CN101957428B - Automatic test method and tool of monitoring circuit board - Google Patents
Automatic test method and tool of monitoring circuit board Download PDFInfo
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- CN101957428B CN101957428B CN 201010264183 CN201010264183A CN101957428B CN 101957428 B CN101957428 B CN 101957428B CN 201010264183 CN201010264183 CN 201010264183 CN 201010264183 A CN201010264183 A CN 201010264183A CN 101957428 B CN101957428 B CN 101957428B
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Abstract
The invention discloses automatic test method and tool of a monitoring circuit board. The performance of the monitoring circuit board is judged according to a difference value obtained by comparing voltage signals outputted to a monitoring circuit board and voltage signals returned by the monitoring circuit board, and the automatic test method of the monitoring circuit board is applied to the automatic test tool to test the performance of the monitoring circuit board. Because the processes of signal outputting, collecting and comparing are completed by the automatic test tool, the method improves the working efficiency and the test accuracy compared with a manual test method.
Description
Technical field
The present invention relates to the collecting test field of simulating signal, particularly a kind of automatic test approach of supervisory circuit plate and instrument.
Background technology
The supervisory circuit plate is the comparatively widely important component part in the electronic product of current utilization, its by gather and the control electronic product in the voltage of Acquisition Circuit, come the monitoring performance to electronic product.
Supervisory circuit plate voltage acquisition port processing behind voltage, supervisory circuit plate and upper machine communication, when host computer sent control command to the supervisory circuit plate, the Control of Voltage port of supervisory circuit plate was according to the control command output voltage.
At present, in order to guarantee that the supervisory circuit plate gathers and correctness and the reliability of output voltage, general method is: manually input analog voltage is to supervisory circuit plate voltage acquisition port, microcomputer and the communication of supervisory circuit plate confirm that the supervisory circuit plate gathers the correctness of voltage, or microcomputer and supervisory circuit plate Communication Control supervisory circuit plate Voltage-output port, utilize the voltage such as multimeter to read the correctness that instrument detects supervisory circuit plate output voltage.The method of this manual detection has the following disadvantages:
1). be subject to the restriction of tester's testing level, can produce larger error;
2). need to consume a large amount of working time of tester, efficient is lower, fails the supervisory circuit plate is carried out reliability testing.
Summary of the invention
In order to overcome above deficiency, the invention provides a kind of automatic test approach and instrument of supervisory circuit plate, the process of manual test is finished by software and hardware, improved efficient and the precision of test.
The automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
(1). read the model of supervisory circuit plate and according to the model of supervisory circuit plate test event, test parameter and test index are set;
(2). generate the voltage signal corresponding with described test event and test parameter and voltage signal is exported to voltage acquisition port corresponding to supervisory circuit plate;
(3). gather voltage signal from Voltage-output port corresponding to supervisory circuit plate, whether judge the performance of supervisory circuit plate according to the absolute value of the difference of the voltage signal of the voltage signal of described collection and generation less than described test index.
Preferably, described step (1) comprising:
A. read the model of supervisory circuit plate;
B., whether the test cases of current model supervisory circuit plate is arranged, if having then enter step c, if not then enter steps d in the Query Database;
C. with test event, test parameter and test index in the current model supervisory circuit board test case in database test event, test parameter and the test index as current model supervisory circuit plate;
D. test event, test parameter and the test index of first test cases in the reminding user Update Table storehouse, with test event, test parameter and the test index of amended first test cases of user as test event, test parameter and the test index of current model supervisory circuit plate and be kept in the database test cases as current model supervisory circuit plate.
The automatic testing instrument of supervisory circuit plate of the present invention, comprise the PC main frame, testing instrument unit and testing mould unit, described PC main frame, testing instrument unit links to each other in twos with the testing mould unit, described testing mould unit links to each other with the supervisory circuit plate, described PC main frame reads the model of supervisory circuit plate by described testing mould unit, test event corresponding to supervisory circuit plate model is set, test parameter and test index, generate voltage signal corresponding to described test event and test parameter and be transferred to voltage acquisition port corresponding to supervisory circuit plate by described testing instrument unit and testing mould unit successively, the voltage signal of the Voltage-output port that the acquisition monitoring circuit board is corresponding, whether judge the performance of supervisory circuit plate less than described test index according to the absolute value of the difference between the voltage signal of the voltage signal of described collection and described generation, described testing instrument unit is carried out modulus or digital-to-analog conversion to the voltage signal that transmits between described PC main frame and the described testing mould unit, described testing mould unit between described PC main frame and the supervisory circuit plate be connected and described testing instrument unit and supervisory circuit plate between be connected the function that interface conversion is provided.
Preferably, described PC main frame comprises configuration module, communication module, instrument control module and data processing module, described communication module reads the model of current supervisory circuit plate by described testing mould unit, described configuration module is judged the test cases of whether having preserved current model supervisory circuit plate in the described data processing module, if then with the test event in this test cases, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, then reminding user is revised the test event of first test cases that described data processing module preserves if not, test parameter and test index, with the amended test event of user, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, described instrument control module generates the voltage signal corresponding with the test event of current model supervisory circuit plate and test parameter, voltage signal is sent to successively the voltage signal of Voltage-output port corresponding to voltage acquisition port corresponding to supervisory circuit plate and acquisition monitoring circuit board by described testing instrument unit and described testing mould unit, described data processing module is with described test event, test parameter and test index save as the test cases of current model supervisory circuit plate, whether judge the performance of supervisory circuit plate less than described test index according to the absolute value of the difference between the voltage signal of the voltage signal that gathers and generation.
The automatic test approach of supervisory circuit plate of the present invention and instrument, the voltage signal that simulation electronic product input voltage signal returns to supervisory circuit plate and acquisition monitoring circuit board, the voltage signal that the voltage signal of input monitoring circuit board is returned with it makes comparisons to judge the performance of supervisory circuit plate, owing to preserved a large amount of test cases, so that directly adopt the test parameter in the case or can generate the voltage signal corresponding with supervisory circuit plate model with reference to test parameter in the case, again because test index is set, so that to the accuracy of judgement of supervisory circuit plate performance and flexibly, generate signal, the process of collection signal and comparison signal is all finished by automatic testing instrument, compares manual test and has improved testing efficiency and precision.
Description of drawings
Fig. 1 is the schematic flow sheet of the automatic test approach embodiment one of supervisory circuit plate of the present invention;
Fig. 2 is the schematic flow sheet of the automatic test approach embodiment three of supervisory circuit plate of the present invention;
Fig. 3 is the structural representation of the automatic testing instrument embodiment one of supervisory circuit plate of the present invention;
Fig. 4 is the structural representation of the automatic testing instrument embodiment four of supervisory circuit plate of the present invention.
Embodiment
Supervisory circuit plate of the present invention is the method for test automatically, and the result's who returns according to the test parameter that arranges and supervisory circuit plate size is judged the performance of supervisory circuit plate.
Further explain the present invention below in conjunction with accompanying drawing.
Embodiment one:
Shown in Figure 1 is the process flow diagram of supervisory circuit plate automatic test approach embodiment one of the present invention, and the automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
101. read the model of supervisory circuit plate and according to the model of supervisory circuit plate test event, test parameter and test index be set;
102. the voltage signal that generation is corresponding with test event and test parameter is also exported to voltage acquisition port corresponding to supervisory circuit plate with voltage signal;
103. gather voltage signal from Voltage-output port corresponding to supervisory circuit plate, whether judge the performance of supervisory circuit plate according to the absolute value of the difference of the voltage signal of the voltage signal that gathers and generation less than test index.
Its performance of supervisory circuit plate of different model is perhaps different, therefore before test, need to test event be set for the model of supervisory circuit plate, test parameter and test index that each test event is corresponding different, wherein test index is to weigh the index of supervisory circuit plate performance, then this supervisory circuit plate performance is qualified if the absolute value of the difference of the voltage signal of input monitoring circuit board and output monitoring circuit board is less than test index, otherwise defective.
Embodiment two:
The difference of present embodiment and embodiment one is that the step 101 of embodiment one is come specific implementation by the step a in the present embodiment～d, and the automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
A. read the model of supervisory circuit plate;
B., whether the test cases of current model supervisory circuit plate is arranged, if having then enter step c, if not then enter steps d in the Query Database;
C. with test event, test parameter and test index in the current model supervisory circuit board test case in database test event, test parameter and the test index as current model supervisory circuit plate;
D. test event, test parameter and the test index of first test cases in the reminding user Update Table storehouse, with test event, test parameter and the test index of amended first test cases of user as test event, test parameter and the test index of current model supervisory circuit plate and be kept in the database test cases as current model supervisory circuit plate.
In the present embodiment test event, test parameter and the test index of supervisory circuit plate be kept in the database test cases as this model supervisory circuit plate, when next time the supervisory circuit plate of same model being tested, directly adopt test event, test parameter and the test index of the test cases of the supervisory circuit plate that model is identical in the database, avoid the setting that repeats to same model supervisory circuit plate, improved testing efficiency.
Identical among other technical characterictic among the embodiment two and the embodiment one do not repeat them here.
Embodiment three:
The difference of present embodiment and embodiment two is, present embodiment has increased from the step of supervisory circuit plate reading out data, be the process flow diagram of supervisory circuit plate automatic test approach embodiment three of the present invention as shown in Figure 2, the automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
201. read the model of supervisory circuit plate;
202. whether the test cases of current model supervisory circuit plate is arranged, if having then enter step 203,205, if not then enter step 204,205 in the Query Database;
203. with test event, test parameter and test index in the current model supervisory circuit board test case in database test event, test parameter and the test index as current model supervisory circuit plate;
204. test event, test parameter and the test index of first test cases in the reminding user Update Table storehouse, with test event, test parameter and the test index of amended first test cases of user as test event, test parameter and the test index of current model supervisory circuit plate and be kept in the database test cases as current model supervisory circuit plate.
Whether need data on the supervisory circuit plate 205. judge to generate test event and voltage signal corresponding to test parameter, if need to would enter step 206,207, if do not need then enter step 207;
206. read the data that need from the supervisory circuit plate;
207. generate test event and voltage signal corresponding to test parameter;
208. the voltage signal that generates is transferred to the voltage signal of Voltage-output port corresponding to voltage acquisition port corresponding to supervisory circuit plate and acquisition monitoring circuit board;
209. the difference of the voltage signal that calculating gathers and the voltage signal of generation, judge that whether the absolute value of difference is less than test index, if the performance less than current model supervisory circuit plate then is qualified, if the test index of being not less than, then the performance inconsistency lattice of current model supervisory circuit plate.
The below further specifies the flow process of this supervisory circuit plate automatic test approach take the temperature detecting function test as example.
Read the supervisory circuit plate model and with database in the test cases preserved relatively, the test cases of learning current model exists, then adopt the test event in the test cases, test parameter and test index, test event in this test cases comprises that the temperature detecting function test describes as example, read test parameters of temperature higher limit Tmax from this test cases, lowest temperature value Tmin and temperature test index Tm, in the bound scope, choose one group of number as test parameter, such as minimum value, random value between minimum value and the intermediate value, intermediate value, random value between intermediate value and the maximal value, maximal value is the array S of totally 5 numbers composition, the more test results of data amount check are more accurate, but overabundance of data will affect testing efficiency, therefore generally get 5 numbers, when generating voltage signal corresponding to test parameter, the temperature detecting function test need to be converted into magnitude of voltage with temperature value, therefore read temperature slope T1 from the supervisory circuit plate, temperature intercept parameter T2, then can get magnitude of voltage array V=S*T1+T2, the voltage signal that formation voltage value array V is corresponding also outputs to voltage signal the temperature detection port of supervisory circuit plate voltage acquisition port, read the voltage signal of the temperature output port of the Voltage-output port on the supervisory circuit plate, be that the voltage signal of input monitoring circuit board is when comparing with the voltage signal that reads from the supervisory circuit plate at the voltage signal that will generate, the voltage signal that reads is sampled, according to array S, choose the minimum value of the above-mentioned voltage signal amplitude that reads, random value between minimum value and the intermediate value, intermediate value, random value between intermediate value and the maximal value, maximal value totally 5 numbers forms temperature value array T, test result array R=|S-T| then, with the temperature test index Tm in test result and the test cases relatively, when the numerical value among the array R during all less than Tm, supervisory circuit plate performance is qualified, and the performance of the less supervisory circuit plate of the numerical value among the array R is better, and the performance of the larger explanation supervisory circuit of the numerical value among array R plate is poorer.
The automatic testing instrument of supervisory circuit plate of the present invention, the device corresponding with the automatic test approach of supervisory circuit plate of the present invention, it adopts PC main frame simulation electronic product and host computer input/output signal to the supervisory circuit plate, the result that the supervisory circuit plate is returned compares with theoretical value, judge the quality of supervisory circuit plate performance with the size of error, explain in detail the present invention below in conjunction with accompanying drawing.
Embodiment one:
As shown in Figure 3, the automatic testing instrument of supervisory circuit plate of the present invention, comprise the PC main frame, testing instrument unit and testing mould unit, the PC main frame, testing instrument unit links to each other in twos with the testing mould unit, the testing mould unit links to each other with the supervisory circuit plate, the PC main frame reads the model of supervisory circuit plate and sets test event according to the model of supervisory circuit plate, test parameter and test index also generate test event and voltage signal that test parameter is corresponding, this voltage signal is transferred to voltage acquisition port corresponding to supervisory circuit plate, the voltage signal of the Voltage-output port that the acquisition monitoring circuit board is corresponding, whether judge the performance of supervisory circuit plate less than test index according to the absolute value of the difference of the voltage signal of the voltage signal that gathers and generation, the signal that transmits between PC main frame and the supervisory circuit plate, if voltage signal, then signal transmits between the voltage port of the PCI of PC main frame slot and supervisory circuit plate through testing instrument unit and testing mould unit, if be non-voltage signal, then signal only transmits between the RS485 port of the PORT COM of PC main frame and supervisory circuit plate through the testing mould unit, any change is not made to signal in the testing mould unit, only between PC main frame and the supervisory circuit plate be connected and testing instrument unit and supervisory circuit plate between be connected the function that interface conversion is provided, the testing mould unit can independently-poweredly also can be powered by testing instrument unit, in order to allow the supervisory circuit plate better work, the testing mould unit is the power supply of supervisory circuit plate after with the voltage voltage stabilizing again, testing instrument unit is finished the analog to digital conversion of the different voltage signal that transmits between PC main frame and the testing mould unit, and (simulating signal is to the conversion of digital signal, or digital signal is to the conversion of simulating signal), in temperature detecting function test and power detection test, after testing instrument unit is carried out digital-to-analog conversion to voltage signal corresponding to temperature detecting function test, with the signal after the conversion after tested die unit export to the temperature detection port of supervisory circuit plate voltage acquisition port, after testing instrument unit is carried out digital-to-analog conversion to voltage signal corresponding to power detection test, with the signal after the conversion after tested die unit export to the power detection port of supervisory circuit plate voltage acquisition port.
Embodiment two:
The difference of present embodiment and embodiment one is, PC main frame among the embodiment one is by the configuration module in the present embodiment, communication module, instrument control module and data processing module come specific implementation, as shown in Figure 4, the PC main frame of the automatic testing instrument of supervisory circuit plate of the present invention comprises configuration module, communication module, instrument control module and data processing module, communication module reads the model of current supervisory circuit plate by the testing mould unit, configuration module is judged the test cases of whether having preserved current model supervisory circuit plate in the data processing module, if then with the test event in this test cases, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, the test event of first test cases of preserving of reminding user Update Table processing module then if not, test parameter and test index, with the amended test event of user, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, the instrument control module generates the voltage signal corresponding with the test event of current model supervisory circuit plate and test parameter, voltage signal is sent to successively the voltage signal of Voltage-output port corresponding to voltage acquisition port corresponding to supervisory circuit plate and acquisition monitoring circuit board by testing instrument unit and testing mould unit, data processing module is with described test event, test parameter and test index save as the test cases of current model supervisory circuit plate, whether judge the performance of supervisory circuit plate less than test index according to the absolute value of difference between the voltage signal of the voltage signal that gathers and generation.
Data processing module in the present embodiment is also preserved the test cases of each model supervisory circuit plate, if module finds current model supervisory circuit plate in the test cases that data processing module is preserved test cases is set, then need not again current model supervisory circuit plate to be arranged, directly adopt test event, test parameter and test index in the test cases to get final product, saved the trouble that again arranges, test cases has been preserved also be convenient to the later stage and check.
Identical among other technical characterictic among the embodiment two and the embodiment one do not repeat them here.
Embodiment three:
The difference of present embodiment and embodiment two is, the automatic test job of supervisory circuit plate of present embodiment has increased from the function of supervisory circuit plate reading out data, the instrument control module judged before the formation voltage signal whether the formation voltage signal needs the data of supervisory circuit plate, if do not need then direct formation voltage signal, then send the reading out data instruction to communication module if need, communication module reads the corresponding data of supervisory circuit plate and sends to the instrument control module by the testing mould unit after receiving instruction, the instrument control module is according to test event, test parameter and corresponding data formation voltage signal, data processing module also is saved to this corresponding data in the test cases of current model supervisory circuit plate.
In the example such as the test of automatic test approach embodiment three temperature detecting functions of supervisory circuit plate of the present invention, when converting temperature value to magnitude of voltage, need to read temperature slope and temperature intercept parameter from the supervisory circuit plate, when present embodiment runs into this kind situation, the judgement of instrument control module learns that the formation voltage signal also needs the data on the supervisory circuit plate except test parameter, then obtain corresponding data on the supervisory circuit plate and then formation voltage signal by communication module.
Identical among other technical characterictic among the embodiment three and the embodiment two do not repeat them here.
Embodiment four:
The difference of present embodiment and embodiment three is, testing instrument unit among the embodiment three is come specific implementation by the A/D capture card in the present embodiment and D/A output card, as shown in Figure 4, testing instrument unit comprises A/D capture card and D/A output card, the A/D capture card is inserted on the PCI slot of PC main frame, the different voltage signal that the Voltage-output port of supervisory circuit plate is returned is transferred to the instrument control module of PC main frame after analog to digital conversion (simulating signal is to the conversion of digital signal), the D/A output card is inserted on the PCI slot of PC main frame, the different voltage signal of the instrument control module of PC main frame output is transferred to the voltage acquisition port of supervisory circuit plate by the testing mould unit through digital-to-analog conversion (digital signal is to the conversion of simulating signal), the power supply of testing mould unit can be provided by the A/D capture card, perhaps provided by the D/A output card, also can jointly be provided by the two.
Other technical characterictic among the embodiment four is identical with embodiment three, does not repeat them here.
The automatic test approach of supervisory circuit plate of the present invention is applied on the automatic testing instrument of supervisory circuit plate of the present invention, can finishes the every test to the supervisory circuit plate.
Above-described embodiment of the present invention does not consist of the restriction to protection domain of the present invention.Any modification of doing within the spirit and principles in the present invention, be equal to and replace and improvement etc., all should be included within the claim protection domain of the present invention.
Claims (5)
1. the automatic test approach of a supervisory circuit plate is characterized in that, may further comprise the steps:
(1). read the model of supervisory circuit plate and according to the model of supervisory circuit plate test event, test parameter and test index are set;
(2). generate the voltage signal corresponding with described test event and test parameter and voltage signal is exported to voltage acquisition port corresponding to supervisory circuit plate;
(3). gather voltage signal from Voltage-output port corresponding to supervisory circuit plate, whether judge the performance of supervisory circuit plate less than described test index according to the absolute value of the difference of the voltage signal of the voltage signal of described collection and generation,
Described step (1) comprising:
A. read the model of supervisory circuit plate;
B., whether the test cases of current model supervisory circuit plate is arranged, if having then enter step c, if not then enter steps d in the Query Database;
C. with test event, test parameter and test index in the current model supervisory circuit board test case in database test event, test parameter and the test index as current model supervisory circuit plate;
D. test event, test parameter and the test index of first test cases in the reminding user Update Table storehouse, with test event, test parameter and the test index of amended first test cases of user as test event, test parameter and the test index of current model supervisory circuit plate and be kept in the database test cases as current model supervisory circuit plate.
2. the automatic test approach of supervisory circuit plate according to claim 1 is characterized in that, generates the voltage signal corresponding with described test event and test parameter in the described step (2) and comprises:
Judge and generate the data whether voltage signal corresponding with described test event and test parameter needs the supervisory circuit plate, then directly generate if not the voltage signal corresponding with described test event and test parameter, if then read the corresponding data of supervisory circuit plate and generate the voltage signal corresponding with the corresponding data of described test event, test parameter and supervisory circuit plate.
3. the automatic testing instrument of a supervisory circuit plate, it is characterized in that, comprise the PC main frame, testing instrument unit and testing mould unit, described PC main frame, testing instrument unit links to each other in twos with the testing mould unit, described testing mould unit links to each other with the supervisory circuit plate, described PC main frame reads the model of supervisory circuit plate by described testing mould unit, test event corresponding to supervisory circuit plate model is set, test parameter and test index, generate voltage signal corresponding to described test event and test parameter and be transferred to voltage acquisition port corresponding to supervisory circuit plate by described testing instrument unit and testing mould unit successively, the voltage signal of the Voltage-output port that the acquisition monitoring circuit board is corresponding, whether judge the performance of supervisory circuit plate less than described test index according to the absolute value of the difference between the voltage signal of the voltage signal of described collection and described generation, described testing instrument unit is carried out modulus or digital-to-analog conversion to the voltage signal that transmits between described PC main frame and the described testing mould unit, described testing mould unit between described PC main frame and the supervisory circuit plate be connected and described testing instrument unit and supervisory circuit plate between be connected the function that interface conversion is provided
Described PC main frame comprises configuration module, communication module, instrument control module and data processing module, described communication module reads the model of current supervisory circuit plate by described testing mould unit, described configuration module is judged the test cases of whether having preserved current model supervisory circuit plate in the described data processing module, if then with the test event in this test cases, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, then reminding user is revised the test event of first test cases that described data processing module preserves if not, test parameter and test index, with the amended test event of user, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, described instrument control module generates the voltage signal corresponding with the test event of current model supervisory circuit plate and test parameter, voltage signal is sent to successively the voltage signal of Voltage-output port corresponding to voltage acquisition port corresponding to supervisory circuit plate and acquisition monitoring circuit board by described testing instrument unit and described testing mould unit, described data processing module is with described test event, test parameter and test index save as the test cases of current model supervisory circuit plate, whether judge the performance of supervisory circuit plate less than described test index according to the absolute value of the difference between the voltage signal of the voltage signal that gathers and generation.
4. the automatic testing instrument of supervisory circuit plate according to claim 3, it is characterized in that, described instrument control module judged before the formation voltage signal whether the formation voltage signal needs the data of supervisory circuit plate, if do not need then direct formation voltage signal, then send the reading out data instruction to described communication module if need, described communication module reads the corresponding data of supervisory circuit plate and sends to described instrument control module by described testing mould unit after receiving instruction, described instrument control module is according to described corresponding data formation voltage signal, and described data processing module is saved to described corresponding data in the test cases of current model supervisory circuit plate.
5. according to claim 3 or the automatic testing instrument of 4 described supervisory circuit plates, it is characterized in that, described testing instrument unit comprises A/D capture card and D/A output card, the voltage signal of the Voltage-output port collection that described A/D capture card will return from the supervisory circuit plate is transferred to described PC main frame after analog to digital conversion, described D/A output card is transferred to supervisory circuit plate through digital-to-analog conversion by described testing mould unit with the voltage signal of described PC main frame output.
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| CN 201010264183 CN101957428B (en) | 2010-08-25 | 2010-08-25 | Automatic test method and tool of monitoring circuit board |
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| CN 201010264183 CN101957428B (en) | 2010-08-25 | 2010-08-25 | Automatic test method and tool of monitoring circuit board |
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| CN102435930A (en) * | 2011-09-29 | 2012-05-02 | 福建三元达软件有限公司 | Circuit board testing device and testing method thereof |
| CN104730446B (en) * | 2013-12-19 | 2018-01-23 | 致伸科技股份有限公司 | The test system of circuit board |
| CN105067930A (en) * | 2015-08-15 | 2015-11-18 | 深圳市昂盛达电子有限公司 | Test method and system of automatic test platform |
| CN105467243A (en) * | 2015-12-09 | 2016-04-06 | 上海精密计量测试研究所 | A man-machine interactive type component general test system and a test method thereof |
| CN105811981B (en) * | 2016-03-09 | 2019-07-26 | 深圳市博巨兴实业发展有限公司 | A kind of automatic test equipment of high-precision adc measurement |
| CN105738798A (en) * | 2016-04-15 | 2016-07-06 | 福建联迪商用设备有限公司 | Method, device and system for testing magnetic card circuits |
| CN106199388A (en) * | 2016-08-19 | 2016-12-07 | 集美大学 | Smart Home circuit board full-automatic detection apparatus and detection method thereof |
| CN111157873B (en) * | 2019-12-26 | 2021-08-06 | 武汉联特科技股份有限公司 | Intelligent PCBA program downloading and PCBA automatic testing system applied to industrial production |
| CN112947355B (en) * | 2020-09-16 | 2024-08-02 | 佛山市顺德海尔智能电子有限公司 | Test system |
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| JP2002156399A (en) * | 2000-11-17 | 2002-05-31 | Oht Inc | Device and method for inspecting circuit board |
| JP2006329814A (en) * | 2005-05-26 | 2006-12-07 | Denso Corp | Method for inspecting circuit mounted onto board |
| CN101452414A (en) * | 2007-12-06 | 2009-06-10 | 鸿富锦精密工业（深圳）有限公司 | Mainboard fan interface test system and method |
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