Fantz et al., 2021 - Google Patents

Negative hydrogen ion sources for fusion: From plasma generation to beam properties

Fantz et al., 2021

View HTML
Document ID
465995451688354277
Author
Fantz U
Briefi S
Heiler A
Wimmer C
Wünderlich D
Publication year
Publication venue
Frontiers in Physics

External Links

Snippet

The neutral beam injection systems for the international fusion experiment ITER used for heating, current drive, and diagnostic purposes are based on RF-driven negative hydrogen ion sources with a source area of roughly 0.9 m× 1.9 m. The sources operate at 0.3 Pa in …
Continue reading at www.frontiersin.org (HTML) (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/08—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06—Sources
    • H01J2237/08—Ion sources
    • H01J2237/0802—Field ionization sources
    • H01J2237/0807—Gas field ion sources [GFIS]
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • H01J37/243—Beam current control or regulation circuits
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/153—Correcting image defects, e.g. stigmators
    • H01J2237/1538—Space charge (Boersch) effect compensation
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H01J2237/2813—Scanning microscopes characterised by the application
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Similar Documents

Publication Publication Date Title
Fantz et al. Negative hydrogen ion sources for fusion: From plasma generation to beam properties
Fantz et al. Development of negative hydrogen ion sources for fusion: Experiments and modelling
Beyer et al. X-ray radiation of highly charged ions
Fantz et al. Towards powerful negative ion beams at the test facility ELISE for the ITER and DEMO NBI systems
Fantz et al. Achievement of the ITER NBI ion source parameters for hydrogen at the test facility ELISE and present Status for deuterium
Zgadzaj et al. Dissipation of electron-beam-driven plasma wakes
Tsumori et al. A review of diagnostic techniques for high-intensity negative ion sources
Crombé et al. Studies of RF sheaths and diagnostics on IShTAR
Hurlbatt et al. The particle tracking code BBCNI for large negative ion beams and their diagnostics
Roth et al. Proton acceleration experiments and warm dense matter research using high power lasers
Wang et al. Construction and commissioning of the collinear laser spectroscopy system at BRIF
Shao Investigations on rf breakdown phenomenon in high gradient accelerating structures
Ugoletti et al. SPIDER beam homogeneity characterization through visible cameras
Bartnik et al. Ultimate bunch length and emittance performance of an MeV ultrafast electron diffraction apparatus with a dc gun and a multicavity superconducting rf linac
Boháček et al. Stable electron beams from laser wakefield acceleration with few-terawatt driver using a supersonic air jet
Thoma et al. Investigation, simulation and first measurements of a 2 m long electron column trapped in a Gabor-Lens device
Froese The TITAN electron beam ion trap: Assembly, characterization, and first tests
Geldhof Developments for high-resolution laser spectroscopy and application to palladium isotopes
Debernardi UltraCold ion beam source
Henestroza et al. Final focus system for high intensity beams
Mario Correlation between plasma and beam properties at the ELISE test facility
Hahn et al. Cesium Rydberg-state ionization study by three-dimensional ion-electron correlation: Toward a monochromatic electron source
Taban A cold atom electron source
Agnello et al. Study of Negative Ion Beamlets Produced in SPIDER by Beam Emission Spectroscopy
Roussel Single-Shot Characterization of High Transformer Ratio Wakefields in Nonlinear Plasma