TWI463358B - Ghost cancellation method for multi-touch sensitive device - Google Patents

Ghost cancellation method for multi-touch sensitive device Download PDF

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TWI463358B
TWI463358B TW099114639A TW99114639A TWI463358B TW I463358 B TWI463358 B TW I463358B TW 099114639 A TW099114639 A TW 099114639A TW 99114639 A TW99114639 A TW 99114639A TW I463358 B TWI463358 B TW I463358B
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line
axis
touched
sensing
point
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TW201140390A (en
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Hung Wei Wu
Chih Yu Chang
Tsan Hwi Chen
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Silicon Integrated Sys Corp
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用於多點觸控感測裝置之鬼點去除方法Ghost point removal method for multi-touch sensing device

本發明係關於多點觸控技術,更明確而言,係關於用於多點觸控感測裝置之鬼點去除方法。The present invention relates to multi-touch technology, and more particularly to ghost point removal methods for multi-touch sensing devices.

在多點觸控感測裝置中,像是觸控面板,一般來說有兩種類型的感測方法用以感測一或多點觸碰。一種方式稱為投射式感測方法,另一種是矩陣式感測方法。在投射式感測方法中,裝置每次是感測感測陣列的一整條線。In a multi-touch sensing device, such as a touch panel, there are generally two types of sensing methods for sensing one or more touches. One method is called a projection sensing method, and the other is a matrix sensing method. In the projected sensing method, the device senses an entire line of the sensing array each time.

在矩陣式感測方法中,裝置每次感測觸碰感測陣列的一個節點(亦即一行與一列的交點)。如可知者,實行矩陣式感測方法比投射式感測方法明顯花費較多時間。以20×30的感測陣列而言(亦即具有20列與30行之感測陣列),總共有20+30=50條線,因此當利用投射式感測方法時,僅需要50次檢測。相對而言,有20×30=600個節點,故當利用矩陣式感測方法時,需要600次檢測。In a matrix sensing method, the device senses one node of the touch sensing array each time (ie, the intersection of one row and one column). As can be seen, the implementation of the matrix sensing method takes significantly more time than the projection sensing method. In the case of a 20×30 sensing array (that is, a sensing array with 20 columns and 30 rows), there are 20+30=50 lines in total, so when using the projection sensing method, only 50 detections are required. . In contrast, there are 20 × 30 = 600 nodes, so when using the matrix sensing method, 600 tests are required.

現今在速度與成本的考量下,投射式感測方法係廣泛使用於各種觸碰裝置。然而,投射式感測方法的缺點在於所謂的「鬼點問題」,以下將加以說明。Today's speed and cost considerations, projection sensing methods are widely used in a variety of touch devices. However, the disadvantage of the projection sensing method is the so-called "ghost point problem", which will be described below.

第1圖係概略顯示一般的多點觸控感測裝置1。該多點觸控感測裝置1具有一感測陣列10。感測陣列10包含一群縱向傳導軌(亦即線a至線f)以及一群橫向傳導軌(亦即線1至線7)排列成X-Y座標系的行與列。或者,該等傳導軌可以排列成極座標系。感測元件(未圖示)係設置於該等傳導軌的各個交點。舉例而言,感測元件通常以電阻器或電容器實施。觸控感測器電路22、24施加驅動信號至該等軌以感測是否有觸碰。各觸控感測器電路22、24包含多個觸控感測器(未在圖中顯示)。各觸控感測器負責驅動與感測一或多條軌。觸控感測器電路22和24由控制器30控制。Fig. 1 schematically shows a general multi-touch sensing device 1. The multi-touch sensing device 1 has a sensing array 10. The sensing array 10 includes a plurality of longitudinal transmissive rails (i.e., lines a to f) and a plurality of lateral transmissive rails (i.e., lines 1 through 7) arranged in rows and columns of X-Y coordinate systems. Alternatively, the transfer guides may be arranged in a polar coordinate system. Sensing elements (not shown) are provided at respective intersections of the transfer guides. For example, the sensing element is typically implemented as a resistor or capacitor. The touch sensor circuits 22, 24 apply drive signals to the tracks to sense if there is a touch. Each of the touch sensor circuits 22, 24 includes a plurality of touch sensors (not shown). Each touch sensor is responsible for driving and sensing one or more tracks. Touch sensor circuits 22 and 24 are controlled by controller 30.

在本例中,假設兩個觸碰同時發生在B點與C點,其坐標分別為(e,2)、(c,6)。使用投射式感測方法。在X軸方向,發現在線c與線e處有兩個峰值。在Y軸方向,發現在線2與線6處有兩個峰值。根據排列組合的原理,四個峰值可以組成四組座標:(c,2)、(c,6)、(e,2)、及(e,6)。換言之,除了實際觸碰點B和C之外,裝置1會誤判在A點(c,2)與D點(e,6)也發生觸碰。未被觸碰卻被誤判被觸碰的A點與D點稱為「鬼點」。In this example, assume that two touches occur simultaneously at points B and C, with coordinates (e, 2), (c, 6), respectively. Use a projected sensing method. In the X-axis direction, it is found that there are two peaks at the line c and the line e. In the Y-axis direction, it is found that there are two peaks at line 2 and line 6. According to the principle of permutation and combination, the four peaks can form four sets of coordinates: (c, 2), (c, 6), (e, 2), and (e, 6). In other words, in addition to the actual touch points B and C, the device 1 misjudges that a touch occurs also at point A (c, 2) and point D (e, 6). Points A and D that have not been touched but are misjudged and touched are called "ghost points".

如果利用矩陣感測方法檢測感測陣列10的每個節點,可判定實際觸碰點B和C,而可排除鬼點問題。然而,如上所述,如此花費太多時間。If the matrix sensing method is used to detect each node of the sensing array 10, the actual touch points B and C can be determined, and the ghost point problem can be eliminated. However, as described above, it takes so much time.

本發明之目的在於提供一種用於多點觸控感測裝置之鬼點去除方法,當在裝置發生複數觸碰時,能有效果且有效率地排除鬼點。It is an object of the present invention to provide a ghost point removal method for a multi-touch sensing device that can effectively and efficiently eliminate ghost points when multiple touches occur in the device.

根據本發明,多點觸控感測裝置包括有感測陣列,感測陣列具有第一軸之多條線與第二軸之多條線相互交叉,鬼點去除方法包含施加第一驅動信號至第一軸之各條線;檢測第一軸被驅動的各條線以判定該條線是否被觸碰;施加第二驅動信號至第二軸之各條線;檢測第二軸被驅動的各條線以判定該條線是否被觸碰;根據第一軸被觸碰的線與第二軸被觸碰的線決定候選觸碰點;施加第三驅動信號至各候選觸碰點的第一軸之線;以及檢測各候選觸碰點的第二軸之線以判定該候選觸碰點是否被觸碰。According to the present invention, the multi-touch sensing device includes a sensing array, the sensing array having a plurality of lines of the first axis and a plurality of lines of the second axis intersecting each other, and the ghost point removing method includes applying the first driving signal to Each line of the first axis; detecting each line driven by the first axis to determine whether the line is touched; applying a second driving signal to each line of the second axis; detecting each of the second axis being driven a line to determine whether the line is touched; determining a candidate touch point according to a line touched by the first axis and a line touched by the second axis; applying a third driving signal to the first of each candidate touch point a line of the axis; and a line detecting the second axis of each candidate touch point to determine whether the candidate touch point is touched.

如所述,對於多點觸控裝置1而言,投射式感測方法可迅速完成檢測以決定觸碰點。然而,所決定的觸碰點可能包括了鬼點。而利用矩陣式感測方法檢測所有節點以找到實際觸碰點又花費太多時間。本發明提供一種鬼點去除方法可解決上述問題。As described, for the multi-touch device 1, the projection sensing method can quickly complete the detection to determine the touch point. However, the touch points determined may include ghost points. It takes too much time to detect all nodes using the matrix sensing method to find the actual touch point. The present invention provides a ghost point removal method that can solve the above problems.

在本發明之鬼點去除方法中,首先藉由利用投射式感測方法決定候選觸碰點,而後藉由利用矩陣式感測方法測試候選觸碰點以驗證實際觸碰點並排除鬼點。In the ghost point removing method of the present invention, candidate touch points are first determined by using a projection sensing method, and then the candidate touch points are tested by using a matrix sensing method to verify the actual touch points and exclude ghost points.

第2圖係概略顯示一觸控感測器220實行投射式感測方法的一個例子。如所數,觸控感測器電路22和24各包含多個觸控感測器以驅動並感測第1圖之感測陣列10的各條線。觸控感測器220具有一波形產生器221,其產生具有頻率f1之方波(或正弦波)。該方波係施加至一電壓驅動器223以驅動一交流(AC)電壓源224。該AC電壓源224則根據該方波產生一驅動信號Vd。該驅動信號Vd具有振幅V1。該電壓源224係經由電阻分壓器Rz連接至一線13(例如第1圖之感測陣列10的一條軌)。該電阻分壓器Rz的一端係與該電壓源224連接,另一端與線13與一緩衝器226的一端(亦即輸入端)連接。感測信號Vs係於該緩衝器226的另一端(亦即輸出端)檢測。該感測信號Vs係傳送至觸控感測器220之感測電路(未圖示)。該緩衝器226係用以隔離兩端的阻抗,使感測電路不會受到外部阻抗影響。緩衝器226具有輸入阻抗(impedance)高、輸出阻抗低的特性,使得觸控感測器220之感測電路(未圖示)透過緩衝器226來量測線13的分壓值,這是因為該緩衝器226的輸入阻抗夠高而不影響前級各感測線的分壓之外,也因為其輸出阻抗夠低而如同一個電壓源(voltage source)以驅動觸控感測器220之感測電路。該緩衝器226可利用運算放大器(Operational Amplifier)來實現。FIG. 2 is a diagram schematically showing an example of a touch sensing method performed by the touch sensor 220. As shown, touch sensor circuits 22 and 24 each include a plurality of touch sensors to drive and sense the lines of sense array 10 of FIG. The touch sensor 220 has a waveform generator 221 that generates a square wave (or sine wave) having a frequency f1. The square wave system is applied to a voltage driver 223 to drive an alternating current (AC) voltage source 224. The AC voltage source 224 generates a drive signal Vd based on the square wave. The drive signal Vd has an amplitude V1. The voltage source 224 is coupled to a line 13 (e.g., one track of the sensing array 10 of FIG. 1) via a resistor divider Rz. One end of the resistor divider Rz is connected to the voltage source 224, and the other end is connected to the line 13 and one end (ie, the input end) of a buffer 226. The sense signal Vs is detected at the other end (ie, the output) of the buffer 226. The sensing signal Vs is transmitted to a sensing circuit (not shown) of the touch sensor 220. The buffer 226 is used to isolate the impedance at both ends so that the sensing circuit is not affected by external impedance. The buffer 226 has a characteristic that the input impedance is high and the output impedance is low, so that the sensing circuit (not shown) of the touch sensor 220 passes the buffer 226 to measure the voltage dividing value of the line 13, because The input impedance of the buffer 226 is high enough not to affect the voltage division of the sensing lines of the previous stage, and because the output impedance is low enough to act as a voltage source to drive the sensing of the touch sensor 220. Circuit. The buffer 226 can be implemented using an operational amplifier (Operational Amplifier).

.

當線13未被觸碰時,線13為浮接,因此理想上此時感測信號Vs應大致與驅動信號Vd的電壓值V1相同。當線13被人類手指觸碰,線13係經由人體接地,造成一電壓降,使得感測信號Vs等於分壓Vp,其分壓Vp可以下列公式計算:When the line 13 is not touched, the line 13 is floating, so ideally the sense signal Vs should be substantially the same as the voltage value V1 of the drive signal Vd. When the line 13 is touched by a human finger, the line 13 is grounded via the human body, causing a voltage drop such that the sensing signal Vs is equal to the divided voltage Vp, and the divided voltage Vp can be calculated by the following formula:

其中Cf為人類手指與線13之間的耦合電容,Cb表示人體的等效電容,Rb表示人體的等效電阻,而ω=2πf1。當線13被觸碰時,由於電壓降,使得感測信號Vs的振幅下降。亦即,感測信號Vs的振幅在被觸碰時小於未被觸碰時的振幅(Vp<V1)。因此,可藉由檢查感測信號Vs的振幅來判定線13有無被觸碰。感測陣列10(第1圖)之所有行與列均以此方式檢測,因此可知哪些行與哪些列被觸碰。應注意可藉由利用不同的驅動信號,例如具有不同頻率的驅動信號,而同時驅動一條以上的線。此外,可同時檢測一條以上的線。藉由該等被觸碰的行與列可決定候選觸碰點。應注意的是,此等候選觸碰點包括如上所述之實際觸碰點與鬼點。對於一二維感測陣列而言,被觸碰的行數與被觸碰的列數應該相同。候選觸碰點為該等被觸碰的行與被觸碰的列之交點。候選觸碰點的數目為被觸碰之行數與被觸碰之列數的乘積。例如,如果有兩列與兩行被觸碰,則有四個候選觸碰點。Where Cf is the coupling capacitance between the human finger and the line 13, Cb represents the equivalent capacitance of the human body, Rb represents the equivalent resistance of the human body, and ω = 2πf1. When the line 13 is touched, the amplitude of the sensing signal Vs drops due to the voltage drop. That is, the amplitude of the sensing signal Vs is smaller than the amplitude (Vp < V1) when it is touched when it is touched. Therefore, it is possible to determine whether or not the line 13 is touched by checking the amplitude of the sensing signal Vs. All rows and columns of the sensing array 10 (Fig. 1) are detected in this manner, so that which rows and which columns are touched are known. It should be noted that more than one line can be driven simultaneously by utilizing different drive signals, such as drive signals having different frequencies. In addition, more than one line can be detected simultaneously. The candidate touch points can be determined by the touched rows and columns. It should be noted that these candidate touch points include the actual touch points and ghost points as described above. For a two-dimensional sensing array, the number of rows touched should be the same as the number of columns touched. The candidate touch point is the intersection of the touched line and the touched column. The number of candidate touch points is the product of the number of touched lines and the number of columns touched. For example, if there are two columns and two rows being touched, there are four candidate touch points.

第3圖係概略顯示另一形式之觸控感測器240實行投射式感測方法。該觸控感測器240具有一波形產生器241,其產生具有頻率f1之方波(或正弦波)。該方波係施加至一電流驅動器243以驅動一交流(AC)電流源244。該AC電流源244依據該方波產生一驅動信號Id。該驅動信號Id係用於驅動一線12。在圖中,電容器Cs表示從線12觀察到的電容。當線12被觸碰,Cs之電容改變。因此,可藉由觀察Cs之電容來判定線12是否被觸碰。應注意其他合適類型的觸控感測器亦可用來檢測感測陣列所有的線(亦即所有的行與列),從而決定候選觸碰點,緩衝器246係用以隔離兩端的阻抗,使觸控感測器240之感測電路(未圖示)不會受到外部阻抗影響。該緩衝器246的目的如同前述緩衝器226一樣,在此不再贅述。。FIG. 3 is a schematic diagram showing another form of touch sensor 240 that implements a projection sensing method. The touch sensor 240 has a waveform generator 241 that generates a square wave (or sine wave) having a frequency f1. The square wave system is applied to a current driver 243 to drive an alternating current (AC) current source 244. The AC current source 244 generates a drive signal Id according to the square wave. The drive signal Id is used to drive a line 12. In the figure, capacitor Cs represents the capacitance observed from line 12. When line 12 is touched, the capacitance of Cs changes. Therefore, it can be determined whether the line 12 is touched by observing the capacitance of Cs. It should be noted that other suitable types of touch sensors can also be used to detect all lines of the sensing array (ie, all rows and columns) to determine candidate touch points, and the buffer 246 is used to isolate the impedance at both ends. The sensing circuit (not shown) of touch sensor 240 is not affected by external impedance. The purpose of the buffer 246 is the same as that of the buffer 226 described above, and details are not described herein again. .

如果兩根手指同時觸碰該多點觸控感測裝置1,最多將會有四的候選觸碰點。在本發明之方法中,該等候選觸碰點係利用矩陣感測方法加以檢查。以下將詳述。If two fingers touch the multi-touch sensing device 1 at the same time, there will be at most four candidate touch points. In the method of the present invention, the candidate touch points are examined using a matrix sensing method. It will be detailed below.

第4圖係概略顯示根據本發明利用矩陣式感測方法測試觸控感測陣列之一節點。如所示,於本實施例中,感測陣列的各條線係連接至第2圖之觸控感測器220(或第3圖之觸控感測器240)。亦可數條線以多工方式共用一個觸控感測器。為了簡化與清楚起見,於此圖中僅顯示兩列(線1與線2)與兩行(線a與線b)。在第4圖所示之例子中,假設已知E點與F點兩者為候選觸碰點(在該例中,E點為實際觸碰點,而F點表示一鬼點)。E點為線a與線2之交點,因此其座標為(a,2)。F點為線b與線2之交點,因此其座標為(b,2)。為測試一節點(一特定列與一特定行的交點),驅動信號(例如Vd)係施加至第一軸(例如X軸)的線,亦即相關於該節點的列,且第二軸(例如Y軸)的線被檢測,亦即相關於該節點的行被檢測,以取得感測信號(例如Vs)。或者,驅動信號係傳送至相關於該節點的行,而檢測相關於該節點的列。Figure 4 is a schematic diagram showing the testing of one of the touch sensing array nodes using a matrix sensing method in accordance with the present invention. As shown, in the present embodiment, each line of the sensing array is connected to the touch sensor 220 of FIG. 2 (or the touch sensor 240 of FIG. 3). A number of lines can also share one touch sensor in a multiplex manner. For simplicity and clarity, only two columns (line 1 and line 2) and two rows (line a and line b) are shown in this figure. In the example shown in Fig. 4, it is assumed that both the E point and the F point are known as candidate touch points (in this example, point E is the actual touch point and point F represents a ghost point). Point E is the intersection of line a and line 2, so its coordinates are (a, 2). Point F is the intersection of line b and line 2, so its coordinate is (b, 2). To test a node (the intersection of a particular column and a particular row), a drive signal (eg, Vd) is applied to the line of the first axis (eg, the X axis), ie, the column associated with the node, and the second axis ( A line such as the Y-axis is detected, that is, a line associated with the node is detected to obtain a sensing signal (e.g., Vs). Alternatively, the drive signal is transmitted to the row associated with the node and the column associated with the node is detected.

為檢查E點是否被觸碰,驅動信號Vd係施加於線2,並檢測線a。由於E點實際上有被手指觸碰,在線2與線a之間經由人體形成導電迴路,使得感測信號Vs可從線a測得。理想上,感測信號Vs大致與驅動信號Vd相同。To check if the E point is touched, the drive signal Vd is applied to the line 2, and the line a is detected. Since the point E is actually touched by the finger, a conductive loop is formed between the line 2 and the line a via the human body, so that the sensing signal Vs can be measured from the line a. Ideally, the sense signal Vs is substantially the same as the drive signal Vd.

為檢查F點是否被觸碰,驅動信號Vd係施加於線2,並檢測線b。由於F點並未被觸碰,無導電迴路形成於線2與線b之間。因此,當檢測線b時,不會測得感測信號。據此可判定F點為鬼點。To check if the F point is touched, the drive signal Vd is applied to the line 2, and the line b is detected. Since point F is not touched, no conductive loop is formed between line 2 and line b. Therefore, when the line b is detected, the sensing signal is not measured. According to this, it can be determined that point F is a ghost point.

第5A至5D圖闡示藉由根據本發明一實施例之方法測試候選觸碰點。圖中所示之多點觸控感測裝置係與第1圖中類同,相同的元件符號表示相同的元件,在此省略相關說明以避免冗贅。如所述者,各觸控感測器電路22、24包含複數個觸控感測器(例如第2圖所示之觸控感測器220或第3圖所示之觸控感測器240)。Figures 5A through 5D illustrate testing candidate touch points by a method in accordance with an embodiment of the present invention. The multi-touch sensing device shown in the drawing is the same as that in FIG. 1, and the same component symbols denote the same components, and the related description is omitted here to avoid redundancy. As shown, each of the touch sensor circuits 22 and 24 includes a plurality of touch sensors (for example, the touch sensor 220 shown in FIG. 2 or the touch sensor 240 shown in FIG. 3; ).

感測陣列10的所有行與列,亦即線1-7以及線a-f係利用投射式感測方法加以掃描以判定何者被觸碰。藉由如此,可決定數個候選觸碰點。如所述,當B點與C點同時被觸碰,除了B點與C點以外,藉由利用投射式感測方法,裝置1亦會誤以為A點與D點為觸碰點。換言之,有四個候選觸碰點A、B、C、D。於本實施例中,係逐一檢查候選觸碰點。All rows and columns of sense array 10, i.e., lines 1-7 and lines a-f, are scanned using projection sensing methods to determine which one is touched. By doing so, several candidate touch points can be determined. As described above, when point B and point C are touched at the same time, in addition to point B and point C, by using the projection sensing method, the device 1 may mistakenly point that point A and point D are touch points. In other words, there are four candidate touch points A, B, C, D. In this embodiment, the candidate touch points are checked one by one.

如第5A圖所示,係檢查A點。驅動信號係施加於線2,並檢測線c。由於A點未被觸碰,從線c不會檢測到感測信號。如第5B圖所示,係檢查B點。驅動信號係施加於線2,並檢測線e。由於B點有被觸碰,係從線e檢測到感測信號。如第C圖所示,係檢查C點。驅動信號係施加於線6,並檢測線c。由於C點有被觸碰,係從線c檢測到感測信號。如第5D圖所示,係檢查D點。驅動信號係施加於線6,並檢測線e。由於D點未被觸碰,從線e不會檢測到感測信號。As shown in Figure 5A, check point A. The drive signal is applied to line 2 and line c is detected. Since point A is not touched, the sensing signal is not detected from line c. As shown in Fig. 5B, check point B. The drive signal is applied to line 2 and line e is detected. Since the point B is touched, the sensing signal is detected from the line e. As shown in Figure C, check point C. The drive signal is applied to line 6 and line c is detected. Since the point C is touched, the sensing signal is detected from the line c. As shown in Fig. 5D, the point D is checked. The drive signal is applied to line 6 and line e is detected. Since point D is not touched, the sensing signal is not detected from line e.

第6A圖與第6B圖闡示藉由根據本發明另一實施例之方法測試候選觸碰點。本實施例與前一實施例的差異在於同一列的候選觸碰點係同時檢查。如第6A圖所示,係同時檢查候選觸碰點A點與B點。驅動信號係施加至線2,並同時檢測線c和線e。由於A點未被觸碰而B點有被觸碰,從線c未檢測到感測信號,但從線e有檢測到感測信號。FIGS. 6A and 6B illustrate testing candidate touch points by a method in accordance with another embodiment of the present invention. The difference between this embodiment and the previous embodiment is that the candidate touch points of the same column are simultaneously checked. As shown in Fig. 6A, the candidate touch points A and B are simultaneously checked. The drive signal is applied to line 2 and simultaneously detects line c and line e. Since point A is not touched and point B is touched, the sensing signal is not detected from line c, but a sensing signal is detected from line e.

同理,如第6B圖所示,係同時檢查候選觸碰點C點與D點。驅動信號係施加於線6,並同時檢測線c及線e。由於C點有被觸碰而D點未被觸碰,係從線c檢測到感測信號,但從線e未檢測到感測信號。Similarly, as shown in FIG. 6B, the candidate touch points C and D are simultaneously checked. The drive signal is applied to line 6 and simultaneously detects line c and line e. Since the point C is touched and the point D is not touched, the sensing signal is detected from the line c, but the sensing signal is not detected from the line e.

本發明之用於多點觸控感測裝置之鬼點去除方法可歸納成第7圖所示之流程圖。多點觸控感測裝置1具有感測陣列10。該感測陣列10具有第一軸(如X軸)之多條線以及第二軸(如Y軸)之多條線。第一軸的線與第二軸的線相互交叉以構成例如正交座標系或是極座標系。程序開始於步驟S710。在步驟S720,將第一驅動信號施加至第一軸(如X軸)之各條線,並檢測同條線。如上所述,如果一條特定線未被觸碰,從此條線檢測到的感測信號大致上與驅動信號相同。如果一條特定線被觸碰,則從此條線檢測到的感測信號其振幅會減小。在此步驟中,係找出第一軸之被觸碰的線。在步驟S730,將第二驅動信號施加至第二軸(如Y軸)之各條線,並檢測同條線。在此步驟中,係找出第二軸被觸碰的線。在步驟S740,藉由分析感測信號來決定觸碰點。換言之,係根據第一軸被觸碰的線與第二軸被觸碰的線而初步決定觸碰點。在步驟S750,判斷所決定的觸碰點是否不明確。在此步驟可利用各種算則。判斷技術並非本發明欲討論之課題。如果初步決定的觸碰點並不會不明確,則程序返回步驟S710以進行下一輪感測觸碰。如果初步決定的觸碰點不明確,意味著該等所決定的觸碰點包括鬼點,則程序進行至S760以排除鬼點。The ghost point removing method for the multi-touch sensing device of the present invention can be summarized into the flowchart shown in FIG. The multi-touch sensing device 1 has a sensing array 10. The sensing array 10 has a plurality of lines of a first axis (such as an X axis) and a plurality of lines of a second axis (such as a Y axis). The line of the first axis intersects the line of the second axis to form, for example, an orthogonal coordinate system or a polar coordinate system. The program begins in step S710. At step S720, the first drive signal is applied to each of the first axes (e.g., the X-axis), and the same line is detected. As described above, if a particular line is not touched, the sensed signal detected from this line is substantially the same as the drive signal. If a particular line is touched, the amplitude of the sensed signal detected from this line decreases. In this step, the line touched by the first axis is found. In step S730, a second driving signal is applied to each of the second axes (such as the Y-axis), and the same line is detected. In this step, the line where the second axis is touched is found. At step S740, the touch point is determined by analyzing the sensing signal. In other words, the touch point is initially determined based on the line touched by the first axis and the line touched by the second axis. At step S750, it is judged whether or not the determined touch point is ambiguous. Various rules can be utilized in this step. The judgment technique is not the subject of the present invention. If the initially determined touch point is not ambiguous, the process returns to step S710 to perform the next round of sensing touch. If the initially determined touch point is not clear, meaning that the determined touch points include ghost points, the program proceeds to S760 to exclude ghost points.

現在,不明確的觸碰點係為候選觸碰點。在步驟S760,係檢查該等候選觸碰點。將第三驅動信號施加至一候選觸碰點的第一軸之線,並檢測該候選觸碰點的第二軸之線。在此步驟中,係判定所檢查的候選觸碰點是實際觸碰點或是鬼點,該第三驅動信號和第一驅動信號及第二驅動信號都是由觸控感測器220所產生,不同的是該第三驅動信號的目的是用來探測鬼點。在步驟S770,根據步驟S760的結果去除鬼點。在步驟S780,決定是否要執行對下一個候選觸碰點的測試。如是,則程序返回步驟S760。Now, unclear touch points are candidate touch points. At step S760, the candidate touch points are checked. A third drive signal is applied to a line of a first axis of a candidate touch point and a line of the second axis of the candidate touch point is detected. In this step, it is determined that the candidate touch point to be inspected is an actual touch point or a ghost point, and the third driving signal and the first driving signal and the second driving signal are both generated by the touch sensor 220. The difference is that the purpose of the third driving signal is to detect ghost points. At step S770, ghost points are removed according to the result of step S760. At step S780, it is decided whether or not the test for the next candidate touch point is to be performed. If so, the program returns to step S760.

藉由利用不同驅動信號同時驅動複數候選觸碰點的複數條第一軸之線是可行的,亦即施加不同頻率的第三驅動信號至兩條以上的第一軸線,使得每一條第一軸線對應不同頻率的第三驅動信號。此外,如參照第6A與6B圖所說明的例子,例如可藉由不同觸控感測器同時檢測候選觸碰點所對應的兩條以上的第二軸線,故在同一條第一軸之線上複數候選觸碰點可以同時測試。It is feasible to simultaneously drive a plurality of lines of the first plurality of axes of the plurality of candidate touch points by using different driving signals, that is, applying third driving signals of different frequencies to the two or more first axes, so that each of the first axes Corresponding to the third drive signal of different frequencies. In addition, as described in the figures of FIGS. 6A and 6B, for example, two or more second axes corresponding to the candidate touch points can be simultaneously detected by different touch sensors, so that they are on the same first axis. Multiple candidate touch points can be tested simultaneously.

雖然本發明之較佳實施例已詳細闡示並說明,熟知此項技藝者可進行各種修改及替代。因此本發明實施例之說明僅為例示性而非限制性質。本發明並不受限於所闡示之特定形式,秉持本發明之精神與領域所行之所有修改與替代均在所附申請專利範圍所定義之範疇中。While the preferred embodiment of the invention has been shown and described in detail Therefore, the description of the embodiments of the invention is merely illustrative and not limiting. The invention is not limited to the specific forms of the invention, and all modifications and substitutions of the spirit and scope of the invention are defined in the scope of the appended claims.

1...多點觸控感測裝置1. . . Multi-touch sensing device

10...感測陣列10. . . Sensing array

12‧‧‧線12‧‧‧ line

13‧‧‧線13‧‧‧ line

22‧‧‧觸控感測器電路22‧‧‧Touch sensor circuit

24‧‧‧觸控感測器電路24‧‧‧Touch sensor circuit

220‧‧‧觸控感測器220‧‧‧ touch sensor

221‧‧‧波形產生器221‧‧‧ Waveform Generator

223‧‧‧電壓驅動器223‧‧‧Voltage Driver

224‧‧‧AC電壓源224‧‧‧AC voltage source

226‧‧‧緩衝器226‧‧‧buffer

240‧‧‧觸控感測器240‧‧‧Touch sensor

241‧‧‧波形產生器241‧‧‧ Waveform Generator

243‧‧‧電流驅動器243‧‧‧current drive

244‧‧‧AC電流源244‧‧‧AC current source

第1圖係概略顯示一般的多點觸控感測裝置;Figure 1 is a schematic view showing a general multi-touch sensing device;

第2圖係概略顯示一觸控感測器實行投射式感測方法;FIG. 2 is a schematic diagram showing a touch sensor performing a projection sensing method;

第3圖係概略顯示另一觸控感測器實行投射式感測方法;Figure 3 is a schematic diagram showing another touch sensor performing a projection sensing method;

第4圖係概略顯示根據本發明利用矩陣式感測方法測試觸控感測陣列之一節點;4 is a schematic diagram showing testing a node of a touch sensing array using a matrix sensing method according to the present invention;

第5A至5D圖闡示藉由根據本發明一實施例之方法測試候選觸碰點;5A-5D illustrate the testing of candidate touch points by a method in accordance with an embodiment of the present invention;

第6A與6B圖闡示藉由根據本發明另一實施例之方法測試候選觸碰點;以及6A and 6B illustrate the testing of candidate touch points by a method in accordance with another embodiment of the present invention;

第7圖係顯示本發明之鬼點去除方法的流程圖。Fig. 7 is a flow chart showing the method of removing ghost points of the present invention.

220...觸控感測器220. . . Touch sensor

Claims (9)

一種用於多點觸控感測裝置之鬼點去除方法,該多點觸控感測裝置包含一感測陣列,該感測陣列具有第一軸之多條線以及第二軸之多條線相互交叉,該方法包含:施加第一驅動信號至第一軸之各條線;檢測第一軸之被驅動的線以判定該條線是否被觸碰;施加第二驅動信號至第二軸之各條線;檢測第二軸之被驅動的線以判定該條線是否被觸碰;依據第一軸之被觸碰的線以及第二軸之被觸碰的線決定候選觸碰點;施加第三驅動信號至各候選觸碰點的第一軸之線;以及檢測該候選觸碰點的第二軸之線以判定該候選觸碰點是否被觸碰。 A ghost point removing method for a multi-touch sensing device, the multi-touch sensing device comprising a sensing array having a plurality of lines of a first axis and a plurality of lines of a second axis Crossing each other, the method comprising: applying a first driving signal to each of the first axes; detecting a driven line of the first axis to determine whether the line is touched; applying a second driving signal to the second axis Each line; detecting a driven line of the second axis to determine whether the line is touched; determining a candidate touch point according to the touched line of the first axis and the touched line of the second axis; a line of the third driving signal to the first axis of each candidate touch point; and detecting a line of the second axis of the candidate touch point to determine whether the candidate touch point is touched. 如申請專利範圍第1項所述之方法,其中該等候選觸碰點為第一軸之被觸碰的線以及第二軸之被觸碰的線的交點。 The method of claim 1, wherein the candidate touch points are the intersection of the touched line of the first axis and the touched line of the second axis. 如申請專利範圍第1項所述之方法,其中該第一軸與該第二軸配置成一正交座標系。 The method of claim 1, wherein the first axis and the second axis are arranged in an orthogonal coordinate system. 如申請專利範圍第1項所述之方法,其中該第一軸與該第二軸配置成一極座標座標系。 The method of claim 1, wherein the first axis and the second axis are configured as a polar coordinate system. 如申請專利範圍第1項所述之方法,其中係同時分別施加不同頻率的第三驅動信號至兩條以上的第一軸之線,使得每一條第一軸之線對應不同頻率的第三驅動信號。 The method of claim 1, wherein the third driving signal of different frequencies is simultaneously applied to the lines of the two or more first axes, so that the line of each of the first axes corresponds to the third driving of different frequencies. signal. 如申請專利範圍第1項所述之方法,其中係同時檢測候選觸碰點所對應的兩條以上的第二軸之線。 The method of claim 1, wherein the lines of the two or more second axes corresponding to the candidate touch points are simultaneously detected. 如申請專利範圍第1項所述之方法,其中在施加該第一驅動信號於第一軸之線後,如果該條線有被觸碰,則從 該條線檢測到的感測信號具有比該第一驅動信號小的振幅。 The method of claim 1, wherein after the first driving signal is applied to the line of the first axis, if the line is touched, The sensed signal detected by the line has a smaller amplitude than the first drive signal. 如申請專利範圍第1項所述之方法,其中在施加該第二驅動信號於第二軸之線後,如果該條線有被觸碰,則從該條線檢測到的感測信號具有比該第二驅動信號小的振幅。 The method of claim 1, wherein after the second driving signal is applied to the line of the second axis, if the line is touched, the sensing signal detected from the line has a ratio The second drive signal has a small amplitude. 如申請專利範圍第1項所述之方法,其中在施加該第三驅動信號至候選觸碰點的第一軸之線後,如果該候選觸碰點係實際被觸碰,則可從該候選觸碰點的第二軸之線檢測得感測信號,然而,在施加該第三驅動信號至候選觸碰點的第一軸之線後,如果該候選觸碰點未被觸碰,則無感測信號從該候選觸碰點的第二軸之線檢測得。The method of claim 1, wherein after the third driving signal is applied to the line of the first axis of the candidate touch point, if the candidate touch point is actually touched, the candidate is available The line of the second axis of the touch point detects the sensing signal, however, after applying the third driving signal to the line of the first axis of the candidate touch point, if the candidate touch point is not touched, then no A sense signal is detected from a line of the second axis of the candidate touch point.
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