US3854125A - Automated diagnostic testing system - Google Patents

Automated diagnostic testing system Download PDF

Info

Publication number
US3854125A
US3854125A US00153902A US15390271A US3854125A US 3854125 A US3854125 A US 3854125A US 00153902 A US00153902 A US 00153902A US 15390271 A US15390271 A US 15390271A US 3854125 A US3854125 A US 3854125A
Authority
US
United States
Prior art keywords
bus
terminal
terminals
switch
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US00153902A
Inventor
E Ehling
P Jackson
J Mccarthy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INSTRUMENTATION ENG INC US
Giordano Associates Inc
Original Assignee
INSTRUMENTATION ENGINEERING
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INSTRUMENTATION ENGINEERING filed Critical INSTRUMENTATION ENGINEERING
Priority to US00153902A priority Critical patent/US3854125A/en
Priority to BE784845A priority patent/BE784845A/en
Priority to CA144,702A priority patent/CA956699A/en
Priority to DE19722228881 priority patent/DE2228881A1/en
Priority to CH883272A priority patent/CH594893A5/xx
Priority to FR7221462A priority patent/FR2142451A5/fr
Priority to IT25699/72A priority patent/IT956586B/en
Priority to GB4922074A priority patent/GB1401193A/en
Priority to NL7208179A priority patent/NL7208179A/xx
Priority to GB4922174A priority patent/GB1401194A/en
Priority to GB2796772A priority patent/GB1401192A/en
Priority to ES403913A priority patent/ES403913A1/en
Priority to JP6032672A priority patent/JPS5318132B1/ja
Application granted granted Critical
Publication of US3854125A publication Critical patent/US3854125A/en
Assigned to GIORDANO ASSOCIATES, INC., A CORP OF NJ reassignment GIORDANO ASSOCIATES, INC., A CORP OF NJ NUNC PRO TUNC ASSIGNMENT (SEE DOCUMENT FOR DETAILS). Assignors: INSTRUMENTATION ENGINEERING INC., A CORP OF DE
Assigned to MIDLANTIC NATIONAL BANK, P.O. BOX, METROPARK PLAZA, EDISON, NEW JERSEY08818 reassignment MIDLANTIC NATIONAL BANK, P.O. BOX, METROPARK PLAZA, EDISON, NEW JERSEY08818 SECURITY INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: GIORDANO ASSOCIATES, INC., A NJ CORP.
Assigned to MIDLANTIC NATIONAL BANK reassignment MIDLANTIC NATIONAL BANK SECURITY INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: GIORDANO ASSOCIATES, INC.
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Definitions

  • ABSTRACT An automated diagnostic testing system under control of a computer having on line compiling capability for entering and modifying testing programs involving the inter-connection of the unit under test with one or more peripheral devices.
  • An important aspect of the invention is the system for routing electrical signals between a selected pair of a plurality of terminals, via one or more conductive buses, including switch means associated with each terminal and controllably operative to connect that terminal to any one of the buses.
  • Switch control means responsive to programmed commands determines from a stored indication the availability of one of the buses, assigns the bus determined to be available to one of the selected terminals, assigns the other selected terminal to that bus. stores an indication of the bus and terminal so assigned and operates the switch means associated with the selected terminals to connect them to the assigned bus.
  • the switch means comprises a controllable individual switch between each bus and a particular terminal, and at least one separately controllable switch for opening and closing the series circuit between the terminal and any bus. This separately controllable switch is operated prior to operating the individual switches between the terminal and each of the buses.
  • PAIENIE DEC 1 01974 sum -"13 0F 19 OPEN MERCu y I86 RELAY FOR ANY E PINS f0 5 /36 OPEN NETWORK RELAY /7 N0 E1 DOA/N66 r 0 L46 F R ALL Pnvs r0 as //9 Cvlwvfcrso 7'0 ii 5 4 /93 li'flcollA/scr FLAGS FORALL PINS m as flMYfCfZ-p r0 A /6min 4014 4540 54/5 f REM m 2/4 KEL V/IV INDICATORS
  • FIGIS fiir CLOS WORKRELA v5 I98 a 05E MERCURY NE rwomr RELA vs RELAYS Z00 is RELA 1 CONNECT //99 2/0 rum /5 szr 204 262 l5 ,3 ANY g? DELAY Y 1 Y5 Dev/

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Programmable Controllers (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

An automated diagnostic testing system under control of a computer having on-line compiling capability for entering and modifying testing programs involving the inter-connection of the unit under test with one or more peripheral devices. An important aspect of the invention is the system for routing electrical signals between a selected pair of a plurality of terminals, via one or more conductive buses, including switch means associated with each terminal and controllably operative to connect that terminal to any one of the buses. Switch control means responsive to programmed commands determines from a stored indication the availability of one of the buses, assigns the bus determined to be available to one of the selected terminals, assigns the other selected terminal to that bus, stores an indication of the bus and terminal so assigned and operates the switch means associated with the selected terminals to connect them to the assigned bus. The switch means comprises a controllable individual switch between each bus and a particular terminal, and at least one separately controllable switch for opening and closing the series circuit between the terminal and any bus. This separately controllable switch is operated prior to operating the individual switches between the terminal and each of the buses.

Description

United States Patent 1 Ehling et al.
1 Dec. 10, 1974 1 AUTOMATED DIAGNOSTIC TESTING SYSTEM [75] inventors: Ernest H. Ehling, Hackensack;
Philip C. Jackson, Oakland; James V. McCarthy, Riverdale, all of NJ.
[73] Assignee: Instrumentation Engineering, Inc.,
Franklin Lakes. NJ.
22 Filed: June 15, 1971 21 Appl. No.: 153,902
[52] 1.1.8. Cl. 340/1725 [51] ..G06111/00 [581 Field Of Search 340/1725; 235/157; 324/73 AT [56] References Cited UNITED STATES PATENTS 3.211428 10/1965 Blanchi et a1 340/1725 3,247,498 4/1966 Sadvary et a1. 340/1725 3,585,599 6/1971 Hitt et a1 340/1725 3,597,632 8/1971 Huhbs ct 211. 324/73 AT 3,623.011 11/1971 Baynard et 111.... 340/1725 3.6291556 12/1971 Arai et a1 340/1725 3.638J93 1/1972 Opl'erman 3411/1725 3,646,519 2/1972 Wollum et a1....... 340/1725 3,665,413 5/1972 Bouricius et a1 3411/1725 3,681.758 8/1972 ()ster et a1. 3411/1725 Primary Examiner-Gareth D. Shaw Assistant E.mminerMurk Edward Nusbaum Attorney, Agent, or FirmMorgan. Finnegan, Durham & Pike [57] ABSTRACT An automated diagnostic testing system under control of a computer having on line compiling capability for entering and modifying testing programs involving the inter-connection of the unit under test with one or more peripheral devices.
An important aspect of the invention is the system for routing electrical signals between a selected pair of a plurality of terminals, via one or more conductive buses, including switch means associated with each terminal and controllably operative to connect that terminal to any one of the buses. Switch control means responsive to programmed commands determines from a stored indication the availability of one of the buses, assigns the bus determined to be available to one of the selected terminals, assigns the other selected terminal to that bus. stores an indication of the bus and terminal so assigned and operates the switch means associated with the selected terminals to connect them to the assigned bus. The switch means comprises a controllable individual switch between each bus and a particular terminal, and at least one separately controllable switch for opening and closing the series circuit between the terminal and any bus. This separately controllable switch is operated prior to operating the individual switches between the terminal and each of the buses.
22 Claims, 24 Drawing Figures PATENIEU EEC I 01974 SHEET INPUTS FROM DEVICE CONTROLLER OPERATOR TE RMINAL MEASUREMENT DEVICES C M PUTER FIG.
ROUTING SYSTEM m T 5 E TT 7 R I N um N /M u STIMULUS [6/ DEVICES FIG.4
26 DEVICE LaAo TERMINALS TO 50 TEST POINT TERMINALS TO UUT PERIPHERAL DEVICES PATENTE 1C1 DISH saw on or 1 PMENTEL, LIE I DISH SHEET 0a or 1 PATENIEL DEC! [H974 OPE'IV MERCURY RELAYS RESE T D VICE PROGRAM DE VICE SHEET START DEVICE CONNECT uswce more) STAR T DE VICE STOP DEVICE CLOSE MERCUR Y RELA Y5 R AD FIGIO DE TERMINE DEVICE 0E TERM/NE DEV/CE OPEN HIGH-LEAD MERCURY RELAY r? DEV/CE CLOSE HIGH-LEAD MERCURY RELAY F01? DE was DELAY n 1100/ M/LL/SECO/VDS (NEXT FUA/C 7'l0/V FIGII PATENTEL 351 I (974 3. 854.12 5
SHEET 10 0F 19 DETERMINE DE V/C E 55 T INTERNAL KEI. V/N IN DICA TOR IF SENSE 0/? K E L VIN MODE RE QUIPE D 14568115 ASS/6N BUS A55/6N DE- VICE LOW LEAD 70 A5- .5/GNED HI- LEAD BUS I 5H0! YES THERE BE A LOI'VPLEAD LEAD FIGIZ PATENTEL 3531mm 3.854.125
sum 11 HF 19 3 YES PA 55 IVE W 5 MEASURE- ERRO MENT ARE YES 7 MEASURE- PMENTEL I 3.854.125
SHEET 12 [1F 19 ASGBUB I mace N0 ME ASUFEMENI' 77;:
1551'" FLAGS T0 DISCONNECT PINS CURRENTLY A5 5/GNED T0 7'' HIS BUS KEL VIN M0205 2957" FLAGS T0 DISCONNECT ANY mvscrso r0 FIG. l4
PAIENIE DEC 1 01974 sum -"13 0F 19 OPEN MERCu y I86 RELAY FOR ANY E PINS f0 5 /36 OPEN NETWORK RELAY /7 N0 E1 DOA/N66 r 0 L46 F R ALL Pnvs r0 as //9 Cvlwvfcrso 7'0 ii 5 4 /93 li'flcollA/scr FLAGS FORALL PINS m as flMYfCfZ-p r0 A /6min 4014 4540 54/5 f REM m 2/4 KEL V/IV INDICATORS FIGIS fiir CLOS WORKRELA v5 I98 a 05E MERCURY NE rwomr RELA vs RELAYS Z00 is RELA 1 CONNECT //99 2/0 rum /5 szr 204 262 l5 ,3 ANY g? DELAY Y 1 Y5 Dev/(nuns #0 R Y5 Y5: M/tt/SECUNOS uwm 6550 21 5g 5 ,9 cm 0 PM #544 v:
"{ 0 g M 55m:
. N0 No (I USE Yas mm 20/ 209 CLOSE 2 MERCURY 203 I I PEI-4Y5 CLOSE 27/ n05: NET- czass. Wmr RELAJG' APPRflPR/AI'E 525 2,2
HIGH 4540 (1.055 RfLAY CUR) RELAX? cwsa 2/3 [.5 LOW LEAD YES APPROPRIATE 206 LOW LEAD RELAY 205 N0 FIG. I6
PATENILL, SEC I DISH SHEU SET MODE TO OPEN M69122) r 2,6 REL 5 2/9 557 K51. w/v INDICATOR 3. 8
HIGH 45.40 canwscrio 22/ 224 OPEN APPRDFW/A 7: REM F01? aswcs H h LEAD WEN APMWR/ATE RELAY F0}? DEV/CE 40w LEAD FIG.I7
1SBF19 I5 DISCOIWVFCI' 05 ms YES Au PIA 5 /Z30 Dewaon cmwvfc'rm 5 r9 rm: Bus
army Fm lit-LAY 5E TTLl/VG OPEN NEI'WMIY Ram 5 5,57 MODE r0 OPE/V NETWORK FIGIS PATENTED IEC] 01974 SHEET 15 [1F 19 5 Er DISCONNICT n. A65 FOR P/MS OPEN MEI? CUR y 247/ RELAYS DELA Y FOR REL A Y 245 JETTLING ops/v 1v: rwomr REL 4Y5 DELA Y (lvixr FUNCTION) fi EXr FUNCTION)

Claims (22)

1. In a system for automatically testing units having electrical circuits by exciting the unit under test with a stimulus device and obtaining an indication of the unit''s response thereto by at least one measurement device and wherein the unit has a plurality of terminals, the improvement comprisIng means for connecting selected unit terminals to at least one device terminal, including: input means for generating programmable command signals; a plurality of buses over which signals to and from unit terminals may be transmitted; a memory for storing electrical indications of existing terminal connections made via said buses; switch means associated with the unit terminals and controllably operable to individually connect unit terminals to each of the plurality of buses; switch means associated with the device terminals and controllably operable to connect at least said one device terminal to at least one bus; control means responsive to said command signals including means for interrogating the memory storing said indications of existing connections of terminals to the buses to locate a bus to which no predetermined terminal connection is made and which thereby is available for connection to the terminals to be interconnected; means responsive to said interrogation for storing in the memory an indication that a terminal connection is to be made to said bus determined from said interrogation to be available, and means for generating switch control signals; and means for coupling the control means to the respective switch means so as to operate the switch means associated with the available bus in response to the switch control signals.
2. The system of claim 1, wherein the control means further includes: means for interrogating the memory for the existence of any connection, other than a predetermined connection, between the available bus and terminals other than those terminals desired to be interconnected; and means for generating signals to operate the switch means associated with such other terminals to cause their disconnection from said bus prior to operation of the switch means to make the connection with the desired terminals.
3. The system of claim 1, wherein the control means further includes: means for interrogating the memory for the existence of any connections between the desired terminals and any bus other than the available bus; and means for generating signals to operate the switch means associated with such connected desired terminals to cause their disconnection from the other bus prior to operation of the switch means for connecting the desired terminals to the available bus.
4. The system of claim 1, wherein; the input means selectively generates command signals for storing in the memory a designation representing a particular bus for use in an interconnection; and the control means further includes means for interrogating the memory for stored indications of any connection of the predesignated bus to a terminal other than a terminal to be interconnected, or (b) a desired terminal to a different bus, and means responsive to detection of such a stored indication to preclude the generation of switch-control signals for the attempted interconnection if either such connection exists.
5. The automatic testing system of claim 1, wherein the control means further includes: means for generating separate indications for different types of device terminals for storage in the memory; and means for detecting from such stored indications whether a device terminal to be connected to a unit terminal is a stimulus type or measurement type device, the interrogating means being responsive to detection of such stored indications so as to interrogate the memory for possible indications of connections associated with one group of buses in determining the availability of a bus for connection to a stimulus type device terminal, and so as to interrogate the memory for possible indications of connections to another group of buses in determining the availability of a bus for connection to a measurement type device terminal.
6. The automatic testing system of claim 5, wherein the interrogating means: interrogates the memory containing possible indIcations of connections to the remaining group of buses in determining the availability of a bus if all buses of the first bus group are unavailable.
7. The automatic testing system of claim 5, wherein the interrogating means: interrogates the memory so as to determine the availability of buses of the respective groups in a preselected order of preference.
8. The automatic testing system of claim 7 wherein the interrogating means: interrogates the memory so as to select a bus from the remaining group of buses if all buses of the first group to be used are unavailable, such selection occurring in a preselected order of preference that is the inverse of the preselected order of preference for that group when it contains the selected bus.
9. The automatic testing system of claim 1, wherein the switch means for each terminal comprises: a common node; a first controllable switch device connected between the terminal and the node; and a separately controllable second switch device connected between the common node and each bus.
10. The automatic testing system of claim 9, wherein: the generating means is operative to generate switch control signals during a disconnection so as to first operate the first switch device and then operate the second switch device.
11. The signal routing system of claim 9, wherein: the generating means is operative to generate switch control signals during a connection so as to first operate the second switch device for the available bus and then operate the first switch device for that terminal.
12. The automatic testing system of claim 1, wherein: the system further comprises means for generating programmable commands to disconnect selected terminals; and the interrogating means includes means operable in response to a disconnection command to interrogate the memory for stored indications of any connection to an available bus of a terminal other than a terminal desired to be disconnected; and the generating means includes means for generating signals operative to disconnect the switch means associated with each such other terminal from said available bus upon disconnection of the interconnected terminal therefrom.
13. The automatic testing system of claim 1, wherein the: the interrogating means is responsive to indications in the memory representing a predetermined number of terminal connections to at least one bus and provides an indication thereof effective to preclude further connections thereto.
14. The automatic testing system of claim 1, wherein: the input means selectably generates disconnection commands; and the interrogating means in response to disconnection commands interrogates the memory for indications representing connections between the terminals of first and second preselected groups of terminals, and the generating means generates switch control signals so as to disconnect any terminal of the second group connected to a bus upon disconnection of a terminal of the first group from the same bus.
15. The automatic testing system of claim 1, wherein: at least one device may be connected to a unit terminal by more than one circuit path in response to a command by the input means; the memory contains stored indications identifying such device; the control means further includes means responsive to a device connection command for interrogating the memory for the existence of said identifying indication; and means jointly responsive to detection of said identifying indications and to said connection command for precluding the generation of switch control signals by the generating means if the connection command does not include instructions to connect said device by more than one circuit path.
16. The automatic testing system of claim 1, wherein: the input means selectively generates command signals for storing in the memory a designation representing a particular bus for use in an interconnection; aNd the interrogating means interrogates the memory to provide an indication if the particular bus was not previously designated and the terminal to be connected in response to the existing command is connected to a different bus.
17. The automatic testing system of claim 1, wherein the control means includes: means for determining whether an existing command includes an instruction to connect a device terminal to a unit terminal via a particular bus; and means responsive to said determining means for interrogating the memory for the presence of any existing connections of the terminals of the device to that particular bus and for providing an indication if such existing connections equal a predetermined number.
18. The automatic testing system of claim 1, wherein: the generating means in response to a command signal generates plural signals for operating the switch means associated with the device terminal to connect respective plural devices to the available bus.
19. The automatic testing system of claim 18, wherein: at least one of said plural devices is a stimulus device and another of said plural devices is a measurement device.
20. The automatic testing system of claim 18, wherein: said plural devices are measurement devices.
21. The automatic testing system of claim 1, wherein: the generating means in response to a command signal generates plural signals for operating the switch means associated with respective unit terminals so as to connect plural unit terminals to the available bus.
22. The automatic testing system of claim 1, comprising: a source code memory accessible by said input means for storing source code signals representing a programmable command for interconnecting the selected terminals; memory means associated with said control for storing a set of executable code signals representing at least one predesignated routine which includes the interrogation and indication storing functions of the control means; and means for converting the stored source code signals into a hybrid signal code, and for storing said hybrid signal code in one of said memory means for execution when interconnecting the selected terminals; said hybrid signal code comprising (1) a call to said executable code signals representing the predesignated routine and (2) relevant source code signal information of the selected terminals to be interconnected, said switch control generating means being jointly responsive to the stored executable signal code and to said stored record of existing connections during execution of the programmed command for generating switch control signals addressed to operate the switch means associated with said available bus.
US00153902A 1971-06-15 1971-06-15 Automated diagnostic testing system Expired - Lifetime US3854125A (en)

Priority Applications (13)

Application Number Priority Date Filing Date Title
US00153902A US3854125A (en) 1971-06-15 1971-06-15 Automated diagnostic testing system
CA144,702A CA956699A (en) 1971-06-15 1972-06-14 Automated diagnostic testing system
DE19722228881 DE2228881A1 (en) 1971-06-15 1972-06-14 Automatic diagnostic examiner
CH883272A CH594893A5 (en) 1971-06-15 1972-06-14
FR7221462A FR2142451A5 (en) 1971-06-15 1972-06-14
BE784845A BE784845A (en) 1971-06-15 1972-06-14 AUTOMATIC TEST AND DIAGNOSIS DEVICE
GB4922174A GB1401194A (en) 1971-06-15 1972-06-15 Automatic testing systems
NL7208179A NL7208179A (en) 1971-06-15 1972-06-15
IT25699/72A IT956586B (en) 1971-06-15 1972-06-15 AUTOMATED DIAGNOSTIC ANALYSIS SYSTEM
GB2796772A GB1401192A (en) 1971-06-15 1972-06-15 Automatic testing systems
ES403913A ES403913A1 (en) 1971-06-15 1972-06-15 Automated diagnostic testing system
JP6032672A JPS5318132B1 (en) 1971-06-15 1972-06-15
GB4922074A GB1401193A (en) 1971-06-15 1972-06-15 Automatic testing systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00153902A US3854125A (en) 1971-06-15 1971-06-15 Automated diagnostic testing system

Publications (1)

Publication Number Publication Date
US3854125A true US3854125A (en) 1974-12-10

Family

ID=22549202

Family Applications (1)

Application Number Title Priority Date Filing Date
US00153902A Expired - Lifetime US3854125A (en) 1971-06-15 1971-06-15 Automated diagnostic testing system

Country Status (11)

Country Link
US (1) US3854125A (en)
JP (1) JPS5318132B1 (en)
BE (1) BE784845A (en)
CA (1) CA956699A (en)
CH (1) CH594893A5 (en)
DE (1) DE2228881A1 (en)
ES (1) ES403913A1 (en)
FR (1) FR2142451A5 (en)
GB (3) GB1401194A (en)
IT (1) IT956586B (en)
NL (1) NL7208179A (en)

Cited By (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3988718A (en) * 1973-12-20 1976-10-26 Compagnie Industrielle Des Telecommunications Cit-Alcatel Logic control system
US4041473A (en) * 1974-05-16 1977-08-09 Honeywell Information Systems Italia Computer input/output control apparatus
US4057847A (en) * 1976-06-14 1977-11-08 Sperry Rand Corporation Remote controlled test interface unit
US4207611A (en) * 1978-12-18 1980-06-10 Ford Motor Company Apparatus and method for calibrated testing of a vehicle electrical system
US4207610A (en) * 1978-12-18 1980-06-10 Ford Motor Company Apparatus and method for testing and controlling manufacture of a vehicle electrical system
EP0056895A2 (en) * 1981-01-27 1982-08-04 Westinghouse Electric Corporation Automatic test system
EP0067496A2 (en) * 1981-06-15 1982-12-22 Westinghouse Electric Corporation Automatic test system
EP0216533A2 (en) * 1985-09-17 1987-04-01 Tektronix, Inc. Computer-based instrument system
US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
US4700293A (en) * 1985-05-14 1987-10-13 The United States Of America As Represented By The Secretary Of The Air Force Maintenance port system incorporating software development package
US4701870A (en) * 1984-07-13 1987-10-20 Sony Corporation Integrated circuit device testable by an external computer system
US4736374A (en) * 1986-05-14 1988-04-05 Grumman Aerospace Corporation Automated test apparatus for use with multiple equipment
US4760377A (en) * 1983-11-25 1988-07-26 Giordano Associates, Inc. Decompaction of stored data in automatic test systems
GR880100266A (en) * 1987-04-23 1989-01-31 Grumman Aerospace Corp Programmed tester with memory of the type of bubble
US5132635A (en) * 1991-03-05 1992-07-21 Ast Research, Inc. Serial testing of removable circuit boards on a backplane bus
EP0500310A1 (en) * 1991-02-22 1992-08-26 Genrad, Inc. Automatic circuit tester with separate instrument and scanner busses
EP0502624A1 (en) * 1991-02-22 1992-09-09 Genrad, Inc. Tester interconnect system
US5251150A (en) * 1989-01-13 1993-10-05 Tektronix, Inc. Sub-modular development system for modular computer-based instruments
US5331274A (en) * 1992-03-02 1994-07-19 At&T Bell Laboratories Method and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scan
US5353243A (en) * 1989-05-31 1994-10-04 Synopsys Inc. Hardware modeling system and method of use
US5390194A (en) * 1993-11-17 1995-02-14 Grumman Aerospace Corporation ATG test station
US5388467A (en) * 1992-09-09 1995-02-14 Tricor Systems, Inc. Automatic switch test station
US5477544A (en) * 1994-02-10 1995-12-19 The United States Of America As Represented By The Secretary Of The Navy Multi-port tester interface
US5673295A (en) * 1995-04-13 1997-09-30 Synopsis, Incorporated Method and apparatus for generating and synchronizing a plurality of digital signals
US5793218A (en) * 1995-12-15 1998-08-11 Lear Astronics Corporation Generic interface test adapter
US6148275A (en) * 1989-05-31 2000-11-14 Synopsys, Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
US6415392B1 (en) * 1997-12-08 2002-07-02 Ricoh Company, Ltd. Remote diagnosis system and method
US6437595B1 (en) * 2000-12-20 2002-08-20 Advanced Micro Devices, Inc. Method and system for providing an automated switching box for testing of integrated circuit devices
US20030191883A1 (en) * 2002-04-05 2003-10-09 Sycamore Networks, Inc. Interface for upgrading serial backplane application from ethernet to gigabit ethernet
US6647526B1 (en) * 2000-06-30 2003-11-11 Rockwell Automation Technologies, Inc. Modular/re-configurable test platform
US20040201490A1 (en) * 2003-04-11 2004-10-14 Newell Larry Dale Apparatus and method for providing visual and hardware addressing information
US20040230866A1 (en) * 2003-04-30 2004-11-18 Hewlett-Packard Development Company, L.P. Test system for testing components of an open architecture modular computing system
US6850868B2 (en) * 2001-02-06 2005-02-01 Shimadzu Corporation Maintenance system for analyzing instrument
US20080160810A1 (en) * 2006-12-27 2008-07-03 Thomas Wilmer Ferguson Electrically safe receptacle
TWI501593B (en) * 2009-01-07 2015-09-21 Ic Plus Corp Switch test apparatus and test apparatus thereof
CN112305398A (en) * 2019-08-01 2021-02-02 富港电子(东莞)有限公司 Automatic circuit board testing system and method thereof
US10935594B1 (en) * 2014-11-10 2021-03-02 Priority Labs, Inc. Curve trace analysis testing apparatus controller
CN112951314A (en) * 2021-02-01 2021-06-11 上海航天计算机技术研究所 Loadable general RAM self-testing method based on TSC695 processor

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4218745A (en) * 1978-09-11 1980-08-19 Lockheed Corporation Microcomputer assisted electrical harness fabrication and testing system
US4392107A (en) * 1980-09-09 1983-07-05 The Bendix Corporation Switching equipment for testing apparatus
FR2495350A1 (en) * 1980-12-03 1982-06-04 Lazare Rene SPECIFIC MODULE TESTER, AUTOMATED AND PORTABLE
CA1242486A (en) * 1983-11-25 1988-09-27 John J. Comfort Automatic test equipment
GB2195028B (en) * 1983-11-25 1988-09-01 Mars Inc Automatic test equipment
GB2195029B (en) * 1983-11-25 1988-09-01 Mars Inc Automatic test equipment
GB2195027B (en) * 1983-11-25 1988-09-14 Mars Inc Automatic test equipment
GB2157837B (en) * 1984-04-16 1988-05-18 Mars Inc Circuit testing apparatus
GB8505874D0 (en) * 1985-03-07 1985-04-11 Ti Crypton Ltd Engine analysers
US4719459A (en) * 1986-03-06 1988-01-12 Grumman Aerospace Corporation Signal distribution system switching module
US4825392A (en) * 1986-08-20 1989-04-25 Freeman Mark S Dual function DMM display

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3213428A (en) * 1961-01-19 1965-10-19 Gen Dynamics Corp Sequential testing system
US3247498A (en) * 1962-08-23 1966-04-19 Bendix Corp Worst condition indicating system
US3585599A (en) * 1968-07-09 1971-06-15 Ibm Universal system service adapter
US3597682A (en) * 1968-11-12 1971-08-03 E H Research Lab Inc Programmable testing unit for single shot testing
US3623011A (en) * 1969-06-25 1971-11-23 Bell Telephone Labor Inc Time-shared access to computer registers
US3629856A (en) * 1969-03-22 1971-12-21 Tokyo Keiki Seizosho Co Ltd Multichannel signal-processing system
US3638193A (en) * 1970-02-02 1972-01-25 Bell Telephone Labor Inc {62 -element switching network control
US3646519A (en) * 1970-02-02 1972-02-29 Burroughs Corp Method and apparatus for testing logic functions in a multiline data communication system
US3665418A (en) * 1968-07-15 1972-05-23 Ibm Status switching in an automatically repaired computer
US3681758A (en) * 1970-04-29 1972-08-01 Northrop Corp Data acquisition unit with memory

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3213428A (en) * 1961-01-19 1965-10-19 Gen Dynamics Corp Sequential testing system
US3247498A (en) * 1962-08-23 1966-04-19 Bendix Corp Worst condition indicating system
US3585599A (en) * 1968-07-09 1971-06-15 Ibm Universal system service adapter
US3665418A (en) * 1968-07-15 1972-05-23 Ibm Status switching in an automatically repaired computer
US3597682A (en) * 1968-11-12 1971-08-03 E H Research Lab Inc Programmable testing unit for single shot testing
US3629856A (en) * 1969-03-22 1971-12-21 Tokyo Keiki Seizosho Co Ltd Multichannel signal-processing system
US3623011A (en) * 1969-06-25 1971-11-23 Bell Telephone Labor Inc Time-shared access to computer registers
US3638193A (en) * 1970-02-02 1972-01-25 Bell Telephone Labor Inc {62 -element switching network control
US3646519A (en) * 1970-02-02 1972-02-29 Burroughs Corp Method and apparatus for testing logic functions in a multiline data communication system
US3681758A (en) * 1970-04-29 1972-08-01 Northrop Corp Data acquisition unit with memory

Cited By (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3988718A (en) * 1973-12-20 1976-10-26 Compagnie Industrielle Des Telecommunications Cit-Alcatel Logic control system
US4041473A (en) * 1974-05-16 1977-08-09 Honeywell Information Systems Italia Computer input/output control apparatus
US4057847A (en) * 1976-06-14 1977-11-08 Sperry Rand Corporation Remote controlled test interface unit
US4207611A (en) * 1978-12-18 1980-06-10 Ford Motor Company Apparatus and method for calibrated testing of a vehicle electrical system
US4207610A (en) * 1978-12-18 1980-06-10 Ford Motor Company Apparatus and method for testing and controlling manufacture of a vehicle electrical system
EP0056895A2 (en) * 1981-01-27 1982-08-04 Westinghouse Electric Corporation Automatic test system
EP0056895A3 (en) * 1981-01-27 1983-11-16 Westinghouse Electric Corporation Automatic test system
EP0067496A2 (en) * 1981-06-15 1982-12-22 Westinghouse Electric Corporation Automatic test system
EP0067496A3 (en) * 1981-06-15 1985-04-03 Westinghouse Electric Corporation Automatic test system
US4656632A (en) * 1983-11-25 1987-04-07 Giordano Associates, Inc. System for automatic testing of circuits and systems
US4760377A (en) * 1983-11-25 1988-07-26 Giordano Associates, Inc. Decompaction of stored data in automatic test systems
US4701870A (en) * 1984-07-13 1987-10-20 Sony Corporation Integrated circuit device testable by an external computer system
US4700293A (en) * 1985-05-14 1987-10-13 The United States Of America As Represented By The Secretary Of The Air Force Maintenance port system incorporating software development package
EP0216533A3 (en) * 1985-09-17 1989-10-18 Tektronix, Inc. Computer-based instrument system
EP0216533A2 (en) * 1985-09-17 1987-04-01 Tektronix, Inc. Computer-based instrument system
US4736374A (en) * 1986-05-14 1988-04-05 Grumman Aerospace Corporation Automated test apparatus for use with multiple equipment
GR880100266A (en) * 1987-04-23 1989-01-31 Grumman Aerospace Corp Programmed tester with memory of the type of bubble
EP0311682A1 (en) * 1987-04-23 1989-04-19 Grumman Aerospace Corporation Programmable tester with bubble memory
EP0311682A4 (en) * 1987-04-23 1989-08-09 Grumman Aerospace Corp Programmable tester with bubble memory.
US5251150A (en) * 1989-01-13 1993-10-05 Tektronix, Inc. Sub-modular development system for modular computer-based instruments
US5353243A (en) * 1989-05-31 1994-10-04 Synopsys Inc. Hardware modeling system and method of use
US5625580A (en) * 1989-05-31 1997-04-29 Synopsys, Inc. Hardware modeling system and method of use
US6148275A (en) * 1989-05-31 2000-11-14 Synopsys, Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
EP0502624A1 (en) * 1991-02-22 1992-09-09 Genrad, Inc. Tester interconnect system
EP0500310A1 (en) * 1991-02-22 1992-08-26 Genrad, Inc. Automatic circuit tester with separate instrument and scanner busses
US5132635A (en) * 1991-03-05 1992-07-21 Ast Research, Inc. Serial testing of removable circuit boards on a backplane bus
US5331274A (en) * 1992-03-02 1994-07-19 At&T Bell Laboratories Method and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scan
US5388467A (en) * 1992-09-09 1995-02-14 Tricor Systems, Inc. Automatic switch test station
US5390194A (en) * 1993-11-17 1995-02-14 Grumman Aerospace Corporation ATG test station
US5477544A (en) * 1994-02-10 1995-12-19 The United States Of America As Represented By The Secretary Of The Navy Multi-port tester interface
US5673295A (en) * 1995-04-13 1997-09-30 Synopsis, Incorporated Method and apparatus for generating and synchronizing a plurality of digital signals
US5793218A (en) * 1995-12-15 1998-08-11 Lear Astronics Corporation Generic interface test adapter
US6415392B1 (en) * 1997-12-08 2002-07-02 Ricoh Company, Ltd. Remote diagnosis system and method
US6647526B1 (en) * 2000-06-30 2003-11-11 Rockwell Automation Technologies, Inc. Modular/re-configurable test platform
US6437595B1 (en) * 2000-12-20 2002-08-20 Advanced Micro Devices, Inc. Method and system for providing an automated switching box for testing of integrated circuit devices
US6850868B2 (en) * 2001-02-06 2005-02-01 Shimadzu Corporation Maintenance system for analyzing instrument
US20030191883A1 (en) * 2002-04-05 2003-10-09 Sycamore Networks, Inc. Interface for upgrading serial backplane application from ethernet to gigabit ethernet
US20040201490A1 (en) * 2003-04-11 2004-10-14 Newell Larry Dale Apparatus and method for providing visual and hardware addressing information
US7119708B2 (en) * 2003-04-11 2006-10-10 Avaya Technology Corp Apparatus and method for providing visual and hardware addressing information
US20040230866A1 (en) * 2003-04-30 2004-11-18 Hewlett-Packard Development Company, L.P. Test system for testing components of an open architecture modular computing system
US20080160810A1 (en) * 2006-12-27 2008-07-03 Thomas Wilmer Ferguson Electrically safe receptacle
US7575467B2 (en) * 2006-12-27 2009-08-18 Thomas Wilmer Ferguson Electrically safe receptacle
TWI501593B (en) * 2009-01-07 2015-09-21 Ic Plus Corp Switch test apparatus and test apparatus thereof
US10935594B1 (en) * 2014-11-10 2021-03-02 Priority Labs, Inc. Curve trace analysis testing apparatus controller
CN112305398A (en) * 2019-08-01 2021-02-02 富港电子(东莞)有限公司 Automatic circuit board testing system and method thereof
EP3771912A1 (en) * 2019-08-01 2021-02-03 Cheng Uei Precision Industry Co., Ltd. Automatic circuit board test system and automatic circuit board test method applied therein
EP3879287A1 (en) * 2019-08-01 2021-09-15 Cheng Uei Precision Industry Co., Ltd. Automatic circuit board test method
US11162997B2 (en) 2019-08-01 2021-11-02 Cheng Uei Precision Industry Co., Ltd. Automatic circuit board test system and automatic circuit board test method applied therein
CN112951314A (en) * 2021-02-01 2021-06-11 上海航天计算机技术研究所 Loadable general RAM self-testing method based on TSC695 processor

Also Published As

Publication number Publication date
IT956586B (en) 1973-10-10
FR2142451A5 (en) 1973-01-26
GB1401194A (en) 1975-07-16
NL7208179A (en) 1972-12-19
DE2228881A1 (en) 1972-12-21
GB1401193A (en) 1975-07-16
ES403913A1 (en) 1975-05-01
GB1401192A (en) 1975-07-16
CA956699A (en) 1974-10-22
JPS5318132B1 (en) 1978-06-13
CH594893A5 (en) 1978-01-31
BE784845A (en) 1972-10-02

Similar Documents

Publication Publication Date Title
US3854125A (en) Automated diagnostic testing system
CN109342848B (en) Avalanche testing method and system for dispatching automation master station and terminal equipment
EP4191905A1 (en) Test method and device
CN109032888A (en) A kind of server start-up course fault detection method, device and controlled terminal
CN112067970A (en) Plate intelligent test system with checking function
CN112083310A (en) Intelligent plate testing system
US3430135A (en) Automatic circuit fault tester for multiple circuits including means responsive to blank terminals at ends of the circuits under test
US3370232A (en) Switching apparatus for verifying the resistive integrity of electrical wiring systems
US3600673A (en) Sequentially stepped, termination indicating multiconductor checking and testing apparatus
EP0157028B1 (en) Programmable tester
CN113589061B (en) Relay protection outlet testing device
CN108427044A (en) Method, device, equipment and storage medium for testing fault protection function
CN113156914B (en) Hardware insulation test platform of subway vehicle-mounted signal control equipment
US2978641A (en) Circuit ambiguity testing apparatus
CN115184822A (en) HI-POT testing device with multi-channel switching and contact self-checking method thereof
CN111934293B (en) Power system fault analysis method, device, equipment and storage medium
JPH02221874A (en) Fault diagnostic system for electric power transforming equipment
TW201809711A (en) Semiconductor test method and apparatus for controlling tester
CN113447880A (en) Fault diagnosis method and device for electric energy meter and terminal equipment
US4286117A (en) Danger alarm system
WO1984002015A1 (en) A METHOD AND APPARATUS FOR THE EXAMINATION OF THE INTERNAL INTERCONNECTION SYSTEM BETWEEN n TERMINALS OF AN ELECTRICAL NETWORK
CN111146756A (en) Protection constant value checking method and system
CN116298850B (en) Testing device and testing method
CN113721090B (en) Input/output circuit inspection method for universal weapon system
CN109490662A (en) Test method, device, computer equipment and the storage medium of vehicle electronics

Legal Events

Date Code Title Description
AS Assignment

Owner name: GIORDANO ASSOCIATES, INC., 21 WHITE DEER PLAZA, SP

Free format text: NUNC PRO TUNC ASSIGNMENT;ASSIGNOR:INSTRUMENTATION ENGINEERING INC., A CORP OF DE;REEL/FRAME:004598/0155

Effective date: 19860722

Owner name: GIORDANO ASSOCIATES, INC., A CORP OF NJ,NEW JERSEY

Free format text: NUNC PRO TUNC ASSIGNMENT;ASSIGNOR:INSTRUMENTATION ENGINEERING INC., A CORP OF DE;REEL/FRAME:004598/0155

Effective date: 19860722

AS Assignment

Owner name: MIDLANTIC NATIONAL BANK, P.O. BOX, METROPARK PLAZA

Free format text: SECURITY INTEREST;ASSIGNOR:GIORDANO ASSOCIATES, INC., A NJ CORP.;REEL/FRAME:004738/0865

Effective date: 19870723

AS Assignment

Owner name: MIDLANTIC NATIONAL BANK, NEW JERSEY

Free format text: SECURITY INTEREST;ASSIGNOR:GIORDANO ASSOCIATES, INC.;REEL/FRAME:005031/0177

Effective date: 19890224

STCF Information on status: patent grant

Free format text: PATENTED FILE - (OLD CASE ADDED FOR FILE TRACKING PURPOSES)