CN103196404A - Electronic probe rock slice sample positioning device - Google Patents
Electronic probe rock slice sample positioning device Download PDFInfo
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- CN103196404A CN103196404A CN201310103427XA CN201310103427A CN103196404A CN 103196404 A CN103196404 A CN 103196404A CN 201310103427X A CN201310103427X A CN 201310103427XA CN 201310103427 A CN201310103427 A CN 201310103427A CN 103196404 A CN103196404 A CN 103196404A
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Abstract
The invention discloses an electronic probe rock slice sample positioning device. The electronic probe rock slice sample positioning device comprises a sample calibration clamping device, a calibration angle, a limiting spring piece, a limiting screw, a transparent window and a grid coordinate optical film, wherein the calibration angle, the limiting spring piece, the limiting screw and the transparent window are arranged on the sample calibration clamping device, the grid coordinate optical film covers a sample, a rock slice sample is fixed on the sample calibration clamping device, the rid coordinate optical film is covered on the rock slice sample, and the point coordinate (0,0) of the rid coordinate optical film coincides with the calibration angle. When the electronic probe rock slice sample positioning device works, an analysis point determined under a polarizing microscope can rapidly find the same analysis point with the aid of an electronic probe.
Description
Technical field
The present invention relates to a kind of accurate device of location fast of petrographic thin section sample microcell of electron probe.
Background technology
Electron probing analysis is the equipment that comes analytical element kind and content by the electron-beam excitation sample, and the I of beam spot diameter reaches 1 micron.By the petrographic thin section sample that polarizing microscope is difficult to identify, put into electron probe analysis again, element kind and content that can the Accurate Analysis sample.But, the petrographic thin section sample size be on long 7.5 centimetres wide 2.5 centimetres the glass sheet, the sample size that needs to identify has only several microns to tens microns usually, so sample spot of under the polarizing microscope that hundred times is amplified, seeing, under electron probe, be difficult to find, and polarizing microscope is optical imagery, and electron probe is electronic imaging.Even identical analysis site is also different at the pattern that different equipment presents.
In order under electron probe, to find the analysis site of polarizing microscope, adopt methods such as pencil setting-out, pin are drawn, impression in the past, still above method is all destroyed sample, and finds the speed of analysis site also very slow.
Summary of the invention
The object of the present invention is to provide a kind of accurate device of location fast of petrographic thin section sample microcell of electron probe.Under the prerequisite of not destroying sample, the same analysis site to polarizing microscope under electron probe is located fast.The analysis site of determining under polarizing microscope can find same analysis site fast under electron probe.
The technical solution adopted in the present invention is: this electron probe petrographic thin section sample locating device comprises sample calibration clamper, described sample calibration clamper both sides are opening trough_like, spacing spring leaf is wherein fixedly arranged in the groove of a side, and the edge of groove is provided with the calibration angle, sample calibration clamper middle part is light inlet window, sample calibration clamper inserts petrographic thin section, petrographic thin section is fixed by the limit spring sheet, be covered with the mesh coordinate blooming on the petrographic thin section, the mesh coordinate blooming is provided with coordinate system, coordinate system 0,0 point coordinate overlaps with the calibration angle.
Described calibration clamper adopts stainless steel processing; Described coordinate grid coordinate blooming adopts PVC processing.
Effect of the present invention and advantage are: the analysis site that the present invention determines under polarizing microscope, can find same analysis site fast under electron probe.Even large-sized petrographic thin section sample also is easy to find and can identifies several microns to tens microns analysis site.And be identical analysis site under polarizing microscope and electron probe, the pattern that presents is identical, can Accurate Analysis petrographic thin section sample element kind and content.
Description of drawings
Fig. 1 is structural representation of the present invention;
Fig. 2 uses view for the present invention;
Fig. 3 is the structural representation of limit spring sheet among Fig. 1;
Fig. 4 be among Fig. 2 the mesh coordinate blooming structural representation.
Among the figure: 1-calibrates the angle, 2-limit spring sheet, 3-limited screw hole, 4-light inlet window, 5-flap position set screw hole, 6-spring leaf fixed screw holes, 7-mesh coordinate blooming, 8-sample calibration clamper, 9-petrographic thin section sample.
Embodiment
Below in conjunction with embodiment and accompanying drawing to this bright further describing:
As shown in FIG., this electron probe petrographic thin section sample locating device comprises sample calibration clamper 8, sample calibration clamper 8 is used for placing petrographic thin section sample 9, sample calibration clamper 8 both sides are opening trough_like, the flute profile of sample calibration clamper 8 both sides prevents that petrographic thin section sample string is moving and is conducive to write down each analysis site, the groove upper side wall of sample calibration clamper 8 both sides is respectively equipped with limited screw hole 3, the upper surface is respectively equipped with flap position set screw hole 5 on the groove of sample calibration clamper 8 both sides, fixedly there is spacing spring leaf 2 the groove inboard of sample calibration clamper 8 one sides by spring leaf fixed screw holes 6,2 pairs of petrographic thin section samples of limit spring sheet have spacing, the petrographic thin section sample can all around not slided, the edge of sample calibration clamper 8 one side channels is provided with calibration angle 1, sample calibration clamper 8 middle parts are light inlet window 4, sample calibration clamper 8 inserts petrographic thin section, petrographic thin section is fixing by limit spring sheet 2, be covered with mesh coordinate blooming 7 on the petrographic thin section, mesh coordinate blooming 7 is provided with coordinate system, coordinate system 0,0 point coordinate overlaps with calibration angle 1, and the 1 pair of mesh coordinate blooming 7 in calibration angle has position-limiting action.Mesh coordinate blooming 7 is transparent rectangle, and scale unit is 0.1 millimeter.
During use, the petrographic thin section sample is put into sample calibration clamper 8, by limit spring sheet and limited screw the petrographic thin section sample is fixed, grid coverage coordinate blooming 7 on the thin slice, 0 of mesh coordinate blooming 7,0 point coordinate overlaps with the calibration angle, determines each analysis site under polarizing microscope, writes down the coordinate of each analysis site respectively by the mesh coordinate blooming.Take off the mesh coordinate blooming, then the thin slice sample is put into the electron probe sample bin with fixing sample calibration clamper.Find the coordinate at calibration angle, the coordinate position of each analysis site at electron probe converts.
Claims (2)
1. electron probe petrographic thin section sample locating device, comprise sample calibration clamper (8), it is characterized in that, described sample calibration clamper (8) both sides are opening trough_like, spacing spring leaf (2) is wherein fixedly arranged in the groove of a side, and the edge of groove is provided with calibration angle (1), sample calibration clamper (8) middle part is light inlet window (4), sample calibration clamper (8) inserts petrographic thin section, petrographic thin section is fixing by limit spring sheet (2), is covered with mesh coordinate blooming (7) on the petrographic thin section, and mesh coordinate blooming (7) is provided with coordinate system, coordinate system 0,0 point coordinate overlaps with calibration angle (1).
2. electron probe petrographic thin section sample locating device as claimed in claim 1 is characterized in that described mesh coordinate blooming (7) is transparent rectangle, and scale unit is 0.1 millimeter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310103427XA CN103196404A (en) | 2013-03-28 | 2013-03-28 | Electronic probe rock slice sample positioning device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310103427XA CN103196404A (en) | 2013-03-28 | 2013-03-28 | Electronic probe rock slice sample positioning device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103196404A true CN103196404A (en) | 2013-07-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310103427XA Pending CN103196404A (en) | 2013-03-28 | 2013-03-28 | Electronic probe rock slice sample positioning device |
Country Status (1)
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| CN (1) | CN103196404A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439781A (en) * | 2013-09-06 | 2013-12-11 | 成都西图科技有限公司 | Polarizing microscopic image automatic acquisition and analysis device |
| CN104880474A (en) * | 2014-10-23 | 2015-09-02 | 中国计量科学研究院 | Standard substance anti-counterfeiting clamping sleeve and method for analysis of standard substance by standard substance anti-counterfeiting clamping sleeve |
| CN108732194A (en) * | 2018-03-18 | 2018-11-02 | 桂林理工大学 | Multicapacity convenient can vary electron probe sample stage |
| CN109254025A (en) * | 2018-11-02 | 2019-01-22 | 内蒙古工业大学 | A kind of device and method for pasting annular support grid for transmission electron microscope sample |
| CN114088756A (en) * | 2021-12-20 | 2022-02-25 | 北京中科科仪股份有限公司 | Sample access device and scanning electron microscope |
| US11311886B2 (en) | 2017-04-05 | 2022-04-26 | Leica Mikrosysteme Gmbh | Holding apparatus for sample carriers, and method for introducing and withdrawing a sample carrier |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2092765U (en) * | 1991-04-28 | 1992-01-08 | 济南医用光学仪器厂 | Positioning device for slide specimen |
| CN1163666A (en) * | 1995-07-31 | 1997-10-29 | 莱卡显微及系统有限公司 | Object holder for thin object carriers |
| CN2914117Y (en) * | 2005-04-11 | 2007-06-20 | 张前 | Display screen gridding observing film |
| CN101551347A (en) * | 2009-03-26 | 2009-10-07 | 江苏天瑞仪器股份有限公司 | Method and apparatus for locating and adjusting luminous spot of X fluorescent spectrometer |
| CN102422198A (en) * | 2009-05-11 | 2012-04-18 | 卡尔蔡司公司 | Microscopy of an object using a sequence of optical microscopy and particle beam microscopy |
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2013
- 2013-03-28 CN CN201310103427XA patent/CN103196404A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2092765U (en) * | 1991-04-28 | 1992-01-08 | 济南医用光学仪器厂 | Positioning device for slide specimen |
| CN1163666A (en) * | 1995-07-31 | 1997-10-29 | 莱卡显微及系统有限公司 | Object holder for thin object carriers |
| CN2914117Y (en) * | 2005-04-11 | 2007-06-20 | 张前 | Display screen gridding observing film |
| CN101551347A (en) * | 2009-03-26 | 2009-10-07 | 江苏天瑞仪器股份有限公司 | Method and apparatus for locating and adjusting luminous spot of X fluorescent spectrometer |
| CN102422198A (en) * | 2009-05-11 | 2012-04-18 | 卡尔蔡司公司 | Microscopy of an object using a sequence of optical microscopy and particle beam microscopy |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103439781A (en) * | 2013-09-06 | 2013-12-11 | 成都西图科技有限公司 | Polarizing microscopic image automatic acquisition and analysis device |
| CN104880474A (en) * | 2014-10-23 | 2015-09-02 | 中国计量科学研究院 | Standard substance anti-counterfeiting clamping sleeve and method for analysis of standard substance by standard substance anti-counterfeiting clamping sleeve |
| US11311886B2 (en) | 2017-04-05 | 2022-04-26 | Leica Mikrosysteme Gmbh | Holding apparatus for sample carriers, and method for introducing and withdrawing a sample carrier |
| EP3385771B1 (en) * | 2017-04-05 | 2023-10-25 | Leica Mikrosysteme GmbH | Holding device for a sample holder and method for introducing and removing of a sample holder |
| CN108732194A (en) * | 2018-03-18 | 2018-11-02 | 桂林理工大学 | Multicapacity convenient can vary electron probe sample stage |
| CN109254025A (en) * | 2018-11-02 | 2019-01-22 | 内蒙古工业大学 | A kind of device and method for pasting annular support grid for transmission electron microscope sample |
| CN109254025B (en) * | 2018-11-02 | 2023-09-22 | 内蒙古工业大学 | Device and method for sticking annular carrier net to transmission electron microscope sample |
| CN114088756A (en) * | 2021-12-20 | 2022-02-25 | 北京中科科仪股份有限公司 | Sample access device and scanning electron microscope |
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
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Application publication date: 20130710 |