CN102544347A - Quick-response photo-thermal induced voltage thin-film material and application - Google Patents

Quick-response photo-thermal induced voltage thin-film material and application Download PDF

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CN102544347A
CN102544347A CN2011102948999A CN201110294899A CN102544347A CN 102544347 A CN102544347 A CN 102544347A CN 2011102948999 A CN2011102948999 A CN 2011102948999A CN 201110294899 A CN201110294899 A CN 201110294899A CN 102544347 A CN102544347 A CN 102544347A
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induced voltage
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CN102544347B (en
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虞澜
张鹏翔
哈勃迈尔.汉斯.乌利希
晏国文
王勇
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Kunming University of Science and Technology
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Abstract

The invention discloses a photo-thermal induced voltage thin-film material having response time of less than 10 ns, and the application of the material. Lal-xSrxCoO3 serves as a quick-response induced voltage material, wherein x is equal to 0.1 to 0.6. A thin film is grown on an inclined strontium titanate (SrTiO3) single-crystal substrate by using a pulse laser deposit technology and has photo-thermal radiation induced voltage effects. Pulse laser light of which the pulse width is 28 ns and the wavelength is 248 nm is irradiated to the thin film, a quick-response large voltage signal of which the response time is 7 ns and the full width at half maximum is 17ns is obtained in the inclination direction of the thin film, and the voltage signal is acquired by a high-frequency oscilloscope. The photo-thermal induced voltage thin-film material is characterized in that: the response time is short; the material can operate at a wide optical spectrum of 0.19 to 11 mu m; the operation flow is easy, and energy sources are saved; the material can be used for manufacturing quick-response photo-thermal induced voltage detector devices; the response speed of a photo-thermal measuring instrument is increased; and the material is applicable to sensitive detection and tracking of pulse photo-thermal signals and military targets in the technical field of industry and the field of life.

Description

A kind of photo-thermal induced potential thin-film material and purposes of quick response
Technical field
The present invention relates to a kind of induced voltage material and purposes of fast-response, belong to light, hot induced voltage material and device technology field.
Background technology
At present, light, thermal measurement appearance mainly are divided into photon type measuring instrument and calorimetric type measuring instrument two big classes.The photon type measuring instrument is based on incident light in the semi-conducting material to the exciting of charge carrier, and like the generation of electron hole, measures the energy of incident light.This type detector has very fast time response usually, but receives to be with and the restriction of energy level, can not in wide spectral region, work.Calorimetric type measuring instrument is the variation that when absorbing heat, has physical quantity, through to the monitoring of physical index and the measuring light radiation.Need the long time to reach heat balance but this type device can be worked in very wide spectral region, so the response time is slow.And above-mentioned two types of devices need apply bias voltage or bias current mostly, thereby cause the interference of dark current, thermal noise and so on, simultaneously consumed energy.
One type of photo-thermal radiation detector is based on the anisotropy of material Seebeck coefficient.To have the anisotropic material epitaxy of Seebeck coefficient and be grown on the single crystalline substrate of inclination, use up, thermal radiation will produce photoinduction voltage to film.Its advantage is in very wide spectral region (0.19 μ m~11 μ m), can obtain high response signal and fast response time.In the thin film material system of perovskite structure and accurate perovskite structure, the response time (referring to the signal rising edge) is in 50ns to the microsecond order of magnitude, but does not also break through 10ns.
 
Summary of the invention
The objective of the invention is to obtain to be shorter than 10ns in the response time (referring to the signal rising edge); Halfwidth 17ns; Can in very wide spectral region, work, and need not apply any bias voltage, bias current, the saving energy, photo-thermal induced voltage material and device that workflow is easy.
Technical scheme of the present invention is:
Choose La 1-xSr xCoO 3(X=0.1-O.6) as the thin-film material of fast response optical heat induced potential effect, it belongs to perovskite (A 1-xM xBO 3) oxide of structure class, wherein X=0.1~O.6, A is a trivalent rare earth ions, and M is the divalent alkaline-earth metal ion, and B is the transition-metal ion of variable valence states such as Mn, Co, Fe, and this type oxide has anisotropic Seebeck coefficient.
Adopt SrTiO 3Or LaAlO 3Structural material is as single crystalline substrate, utilizes pulsed laser deposition technique 5~15 ° of inclinations
SrTiO 3Or LaAlO 3La grows on the single crystalline substrate 1-xSr xCoO 3Film.
On 5~15 ° of incline directions on the film surface, prepare electrode then, receive on the ondograph through coaxial cable at the electrode two ends.
When pulsewidth is 28ns, wavelength be the pulsed laser irradiation of 248nm to film, on the film incline direction, obtain response time 7ns, the voltage signal that reaches volt of the quick response of halfwidth 17ns collects this voltage signal by ondograph.
Principle of the present invention:
The induced potential formula can be expressed as:
Figure DEST_PATH_IMAGE001
(1)
V is the induced potential of film on the substrate tilting direction in (1) formula; L is that film is accepted light, thermal-radiating length, and d is a film thickness; Δ S=(S Ab-S c), S Ab, S cBe respectively the Seebeck coefficient of ab face and c axle; Δ T is the temperature gradient that film forms in the substrate tilting direction; θ is the angle between single crystalline substrate normal direction and (001) axle, i.e. inclination angle.
The invention has the beneficial effects as follows: the response time has been broken through 10ns (less than 10ns), can in very wide spectral region, work, and need not add any bigoted voltage and current.Can be used for making the photo-thermal induced potential sensitive detection parts of some rapid sensitive reactions, improve the reaction speed of light, thermal measurement appearance, be used for the pulsed light thermal signal of industrial technology field even sphere of life and the sensitivity of military target and survey and follow the trail of.
 
Description of drawings
Fig. 1 is that the present invention is at inclination SrTiO 3The La that grows on the single crystalline substrate 1-xSr xCoO 3(X=0.1-O.6) film sketch map and pulse laser induced potential schematic diagram.
Fig. 2 is that the present invention is 10 at the inclination angle oSrTiO 3The La that grows on the single crystalline substrate 0.5Sr 0.5CoO 3The photoinduction voltage signal curve of film.
Embodiment
Below in conjunction with accompanying drawing and embodiment the present invention is further specified.
Embodiment 1:
In Fig. 1, choose La 1-xSr xCoO 3, wherein X=0.3 is as the thin-film material of fast-response laser induced chemical vapor deposition voltage effects.At first utilizing pulsed laser deposition technique is 10 at the inclination angle oSrTiO 3La grows on the single crystalline substrate 1-xSr xCoO 3Film; Connect ondograph according to Fig. 1 then; With light radiation film surface, then direction produces photoinduction voltage at the inclination angle, thereby can obtain the induced potential signal, forms corresponding image.
Fig. 2 is 10 at the inclination angle for using said method oSrTiO 3The La that grows on the single crystalline substrate 0.5Sr 0.5CoO 3Film, the photoinduction voltage pattern picture that under Ultra-Violet Laser (248nm) irradiation of 28ns pulse duration, obtains.Can draw La 0.5Sr 0.5CoO 3The response time of film is 7ns, halfwidth 17ns.
Embodiment 2:
In Fig. 1, choose La 1-xSr xCoO 3, wherein X=0.1 is as the thin-film material of fast-response laser induced chemical vapor deposition voltage effects.At first utilizing pulsed laser deposition technique is 15 at the inclination angle oSrTiO 3La grows on the single crystalline substrate 1-xSr xCoO 3Film; Connect ondograph according to Fig. 1 then; With light radiation film surface, then direction produces photoinduction voltage at the inclination angle, thereby can obtain the induced potential signal, forms corresponding image.
The photoinduction voltage pattern picture that under Ultra-Violet Laser (248nm) irradiation of 28ns pulse duration, obtains.Can draw La 0.5Sr 0.5CoO 3The response time of film is 7ns, halfwidth 17ns.
Embodiment 3:
In Fig. 1, choose La 1-xSr xCoO 3, wherein X=0.6 is as the thin-film material of fast-response laser induced chemical vapor deposition voltage effects.At first utilizing pulsed laser deposition technique is 5 at the inclination angle oSrTiO 3La grows on the single crystalline substrate 1-xSr xCoO 3Film; Connect ondograph according to Fig. 1 then; With light radiation film surface, then direction produces photoinduction voltage at the inclination angle, thereby can obtain the induced potential signal, forms corresponding image.
The photoinduction voltage pattern picture that under Ultra-Violet Laser (248nm) irradiation of 28ns pulse duration, obtains.Can draw La 0.5Sr 0.5CoO 3The response time of film is 7ns, halfwidth 17ns.

Claims (3)

1. a photo-thermal induced potential thin-film material that responds fast is characterized in that: adopt SrTiO 3Or LaAlO 3Structural material
As single crystalline substrate, La 1-xSr xCoO 3Structural material is as the thin-film material of the photo-thermal induced potential effect of fast-response, wherein X=0.1~0.6.
2. quick response induced potential thin-film material according to claim 1 is characterized in that: La 1-xSr xCoO 3Structure
Film is that to be grown in the inclination angle be 5~15 ° SrTiO 3, LaAlO 3On the single crystalline substrate.
3. quick response induced potential thin-film material according to claim 2 and uses thereof is characterized in that: be used for the pulsed light thermal signal of industrial technology field even sphere of life and the sensitivity of military target and survey and follow the trail of.
CN201110294899.9A 2011-10-08 2011-10-08 Quick-response photo-thermal induced voltage thin-film material and application Expired - Fee Related CN102544347B (en)

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103427013A (en) * 2013-08-30 2013-12-04 昆明理工大学 Atomic-layer thermopile material and application thereof
CN103641465A (en) * 2013-12-02 2014-03-19 昆明理工大学 Preparation method of porous ceramics
CN106400115A (en) * 2016-09-26 2017-02-15 昆明理工大学 Novel thin-film material with high-sensitivity transverse light-induced voltage response and preparation method thereof
CN108534945A (en) * 2018-03-22 2018-09-14 昆明理工大学 A method of modulation membrane laser induced potential
CN108630800A (en) * 2018-04-17 2018-10-09 昆明理工大学 A kind of photo-thermal induced voltage material and its application
CN109103324A (en) * 2018-06-26 2018-12-28 昆明理工大学 A kind of hot induced voltage material and its application
CN110350075A (en) * 2018-04-08 2019-10-18 昆明理工大学 A kind of hot induced voltage material and its application

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110993778A (en) * 2019-12-13 2020-04-10 西南科技大学 Heat flow sensor based on transverse thermoelectric effect of thin film
CN115666203B (en) 2022-12-26 2023-06-16 山东大学 Heat flow sensor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040016926A1 (en) * 2000-11-03 2004-01-29 The Regents Of The University Of California Thin film transistors on plastic substrates with reflective coatings for radiation protection
CN1923751A (en) * 2005-12-19 2007-03-07 昆明理工大学 Fast response optical heat radiation induced voltage material, preparation method and application

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040016926A1 (en) * 2000-11-03 2004-01-29 The Regents Of The University Of California Thin film transistors on plastic substrates with reflective coatings for radiation protection
CN1923751A (en) * 2005-12-19 2007-03-07 昆明理工大学 Fast response optical heat radiation induced voltage material, preparation method and application

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
彭巨擎等: "不同衬底上La0.5Sr0.5CoO3薄膜生长及导电性质的研究", 《昆明理工大学学报》 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103427013A (en) * 2013-08-30 2013-12-04 昆明理工大学 Atomic-layer thermopile material and application thereof
CN103641465A (en) * 2013-12-02 2014-03-19 昆明理工大学 Preparation method of porous ceramics
CN106400115A (en) * 2016-09-26 2017-02-15 昆明理工大学 Novel thin-film material with high-sensitivity transverse light-induced voltage response and preparation method thereof
CN106400115B (en) * 2016-09-26 2020-03-31 云南大学 Thin film material with high-sensitivity transverse light induced voltage response and preparation method thereof
CN108534945A (en) * 2018-03-22 2018-09-14 昆明理工大学 A method of modulation membrane laser induced potential
CN108534945B (en) * 2018-03-22 2021-01-05 昆明理工大学 Method for modulating thin film laser induced voltage
CN110350075A (en) * 2018-04-08 2019-10-18 昆明理工大学 A kind of hot induced voltage material and its application
CN108630800A (en) * 2018-04-17 2018-10-09 昆明理工大学 A kind of photo-thermal induced voltage material and its application
CN109103324A (en) * 2018-06-26 2018-12-28 昆明理工大学 A kind of hot induced voltage material and its application

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