AU2001283944A1 - Gas inlet mechanism for cvd-method and device - Google Patents
Gas inlet mechanism for cvd-method and deviceInfo
- Publication number
- AU2001283944A1 AU2001283944A1 AU2001283944A AU8394401A AU2001283944A1 AU 2001283944 A1 AU2001283944 A1 AU 2001283944A1 AU 2001283944 A AU2001283944 A AU 2001283944A AU 8394401 A AU8394401 A AU 8394401A AU 2001283944 A1 AU2001283944 A1 AU 2001283944A1
- Authority
- AU
- Australia
- Prior art keywords
- cvd
- gas inlet
- inlet mechanism
- gas
- inlet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45502—Flow conditions in reaction chamber
- C23C16/45508—Radial flow
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45568—Porous nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45576—Coaxial inlets for each gas
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10061671 | 2000-09-22 | ||
DE10061671 | 2000-09-22 | ||
DE10064941A DE10064941A1 (en) | 2000-09-22 | 2000-12-23 | Gas inlet element |
DE10064941 | 2000-12-23 | ||
PCT/EP2001/008139 WO2002024985A1 (en) | 2000-09-22 | 2001-07-14 | Gas inlet mechanism for cvd-method and device |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001283944A1 true AU2001283944A1 (en) | 2002-04-02 |
Family
ID=26007933
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001283944A Abandoned AU2001283944A1 (en) | 2000-09-22 | 2001-07-14 | Gas inlet mechanism for cvd-method and device |
Country Status (5)
Country | Link |
---|---|
US (1) | US7294207B2 (en) |
EP (1) | EP1322801B1 (en) |
AU (1) | AU2001283944A1 (en) |
TW (1) | TW555900B (en) |
WO (1) | WO2002024985A1 (en) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10043601A1 (en) * | 2000-09-01 | 2002-03-14 | Aixtron Ag | Device and method for depositing, in particular, crystalline layers on, in particular, crystalline substrates |
AU2001283944A1 (en) * | 2000-09-22 | 2002-04-02 | Aixtron Ag | Gas inlet mechanism for cvd-method and device |
DE102004009130A1 (en) * | 2004-02-25 | 2005-09-15 | Aixtron Ag | Inlet system for a MOCVD reactor |
US7510624B2 (en) * | 2004-12-17 | 2009-03-31 | Applied Materials, Inc. | Self-cooling gas delivery apparatus under high vacuum for high density plasma applications |
US7722719B2 (en) * | 2005-03-07 | 2010-05-25 | Applied Materials, Inc. | Gas baffle and distributor for semiconductor processing chamber |
DE102005011384A1 (en) * | 2005-03-11 | 2006-09-14 | Centrotherm Elektrische Anlagen Gmbh & Co. Kg | Gas-tight connection element with bayonet lock |
DE102005045582B3 (en) * | 2005-09-23 | 2007-03-29 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Apparatus and method for continuous vapor deposition under atmospheric pressure and their use |
DE102005056320A1 (en) | 2005-11-25 | 2007-06-06 | Aixtron Ag | CVD reactor with a gas inlet member |
US20070234956A1 (en) * | 2006-04-05 | 2007-10-11 | Dalton Jeremie J | Method and apparatus for providing uniform gas delivery to a reactor |
US7740706B2 (en) * | 2006-11-28 | 2010-06-22 | Applied Materials, Inc. | Gas baffle and distributor for semiconductor processing chamber |
US20080121177A1 (en) * | 2006-11-28 | 2008-05-29 | Applied Materials, Inc. | Dual top gas feed through distributor for high density plasma chamber |
US20080124944A1 (en) * | 2006-11-28 | 2008-05-29 | Applied Materials, Inc. | Gas baffle and distributor for semiconductor processing chamber |
US7758698B2 (en) * | 2006-11-28 | 2010-07-20 | Applied Materials, Inc. | Dual top gas feed through distributor for high density plasma chamber |
JP2011500961A (en) * | 2007-10-11 | 2011-01-06 | バレンス プロセス イクウィップメント,インコーポレイテッド | Chemical vapor deposition reactor |
US8153536B2 (en) * | 2007-11-20 | 2012-04-10 | Soitec | Transfer of high temperature wafers |
JP5409413B2 (en) * | 2010-01-26 | 2014-02-05 | 日本パイオニクス株式会社 | III-nitride semiconductor vapor phase growth system |
CN103329249B (en) * | 2010-12-20 | 2016-08-10 | 三星电子株式会社 | Chemical vapor depsotition equipment and the method using this device fabrication luminescent device |
TWI473903B (en) | 2013-02-23 | 2015-02-21 | Hermes Epitek Corp | Gas Injector and Cover Plate Assembly for Semiconductor Equipment |
FR3010092B1 (en) | 2013-09-02 | 2017-05-26 | Commissariat Energie Atomique | METHOD AND DEVICE FOR TREATING THE FREE SURFACE OF A MATERIAL |
US10407771B2 (en) * | 2014-10-06 | 2019-09-10 | Applied Materials, Inc. | Atomic layer deposition chamber with thermal lid |
US10403515B2 (en) * | 2015-09-24 | 2019-09-03 | Applied Materials, Inc. | Loadlock integrated bevel etcher system |
CN114164412B (en) * | 2020-09-10 | 2024-03-08 | 鑫天虹(厦门)科技有限公司 | Spray head structure of semiconductor atomic layer deposition device |
CN112342529B (en) * | 2020-09-24 | 2022-12-06 | 杭州盾源聚芯半导体科技有限公司 | Injection pipe with connector |
CN114105679B (en) * | 2021-11-25 | 2023-05-16 | 西安鑫垚陶瓷复合材料有限公司 | Chemical vapor infiltration diversion equipment and method for preparing ceramic composite pipe fitting by using same |
WO2024158639A1 (en) * | 2023-01-26 | 2024-08-02 | Applied Materials, Inc. | Cell architectural structures for enhanced thermal management in epitaxial growth processing chamber |
CN116791065B (en) * | 2023-07-03 | 2024-06-14 | 拓荆科技(上海)有限公司 | Diffusion member and semiconductor process equipment |
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GB1056430A (en) * | 1962-11-13 | 1967-01-25 | Texas Instruments Inc | Epitaxial process and apparatus for semiconductors |
GB1282866A (en) * | 1968-08-16 | 1972-07-26 | Pilkington Brothers Ltd | Improvements in or relating to the production of glass having desired surface characteristics |
US3757733A (en) * | 1971-10-27 | 1973-09-11 | Texas Instruments Inc | Radial flow reactor |
USRE30244E (en) * | 1976-01-22 | 1980-04-01 | Bell Telephone Laboratories, Incorporated | Radial flow reactor including glow discharge limitting shield |
US4033287A (en) * | 1976-01-22 | 1977-07-05 | Bell Telephone Laboratories, Incorporated | Radial flow reactor including glow discharge limiting shield |
US4207137A (en) * | 1979-04-13 | 1980-06-10 | Bell Telephone Laboratories, Incorporated | Method of controlling a plasma etching process by monitoring the impedance changes of the RF power |
JPS6055478B2 (en) * | 1982-10-19 | 1985-12-05 | 松下電器産業株式会社 | Vapor phase growth method |
US4590042A (en) * | 1984-12-24 | 1986-05-20 | Tegal Corporation | Plasma reactor having slotted manifold |
US4793975A (en) * | 1985-05-20 | 1988-12-27 | Tegal Corporation | Plasma Reactor with removable insert |
US4612077A (en) * | 1985-07-29 | 1986-09-16 | The Perkin-Elmer Corporation | Electrode for plasma etching system |
US4778559A (en) * | 1986-10-15 | 1988-10-18 | Advantage Production Technology | Semiconductor substrate heater and reactor process and apparatus |
FR2628984B1 (en) * | 1988-03-22 | 1990-12-28 | Labo Electronique Physique | PLANETARY EPITAXY REACTOR |
FR2628985B1 (en) * | 1988-03-22 | 1990-12-28 | Labo Electronique Physique | EPITAXY REACTOR WITH WALL PROTECTION |
US4993358A (en) * | 1989-07-28 | 1991-02-19 | Watkins-Johnson Company | Chemical vapor deposition reactor and method of operation |
DE4011933C2 (en) * | 1990-04-12 | 1996-11-21 | Balzers Hochvakuum | Process for the reactive surface treatment of a workpiece and treatment chamber therefor |
US5212116A (en) * | 1990-06-18 | 1993-05-18 | At&T Bell Laboratories | Method for forming planarized films by preferential etching of the center of a wafer |
US5275976A (en) * | 1990-12-27 | 1994-01-04 | Texas Instruments Incorporated | Process chamber purge module for semiconductor processing equipment |
US6039812A (en) * | 1996-10-21 | 2000-03-21 | Abb Research Ltd. | Device for epitaxially growing objects and method for such a growth |
US5954881A (en) * | 1997-01-28 | 1999-09-21 | Northrop Grumman Corporation | Ceiling arrangement for an epitaxial growth reactor |
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WO1998045501A1 (en) * | 1997-04-10 | 1998-10-15 | Koninklijke Philips Electronics N.V. | Method of manufacturing a semiconductor device and a device for applying such a method |
US6537418B1 (en) * | 1997-09-19 | 2003-03-25 | Siemens Aktiengesellschaft | Spatially uniform gas supply and pump configuration for large wafer diameters |
US6056824A (en) * | 1998-01-16 | 2000-05-02 | Silicon Valley Group Thermal Systems | Free floating shield and semiconductor processing system |
US5849088A (en) * | 1998-01-16 | 1998-12-15 | Watkins-Johnson Company | Free floating shield |
US6352592B1 (en) * | 1998-01-16 | 2002-03-05 | Silicon Valley Group, Thermal Systems Llc | Free floating shield and semiconductor processing system |
US6015595A (en) * | 1998-05-28 | 2000-01-18 | Felts; John T. | Multiple source deposition plasma apparatus |
US6246030B1 (en) * | 1998-07-22 | 2001-06-12 | Tokyo Electron Limited | Heat processing method and apparatus |
DE19841777C1 (en) * | 1998-09-12 | 2000-01-05 | Fraunhofer Ges Forschung | Apparatus for plasma-technological precipitation of polycrystalline diamond on substrates with large plane areas |
TW455912B (en) * | 1999-01-22 | 2001-09-21 | Sony Corp | Method and apparatus for film deposition |
KR100328820B1 (en) * | 1999-02-25 | 2002-03-14 | 박종섭 | Gas injection apparatus of chemical vapor deposition device |
US6592771B1 (en) * | 1999-04-08 | 2003-07-15 | Sony Corporation | Vapor-phase processing method and apparatus therefor |
WO2000071778A1 (en) * | 1999-05-21 | 2000-11-30 | Silicon Valley Group, Thermal Systems Llc | Protective gas shield apparatus |
AU2001242363A1 (en) * | 2000-02-04 | 2001-08-14 | Aixtron Ag | Device and method for depositing one or more layers onto a substrate |
US6325855B1 (en) * | 2000-08-09 | 2001-12-04 | Itt Manufacturing Enterprises, Inc. | Gas collector for epitaxial reactors |
DE10043601A1 (en) * | 2000-09-01 | 2002-03-14 | Aixtron Ag | Device and method for depositing, in particular, crystalline layers on, in particular, crystalline substrates |
AU2001283944A1 (en) * | 2000-09-22 | 2002-04-02 | Aixtron Ag | Gas inlet mechanism for cvd-method and device |
DE10064944A1 (en) * | 2000-09-22 | 2002-04-11 | Aixtron Ag | Process for depositing crystalline layers in particular, gas inlet element and device for carrying out the process |
JP3864696B2 (en) * | 2000-11-10 | 2007-01-10 | 株式会社デンソー | Method and apparatus for producing silicon carbide single crystal |
JP3959952B2 (en) * | 2000-11-10 | 2007-08-15 | 株式会社デンソー | Method and apparatus for producing silicon carbide single crystal |
DE10133914A1 (en) * | 2001-07-12 | 2003-01-23 | Aixtron Ag | Apparatus to deposit crystalline layers on semiconductor wafers comprises rotating wafer holders mounted on rotating mounting forming floor of process chamber whose roof contains central gas inlet |
US6890386B2 (en) * | 2001-07-13 | 2005-05-10 | Aviza Technology, Inc. | Modular injector and exhaust assembly |
JP2003100717A (en) * | 2001-09-21 | 2003-04-04 | Tokyo Electron Ltd | Plasma treatment apparatus |
DE10153463A1 (en) * | 2001-10-30 | 2003-05-15 | Aixtron Ag | Method and device for depositing, in particular, crystalline layers on, in particular, crystalline substrates |
DE10247921A1 (en) * | 2002-10-10 | 2004-04-22 | Aixtron Ag | Hydride vapor phase epitaxy reactor, to produce pseudo-substrates for electronic components, deposits layers of crystalline substrates from a gas phase with increased growth rates |
JP3866655B2 (en) * | 2002-12-26 | 2007-01-10 | 励起 渡辺 | Processing apparatus and processing method |
-
2001
- 2001-07-14 AU AU2001283944A patent/AU2001283944A1/en not_active Abandoned
- 2001-07-14 WO PCT/EP2001/008139 patent/WO2002024985A1/en active Application Filing
- 2001-07-14 EP EP01962856A patent/EP1322801B1/en not_active Expired - Lifetime
- 2001-09-10 TW TW090122330A patent/TW555900B/en not_active IP Right Cessation
-
2003
- 2003-03-24 US US10/395,948 patent/US7294207B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
WO2002024985A1 (en) | 2002-03-28 |
EP1322801B1 (en) | 2010-01-06 |
TW555900B (en) | 2003-10-01 |
US7294207B2 (en) | 2007-11-13 |
US20030177977A1 (en) | 2003-09-25 |
EP1322801A1 (en) | 2003-07-02 |
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