CN103187025B - Operating circuit and related device, equipment and method for OLED - Google Patents
Operating circuit and related device, equipment and method for OLED Download PDFInfo
- Publication number
- CN103187025B CN103187025B CN201110456044.1A CN201110456044A CN103187025B CN 103187025 B CN103187025 B CN 103187025B CN 201110456044 A CN201110456044 A CN 201110456044A CN 103187025 B CN103187025 B CN 103187025B
- Authority
- CN
- China
- Prior art keywords
- screen body
- voltage
- oled screen
- oled
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 10
- 238000001514 detection method Methods 0.000 claims description 48
- 230000008439 repair process Effects 0.000 claims description 31
- 239000012044 organic layer Substances 0.000 claims description 14
- 239000011159 matrix material Substances 0.000 claims description 13
- 238000012544 monitoring process Methods 0.000 claims description 3
- 230000007547 defect Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000037361 pathway Effects 0.000 description 2
- 229920001621 AMOLED Polymers 0.000 description 1
- 208000037656 Respiratory Sounds Diseases 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- GOLXNESZZPUPJE-UHFFFAOYSA-N spiromesifen Chemical compound CC1=CC(C)=CC(C)=C1C(C(O1)=O)=C(OC(=O)CC(C)(C)C)C11CCCC1 GOLXNESZZPUPJE-UHFFFAOYSA-N 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Electroluminescent Light Sources (AREA)
Abstract
The invention provides a kind of operating circuit for OLED.Present invention also offers a kind of OLED, it includes OLED screen body and the above-mentioned operating circuit for OLED.Present invention also offers a kind of display device.Present invention also offers a kind of luminaire.Present invention also offers the method for repairing OLED screen body.
Description
Technical field
This patent disclosure relates generally to ORGANIC ELECTROLUMINESCENCE DISPLAYS (OLED, OrganicElectroluminescenceDisplay) and lighting field, be specifically related to the reparation field of OLED.
Background technology
In recent years, organic electroluminescent technology is increasingly paid close attention to by people because of its plurality of advantages, and OLED is more extensively used display and illumination.
Typical OLED screen body includes anode, negative electrode and arranges organic layer between a cathode and an anode.In the work of OLED, OLED screen body is applied in forward voltage so that inject electronics from negative electrode to organic layer, injects hole, electronics and hole from anode to organic layer and is compounded to form exciton in organic layer, and when exciton releases energy, organic layer is luminous.
Current OLED includes active-matrix (activematrix) OLED and passive-matrix (passivematrix) OLED two kinds.In passive-matrix OLED, including one or more negative electrodes (they are generally parallel to each other when having multiple) and one or more anode (they are generally parallel to each other when having multiple), described negative electrode is with described anode at an angle, at generally right angles.Organic layer is there is between device cathodes and anode.In the work of passive-matrix OLED, each negative electrode and each anode can individually be applied voltage, when have there is forward voltage between the negative electrode of overlapping region and anode time, organic layer in this overlapping region is luminous.
Summary of the invention
OLED screen body is inevitably usually present the defect points such as dust granule, burr, pin hole, crackle, and the interval between the anode of OLED screen body and negative electrode is generally the least (the most hundreds of nanometer).As a result, at this defect point, anode may directly contact with negative electrode, or the organic layer between anode and negative electrode can become thinner than other positions.When OLED works, electric current more they tends to pass through at this defect point rather than from other positions.Heat is made to accumulate (often showing as bright spot) at this defect point.If things go on like this, single pixel not only can be caused the most luminous, also influence whether whole piece file or horizontally-arranged pixel, damage quality and the reliability of whole OLED.This defect point is referred to herein as short dot.
It is said that in general, in the case of other conditions are identical, the light-emitting area of OLED screen body is the biggest, occur that the probability of short dot is the biggest.Additionally, for there is the OLED of big pixel (such as the OLED of illumination, it the most only has a few pixels and the most only has a pixel), if short dot development of defects to pixel, with regard to the function of the whole OLED of entail dangers to.
Likely reduce short dot by increasing the thickness of organic layer, but this requires OLED to use higher driving voltage thus affects device efficiency, and short dot can not be completely eliminated.Short dot problem may be solved by adding overcoat, but this also requires that OLED uses higher driving voltage, and the complexity of preparation can be increased.
OLED screen body has the electrical characteristic of light emitting diode: when OLED screen body is applied forward voltage, is increased along with the increase exponentially of this forward voltage by the electric current of OLED screen body, such as shown in Fig. 1, (abscissa represents voltage, and unit is V；Vertical coordinate represents electric current density, and unit is A/m2)；When OLED screen body is applied backward voltage, OLED screen body is cut-off state, and no current passes through.If the OLED screen body that there is short dot is applied backward voltage, then the position in addition to short-circuit point is cut-off state, and current convergence passes through in short-circuit point, i.e. short-circuit point exists leakage current.When leakage current reaches a certain threshold value, and short dot can be breakdown, hereafter defect not developing deeply.In this article, " forward " voltage refers to the voltage putting on anode higher than the voltage putting on negative electrode, and " reversely " voltage refers to the voltage putting on negative electrode higher than the voltage putting on anode.Correspondingly, " reversely " electric current refers to from cathode system to the electric current of anode.
No doubt short dot is no longer luminous after breakdown, thus shows as dim spot, but when this dim spot is the least compared with the light-emitting area of whole OLED screen body, the impact on overall display or illuminating effect is the least, it might even be possible to ignore.Therefore, before short dot development of defects, even before short dot is found by human eye or detection equipment, it is favourable for repairing early.
One aspect of the present invention provides a kind of operating circuit for OLED, including:
Repair circuit, including:
First voltage supply terminal, for being connected to the anode of OLED screen body；And
Second voltage supply terminal, for being connected to the negative electrode of described OLED screen body,
For applying reversely to repair voltage to described OLED screen body by described first voltage supply terminal and described second voltage supply terminal.
In one embodiment, the above-mentioned operating circuit for OLED also includes:
Testing circuit, including:
3rd voltage supply terminal, for being connected to the anode of described OLED screen body；And
4th voltage supply terminal, for being connected to the negative electrode of described OLED screen body,
For described OLED screen body being applied inverse detection voltage by described 3rd voltage supply terminal and described 4th voltage supply terminal, and monitor the size of the inverse detection electric current caused by described inverse detection voltage.
In one embodiment, described 3rd voltage supply terminal and described first voltage supply terminal be same one end in, and/or described 4th voltage supply terminal is same terminal with described second voltage supply terminal.Use this embodiment can simplify circuit.
In one embodiment, the above-mentioned operating circuit for OLED also includes:
Driven circuit, including:
5th voltage supply terminal, for being connected to the anode of described OLED screen body；And
6th voltage supply terminal, for being connected to the negative electrode of described OLED screen body,
For described OLED screen body being applied normal drive voltage by described 5th voltage supply terminal and described 6th voltage supply terminal.
In one embodiment, described 5th voltage supply terminal and described first voltage supply terminal are same terminals, and/or described 6th voltage supply terminal is same terminal with described second voltage supply terminal.Use this embodiment can simplify circuit.
In one embodiment, the above-mentioned operating circuit for OLED also includes control unit, for controlling enabling and/or disabling of described reparation circuit.
In one embodiment, the above-mentioned operating circuit for OLED also includes control unit, is used for judging that whether described inverse detection electric current is more than threshold value, and perform:
If described inverse detection electric current is more than described threshold value, then enable described reparation circuit；And
If described inverse detection electric current is not more than described threshold value, then disable described reparation circuit.
In one embodiment, described control unit is additionally operable to perform:
If described inverse detection electric current is more than described threshold value, then forbid described OLED screen body is applied normal drive voltage；And
If described inverse detection electric current is not more than described threshold value, then allow described OLED screen body is applied normal drive voltage.
Another aspect provides a kind of OLED, including:
OLED screen body, including:
Anode；
Negative electrode；With
Organic layer, it is between described anode and described negative electrode；And
According to the operating circuit for OLED one of foregoing embodiments Suo Shu.Use this embodiment can obtain self OLED with repair function.On the one hand, this simplify the reparation operation of OLED, it is allowed to just OLED need not can be repaired by external reparation circuit, and allow the user not possessing corresponding technical skill at home OLED to be repaired.On the other hand, this is conducive to the timely reparation of OLED, such as, allow short dot to be repaired early before being found by human eye or detection equipment, thus extend the service life of OLED.
In one embodiment, above-mentioned OLED is passive-matrix OLED.
Another aspect provides a kind of display device, including according to the OLED one of foregoing embodiments Suo Shu.
Another aspect provides a kind of luminaire, including according to the OLED one of foregoing embodiments Suo Shu.
Another aspect provides a kind of method for repairing OLED screen body, including:
Apply reversely to repair voltage to described OLED screen body.
In one embodiment, the method is to use to perform according to the operating circuit for OLED one of foregoing embodiments Suo Shu.
Another aspect provides a kind of method for repairing OLED screen body, including:
OLED screen body is applied inverse detection voltage；
The size of the inverse detection electric current that monitoring is caused by described inverse detection voltage；And
If described inverse detection electric current is more than threshold value, then apply reversely to repair voltage to described OLED screen body.
In one embodiment, the above-mentioned method for repairing OLED screen body also includes:
After applying reversely to repair voltage to described OLED screen body, again described OLED screen body is applied inverse detection voltage, so repeat, until described inverse detection electric current is not more than described threshold value.
In one embodiment, the method is to use to perform according to the operating circuit for OLED one of foregoing embodiments Suo Shu.
Accompanying drawing explanation
By the detailed description below in conjunction with accompanying drawing, it is better understood with the present invention.In the accompanying drawings:
Fig. 1 exemplified with OLED screen body apply forward voltage time voltage-current curve graph.
Fig. 2 is the exemplary cross sectional view of the OLED screen body that there is short dot.
Fig. 3 is the schematic diagram being in connection status with the operating circuit and OLED screen body repairing circuit for OLED according to one embodiment of the invention
Fig. 4 is the schematic diagram being in connection status with the operating circuit and OLED screen body repairing circuit for OLED according to another embodiment of the invention.
Fig. 5 is the flow chart of the operation exemplified with the operating circuit shown in Fig. 4.
Fig. 6 is the schematic diagram of an embodiment of the voltage for repairing OLED screen body according to the present invention.
Should be understood that these accompanying drawings, merely for example purpose, and are not necessarily drawn to scale.
Detailed description of the invention
The detailed description of the invention of the present invention is described hereinafter with reference to accompanying drawing.
Fig. 2 is the exemplary cross sectional view of the OLED screen body 20 that there is short dot.OLED screen body 20 includes: substrate 200, anode 210, organic layer 220 and negative electrode 230.In OLED screen body 20, there is a short dot 240.Although short dot 240 is shown in the burr being convex to organic layer 220 at the interface of anode 210 and organic layer 220 from anode 210 in fig. 2, but short dot can occur otherwise in practice.
Fig. 3 is the schematic diagram being in connection status with the operating circuit 30 and OLED screen body 300 repairing circuit for OLED according to one embodiment of the invention.Operating circuit 30 includes: driven controls switch S1；Repair and control switch S2；Power switch Q1, Q2, Q3 and Q4 (are shown as MOS transistor) in figure 3；First voltage supply terminal 310, for being connected to the anode of OLED screen body；And the second voltage supply terminal 320, for being connected to the negative electrode of OLED screen body.
For operating circuit 30, normal drive voltage VCC is through the path of power switch Q1 to first voltage supply terminal 310, and ground voltage GND belongs to driven circuit through the path of power switch Q3 to second voltage supply terminal 320；Voltage VCOMH is through the path of power switch Q2 to second voltage supply terminal 320 in reparation, and ground voltage GND belongs to reparation circuit through the path of power switch Q4 to first voltage supply terminal 310.In operating circuit 30, driven circuit and reparation circuit share the first voltage supply terminal 310 and the second voltage supply terminal 320.
It is described in the operation in the case of operating circuit 30 is connected with OLED screen body 300 below.
When driven control switch S1 is for closing and repair control switch S2 for disconnection, power switch Q1 and Q3 conducting and power switch Q2 and Q4 are not turned on, the first voltage supply terminal 310 is made to provide normal drive voltage VCC to the anode of OLED screen body 300, and second voltage supply terminal 320 provide ground voltage GND to the negative electrode of OLED screen body 300, thus OLED screen body 300 normally works.When repairing control switch S2 and controlling to switch S1 for disconnecting for Guan Bi and driven, power switch Q2 and Q4 conducting and power switch Q1 and Q3 are not turned on, second voltage supply terminal 320 is provided to the negative electrode of OLED screen body 300 and repairs voltage VCOMH, and first anode from voltage supply terminal 310 to OLED screen body 300 provide ground voltage GND, wherein repair the part that voltage VCOMH includes voltage voltage GND above Ground, this part applies reversely to repair voltage to OLED screen body 300, thus repairs OLED screen body 300.
For operating circuit 30, repairing voltage VCOMH can be the pulse higher than GND of one or more voltage, can also be alternately (that plays puncture short point effect is still the voltage pulse higher than GND) of the pulse higher than GND of one or more voltage and the pulse less than GND of one or more voltage, depending on being actually needed.
Repair the closed and disconnected controlling to switch S2 can automatically trigger or manually trigger.Furthermore it is possible to add protection circuit for operating circuit 30, to avoid driven control switch S1 and repair control switch S2 simultaneously for Guan Bi.
Should be understood that and can apply to repair voltage on any desired opportunity.In a situation, can be when each end-of-job of OLED, such as when the display device with OLED shuts down, Guan Bi is repaired and is controlled switch S2, to apply to repair voltage, it would be possible to the short dot existed punctures.In another situation, can be during OLED normally work, when finding short dot (such as bright spot), disconnect driven and control switch S1, then Guan Bi restoration switch S2, to apply to repair voltage, short dot is punctured.
Fig. 4 is the schematic diagram being in connection status with the operating circuit 40 and OLED screen body 400 repairing circuit for OLED according to another embodiment of the invention.Operating circuit 40 includes: total control switch S1；Power switch Q1, Q2, Q3 and Q4 (are shown as MOS transistor) in the diagram；First voltage supply terminal 410, for being connected to the anode of OLED screen body；Second voltage supply terminal 420, for being connected to the negative electrode of OLED screen body；Master control unit 430, it has input IO_1 and IO_3 and outfan IO_2 and IO_4；Detector unit 440；And select unit 450 (not shown).
For operating circuit 40, normal drive voltage VCC is through the path of power switch Q1 to first voltage supply terminal 410, and ground voltage GND belongs to driven circuit through the path of power switch Q3 to second voltage supply terminal 420；Voltage VTEST is through the path of power switch Q2 to second voltage supply terminal 420 in detection, and ground voltage GND belongs to testing circuit through the path of power switch Q4 to first voltage supply terminal 410；Voltage VCOMH is through the path of power switch Q2 to second voltage supply terminal 420 in reparation, and ground voltage GND belongs to reparation circuit through the path of power switch Q4 to first voltage supply terminal 410.In operating circuit 40, driven circuit, testing circuit and reparation circuit share the first voltage supply terminal 410 and the second voltage supply terminal 420.Owing to operating circuit 40 performed detection before performing driven all automatically and automatically performed reparation according to testing result every time, the reparation circuit in Fig. 4 can be referred to as " self-repair circuit ".
It is described in the operation in the case of operating circuit 40 is connected with OLED screen body 400 below.
When total control switch S1 is for disconnecting, power switch Q1, Q2, Q3 and Q4 are not turned on.When total control switch S1 is switched to Guan Bi by disconnection, master control unit 430 receives voltage VDD by input IO_1, and make power switch Q2 and Q4 turn on by outfan IO_2 output signal, and select unit 450 to select detection voltage VTEST, the second voltage supply terminal 420 is made to provide detection voltage VTEST to the negative electrode of OLED screen body 400, and first anode from voltage supply terminal 410 to OLED screen body 400 provide ground voltage GND, wherein detection voltage VTEST includes the part of voltage voltage GND above Ground, and this part applies inverse detection voltage to OLED screen body 400.Now, detector unit 440 monitors the size of the reverse current (inverse detection electric current) caused by detection voltage VTEST, and the output valve exporting the size reflecting this reverse current to the input IO_3 of master control unit 430 and selects unit 450.If this output valve shows that this reverse current is not more than threshold value (such as 0A), so master control unit 430 makes power switch Q2 and Q4 be not turned on by outfan IO_2 output signal, then power switch Q1 and Q3 is made to turn on by outfan IO_4 output signal, the first voltage supply terminal 410 is made to provide normal drive voltage VCC to the anode of OLED screen body 400, and second voltage supply terminal 420 provide ground voltage GND to the negative electrode of OLED screen body 400, thus OLED screen body 400 normally works.If this output valve shows that this reverse current is more than described threshold value, unit 450 is selected to select to repair voltage VCOMH, second voltage supply terminal 420 is provided to the negative electrode of OLED screen body 400 and repairs voltage VCOMH, and first anode from voltage supply terminal 410 to OLED screen body 400 provide ground voltage GND, wherein repair the part that voltage VCOMH includes voltage voltage GND above Ground, this part applies reversely to repair voltage to OLED screen body 400, thus repairs OLED screen body 400；Then unit 450 is selected again to select to detect voltage VTEST, till reverse current is not more than described threshold value.
For operating circuit 40, detection voltage VTEST can be the voltage higher than GND continued for some time, and its size is typically not enough to puncture short point；Repairing voltage VCOMH can be the pulse higher than GND of one or more voltage, can also be alternately (that plays puncture short point effect is still the voltage pulse higher than GND) of the pulse higher than GND of one or more voltage and the pulse less than GND of one or more voltage, depending on being actually needed.
It should be understood that, it is convenient to omit detector unit 440 and selection unit 450, and the time applying to repair voltage is controlled by master control unit 430.
Operating circuit 30 and operating circuit 40, and master control unit 430, detector unit 440 and selection unit 450, can use discrete component form, integrated circuit form, discrete component to realize with integrated circuit combining form or any other suitable form.
Although it is global design with driven circuit that Fig. 3 and Fig. 4 all shows reparation circuit, it should be appreciated that it can also be separate for repairing circuit with driven circuit.Although Fig. 4 showing detection voltage and repairs voltage via same delivery pathways to OLED screen body, it should be appreciated that can also be via delivery pathways separate to OLED screen body.
Fig. 5 is the flow chart of the operation exemplified with the operating circuit 40 shown in Fig. 4.
Fig. 6 is the schematic diagram of an embodiment of the voltage for repairing OLED screen body according to the present invention.In figure 6, abscissa express time, unit is ms；Vertical coordinate represents voltage, and unit is V；Repair voltage and be illustrated as on the occasion of-null value-negative value-null value squared pulse trains alternately, vertical coordinate be on the occasion of pulse (direct impulse) represent to OLED screen body apply forward voltage, vertical coordinate be negative value pulse (reverse impulse) represent to OLED screen body apply backward voltage.In the pulse train shown in Fig. 6, play puncture short point effect is reverse impulse, and OLED screen body can be carried out seasoned while repairing defect by the pulse applying positive and negative alternate.In figure 6, the width of each direct impulse is 0.1ms, the width of each reverse impulse is 5ms, and the interval between each direct impulse and next reverse impulse is 0.1ms (mark), and the interval between each reverse impulse and next direct impulse is 8ms.Such as, want to realize the pulse train shown in Fig. 6 by the operating circuit 40 shown in the operating circuit 30 or Fig. 4 shown in Fig. 3, assuming that GND remains 0V, then can alternately input the pulse that width is 0.1ms and the pulse that width is 5ms of 10V of-21V as VCOMH.
Should be understood that and can use other kinds of reparation voltage according to practical situation: such as, the height of pulse, width and interval can be depending on being actually needed；It is for instance possible to use only negative loop and there is no the pulse train of positive portions.
Should be understood that embodiment herein and embodiment merely for example purpose, those skilled in the art can make many variants herein on the basis of instructing, and the scope of the present invention is defined by the claims.
Claims (6)
1. the operating circuit for passive-matrix OLED, it is characterised in that including:
For being connected to the terminal of the anode of OLED screen body；
For being connected to the terminal of the negative electrode of OLED screen body；
Total control switch, is used for controlling described operating circuit and starts working or quit work；
Driven circuit, for applying normal drive voltage to OLED screen body；
Detection/repair circuit, for OLED screen body apply inverse detection voltage/for OLED screen body apply reversely repair voltage；
Select unit, be used for selecting inverse detection voltage or reversely repairing voltage；
Detector unit, the inverse detection size of current that monitoring is caused by described inverse detection voltage；
Described operating circuit also includes master control unit,
When total control switch closes, described selection Unit selection inverse detection voltage and by described detection/reparation circuit to OLED screen body apply inverse detection voltage, the most described detector unit is monitored the inverse detection size of current caused by described inverse detection voltage and exports to described master control unit and described selection unit by the output valve reflecting described inverse detection size of current, wherein
When described output valve is not more than threshold value, the most described master control unit disconnects described detection/reparation circuit and connects described driven circuit, so that OLED screen body normally works；
When described output valve is more than described threshold value, the most described selection Unit selection reversely repairs voltage, to apply reversely to repair voltage to repair OLED screen body to OLED screen body by described detection/reparation circuit；
Then, described master control unit disconnects described driven circuit and connects described detection/reparation circuit the most described selection unit and again select inverse detection voltage, so repeats, till described output valve is not more than described threshold value.
2. a passive-matrix OLED, including:
OLED screen body, including:
Anode；
Negative electrode；With
Organic layer, it is between described anode and described negative electrode；And
Operating circuit for passive-matrix OLED according to claim 1.
3. a display device, including passive-matrix OLED according to claim 2.
4. a luminaire, including passive-matrix OLED according to claim 2.
5. for the method repairing passive-matrix OLED screen body, including:
OLED screen body is applied inverse detection voltage；
The size of the inverse detection electric current that monitoring is caused by described inverse detection voltage；
When the size of described inverse detection electric current is not more than threshold value, then OLED screen body is made normally to work；
When the size of described inverse detection electric current is more than described threshold value, then repair OLED screen body；
Then, again OLED screen body is applied inverse detection voltage, so repeat, till the size of inverse detection electric current is not more than described threshold value.
Method for repairing passive-matrix OLED screen body the most according to claim 5, it is to use the operating circuit for passive-matrix OLED according to claim 1 to perform.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110456044.1A CN103187025B (en) | 2011-12-30 | 2011-12-30 | Operating circuit and related device, equipment and method for OLED |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110456044.1A CN103187025B (en) | 2011-12-30 | 2011-12-30 | Operating circuit and related device, equipment and method for OLED |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103187025A CN103187025A (en) | 2013-07-03 |
| CN103187025B true CN103187025B (en) | 2016-08-03 |
Family
ID=48678169
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110456044.1A Active CN103187025B (en) | 2011-12-30 | 2011-12-30 | Operating circuit and related device, equipment and method for OLED |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103187025B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109545135B (en) * | 2018-12-06 | 2021-07-20 | 固安翌光科技有限公司 | Driving method and device of OLED (organic light emitting diode) illuminating screen body |
| CN116312360A (en) * | 2023-02-22 | 2023-06-23 | 合肥京东方卓印科技有限公司 | Display panel, control method thereof and display device |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001022504A1 (en) * | 1999-09-22 | 2001-03-29 | Koninklijke Philips Electronics N.V. | Organic electroluminescent device |
| CN1350417A (en) * | 2000-10-10 | 2002-05-22 | 株式会社半导体能源研究所 | Method for manufacturing and/or repairing lighting equipment |
| CN1462371A (en) * | 2001-05-15 | 2003-12-17 | 皇家菲利浦电子有限公司 | Display device comprising plurality of LEDS |
| CN1636145A (en) * | 2001-12-19 | 2005-07-06 | 皇家飞利浦电子股份有限公司 | Method of healing of low-ohmic defects in a flat display |
| CN1648978A (en) * | 2004-01-26 | 2005-08-03 | 株式会社半导体能源研究所 | Display device and driving method of the same |
| CN1677469A (en) * | 2004-03-29 | 2005-10-05 | 东北先锋电子股份有限公司 | Drive unit for light-emitting display panel, and electronic device mounted therewith |
| CN1711479A (en) * | 2002-11-06 | 2005-12-21 | 皇家飞利浦电子股份有限公司 | Inspecting method and apparatus for a LED matrix display |
| CN101236738A (en) * | 2008-03-03 | 2008-08-06 | 上海广电光电子有限公司 | LCD device repairing line operation amplification circuit and its drive method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4495952B2 (en) * | 2003-11-25 | 2010-07-07 | 東北パイオニア株式会社 | Organic EL display device and driving method thereof |
| JP4626649B2 (en) * | 2007-12-21 | 2011-02-09 | ソニー株式会社 | Manufacturing method of organic light emitting device |
| CN101710601A (en) * | 2009-10-30 | 2010-05-19 | 浙江正泰太阳能科技有限公司 | Method and equipment for repairing thin film solar cell |
-
2011
- 2011-12-30 CN CN201110456044.1A patent/CN103187025B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001022504A1 (en) * | 1999-09-22 | 2001-03-29 | Koninklijke Philips Electronics N.V. | Organic electroluminescent device |
| CN1350417A (en) * | 2000-10-10 | 2002-05-22 | 株式会社半导体能源研究所 | Method for manufacturing and/or repairing lighting equipment |
| CN1462371A (en) * | 2001-05-15 | 2003-12-17 | 皇家菲利浦电子有限公司 | Display device comprising plurality of LEDS |
| CN1636145A (en) * | 2001-12-19 | 2005-07-06 | 皇家飞利浦电子股份有限公司 | Method of healing of low-ohmic defects in a flat display |
| CN1711479A (en) * | 2002-11-06 | 2005-12-21 | 皇家飞利浦电子股份有限公司 | Inspecting method and apparatus for a LED matrix display |
| CN1648978A (en) * | 2004-01-26 | 2005-08-03 | 株式会社半导体能源研究所 | Display device and driving method of the same |
| CN1677469A (en) * | 2004-03-29 | 2005-10-05 | 东北先锋电子股份有限公司 | Drive unit for light-emitting display panel, and electronic device mounted therewith |
| CN101236738A (en) * | 2008-03-03 | 2008-08-06 | 上海广电光电子有限公司 | LCD device repairing line operation amplification circuit and its drive method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103187025A (en) | 2013-07-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI537919B (en) | Display and sub-pixel driving method thereof | |
| US10916618B2 (en) | Array substrate and method for repairing array substrate | |
| CN106531079B (en) | Pixel circuit, driving method thereof and display device | |
| CN105679219B (en) | AMOLED display panel testing method and detection device | |
| JP5317325B2 (en) | Light emitting device | |
| US10679911B2 (en) | Redundant pixel architecture in ILED displays | |
| CN1691113A (en) | Self light emitting type display module, electronic appliance loaded with the same module and verification method of faults in the same module | |
| JP2002040082A (en) | Inspection method and inspection device for organic led array | |
| TW200845808A (en) | Method for inspecting defects in electroluminescente display device, method for correcting defects in electroluminescenle display device, and method for making an electroluminescence display device | |
| CN100538793C (en) | The method of luminescent device and this luminescent device of driving | |
| CN1674075A (en) | Self light emitting display module, and inspection method of defect state in the same module and equipment with the same module | |
| CN104409453A (en) | LED packaging structure, LED display system and bad lamp detection method | |
| JP4565873B2 (en) | Luminescent display panel | |
| CN104218066A (en) | Pixel and organic light emitting display device using the same | |
| CN108122519A (en) | AMOLED pixel method for repairing and mending | |
| CN103187025B (en) | Operating circuit and related device, equipment and method for OLED | |
| JP5620988B2 (en) | Manufacturing method of organic EL display device | |
| JP5047850B2 (en) | Color display panel and display device | |
| JP4902194B2 (en) | Display device and inspection method for the same | |
| KR100662296B1 (en) | Aging Method of Organic Electro Luminescent Module | |
| JP2006210213A (en) | Aging method, manufacturing method and aging device of self-luminous device | |
| CN108682389A (en) | Pixel circuit and display device | |
| CN105788511B (en) | Pixel driving circuit and display device | |
| JP4192812B2 (en) | Image display device | |
| JP2013062086A (en) | Organic el display panel inspection method and inspection system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| ASS | Succession or assignment of patent right |
Owner name: TSINGHUA UNIVERSITY Free format text: FORMER OWNER: TSINGHUA UNIVERSITY WEIXINNUO SCIENCE AND TECHNOLOGY CO., LTD., BEIJING Effective date: 20140410 Owner name: KUNSHAN VISIONOX TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: WEIXINNUO DISPLAY TECH CO., LTD. Effective date: 20140410 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20140410 Address after: 215300 Kunshan high tech Zone, Jiangsu Province, Feng Feng Road, No. 188, No. Applicant after: KUNSHAN VISIONOX TECHNOLOGY CO., LTD. Applicant after: Tsinghua University Address before: 215300 Kunshan high tech Zone, Jiangsu Province, Feng Feng Road, No. 188, No. Applicant before: Weixinnuo Display Tech Co., Ltd. Applicant before: Tsinghua University Applicant before: Weixinnuo Science and Technology Co., Ltd., Beijing |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 215300 No. 188 Feng Feng Road, Kunshan hi tech Zone, Jiangsu, Kunshan Patentee after: Suzhou Qingyue Photoelectric Technology Co., Ltd Patentee after: TSINGHUA University Address before: 215300 No. 188 Feng Feng Road, Kunshan hi tech Zone, Jiangsu, Kunshan Patentee before: Kunshan Visionox Technology Co.,Ltd. Patentee before: TSINGHUA University |