US3854125A - Automated diagnostic testing system - Google Patents
Automated diagnostic testing system Download PDFInfo
- Publication number
- US3854125A US3854125A US00153902A US15390271A US3854125A US 3854125 A US3854125 A US 3854125A US 00153902 A US00153902 A US 00153902A US 15390271 A US15390271 A US 15390271A US 3854125 A US3854125 A US 3854125A
- Authority
- US
- United States
- Prior art keywords
- bus
- terminal
- terminals
- switch
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
Definitions
- ABSTRACT An automated diagnostic testing system under control of a computer having on line compiling capability for entering and modifying testing programs involving the inter-connection of the unit under test with one or more peripheral devices.
- An important aspect of the invention is the system for routing electrical signals between a selected pair of a plurality of terminals, via one or more conductive buses, including switch means associated with each terminal and controllably operative to connect that terminal to any one of the buses.
- Switch control means responsive to programmed commands determines from a stored indication the availability of one of the buses, assigns the bus determined to be available to one of the selected terminals, assigns the other selected terminal to that bus. stores an indication of the bus and terminal so assigned and operates the switch means associated with the selected terminals to connect them to the assigned bus.
- the switch means comprises a controllable individual switch between each bus and a particular terminal, and at least one separately controllable switch for opening and closing the series circuit between the terminal and any bus. This separately controllable switch is operated prior to operating the individual switches between the terminal and each of the buses.
- PAIENIE DEC 1 01974 sum -"13 0F 19 OPEN MERCu y I86 RELAY FOR ANY E PINS f0 5 /36 OPEN NETWORK RELAY /7 N0 E1 DOA/N66 r 0 L46 F R ALL Pnvs r0 as //9 Cvlwvfcrso 7'0 ii 5 4 /93 li'flcollA/scr FLAGS FORALL PINS m as flMYfCfZ-p r0 A /6min 4014 4540 54/5 f REM m 2/4 KEL V/IV INDICATORS
- FIGIS fiir CLOS WORKRELA v5 I98 a 05E MERCURY NE rwomr RELA vs RELAYS Z00 is RELA 1 CONNECT //99 2/0 rum /5 szr 204 262 l5 ,3 ANY g? DELAY Y 1 Y5 Dev/
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
- Programmable Controllers (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
Description
Claims (22)
Priority Applications (13)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US00153902A US3854125A (en) | 1971-06-15 | 1971-06-15 | Automated diagnostic testing system |
CA144,702A CA956699A (en) | 1971-06-15 | 1972-06-14 | Automated diagnostic testing system |
DE19722228881 DE2228881A1 (en) | 1971-06-15 | 1972-06-14 | Automatic diagnostic examiner |
CH883272A CH594893A5 (en) | 1971-06-15 | 1972-06-14 | |
FR7221462A FR2142451A5 (en) | 1971-06-15 | 1972-06-14 | |
BE784845A BE784845A (en) | 1971-06-15 | 1972-06-14 | AUTOMATIC TEST AND DIAGNOSIS DEVICE |
GB4922174A GB1401194A (en) | 1971-06-15 | 1972-06-15 | Automatic testing systems |
NL7208179A NL7208179A (en) | 1971-06-15 | 1972-06-15 | |
IT25699/72A IT956586B (en) | 1971-06-15 | 1972-06-15 | AUTOMATED DIAGNOSTIC ANALYSIS SYSTEM |
GB2796772A GB1401192A (en) | 1971-06-15 | 1972-06-15 | Automatic testing systems |
ES403913A ES403913A1 (en) | 1971-06-15 | 1972-06-15 | Automated diagnostic testing system |
JP6032672A JPS5318132B1 (en) | 1971-06-15 | 1972-06-15 | |
GB4922074A GB1401193A (en) | 1971-06-15 | 1972-06-15 | Automatic testing systems |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US00153902A US3854125A (en) | 1971-06-15 | 1971-06-15 | Automated diagnostic testing system |
Publications (1)
Publication Number | Publication Date |
---|---|
US3854125A true US3854125A (en) | 1974-12-10 |
Family
ID=22549202
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US00153902A Expired - Lifetime US3854125A (en) | 1971-06-15 | 1971-06-15 | Automated diagnostic testing system |
Country Status (11)
Country | Link |
---|---|
US (1) | US3854125A (en) |
JP (1) | JPS5318132B1 (en) |
BE (1) | BE784845A (en) |
CA (1) | CA956699A (en) |
CH (1) | CH594893A5 (en) |
DE (1) | DE2228881A1 (en) |
ES (1) | ES403913A1 (en) |
FR (1) | FR2142451A5 (en) |
GB (3) | GB1401194A (en) |
IT (1) | IT956586B (en) |
NL (1) | NL7208179A (en) |
Cited By (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3988718A (en) * | 1973-12-20 | 1976-10-26 | Compagnie Industrielle Des Telecommunications Cit-Alcatel | Logic control system |
US4041473A (en) * | 1974-05-16 | 1977-08-09 | Honeywell Information Systems Italia | Computer input/output control apparatus |
US4057847A (en) * | 1976-06-14 | 1977-11-08 | Sperry Rand Corporation | Remote controlled test interface unit |
US4207611A (en) * | 1978-12-18 | 1980-06-10 | Ford Motor Company | Apparatus and method for calibrated testing of a vehicle electrical system |
US4207610A (en) * | 1978-12-18 | 1980-06-10 | Ford Motor Company | Apparatus and method for testing and controlling manufacture of a vehicle electrical system |
EP0056895A2 (en) * | 1981-01-27 | 1982-08-04 | Westinghouse Electric Corporation | Automatic test system |
EP0067496A2 (en) * | 1981-06-15 | 1982-12-22 | Westinghouse Electric Corporation | Automatic test system |
EP0216533A2 (en) * | 1985-09-17 | 1987-04-01 | Tektronix, Inc. | Computer-based instrument system |
US4656632A (en) * | 1983-11-25 | 1987-04-07 | Giordano Associates, Inc. | System for automatic testing of circuits and systems |
US4700293A (en) * | 1985-05-14 | 1987-10-13 | The United States Of America As Represented By The Secretary Of The Air Force | Maintenance port system incorporating software development package |
US4701870A (en) * | 1984-07-13 | 1987-10-20 | Sony Corporation | Integrated circuit device testable by an external computer system |
US4736374A (en) * | 1986-05-14 | 1988-04-05 | Grumman Aerospace Corporation | Automated test apparatus for use with multiple equipment |
US4760377A (en) * | 1983-11-25 | 1988-07-26 | Giordano Associates, Inc. | Decompaction of stored data in automatic test systems |
GR880100266A (en) * | 1987-04-23 | 1989-01-31 | Grumman Aerospace Corp | Programmed tester with memory of the type of bubble |
US5132635A (en) * | 1991-03-05 | 1992-07-21 | Ast Research, Inc. | Serial testing of removable circuit boards on a backplane bus |
EP0500310A1 (en) * | 1991-02-22 | 1992-08-26 | Genrad, Inc. | Automatic circuit tester with separate instrument and scanner busses |
EP0502624A1 (en) * | 1991-02-22 | 1992-09-09 | Genrad, Inc. | Tester interconnect system |
US5251150A (en) * | 1989-01-13 | 1993-10-05 | Tektronix, Inc. | Sub-modular development system for modular computer-based instruments |
US5331274A (en) * | 1992-03-02 | 1994-07-19 | At&T Bell Laboratories | Method and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scan |
US5353243A (en) * | 1989-05-31 | 1994-10-04 | Synopsys Inc. | Hardware modeling system and method of use |
US5390194A (en) * | 1993-11-17 | 1995-02-14 | Grumman Aerospace Corporation | ATG test station |
US5388467A (en) * | 1992-09-09 | 1995-02-14 | Tricor Systems, Inc. | Automatic switch test station |
US5477544A (en) * | 1994-02-10 | 1995-12-19 | The United States Of America As Represented By The Secretary Of The Navy | Multi-port tester interface |
US5673295A (en) * | 1995-04-13 | 1997-09-30 | Synopsis, Incorporated | Method and apparatus for generating and synchronizing a plurality of digital signals |
US5793218A (en) * | 1995-12-15 | 1998-08-11 | Lear Astronics Corporation | Generic interface test adapter |
US6148275A (en) * | 1989-05-31 | 2000-11-14 | Synopsys, Inc. | System for and method of connecting a hardware modeling element to a hardware modeling system |
US6415392B1 (en) * | 1997-12-08 | 2002-07-02 | Ricoh Company, Ltd. | Remote diagnosis system and method |
US6437595B1 (en) * | 2000-12-20 | 2002-08-20 | Advanced Micro Devices, Inc. | Method and system for providing an automated switching box for testing of integrated circuit devices |
US20030191883A1 (en) * | 2002-04-05 | 2003-10-09 | Sycamore Networks, Inc. | Interface for upgrading serial backplane application from ethernet to gigabit ethernet |
US6647526B1 (en) * | 2000-06-30 | 2003-11-11 | Rockwell Automation Technologies, Inc. | Modular/re-configurable test platform |
US20040201490A1 (en) * | 2003-04-11 | 2004-10-14 | Newell Larry Dale | Apparatus and method for providing visual and hardware addressing information |
US20040230866A1 (en) * | 2003-04-30 | 2004-11-18 | Hewlett-Packard Development Company, L.P. | Test system for testing components of an open architecture modular computing system |
US6850868B2 (en) * | 2001-02-06 | 2005-02-01 | Shimadzu Corporation | Maintenance system for analyzing instrument |
US20080160810A1 (en) * | 2006-12-27 | 2008-07-03 | Thomas Wilmer Ferguson | Electrically safe receptacle |
TWI501593B (en) * | 2009-01-07 | 2015-09-21 | Ic Plus Corp | Switch test apparatus and test apparatus thereof |
CN112305398A (en) * | 2019-08-01 | 2021-02-02 | 富港电子(东莞)有限公司 | Automatic circuit board testing system and method thereof |
US10935594B1 (en) * | 2014-11-10 | 2021-03-02 | Priority Labs, Inc. | Curve trace analysis testing apparatus controller |
CN112951314A (en) * | 2021-02-01 | 2021-06-11 | 上海航天计算机技术研究所 | Loadable general RAM self-testing method based on TSC695 processor |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4218745A (en) * | 1978-09-11 | 1980-08-19 | Lockheed Corporation | Microcomputer assisted electrical harness fabrication and testing system |
US4392107A (en) * | 1980-09-09 | 1983-07-05 | The Bendix Corporation | Switching equipment for testing apparatus |
FR2495350A1 (en) * | 1980-12-03 | 1982-06-04 | Lazare Rene | SPECIFIC MODULE TESTER, AUTOMATED AND PORTABLE |
CA1242486A (en) * | 1983-11-25 | 1988-09-27 | John J. Comfort | Automatic test equipment |
GB2195028B (en) * | 1983-11-25 | 1988-09-01 | Mars Inc | Automatic test equipment |
GB2195029B (en) * | 1983-11-25 | 1988-09-01 | Mars Inc | Automatic test equipment |
GB2195027B (en) * | 1983-11-25 | 1988-09-14 | Mars Inc | Automatic test equipment |
GB2157837B (en) * | 1984-04-16 | 1988-05-18 | Mars Inc | Circuit testing apparatus |
GB8505874D0 (en) * | 1985-03-07 | 1985-04-11 | Ti Crypton Ltd | Engine analysers |
US4719459A (en) * | 1986-03-06 | 1988-01-12 | Grumman Aerospace Corporation | Signal distribution system switching module |
US4825392A (en) * | 1986-08-20 | 1989-04-25 | Freeman Mark S | Dual function DMM display |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3213428A (en) * | 1961-01-19 | 1965-10-19 | Gen Dynamics Corp | Sequential testing system |
US3247498A (en) * | 1962-08-23 | 1966-04-19 | Bendix Corp | Worst condition indicating system |
US3585599A (en) * | 1968-07-09 | 1971-06-15 | Ibm | Universal system service adapter |
US3597682A (en) * | 1968-11-12 | 1971-08-03 | E H Research Lab Inc | Programmable testing unit for single shot testing |
US3623011A (en) * | 1969-06-25 | 1971-11-23 | Bell Telephone Labor Inc | Time-shared access to computer registers |
US3629856A (en) * | 1969-03-22 | 1971-12-21 | Tokyo Keiki Seizosho Co Ltd | Multichannel signal-processing system |
US3638193A (en) * | 1970-02-02 | 1972-01-25 | Bell Telephone Labor Inc | {62 -element switching network control |
US3646519A (en) * | 1970-02-02 | 1972-02-29 | Burroughs Corp | Method and apparatus for testing logic functions in a multiline data communication system |
US3665418A (en) * | 1968-07-15 | 1972-05-23 | Ibm | Status switching in an automatically repaired computer |
US3681758A (en) * | 1970-04-29 | 1972-08-01 | Northrop Corp | Data acquisition unit with memory |
-
1971
- 1971-06-15 US US00153902A patent/US3854125A/en not_active Expired - Lifetime
-
1972
- 1972-06-14 FR FR7221462A patent/FR2142451A5/fr not_active Expired
- 1972-06-14 CH CH883272A patent/CH594893A5/xx not_active IP Right Cessation
- 1972-06-14 BE BE784845A patent/BE784845A/en not_active IP Right Cessation
- 1972-06-14 CA CA144,702A patent/CA956699A/en not_active Expired
- 1972-06-14 DE DE19722228881 patent/DE2228881A1/en active Pending
- 1972-06-15 GB GB4922174A patent/GB1401194A/en not_active Expired
- 1972-06-15 GB GB2796772A patent/GB1401192A/en not_active Expired
- 1972-06-15 JP JP6032672A patent/JPS5318132B1/ja active Pending
- 1972-06-15 NL NL7208179A patent/NL7208179A/xx unknown
- 1972-06-15 ES ES403913A patent/ES403913A1/en not_active Expired
- 1972-06-15 GB GB4922074A patent/GB1401193A/en not_active Expired
- 1972-06-15 IT IT25699/72A patent/IT956586B/en active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3213428A (en) * | 1961-01-19 | 1965-10-19 | Gen Dynamics Corp | Sequential testing system |
US3247498A (en) * | 1962-08-23 | 1966-04-19 | Bendix Corp | Worst condition indicating system |
US3585599A (en) * | 1968-07-09 | 1971-06-15 | Ibm | Universal system service adapter |
US3665418A (en) * | 1968-07-15 | 1972-05-23 | Ibm | Status switching in an automatically repaired computer |
US3597682A (en) * | 1968-11-12 | 1971-08-03 | E H Research Lab Inc | Programmable testing unit for single shot testing |
US3629856A (en) * | 1969-03-22 | 1971-12-21 | Tokyo Keiki Seizosho Co Ltd | Multichannel signal-processing system |
US3623011A (en) * | 1969-06-25 | 1971-11-23 | Bell Telephone Labor Inc | Time-shared access to computer registers |
US3638193A (en) * | 1970-02-02 | 1972-01-25 | Bell Telephone Labor Inc | {62 -element switching network control |
US3646519A (en) * | 1970-02-02 | 1972-02-29 | Burroughs Corp | Method and apparatus for testing logic functions in a multiline data communication system |
US3681758A (en) * | 1970-04-29 | 1972-08-01 | Northrop Corp | Data acquisition unit with memory |
Cited By (49)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3988718A (en) * | 1973-12-20 | 1976-10-26 | Compagnie Industrielle Des Telecommunications Cit-Alcatel | Logic control system |
US4041473A (en) * | 1974-05-16 | 1977-08-09 | Honeywell Information Systems Italia | Computer input/output control apparatus |
US4057847A (en) * | 1976-06-14 | 1977-11-08 | Sperry Rand Corporation | Remote controlled test interface unit |
US4207611A (en) * | 1978-12-18 | 1980-06-10 | Ford Motor Company | Apparatus and method for calibrated testing of a vehicle electrical system |
US4207610A (en) * | 1978-12-18 | 1980-06-10 | Ford Motor Company | Apparatus and method for testing and controlling manufacture of a vehicle electrical system |
EP0056895A2 (en) * | 1981-01-27 | 1982-08-04 | Westinghouse Electric Corporation | Automatic test system |
EP0056895A3 (en) * | 1981-01-27 | 1983-11-16 | Westinghouse Electric Corporation | Automatic test system |
EP0067496A2 (en) * | 1981-06-15 | 1982-12-22 | Westinghouse Electric Corporation | Automatic test system |
EP0067496A3 (en) * | 1981-06-15 | 1985-04-03 | Westinghouse Electric Corporation | Automatic test system |
US4656632A (en) * | 1983-11-25 | 1987-04-07 | Giordano Associates, Inc. | System for automatic testing of circuits and systems |
US4760377A (en) * | 1983-11-25 | 1988-07-26 | Giordano Associates, Inc. | Decompaction of stored data in automatic test systems |
US4701870A (en) * | 1984-07-13 | 1987-10-20 | Sony Corporation | Integrated circuit device testable by an external computer system |
US4700293A (en) * | 1985-05-14 | 1987-10-13 | The United States Of America As Represented By The Secretary Of The Air Force | Maintenance port system incorporating software development package |
EP0216533A3 (en) * | 1985-09-17 | 1989-10-18 | Tektronix, Inc. | Computer-based instrument system |
EP0216533A2 (en) * | 1985-09-17 | 1987-04-01 | Tektronix, Inc. | Computer-based instrument system |
US4736374A (en) * | 1986-05-14 | 1988-04-05 | Grumman Aerospace Corporation | Automated test apparatus for use with multiple equipment |
GR880100266A (en) * | 1987-04-23 | 1989-01-31 | Grumman Aerospace Corp | Programmed tester with memory of the type of bubble |
EP0311682A1 (en) * | 1987-04-23 | 1989-04-19 | Grumman Aerospace Corporation | Programmable tester with bubble memory |
EP0311682A4 (en) * | 1987-04-23 | 1989-08-09 | Grumman Aerospace Corp | Programmable tester with bubble memory. |
US5251150A (en) * | 1989-01-13 | 1993-10-05 | Tektronix, Inc. | Sub-modular development system for modular computer-based instruments |
US5353243A (en) * | 1989-05-31 | 1994-10-04 | Synopsys Inc. | Hardware modeling system and method of use |
US5625580A (en) * | 1989-05-31 | 1997-04-29 | Synopsys, Inc. | Hardware modeling system and method of use |
US6148275A (en) * | 1989-05-31 | 2000-11-14 | Synopsys, Inc. | System for and method of connecting a hardware modeling element to a hardware modeling system |
EP0502624A1 (en) * | 1991-02-22 | 1992-09-09 | Genrad, Inc. | Tester interconnect system |
EP0500310A1 (en) * | 1991-02-22 | 1992-08-26 | Genrad, Inc. | Automatic circuit tester with separate instrument and scanner busses |
US5132635A (en) * | 1991-03-05 | 1992-07-21 | Ast Research, Inc. | Serial testing of removable circuit boards on a backplane bus |
US5331274A (en) * | 1992-03-02 | 1994-07-19 | At&T Bell Laboratories | Method and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scan |
US5388467A (en) * | 1992-09-09 | 1995-02-14 | Tricor Systems, Inc. | Automatic switch test station |
US5390194A (en) * | 1993-11-17 | 1995-02-14 | Grumman Aerospace Corporation | ATG test station |
US5477544A (en) * | 1994-02-10 | 1995-12-19 | The United States Of America As Represented By The Secretary Of The Navy | Multi-port tester interface |
US5673295A (en) * | 1995-04-13 | 1997-09-30 | Synopsis, Incorporated | Method and apparatus for generating and synchronizing a plurality of digital signals |
US5793218A (en) * | 1995-12-15 | 1998-08-11 | Lear Astronics Corporation | Generic interface test adapter |
US6415392B1 (en) * | 1997-12-08 | 2002-07-02 | Ricoh Company, Ltd. | Remote diagnosis system and method |
US6647526B1 (en) * | 2000-06-30 | 2003-11-11 | Rockwell Automation Technologies, Inc. | Modular/re-configurable test platform |
US6437595B1 (en) * | 2000-12-20 | 2002-08-20 | Advanced Micro Devices, Inc. | Method and system for providing an automated switching box for testing of integrated circuit devices |
US6850868B2 (en) * | 2001-02-06 | 2005-02-01 | Shimadzu Corporation | Maintenance system for analyzing instrument |
US20030191883A1 (en) * | 2002-04-05 | 2003-10-09 | Sycamore Networks, Inc. | Interface for upgrading serial backplane application from ethernet to gigabit ethernet |
US20040201490A1 (en) * | 2003-04-11 | 2004-10-14 | Newell Larry Dale | Apparatus and method for providing visual and hardware addressing information |
US7119708B2 (en) * | 2003-04-11 | 2006-10-10 | Avaya Technology Corp | Apparatus and method for providing visual and hardware addressing information |
US20040230866A1 (en) * | 2003-04-30 | 2004-11-18 | Hewlett-Packard Development Company, L.P. | Test system for testing components of an open architecture modular computing system |
US20080160810A1 (en) * | 2006-12-27 | 2008-07-03 | Thomas Wilmer Ferguson | Electrically safe receptacle |
US7575467B2 (en) * | 2006-12-27 | 2009-08-18 | Thomas Wilmer Ferguson | Electrically safe receptacle |
TWI501593B (en) * | 2009-01-07 | 2015-09-21 | Ic Plus Corp | Switch test apparatus and test apparatus thereof |
US10935594B1 (en) * | 2014-11-10 | 2021-03-02 | Priority Labs, Inc. | Curve trace analysis testing apparatus controller |
CN112305398A (en) * | 2019-08-01 | 2021-02-02 | 富港电子(东莞)有限公司 | Automatic circuit board testing system and method thereof |
EP3771912A1 (en) * | 2019-08-01 | 2021-02-03 | Cheng Uei Precision Industry Co., Ltd. | Automatic circuit board test system and automatic circuit board test method applied therein |
EP3879287A1 (en) * | 2019-08-01 | 2021-09-15 | Cheng Uei Precision Industry Co., Ltd. | Automatic circuit board test method |
US11162997B2 (en) | 2019-08-01 | 2021-11-02 | Cheng Uei Precision Industry Co., Ltd. | Automatic circuit board test system and automatic circuit board test method applied therein |
CN112951314A (en) * | 2021-02-01 | 2021-06-11 | 上海航天计算机技术研究所 | Loadable general RAM self-testing method based on TSC695 processor |
Also Published As
Publication number | Publication date |
---|---|
IT956586B (en) | 1973-10-10 |
FR2142451A5 (en) | 1973-01-26 |
GB1401194A (en) | 1975-07-16 |
NL7208179A (en) | 1972-12-19 |
DE2228881A1 (en) | 1972-12-21 |
GB1401193A (en) | 1975-07-16 |
ES403913A1 (en) | 1975-05-01 |
GB1401192A (en) | 1975-07-16 |
CA956699A (en) | 1974-10-22 |
JPS5318132B1 (en) | 1978-06-13 |
CH594893A5 (en) | 1978-01-31 |
BE784845A (en) | 1972-10-02 |
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Legal Events
Date | Code | Title | Description |
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