oscillator counts, and stops charging when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during electric discharge, and the umber of pulse of counter priority paired pulses oscillator counts, and stops electric discharge when electrode ports magnitude of voltage reaches preset value, counter stops counting, count value is stored in storer;
Step 40, repeats step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces in charging process and the count value produced in discharge process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is within the scope of predetermined capacitance, being then qualified, if this capacitance is not within the scope of predetermined capacitance, is then defective.
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| CN105988041A (en) * | 2015-02-13 | 2016-10-05 | 宏达国际电子股份有限公司 | Capacitance measuring system and capacitance measuring method |
| CN106526398B (en) * | 2016-10-28 | 2019-08-27 | 昆山国显光电有限公司 | The detection method and detection device of capacitive touch screen |
| CN107632206B (en) * | 2017-09-22 | 2020-01-31 | 重庆纳尔利科技有限公司 | finger touch capacitance detection device and working method thereof |
| CN108152625B (en) * | 2017-12-21 | 2021-02-09 | 帝晶光电（深圳）有限公司 | Efficient general Sensor function detection system and algorithm for self-capacitance capacitive screen |
| CN109460168A (en) * | 2018-10-31 | 2019-03-12 | 上海海栎创微电子有限公司 | A method of detection shunt capacitance between chip whether normal weld |
| CN113884833B (en) * | 2021-10-21 | 2023-08-18 | 迈普通信技术股份有限公司 | System and method for detecting welding quality of capacitor |
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