#

yeild-opimization

Here are 2 public repositories matching this topic...

Wafers-Defect-Recognition-using-Visual-Transformer

PanithanS / Wafers-Defect-Recognition-using-Visual-Transformer

We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.

machine-learning computer-vision data-analysis pattern-recognition lithography multilabel-classification semiconductor-manufacturing wafermap defect-detection visual-transformer defect-classification yeild wafer-defects yeild-opimization mixed-type-data-classification mixedwm38

Updated Oct 1, 2023
Jupyter Notebook

Defect-Prediction-in-Semiconductor-Lithography

PanithanS / Defect-Prediction-in-Semiconductor-Lithography

Lithography defect prediction for microchip manufacturing optimization with machine learning model

machine-learning data-analysis lithography semiconductor-manufacturing defect-detection yeild yeild-opimization

Updated Dec 2, 2023
Jupyter Notebook

Improve this page

Add a description, image, and links to the yeild-opimization topic page so that developers can more easily learn about it.

Curate this topic

Add this topic to your repo

To associate your repository with the yeild-opimization topic, visit your repo's landing page and select "manage topics."