TWI512150B - Preparation of copper - clad copper - clad copper clad copper - Google Patents
Preparation of copper - clad copper - clad copper clad copper Download PDFInfo
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本發明係為一種氮化鋁基板厚銅覆銅之製備方法,特別是關於以鈦、鎢等金屬濺鍍於氮化鋁基板上並於其上電鍍銅膜,進行無氧銅厚銅製程,利用鈦、鎢等金屬可使銅線路電路與氮化鋁基板有較好之相容性。The invention relates to a method for preparing a thick copper copper-clad of an aluminum nitride substrate, in particular to a method of depositing a copper film on a silicon nitride substrate by sputtering a metal such as titanium or tungsten on the aluminum nitride substrate, and performing an oxygen-free copper thick copper process. The use of metals such as titanium and tungsten allows the copper circuit to have good compatibility with the aluminum nitride substrate.
習知,LED產品具有節能、高效率、使用週期長、且不含有毒物質等。但LED產品輸入功率有80%會以熱能散失,解決LED散熱系統為目前最重要課題。LED散熱途徑主要有(1)直接從空氣散熱(2)晶粒散熱基板將熱傳導至系統電路板(3)電極金屬導線將熱傳導至系統電路板。Conventionally, LED products have energy saving, high efficiency, long service life, and no toxic substances. However, 80% of the input power of LED products will be lost due to thermal energy. Solving the LED cooling system is currently the most important issue. LED heat dissipation methods mainly include (1) direct heat dissipation from the air (2) die heat dissipation substrate to conduct heat to the system circuit board (3) electrode metal wires conduct heat to the system circuit board.
按,鍍銅陶瓷基材之製造方法如下,美國陶瓷協會期刊61,1978,作者A.K. Varchneya及R.J. Petti所述以銅板或銅膜直接接合於陶瓷基材上;或以銀、金、銅及鎳藉印刷或其他方法施用於陶瓷基材上,直接進行鍍層或加熱數百度之後進行鍍層,但上述所提藉無電鍍銅沉澱的銅微粒粒徑大,與陶瓷基材表面不規則部分之接觸面積小,使銅微粒與陶瓷基材間的黏著性差,還需以有機化合物作為黏著劑,該化合物易裂化,黏合強度降低,中華民國第528814號發明專利提出一種鍍銅的陶瓷基材用於半導體,該專利以陶瓷基材層上設置薄膜鉻層,以及於鉻層上放置薄膜金層,其中金層以銅鍍層,金層與鉻層間形成另一金屬層增強黏著性,藉由金層及鉻層提高陶瓷層與銅層間之黏著性,以多層金屬輔助銅層附著於陶瓷基材上,該製程成本較為昂貴且工序多道。中華民國第I238452號發明專利,欲解決隨高集聚化所衍生金屬間之間距越小,而考慮隨金屬線之間的銅擴散等現象所產生漏電流問題點,提供利用鋁作為銅擴散防止膜之形成方法,以蒸鍍較薄的鋁膜之後,再對鋁膜表面上依NH3 施行電漿處理,而轉變為以氮化鋁(Alx Ny )為主幹的氮化膜,然後在上述氮化膜表面上蒸鍍鋁膜,並於所蒸鍍的表面膜上蒸鍍銅,已達到抑制銅之擴散,其以電漿蒸鍍 多道膜作為防止銅線擴散,製程較為複雜且未解決於陶瓷基材上抑制銅擴散導致漏電流問題。又如中華民國發明公開專利TW201134328A1所述,利用濺鍍製程在陶瓷基板表面形成一鎳金屬層,將該銅金屬層鍍膜於鎳金屬層上,將銅金屬層抗蝕刻乾膜剝除形成一陶瓷鍍銅基板。According to the method for manufacturing a copper-plated ceramic substrate, as described in American Ceramic Society Journal 61, 1978, by AK Varchneya and RJ Petti, a copper plate or a copper film is directly bonded to a ceramic substrate; or silver, gold, copper, and nickel. Applying to a ceramic substrate by printing or other methods, directly performing plating or heating for several hundred degrees, and then performing plating, but the copper particles precipitated by the electroless copper plating mentioned above have a large particle size and a contact area with an irregular portion of the surface of the ceramic substrate. Small, the adhesion between the copper particles and the ceramic substrate is poor, and an organic compound is required as an adhesive. The compound is easily cracked and the bonding strength is lowered. The invention patent of the Republic of China No. 528814 proposes a copper-plated ceramic substrate for a semiconductor. The patent has a thin film chromium layer on the ceramic substrate layer and a thin film gold layer on the chromium layer, wherein the gold layer is plated with copper, and another metal layer is formed between the gold layer and the chromium layer to enhance adhesion, by the gold layer and The chrome layer enhances the adhesion between the ceramic layer and the copper layer, and the multi-layer metal-assisted copper layer is attached to the ceramic substrate, which is relatively expensive and has many processes. Patent No. I238452 of the Republic of China, in order to solve the problem of leakage current caused by copper diffusion between metal wires, and to provide aluminum diffusion as a copper diffusion preventing film, in order to solve the problem of leakage current caused by copper diffusion between metal wires. a method of forming, after deposition in a thin aluminum film, then the upper surface of the aluminum plasma processing performed by NH 3, converted to a nitride film of aluminum nitride (Al x N y) as the backbone, and then The aluminum film is vapor-deposited on the surface of the nitride film, and copper is vapor-deposited on the vapor-deposited surface film to suppress the diffusion of copper. The plasma is vapor-deposited as a multi-channel film to prevent copper wire diffusion, and the process is complicated. It does not solve the problem of leakage current caused by suppressing copper diffusion on the ceramic substrate. Further, as described in the Republic of China invention patent TW201134328A1, a nickel metal layer is formed on the surface of the ceramic substrate by a sputtering process, the copper metal layer is coated on the nickel metal layer, and the copper metal layer is etched away to form a ceramic. Copper plated substrate.
LED產生的熱主要從LED晶粒基板傳導至系統電路板,而LED晶粒基板為晶粒與系統電路板間的媒介,基板材質為陶瓷基板為主依線路製備方式不同有低溫共燒多層陶瓷基板(LTCC,Low-Temperature Co-fired Ceramic)、高溫共燒多層陶瓷(HTCC,High-Temperature Co-fired Ceramic)、直接接合銅基板(DBC,Direct Bonded Copper)及直接鍍銅基板(DPC,Direct Plate Copper),LTCC加入玻璃材料使整體的熱傳導率降低至2~3W/mK之間,比其他陶瓷基板低,另LTCC與HTCC均採網印方式印製線路,使線路本身具有線徑寬度不夠精細、以及網版張網問題、導致線路精準度不足、表面平整度不佳等現象,加上多層疊壓燒結又有基板收縮比例之問題需考量,DBC的銅層與陶瓷基板附著性佳,採用1065℃~1085℃高溫熔煉,製造費用高,且基板與銅板間有微氣孔之問題不易解決,DPC之薄膜製程的真空濺鍍方式上鍍上薄銅,再以黃光微影製程完成線路,線徑寬度10~50μm,應用層面較適於高功率且小尺寸之LED。綜上所述如合增強陶瓷基板與金屬間黏合力、及提升佈線於基板上之線路精準度等仍為目前所欲解決之課題。The heat generated by the LED is mainly transmitted from the LED die substrate to the system circuit board, and the LED die substrate is the medium between the die and the system circuit board, and the substrate material is the ceramic substrate mainly according to the circuit preparation method, and the low temperature co-fired multilayer ceramic is different. LTCC (Low-Temperature Co-fired Ceramic), High-Temperature Co-fired Ceramic (HTCC), Direct Bonded Copper (DBC) and Direct Copper Plated (DPC, Direct) Plate Copper), LTCC added glass material to reduce the overall thermal conductivity to 2~3W/mK, which is lower than other ceramic substrates. LTCC and HTCC all use screen printing to print the circuit, so that the line itself has insufficient wire diameter. Fine, and screen-laid network problems, resulting in insufficient line accuracy, poor surface flatness, etc., plus multi-layer pressure sintering and substrate shrinkage ratio issues need to be considered, DBC copper layer and ceramic substrate adhesion, The use of high temperature melting at 1065 ° C ~ 1085 ° C, high manufacturing costs, and the problem of micro-pores between the substrate and the copper plate is not easy to solve, DPC film process vacuum sputtering method is coated with thin copper, and then yellow light Line lithography process is completed, 10 ~ 50μm, diameter wider than the application level suitable for high-power and small size of the LED. In summary, the improvement of the adhesion between the ceramic substrate and the metal, and the improvement of the accuracy of the wiring on the substrate are still the problems to be solved.
鑒於上述習知技術之缺點,本發明係提供一種氮化鋁基板厚銅覆銅之製備方法,該方法係以一氮化鋁基板表面濺鍍一層鈦或鎢金屬,再於鈦或鎢金屬層上電鍍銅層,並以一無氧銅厚板覆蓋於電鍍銅層之上,進行燒結製程,利用鈦、鎢等金屬可使銅線路電路與氮化鋁基板有較好之相容性,並以氮化鋁基板作為散熱基板係可提升LED電路板之散熱效率。In view of the above disadvantages of the prior art, the present invention provides a method for preparing a thick copper copper-clad of an aluminum nitride substrate by sputtering a titanium or tungsten metal on the surface of an aluminum nitride substrate, and then depositing a layer of titanium or tungsten. Electroplating a copper layer and covering the electroplated copper layer with an oxygen-free copper thick plate to perform a sintering process, and using a metal such as titanium or tungsten to make the copper circuit and the aluminum nitride substrate have better compatibility, and The aluminum nitride substrate is used as the heat dissipation substrate to improve the heat dissipation efficiency of the LED circuit board.
本發明之目的在於揭露一種氮化鋁基板厚銅覆銅之製備方法,先在氮化鋁基板分別鍍上鈦或鎢金屬、銅層完成燒結前製作,鍍上銅膜可使上下兩片基板能因銅互相擴散而接合在一起。在將電鍍好銅基板與氮化鋁基板疊在一起放置高溫爐燒結,利用燒結機制銅晶粒成長至氮化鋁基板,使厚銅基板與氮化鋁結合,完成後銅覆氮化鋁基板。由於直接敷銅陶瓷基板沒有添加任何針 焊成分,這樣就減少焊層,降低熱阻,減少孔洞,提高成品率,並且在相同載流量下0.3mm厚的銅箔線寬僅為普通印刷電路板的10%。無氧銅基板純度達99.99%、含氧量低於10ppm、以及其餘雜質低於50ppm,而一般銅厚板含有氧元素及其他雜質會影響其燒結後電路板之電性及機械性質。The object of the present invention is to disclose a method for preparing a copper-clad copper-clad copper-clad substrate, which is first prepared by plating titanium or tungsten metal and copper layers on the aluminum nitride substrate before sintering, and plating the copper film to make two upper and lower substrates Can be joined together by the mutual diffusion of copper. The plated copper substrate and the aluminum nitride substrate are stacked and placed in a high temperature furnace for sintering, and the copper grain is grown to an aluminum nitride substrate by a sintering mechanism, and the thick copper substrate is combined with the aluminum nitride to complete the copper-coated aluminum nitride substrate. . Since no direct needle is applied to the copper ceramic substrate The composition of the solder, thus reducing the solder layer, reducing the thermal resistance, reducing the hole, improving the yield, and the line width of the 0.3mm thick copper foil at the same current carrying capacity is only 10% of the ordinary printed circuit board. The oxygen-free copper substrate has a purity of 99.99%, an oxygen content of less than 10 ppm, and the remaining impurities are less than 50 ppm. However, the general copper plate containing oxygen and other impurities may affect the electrical and mechanical properties of the sintered circuit board.
本發明之另一目的在於一種氮化鋁基板厚銅覆銅之製備方法,該方法係包含以下步驟,提供一氮化鋁基板;利用濺鍍製程於該氮化鋁基板表面形成一鈦或鎢金屬層;以電鍍方式將銅金屬形成於該鈦或鎢金屬層上,形成複合基材;提供一無氧銅厚板;將該無氧銅厚板之一面與該複合基材結合;將結合之基板置於氣氛高溫爐,進行燒結製程溫度設定900~1050℃,並使腔體充滿氮氣隔絕空氣。更可將該無氧銅厚板之另一面與該複合基材結合,其中鈦或鎢金屬係可為純鈦金屬、純鎢金屬、鈦合金或鎢合金。Another object of the present invention is a method for preparing a copper-clad copper-clad copper-clad substrate, the method comprising the steps of: providing an aluminum nitride substrate; forming a titanium or tungsten on the surface of the aluminum nitride substrate by using a sputtering process a metal layer; forming a copper metal on the titanium or tungsten metal layer by electroplating to form a composite substrate; providing an oxygen-free copper thick plate; bonding one side of the oxygen-free copper thick plate to the composite substrate; The substrate is placed in an atmosphere high temperature furnace, and the sintering process temperature is set to 900 to 1050 ° C, and the chamber is filled with nitrogen to isolate the air. The other side of the oxygen-free copper thick plate may be combined with the composite substrate, wherein the titanium or tungsten metal may be pure titanium metal, pure tungsten metal, titanium alloy or tungsten alloy.
以上之概述與接下來的詳細說明,是為了能進一步說明本發明達到預定目的所採取的方式、手段及功效。而有關本發明的其它目的及優點,將在後續的說明中加以闡述。The above summary and the following detailed description are intended to further illustrate the manner, means and function of the present invention to achieve the intended purpose. Other objects and advantages of the present invention will be set forth in the description which follows.
S11~S16‧‧‧步驟S11~S16‧‧‧Steps
S21~S26‧‧‧步驟S21~S26‧‧‧Steps
11‧‧‧氮化鋁11‧‧‧Aluminum nitride
12‧‧‧鈦金屬12‧‧‧Titanium
13‧‧‧電鍍銅層13‧‧‧Electroplated copper layer
14‧‧‧無氧銅厚板14‧‧‧Oxygen-free copper plate
21‧‧‧氮化鋁21‧‧‧Aluminum nitride
22‧‧‧鎢金屬22‧‧‧Tungsten metal
23‧‧‧電鍍銅層23‧‧‧Electroplated copper layer
24‧‧‧無氧銅厚板24‧‧‧Oxygen-free copper plate
25‧‧‧電鍍銅層25‧‧‧Electroplated copper layer
26‧‧‧鈦金屬26‧‧‧Titanium
27‧‧‧氮化鋁27‧‧‧Aluminum nitride
第一圖係為本發明實施例一之流程圖The first figure is a flowchart of Embodiment 1 of the present invention.
第二圖係為本發明實施例一之結構示意圖The second figure is a schematic structural view of the first embodiment of the present invention.
第三圖係為本發明實施例二之流程圖The third figure is a flowchart of the second embodiment of the present invention.
第四圖係為本發明實施例二之結構示意圖The fourth figure is a schematic structural view of the second embodiment of the present invention.
以下係藉由特定具體實例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示內容輕易地瞭解本發明之其它優點與功效。The embodiments of the present invention are described below by way of specific examples, and those skilled in the art can readily appreciate the other advantages and advantages of the present invention.
實施例一Embodiment 1
請參閱本發明第一圖流程圖,一種氮化鋁基板厚銅覆銅之製備方法,該方法係包含以下步驟:提供一氮化鋁基板S11;利用濺鍍製程於該氮化鋁基板表面形成一鈦或鎢金屬層S12;以電鍍方式將銅金屬形成於該鈦或鎢金屬層上,形成複合基材S13;提供一無氧銅厚板S14;將該無氧銅厚板之一面與該複合基材結合S15;將結合之基板置於氣氛高溫爐,進行燒結製程S16。藉由本實施例形成之 氮化鋁基板厚銅覆銅結構如第二圖所示,圖中氮化鋁11為基板於該氮化鋁11基板上係為1~2μm純鈦金屬12,純鈦金屬之上係為20~28μm電鍍銅層13,最後以0.4~0.7mm無氧銅厚板14覆蓋於該電鍍銅層13之上,形成一氮化鋁基板厚銅覆銅結構。Please refer to the flow chart of the first embodiment of the present invention, a method for preparing a thick copper copper-clad of an aluminum nitride substrate, the method comprising the steps of: providing an aluminum nitride substrate S11; forming a surface of the aluminum nitride substrate by using a sputtering process a titanium or tungsten metal layer S12; forming a copper metal on the titanium or tungsten metal layer by electroplating to form a composite substrate S13; providing an oxygen-free copper plate S14; and etching the one side of the oxygen-free copper plate The composite substrate is combined with S15; the bonded substrate is placed in an atmosphere high temperature furnace to perform a sintering process S16. Formed by this embodiment The thick copper-clad structure of the aluminum nitride substrate is as shown in the second figure. In the figure, the aluminum nitride 11 is a substrate of 1 to 2 μm pure titanium metal 12 on the aluminum nitride 11 substrate, and 20 on the pure titanium metal. The 28μm electroplated copper layer 13 is finally overlaid on the electroplated copper layer 13 with a 0.4-0.7 mm oxygen-free copper plate 14 to form a thick copper-copper structure of an aluminum nitride substrate.
實施例二Embodiment 2
請參閱本發明第三圖流程圖,另一種氮化鋁基板厚銅覆銅之製備方法,該方法係包含以下步驟:提供一氮化鋁基板S21;利用濺鍍製程於該氮化鋁基板表面形成一鈦或鎢金屬層S22;以電鍍方式將銅金屬形成於該鈦或鎢金屬層上,形成複合基材S23;提供一無氧銅厚板S24;將該無氧銅厚板之兩面分別與該複合基材結合S25;將結合之基板置於氣氛高溫爐,進行燒結製程S26。藉由本實施例形成之氮化鋁基板厚銅覆銅結構,請參閱第四圖所示其中氮化鋁21為基板於該氮化鋁21基板上係為1~2μm純鎢金屬22,純鎢金屬之上係為20~28μm電鍍銅層23,形成第一氮化鋁複合材料與0.4~0.7mm無氧銅厚板24之一面結合,另以包含電鍍銅層25、純鈦金屬26及氮化鋁27之第二氮化鋁複合材料,其中的電鍍銅層25與無氧銅厚板24之另一面結合,形成另一種氮化鋁基板厚銅覆銅結構。Please refer to the flow chart of the third embodiment of the present invention, another method for preparing a thick copper copper-clad of an aluminum nitride substrate, the method comprising the steps of: providing an aluminum nitride substrate S21; and using a sputtering process on the surface of the aluminum nitride substrate Forming a titanium or tungsten metal layer S22; forming a copper metal on the titanium or tungsten metal layer by electroplating to form a composite substrate S23; providing an oxygen-free copper plate S24; and respectively forming the two sides of the oxygen-free copper plate S25 is combined with the composite substrate; the bonded substrate is placed in an atmosphere high temperature furnace, and a sintering process S26 is performed. The thick copper-copper-clad structure of the aluminum nitride substrate formed by the embodiment is as shown in the fourth figure, wherein the aluminum nitride 21 is a substrate on the aluminum nitride 21 substrate, which is 1 to 2 μm pure tungsten metal 22, pure tungsten. The metal is 20~28μm electroplated copper layer 23, and the first aluminum nitride composite material is combined with one side of 0.4-0.7mm oxygen-free copper thick plate 24, and further comprises electroplated copper layer 25, pure titanium metal 26 and nitrogen. The second aluminum nitride composite material of the aluminum alloy 27, wherein the electroplated copper layer 25 is combined with the other side of the oxygen-free copper thick plate 24, forms another thick aluminum-clad copper-clad structure of the aluminum nitride substrate.
上述之實施例僅為例示性說明本發明之特點及其功效,而非用於限制本發明之實質技術內容的範圍。任何熟悉此技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修飾與變化。因此,本發明之權利保護範圍,應如後述之申請專利範圍所列。The above-described embodiments are merely illustrative of the features and functions of the present invention and are not intended to limit the scope of the technical scope of the present invention. Modifications and variations of the above-described embodiments can be made by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as set forth in the scope of the claims described below.
S11~S16‧‧‧步驟S11~S16‧‧‧Steps
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TWI667764B (en) * | 2018-06-29 | 2019-08-01 | 大陸商長江存儲科技有限責任公司 | Semiconductor structure and method of forming the same |
CN110493951A (en) * | 2019-09-27 | 2019-11-22 | 德胜光电股份有限公司 | Aluminium nitride ceramics board structure of circuit |
CN110650595A (en) * | 2019-09-27 | 2020-01-03 | 德胜光电股份有限公司 | Method for manufacturing ceramic circuit board |
CN110662359A (en) * | 2019-09-27 | 2020-01-07 | 德胜光电股份有限公司 | Silicon nitride ceramic circuit board structure |
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CN106888551A (en) * | 2017-04-17 | 2017-06-23 | 深圳市环基实业有限公司 | A kind of ceramic base copper-clad plate and its preparation technology |
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CN102448663A (en) * | 2009-05-27 | 2012-05-09 | 京瓷株式会社 | Solder material, heat dissipation base using same, and electronic device |
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Publication number | Priority date | Publication date | Assignee | Title |
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TWI667764B (en) * | 2018-06-29 | 2019-08-01 | 大陸商長江存儲科技有限責任公司 | Semiconductor structure and method of forming the same |
CN110493951A (en) * | 2019-09-27 | 2019-11-22 | 德胜光电股份有限公司 | Aluminium nitride ceramics board structure of circuit |
CN110650595A (en) * | 2019-09-27 | 2020-01-03 | 德胜光电股份有限公司 | Method for manufacturing ceramic circuit board |
CN110662359A (en) * | 2019-09-27 | 2020-01-07 | 德胜光电股份有限公司 | Silicon nitride ceramic circuit board structure |
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