TWI585821B - Method for manufacturing mold - Google Patents
Method for manufacturing mold Download PDFInfo
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- TWI585821B TWI585821B TW102127691A TW102127691A TWI585821B TW I585821 B TWI585821 B TW I585821B TW 102127691 A TW102127691 A TW 102127691A TW 102127691 A TW102127691 A TW 102127691A TW I585821 B TWI585821 B TW I585821B
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- Prior art keywords
- droplets
- flange portion
- mold
- curable resin
- substrate
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/42—Moulds or cores; Details thereof or accessories therefor characterised by the shape of the moulding surface, e.g. ribs or grooves
- B29C33/424—Moulding surfaces provided with means for marking or patterning
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Description
本發明是有關於一種表面具有微細的凹凸圖案的模具的製造方法及利用其製造的模具。 The present invention relates to a method for producing a mold having a fine uneven pattern on its surface, and a mold produced therewith.
奈米壓印是將形成凹凸圖案的模(通常亦稱為模具、壓模、模板)壓抵(壓印)於塗佈於被轉印基板上的抗蝕劑上,使抗蝕劑發生力學性變形或流動而將微細的圖案精密地轉印至抗蝕劑膜的技術。只要一旦製作出模具,便可將奈米水準的微細結構簡單反覆進行成型,因此較為經濟,並且是有害的廢棄物及排出物少的轉印技術,因此近年來期待應用於半導體領域等各種領域。 Nano-imprinting is a method of pressing (imprinting) a mold (also commonly referred to as a mold, a stamper, a template) forming a concave-convex pattern onto a resist applied on a substrate to be transferred, so that the resist is mechanically generated. A technique in which a fine pattern is precisely transferred to a resist film by deformation or flow. As long as the mold is produced, the fine structure of the nanometer level can be easily and repeatedly formed. Therefore, it is economical, and it is a transfer technique with less harmful waste and less emissions. Therefore, it has been expected to be applied to various fields such as the semiconductor field in recent years. .
模具已知:具有包含凸台部(上表面相對較平並高於周圍的部分)與其周圍的凸緣部的凸台結構者(以下亦稱為凸台型模具)(例如專利文獻1)。在使用凸台型模具進行奈米壓印時,與使用平坦的模具的情形相比,具有模具與抗蝕劑的接觸面積減少,而可藉由小的力將模具自抗蝕劑剝離的優點。另外亦具有以下優點:例如在對同一被轉印基板反覆轉印圖案(分步重複(step and repeat))時,藉由使用凸台型模具,而可避免在轉印下一圖案時模具與之前轉印的圖案干擾,而之前轉印的圖案破損。 The mold is known to have a boss structure (hereinafter also referred to as a boss type mold) including a boss portion (the upper surface is relatively flat and higher than the surrounding portion) and the flange portion around it (for example, Patent Document 1). When the embossing is performed using a boss type mold, the contact area between the mold and the resist is reduced as compared with the case of using a flat mold, and the advantage of peeling the mold from the resist by a small force is obtained. . In addition, it also has the following advantages: for example, repeating a transfer pattern on the same transferred substrate (step by step (step And repeat)), by using a boss type mold, it is possible to avoid the mold from interfering with the previously transferred pattern when the next pattern is transferred, and the previously transferred pattern is broken.
然而,模具存在如下情況:除了例如半導體的電路圖案或表面加工用加工圖案等成為轉印的對象的凹凸圖案外,還設置對準標記或識別標記等輔助標記。 However, the mold may be provided with an auxiliary mark such as an alignment mark or an identification mark in addition to a concave-convex pattern to be transferred, such as a semiconductor circuit pattern or a surface processing processing pattern.
先前,作為具有此種輔助標記的模具的製造方法,例如已知有專利文獻2~專利文獻4的方法。專利文獻2中揭示了使用雷射加工機將識別標記刻印至模具上的方法。專利文獻3中揭示了如下的方法:使用具有微細的凹凸圖案及輔助標記的平坦的原模(master mould)與平坦的被轉印基板,經過在被轉印基板上塗佈抗蝕劑、奈米壓印、及蝕刻的各步驟,而在上述被轉印基板上轉印凹凸圖案,同時亦轉印輔助標記的方法。專利文獻4中揭示了如下的方法:與專利文獻3同樣地將凹凸圖案與輔助標記同時轉印至平坦的被轉印基板上後,遮住包含凹凸圖案的這一部分區域,藉由蝕刻使包含輔助標記的其他區域下凹的方法。 Conventionally, as a method of manufacturing a mold having such an auxiliary mark, for example, methods of Patent Document 2 to Patent Document 4 are known. Patent Document 2 discloses a method of marking an identification mark onto a mold using a laser processing machine. Patent Document 3 discloses a method in which a flat master mold having a fine uneven pattern and an auxiliary mark and a flat transfer substrate are used, and a resist is applied onto the transferred substrate. A method of transferring an uneven pattern on the transferred substrate while transferring the auxiliary mark on each step of the embossing and etching. Patent Document 4 discloses a method of simultaneously transferring a concave-convex pattern and an auxiliary mark onto a flat substrate to be transferred in the same manner as in Patent Document 3, and then blocking the portion including the concave-convex pattern, and etching is included. A method of recessing other areas of the auxiliary mark.
根據專利文獻4的方法,可製造在凸台部上具有微細的凹凸圖案,並在凸緣部具有輔助標記的凸台型模具。 According to the method of Patent Document 4, it is possible to manufacture a boss-type mold having a fine concavo-convex pattern on the boss portion and having an auxiliary mark on the flange portion.
[專利文獻1]日本專利特開2009-170773號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2009-170773
[專利文獻2]日本專利特開2011-066153號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2011-066153
[專利文獻3]日本專利特開2011-063004號公報 [Patent Document 3] Japanese Patent Laid-Open No. 2011-063004
[專利文獻4]日本專利特開2011-066238號公報 [Patent Document 4] Japanese Patent Laid-Open No. 2011-066238
然而,專利文獻4的方法中,由於輔助標記固定於原模,因此無法容易地變更輔助標記。藉此,例如即便是在由1個原模複製多個模具的情況下,亦無法對所複製的每個模具變更識別標記。另外,專利文獻4的方法中,對包含輔助標記的其他區域進行蝕刻的步驟間,難以完全維持輔助標記的形狀,而有可能損害作為輔助標記的功能。 However, in the method of Patent Document 4, since the auxiliary mark is fixed to the original mold, the auxiliary mark cannot be easily changed. Thereby, for example, even when a plurality of dies are copied from one master, it is impossible to change the identification mark for each of the copied dies. Further, in the method of Patent Document 4, it is difficult to completely maintain the shape of the auxiliary mark between the steps of etching the other region including the auxiliary mark, and the function as the auxiliary mark may be impaired.
另一方面,作為具有輔助標記的凸台型模具的製造方法,亦認為有,製造在凸台部上具有微細的凹凸圖案的凸台型模具後,如專利文獻2般藉由雷射等對凸緣部刻印輔助標記的方法。然而,此種方法中,必須對每個模具進行刻印,而作為製造步驟並非高效。 On the other hand, as a method of manufacturing a boss-type mold having an auxiliary mark, it is considered that a boss type mold having a fine uneven pattern on the land portion is produced, and as in Patent Document 2, a laser or the like is used. A method of marking an auxiliary mark on a flange portion. However, in this method, each mold must be inscribed, and the manufacturing step is not efficient.
本發明是鑒於上述問題而成,目的是提供一種在具有輔助標記的凸台型模具的製造中,可靈活地應對輔助標記的變更,而且可更高效地製造的模具的製造方法及利用其製造的模具。 The present invention has been made in view of the above problems, and it is an object of the invention to provide a method for manufacturing a mold which can flexibly cope with a change in an auxiliary mark in the manufacture of a boss type mold having an auxiliary mark, and which can be manufactured more efficiently. Mold.
為了解決上述課題,本發明的模具的製造方法是用於製造表面具有微細的凹凸圖案與輔助標記的模具的製造方法,該模具的製造方法的特徵在於:使用具有包含凸台部及凸緣部的凸台結構的被轉印基板;藉由液滴噴出法,在凸台部上配置包含硬化性樹脂的多滴液滴,並以如下方式在凸緣部上配置包含硬化性樹脂的多滴液滴, 即配置於凸緣部上的多滴液滴各自的高度低於凸台部的高度、且配置於凸緣部上的多滴液滴表示輔助標記;在將原模的凹凸圖案壓抵於配置於凸台部上的多滴液滴的狀態下,使凸台部上的硬化性樹脂硬化,並使凸緣部上的硬化性樹脂硬化;將經硬化的硬化性樹脂作為遮罩,進行被轉印基板的蝕刻。 In order to solve the above problems, the method for producing a mold according to the present invention is a method for producing a mold having a fine uneven pattern and an auxiliary mark on the surface, and the method for manufacturing the mold includes a boss portion and a flange portion. By the droplet discharge method, a plurality of droplets containing a curable resin are placed on the boss portion, and a plurality of droplets containing a curable resin are placed on the flange portion as follows. Droplet, That is, the height of each of the plurality of droplets disposed on the flange portion is lower than the height of the land portion, and the plurality of droplets disposed on the flange portion indicate the auxiliary mark; and the concave-convex pattern of the original mold is pressed against the arrangement In the state of a plurality of droplets on the boss portion, the curable resin on the boss portion is cured to cure the curable resin on the flange portion, and the cured curable resin is used as a mask. Etching of the transfer substrate.
並且,在本發明的模具的製造方法中,較佳為以配置於凸緣部上的每一滴液滴的液滴與凸緣部的接觸面積,大於配置於凸台部上的每一滴液滴的液滴與凸台部的接觸面積的方式,進行上述多滴液滴的配置。 Further, in the method of manufacturing a mold according to the present invention, it is preferable that a contact area between a droplet of each drop of the droplet disposed on the flange portion and the flange portion is larger than each droplet disposed on the boss portion. The arrangement of the plurality of droplets described above is performed in such a manner that the droplets have a contact area with the land portion.
另外,在本發明的模具的製造方法中,較佳為以液滴與凸緣部的接觸面的連同液滴的寬度為50μm~500μm的方式,進行在凸緣部上的上述多滴液滴的配置。 Further, in the method for producing a mold according to the present invention, it is preferable that the plurality of droplets on the flange portion are formed so that the width of the droplets on the contact surface of the droplets and the flange portion is 50 μm to 500 μm. Configuration.
另外,在本發明的模具的製造方法中,較佳為以配置於凸緣部上的每一滴液滴的液滴量多於配置於凸台部上的每一滴液滴的液滴量的方式,進行上述多滴液滴的配置。 Further, in the method of manufacturing a mold according to the present invention, it is preferable that the amount of droplets of each droplet disposed on the flange portion is larger than the amount of droplets of each droplet disposed on the boss portion. The arrangement of the above droplets is performed.
另外,在本發明的模具的製造方法中,較佳為作為被轉印基板,使用凸緣部表面的潤濕性大於凸台部表面的潤濕性的基板。該情況下,較佳為藉由僅在凸緣部實施紫外線臭氧處理的方法或形成與硬化性樹脂的親和性高的薄膜的方法,而增大凸緣部的潤濕性。 Further, in the method for producing a mold according to the present invention, it is preferable to use a substrate having a wettability of the surface of the flange portion larger than the wettability of the surface of the land portion as the substrate to be transferred. In this case, it is preferable to increase the wettability of the flange portion by a method of performing ultraviolet ozone treatment only on the flange portion or a method of forming a film having high affinity with the curable resin.
另外,在本發明的模具的製造方法中,較佳為以配置於 凸緣部上的液滴的高度大於配置於凸台部上的液滴的高度的方式,進行上述多滴液滴的配置。 Further, in the method of manufacturing a mold of the present invention, it is preferable to arrange The arrangement of the plurality of droplets described above is performed such that the height of the droplets on the flange portion is larger than the height of the droplets disposed on the boss portion.
另外,在本發明的模具的製造方法中,較佳為同時進行在凸台部上的上述多滴液滴的配置及在凸緣部上的上述多滴液滴的配置。 Further, in the method of manufacturing a mold according to the present invention, it is preferable that the arrangement of the plurality of droplets on the boss portion and the arrangement of the plurality of droplets on the flange portion are simultaneously performed.
另外,在本發明的模具的製造方法中,較佳為以成為將凸台部上的硬化性樹脂除去且使凸緣部上的硬化性樹脂殘存的狀態的方式,進行上述蝕刻。該情況下,可藉由被轉印基板及硬化性樹脂的各自的光學特性的差異,對輔助標記賦予對比度。 Moreover, in the manufacturing method of the mold of the present invention, it is preferable to perform the etching so that the curable resin on the boss portion is removed and the curable resin on the flange portion remains. In this case, contrast can be imparted to the auxiliary mark by the difference in optical characteristics between the substrate to be transferred and the curable resin.
或者,在本發明的模具的製造方法中,較佳為被轉印基板的凸緣部在該凸緣部的表面的至少一部分具有含有金屬的膜,在含有金屬的膜上進行在凸緣部上的上述多滴液滴的配置。該情況下,可藉由被轉印基板及含有金屬的膜的各自的光學特性的差異,而對輔助標記賦予對比度。並且,在該情況下,較佳為含有金屬的膜具有微細的凹凸結構。而且,較佳為被轉印基板的凸台部在該凸台部的表面具有含有金屬的膜,在蝕刻後,將硬化性樹脂或含有金屬的膜作為遮罩,以成為將凸台部的含有金屬的膜除去且使凸緣部的含有金屬的膜殘存的狀態的方式,進行被轉印基板的蝕刻。 Alternatively, in the method of manufacturing a mold according to the present invention, it is preferable that the flange portion of the substrate to be transferred has a film containing a metal on at least a part of the surface of the flange portion, and the flange portion is formed on the film containing the metal. The configuration of the above droplets on the above. In this case, contrast can be imparted to the auxiliary mark by the difference in optical characteristics of the substrate to be transferred and the film containing the metal. Further, in this case, it is preferable that the film containing a metal has a fine uneven structure. Further, it is preferable that the land portion of the substrate to be transferred has a film containing a metal on the surface of the land portion, and after the etching, a curable resin or a film containing a metal is used as a mask to form a land portion. The film to be transferred is etched so that the metal-containing film is removed and the metal-containing film of the flange portion remains.
本發明的模具的特徵在於:其藉由如上述所記載的方法而製造。 The mold of the present invention is characterized in that it is produced by the method described above.
本發明的模具的製造方法中,特別是由於為表示輔助標記而在藉由液滴噴出法配置硬化性樹脂的液滴後,將經硬化的該硬化性樹脂作為遮罩進行蝕刻,因此即便是在欲對每個模具變更輔助標記的情況下,不僅可對液滴的配置部位進行設計變更,而且容易變更輔助標記。其結果是在具有輔助標記的凸台型模具的製造中,可靈活地應對輔助標記的變更,而且可更高效地製造。 In the method for producing a mold according to the present invention, in particular, since the droplet of the curable resin is placed by the droplet discharge method after the auxiliary mark is formed, the cured curable resin is etched as a mask, so that even When it is desired to change the auxiliary mark for each mold, not only the design change of the arrangement portion of the liquid droplet but also the auxiliary mark can be easily changed. As a result, in the manufacture of a boss type mold having an auxiliary mark, it is possible to flexibly cope with the change of the auxiliary mark and to manufacture it more efficiently.
1‧‧‧模具 1‧‧‧Mold
2、5a‧‧‧凸台部 2, 5a‧‧‧ boss
2s、3s、5c、5d‧‧‧上表面 2s, 3s, 5c, 5d‧‧‧ upper surface
3、5b‧‧‧凸緣部 3, 5b‧‧‧Flange
5‧‧‧被轉印基板 5‧‧‧Transferred substrate
6‧‧‧含有金屬的膜 6‧‧‧Metal-containing film
21、43a‧‧‧凹凸圖案 21, 43a‧‧‧ concave pattern
30‧‧‧輔助標記 30‧‧‧Auxiliary mark
31‧‧‧文字 31‧‧‧ text
32‧‧‧條碼 32‧‧‧ barcode
33‧‧‧符號 33‧‧‧ symbol
40‧‧‧噴墨頭 40‧‧‧Inkjet head
41、42‧‧‧液滴 41, 42‧‧‧ droplets
43‧‧‧原模 43‧‧‧ original model
44、45‧‧‧硬化性樹脂 44, 45‧‧‧ hardening resin
46‧‧‧蝕刻氣體 46‧‧‧etching gas
h‧‧‧階差 H‧‧‧step
圖1是表示具有微細的凹凸圖案與輔助標記的凸台型模具的例子的概略圖。 FIG. 1 is a schematic view showing an example of a boss type mold having a fine uneven pattern and an auxiliary mark.
圖2是表示識別標記的例子的概略圖。 FIG. 2 is a schematic view showing an example of an identification mark.
圖3是表示第1實施形態的模具的製造方法的步驟的概略剖面圖。 3 is a schematic cross-sectional view showing a procedure of a method of manufacturing a mold according to the first embodiment.
圖4是表示第2實施形態的模具的製造方法的步驟的概略剖面圖。 4 is a schematic cross-sectional view showing a procedure of a method of manufacturing a mold according to a second embodiment.
圖5是表示第2實施形態的設計變更的概略圖。 Fig. 5 is a schematic view showing a design change of the second embodiment.
圖6是表示第3實施形態的設計變更的概略圖。 Fig. 6 is a schematic view showing a design change of the third embodiment.
以下,使用圖式對本發明的實施形態進行說明,但本發明並不限定於此。另外,為了容易視認,圖式中的各構成要素的比例尺等與實物適當不同。 Hereinafter, embodiments of the present invention will be described using the drawings, but the present invention is not limited thereto. In addition, in order to make it easy to see, the scale of each component in a figure, etc. differs suitably from an actual thing.
「具有輔助標記的凸台型模具」 "Stud type die with auxiliary mark"
首先,對藉由本發明而得的模具進行簡單地說明。圖1是表示具有微細的凹凸圖案與輔助標記的凸台型模具的例子的概略圖。具體而言,圖1之A是模具1的俯視圖,圖1之B是模具1的正面圖。圖2是表示識別標記的例子的概略圖。 First, the mold obtained by the present invention will be briefly described. FIG. 1 is a schematic view showing an example of a boss type mold having a fine uneven pattern and an auxiliary mark. Specifically, A of FIG. 1 is a plan view of the mold 1, and FIG. 1B is a front view of the mold 1. FIG. 2 is a schematic view showing an example of an identification mark.
根據本發明的製造方法,製造例如如圖1般的凸台型模具1。模具1具有包含凸台部2及凸緣部3的凸台結構,凸台部2的上表面2s與凸緣部3的上表面3s相比,僅階差h部分變高(圖1之B)。並且,微細的凹凸圖案21形成於凸台部2的上表面2s,輔助標記形成於凸緣部3的上表面3s。 According to the manufacturing method of the present invention, a boss type mold 1 such as that shown in Fig. 1 is manufactured. The mold 1 has a boss structure including the boss portion 2 and the flange portion 3. The upper surface 2s of the boss portion 2 is higher in height than the upper surface 3s of the flange portion 3 (Fig. 1B) ). Further, the fine concavo-convex pattern 21 is formed on the upper surface 2s of the boss portion 2, and the auxiliary mark is formed on the upper surface 3s of the flange portion 3.
輔助標記是對準標記或識別標記等在使用模具1的奈米壓印中不成為轉印的對象而發揮輔助功能的圖案。對準標記是用以輔助壓印時的模具的位置調整的圖案,識別標記是用以識別管理各模具的圖案。識別標記例如藉由文字、圖形、符號、圖像、條碼、位元記錄圖案或這些的組合來表示模具的管理資訊。所謂管理資訊,例如為模具的製造編號、管理編號、製造條件(製造日、溫度、母盤種類)、規格(厚度、平坦度、平行度、凹凸圖案資訊、凹凸圖案配置座標)、使用歷程等。輔助標記可由1條以上的線構成,亦可如圖2般由多個點的排列而構成。例如圖1與圖2描繪包括由多個點構成的文字31、條碼32以及符號33的補助標記。另外,輔助標記的檢測可藉由目視觀察、顯微鏡觀察、雷射測量、使用電子計算機的圖像識別處理等而進行。 The auxiliary mark is a pattern in which an alignment function, such as an alignment mark or an identification mark, does not become a target of transfer in the nanoimprint using the mold 1. The alignment mark is a pattern for assisting in the positional adjustment of the mold at the time of imprinting, and the identification mark is a pattern for identifying each mold. The identification mark represents management information of the mold, for example, by words, figures, symbols, images, barcodes, bit record patterns, or a combination thereof. The management information is, for example, the manufacturing number of the mold, the management number, the manufacturing conditions (manufacturing date, temperature, master type), specifications (thickness, flatness, parallelism, concave-convex pattern information, coordinates of the concave-convex pattern), usage history, etc. . The auxiliary mark may be composed of one or more lines, or may be composed of a plurality of dots as shown in FIG. For example, FIGS. 1 and 2 depict a subsidy mark including a character 31, a bar code 32, and a symbol 33 composed of a plurality of points. Further, the detection of the auxiliary mark can be performed by visual observation, microscopic observation, laser measurement, image recognition processing using an electronic computer, or the like.
輔助標記可由凸緣部3的上表面3s自身的凹凸形狀來 表示,亦可由硬化性樹脂或金屬等與構成凸緣部3(或模具1)的材料不同的材料的圖案來表示。如此,藉由將與構成凸緣部3(或模具1)的材料不同的材料在凸緣部3的上表面3s上圖案化,而對比度提高,並容易地讀取資訊。輔助標記的結構單元的大小(例如每一文字、每一圖形的大小)並無特別限制,根據檢測方法在例如μm尺度~mm尺度的範圍內適當選擇。關於輔助標記的具體的形成方法,在後述的各實施形態中進行詳細地說明。 The auxiliary mark may be formed by the uneven shape of the upper surface 3s of the flange portion 3 itself. It is also shown that a curable resin, a metal, or the like is represented by a pattern of a material different from the material constituting the flange portion 3 (or the mold 1). As described above, by patterning a material different from the material constituting the flange portion 3 (or the mold 1) on the upper surface 3s of the flange portion 3, the contrast is improved, and information is easily read. The size of the structural unit of the auxiliary mark (for example, the size of each character and each figure) is not particularly limited, and is appropriately selected in the range of, for example, the μm scale to the mm scale according to the detection method. The specific formation method of the auxiliary mark will be described in detail in each embodiment to be described later.
另外,在不需要輔助標記時,可將該輔助標記除去。例如在輔助標記由硬化性樹脂表示時,可藉由氧氣灰化、紫外線(ultraviolet,UV)臭氧處理清洗、及酸或鹼的清洗,將輔助標記除去,在輔助標記由包含金屬的材料的圖案表示時,可藉由酸或鹼的清洗,將輔助標記除去。 In addition, the auxiliary mark can be removed when the auxiliary mark is not required. For example, when the auxiliary mark is represented by a curable resin, the auxiliary mark can be removed by oxygen ashing, ultraviolet (UV) ozone treatment cleaning, and acid or alkali cleaning, and the auxiliary mark is patterned by a material containing metal. When indicated, the auxiliary mark can be removed by washing with an acid or a base.
「第1實施形態」 "First embodiment"
對模具1的製造方法及藉由該方法製造的模具的第1實施形態進行說明。圖3是表示第1實施形態的模具的製造方法的步驟的概略剖面圖。 The first embodiment of the method for producing the mold 1 and the mold produced by the method will be described. 3 is a schematic cross-sectional view showing a procedure of a method of manufacturing a mold according to the first embodiment.
本實施形態的模具1的製造方法如圖3所示般,使用具有包含凸台部5a及凸緣部5b的凸台結構的被轉印基板5(圖3之A)、及包含噴墨頭40的噴墨裝置(省略圖示),藉由噴墨法,在凸台部5a上配置包含硬化性樹脂的多滴液滴41,並以如下方式在凸緣部5b上配置包含相同的硬化性樹脂的多滴液滴42,即配置於凸緣部5b上的多滴液滴42各自的高度低於凸台部5a的高度、且 配置於凸緣部5b上的多滴液滴42表示輔助標記30(圖3之B),在將原模43的凹凸圖案43a壓抵於配置於凸台部5a上的多滴液滴41的狀態下,使凸台部5a上的硬化性樹脂及凸緣部5b上的硬化性樹脂硬化(圖3之C),將經硬化的硬化性樹脂44及硬化性樹脂45作為遮罩,以成為將凸台部5a上的硬化性樹脂44除去且使凸緣部5b上的硬化性樹脂45殘存的狀態的方式,藉由蝕刻氣體46進行被轉印基板5的蝕刻(圖3之D及圖3之E)。該蝕刻結束後,例如可獲得如圖3之E所示的模具1(即原模43的複盤)。在本實施形態中,輔助標記30的視認性主要藉由殘存於凸緣部5b上的硬化性樹脂45而達成。 As shown in FIG. 3, the method of manufacturing the mold 1 of the present embodiment uses a transfer substrate 5 (A of FIG. 3) having a boss structure including a boss portion 5a and a flange portion 5b, and an ink jet head. In an inkjet apparatus (not shown) of 40, a plurality of droplets 41 containing a curable resin are placed on the boss portion 5a by an inkjet method, and the same hardening is disposed on the flange portion 5b as follows. The plurality of droplets 42 of the resin, that is, the heights of the plurality of droplets 42 disposed on the flange portion 5b are lower than the height of the land portion 5a, and The plurality of droplets 42 disposed on the flange portion 5b indicate the auxiliary marks 30 (B of FIG. 3), and the concave-convex pattern 43a of the original mold 43 is pressed against the plurality of droplets 41 disposed on the boss portion 5a. In the state, the curable resin on the boss portion 5a and the curable resin on the flange portion 5b are cured (C in FIG. 3), and the cured curable resin 44 and the curable resin 45 are used as a mask to become The removal of the curable resin 44 on the boss portion 5a and the state in which the curable resin 45 on the flange portion 5b remains, the etching of the transferred substrate 5 is performed by the etching gas 46 (D and FIG. 3) 3 of E). After the etching is completed, for example, the mold 1 as shown in FIG. 3 (i.e., the reed of the master mold 43) can be obtained. In the present embodiment, the visibility of the auxiliary mark 30 is mainly achieved by the curable resin 45 remaining on the flange portion 5b.
(被轉印基板) (transferred substrate)
被轉印基板5是成為模具1的基礎的基板。本發明中,為了製造凸台型模具1,而在被轉印基板5上預先形成具有凸台部5a及凸緣部5b的凸台結構。藉由該凸台結構,在利用原模43的壓印時(圖3之C),僅配置於被轉印基板5的凸台部5a的液滴41與原模43接觸,而避免配置於凸緣部5b的液滴42與原模43的接觸。凸台部5a的階差h較佳為1μm~1000μm,更佳為10μm~500μm,尤佳為20μm~100μm。其原因是,在階差h低於配置於凸緣部5b的液滴42的高度(若考慮到通常的液滴量,則約為500nm~數μm)時,有可能該液滴42與原模43接觸而污染原模43。另一方面原因是,在階差h過高時,噴墨頭40的液滴噴出口與凸緣部上表面5d的距離擴大,因此液滴配置精度變差。關於 被轉印基板5的形狀,例如在模具1用於資訊記錄媒體的製造時,為圓板狀。 The substrate to be transferred 5 is a substrate that serves as a basis of the mold 1. In the present invention, in order to manufacture the boss type mold 1, a boss structure having a boss portion 5a and a flange portion 5b is formed in advance on the substrate 5 to be transferred. According to the boss structure, only the droplets 41 disposed on the land portion 5a of the substrate 5 to be transferred are brought into contact with the master mold 43 at the time of imprinting by the master mold 43 (C in FIG. 3), and the arrangement is prevented. The droplets 42 of the flange portion 5b are in contact with the master mold 43. The step h of the land portion 5a is preferably from 1 μm to 1000 μm, more preferably from 10 μm to 500 μm, still more preferably from 20 μm to 100 μm. The reason is that when the step h is lower than the height of the droplets 42 disposed on the flange portion 5b (about 500 nm to several μm in consideration of the normal amount of droplets), the droplet 42 may be original. The mold 43 contacts and contaminates the master mold 43. On the other hand, when the step h is too high, the distance between the droplet discharge port of the inkjet head 40 and the upper surface 5d of the flange portion is increased, and thus the droplet placement accuracy is deteriorated. on The shape of the substrate 5 to be transferred is, for example, a disk shape when the mold 1 is used for the production of an information recording medium.
在硬化性樹脂為光硬化性者,且原模為矽(Si)等而不具有透光性時,為了可對硬化性樹脂曝光,較佳為被轉印基板5為石英基板。石英基板具有透光性,若厚度為0.3mm以上,則並無特別限制,可根據目的而適當選擇。例如作為被轉印基板5,可列舉:藉由矽烷偶合劑等密接層被覆石英基板表面者,或在石英基板上積層包含Cr、W、Ti、Ni、Ag、Pt、Au等的金屬膜者,或在石英基板上積層包含CrO2、WO2、TiO2等的金屬氧化膜者,或藉由矽烷偶合劑等密接層被覆上述積層體的表面者等。另外,在本實施形態中,對被轉印基板5不具有上述金屬膜或金屬氧化膜等含有金屬的膜的情形進行說明。在第2實施形態及第3實施形態中對被轉印基板5具有含有金屬的膜的情形進行說明。密接層並非必須,但為了提高硬化性樹脂與被轉印基板5的密接性而適當使用。密接層只要至少形成於凸台部5a的圖案形成區域(形成凹凸圖案的區域)即可。 When the curable resin is photocurable, and the original mold is bismuth (Si) or the like and does not have translucency, the substrate 5 to be transferred is preferably a quartz substrate in order to expose the curable resin. The quartz substrate has a light transmissive property, and is not particularly limited as long as it has a thickness of 0.3 mm or more, and can be appropriately selected depending on the purpose. For example, the transfer substrate 5 may be a surface of a quartz substrate coated with an adhesion layer such as a decane coupling agent, or a metal film containing Cr, W, Ti, Ni, Ag, Pt, Au, or the like laminated on a quartz substrate. Or a metal oxide film containing CrO 2 , WO 2 , TiO 2 or the like is laminated on a quartz substrate, or a surface of the laminate is coated with an adhesion layer such as a decane coupling agent. In the present embodiment, a case where the substrate 5 to be transferred does not have a metal-containing film such as the above metal film or metal oxide film will be described. In the second embodiment and the third embodiment, a case where the transfer target substrate 5 has a film containing a metal will be described. The adhesion layer is not necessarily required, but is used in order to improve the adhesion between the curable resin and the substrate 5 to be transferred. The adhesion layer may be formed at least in the pattern formation region (the region in which the uneven pattern is formed) of the boss portion 5a.
另外,上述「具有透光性」具體是指,以自形成有硬化性樹脂的膜的一個面出射的方式而自基板的另一個面入射光時,硬化性樹脂會充分地硬化,並且是指至少波長為200nm以上的光自上述另一個面向上述一個面的透射率為5%以上。 In addition, the above-mentioned "translucent" means that the curable resin is sufficiently hardened when light is incident from the other surface of the substrate so as to be emitted from one surface of the film on which the curable resin is formed, and means The transmittance of light having a wavelength of at least 200 nm or more from the other surface to the one surface is 5% or more.
石英基板的厚度通常較佳為0.3mm以上。原因是,在厚度為0.3mm以下時,藉由操作或壓印中的按壓而容易破損。 The thickness of the quartz substrate is usually preferably 0.3 mm or more. The reason is that when the thickness is 0.3 mm or less, it is easily broken by pressing in operation or imprinting.
另一方面,在原模43為石英等而具有透光性時,關於被轉印基板5的結構、材料,並無特別限制,可根據目的進行適當選擇。在被轉印基板5中,若結構為凸台結構,則可為單層結構,亦可為積層結構。作為材料,可自作為基板材料而公知者中適當選擇,例如可列舉:矽、鎳、鋁、玻璃、樹脂等。這些基板材料可單獨使用1種,亦可併用2種以上。被轉印基板5可為適當合成者,亦可使用市售品。另外,亦可為藉由矽烷偶合劑被覆表面者。 On the other hand, when the master mold 43 is made of quartz or the like and has light transmissivity, the structure and material of the substrate 5 to be transferred are not particularly limited, and may be appropriately selected depending on the purpose. In the substrate 5 to be transferred, if the structure is a boss structure, it may have a single layer structure or a laminated structure. The material can be appropriately selected from those known as the substrate material, and examples thereof include ruthenium, nickel, aluminum, glass, and resin. These substrate materials may be used alone or in combination of two or more. The substrate to be transferred 5 may be a suitable one or a commercially available product. Alternatively, the surface may be coated with a decane coupling agent.
作為被轉印基板5的厚度(凸台部的整體的厚度),並無特別限制,可根據目的而適當選擇,較佳為0.05mm以上,更佳為0.1mm以上。若基板的厚度小於0.05mm,則有可能在壓印時在基板側產生撓曲,而無法確保均勻的密接狀態。 The thickness of the substrate 5 to be transferred (the thickness of the entire land portion) is not particularly limited, and may be appropriately selected depending on the purpose, and is preferably 0.05 mm or more, and more preferably 0.1 mm or more. If the thickness of the substrate is less than 0.05 mm, there is a possibility that deflection occurs on the substrate side at the time of imprinting, and a uniform adhesion state cannot be ensured.
(硬化性樹脂) (curable resin)
硬化性樹脂並無特別限制,在本實施形態中,例如可使用在聚合性化合物中添加光聚合起始劑(2質量%左右)、氟單體(0.1質量%~1質量%)而製備的材料。 The curable resin is not particularly limited, and in the present embodiment, for example, a photopolymerization initiator (about 2% by mass) or a fluoromonomer (0.1% by mass to 1% by mass) may be added to the polymerizable compound. material.
另外,亦可根據需要添加抗氧化劑(1質量%左右)。根據上述順序製作的材料例如可藉由波長為360nm的紫外光而硬化。關於溶解性差者,較佳為添加少量丙酮或乙酸乙酯使其溶解後,將溶劑蒸餾除去。 Further, an antioxidant (about 1% by mass) may be added as needed. The material produced according to the above sequence can be hardened, for example, by ultraviolet light having a wavelength of 360 nm. In the case of poor solubility, it is preferred to dissolve the solvent by adding a small amount of acetone or ethyl acetate to dissolve it.
作為上述聚合性化合物,除了丙烯酸苄酯(Viscoat(註冊商標)#160:大阪有機化學股份有限公司製造)、乙基卡必醇丙 烯酸酯(Viscoat(註冊商標)#190:大阪有機化學股份有限公司製造)、聚丙二醇二丙烯酸酯(ARONIX(註冊商標)M-220:東亞合成股份有限公司製造)、三羥甲基丙烷環氧丙烷(Propylene Oxide,PO)改質三丙烯酸酯(ARONIX(註冊商標)M-310:東亞合成股份有限公司製造)等外,可列舉:下述結構式1所示的化合物A等。 As the above polymerizable compound, in addition to benzyl acrylate (Viscoat (registered trademark) #160: manufactured by Osaka Organic Chemical Co., Ltd.), ethyl carbitol Polyester (Viscoat (registered trademark) #190: manufactured by Osaka Organic Chemical Co., Ltd.), polypropylene glycol diacrylate (ARONIX (registered trademark) M-220: manufactured by Toagosei Co., Ltd.), trimethylolpropane ring In the case of propylene oxide (Propylene Oxide, PO) modified triacrylate (ARONIX (registered trademark) M-310: manufactured by Toagosei Co., Ltd.), etc., the compound A represented by the following structural formula 1 etc. are mentioned.
另外,作為上述聚合起始劑,可列舉:2-(二甲基胺基)-2-[(4-甲基苯基)甲基]-1-[4-(4-嗎啉基)苯基]-1-丁酮(IRGACURE(註冊商標)379:豐田通商化工(Toyotsu Chemiplas)股份有限公司製造)等烷基苯酮系光聚合起始劑。 Further, examples of the polymerization initiator include 2-(dimethylamino)-2-[(4-methylphenyl)methyl]-1-[4-(4-morpholinyl)benzene. Alkylphenone-based photopolymerization initiator such as I-butyl ketone (IRGACURE (registered trademark) 379: manufactured by Toyotsu Chemiplas Co., Ltd.).
另外,作為上述氟單體,可列舉:下述結構式2所示的化合物B等。 In addition, examples of the fluoromonomer include Compound B represented by the following Structural Formula 2.
結構式2:
例如,硬化性樹脂的黏度為8cP~20cP,硬化性樹脂的表面能為25mN/m~35mN/m。此處,硬化性樹脂的黏度是使用RE-80L型旋轉黏度計(東機產業股份有限公司製造)在25℃±0.2℃下測定的值。關於測定時的旋轉速度,在黏度為0.5cP以上、小於5cP時,設為100rpm,在黏度為5cP以上、小於10cP時,設為50rpm,在黏度為10cP以上、小於30cP時,設為20rpm,在黏度為30cP以上、小於60cP時,設為10rpm。另外,硬化性樹脂的表面能是使用“紫外線奈米壓印材料:表面能、殘餘層、與壓印品質(UV nanoimprint materials:Surface energies,residual layers,and imprint quality)”,施密特等,真空科學與技術雜誌B輯,第25卷、第3期、第785頁-第790頁、2007年(H.Schmitt et al.,J.Vac.Sci.Technol.B,Vol.25,Issue 3,pp.785-790,2007)所記載的方法。具體而言,分別求出經UV臭氧處理的矽基板、與藉由OPTOOL(註冊商標)DSX(大金(DAIKIN)股份有限公司製造)進行表面處理的矽基板的表面能,根據硬化性樹脂相對於兩基板的接觸角而算出硬化性樹脂的表面能。 For example, the curable resin has a viscosity of 8 cP to 20 cP, and the curable resin has a surface energy of 25 mN/m to 35 mN/m. Here, the viscosity of the curable resin is a value measured at 25 ° C ± 0.2 ° C using a RE-80L type rotational viscometer (manufactured by Toki Sangyo Co., Ltd.). The rotation speed at the time of measurement is 100 rpm when the viscosity is 0.5 cP or more and less than 5 cP, and 50 rpm when the viscosity is 5 cP or more and less than 10 cP, and 20 rpm when the viscosity is 10 cP or more and less than 30 cP. When the viscosity is 30 cP or more and less than 60 cP, it is set to 10 rpm. In addition, the surface energy of the curable resin is "UV nanoimprint materials: surface energies, residual layers, and imprint quality", Schmidt, etc., vacuum Journal of Science and Technology, Series B, Vol. 25, No. 3, p. 785 - p. 790, 2007 (H. Schmitt et al., J. Vac. Sci. Technol. B, Vol. 25, Issue 3, The method described in pp. 785-790, 2007). Specifically, the surface energy of the ruthenium substrate treated with the UV ozone treatment and the ruthenium substrate surface-treated with OPTOOL (registered trademark) DSX (manufactured by Daikin (DAIKIN) Co., Ltd.) was determined, and the curable resin was used. The surface energy of the curable resin was calculated from the contact angle of the two substrates.
配置於凸台部5a上的硬化性樹脂與配置於凸緣部5b上的硬化性樹脂,可為相互相同的材料,亦可為不同的材料。 The curable resin disposed on the boss portion 5a and the curable resin disposed on the flange portion 5b may be the same material or different materials.
(包含硬化性樹脂的液滴的配置方法) (Method of arranging droplets containing curable resin)
作為包含硬化性樹脂的液滴的配置方法,使用噴墨法或分配法等可將特定量的液滴配置於被轉印基板5上的特定位置的液滴噴出法。在基板5上配置液滴時,可根據所期望的液滴量(所配置的每一滴液滴的量),而分開使用噴墨印表機或分配器。例如在液滴量小於100nl時,使用噴墨印表機,在液滴量為100nl以上時,有使用分配器等的方法。另外,本實施形態中使用噴墨法。 As a method of disposing the droplets containing the curable resin, a droplet discharge method in which a specific amount of droplets can be placed at a specific position on the substrate 5 to be transferred can be used by an inkjet method or a dispensing method. When droplets are disposed on the substrate 5, the ink jet printer or dispenser can be used separately depending on the desired amount of droplets (the amount of droplets dispensed per droplet). For example, when the amount of liquid droplets is less than 100 nl, an ink jet printer is used, and when the amount of liquid droplets is 100 nl or more, a method using a dispenser or the like is used. Further, in the present embodiment, an inkjet method is used.
將液滴自噴嘴噴出的噴墨頭40可列舉:壓電方式、熱方式、靜電方式等。這些中,較佳為可調整液滴量或噴出速度的壓電方式。在基板5上配置液滴前,預先調整液滴量或噴出速度。例如較佳為在與原模43的凹凸圖案的空間體積大的區域相對應的基板5上的位置使液滴量增多、或者在與原模43的凹凸圖案的空間體積小的區域相對應的基板5上的位置使液滴量減小而進行調整。此種調整可根據液滴的噴出量(噴出時的每一滴液滴的量)進行適當控制。例如,在使用噴出量為1pl的噴墨頭將液滴量設定為5pl時,對相同部位噴出5次而控制液滴量。液滴量例如藉由以下方式求出:藉由共焦點顯微鏡等測定事先在相同條件下噴出至基板5(或同質的其他基板)上的液滴的立體形狀,根據該形狀計算體積。 Examples of the ink jet head 40 that ejects droplets from a nozzle include a piezoelectric method, a thermal method, and an electrostatic method. Among these, a piezoelectric method in which the amount of droplets or the ejection speed can be adjusted is preferable. Before the liquid droplets are placed on the substrate 5, the amount of liquid droplets or the discharge speed is adjusted in advance. For example, it is preferable that the position on the substrate 5 corresponding to the region where the spatial volume of the concave-convex pattern of the original mold 43 is large increases the amount of liquid droplets or corresponds to a region where the spatial volume of the concave-convex pattern of the original mold 43 is small. The position on the substrate 5 is adjusted so that the amount of liquid droplets is reduced. Such adjustment can be appropriately controlled in accordance with the discharge amount of the droplets (the amount of droplets per droplet at the time of ejection). For example, when the amount of liquid droplets is set to 5 pl using an ink jet head having a discharge amount of 1 pl, the same portion is discharged five times to control the amount of liquid droplets. The amount of liquid droplets is obtained, for example, by measuring the three-dimensional shape of droplets previously ejected onto the substrate 5 (or other homogeneous substrate) under the same conditions by a confocal microscope or the like, and calculating the volume based on the shape.
以上述方式調整液滴量後,根據特定液滴配置圖案,在 被轉印基板5上配置液滴。液滴配置圖案包含含有與液滴配置相對應的格子點群的二維座標資訊。該液滴配置圖案是根據壓印條件及輔助標記的形狀或大小而設計。 After adjusting the amount of droplets in the above manner, according to the specific droplet arrangement pattern, Droplets are placed on the substrate 5 to be transferred. The droplet arrangement pattern includes two-dimensional coordinate information including a lattice point group corresponding to the droplet configuration. The droplet arrangement pattern is designed according to the imprint condition and the shape or size of the auxiliary mark.
在凸緣部5b上的液滴42的配置以如下方式進行:配置於凸緣部5b上的多滴液滴42各自的高度低於凸台部5a的高度、且配置於凸緣部5b上的多滴液滴42表示輔助標記。藉由多滴液滴42各自的高度低於凸台部5a的高度,而在藉由原模43的壓印時,可防止液滴42附著於原模43。在原模43亦具有凸台結構時,一般認為液滴42附著於原模43的可能性降低。然而,例如為了調整位置而進行原模43的平行移動(與被轉印基板5的距離保持固定的移動)時,會遺留此種液滴的附著的問題。因此,不論原模43的形狀如何,如本發明般較佳為多滴液滴42各自的高度低於凸台部5a的高度。另外,在本發明中,由於由多滴液滴42表示輔助標記30的形狀,因此可藉由變更液滴的配置而靈活地變更輔助標記30。 The arrangement of the droplets 42 on the flange portion 5b is performed such that the heights of the plurality of droplets 42 disposed on the flange portion 5b are lower than the height of the boss portion 5a and are disposed on the flange portion 5b. A plurality of droplets 42 represent auxiliary marks. By the height of each of the plurality of droplets 42 being lower than the height of the land portion 5a, the droplet 42 can be prevented from adhering to the master 43 when imprinted by the master 43. When the master mold 43 also has a boss structure, it is generally considered that the possibility that the liquid droplets 42 adhere to the master mold 43 is lowered. However, for example, in order to adjust the position and perform the parallel movement of the master mold 43 (the movement fixed to the distance from the substrate 5 to be transferred), the problem of adhesion of such droplets remains. Therefore, regardless of the shape of the original mold 43, as in the present invention, it is preferable that the height of each of the plurality of droplets 42 is lower than the height of the land portion 5a. Further, in the present invention, since the shape of the auxiliary mark 30 is indicated by a plurality of droplets 42, the auxiliary mark 30 can be flexibly changed by changing the arrangement of the liquid droplets.
如上所述般,輔助標記可由多滴液滴結合的線來表示,亦可由液滴(點)的排列來表示。另外,實際上,由於經過蝕刻步驟,因此亦有由液滴表示的輔助標記的形狀與最終的輔助標記30的形狀未必一致的情況。即,最終的輔助標記30的線變細或點變小。因此,在由液滴表示輔助標記時,考慮到上述情況,為了藉由蝕刻步驟而不損害輔助標記30的資訊傳遞功能,例如必須增加液滴量或使線變粗。 As described above, the auxiliary mark can be represented by a line in which a plurality of droplets are combined, or can be represented by an arrangement of droplets (dot). Further, actually, since the etching step is performed, the shape of the auxiliary mark indicated by the liquid droplets may not necessarily coincide with the shape of the final auxiliary mark 30. That is, the line of the final auxiliary mark 30 becomes thinner or the dots become smaller. Therefore, in the case where the auxiliary mark is represented by the liquid droplet, in consideration of the above, in order to prevent the information transfer function of the auxiliary mark 30 by the etching step, for example, it is necessary to increase the amount of liquid droplets or thicken the line.
在凸台部5a上的液滴配置與在凸緣部5b的液滴配置可同時進行,亦可分別進行。此處,所謂「同時」進行這些液滴配置,是指在噴墨頭等液滴噴出部的單程掃描內,進行在凸台部5a上的液滴配置與在凸緣部5b上的液滴配置,所謂「分別」進行這些液滴配置,是指在液滴噴出部的掃描移動中,僅進行在凸台部5a上的液滴配置的掃描與僅進行在凸緣部5b的液滴配置的掃描完全分開。而且,亦可使用互不相同的噴墨頭進行這些各液滴配置。然而,關於分別在凸台部5a及凸緣部5b上的液滴配置,若使用不同的硬化性樹脂及不同的噴墨頭,則液滴配置所需要的時間增加,因此最佳為使用相同的硬化性樹脂及相同的噴墨頭同時進行液滴配置。 The arrangement of the droplets on the boss portion 5a and the arrangement of the droplets in the flange portion 5b can be performed simultaneously or separately. Here, the fact that the droplets are arranged at the same time means that the droplets are arranged on the boss portion 5a and the droplets on the flange portion 5b in one-way scanning of the droplet discharge portion such as the ink jet head. In the arrangement, the "separate" arrangement of the droplets means that only the scanning of the droplet arrangement on the boss portion 5a and the droplet placement only in the flange portion 5b are performed during the scanning movement of the droplet discharge portion. The scans are completely separate. Moreover, these respective droplet configurations can also be performed using ink jet heads different from each other. However, in the arrangement of the droplets on the boss portion 5a and the flange portion 5b, if different curable resins and different ink jet heads are used, the time required for droplet placement increases, so it is preferable to use the same The curable resin and the same ink jet head simultaneously perform droplet arrangement.
本發明中,就提高輔助標記30的視認性的觀點而言,較佳為以如下方式進行上述多滴液滴的配置:配置於凸緣部5b上的每一滴液滴的液滴42與凸緣部5b的接觸面積(即凸緣部5b的上表面5d中1滴液滴42所接觸的區域的面積的平均值),大於配置於凸台部5a上的每一滴液滴的液滴41與凸台部5a的接觸面積(即凸台部5a的上表面5c中1滴液滴41所接觸的區域的面積的平均值)。其原因在於以下理由。作為液滴配置的單純的方法,認為有:除去液滴配置圖案,在完全相同的條件(例如液滴的材料、噴出量、液滴量、表面能等)下,進行在凸台部5a上的液滴配置與在凸緣部5b上的液滴配置的方法。但在凸台部5a上的液滴配置的條件大多由與藉由原模43的壓印的關係確定,因此在實施此 種方法時,在凸緣部5b上的液滴配置的條件必然從屬於在凸台部5a上的液滴配置的條件。然而,在凸台部5a上的液滴配置中,就防止壓印時的硬化性樹脂膜的未填充缺陷的觀點而言,要求高密度地配置小的液滴。因此,若使在凸緣部5b上的液滴配置的條件從屬於在凸台部5a上的液滴配置的條件,則有可能產生線僅可表示細的輔助標記的問題。這會對完成體的模具1的輔助標記30的視認性造成大的影響。因此,就提高輔助標記30的視認性的觀點而言,作為1個標準,使凸緣部5b上的液滴42的接觸面積大於凸台部5a上的液滴41的接觸面積。 In the present invention, from the viewpoint of improving the visibility of the auxiliary mark 30, it is preferable to arrange the plurality of droplets in such a manner that the droplets 42 and the droplets of each droplet disposed on the flange portion 5b are convex. The contact area of the edge portion 5b (that is, the average value of the area of the region where the one droplet 42 is in contact with the upper surface 5d of the flange portion 5b) is larger than the droplet 41 of each droplet disposed on the boss portion 5a. The contact area with the boss portion 5a (that is, the average value of the area of the region where one drop of the liquid droplet 41 is in the upper surface 5c of the boss portion 5a). The reason is the following reasons. As a simple method of arranging droplets, it is considered that the droplet arrangement pattern is removed, and the projections are formed on the boss portion 5a under the same conditions (for example, material of the droplet, amount of discharge, amount of droplets, surface energy, etc.). The droplet arrangement is arranged with the droplets on the flange portion 5b. However, the condition of the droplet arrangement on the land portion 5a is mostly determined by the relationship with the imprint by the master mold 43, so that this is implemented. In the case of the method, the condition of the droplet arrangement on the flange portion 5b is necessarily subject to the condition of the droplet arrangement on the boss portion 5a. However, in the liquid droplet arrangement on the boss portion 5a, it is required to arrange small droplets at a high density from the viewpoint of preventing unfilled defects of the curable resin film at the time of imprinting. Therefore, if the condition for arranging the droplets on the flange portion 5b is subject to the condition of the droplets disposed on the boss portion 5a, there is a possibility that the line can represent only the fine auxiliary marks. This has a large influence on the visibility of the auxiliary mark 30 of the mold 1 of the finished body. Therefore, from the viewpoint of improving the visibility of the auxiliary mark 30, the contact area of the liquid droplets 42 on the flange portion 5b is made larger than the contact area of the liquid droplets 41 on the boss portion 5a as one standard.
另外,所謂每一滴液滴的液滴的接觸面積,是指該液滴為單獨的狀態(即,未與其他液滴結合的狀態)的接觸面積。因此,在由多滴液滴結合的線表示輔助標記的形狀時,上述接觸面積是指假定為上述單獨的狀態時的接觸面積,這可藉由事先的試驗進行確認。另外,在對相同的部位噴出多次液滴時,可將其整體考慮為1滴液滴。 In addition, the contact area of the droplet of each drop of droplets means the contact area of the droplet in a single state (that is, a state in which it is not combined with other droplets). Therefore, when the line in which the plurality of droplets are combined indicates the shape of the auxiliary mark, the contact area refers to the contact area when the individual state is assumed, which can be confirmed by a prior test. Further, when a plurality of droplets are ejected to the same portion, the whole can be considered as one droplet.
作為以上述方式增大凸緣部5b上的液滴42的接觸面積的方法,例如可列舉:使配置於凸緣部5b上的每一滴液滴的液滴量多於配置於凸台部5a上的每一滴液滴的液滴量的方法。另外,關於液滴量的調整方法,如上所述。或者藉由使用凸緣部上表面5d對於凸緣部5b上的液滴42的潤濕性大於凸台部上表面5c對於凸台部5a上的液滴41的潤濕性的被轉印基板5,亦可以上述方式增大液滴42的接觸面積。原因是,潤濕性大(即,凸緣部上表面 5d的表面能大、或液滴的接觸角小)者,即便是相同的液滴量,藉由濕潤擴散的效果而接觸面積亦擴大。例如可藉由僅在凸緣部5b實施UV臭氧處理、或形成與硬化性樹脂的親和性高的薄膜(例如有機分子膜)等的表面處理方法,而增大凸緣部5b的上述潤濕性。 As a method of increasing the contact area of the liquid droplets 42 on the flange portion 5b in the above-described manner, for example, the amount of droplets of each droplet disposed on the flange portion 5b is larger than that of the boss portion 5a. A method of the amount of droplets per drop of droplets. In addition, the method of adjusting the amount of liquid droplets is as described above. Or a substrate to be transferred which is more wettable to the liquid droplets 42 on the flange portion 5b by using the flange portion upper surface 5d than the upper surface 5c of the boss portion on the droplets 41 on the boss portion 5a. 5. The contact area of the droplets 42 can also be increased in the above manner. The reason is that the wettability is large (ie, the upper surface of the flange portion) In the case where the surface energy of 5d is large or the contact angle of the droplets is small, even if the same amount of liquid droplets, the contact area is enlarged by the effect of wet diffusion. For example, the above-described wetting of the flange portion 5b can be increased by performing a UV treatment on the flange portion 5b or a surface treatment method such as forming a film (for example, an organic molecular film) having high affinity with the curable resin. Sex.
而且,就以肉眼簡易地確認輔助標記的觀點而言,較佳為以連同液滴在內的液滴42與凸緣部5b的接觸面的寬度(用圓近似該接觸面時的其直徑)為50μm~500μm的方式,進行在凸緣部5b上的液滴42的配置。 Further, from the viewpoint of easily confirming the auxiliary mark with the naked eye, it is preferable that the width of the contact surface of the liquid droplet 42 and the flange portion 5b together with the liquid droplet (the diameter when the contact surface is approximated by a circle) The arrangement of the droplets 42 on the flange portion 5b is performed in a manner of 50 μm to 500 μm.
另一方面,亦有效的是以配置於凸緣部5b上的液滴42的高度大於配置於凸台部5a上的液滴41的高度的方式,進行液滴配置。液滴高度亦可藉由變更被轉印基板5的潤濕性(表面能)或液滴量來控制。例如,若提高凸台部上表面5c的表面能,則潤濕性提高,液滴高度變小。為了提高表面能,而有藉由UV臭氧處理等僅對凸台部5a的表面進行活化的方法、或者僅在凸台部5a的表面製作與硬化性樹脂的親和性高的薄膜(例如有機分子膜)的方法。另外,亦可藉由增加配置於凸緣部5b上的液滴42的液滴量,來提高液滴42的高度。 On the other hand, it is also effective to arrange the liquid droplets so that the height of the liquid droplets 42 disposed on the flange portion 5b is larger than the height of the liquid droplets 41 disposed on the boss portion 5a. The droplet height can also be controlled by changing the wettability (surface energy) or the amount of droplets of the substrate 5 to be transferred. For example, when the surface energy of the upper surface 5c of the boss portion is increased, the wettability is improved and the droplet height is reduced. In order to increase the surface energy, there is a method of activating only the surface of the land portion 5a by UV ozone treatment or the like, or a film having high affinity with the curable resin (for example, organic molecules) is formed only on the surface of the land portion 5a. Membrane) method. Further, the height of the liquid droplets 42 can be increased by increasing the amount of droplets of the liquid droplets 42 disposed on the flange portion 5b.
在凸台部5a及凸緣部5b進行互不相同的表面處理時,較佳為藉由表面保護帶保護任一表面的方法。表面保護帶若為市售的半導體晶圓用保護帶,則並無特別限制。由於有剝離表面保護帶時的糊劑殘留的擔心,因此與貼附於進行壓印的凸台部5a上 相比,更佳為在凸緣部5b貼附表面保護帶的方法。在局部地貼附表面保護帶的狀態下,藉由UV臭氧清潔法、旋塗法、浸塗法、噴霧塗佈法、蒸鍍法等方法,將未保護的部分進行表面處理。表面處理後,將表面保護帶剝離,藉此成為在凸台部5a及凸緣部5b進行不同的表面處理的狀態。 When the boss portion 5a and the flange portion 5b are subjected to surface treatment different from each other, it is preferable to protect any surface by a surface protection tape. The surface protection tape is not particularly limited as long as it is a commercially available protective tape for a semiconductor wafer. Since there is a fear of residual paste when the surface protection tape is peeled off, it is attached to the boss portion 5a to be embossed. In comparison, a method of attaching a surface protective tape to the flange portion 5b is more preferable. The unprotected portion is subjected to surface treatment by a method such as a UV ozone cleaning method, a spin coating method, a dip coating method, a spray coating method, or a vapor deposition method in a state where the surface protective tape is partially attached. After the surface treatment, the surface protective tape is peeled off, whereby the surface of the boss portion 5a and the flange portion 5b are subjected to different surface treatments.
(原模) (original model)
本實施形態中所使用的原模43例如可藉由以下順序製造。首先,在矽基材上藉由旋塗等塗佈以聚羥基苯乙烯(polyhydroxy styrene,PHS)系化學增幅型抗蝕劑、酚醛清漆系抗蝕劑、聚甲基丙烯酸甲酯(Poly(methyl methacrylate),PMMA)等丙烯酸系樹脂等為主成分的抗蝕劑液,而形成抗蝕劑層。然後,與所期望的凹凸圖案對應地一邊進行調變一邊對矽基材照射雷射光(或電子束),而在抗蝕劑層表面將凹凸圖案曝光。然後,對抗蝕劑層進行顯影處理,將除去後的抗蝕劑層的圖案作為遮罩,藉由反應性離子蝕刻(Reactive Ion Etching,RIE)等進行選擇蝕刻,而獲得具有特定凹凸圖案的矽模具。 The master mold 43 used in the present embodiment can be manufactured, for example, in the following order. First, a polyhydroxy styrene (PHS)-based chemical amplification resist, a novolac-based resist, and a polymethyl methacrylate (Poly(methyl) are coated on a crucible substrate by spin coating or the like. A resist liquid containing a main component such as an acrylic resin such as methacrylate or PMMA) forms a resist layer. Then, the ruthenium substrate is irradiated with laser light (or an electron beam) while being modulated in accordance with a desired concave-convex pattern, and the concave-convex pattern is exposed on the surface of the resist layer. Then, the resist layer is subjected to development processing, and the pattern of the removed resist layer is used as a mask, and selective etching is performed by reactive ion etching (RIE) or the like to obtain a crucible having a specific concavo-convex pattern. Mold.
另外,本實施形態中,對使用矽模具的情形進行說明,但原模43並不限定於此,亦可使用石英模具。此時,石英模具可藉由與上述矽模具的製造法相同的方法、或上述矽模具的複製方法等而製造。另外,原模43亦可具有凸台結構。 Further, in the present embodiment, a case where a boring mold is used will be described, but the original mold 43 is not limited thereto, and a quartz mold may be used. At this time, the quartz mold can be produced by the same method as the above-described method for producing a tantalum mold, or the above-described method of copying a tantalum mold. In addition, the master mold 43 may have a boss structure.
原模43的凹凸圖案43a的形狀並無特別限定,可根據奈米壓印的用途而適當選擇。例如典型的圖案為線與間隙(line and space)圖案。並且,線與間隙圖案的凸部的長度、凸部的寬度、凸部彼此的間隔及凸部距離凹部底面的高度(凹部的深度)可適當設定。例如凸部的寬度為10nm~100nm、更佳為20nm~70nm,凸部彼此的間隔為10nm~500nm、更佳為20nm~100nm,凸部的高度為10nm~500nm、更佳為30nm~100nm。另外,構成凹凸圖案43a的凸部的形狀可為其他的如具有矩形、圓及橢圓等剖面的點排列而成的形狀。 The shape of the uneven pattern 43a of the original mold 43 is not particularly limited, and can be appropriately selected depending on the use of the nanoimprint. For example, typical patterns are lines and gaps (line and Space) pattern. Further, the length of the convex portion of the line and gap pattern, the width of the convex portion, the interval between the convex portions, and the height of the convex portion from the bottom surface of the concave portion (the depth of the concave portion) can be appropriately set. For example, the width of the convex portion is 10 nm to 100 nm, more preferably 20 nm to 70 nm, the interval between the convex portions is 10 nm to 500 nm, more preferably 20 nm to 100 nm, and the height of the convex portion is 10 nm to 500 nm, and more preferably 30 nm to 100 nm. Further, the shape of the convex portion constituting the concave-convex pattern 43a may be another shape in which dots having a cross section such as a rectangle, a circle, and an ellipse are arranged.
(脫模劑) (release agent)
本發明中,為了提高硬化性樹脂與原模43的脫模性,較佳為對原模43的表面進行脫模處理。作為脫模處理所使用的脫模劑,作為氟系矽烷偶合劑,可列舉:大金工業股份有限公司製造的OPTOOL(註冊商標)DSX、或住友3M股份有限公司製造的Novec(註冊商標)EGC-1720等。 In the present invention, in order to improve the mold release property of the curable resin and the master mold 43, it is preferred to perform a mold release treatment on the surface of the master mold 43. The release agent to be used for the release treatment is, for example, OPTOOL (registered trademark) DSX manufactured by Daikin Industries Co., Ltd., or Novec (registered trademark) EGC manufactured by Sumitomo 3M Co., Ltd. as a fluorine-based decane coupling agent. -1720 and so on.
此外,亦可使用公知的氟系樹脂、烴系潤滑劑、氟系潤滑劑、氟系矽烷偶合劑等。 Further, a known fluorine-based resin, a hydrocarbon-based lubricant, a fluorine-based lubricant, a fluorine-based decane coupling agent, or the like can be used.
例如氟系樹脂可列舉:PTFE(聚四氟乙烯)、PFA(四氟乙烯-全氟烷基乙烯醚共聚物)、FEP(四氟乙烯-六氟丙烯共聚物)、ETFE(四氟乙烯-乙烯共聚物)等。 Examples of the fluorine-based resin include PTFE (polytetrafluoroethylene), PFA (tetrafluoroethylene-perfluoroalkyl vinyl ether copolymer), FEP (tetrafluoroethylene-hexafluoropropylene copolymer), and ETFE (tetrafluoroethylene- Ethylene copolymer) and the like.
例如烴系潤滑劑可列舉:硬脂酸及油酸等羧酸類、硬脂酸丁酯等酯類、十八烷基磺酸等磺酸類、磷酸單十八烷酯等磷酸酯類、硬脂醇及油醇等醇類、硬脂酸醯胺等羧酸醯胺類、硬脂基胺等胺類等。 Examples of the hydrocarbon-based lubricant include carboxylic acids such as stearic acid and oleic acid, esters such as butyl stearate, sulfonic acids such as octadecylsulfonic acid, and phosphates such as monooctadecyl phosphate, and stearic acid. Examples include alcohols such as alcohols and oleyl alcohols; amines such as carboxylic acid amides such as decylamine stearate; and amines such as stearylamine.
例如氟系潤滑劑可列舉:上述烴系潤滑劑的烷基的一部分或全部被氟烷基或全氟聚醚取代的潤滑劑。 For example, a fluorine-based lubricant may be a lubricant in which a part or all of an alkyl group of the above hydrocarbon-based lubricant is substituted with a fluoroalkyl group or a perfluoropolyether.
例如全氟聚醚為:全氟甲醛聚合物、全氟環氧乙烷聚合物、全氟-環氧正丙烷聚合物(CF2CF2CF2O)n、全氟環氧異丙烷聚合物(CF(CF3)CF2O)n或這些的共聚物等。此處,下標n表示聚合度。 For example, perfluoropolyether is: perfluoroformaldehyde polymer, perfluoroethylene oxide polymer, perfluoro-epoxy n-propane polymer (CF 2 CF 2 CF 2 O) n , perfluoroepoxy isopropane polymer (CF(CF 3 )CF 2 O) n or a copolymer of these or the like. Here, the subscript n indicates the degree of polymerization.
例如氟系矽烷偶合劑是分子中具有至少1個、較佳為1個~10個烷氧基矽烷基、氯矽烷基者,較佳為分子量為200~10,000者。例如作為烷氧基矽烷基,可列舉:-Si(OCH3)3基、-Si(OCH2CH3)3基,作為氯矽烷基,可列舉:-Si(Cl)3基等。具體為:十七氟-1,1,2,2-四-氫癸基三甲氧基矽烷、五氟苯基丙基二甲基氯矽烷、十三氟-1,1,2,2-四-氫辛基三乙氧基矽烷、十三氟-1,1,2,2-四-氫辛基三甲氧基矽烷等化合物。 For example, the fluorine-based decane coupling agent is one having at least one, preferably one to ten alkoxyalkylene groups or chlorodecyl groups in the molecule, and preferably having a molecular weight of from 200 to 10,000. Examples of the alkoxyalkylene group include a -Si(OCH 3 ) 3 group and a -Si(OCH 2 CH 3 ) 3 group. Examples of the chloroalkyl group include a -Si(Cl) 3 group. Specifically: heptafluoro-1,1,2,2-tetrahydroindoletrimethoxydecane, pentafluorophenylpropyldimethylchlorodecane, and tridecafluoro-1,1,2,2-tetra a compound such as hydrogenoctyltriethoxydecane or tridecafluoro-1,1,2,2-tetrahydrogenyltrimethoxydecane.
(壓印方法) (imprint method)
在使原模43與硬化性樹脂接觸前,藉由使原模43與基板5間的環境為減壓或真空環境,而降低殘留氣體。但是,在高真空環境下硬化前的硬化性樹脂會揮發,而有可能難以維持均勻的膜厚。因此,較佳為藉由使原模43與基板5間的環境為氦(He)環境或減壓He環境,而降低殘留氣體。He會透過石英基板,因此所摻入的殘留氣體(He)會緩慢地減少。He的透過需要時間,因此更佳為設為減壓He環境。減壓環境較佳為1kPa~90kPa,特佳為1kPa~10kPa。 Before the master mold 43 is brought into contact with the curable resin, the residual gas is reduced by setting the environment between the master mold 43 and the substrate 5 to a reduced pressure or a vacuum environment. However, the curable resin before curing in a high vacuum environment volatilizes, and it may be difficult to maintain a uniform film thickness. Therefore, it is preferable to reduce the residual gas by setting the environment between the master 43 and the substrate 5 to a helium (He) environment or a reduced pressure He environment. He passes through the quartz substrate, so the residual gas (He) incorporated is slowly reduced. The passage of He takes time, so it is better to set it as a decompression He environment. The reduced pressure environment is preferably from 1 kPa to 90 kPa, and particularly preferably from 1 kPa to 10 kPa.
原模43的壓抵壓力為在100kPa以上、10MPa以下的 範圍內。壓力大者,會促進硬化性樹脂的流動,並且亦促進殘留氣體的壓縮、殘留氣體在硬化性樹脂中的溶解、He在石英基板中的透過,而使除去率提高。但是,若加壓力過強,則在原模43接觸時若咬合異物則有可能使原模43及基板5破損。因此,原模43的壓抵壓力較佳為100kPa以上、10MPa以下,更佳為100kPa以上、5MPa以下,尤佳為100kPa以上、1MPa以下。原因是,壓抵壓力設為100kPa以上者,在大氣中進行壓印時,在原模43與基板5間由液體充滿的情況下,原模43與基板5間可藉由大氣壓(約101kPa)加壓。 The pressing pressure of the original mold 43 is 100 kPa or more and 10 MPa or less. Within the scope. When the pressure is high, the flow of the curable resin is promoted, and the compression of the residual gas, the dissolution of the residual gas in the curable resin, and the transmission of He in the quartz substrate are promoted, and the removal rate is improved. However, if the pressing force is too strong, the original mold 43 and the substrate 5 may be damaged if the foreign matter is bitten when the original mold 43 is in contact. Therefore, the pressing pressure of the master mold 43 is preferably 100 kPa or more and 10 MPa or less, more preferably 100 kPa or more and 5 MPa or less, and particularly preferably 100 kPa or more and 1 MPa or less. The reason is that when the pressing pressure is 100 kPa or more, when the embossing is performed in the atmosphere, when the original mold 43 and the substrate 5 are filled with the liquid, the original mold 43 and the substrate 5 can be added by atmospheric pressure (about 101 kPa). Pressure.
凸台部5a上的硬化性樹脂的曝光是在將原模43的凹凸圖案43a壓抵於配置於凸台部5a上的液滴41的狀態下進行。藉此,液滴41成為轉印了凹凸圖案43a的硬化性樹脂膜。凸緣部5b上的硬化性樹脂亦藉由曝光而基本上以液滴配置時的形狀硬化。此時,凸台部5a及凸緣部5b的曝光可同時進行,亦可分別進行。 The exposure of the curable resin on the boss portion 5a is performed in a state where the uneven pattern 43a of the master mold 43 is pressed against the liquid droplets 41 disposed on the boss portion 5a. Thereby, the droplet 41 becomes a curable resin film to which the uneven pattern 43a is transferred. The curable resin on the flange portion 5b is also hardened by the shape at the time of droplet arrangement by exposure. At this time, the exposure of the boss portion 5a and the flange portion 5b may be performed simultaneously or separately.
作為壓抵原模43而形成硬化性樹脂膜後,使其剝離的方法,例如可列舉:在保持原模43或基板5的任一外緣部,並吸引保持另一基板5或原模43的背面的狀態下,使外緣的保持部或背面的保持部朝著與按壓相反的方向相對移動而使其剝離的方法。 The method of forming the curable resin film by pressing against the original mold 43 and then peeling it off is, for example, holding the outer edge portion of the master mold 43 or the substrate 5, and sucking and holding the other substrate 5 or the master mold 43 In the state of the back surface, the holding portion of the outer edge or the holding portion of the back surface is moved in a direction opposite to the pressing direction to be peeled off.
(蝕刻) (etched)
被轉印基板5的蝕刻是將經硬化的硬化性樹脂44及硬化性樹脂45作為遮罩而進行。藉此,在被轉印基板5的凸台部上表面5c 形成與原模43的凹凸圖案對應的圖案,並在被轉印基板5的凸緣部上表面5d形成輔助標記30。而且,在本實施形態中,以成為將凸台部5a上的硬化性樹脂44除去且使凸緣部5b上的硬化性樹脂45殘存的狀態的方式,進行蝕刻(圖3之E)。藉由在輔助標記30上殘存硬化性樹脂,而有藉由被轉印基板及硬化性樹脂的各自的光學特性的差異而對比度提高,從而輔助標記30的視認性提高的效果。通常,所壓印的硬化性樹脂44的膜厚(包括所謂的殘膜部分的凸部整體的厚度)小於1μm。因此,若以大於硬化性樹脂44的膜厚的方式調整硬化性樹脂45的高度,則可藉由蝕刻結束的時序而實現上述狀態。例如考慮試驗中事先獲得的硬化性樹脂44的膜厚、硬化性樹脂45的高度、以及硬化性樹脂44及硬化性樹脂45的蝕刻速率等,而可求出恰當的蝕刻時間。另外,作為使分別配置於凸台部5a及凸緣部5b的硬化性樹脂互不相同的材料,亦可藉由在蝕刻速率上出現差異而實現上述狀態。 The etching of the substrate 5 to be transferred is performed by using the cured curable resin 44 and the curable resin 45 as a mask. Thereby, the upper surface 5c of the boss portion of the substrate 5 to be transferred A pattern corresponding to the concave-convex pattern of the original mold 43 is formed, and the auxiliary mark 30 is formed on the flange surface upper surface 5d of the substrate 5 to be transferred. In the present embodiment, etching is performed so that the curable resin 44 on the boss portion 5a is removed and the curable resin 45 on the flange portion 5b remains (E in FIG. 3). When the curable resin remains on the auxiliary mark 30, the contrast is improved by the difference in optical characteristics between the transfer substrate and the curable resin, and the visibility of the auxiliary mark 30 is improved. In general, the film thickness of the embossed curable resin 44 (including the thickness of the entire convex portion of the so-called residual film portion) is less than 1 μm. Therefore, when the height of the curable resin 45 is adjusted to be larger than the film thickness of the curable resin 44, the above state can be realized by the timing at which the etching is completed. For example, the film thickness of the curable resin 44 obtained in the test, the height of the curable resin 45, the etching rate of the curable resin 44 and the curable resin 45, and the like can be considered, and an appropriate etching time can be obtained. In addition, as a material in which the curable resins respectively disposed on the boss portion 5a and the flange portion 5b are different from each other, the above state can be realized by a difference in etching rate.
作為蝕刻,若為可在基板上形成凹凸圖案者,則並無特別限制,可根據目的而適當選擇,例如可列舉:離子研磨法、反應性離子蝕刻(RIE)、濺鍍蝕刻等。這些中,特佳為離子研磨法、RIE。 The etching is not particularly limited as long as it can form a concave-convex pattern on the substrate, and may be appropriately selected depending on the purpose, and examples thereof include an ion polishing method, reactive ion etching (RIE), and sputtering etching. Among these, ion milling method and RIE are particularly preferable.
離子研磨法亦稱為離子束蝕刻,在離子源中導入Ar等惰性氣體,而生成離子。通過柵極將離子加速,使其碰撞試樣基板而進行蝕刻。作為離子源,可列舉:考夫曼(Kaufman)型、高頻型、電子衝擊型、雙電漿管(duoplasmatron)型、弗里曼(Freeman) 型、電子迴旋共振(electron cyclotron resonance,ECR)型等。 The ion milling method is also called ion beam etching, and an inert gas such as Ar is introduced into the ion source to generate ions. The ions are accelerated by the gate electrode and are etched by colliding with the sample substrate. Examples of the ion source include a Kaufman type, a high frequency type, an electron impact type, a duoplasmatron type, and Freeman. Type, electron cyclotron resonance (ECR) type, etc.
作為離子束蝕刻中的製程氣體,可使用Ar氣體,作為RIE的蝕刻劑,可使用氟系氣體或氯系氣體。 As the process gas in ion beam etching, Ar gas can be used, and as an etchant of RIE, a fluorine-based gas or a chlorine-based gas can be used.
如以上所述,本實施形態的模具的製造方法,為表示輔助標記而在藉由液滴噴出法配置硬化性樹脂的液滴後,將該硬化性樹脂作為遮罩進行蝕刻,因此即便是在欲對每個模具變更輔助標記時,僅對液滴的配置部位進行設計變更便可容易地變更輔助標記。其結果是在具有輔助標記的凸台型模具的製造中,可靈活地應對輔助標記的變更,而且可更高效地製造。 As described above, in the method for producing a mold according to the present embodiment, the droplets of the curable resin are placed by the droplet discharge method after the auxiliary marks are formed, and then the curable resin is etched as a mask, so that even When the auxiliary mark is to be changed for each mold, the auxiliary mark can be easily changed by designing only the arrangement of the liquid droplets. As a result, in the manufacture of a boss type mold having an auxiliary mark, it is possible to flexibly cope with the change of the auxiliary mark and to manufacture it more efficiently.
<設計變更> <design change>
若應用上述實施形態,則即便是在除去一次所形成的輔助標記的情況下,亦可再次將硬化性樹脂的液滴僅配置於凸緣部,並使硬化性樹脂硬化,而形成輔助標記30。即,在藉由本發明的製造方法而製造的模具1中,可藉由輔助標記30的消除及追加而更新資訊。 According to the above-described embodiment, even when the auxiliary mark formed once is removed, the droplet of the curable resin can be placed only on the flange portion, and the curable resin can be cured to form the auxiliary mark 30. . That is, in the mold 1 manufactured by the manufacturing method of the present invention, the information can be updated by the elimination and addition of the auxiliary mark 30.
上述實施形態中,雖然以成為將凸台部5a上的硬化性樹脂44除去且使凸緣部5b上的硬化性樹脂45殘存的狀態的方式進行蝕刻,但亦可將硬化性樹脂全部除去。此時,藉由凸緣部自身的凹凸來表示輔助標記30。 In the above-described embodiment, the curable resin 44 on the boss portion 5a is removed and the curable resin 45 on the flange portion 5b remains. However, all of the curable resin may be removed. At this time, the auxiliary mark 30 is indicated by the unevenness of the flange portion itself.
上述實施形態中,對硬化性樹脂具有光硬化性的情形進行了說明,但本發明並不限定於此。即本發明中,例如亦可使用熱硬化性樹脂。 In the above embodiment, the case where the curable resin has photocurability has been described, but the present invention is not limited thereto. That is, in the present invention, for example, a thermosetting resin can also be used.
另外,藉由液滴表示輔助標記的方法中,若使用具有凸台結構的原模,則亦可應用於不具有凸台結構的平坦的被轉印基板。 Further, in the method of indicating the auxiliary mark by the liquid droplet, if a master having a boss structure is used, it can be applied to a flat substrate to be transferred which does not have a land structure.
「第2實施形態」 "Second embodiment"
接著,對模具的製造方法的第2實施形態進行說明。圖4是表示本實施形態的模具的製造方法的步驟的概略剖面圖。本實施形態在如下方面與第1實施形態不同,僅被轉印基板5的凸緣部5b在其表面具有含有金屬的膜6。因此,關於與第1實施形態相同的構成,只要無特別需要,則省略其詳細說明。 Next, a second embodiment of a method of manufacturing a mold will be described. Fig. 4 is a schematic cross-sectional view showing the procedure of a method of manufacturing a mold according to the embodiment. This embodiment differs from the first embodiment in that the flange portion 5b of the transfer substrate 5 has a film 6 containing a metal on its surface. Therefore, the same configurations as those of the first embodiment are not described in detail unless otherwise specified.
本實施形態的模具1的製造方法如圖4所示般,使用具有包含凸台部5a及凸緣部5b的凸台結構且凸緣部5b在其表面具有含有金屬的膜6的被轉印基板5(圖4之A)、與包含噴墨頭40的噴墨裝置(省略圖示),藉由噴墨法在凸台部5a上配置包含硬化性樹脂的多滴液滴41,並以如下方式在凸緣部5b上配置包含相同硬化性樹脂的多滴液滴42,即配置於凸緣部5b上的多滴液滴42各自的高度低於凸台部5a的高度、且配置於凸緣部5b上的多滴液滴42表示輔助標記30(圖4之B),在將原模43的凹凸圖案43a壓抵於配置於凸台部5a上的多滴液滴41的狀態下,使凸台部5a上的硬化性樹脂及凸緣部5b上的硬化性樹脂硬化(圖4之C),將經硬化的硬化性樹脂44及硬化性樹脂45作為遮罩,以成為將凸台部5a上的硬化性樹脂44除去且使凸緣部5b上的硬化性樹脂45殘存的狀態的方式,藉由蝕刻氣體46進行被轉印基板5的蝕刻 (圖4之D及圖4之E),然後將凸緣部5b上所殘存的硬化性樹脂45除去(圖4之F)。該硬化性樹脂除去後,可獲得例如如圖4之F所示的模具1(即原模43的複盤)。本實施形態中,輔助標記30的視認性主要藉由在凸緣部5b上圖案化的含有金屬的膜6而達成。 As shown in Fig. 4, the method of manufacturing the mold 1 of the present embodiment uses a boss structure having a boss portion 5a and a flange portion 5b, and the flange portion 5b has a film 6 containing a metal on its surface. The substrate 5 (A of FIG. 4) and an inkjet apparatus (not shown) including the inkjet head 40 are provided with a plurality of droplets 41 containing a curable resin on the boss portion 5a by an inkjet method, and In the flange portion 5b, a plurality of droplets 42 containing the same curable resin are disposed, that is, the heights of the plurality of droplets 42 disposed on the flange portion 5b are lower than the height of the boss portion 5a, and are disposed on the flange portion 5b. The plurality of droplets 42 on the flange portion 5b indicate the auxiliary mark 30 (B of FIG. 4), and the concave-convex pattern 43a of the original mold 43 is pressed against the plurality of droplets 41 disposed on the boss portion 5a. The curable resin on the boss portion 5a and the curable resin on the flange portion 5b are cured (C in FIG. 4), and the cured curable resin 44 and the curable resin 45 are used as a mask to be convex. In the state in which the curable resin 44 on the land portion 5a is removed and the curable resin 45 on the flange portion 5b remains, the transfer substrate 46 is transferred by the etching gas 46. Engraved (D of FIG. 4 and E of FIG. 4), the curable resin 45 remaining on the flange portion 5b is removed (F of FIG. 4). After the curable resin is removed, for example, a mold 1 as shown in FIG. 4F (i.e., a refill of the master mold 43) can be obtained. In the present embodiment, the visibility of the auxiliary mark 30 is mainly achieved by the metal-containing film 6 patterned on the flange portion 5b.
(含有金屬的膜) (film containing metal)
含有金屬的膜是包含以金屬或金屬化合物等金屬為主成分的材料的膜。所謂「主成分」,是指材料中的構成比率為50質量%以上。如本實施形態般,藉由利用含有金屬的膜6表示輔助標記30,而輔助標記的視認性提高。就提高視認性的觀點而言,含有金屬的膜的反射率在365nm波長時較佳為30%以上、更佳為50%以上、尤佳為70%以上。含有金屬的膜的厚度通常設為2nm~30nm、較佳為設為5nm~20nm。原因是,特別是若厚度超過30nm,則UV透射性降低,而容易引起硬化性樹脂的硬化不良。含有金屬的膜例如可藉由真空蒸鍍法或濺鍍法等成膜法而形成。作為含有金屬的膜的材料,可列舉:Cr、W、Ti、Ni、Ag、Pt、Au、CrO2、WO2、TiO2等。另外,蝕刻前的含有金屬的膜6只要構成凸緣部上表面5d中的至少形成輔助標記30的預定的表面即可。 The metal-containing film is a film containing a material mainly composed of a metal such as a metal or a metal compound. The term "main component" means that the composition ratio in the material is 50% by mass or more. As in the present embodiment, the auxiliary mark 30 is represented by the film 6 containing metal, and the visibility of the auxiliary mark is improved. From the viewpoint of improving visibility, the reflectance of the metal-containing film is preferably 30% or more, more preferably 50% or more, and particularly preferably 70% or more at a wavelength of 365 nm. The thickness of the metal-containing film is usually 2 nm to 30 nm, preferably 5 nm to 20 nm. The reason is that, in particular, when the thickness exceeds 30 nm, the UV transmittance is lowered, and the curing failure of the curable resin is likely to occur. The metal-containing film can be formed, for example, by a film formation method such as a vacuum deposition method or a sputtering method. Examples of the material of the metal-containing film include Cr, W, Ti, Ni, Ag, Pt, Au, CrO 2 , WO 2 , and TiO 2 . Further, the metal-containing film 6 before etching may constitute a predetermined surface of at least the auxiliary mark 30 formed on the upper surface 5d of the flange portion.
另外,在欲形成包含解像度超過液滴配置描繪的解像度的微細圖案的輔助標記時,可將藉由通常的光刻(photolithography)技術而形成的圖案與液滴配置圖案複合而形成識別標記。例如圖5是表示含有金屬的膜6具有比液滴的大小 更微細的凹凸結構時的製造步驟的概略圖。圖5之A中,例如含有金屬的膜6的黑的部分表示凸部,白的部分表示凹部。含有金屬的膜6的微細的凹凸結構例如藉由光刻技術而預先形成。該情況下,在被轉印基板5的凸台部5a上配置液滴41,在凸緣部5b上配置液滴42後(圖5之B),轉移至蝕刻步驟。其結果形成如圖5之C所示的具有微細凹凸結構的輔助標記30。 Further, when an auxiliary mark including a fine pattern having a resolution exceeding the resolution of the droplet placement drawing is to be formed, a pattern formed by a usual photolithography technique and a droplet arrangement pattern can be combined to form an identification mark. For example, FIG. 5 is a view showing that the film 6 containing metal has a larger size than the droplets. A schematic view of the manufacturing steps in the case of a finer uneven structure. In A of Fig. 5, for example, a black portion of the metal-containing film 6 indicates a convex portion, and a white portion indicates a concave portion. The fine uneven structure of the metal-containing film 6 is formed in advance by, for example, photolithography. In this case, the droplet 41 is placed on the boss portion 5a of the substrate 5 to be transferred, and the droplet 42 is placed on the flange portion 5b (B of FIG. 5), and the process proceeds to the etching step. As a result, the auxiliary mark 30 having a fine uneven structure as shown in FIG. 5C is formed.
(硬化性樹脂的除去方法) (Removal method of curable resin)
硬化性樹脂的除去方法例如亦可根據圖4之E的狀態,採用在酸或鹼中清洗等濕式製程,另外,亦可採用UV臭氧處理或氧氣灰化等乾式製程。 The method of removing the curable resin may be, for example, a wet process such as washing with an acid or an alkali according to the state of E in Fig. 4, or a dry process such as UV ozone treatment or oxygen ashing.
如以上所述,本實施形態的模具的製造方法中,為表示輔助標記而在藉由液滴噴出法配置硬化性樹脂的液滴後,將該硬化性樹脂作為遮罩進行蝕刻,因此亦發揮出與第1實施形態相同的效果。 As described above, in the method for producing a mold according to the present embodiment, the droplets of the curable resin are placed by the droplet discharge method after the auxiliary marks are formed, and the curable resin is etched as a mask. The same effects as those of the first embodiment are obtained.
而且在本實施形態中,由於輔助標記藉由在凸緣部5b上圖案化的含有金屬的膜而表示,因此可提高視認性。 Further, in the present embodiment, since the auxiliary mark is represented by the metal-containing film patterned on the flange portion 5b, the visibility can be improved.
而且,在含有金屬的膜具有比液滴的大小更微細的凹凸結構時,可形成包含解像度超過液滴配置描繪的解像度的微細的圖案的輔助標記。 Further, when the film containing a metal has a concavo-convex structure that is finer than the size of the droplets, an auxiliary mark including a fine pattern having a resolution exceeding the resolution of the droplet arrangement drawing can be formed.
「第3實施形態」 "Third embodiment"
接著,對模具的製造方法的第3實施形態進行說明。圖6是表示本實施形態的模具的製造方法的步驟的概略剖面圖。本實施 形態在以下方面與第2實施形態不同,被轉印基板5的凸台部5a在其表面亦具有含有金屬的膜6。因此,關於與第1實施形態及第2實施形態相同的構成,只要無特別需要,則省略其詳細說明。 Next, a third embodiment of the method for producing a mold will be described. Fig. 6 is a schematic cross-sectional view showing the procedure of a method of manufacturing a mold according to the embodiment. This implementation The form is different from the second embodiment in that the boss portion 5a of the transfer substrate 5 also has a film 6 containing a metal on its surface. Therefore, the same configurations as those of the first embodiment and the second embodiment will not be described in detail unless otherwise specified.
本實施形態的模具1的製造方法如圖6所示般,使用具有包含凸台部5a及凸緣部5b的凸台結構且凸台部5a及凸緣部5b在其表面具有含有金屬的膜6的被轉印基板5(圖6之A)、與包含噴墨頭40的噴墨裝置(省略圖示),藉由噴墨法在凸台部5a上配置包含硬化性樹脂的多滴液滴41,並以如下方式在凸緣部5b上配置包含相同硬化性樹脂的多滴液滴42,即配置於凸緣部5b上的多滴液滴42各自的高度低於凸台部5a的高度、且配置於凸緣部5b上的多滴液滴42表示輔助標記(圖6之B),在將原模43的凹凸圖案43a壓抵於配置於凸台部5a上的多滴液滴41的狀態下,使凸台部5a上的硬化性樹脂及凸緣部5b上的硬化性樹脂硬化(圖6之C),將經硬化的硬化性樹脂44及硬化性樹脂45或含有金屬的膜6作為遮罩,以成為將凸台部5a的含有金屬的膜6除去且使凸緣部5b的含有金屬的膜6殘存的狀態的方式,藉由蝕刻氣體46進行被轉印基板5的蝕刻(圖6之D~圖6之F)。然後,可獲得例如如圖6之F所示的模具1(即原模43的複盤)。本實施形態中,輔助標記30的視認性與第2實施形態同樣,主要藉由在凸緣部5b上圖案化的含有金屬的膜6而達成。 As shown in Fig. 6, the method of manufacturing the mold 1 of the present embodiment uses a boss structure including a boss portion 5a and a flange portion 5b, and the boss portion 5a and the flange portion 5b have a metal-containing film on the surface thereof. 6 of the substrate 5 to be transferred (A in FIG. 6) and an inkjet device (not shown) including the inkjet head 40, and a plurality of droplets containing a curable resin are placed on the boss portion 5a by an inkjet method. The droplet 41 is placed on the flange portion 5b in such a manner that a plurality of droplets 42 containing the same curable resin are disposed, that is, the heights of the plurality of droplets 42 disposed on the flange portion 5b are lower than those of the boss portion 5a. The plurality of droplets 42 disposed at the height of the flange portion 5b indicate auxiliary marks (B of FIG. 6), and the concave-convex pattern 43a of the original mold 43 is pressed against the plurality of droplets disposed on the boss portion 5a. In the state of 41, the curable resin on the boss portion 5a and the curable resin on the flange portion 5b are cured (C in Fig. 6), and the cured curable resin 44, the curable resin 45, or the metal-containing material are cured. The film 6 is a mask, and is a state in which the metal-containing film 6 of the boss portion 5a is removed and the metal-containing film 6 of the flange portion 5b remains. The body 46 performs etching of the substrate 5 to be transferred (D of FIG. 6 to F of FIG. 6). Then, a mold 1 (i.e., a layup of the master mold 43) as shown in Fig. 6F can be obtained. In the present embodiment, the visibility of the auxiliary mark 30 is mainly achieved by the metal-containing film 6 patterned on the flange portion 5b as in the second embodiment.
(蝕刻) (etched)
本實施形態的蝕刻例如藉由如下的2階段的蝕刻而實施。最 初的蝕刻是適於將硬化性樹脂44作為遮罩而蝕刻含有金屬的膜6的條件的蝕刻,後續的蝕刻是適於將經加工的含有金屬的膜6作為遮罩而蝕刻被轉印基板5的條件的蝕刻。並且,根據需要亦進行硬化性樹脂的除去。藉由此種蝕刻,而可轉印更高精度的圖案。 The etching in this embodiment is carried out, for example, by the following two-stage etching. most The initial etching is an etching suitable for etching the film 6 containing the metal using the curable resin 44 as a mask, and the subsequent etching is suitable for etching the transferred substrate by using the processed metal-containing film 6 as a mask. 5 conditions of etching. Further, the curable resin is removed as needed. By such etching, a pattern of higher precision can be transferred.
以下表示本發明的模具的製造方法的實施例。 The embodiment of the method of manufacturing the mold of the present invention is shown below.
(原模的製作) (production of the original model)
在Si基材上,藉由旋塗來塗佈以PHS(polyhydroxy styrene)系化學增幅型抗蝕劑等為主成分的抗蝕劑液,而形成抗蝕劑層。然後,在XY平台上一邊掃描Si基材,一邊照射對應於特定圖案而調變的電子束,而將10mm見方的範圍的抗蝕劑層整個面曝光。然後,對抗蝕劑層進行顯影處理,將曝光部分除去,將除去後的抗蝕劑層的圖案作為遮罩,藉由RIE以槽深度為100nm的方式進行選擇蝕刻,而獲得Si模具。模具表面藉由浸塗法由OPTOOL DSX進行脫模處理。 A resist liquid containing a PHS (polyhydroxy styrene) chemical amplification resist or the like as a main component is applied onto the Si substrate by spin coating to form a resist layer. Then, while scanning the Si substrate on the XY stage, the electron beam modulated in accordance with the specific pattern was irradiated, and the entire surface of the resist layer in the range of 10 mm square was exposed. Then, the resist layer was subjected to development treatment to remove the exposed portion, and the pattern of the removed resist layer was used as a mask, and selective etching was performed by RIE so as to have a groove depth of 100 nm to obtain a Si mold. The mold surface was demolded by OPTOOL DSX by dip coating.
凹凸圖案形成於Si基材的中心部的10mm見方的區域。凹凸圖案是長度10mm、寬度50nm、間距100nm、深度100nm的線與間隙圖案。 The uneven pattern was formed in a 10 mm square region of the center portion of the Si substrate. The concavo-convex pattern is a line and gap pattern having a length of 10 mm, a width of 50 nm, a pitch of 100 nm, and a depth of 100 nm.
(被轉印基板) (transferred substrate)
基板是使用152mm見方、厚度6.35mm的石英基板。首先,在基板中心部的被轉印區域藉由濕式蝕刻形成10mm見方、高度30μm的凸台部。然後,藉由與抗蝕劑的密接性優異的矽烷偶合劑 即KBM-5103(信越化學工業股份有限公司製造),對石英基板的表面進行表面處理。具體而言,藉由PGMEA(丙二醇單甲醚乙酸酯)將KBM-5103稀釋為1質量%,藉由旋塗法塗佈於基板表面。接著,將塗佈基板在加熱板上在150℃、5分鐘的條件下退火,而使矽烷偶合劑與基板表面結合。 The substrate was a quartz substrate of 152 mm square and 6.35 mm thick. First, a land portion of 10 mm square and 30 μm in height was formed by wet etching in the transfer region of the center portion of the substrate. Then, a decane coupling agent excellent in adhesion to a resist Namely, KBM-5103 (manufactured by Shin-Etsu Chemical Co., Ltd.), the surface of the quartz substrate was subjected to surface treatment. Specifically, KBM-5103 was diluted to 1% by mass by PGMEA (propylene glycol monomethyl ether acetate) and applied to the surface of the substrate by spin coating. Next, the coated substrate was annealed on a hot plate at 150 ° C for 5 minutes to bond the decane coupling agent to the surface of the substrate.
(含有金屬的薄膜) (film containing metal)
藉由濺鍍法,在凸緣部形成30nm厚的Cr膜,而形成含有金屬的薄膜。另外,使用通常的光刻技術,在上述Cr膜上形成1μm見方的點以2μm間距排列而成的正方格子圖案的凹凸結構。 A Cr film having a thickness of 30 nm was formed on the flange portion by a sputtering method to form a film containing a metal. Further, a concave-convex structure of a square lattice pattern in which 1 μm square dots are arranged at a pitch of 2 μm is formed on the Cr film by a usual photolithography technique.
(抗蝕劑) (resist)
製備含有48質量%的化合物A、48質量%的ARONIX M220、3質量%的IRGACURE 379、1質量%的化合物B的抗蝕劑。 A resist containing 48% by mass of Compound A, 48% by mass of ARONIX M220, 3% by mass of IRGACURE 379, and 1% by mass of Compound B was prepared.
(抗蝕劑的塗佈步驟) (coating step of resist)
使用作為壓電方式的噴墨印表機的富士軟片迪瑪提斯(FUJIFILM Dimatix)公司製造的DMP-2838。噴墨頭使用專用的10pl頭即DMC-11610。以液滴量為10pl的方式,預先調整噴出條件。液滴配置圖案設定為將液滴間隔設為400μm的鋸齒格子,根據該液滴配置圖案在凸台部上的轉印區域整個面上配置液滴。另外,在凸緣部藉由點配置描繪圖2所示的文字。 DMP-2838 manufactured by FUJIFILM Dimatix Co., Ltd., which is a piezoelectric inkjet printer. The ink jet head uses a dedicated 10 pl head, DMC-11610. The ejection conditions were adjusted in advance so that the amount of droplets was 10 pl. The droplet arrangement pattern was set to a zigzag lattice in which the droplet interval was set to 400 μm, and droplets were placed on the entire surface of the transfer region on the land portion in accordance with the droplet arrangement pattern. Further, the characters shown in Fig. 2 are drawn by the dot arrangement on the flange portion.
(奈米壓印方法) (nano imprint method)
使原模與石英基板接近,直至間隙為0.1mm以下的位置為止,並進行這些的對位。 The master mold is brought close to the quartz substrate until the gap is at a position of 0.1 mm or less, and these alignments are performed.
接著,藉由99體積%以上的He氣體置換原模與石英基板間的空間,He置換後減壓至20kPa以下為止。在減壓He條件下使原模與包含抗蝕劑的液滴接觸。 Next, the space between the master mold and the quartz substrate was replaced by 99% by volume or more of He gas, and the pressure was reduced to 20 kPa or less after He replacement. The master mold was brought into contact with a droplet containing a resist under reduced pressure He conditions.
接觸後,藉由1MPa的壓抵壓力進行5秒鐘加壓,藉由包含360nm的波長的紫外光,以照射量為300mJ/cm2的方式進行曝光,而使抗蝕劑硬化。 After the contact, the pressure was applied for 5 seconds by a pressing pressure of 1 MPa, and the exposure was performed by exposing the ultraviolet light having a wavelength of 360 nm to an exposure amount of 300 mJ/cm 2 to cure the resist.
將石英基板及原模的外緣部進行機械保持,並使石英基板或原模朝著與按壓相反的方向相對移動,藉此將原模自抗蝕劑剝離。 The outer periphery of the quartz substrate and the master is mechanically held, and the quartz substrate or the master is relatively moved in a direction opposite to the pressing, whereby the master is peeled off from the resist.
(評價結果) (Evaluation results)
藉由顯微鏡檢查上述實施例中所得的輔助標記。確認到能以倍率10倍容易地判別文字。 The auxiliary mark obtained in the above examples was examined by a microscope. It was confirmed that the character can be easily discriminated at a magnification of 10 times.
1‧‧‧模具 1‧‧‧Mold
2‧‧‧凸台部 2‧‧‧Boss
2s、3s‧‧‧上表面 2s, 3s‧‧‧ upper surface
3‧‧‧凸緣部 3‧‧‧Flange
21‧‧‧凹凸圖案 21‧‧‧ concave pattern
31‧‧‧文字 31‧‧‧ text
32‧‧‧條碼 32‧‧‧ barcode
33‧‧‧符號 33‧‧‧ symbol
h‧‧‧高度 H‧‧‧height
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JP5804160B2 (en) * | 2013-09-19 | 2015-11-04 | 大日本印刷株式会社 | Imprint method and imprint mold manufacturing method |
JP6446836B2 (en) * | 2014-05-28 | 2019-01-09 | 大日本印刷株式会社 | Method for removing foreign matter from template and method for producing template |
JP6554778B2 (en) * | 2014-10-10 | 2019-08-07 | 大日本印刷株式会社 | Imprint mold substrate and imprint mold manufacturing method |
JP6054991B2 (en) * | 2015-01-07 | 2016-12-27 | ファナック株式会社 | Injection molding system |
JPWO2016133161A1 (en) * | 2015-02-20 | 2017-11-30 | 日本碍子株式会社 | Optical element manufacturing method |
JP2016157785A (en) * | 2015-02-24 | 2016-09-01 | 株式会社東芝 | Template forming method, template, and template base material |
WO2016204878A1 (en) * | 2015-06-15 | 2016-12-22 | Zygo Corporation | Displacement measurement of deformable bodies |
JP6779748B2 (en) * | 2016-10-31 | 2020-11-04 | キヤノン株式会社 | Imprinting equipment, imprinting methods, and manufacturing methods for articles |
JP6809572B2 (en) * | 2019-07-08 | 2021-01-06 | 大日本印刷株式会社 | Imprint mold substrate and imprint mold |
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