AU8881691A - Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects - Google Patents

Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects

Info

Publication number
AU8881691A
AU8881691A AU88816/91A AU8881691A AU8881691A AU 8881691 A AU8881691 A AU 8881691A AU 88816/91 A AU88816/91 A AU 88816/91A AU 8881691 A AU8881691 A AU 8881691A AU 8881691 A AU8881691 A AU 8881691A
Authority
AU
Australia
Prior art keywords
optical components
eye
objects
examining
transparent test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
AU88816/91A
Other versions
AU649291B2 (en
Inventor
Wolfgang Geissler
Peter Dr. Hagmann
Roland Dr. Hauck
Peter Hofer
Hubert Lutz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Novartis AG
Bodenseewerk Geratetechnik GmbH
Original Assignee
Novartis AG
Bodenseewerk Geratetechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19914124003 external-priority patent/DE4124003C2/en
Application filed by Novartis AG, Bodenseewerk Geratetechnik GmbH filed Critical Novartis AG
Publication of AU8881691A publication Critical patent/AU8881691A/en
Application granted granted Critical
Publication of AU649291B2 publication Critical patent/AU649291B2/en
Assigned to NOVARTIS AG, BODENSEEWERK GERATETECHNIK GMBH reassignment NOVARTIS AG Request to Amend Deed and Register Assignors: BODENSEEWERK GERATETECHNIK GMBH, CIBA-GEIGY AG
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Geometry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Eye Examination Apparatus (AREA)
  • Eyeglasses (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

A procedure and an apparatus for the examination, in particular quality inspection, of optical components, in which an image is produced of the respective components to be examined, and defects on the imaged object are detected by image analysis, as well as the integration of this examination procedure into the production of the component. The optical components can be ophthalmic components such as spectacle lenses, contact lenses, intraocular lenses and the like. <IMAGE>
AU88816/91A 1990-12-19 1991-12-04 Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects Ceased AU649291B2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
CH4032/90 1990-12-19
CH403290 1990-12-19
DE19914124003 DE4124003C2 (en) 1991-07-19 1991-07-19 Lighting device for illuminating clear-transparent test objects, for examining the test objects for defects
DE4124003 1991-07-19

Publications (2)

Publication Number Publication Date
AU8881691A true AU8881691A (en) 1992-06-25
AU649291B2 AU649291B2 (en) 1994-05-19

Family

ID=25694472

Family Applications (1)

Application Number Title Priority Date Filing Date
AU88816/91A Ceased AU649291B2 (en) 1990-12-19 1991-12-04 Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects

Country Status (13)

Country Link
EP (1) EP0491663B1 (en)
JP (1) JPH04321186A (en)
KR (1) KR100202215B1 (en)
AT (1) ATE132971T1 (en)
AU (1) AU649291B2 (en)
CA (1) CA2057832A1 (en)
DE (1) DE59107249D1 (en)
DK (1) DK0491663T3 (en)
ES (1) ES2082178T3 (en)
GR (1) GR3018639T3 (en)
HK (1) HK1003125A1 (en)
IE (1) IE70436B1 (en)
PT (1) PT99855B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996030745A1 (en) * 1995-03-30 1996-10-03 Wesley-Jessen Corporation Inspection of optical components
AU674033B2 (en) * 1992-12-21 1996-12-05 Johnson & Johnson Vision Products, Inc. Lens inspection system
AU674169B2 (en) * 1992-12-21 1996-12-12 Johnson & Johnson Vision Products, Inc. A method of inspecting ophthalmic lenses
AU680444B2 (en) * 1992-12-21 1997-07-31 Johnson & Johnson Vision Products, Inc. Illumination and imaging subsystems for a lens inspection system
US6301005B1 (en) 1993-07-29 2001-10-09 Wesley Jessen Corporation Inspection system for optical components

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US5412203A (en) * 1991-07-15 1995-05-02 Fuji Electric Co., Ltd. Cylindrical container inner surface tester
JP3044951B2 (en) * 1992-11-25 2000-05-22 富士電機株式会社 Circular container inner surface inspection device
GR1002574B (en) * 1992-12-21 1997-02-06 Johnson & Johnson Vision Products Inc. Pallet for receiving and transporting opthalmic lens containers.
NZ250042A (en) 1992-12-21 1997-01-29 Johnson & Johnson Vision Prod Robotic inspection of ophthalmic lenses
IL107603A (en) * 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
GR1002789B (en) * 1992-12-21 1997-10-17 Johnson & Johnson Vision Products Inc. An apparatus for carrying ophthalmic lenses.
GR1002072B (en) * 1992-12-21 1995-11-30 Johnson & Johnson Vision Prod Illumination system for opthalmic lens inspection.
IL107513A (en) * 1992-12-21 1997-07-13 Johnson & Johnson Vision Prod Ophthalmic lens inspection system and method
NZ250453A (en) * 1992-12-21 1996-12-20 Johnson & Johnson Vision Prod Ophthalmic lens package; planar surface with concave bowl for containing lens, sealing sheet covering bowl with lens therein
TW325744U (en) * 1993-07-21 1998-01-21 Ciba Geigy Ag Two-sided contact lens mold
JP3734512B2 (en) * 1993-12-27 2006-01-11 株式会社メニコン Contact lens appearance inspection method and appearance inspection apparatus
US5500732A (en) * 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
IL113945A0 (en) * 1994-06-10 1995-08-31 Johnson & Johnson Vision Prod System and method for inspecting lenses
JPH08105937A (en) * 1994-10-06 1996-04-23 Advantest Corp Automatic handler for device tester, and device measuring method thereof
AU698522B2 (en) * 1995-09-29 1998-10-29 Johnson & Johnson Vision Products, Inc. Lens parameter measurement using optical sectioning
US5818573A (en) * 1997-02-06 1998-10-06 Pbh, Inc. Opthalmic lens inspection system
US5801822A (en) * 1997-02-06 1998-09-01 Pbh, Inc. Ophthalmic lens inspection system
US6047082A (en) * 1997-11-14 2000-04-04 Wesley Jessen Corporation Automatic lens inspection system
US6201600B1 (en) * 1997-12-19 2001-03-13 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive objects having a lens portion
DE59915032D1 (en) 1998-08-17 2009-07-16 Novartis Ag TEST MODULE FOR CHECKING OPTICAL PARTS FOR FAULT
US6259518B1 (en) 1999-08-10 2001-07-10 Novartis Ag Wetcell device for inspection
IL126809A (en) * 1998-10-29 2001-08-26 Sarin Technologies Ltd Apparatus and method of examining the shape of gemstones
US6246062B1 (en) 1998-11-05 2001-06-12 Johnson & Johnson Vision Care, Inc. Missing lens detection system and method
CA2288476C (en) 1998-11-05 2010-10-12 Denwood F. Ross, Iii Missing lens detection system and method
DE29901791U1 (en) * 1999-02-02 2000-07-06 Novartis Ag, Basel Lens measuring device
EP1816467A3 (en) * 2000-05-01 2009-11-18 Fujifilm Corporation Lens inspection device
JP4426080B2 (en) * 2000-10-11 2010-03-03 株式会社メニコン Method and apparatus for detecting dirt on ophthalmic lens
US6776044B2 (en) 2000-10-23 2004-08-17 Novartis Ag Ultrasonic device for inspection
EP1203952B1 (en) * 2000-10-23 2012-02-08 Novartis AG Ultrasonic device for inspecting ophthalmic lenses
US6577387B2 (en) 2000-12-29 2003-06-10 Johnson & Johnson Vision Care, Inc. Inspection of ophthalmic lenses using absorption
US6765661B2 (en) 2001-03-09 2004-07-20 Novartis Ag Lens inspection
JP2003042737A (en) * 2001-07-26 2003-02-13 Toray Ind Inc Cut workpiece inspecting method
CN101793595B (en) * 2002-02-21 2012-05-16 庄臣及庄臣视力保护公司 Apparatus for inspecting optical devices
US7837327B2 (en) * 2002-04-12 2010-11-23 Menicon Co., Ltd. Contact lens user support system and support method
CN100465625C (en) * 2005-10-21 2009-03-04 京元电子股份有限公司 Viewing method and system for chip figure
US7416300B2 (en) * 2006-05-25 2008-08-26 Coopervision International Holding Company, Lp Measurement of lenses and lens molds using optical coherence tomography
CN101650258B (en) * 2008-08-14 2012-03-14 鸿富锦精密工业（深圳）有限公司 Lens module detector
SG195400A1 (en) 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses
KR101334168B1 (en) * 2012-09-19 2013-11-29 주식회사 케이피씨 Measuring and testing apparatus for led astral light
GB2560951B (en) 2017-03-29 2020-06-17 Redlux Ltd Inspection of components for imperfections
CN110646169B (en) * 2019-10-28 2022-03-08 沈阳仪表科学研究院有限公司 Method for measuring reflectivity of curved surface optical film element
EP4402450A1 (en) 2021-09-16 2024-07-24 Schneider GmbH & Co. KG Method and apparatus for quality control of ophthalmic lenses
CN114486939B (en) * 2022-04-08 2022-07-22 欧普康视科技股份有限公司 Lens scratch detection system and method
CN116990450B (en) * 2023-07-18 2024-04-26 欧几里德(苏州)医疗科技有限公司 Defect detection method and system for cornea shaping mirror
CN118275443A (en) * 2024-04-02 2024-07-02 平方和(北京)科技有限公司 Contact lens defect detection method and system

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US3988068A (en) * 1974-05-09 1976-10-26 Itek Corporation Method and apparatus for detecting cosmetic defects in opthalmic lenses
DD138110A1 (en) * 1978-07-27 1979-10-10 Horst Riesenberg REQUIRED LIGHTING DEVICE FOR MICROSCOPES
DD145805B1 (en) * 1979-08-27 1982-06-30 Johannes Grosser LIGHTING ARRANGEMENT FOR MICROSCOPES
DE3115634A1 (en) * 1981-04-18 1982-11-04 Feldmühle AG, 4000 Düsseldorf METHOD AND DEVICE FOR TESTING SURFACES LIMITED BY CIRCULAR LINES
DE3475566D1 (en) * 1984-05-14 1989-01-12 Ibm Deutschland Method and device for the inspection of surfaces
US4733360A (en) * 1984-06-14 1988-03-22 Dai Nippon Insatsu Kabushiki Kaisha Device and method for inspecting card-like articles
DE3432002A1 (en) * 1984-08-31 1986-03-06 Fa. Carl Zeiss, 7920 Heidenheim Method and apparatus for the optical examination of contact lenses
GB2171812B (en) * 1984-11-20 1988-08-17 Michael Roy Killpartrick Wet cell inspection of contact lenses
AU580642B2 (en) * 1984-11-29 1989-01-19 Unisearch Limited Lens zonometer
DE3620129A1 (en) * 1986-06-14 1987-12-17 Zeiss Carl Fa DEVICE FOR TESTING TRANSPARENT MATERIAL COMPONENTS FOR SURFACE DEFECTS AND INCLUDES
US4943713A (en) * 1987-11-27 1990-07-24 Hajime Industries Ltd. Bottle bottom inspection apparatus
JPH02257007A (en) * 1989-03-30 1990-10-17 Seiko Epson Corp Instrument for inspecting chipping on outer periphery of contact lens

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU674033B2 (en) * 1992-12-21 1996-12-05 Johnson & Johnson Vision Products, Inc. Lens inspection system
AU674169B2 (en) * 1992-12-21 1996-12-12 Johnson & Johnson Vision Products, Inc. A method of inspecting ophthalmic lenses
AU680444B2 (en) * 1992-12-21 1997-07-31 Johnson & Johnson Vision Products, Inc. Illumination and imaging subsystems for a lens inspection system
US6301005B1 (en) 1993-07-29 2001-10-09 Wesley Jessen Corporation Inspection system for optical components
US6614516B2 (en) 1993-07-29 2003-09-02 Novartis Ag Inspection system for optical components
WO1996030745A1 (en) * 1995-03-30 1996-10-03 Wesley-Jessen Corporation Inspection of optical components
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components

Also Published As

Publication number Publication date
HK1003125A1 (en) 1998-10-09
IE70436B1 (en) 1996-11-27
PT99855A (en) 1994-01-31
DE59107249D1 (en) 1996-02-22
AU649291B2 (en) 1994-05-19
KR100202215B1 (en) 1999-06-15
ES2082178T3 (en) 1996-03-16
JPH04321186A (en) 1992-11-11
GR3018639T3 (en) 1996-04-30
EP0491663B1 (en) 1996-01-10
KR920012892A (en) 1992-07-28
ATE132971T1 (en) 1996-01-15
CA2057832A1 (en) 1992-06-20
IE914411A1 (en) 1992-07-01
DK0491663T3 (en) 1996-02-05
EP0491663A1 (en) 1992-06-24
PT99855B (en) 1999-02-26

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Legal Events

Date Code Title Description
MK14 Patent ceased section 143(a) (annual fees not paid) or expired