TW201717268A - Cutting mechanism, joining mechanism, substrate processing system, substrate processing device, and substrate processing method - Google Patents
Cutting mechanism, joining mechanism, substrate processing system, substrate processing device, and substrate processing method Download PDFInfo
- Publication number
- TW201717268A TW201717268A TW105139460A TW105139460A TW201717268A TW 201717268 A TW201717268 A TW 201717268A TW 105139460 A TW105139460 A TW 105139460A TW 105139460 A TW105139460 A TW 105139460A TW 201717268 A TW201717268 A TW 201717268A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- sheet
- processing
- cutting
- roller
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 667
- 238000012545 processing Methods 0.000 title claims abstract description 486
- 230000007246 mechanism Effects 0.000 title claims abstract description 270
- 238000005520 cutting process Methods 0.000 title claims abstract description 144
- 238000005304 joining Methods 0.000 title claims abstract description 92
- 238000003672 processing method Methods 0.000 title claims description 14
- 238000000034 method Methods 0.000 claims description 63
- 238000004519 manufacturing process Methods 0.000 claims description 56
- 230000008569 process Effects 0.000 claims description 55
- 238000011084 recovery Methods 0.000 claims description 55
- 238000003860 storage Methods 0.000 claims description 29
- 238000004064 recycling Methods 0.000 claims description 6
- 238000012423 maintenance Methods 0.000 claims 1
- 230000032258 transport Effects 0.000 abstract description 53
- 238000001179 sorption measurement Methods 0.000 description 36
- 238000004804 winding Methods 0.000 description 32
- 102000034570 NR1 subfamily Human genes 0.000 description 22
- 108020001305 NR1 subfamily Proteins 0.000 description 22
- 238000007639 printing Methods 0.000 description 15
- 230000001965 increasing effect Effects 0.000 description 13
- 238000012546 transfer Methods 0.000 description 12
- 238000010438 heat treatment Methods 0.000 description 9
- 239000007788 liquid Substances 0.000 description 9
- 238000002360 preparation method Methods 0.000 description 8
- 238000001035 drying Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 239000000853 adhesive Substances 0.000 description 6
- 238000009434 installation Methods 0.000 description 6
- 230000001070 adhesive effect Effects 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 230000007547 defect Effects 0.000 description 5
- 230000003028 elevating effect Effects 0.000 description 5
- 230000002093 peripheral effect Effects 0.000 description 5
- 239000000047 product Substances 0.000 description 5
- 238000011144 upstream manufacturing Methods 0.000 description 5
- 239000002390 adhesive tape Substances 0.000 description 4
- 239000012298 atmosphere Substances 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 230000002950 deficient Effects 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 239000002346 layers by function Substances 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 238000005096 rolling process Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000012467 final product Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 238000007726 management method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 238000002203 pretreatment Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 102100031948 Enhancer of polycomb homolog 1 Human genes 0.000 description 1
- 102100031941 Enhancer of polycomb homolog 2 Human genes 0.000 description 1
- 101000920634 Homo sapiens Enhancer of polycomb homolog 1 Proteins 0.000 description 1
- 101000920664 Homo sapiens Enhancer of polycomb homolog 2 Proteins 0.000 description 1
- 101001132698 Homo sapiens Retinoic acid receptor beta Proteins 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 102100033909 Retinoic acid receptor beta Human genes 0.000 description 1
- 238000003848 UV Light-Curing Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
- 239000013067 intermediate product Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000008204 material by function Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000002082 metal nanoparticle Substances 0.000 description 1
- 239000003607 modifier Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000005496 tempering Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/02—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure
- B29C65/18—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by heating, with or without pressure using heated tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/48—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor using adhesives, i.e. using supplementary joining material; solvent bonding
- B29C65/50—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor using adhesives, i.e. using supplementary joining material; solvent bonding using adhesive tape, e.g. thermoplastic tape; using threads or the like
- B29C65/5057—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor using adhesives, i.e. using supplementary joining material; solvent bonding using adhesive tape, e.g. thermoplastic tape; using threads or the like positioned between the surfaces to be joined
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/74—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by welding and severing, or by joining and severing, the severing being performed in the area to be joined, next to the area to be joined, in the joint area or next to the joint area
- B29C65/745—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by welding and severing, or by joining and severing, the severing being performed in the area to be joined, next to the area to be joined, in the joint area or next to the joint area using a single unit having both a severing tool and a welding tool
- B29C65/7451—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor by welding and severing, or by joining and severing, the severing being performed in the area to be joined, next to the area to be joined, in the joint area or next to the joint area using a single unit having both a severing tool and a welding tool the severing tool and the welding tool being movable with respect to one-another
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/78—Means for handling the parts to be joined, e.g. for making containers or hollow articles, e.g. means for handling sheets, plates, web-like materials, tubular articles, hollow articles or elements to be joined therewith; Means for discharging the joined articles from the joining apparatus
- B29C65/7841—Holding or clamping means for handling purposes
- B29C65/7847—Holding or clamping means for handling purposes using vacuum to hold at least one of the parts to be joined
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/01—General aspects dealing with the joint area or with the area to be joined
- B29C66/05—Particular design of joint configurations
- B29C66/10—Particular design of joint configurations particular design of the joint cross-sections
- B29C66/11—Joint cross-sections comprising a single joint-segment, i.e. one of the parts to be joined comprising a single joint-segment in the joint cross-section
- B29C66/112—Single lapped joints
- B29C66/1122—Single lap to lap joints, i.e. overlap joints
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/40—General aspects of joining substantially flat articles, e.g. plates, sheets or web-like materials; Making flat seams in tubular or hollow articles; Joining single elements to substantially flat surfaces
- B29C66/41—Joining substantially flat articles ; Making flat seams in tubular or hollow articles
- B29C66/43—Joining a relatively small portion of the surface of said articles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/80—General aspects of machine operations or constructions and parts thereof
- B29C66/82—Pressure application arrangements, e.g. transmission or actuating mechanisms for joining tools or clamps
- B29C66/822—Transmission mechanisms
- B29C66/8221—Scissor or lever mechanisms, i.e. involving a pivot point
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/80—General aspects of machine operations or constructions and parts thereof
- B29C66/83—General aspects of machine operations or constructions and parts thereof characterised by the movement of the joining or pressing tools
- B29C66/832—Reciprocating joining or pressing tools
- B29C66/8322—Joining or pressing tools reciprocating along one axis
- B29C66/83221—Joining or pressing tools reciprocating along one axis cooperating reciprocating tools, each tool reciprocating along one axis
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/80—General aspects of machine operations or constructions and parts thereof
- B29C66/83—General aspects of machine operations or constructions and parts thereof characterised by the movement of the joining or pressing tools
- B29C66/832—Reciprocating joining or pressing tools
- B29C66/8324—Joining or pressing tools pivoting around one axis
- B29C66/83241—Joining or pressing tools pivoting around one axis cooperating pivoting tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/80—General aspects of machine operations or constructions and parts thereof
- B29C66/84—Specific machine types or machines suitable for specific applications
- B29C66/853—Machines for changing web rolls or filaments, e.g. for joining a replacement web to an expiring web
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C66/00—General aspects of processes or apparatus for joining preformed parts
- B29C66/90—Measuring or controlling the joining process
- B29C66/93—Measuring or controlling the joining process by measuring or controlling the speed
- B29C66/934—Measuring or controlling the joining process by measuring or controlling the speed by controlling or regulating the speed
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H19/00—Changing the web roll
- B65H19/10—Changing the web roll in unwinding mechanisms or in connection with unwinding operations
- B65H19/18—Attaching, e.g. pasting, the replacement web to the expiring web
- B65H19/1842—Attaching, e.g. pasting, the replacement web to the expiring web standing splicing, i.e. the expiring web being stationary during splicing contact
- B65H19/1852—Attaching, e.g. pasting, the replacement web to the expiring web standing splicing, i.e. the expiring web being stationary during splicing contact taking place at a distance from the replacement roll
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H19/00—Changing the web roll
- B65H19/10—Changing the web roll in unwinding mechanisms or in connection with unwinding operations
- B65H19/18—Attaching, e.g. pasting, the replacement web to the expiring web
- B65H19/1857—Support arrangement of web rolls
- B65H19/1873—Support arrangement of web rolls with two stationary roll supports carrying alternately the replacement and the expiring roll
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4821—Flat leads, e.g. lead frames with or without insulating supports
- H01L21/4825—Connection or disconnection of other leads to or from flat leads, e.g. wires, bumps, other flat leads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/04—Arrangements of vacuum systems or suction cups
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2301/00—Handling processes for sheets or webs
- B65H2301/40—Type of handling process
- B65H2301/46—Splicing
- B65H2301/461—Processing webs in splicing process
- B65H2301/4615—Processing webs in splicing process after splicing
- B65H2301/4617—Processing webs in splicing process after splicing cutting webs in splicing process
- B65H2301/46172—Processing webs in splicing process after splicing cutting webs in splicing process cutting expiring web only
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2301/00—Handling processes for sheets or webs
- B65H2301/40—Type of handling process
- B65H2301/46—Splicing
- B65H2301/462—Form of splice
- B65H2301/4621—Overlapping article or web portions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2301/00—Handling processes for sheets or webs
- B65H2301/40—Type of handling process
- B65H2301/46—Splicing
- B65H2301/463—Splicing splicing means, i.e. means by which a web end is bound to another web end
- B65H2301/4631—Adhesive tape
- B65H2301/46312—Adhesive tape double-sided
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2408/00—Specific machines
- B65H2408/20—Specific machines for handling web(s)
- B65H2408/21—Accumulators
- B65H2408/217—Accumulators of rollers type, e.g. with at least one fixed and one movable roller
- B65H2408/2171—Accumulators of rollers type, e.g. with at least one fixed and one movable roller the position of the movable roller(s), i.e. the web loop, being positively actuated
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H2801/00—Application field
- B65H2801/61—Display device manufacture, e.g. liquid crystal displays
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
- C03B33/023—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
- C03B33/0235—Ribbons
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133351—Manufacturing of individual cells out of a plurality of cells, e.g. by dicing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133354—Arrangements for aligning or assembling substrates
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
- Y02P40/57—Improving the yield, e-g- reduction of reject rates
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Nonlinear Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Replacement Of Web Rolls (AREA)
- Advancing Webs (AREA)
- Liquid Crystal (AREA)
- Electroluminescent Light Sources (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
- Folding Of Thin Sheet-Like Materials, Special Discharging Devices, And Others (AREA)
Abstract
Description
本發明之形態係關於切斷機構、接合機構、基板處理系統、基板處理裝置、以及基板處理方法。 Aspects of the present invention relate to a cutting mechanism, a bonding mechanism, a substrate processing system, a substrate processing apparatus, and a substrate processing method.
本申請係根據2012年5月23日申請之美國臨時申請61/650712及2012年6月1日申請之美國臨時申請61/654500主張優先權,將其內容援引於此。 Priority is claimed on U.S. Provisional Application No. 61/650,712, filed on May 23, 2012, and on
在液晶顯示元件等之大畫面顯示元件,在平面狀玻璃基板上沉積ITO(Indium Tin Oxide)等之透明電極或Si等之半導體物質後蒸鍍金屬材料,塗布光阻並轉印電路圖案。之後,使光阻顯影後,藉由蝕刻形成電路圖案等。然而,隨著顯示元件之大型化玻璃基板亦大型化,因此基板搬送亦變得困難。因此,已提案有在具有可撓性之基板(例如,聚醯亞胺、PET、金屬箔等之膜構件、或極薄玻璃片等)上形成顯示元件之被稱為捲對捲方式(以下,僅記載為「捲筒方式」)之技術(例如,參照專利文獻1)。 In a large-screen display element such as a liquid crystal display device, a transparent electrode such as ITO (Indium Tin Oxide) or a semiconductor material such as Si is deposited on a flat glass substrate, and then a metal material is vapor-deposited, and a photoresist is applied and a circuit pattern is transferred. Thereafter, after the photoresist is developed, a circuit pattern or the like is formed by etching. However, as the size of the large-sized glass substrate of the display element is also increased, substrate transfer becomes difficult. Therefore, it has been proposed to form a display element on a flexible substrate (for example, a film member such as polyimide, PET, or metal foil, or an extremely thin glass sheet), and the like is called a roll-to-roll method (hereinafter, The technique described only as "reel method" (for example, refer to Patent Document 1).
又,在專利文獻2提案有與可旋轉之圓筒狀光罩之外周部接近地配置捲繞於輸送輥且移動之可撓性長條片(基板),使光罩圖案連續地曝光於基板之技術。 Further, in Patent Document 2, it is proposed to arrange a flexible strip (substrate) that is wound around a transport roller and moved around a peripheral portion of the rotatable cylindrical mask, and the mask pattern is continuously exposed to the substrate. Technology.
又,在專利文獻3提案有將以捲筒方式輸送之可撓性長條片(基板)之圖案形成區域暫時保持在平面載台,使透過放大投影透鏡投影之光 罩之圖案像掃描曝光於該圖案形成區域之技術。 Further, in Patent Document 3, it is proposed to temporarily hold a pattern forming region of a flexible long strip (substrate) conveyed by a reel on a plane stage, and to transmit light projected through the enlarged projection lens. The pattern of the mask is like a technique of scanning exposure to the pattern forming region.
專利文獻1:國際公開第2008/129819號 Patent Document 1: International Publication No. 2008/129819
專利文獻2:日本實開昭60-019037號 Patent Document 2: Japan Shikai Show 60-019037
專利文獻3:日本特開2011-22584號 Patent Document 3: Japanese Special Open 2011-22584
然而,上述習知技術存在以下之問題。 However, the above conventional techniques have the following problems.
對長條片狀基板依序施以複數個處理時,依據各處理單元之性能,適於處理之基板之搬送速度在各單元(各處理內容)分別不同。例如,專利文獻2之曝光處理之情形,因塗布在基板表面之感光層之感度與曝光用照明光之亮度等,使基板之搬送速度(作業時間)受到限制。又,蝕刻或鍍敷等之濕式處理或該濕式處理後之乾燥、加熱步驟,藉由將基板緩慢地搬送,亦可得到能使液槽或乾燥/加熱爐小型化等之優點。 When a plurality of processes are sequentially applied to the long sheet substrate, the transport speed of the substrate suitable for processing differs in each unit (each processing content) depending on the performance of each processing unit. For example, in the case of the exposure processing of Patent Document 2, the conveyance speed (working time) of the substrate is restricted by the sensitivity of the photosensitive layer applied to the surface of the substrate and the brightness of the illumination light for exposure. Further, the wet treatment such as etching or plating or the drying and heating steps after the wet treatment can be carried out by slowly transferring the substrate, thereby obtaining advantages such as downsizing of the liquid tank or the drying/heating furnace.
此外,在機能性材料之沉積處理、或印刷或噴墨印刷之步驟等,為了維持高精度化(微細化)並同時確保產率,亦有最佳基板搬送速度。然而,此等最佳基板搬送速度大多因處理單元而不同。 Further, in order to maintain high precision (fineness) and to ensure productivity while performing deposition processing of functional materials or printing or inkjet printing, there is an optimum substrate transport speed. However, these optimum substrate transport speeds are often different depending on the processing unit.
在構築此種組合複數個處理單元,使長條片狀基板依序通過並持續進行一連串處理之捲筒方式之生產線(處理系統)之情形,基板之搬送速度(生產線之速度)不得不配合處理中之基板搬送速度最低之處理單元。 In the case of constructing such a processing unit (processing system) in which a plurality of processing units are combined and the long sheet-like substrate is sequentially passed through and continuously subjected to a series of processing, the conveying speed of the substrate (speed of the production line) has to be processed. The processing unit with the lowest substrate transfer speed.
因此,處理速度快之處理單元,儘管在性能上未完全發揮,亦以慢速度搬送基板。因此,處理單元之效率變差且有可能無法提升生產線整體之產率。 Therefore, the processing unit with a fast processing speed transports the substrate at a slow speed although it is not fully utilized in performance. Therefore, the efficiency of the processing unit is deteriorated and it is possible that the overall yield of the production line cannot be improved.
本發明形態之目的在於提供有助於產率提升之切斷機構、接 合機構、基板處理系統、以及基板處理方法。 The object of the present invention is to provide a cutting mechanism and a connection that contribute to an increase in productivity. Mechanism, substrate processing system, and substrate processing method.
又,專利文獻1中,係以捲方式搬送可撓性片狀基板並主要使用印刷(噴墨)方式在片狀基板上形成電子元件。然而,在一般印刷現場,當捲繞於供應捲筒之片狀基板之剩餘量變少,即暫時停止印刷裝置,在印刷裝置與回收捲筒之間將片狀基板切斷,將作為回收捲筒捲繞之完成印刷之片狀基板送至下一步驟。此情形,在印刷裝置之入口至出口之印刷路徑中,殘留印刷途中之片狀基板,此全部作為不良品而廢棄。在紙或膜上以彩色墨水印刷之情形,印刷成本極為低價。然而,以捲筒方式形成電子元件之情形,片狀基板之每單位長度(m)之製造成本仍舊高價,若如一般印刷現場般將殘留在裝置內之片狀基板廢棄,則過於浪費且成本增加。 Further, in Patent Document 1, a flexible sheet substrate is conveyed by a roll method, and an electronic component is formed on a sheet substrate mainly by a printing (inkjet) method. However, at the general printing site, when the remaining amount of the sheet substrate wound around the supply reel is small, that is, the printing device is temporarily stopped, the sheet substrate is cut between the printing device and the recovery reel, and will be used as a recycling reel. The wound sheet-like substrate that has been printed is sent to the next step. In this case, in the printing path from the entrance to the exit of the printing apparatus, the sheet-like substrate in the middle of printing remains, and all of this is discarded as a defective product. In the case of printing on color paper with paper or film, the printing cost is extremely low. However, in the case of forming an electronic component in a roll form, the manufacturing cost per unit length (m) of the sheet substrate is still high, and if the sheet substrate remaining in the device is discarded as in a general printing site, it is wasteful and costly. increase.
尤其是,將有機EL構成之中型、大型顯示面板形成在片狀基板上之情形,片狀基板連續地通過一連串之複數個處理裝置、例如感光層印刷裝置、專利文獻3之曝光裝置、濕式處理裝置、乾燥裝置等之後,捲繞於回收捲筒。是以,可推測從供應捲筒至回收捲筒通過複數個處理裝置(處理步驟)之片狀基板極長,一旦停止片狀基板之搬送後,會浪費相當長距離之片狀基板。 In particular, in the case where the organic EL constitutes a medium-sized, large-sized display panel formed on a sheet-like substrate, the sheet-like substrate is continuously passed through a series of processing devices, for example, a photosensitive layer printing device, an exposure device of Patent Document 3, and a wet type. After the processing device, the drying device, and the like, the film is wound around the recovery roll. Therefore, it is presumed that the sheet substrate passing through the plurality of processing apparatuses (processing steps) from the supply reel to the recovery reel is extremely long, and once the sheet substrate is stopped, a sheet substrate having a considerable distance is wasted.
本發明另一形態之目的在於提供抑制成本增加且提高產率之基板處理裝置以及基板處理方法。 Another object of the present invention is to provide a substrate processing apparatus and a substrate processing method which suppress an increase in cost and improve productivity.
本發明第1形態之基板處理系統,具備:第1處理單元,對往長邊方向以速度V1搬送之基板連續地施加第1處理;以及第2處理單元,以速度V2搬送以第1處理單元處理後之基板,對基板連續地施加第2處理; 其特徵在於:視第1、第2處理單元之各個之性能,可將速度之關係設定成V1>V2之情形,設置複數個第2處理單元,且在第1處理單元之後進一步具備將已施加第1處理之基板以長邊方向之既定長度切斷之切斷機構、與將切斷後之基板投入複數個第2處理單元之任一個之選擇投入機構;視第1、第2處理單元之各個之性能,可將速度之關係設定成V1<V2之情形,設置複數個第1處理單元,且在第2處理單元之前進一步具備將藉由複數個第1處理單元之各個施加第1處理之複數個基板在長邊方向依序接合並投入第2處理單元之接合機構。 A substrate processing system according to a first aspect of the present invention includes: a first processing unit that continuously applies a first process to a substrate transported at a speed V1 in a longitudinal direction; and a second processing unit that transports the first processing unit at a speed V2 The processed substrate is continuously applied to the substrate by a second process; It is characterized in that, depending on the performance of each of the first and second processing units, the relationship between the speeds can be set to V1 > V2, a plurality of second processing units are provided, and after the first processing unit, there is further provided The cutting mechanism in which the substrate of the first processing is cut at a predetermined length in the longitudinal direction and the selective input mechanism in which the substrate after cutting is input into any of the plurality of second processing units; and each of the first and second processing units In the case where the relationship between the speeds is set to V1 < V2, a plurality of first processing units are provided, and before the second processing unit, a plural number to which the first processing is applied by each of the plurality of first processing units is further provided. The substrates are sequentially joined in the longitudinal direction and are introduced into the joining mechanism of the second processing unit.
本發明第2形態之基板處理方法,具備:藉由第1處理單元對往長邊方向以速度V1搬送之基板連續地施加第1處理之動作;以及以速度V2搬送以第1處理單元處理後之基板,藉由第2處理單元對基板連續地施加第2處理之動作;其特徵在於:視第1、第2處理單元之各個之性能,可將速度之關係設定成V1>V2之情形,使用複數個第2處理單元,且在第1處理單元之後進一步具有將已施加第1處理之基板以長邊方向之既定長度切斷之步驟、與將切斷後之基板投入複數個第2處理單元之任一個之選擇投入步驟;視第1、第2處理單元之各個之性能,可將速度之關係設定成V1<V2之情形,使用複數個第1處理單元,且在第2處理單元之前進一步具有將藉由複數個第1處理單元之各個施加第1處理之複數個基板在長邊方向依序接合並投入第2處理單元之接合步驟。 In the substrate processing method according to the second aspect of the present invention, the first processing unit continuously applies the first processing to the substrate transported at the speed V1 in the longitudinal direction, and the first processing unit performs the processing at the speed V2. The substrate is continuously applied to the substrate by the second processing unit, and the operation of the second processing unit is characterized in that the relationship between the speeds is set to V1 > V2 depending on the performance of each of the first and second processing units. A plurality of second processing units are used, and after the first processing unit, a step of cutting the substrate to which the first processing has been applied in a predetermined length in the longitudinal direction and a substrate after cutting the plurality of second processing units are further provided. Any one of the selection and input steps; depending on the performance of each of the first and second processing units, the relationship between the speeds can be set to V1 < V2, a plurality of first processing units are used, and before the second processing unit A bonding step of sequentially bonding a plurality of substrates to which the first processing is applied by the plurality of first processing units in the longitudinal direction and inputting them into the second processing unit.
本發明第3形態之切斷機構,具備:切斷部,將已進行既定處理之基板切斷;以及緩衝部,基板之儲存量可依據已施加既定處理之基 板之搬送量改變,調整朝向切斷部搬送之基板之搬送量。 A cutting mechanism according to a third aspect of the present invention includes: a cutting portion that cuts a substrate that has been subjected to a predetermined process; and a buffer portion that can be stored in accordance with a predetermined process The conveyance amount of the board is changed, and the conveyance amount of the board|substrate conveyed to the cutting part is adjusted.
本發明第4形態之接合機構,具備:接合部,將施加既定處理之基板接合;以及緩衝部,基板之儲存量可依據施加既定處理之基板之搬送量改變,調整從接合部投入至既定處理之基板之搬送量。 The bonding mechanism according to a fourth aspect of the present invention includes: a bonding portion that bonds a substrate to which a predetermined process is applied; and a buffer portion that can be changed in accordance with a transfer amount of the substrate to which the predetermined process is applied, and the adjustment is performed from the bonding portion to a predetermined process. The amount of substrate transported.
本發明第5形態之基板處理系統,係使往長邊方向搬送之基板通過第1處理單元後,通過第2處理單元,其特徵在於:具備切斷機構,該切斷機構,使在第2處理單元之基板之搬送速度相對於在第1處理單元之基板之搬送速度降低時,在第1處理單元與第2處理單元之間將基板以長邊方向之既定長度切斷;具備接合機構,該接合機構,使在第2處理單元之基板之搬送速度相對於在第1處理單元之基板之搬送速度增加時,在第1處理單元與第2處理單元之間將基板在長邊方向接合。 In the substrate processing system according to the fifth aspect of the present invention, the substrate that has been transported in the longitudinal direction passes through the first processing unit, and the second processing unit is provided with a cutting mechanism that is in the second When the conveyance speed of the substrate of the processing unit is reduced with respect to the conveyance speed of the substrate of the first processing unit, the substrate is cut between the first processing unit and the second processing unit by a predetermined length in the longitudinal direction, and the bonding mechanism is provided. In the joining mechanism, when the conveying speed of the substrate of the second processing unit is increased with respect to the conveying speed of the substrate of the first processing unit, the substrate is joined in the longitudinal direction between the first processing unit and the second processing unit.
本發明第6形態之基板處理裝置,具備:第1安裝部,安裝捲繞有長帶之第1基板之第1輥;第2安裝部,安裝捲繞有長帶之第2基板之第2輥;處理機構,將第1基板與第2基板之任一方作為處理基板往長邊方向輸送並同時施加既定處理;緩衝機構,配置在處理機構與第1安裝部之間,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出;以及基板接續更換機構,在緩衝機構與第1安裝部之間將第1基板切斷,且將從第2輥供應之第2基板之前端部接合在切斷之第1基板之終端部,往緩衝機構送出。 A substrate processing apparatus according to a sixth aspect of the present invention includes: a first mounting portion that mounts a first roller on which a long substrate is wound; and a second mounting portion that mounts a second substrate on which a long tape is wound a processing unit that transports one of the first substrate and the second substrate as a processing substrate in the longitudinal direction and simultaneously applies a predetermined process; the buffer mechanism is disposed between the processing mechanism and the first mounting portion, and is driven from the first roller. The first substrate to be supplied is temporarily stored in the predetermined longest storage range, and then sent to the processing mechanism; and the substrate connection/replacement mechanism is cut off between the buffer mechanism and the first mounting portion, and is supplied from the second roller. The front end portion of the second substrate is joined to the end portion of the cut first substrate, and is sent to the buffer mechanism.
本發明第7形態之基板處理裝置,具備:第1安裝部,安裝捲繞有長帶之第1基板之第1輥;第2安裝部,安裝捲繞有長帶之第2基板 之第2輥;處理機構,將第1基板與第2基板之任一方作為處理基板往長邊方向輸送並同時施加既定處理;緩衝機構,配置在處理機構與第1安裝部之間,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出;以及基板接續更換機構,在緩衝機構與第1安裝部之間將第1基板切斷,且將從第2輥供應之第2基板之前端部連結在切斷之第1基板之緩衝機構側之既定部分,往緩衝機構送出。 A substrate processing apparatus according to a seventh aspect of the present invention includes: a first mounting portion that mounts a first roller on which a long substrate is wound; and a second mounting portion that mounts a second substrate on which a long tape is wound The second roller; the processing means transports one of the first substrate and the second substrate as a processing substrate in the longitudinal direction and simultaneously applies a predetermined process; and the buffer mechanism is disposed between the processing mechanism and the first mounting portion, and The first substrate supplied from the first roller is temporarily stored in the predetermined longest storage range, and then sent to the processing mechanism; and the substrate connection/replacement mechanism is cut off between the buffer mechanism and the first mounting portion, and the first substrate is cut off from the first substrate. The front end portion of the second substrate supplied by the two rolls is connected to a predetermined portion on the side of the buffer mechanism of the first substrate to be cut, and is sent to the buffer mechanism.
本發明第8形態之基板處理裝置,具備:第1安裝部,將捲繞有長帶之第1基板之第1輥可拆裝地安裝;保持部,以既定長度保持與第1基板同等規格之第2基板;處理機構,將第1基板與第2基板之任一方作為處理基板往長邊方向輸送並同時施加既定處理;緩衝機構,配置在處理機構與第1安裝部之間,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出;以及基板接續更換機構,在緩衝機構與第1安裝部之間將第1基板切斷,且將從保持部供應之第2基板之前端部連接在切斷之第1基板之緩衝機構側之既定部分,往緩衝機構送出。 A substrate processing apparatus according to an eighth aspect of the present invention includes: a first mounting portion that detachably mounts a first roller on which a long substrate is wound; and a holding portion that maintains the same specifications as the first substrate with a predetermined length In the second substrate, the processing means transports one of the first substrate and the second substrate as a processing substrate in the longitudinal direction and simultaneously applies a predetermined process; and the buffer mechanism is disposed between the processing mechanism and the first mounting portion, and the buffer mechanism is disposed between the processing device and the first mounting portion. The first substrate supplied from the first roller is temporarily stored in the predetermined longest storage range, and then sent to the processing mechanism; and the substrate connection/replacement mechanism is cut off between the buffer mechanism and the first mounting portion, and will be maintained. The front end portion of the second substrate supplied from the portion is connected to a predetermined portion on the side of the buffer mechanism of the first substrate that is cut, and is sent to the buffer mechanism.
本發明第9形態之基板處理方法,係將已投入之長帶基板作為處理基板往長邊方向輸送並同時以處理機構施加既定處理,其特徵在於,包含:將捲繞有長帶基板之第1輥安裝在第1輥安裝部之動作;將捲繞有長帶基板之第2輥安裝在第2輥安裝部之動作;以配置在處理機構與第1輥安裝部之間之緩衝機構,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出之動作;以及在暫時儲存之第1基板往處理機構送出之期間,在緩衝機構與第1輥安裝部之間將第1基板切 斷,且將從第2輥供應之第2基板之前端部連結在切斷之第1基板之緩衝機構側之既定部分之動作。 In the substrate processing method according to the ninth aspect of the present invention, the long-length substrate to be loaded is transported in the longitudinal direction as a processing substrate, and a predetermined process is applied by the processing means, and the method includes: The operation of attaching the first roller to the first roller attachment portion, the operation of attaching the second roller on which the long substrate is wound to the second roller attachment portion, and the buffer mechanism disposed between the processing mechanism and the first roller attachment portion The first substrate supplied from the first roller is temporarily stored in a predetermined longest storage range, and then sent to the processing mechanism; and the temporarily stored first substrate is sent to the processing mechanism, and the buffer mechanism and the first roller are mounted. Cutting the first substrate between the parts The operation is performed by connecting the end portion of the second substrate supplied from the second roller to a predetermined portion of the buffer mechanism side of the first substrate to be cut.
本發明第10形態之基板處理方法,係將已投入之長帶基板作為處理基板往長邊方向輸送並同時以處理機構施加既定處理,其特徵在於,包含:將捲繞有長帶基板之第1輥安裝在第1輥安裝部之動作;將與第1基板同等規格之第2基板以既定長度保持在保持部之動作;以配置在處理機構與第1輥安裝部之間之緩衝機構,將從第1輥供應之第1基板在既定最長儲存範圍內暫時儲存後,往處理機構送出之動作;以及在暫時儲存之第1基板往處理機構送出之期間,在緩衝機構與第1輥安裝部之間將第1基板切斷,且將從保持部供應之第2基板之前端部連結在切斷之第1基板之緩衝機構側之既定部分之動作。 In the substrate processing method according to the tenth aspect of the present invention, the long-length substrate to be loaded is transported as a processing substrate in the longitudinal direction, and a predetermined process is applied by the processing means, and the method includes: winding the long-length substrate The operation of attaching the first roller to the first roller mounting portion; the operation of holding the second substrate of the same size as the first substrate to the holding portion for a predetermined length; and the buffer mechanism disposed between the processing mechanism and the first roller mounting portion The first substrate supplied from the first roller is temporarily stored in a predetermined longest storage range, and then sent to the processing mechanism; and the temporarily stored first substrate is sent to the processing mechanism, and the buffer mechanism and the first roller are mounted. The first substrate is cut between the portions, and the front end portion of the second substrate supplied from the holding portion is connected to a predetermined portion of the buffer mechanism side of the first substrate that is cut.
本發明之形態中,能有效率地運用在複數個處理步驟之各個使用之處理單元,使基板處理之生產線整體之產率提升。 In the embodiment of the present invention, the processing unit used in each of the plurality of processing steps can be efficiently utilized to increase the overall yield of the substrate processing line.
又,本發明之另一形態中,可大幅地減少基板之浪費,能有效地抑制成本增加。 Moreover, in another aspect of the present invention, waste of the substrate can be greatly reduced, and an increase in cost can be effectively suppressed.
BF1‧‧‧第1緩衝機構(第1緩衝部、緩衝機構) BF1‧‧‧1st buffer mechanism (1st buffer part, buffer mechanism)
BF2‧‧‧第2緩衝機構(第2緩衝部) BF2‧‧‧2nd buffer mechanism (2nd buffer part)
CSa‧‧‧第1接帶器部(基板接續更換機構) CSa‧‧1 first strap unit (substrate connection replacement mechanism)
CSb‧‧‧第2接帶器部(第2基板接續更換機構) CSb‧‧‧2nd strap unit (2nd board connection replacement mechanism)
CU10‧‧‧切斷機構 CU10‧‧‧ cutting mechanism
FS‧‧‧基板 FS‧‧‧Substrate
P‧‧‧基板 P‧‧‧Substrate
PK,PK2‧‧‧引入基板(第3基板) PK, PK2‧‧‧ introduction substrate (3rd substrate)
PU10‧‧‧接合機構 PU10‧‧‧ joint mechanism
RR1‧‧‧供應輥(第1輥) RR1‧‧‧Supply Roller (1st Roll)
RR2‧‧‧供應輥(第2輥) RR2‧‧‧Supply Roller (2nd Roller)
RR3‧‧‧回收輥(第3輥) RR3‧‧‧Recycling roller (3rd roller)
RR4‧‧‧回收輥(第4輥) RR4‧‧‧Recycling roller (4th roller)
RS1‧‧‧第1安裝部 RS1‧‧‧1st installation department
RS2‧‧‧第2安裝部 RS2‧‧‧Second Installation Department
RS3‧‧‧第3安裝部 RS3‧‧‧3rd Installation Department
RS4‧‧‧第4安裝部 RS4‧‧‧4th installation department
ST‧‧‧選擇投入機構 ST‧‧‧Selected input institutions
SYS‧‧‧元件製造系統(基板處理裝置) SYS‧‧‧ component manufacturing system (substrate processing device)
UA,UB,UB1~UB3,UC‧‧‧處理單元 UA, UB, UB1~UB3, UC‧‧‧ processing unit
U1~Un‧‧‧處理裝置(處理機構) U1~Un‧‧‧Processing device (processing mechanism)
圖1係以示意方式顯示第1實施形態之基板處理系統之圖。 Fig. 1 is a view schematically showing a substrate processing system according to a first embodiment.
圖2係第1實施形態之切斷機構之概略立體圖。 Fig. 2 is a schematic perspective view of the cutting mechanism of the first embodiment.
圖3係第1實施形態之第1接帶器部之概略外觀立體圖。 Fig. 3 is a schematic external perspective view of the first splicer portion of the first embodiment.
圖4係第1實施形態之第2接帶器部之概略外觀立體圖。 Fig. 4 is a schematic external perspective view of a second nipper portion of the first embodiment.
圖5係第1實施形態之基板處理系統之控制方塊圖。 Fig. 5 is a control block diagram of the substrate processing system of the first embodiment.
圖6係顯示第1實施形態之元件製造系統之一部分構成之圖。 Fig. 6 is a view showing a part of the configuration of the component manufacturing system of the first embodiment.
圖7係說明構成第1實施形態之生產線之複數個處理單元之模型配置例之圖。 Fig. 7 is a view showing an example of a model arrangement of a plurality of processing units constituting the production line of the first embodiment.
圖8係說明第1實施形態之生產線之作業時間提升之時序圖。 Fig. 8 is a timing chart for explaining an increase in the working time of the production line of the first embodiment.
圖9係顯示作為第2實施形態之基板處理裝置之元件製造系統之一部分構成之圖。 FIG. 9 is a view showing a partial configuration of a component manufacturing system of the substrate processing apparatus according to the second embodiment.
圖10係顯示第2實施形態之第1接帶器部及第1緩衝機構之概略構成之圖。 Fig. 10 is a view showing a schematic configuration of a first splicer unit and a first damper mechanism according to a second embodiment.
圖11係顯示第2實施形態之第2接帶器部及第2緩衝機構之概略構成之圖。 Fig. 11 is a view showing a schematic configuration of a second nipper portion and a second damper mechanism according to the second embodiment.
圖12係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 12 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖13係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 13 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖14係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 14 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖15係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 15 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖16係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 16 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖17係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 17 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖18係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 18 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖19係顯示第2實施形態之基板供應側之基板之接合/切斷動作之圖。 Fig. 19 is a view showing the joining/cutting operation of the substrate on the substrate supply side in the second embodiment.
圖20係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 Fig. 20 is a view showing the joining/cutting operation of the substrate on the substrate recovery side in the second embodiment.
圖21係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 Fig. 21 is a view showing the joining/cutting operation of the substrate on the substrate recovery side in the second embodiment.
圖22係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 Fig. 22 is a view showing the joining/cutting operation of the substrate on the substrate recovery side in the second embodiment.
圖23係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 Fig. 23 is a view showing the joining/cutting operation of the substrate on the substrate recovery side in the second embodiment.
圖24係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 Fig. 24 is a view showing the joining/cutting operation of the substrate on the substrate recovery side in the second embodiment.
圖25係顯示第2實施形態之基板回收側之基板之接合/切斷動作之圖。 Fig. 25 is a view showing the joining/cutting operation of the substrate on the substrate recovery side in the second embodiment.
(第1實施形態) (First embodiment)
以下,參照圖1至圖6說明本發明之切斷機構、接合機構、基板處理系統、以及基板處理方法之實施形態。 Hereinafter, embodiments of the cutting mechanism, the joining mechanism, the substrate processing system, and the substrate processing method of the present invention will be described with reference to Figs. 1 to 6 .
圖1係作為一例以示意方式顯示使片狀基板P依序通過三個處理步驟A、B、C之輥方式之基板處理系統SYS之圖。 Fig. 1 is a view schematically showing, as an example, a substrate processing system SYS in which a sheet substrate P is sequentially passed through three processing steps A, B, and C.
基板處理系統之主體構成為對基板P作為步驟A施加處理A(第1處理)之處理單元UA(第1處理單元)、作為步驟B施加處理B(第1處理、第2處理)之處理單元UB(第1處理單元、第2處理單元)、作為步驟C施加處理C(第2處理)之處理單元UC(第2處理單元)、切斷機構CU10、接合機構PU10、選擇投入機構ST1,ST2、控制部CT(參照圖5)。 The main body of the substrate processing system is a processing unit UA (first processing unit) that applies the processing A (first processing) to the substrate P as the processing unit A, and a processing unit (the first processing and the second processing) that applies the processing B (the first processing and the second processing) as the step B. UB (first processing unit, second processing unit), processing unit UC (second processing unit) that applies processing C (second processing) as step C, cutting mechanism CU10, bonding mechanism PU10, selection input mechanism ST1, ST2 The control unit CT (see Fig. 5).
處理單元UA具備用於安裝供應輥RRA之輥安裝部RSA,將已施加處理A之基板P往切斷機構CU10送出。處理單元UB由分別施加相同處理B之處理單元UB1~UB3構成,例如,在處理單元UA之基板搬送方向之下游側配置成上下3段、或水平3列。 The processing unit UA includes a roller attachment portion RSA for mounting the supply roller RRA, and the substrate P to which the treatment A has been applied is sent to the cutting mechanism CU10. The processing unit UB is configured by the processing units UB1 to UB3 to which the same processing B is applied, and is disposed, for example, in the upper and lower sides of the substrate transport direction of the processing unit UA in three stages or three levels.
各處理單元UB1~UB3具備用以安裝已施加處理A之基板P之輥之安裝部RSB11~RSB31、用以安裝已施加處理B之基板P之輥之安裝部RSB12~RSB32,來自安裝在安裝部RSB11~RSB31之輥RRB11~RRB31(以下,適當稱為子輥RRB11~RRB31)之基板P,在施加處理B後,捲繞至安裝 在安裝部RSB12~RSB32之輥RRB12~RRB32(以下,適當稱為子輥RRB12~RRB32)。 Each of the processing units UB1 to UB3 is provided with mounting portions RSB11 to RSB31 for mounting the roller of the substrate P to which the processing A has been applied, and mounting portions RSB12 to RSB32 for mounting the roller of the substrate P to which the processing B has been applied, from the mounting portion. The substrate P of the rollers RRB11 to RRB31 of RSB11 to RSB31 (hereinafter, appropriately referred to as sub-rollers RRB11 to RRB31) is wound up to be mounted after the application of the treatment B The rollers RRB12 to RRB32 of the mounting portions RSB12 to RSB32 (hereinafter, referred to as sub-rollers RRB12 to RRB32 as appropriate).
此外,圖1中,在處理單元UA後段之切斷機構CU10之後設有捲繞已施加處理A之基板P之輥RR1。在此輥RR1捲繞基板P之既定長度量後,切斷基板P,輥RR1係作為子輥RRB11~RRB31之任一個安裝在各處理單元UB1~UB3之安裝部RSB11~RSB31之任一個。 Further, in Fig. 1, a roller RR1 for winding the substrate P to which the process A has been applied is provided after the cutting mechanism CU10 of the subsequent stage of the processing unit UA. After the roller RR1 is wound around the predetermined length of the substrate P, the substrate P is cut, and the roller RR1 is attached to any one of the attachment portions RSB11 to RSB31 of the processing units UB1 to UB3 as one of the sub-rollers RRB11 to RRB31.
處理單元UC可將以處理單元UB1~UB3施加處理B後之子輥RRB12~RRB32之任一個作為輥RR2安裝。捲繞於此輥RR2之基板P(已施加處理A、B之中間產品)係透過接合機構PU10搬入處理單元UC,被施加處理C。接受處理C之基板P捲繞回收至安裝在輥安裝部RSC之回收輥RRC。 The processing unit UC can mount any one of the sub-rollers RRB12 to RRB32 to which the processing B is applied by the processing units UB1 to UB3 as the roller RR2. The substrate P wound around the roll RR2 (the intermediate product to which the processes A and B have been applied) is carried into the processing unit UC through the bonding mechanism PU10, and the process C is applied. The substrate P subjected to the treatment C is wound and recovered to the recovery roller RRC mounted on the roller mounting portion RSC.
本實施形態中,在處理單元UA之處理A之處理速度VA(基板P之搬送速度)、在處理單元UB1~UB3之處理B之處理速度VB(基板P之搬送速度)、在處理單元UC之處理C之處理速度VC(基板P之搬送速度)之關係如下。 In the present embodiment, the processing speed VA of the processing A of the processing unit UA (the transport speed of the substrate P), the processing speed VB of the processing B of the processing units UB1 to UB3 (the transport speed of the substrate P), and the processing unit UC The relationship between the processing speed VC of the processing C (the transport speed of the substrate P) is as follows.
VA≒VC>VB VA≒VC>VB
此外,在處理單元UA與處理單元UB1~UB3之任一個之間,基板P之搬送速度為VA>VB,因此處理單元UA與搬送速度(V1)高之第1處理單元對應,處理單元UB1~UB3之任一個與搬送速度(V2)低之第2處理單元對應。另一方面,在處理單元UB1~UB3之任一個與處理單元UC之間,基板P之搬送速度為VB<VC,因此處理單元UB1~UB3之任一個與搬送速度(V1)低之 第1處理單元對應,處理單元UC與搬送速度(V2)高之第2處理單元對應。 Further, since the transport speed of the substrate P is VA>VB between the processing unit UA and any of the processing units UB1 to UB3, the processing unit UA corresponds to the first processing unit having a higher transport speed (V1), and the processing unit UB1~ Any one of UB3 corresponds to the second processing unit having a lower transfer speed (V2). On the other hand, between the processing units UB1 to UB3 and the processing unit UC, since the transport speed of the substrate P is VB<VC, any one of the processing units UB1 to UB3 and the transport speed (V1) are lower. Corresponding to the first processing unit, the processing unit UC corresponds to the second processing unit having a higher transport speed (V2).
本實施形態中,處理速度VA、VC可設定成處理速度VB之約3倍。如以往,實施處理步驟B之處理單元UB為一台之情形,從供應輥RRA至回收輥RRC連接成一個之基板P依序通過處理單元UA,UB,UC,因此其搬送速度與最慢之處理速度VB一致。亦即,生產線整體之作業時間(線速度、產率)被最慢之處理單元限制。 In the present embodiment, the processing speeds VA and VC can be set to about three times the processing speed VB. As in the past, in the case where the processing unit UB of the processing step B is one, the substrate P connected from the supply roller RRA to the recovery roller RRC sequentially passes through the processing units UA, UB, UC, so that the transport speed is the slowest. Processing speed VB is consistent. That is, the overall operating time (line speed, yield) of the production line is limited by the slowest processing unit.
本實施形態中,藉由使處理速度慢之處理單元UB複線化(此處為三台並置),可成為不受限制之構成。為了達成此複線化(或設置複數個),必須要基板P捲繞至輥RR1既定長度量後不暫時停止處理步驟A與處理步驟B而切斷基板P之機構CU10。 In the present embodiment, the processing unit UB having a slow processing speed is doubled (here, three units are collocated), and the configuration is not limited. In order to achieve this doublet (or a plurality of sets), it is necessary to cut the substrate CU10 of the substrate P without temporarily stopping the processing step A and the processing step B after the substrate P is wound up to a predetermined length of the roller RR1.
切斷機構CU10主要以既定長度切斷已施加處理A之基板P,如圖1及圖2所示,具備第1緩衝機構(第1緩衝部)BF1與第1接帶器部CSa(切斷部)。又,切斷機構CU10進一步具備使第1接帶器部CSa(切斷部)之動作與在第1緩衝機構BF1(第1緩衝部)之基板P之儲存量連動之連動控制部。 The cutting mechanism CU10 mainly cuts the substrate P to which the processing A has been applied, and includes a first buffer mechanism (first buffer portion) BF1 and a first adapter portion CSa (cut as shown in FIGS. 1 and 2). unit). Further, the cutting mechanism CU10 further includes an interlocking control unit that interlocks the operation of the first splicer portion CSa (cutting portion) with the storage amount of the substrate P of the first buffer mechanism BF1 (first buffer portion).
第1緩衝機構BF1具有設在實施作為第1處理之處理A之單元UA與第1接帶器部CSa之間且以多數個輥等使基板P折返儲存既定長度量之張力捲筒機構DR1,藉由張力捲筒機構DR1之上下動等,將基板P之儲存長度可變地調整並同時將基板P搬入/搬出。第1緩衝機構BF1具備與處理單元UA之基板P之搬送方向之下游側相鄰設置且調整往第1接帶器部CSa搬出之基板P之搬送量(或搬送速度)之夾持驅動捲筒NR1(參照圖 5)。張力捲筒機構DR1之驅動及夾持驅動捲筒NR1之驅動被控制部CT控制。 The first buffer mechanism BF1 has a tension reel mechanism DR1 that is disposed between the unit UA that is the process A of the first process and the first splicer portion CSa, and that folds the substrate P back by a plurality of rollers to store a predetermined length. The storage length of the substrate P is variably adjusted by the downward movement of the tension reel mechanism DR1 or the like, and the substrate P is simultaneously carried in and out. The first buffer mechanism BF1 includes a chucking drive reel that is disposed adjacent to the downstream side of the transport direction of the substrate P of the processing unit UA and that adjusts the transport amount (or transport speed) of the substrate P carried out to the first splicer portion CSa. NR1 (refer to the figure 5). The driving of the tension reel mechanism DR1 and the driving of the nip drive reel NR1 are controlled by the control unit CT.
此處,藉由顯示第1接帶器部CSa之概略立體外觀之圖3說明其構成。 Here, the configuration will be described with reference to FIG. 3 showing the schematic three-dimensional appearance of the first splicer portion CSa.
第1接帶器部CSa具備在上面具有以例如多孔質材形成之吸附墊1且往基板P之搬送方向(以下,僅稱為搬送方向)移動自如之滑件2、將滑件2往搬送方向移動自如地支承之附導軌之升降台3、使升降台3升降之驅動部4、升降台3位於上升位置時往基板P之寬度方向移動且可將吸附在滑件2之吸附墊1之基板P切斷之刀具部5、可對基板P黏貼黏著帶TP之黏貼部6、及設在升降台3上方且以兩側保持捲繞已施加處理A之基板P之輥RR1用之捲繞軸7之保持部8(可上下動)。 The first splicer portion CSa includes a slider 2 that has a suction pad 1 formed of, for example, a porous material, and that is movable in a transport direction (hereinafter, simply referred to as a transport direction) of the substrate P, and transports the slider 2 The elevating table 3 with the rails movably supported in the direction, the driving unit 4 for elevating and lowering the elevating table 3, and the elevating table 3 are moved in the width direction of the substrate P and can be adsorbed on the adsorption pad 1 of the slider 2 The cutter portion 5 on which the substrate P is cut, the adhesive portion 6 to which the adhesive tape TP is adhered to the substrate P, and the winding roller 1 for the roller RR1 which is disposed above the lift table 3 and which is wound around the substrate P to which the process A has been applied is wound on both sides. The holding portion 8 of the shaft 7 (can be moved up and down).
此外,捲繞軸7,在其外周面之一部分(或全周面)黏貼有黏著力高之樹脂膜或材料,在基板P之前端部接觸捲繞軸7之外周面後,藉由使捲繞軸7旋轉,可自動地捲繞基板P。 Further, the winding shaft 7 is adhered to a resin film or material having a high adhesive force on one portion (or the entire circumferential surface) of the outer peripheral surface thereof, and the end portion of the substrate P is brought into contact with the outer peripheral surface of the winding shaft 7 by the front end of the substrate P. Rotating around the shaft 7 automatically winds the substrate P.
此等滑件2、升降台3、驅動部4、刀具部5、黏貼部6、及保持部8構成為一體化之工作站部SN,可載置在腳輪台等搬送,且可定位在既定位置。 The sliders 2, the lifting table 3, the driving unit 4, the cutter unit 5, the bonding unit 6, and the holding unit 8 are configured as an integrated workstation unit SN, and can be placed on a caster table or the like and can be positioned at a predetermined position. .
此等滑件2、驅動部4、刀具部5、黏貼部6之各驅動被控制部CT控制(參照圖5)。 The driving of the slider 2, the driving unit 4, the cutter unit 5, and the bonding unit 6 is controlled by the control unit CT (see Fig. 5).
又,工作站部SN具備可保持基板P並往長邊方向移動且包含滑件2、升降台3、驅動部4等之移動部,及使移動部移動至切斷機構CU10之切斷 區域或接合機構PU10之接合區域之移動控制部。 Further, the workstation unit SN includes a moving portion that can move the substrate P and moves in the longitudinal direction, and includes the slider 2, the lifting table 3, the driving unit 4, and the like, and moves the moving portion to the cutting mechanism CU10. A movement control unit of the area or the joint area of the joint mechanism PU10.
此外,本實施形態中之黏貼部6係藉由黏著帶TP將基板P貼合,但為其他黏貼方式(機構)亦可。例如,將接著劑往基板P之與搬送方向正交之寬度方向塗布成帶狀並加壓貼合之方式、基板P為樹脂膜等之情形加熱基板P之欲貼合部分並壓接之方式、或超音波接合等之方式亦可。 Further, in the adhesive portion 6 in the present embodiment, the substrate P is bonded by the adhesive tape TP, but other adhesive means (mechanism) may be used. For example, when the adhesive agent is applied in a strip shape in the width direction orthogonal to the conveyance direction of the substrate P and pressure-bonded, and the substrate P is a resin film or the like, the bonding portion of the substrate P is heated and crimped. Or the method of ultrasonic bonding or the like.
又,設在滑件2上面之吸附墊1雖藉由真空壓保持基板P,但藉由真空壓以外之機械式開閉機構(開閉手等)將基板P卡止在滑件1之上面之構成亦可。 Further, the adsorption pad 1 provided on the upper surface of the slider 2 holds the substrate P by vacuum pressure, but the substrate P is locked on the upper surface of the slider 1 by a mechanical opening and closing mechanism (opening or closing hand) other than vacuum pressure. Also.
此外,圖1所示之選擇投入機構ST1,在控制部CT之控制下,將已施加處理A之基板P捲繞於捲繞軸7之輥RR1(以下,稱為子輥RR1)作為子輥RRB11,RRB21,RRB31之任一個選擇性投入安裝部RSB11~RSB31之任一個,且將預備之捲繞軸7搬送至子輥RR1被搬出而空出來之第1接帶器部CSa之保持部8。 Further, the selective input mechanism ST1 shown in FIG. 1 is a sub-roller by rolling the roll RR1 (hereinafter referred to as a sub-roller RR1) on which the substrate P to which the process A has been applied is wound under the control of the control unit CT. Any one of the RRB 11, the RRB 21, and the RRB 31 is selectively inserted into the mounting portions RSB11 to RSB31, and the preparatory winding shaft 7 is transported to the holding portion 8 of the first splicer portion CSa from which the sub-roller RR1 is carried out and vacated. .
本實施形態中,處理速度VA、VC為處理速度VB之約3倍,處理單元UB亦設置三台,因此子輥RR1(亦即,子輥RRB11~RRB31,RRB12~RRB32,後述RR2)捲繞之基板P之長度係設定成捲繞於成為親輥之供應輥RRA之基板P之長度之1/3程度。 In the present embodiment, the processing speeds VA and VC are approximately three times the processing speed VB, and three processing units UB are provided. Therefore, the sub-rollers RR1 (that is, the sub-rollers RRB11 to RRB31, RRB12 to RRB32, and RR2 described later) are wound. The length of the substrate P is set to be about 1/3 of the length of the substrate P wound around the supply roller RRA which is the pro-roller.
是以,切斷機構CU10以將捲繞於供應輥RRA之基板P之全長大致三等分之既定長度將基板P切斷。 In other words, the cutting mechanism CU10 cuts the substrate P by a predetermined length that substantially equals the entire length of the substrate P wound around the supply roller RRA.
又,圖1之選擇投入機構ST2,在控制部CT之控制下,選擇將以處理單元UB1~UB3之任一個施加處理B後之基板P捲繞既定長度量 之安裝部RSB12~RSB32之子輥RRB12~RRB32之任一個,投入接合機構PU10(輥搬送),且對子輥RRB12~RRB32之任一個被搬送而空出來之安裝部RSB12~RSB32安裝預備之捲繞軸。 Further, the selection input mechanism ST2 of FIG. 1 selects the substrate P to be wound by a predetermined length by applying the processing B to any one of the processing units UB1 to UB3 under the control of the control unit CT. In any one of the sub-rollers RRB12 to RRB32 of the mounting portions RSB12 to RSB32, the joining mechanism PU10 (roller conveying) is inserted, and the winding portions of the mounting portions RSB12 to RSB32 that are vacated by any one of the sub-rollers RRB12 to RRB32 are mounted. axis.
接合機構PU10主要將施加處理B並搬送之子輥RRB12~RRB32之任一個作為子輥RR2,接合於之前投入被切斷之基板之終端附近,如圖1所示,具備第2接帶器部CSb(接合部)與第2緩衝機構(第2緩衝部)BF2。又,接合機構PU10,包含將已施加處理B之基板接合之第2接帶器部CSb(接合部)、與基板之儲存量可依據施加處理B之基板之搬送量改變且調整從接合部投入至處理B之基板之搬送量之第2緩衝機構(緩衝部)BF2。 The bonding mechanism PU10 mainly connects any one of the sub-rollers RRB12 to RRB32 to which the process B is applied and is used as the sub-roller RR2, and is joined to the vicinity of the terminal to which the substrate to be cut is previously placed. As shown in FIG. 1, the second pick-up portion CSb is provided. (joining portion) and second buffer mechanism (second buffer portion) BF2. Further, the bonding mechanism PU10 includes the second taper portion CSb (joining portion) for bonding the substrate to which the process B has been applied, and the amount of storage of the substrate to be changed according to the amount of transfer of the substrate to which the process B is applied, and the adjustment is made from the joint portion. The second buffer mechanism (buffer portion) BF2 that handles the transport amount of the substrate of B.
第2接帶器部CSb,如圖4所示,在設置在上述第1接帶器部CSa之工作站部SN使基板P之搬送方向成為相反之狀態下設置。亦即,第2接帶器部CSb具備在上面具有吸附墊1且往搬送方向移動自如之滑件2、將滑件2往搬送方向移動自如地支承之附導軌之升降台3、使升降台3升降之驅動部4、升降台3位於上升位置時往基板P之寬度方向移動且可將吸附在滑件2之吸附墊1之基板P切斷之刀具部5、可對基板P黏貼黏著帶TP之黏貼部6、及設在升降台3上方且以兩側保持捲繞已施加處理B之基板P之子輥RR2用之捲繞軸7之保持部8。 As shown in FIG. 4, the second splicer portion CSb is provided in a state in which the transport direction of the substrate P is reversed in the station portion SN provided in the first splicer portion CSa. In other words, the second adapter unit CSb includes a slider 2 having a suction pad 1 on the upper surface and a movable guide 2 movable in the conveyance direction, and a lifting platform 3 for movably supporting the slider 2 in the conveyance direction. When the driving portion 4 for lifting and lowering is moved to the width direction of the substrate P when the lifting table 3 is at the rising position, the cutter portion 5 which is attached to the substrate P of the adsorption pad 1 of the slider 2 can be cut, and the adhesive tape can be adhered to the substrate P. The TP bonding portion 6 and the holding portion 8 of the winding shaft 7 for the sub-roller RR2 for winding the substrate P to which the processing B has been applied are held above the elevating table 3.
第2緩衝機構BF2與第1緩衝機構BF1構成相同,將搬入處理單元UC之基板P在可調整長度之範圍可變地儲存,與處理單元UC之基板P之搬送方向之上游側相鄰設置。 The second buffer mechanism BF2 is configured in the same manner as the first buffer mechanism BF1, and the substrate P carried in the processing unit UC is variably stored in the range of the adjustable length, and is disposed adjacent to the upstream side in the transport direction of the substrate P of the processing unit UC.
第2緩衝機構BF2具備在基板P之搬送方向相鄰之複數個捲筒彼此往相反方向升降可將基板P之儲存量可變地調整之張力捲筒機構DR2、及調整從第2接帶器部CSb往張力捲筒機構DR2搬送之基板P之搬送量(搬送速度)之夾持驅動捲筒NR2(參照圖5)。張力捲筒機構DR2之驅動及夾持驅動捲筒NR2之驅動被控制部CT控制。 The second buffer mechanism BF2 includes a tension reel mechanism DR2 that variably adjusts the storage amount of the substrate P in a plurality of reels adjacent to each other in the transport direction of the substrate P, and an adjustment from the second retractor The conveyance amount (transport speed) of the substrate P conveyed by the portion CSb to the tension reel mechanism DR2 is held by the drive reel NR2 (see FIG. 5). The driving of the tension reel mechanism DR2 and the driving of the nip drive reel NR2 are controlled by the control unit CT.
圖5係圖1~圖4所示之基板處理系統之控制方塊圖。 FIG. 5 is a control block diagram of the substrate processing system shown in FIGS. 1 to 4.
如圖5所示,控制部CT控制處理單元UA,UB(UB1~UB3),UC之動作,且統籌控制設在切斷機構CU10與接合機構PU10之各個之滑件2、驅動部4、刀具部5、黏貼部6、選擇投入機構ST1,ST2、張力捲筒機構DR1,DR2、夾持驅動捲筒NR1,NR2等之驅動。此外,控制部CT計數管理供應輥RRA、回收輥RRC之旋轉驅動、在各步驟(各處理單元)之基板P之搬送長度,計數管理成為基板P之供應側之各輥之基板殘餘量、成為基板P之回收側之各輥之基板捲繞量,亦進行處理步驟A~C之整體作業時間之管理、各輥分別之處理上有無問題或產生不良情形之程度或部位等資訊之管理。控制部CT包含使切斷機構CU10之動作與在第1緩衝部BF1之基板P之儲存量連動之連動控制部。同樣地,控制部CT包含使接合機構PU10之動作與在第2緩衝部BF2之基板P之儲存量連動之連動控制部。 As shown in FIG. 5, the control unit CT controls the operations of the processing units UA, UB (UB1 to UB3), UC, and collectively controls the slider 2, the drive unit 4, and the cutters provided in each of the cutting mechanism CU10 and the engagement mechanism PU10. The portion 5, the bonding portion 6, the selection of the input mechanisms ST1, ST2, the tension reel mechanisms DR1, DR2, and the driving of the driving reels NR1, NR2 and the like. In addition, the control unit CT counts the rotation of the supply roller RRA, the recovery roller RRC, and the transport length of the substrate P in each step (each processing unit), and counts and manages the remaining amount of the substrate on the supply side of the substrate P. The substrate winding amount of each of the rolls on the recovery side of the substrate P is also managed by the management of the overall operation time of the processing steps A to C, the presence or absence of problems in the processing of each of the rolls, and the degree or location of the defective condition. The control unit CT includes an interlocking control unit that interlocks the operation of the cutting mechanism CU10 with the storage amount of the substrate P of the first buffer unit BF1. Similarly, the control unit CT includes an interlocking control unit that interlocks the operation of the bonding mechanism PU10 with the storage amount of the substrate P in the second buffer unit BF2.
接著,說明上述構成之基板處理系統之動作。 Next, the operation of the substrate processing system having the above configuration will be described.
此處,如圖1所示,在處理單元UB1處理B完成之後一刻,子輥RRB12被選擇投入機構ST2搬送至第2接帶器部CSb之保持部8。又,在處理單元UB2,對從安裝在安裝部RSB21之子輥RRB21引出之基板P施加處理B。 又,在處理單元UB3,在成為下一個處理對象之子輥RRB31安裝至安裝部RSB31為止待機。 Here, as shown in FIG. 1, the sub-roller RRB12 is transported to the holding portion 8 of the second splicer portion CSb by the selective input mechanism ST2 one time after the processing B of the processing unit UB1 is completed. Further, in the processing unit UB2, the process B is applied to the substrate P drawn from the sub-roller RRB21 attached to the mounting portion RSB21. In addition, the processing unit UB3 waits until the sub-roller RRB31 to be next processed is attached to the mounting portion RSB31.
又,以下說明中,由於各構成機器之動作被控制部CT控制,因此省略其記載。 In the following description, since the operation of each component device is controlled by the control unit CT, the description thereof will be omitted.
首先,在第1接帶器部CSa之保持部8所保持之子輥RR1,以既定長度捲繞已施加處理A之基板P後,在第1緩衝機構BF1,夾持驅動捲筒NR1停止驅動,停止對第1接帶器部CSa之基板P之供應。此時,在處理單元UA持續進行處理A,基板P被送往第1緩衝機構BF1。因此,在第1緩衝機構BF1之張力捲筒機構DR1驅動成使基板P之儲存量增加之方向。 First, after the substrate P to which the process A has been applied is wound with a predetermined length in the sub-roller RR1 held by the holding portion 8 of the first splicer portion CSa, the drive roller NR1 is held by the first damper mechanism BF1 to stop driving. The supply of the substrate P to the first splicer portion CSa is stopped. At this time, the processing unit UA continues the processing A, and the substrate P is sent to the first buffer mechanism BF1. Therefore, the tension reel mechanism DR1 of the first buffer mechanism BF1 is driven in a direction in which the storage amount of the substrate P is increased.
與來自第1緩衝機構BF1之基板P之供應停止連動,在第1接帶器部CSa進行基板P之切斷處理。 The supply of the substrate P from the first buffer mechanism BF1 is stopped, and the cutting process of the substrate P is performed in the first splicer portion CSa.
具體而言,首先,滑件2移動至與刀具部5對向之位置後,藉由驅動部4之作動使升降台3與滑件2一起上升。藉由滑件2之上升,吸附墊1從背面(下面)吸附保持基板P,定位刀具部5之切斷位置。之後,刀具部5,往基板P之寬度方向移動並將基板P切斷。基板P被切斷後,選擇投入機構ST1將子輥RR1作為子輥RRB31投入處理單元UB3之安裝部RSB31。又,選擇投入機構ST1在子輥RR1排出後成為空的第1接帶器部CSa之保持部8裝填預備之捲繞軸7。 Specifically, first, after the slider 2 is moved to a position facing the cutter portion 5, the lift table 3 is lifted together with the slider 2 by the operation of the drive portion 4. By the rise of the slider 2, the adsorption pad 1 sucks and holds the substrate P from the back surface (lower surface), and positions the cutting position of the cutter portion 5. Thereafter, the cutter portion 5 moves in the width direction of the substrate P and cuts the substrate P. After the substrate P is cut, the input mechanism ST1 is selected to put the sub-roller RR1 as the sub-roller RRB31 into the mounting portion RSB31 of the processing unit UB3. Moreover, the holding mechanism ST1 is loaded with the preparatory winding shaft 7 in the holding portion 8 of the first splicer portion CSa which is empty after the sub-roller RR1 is discharged.
在第1接帶器部CSa,捲繞軸7安裝在保持部8後,滑件2移動(同時夾持驅動捲筒NR1亦同步旋轉既定量)以使吸附保持在滑件2上面 之基板P之前端部分位於捲繞軸7之下方,支承捲繞軸7之保持部8下降一定距離,基板P之前端部分密合於捲繞軸7之外周面之黏著部。如此,從第1緩衝機構BF1側延伸之基板P之前端部分連接於新的捲繞軸7後,解除吸附墊1之吸附保持,之後,保持部8返回原本之高度位置,藉由驅動部4之作動使升降台3與滑件2一起下降。 In the first splicer portion CSa, after the winding shaft 7 is attached to the holding portion 8, the slider 2 is moved (while the nip roller NR1 is also rotated synchronously) so that the suction is held on the slider 2 The front end portion of the substrate P is positioned below the winding shaft 7, and the holding portion 8 for supporting the winding shaft 7 is lowered by a predetermined distance, and the front end portion of the substrate P is adhered to the adhesive portion of the outer peripheral surface of the winding shaft 7. As described above, the front end portion of the substrate P extending from the side of the first buffer mechanism BF1 is connected to the new winding shaft 7, and the adsorption holding of the suction pad 1 is released. Then, the holding portion 8 returns to the original height position, and the driving portion 4 is returned. The action causes the lifting platform 3 to descend together with the slider 2.
之後,夾持驅動捲筒NR1與新的捲繞軸7之旋轉驅動再次開始,來自第1緩衝機構BF1之基板P之供應再次開始,基板P捲繞至新的捲繞軸7。基板P之供應再次開始後,夾持驅動捲筒NR1以較與在處理單元UA之處理速度VA對應之基板P之輸送速度(亦即,基板P送至第1緩衝機構BF1之速度)稍快之速度旋轉。在張力捲筒機構DR1,與夾持驅動捲筒NR1之驅動對應,驅動成使基板P之儲存量減少之方向。 Thereafter, the rotational driving of the grip driving reel NR1 and the new winding shaft 7 is resumed, the supply of the substrate P from the first buffer mechanism BF1 is resumed, and the substrate P is wound up to the new winding shaft 7. After the supply of the substrate P is resumed, the driving drive reel NR1 is slightly faster than the conveying speed of the substrate P corresponding to the processing speed VA of the processing unit UA (that is, the speed at which the substrate P is sent to the first buffer mechanism BF1). The speed of rotation. The tension reel mechanism DR1 is driven in a direction to reduce the amount of storage of the substrate P in accordance with the driving of the nip drive reel NR1.
在儲存在第1緩衝機構BF1之基板P之長度為大致最小後,以與在處理單元UA之基板P之輸送速度相同之速度驅動夾持驅動捲筒NR1。 After the length of the substrate P stored in the first buffer mechanism BF1 is substantially minimum, the chuck driving reel NR1 is driven at the same speed as the conveyance speed of the substrate P of the processing unit UA.
另一方面,從安裝在處理單元UB3之安裝部RSB31之子輥RRB31引出基板P,以與處理速度VB對應之速度輸送並施加處理B,捲繞至安裝在安裝部RSB32之子輥RRB32。 On the other hand, the substrate P is taken out from the sub-roller RRB31 attached to the mounting portion RSB31 of the processing unit UB3, transported and applied at a speed corresponding to the processing speed VB, and wound up to the sub-roller RRB32 attached to the mounting portion RSB32.
在處理單元UB3,在對從子輥RRB31引出之基板P施加處理B之期間,在處理單元UB2,對從子輥RRB21引出之基板P之處理B完成,捲繞有基板P之子輥RRB2在安裝部RSB22待機。 In the processing unit UB3, while the process B is applied to the substrate P drawn from the sub-roller RRB31, the processing B of the substrate P taken out from the sub-roller RRB21 is completed in the processing unit UB2, and the sub-roller RRB2 around which the substrate P is wound is mounted. The RSB22 is in standby.
藉由選擇投入機構ST2,對來自之前作為子輥RR2安裝在 接合機構PU10之子輥RRB12之基板P之處理單元UC之處理C完成後,在接合機構PU10之第2緩衝機構BF2之夾持驅動捲筒NR2之驅動停止,往張力捲筒機構DR2之基板P之供應停止。 By selecting the input mechanism ST2, the pair is attached as the sub-roller RR2 After the processing C of the processing unit UC of the substrate P of the sub-roller RRB12 of the bonding mechanism PU10 is completed, the driving of the clamping drive reel NR2 of the second buffer mechanism BF2 of the bonding mechanism PU10 is stopped, and the substrate P of the tension reel mechanism DR2 is stopped. Supply stopped.
此時,在處理單元UC持續進行處理C。因此,張力捲筒機構DR2作動,以與在處理單元UC之基板P之輸送量(處理速度VC)對應之一定速度將儲存在第2緩衝機構BF2之基板P往處理單元UC送出。 At this time, the processing C is continued in the processing unit UC. Therefore, the tension reel mechanism DR2 is actuated to send the substrate P stored in the second buffer mechanism BF2 to the processing unit UC at a constant speed corresponding to the conveyance amount (processing speed VC) of the substrate P of the processing unit UC.
在第2接帶器部CSb,與在第1接帶器部CSa之切斷處理同樣地,滑件2移動至與刀具部5對向之位置後,藉由驅動部4之作動使升降台3與滑件2一起上升。藉由滑件2之上升,吸附墊1從背面(下面)吸附保持來自子輥RRB12之基板P,定位刀具部5之切斷位置。之後,刀具部5,往基板P之寬度方向移動並將基板P切斷。基板P被切斷後,選擇投入機構ST2從保持部8取出捲繞有子輥RR2(RRB12)之捲繞軸7,在空的保持部8安裝在安裝部RSB22待機之子輥RRB22作為子輥RR2。 In the second splicer portion CSb, similarly to the cutting process of the first splicer portion CSa, the slider 2 is moved to a position facing the tool portion 5, and then the driving portion 4 is actuated to cause the lifting table. 3 rises together with the slider 2. By the rise of the slider 2, the adsorption pad 1 sucks and holds the substrate P from the sub-roller RRB12 from the back surface (lower surface), and positions the cutting position of the cutter portion 5. Thereafter, the cutter portion 5 moves in the width direction of the substrate P and cuts the substrate P. After the substrate P is cut, the input mechanism ST2 selects the winding shaft 7 around which the sub-roller RR2 (RRB12) is wound, and the empty holding portion 8 is attached to the sub-roller RRB22 in which the mounting portion RSB22 stands by as the sub-roller RR2.
作為子輥RR2,子輥RRB22安裝在第2接帶器部CSb之保持部8後,從子輥RR2引出之基板P之前端部分與之前切斷之第2緩衝機構BF2側之基板P之後端部對準,二片基板P皆以吸附墊1保持。在此狀態下,二片基板P藉由黏著帶TP接合。基板P接合後,解除吸附墊1之吸附保持,之後,藉由驅動部4之作動使升降台3與滑件2一起下降。之後,藉由驅動夾持驅動捲筒NR2,從第2接帶器部CSb往第2緩衝機構BF2之基板P之供應再次開始。 As the sub-roller RR2, after the sub-roller RRB22 is attached to the holding portion 8 of the second belt connector portion CSb, the front end portion of the substrate P taken out from the sub-roller RR2 and the rear end of the substrate P on the side of the second buffer mechanism BF2 that has been cut before. When the portions are aligned, the two substrates P are all held by the adsorption pad 1. In this state, the two substrates P are joined by the adhesive tape TP. After the substrate P is joined, the adsorption holding of the adsorption pad 1 is released, and thereafter, the lifting table 3 is lowered together with the slider 2 by the operation of the driving portion 4. Thereafter, by driving the nip drive reel NR2, the supply of the substrate P from the second splicer portion CSb to the second damper mechanism BF2 is resumed.
基板P之供應再次開始後,夾持驅動捲筒NR2以較與在處 理單元UC之處理速度VC對應之基板P之輸送速度稍快之速度旋轉。在張力捲筒機構DR2,與夾持驅動捲筒NR2之驅動對應,驅動成使基板P之儲存量增加之方向。 After the supply of the substrate P is started again, the driving drive reel NR2 is clamped to be more The processing speed of the processing unit VC is rotated at a speed slightly faster than the transport speed of the substrate P. The tension reel mechanism DR2 is driven in a direction in which the amount of storage of the substrate P is increased in accordance with the driving of the nip drive reel NR2.
在儲存在第2緩衝機構BF2之基板P之長度為大致最大後,以與在處理單元UC之基板P之輸送速度相同之速度驅動夾持驅動捲筒NR2。接著,從透過第2緩衝機構BF2輸送至處理單元UC之子輥RRB22(子輥RR2)引出之基板P係以處理速度VC施加處理C。 After the length of the substrate P stored in the second buffer mechanism BF2 is substantially the maximum, the chuck driving reel NR2 is driven at the same speed as the conveyance speed of the substrate P of the processing unit UC. Next, the substrate P drawn from the sub-roller RRB22 (sub-roller RR2) that has been transported to the processing unit UC through the second buffer mechanism BF2 is subjected to the processing speed VC application process C.
如上述,以處理單元UA施加處理A後之基板P,捲繞為依據處理單元UB之台數分割之長度之子輥RR1後,依序投入處理單元UB1~UB3並施加處理B之後,從處理單元UB1~UB3作為子輥RR2依序投入處理單元UC並施加處理C。關於處理速度VB較處理速度VC慢之處理單元UB,依據處理速度之比設有三台,因此表觀上,從三台處理單元UB1~UB3以與用處理速度VB之3倍之處理速度施加處理B後之情形相同之週期將子輥RR2投入處理單元VC。 As described above, the substrate P after the processing A is applied by the processing unit UA, and is wound into the sub-rollers RR1 of the length divided by the number of the processing units UB, and then sequentially processed into the processing units UB1 to UB3 and applied with the processing B, and then the processing unit UB1 to UB3 are sequentially supplied to the processing unit UC as the sub-rollers RR2 and the process C is applied. Regarding the processing unit UB whose processing speed VB is slower than the processing speed VC, three units are provided in accordance with the processing speed ratio, so apparently, processing is applied from the three processing units UB1 to UB3 at a processing speed equal to three times the processing speed VB. The sub-roller RR2 is put into the processing unit VC in the same cycle after B.
如上述,本實施形態中,依據處理單元UA,UB之各個之性能,可設定成處理速度VA>處理速度VB之情形,將處理單元UA之台數n與處理單元UB之台數m之關係設成n<m,將基板P切斷成與台數m對應之長度之子輥並選擇性投入m台處理單元UB1~UBm之任一個。因此,不會受限於低處理速度VB,生產線整體觀之,能以處理速度VA處理基板P。 As described above, in the present embodiment, depending on the performance of each of the processing units UA, UB, the processing speed VA > the processing speed VB can be set, and the relationship between the number n of processing units UA and the number m of processing units UB can be set. When n<m, the substrate P is cut into sub-rollers having a length corresponding to the number m, and is selectively supplied to any one of the m processing units UB1 to UBm. Therefore, it is not limited to the low processing speed VB, and the entire line can be processed, and the substrate P can be processed at the processing speed VA.
又,依據處理單元UB,UC之各個之性能,可設定成處理速度VB<處理速度VC之情形,將以複數台(m)處理單元UB1~UBm施加處理B 後之子輥RR2之基板P依序接合並投入n台(n<m)處理單元UC。因此,可實質上抑制基板P從處理單元UB搬入至處理單元UC為止之等待時間。 Further, depending on the performance of each of the processing units UB, UC, the processing speed VB<the processing speed VC can be set, and the processing B is applied to the plurality of (m) processing units UB1 to UBm. The substrate P of the succeeding sub-roller RR2 is sequentially joined and placed in n (n < m) processing units UC. Therefore, the waiting time until the substrate P is carried from the processing unit UB to the processing unit UC can be substantially suppressed.
是以,此情形亦不會受限於低處理速度VB,能以處理速度VC(≒VA)處理基板P。 Therefore, the situation is not limited to the low processing speed VB, and the substrate P can be processed at the processing speed VC (≒VA).
是以,本實施形態中,即使依序施加處理速度不同之複數個處理A~C之情形,亦可謀求產率提升。又,本實施形態中,依據處理速度之比設定處理單元UB之台數。因此,不過度設置設備即可實現高效率基板處理。此外,本實施形態中,將複線化之處理單元UB1~UB3在上下方向多段設置之情形,不增加設置面積(footprint)即可實施高效率基板處理。 Therefore, in the present embodiment, even if a plurality of processes A to C having different processing speeds are sequentially applied, the yield can be improved. Further, in the present embodiment, the number of processing units UB is set in accordance with the ratio of the processing speeds. Therefore, high-efficiency substrate processing can be realized without excessively setting the device. Further, in the present embodiment, in the case where the multi-line processing units UB1 to UB3 are provided in a plurality of stages in the vertical direction, high-efficiency substrate processing can be performed without increasing the footprint.
又,本實施形態中,使附緩衝機構之切斷機構CU10與附緩衝機構之接合機構PU10為可使用於切斷用與接合用之任一者之共通構成,設置為工作站部SN。因此,不需個別設置不同種之裝置,亦可降低生產設備之成本。 Further, in the present embodiment, the cutting mechanism CU10 with the buffer mechanism and the joining mechanism PU10 with the buffer mechanism are provided in common with each of the cutting and joining, and are provided as the workstation unit SN. Therefore, it is not necessary to separately set different types of devices, and the cost of the production equipment can also be reduced.
亦即,在一連串之複數個處理單元中之相鄰處理單元間,若相對於基板P之搬送方向之上游側之處理單元,下游側之處理單元之處理速度較低,則在其間設置工作站部SN作為切斷機構CU10,處理速度之關係相反之情形,在相鄰處理單元間設置工作站部SN作為接合機構PU10即可。 That is, if the processing speed of the processing unit on the downstream side is lower than the processing unit on the upstream side of the transport direction of the substrate P among the adjacent processing units among the plurality of processing units, the workstation portion is disposed therebetween. When the SN is the cutting mechanism CU10, the relationship between the processing speeds is reversed, and the workstation unit SN may be provided between the adjacent processing units as the bonding mechanism PU10.
亦即,本實施形態之基板處理系統,在一連串之複數個處理單元中之相鄰處理單元間,相對於基板P之搬送方向之上游側之處理單元(第1處理單元)之基板P之搬送速度,使下游側之處理單元(第2處理單元) 之基板P之搬送速度降低時,在第1處理單元與第2處理單元之間具備將基板P以長帶方向之既定長度切斷之切斷機構CU10,相對於第1處理單元之基板P之搬送速度,使第2處理單元之基板P之搬送速度增加時,在第1處理單元與第2處理單元之間具備將基板P在長邊方向接合之接合機構PU10。 In other words, in the substrate processing system of the present embodiment, the substrate P of the processing unit (first processing unit) on the upstream side in the transport direction of the substrate P is transported between adjacent processing units among the plurality of processing units. Speed, the processing unit on the downstream side (second processing unit) When the transport speed of the substrate P is lowered, the cutting mechanism CU10 that cuts the substrate P by a predetermined length in the long-band direction is provided between the first processing unit and the second processing unit, and the substrate P of the first processing unit is When the conveyance speed is increased and the conveyance speed of the substrate P of the second processing unit is increased, the bonding mechanism PU10 that joins the substrate P in the longitudinal direction is provided between the first processing unit and the second processing unit.
(元件製造系統) (Component Manufacturing System)
接著,參照圖6說明適用上述基板處理系統之元件製造系統。 Next, a component manufacturing system to which the above substrate processing system is applied will be described with reference to FIG.
圖6係顯示作為基板處理系統之元件製造系統(可撓性顯示器生產線)之一部分之構成之圖。此處,顯示從供應輥RR1引出之可撓性基板P(片、膜等)依序經過n台處理裝置U1,U2,U3,U4,…Un捲繞至回收輥RR2之例。上位控制裝置CONT(控制部)統籌控制構成生產線之各處理裝置U1~Un。 Fig. 6 is a view showing the constitution of a part of a component manufacturing system (flexible display production line) as a substrate processing system. Here, the flexible substrate P (sheet, film, etc.) drawn from the supply roller RR1 is sequentially passed through the n processing apparatuses U1, U2, U3, U4, ... Un to the recovery roll RR2. The upper control unit CONT (control unit) collectively controls the processing units U1 to Un constituting the production line.
此外,圖6所示之處理裝置U1~Un為圖1所示之處理單元UA~UC之任一者亦可,使處理裝置U1~Un中之二個以上之連續之處理裝置一起對應處理單元UA~UC之任一者亦可。 In addition, the processing apparatuses U1 to Un shown in FIG. 6 may be any one of the processing units UA to UC shown in FIG. 1, and two or more consecutive processing apparatuses of the processing apparatuses U1 to Un may be associated with the processing unit. Any of UA~UC can also be used.
圖6中,正交座標系XYZ設定成基板P之表面(或背面)與XZ面垂直,與基板P之搬送方向(長帶方向)正交之寬度方向設定成Y軸方向。此外,該基板P係預先藉由既定前置處理將其表面改質活性化者,或在表面形成有精密圖案化用之微細之分隔壁構造(凹凸構造)者亦可。 In FIG. 6, the orthogonal coordinate system XYZ is set such that the surface (or the back surface) of the substrate P is perpendicular to the XZ plane, and the width direction orthogonal to the transport direction (long strip direction) of the substrate P is set to the Y-axis direction. In addition, the substrate P may be modified in advance by a predetermined pre-treatment, or a fine partition structure (concave-convex structure) for precise patterning may be formed on the surface.
捲繞至供應輥RR1之基板P係藉由夾持之驅動捲筒DR10引出並搬送至處理裝置U1。基板P之Y軸方向(寬度方向)之中心係藉由邊 緣位置控制器EPC1以相對於目標位置位在±十數μm~數十μm程度之範圍之方式進行伺服控制。 The substrate P wound up to the supply roller RR1 is taken out by the driven drive reel DR10 and conveyed to the processing apparatus U1. The center of the Y-axis direction (width direction) of the substrate P is by the side The edge position controller EPC1 performs servo control so as to be in the range of ±10 μm to several tens of μm with respect to the target position.
處理裝置U1係以印刷方式在基板P之搬送方向(長邊方向)將感光性機能液(光阻、感光性矽烷耦合材、感光性耦合材、感光性親撥液改質劑、感光性鍍敷還原劑、UV硬化樹脂液等)連續地或選擇性地塗布在基板P表面之塗布裝置。在處理裝置U1內設有塗布機構Gp1與急速地除去塗布在基板P上之感光性機能液所含之溶劑或水分之乾燥機構Gp2等,該塗布機構Gp1包含捲繞有基板P之壓體捲筒DR20、在此壓體捲筒DR20上將感光性機能液均勻地塗布在基板P表面之塗布用捲筒、或將感光性機能液作為油墨印刷圖案之凸版或凹版之版體捲筒等。 The processing device U1 is a photosensitive functional liquid (photoresist, photosensitive decane coupling material, photosensitive coupling material, photosensitive dia liquid modifier, photosensitive plating) in the transfer direction (longitudinal direction) of the substrate P by printing. A coating device that applies a reducing agent, a UV-curing resin solution, or the like to the surface of the substrate P continuously or selectively. The processing device U1 is provided with a coating mechanism Gp1 and a drying mechanism Gp2 for rapidly removing the solvent or moisture contained in the photosensitive functional liquid applied to the substrate P, and the coating mechanism Gp1 includes a pressing body roll around which the substrate P is wound. The cylinder DR20 is a coating roll in which the photosensitive functional liquid is uniformly applied to the surface of the substrate P, or a photosensitive functional liquid is used as a relief or intaglio plate roll of the ink printing pattern.
處理裝置U2係將從處理裝置U1搬送來之基板P加熱至既定溫度(例如,數十~120℃程度)並使塗布在表面之感光性機能層穩定地固定之加熱裝置。在處理裝置U2內設有使基板P折返並搬送之複數個捲筒與空氣旋轉桿、將搬入而來之基板P加熱之加熱室部HA1、使加熱後之基板P之溫度下降成與後續步驟(處理裝置U3)之環境溫度一致之冷卻室部HA2、及夾持之驅動捲筒DR3等。 The processing device U2 is a heating device that heats the substrate P conveyed from the processing device U1 to a predetermined temperature (for example, several tens to 120 ° C) and stably fixes the photosensitive functional layer applied to the surface. In the processing apparatus U2, a plurality of reels and an air rotating rod for folding and transporting the substrate P, and a heating chamber portion HA1 for heating the loaded substrate P are provided, and the temperature of the substrate P after heating is lowered to a subsequent step. (Processing device U3) The cooling chamber portion HA2 having the same ambient temperature and the driven driving drum DR3 and the like.
處理裝置U3係對從處理裝置U2搬送而來之基板P之感光性機能層照射與顯示器用電路圖案或配線圖案對應之紫外線之圖案化光之曝光裝置。在處理裝置U3內設有將基板P之Y軸方向(寬度方向)之中心控制成一定位置之邊緣位置控制器EPC、夾持之驅動捲筒DR4、將基板P以既定張力局部捲繞並將基板P上之圖案曝光部分支承成均勻之圓筒面狀之 旋轉筒DR5、及對基板P賦予既定鬆弛(空隙)DL之二組驅動捲筒DR6,DR7等。 The processing device U3 is an exposure device that irradiates the photosensitive functional layer of the substrate P transferred from the processing device U2 with the patterned light of ultraviolet rays corresponding to the circuit pattern for the display or the wiring pattern. The processing device U3 is provided with an edge position controller EPC that controls the center of the substrate P in the Y-axis direction (width direction) to a certain position, the clamped drive reel DR4, and partially winds the substrate P at a predetermined tension and The pattern exposed portion on the substrate P is supported in a uniform cylindrical shape The rotating cylinder DR5 and the two sets of driving reels DR6, DR7 and the like which impart a predetermined slack (void) DL to the substrate P.
再者,在處理裝置U3內設有透射型圓筒光罩DM、設在該圓筒光罩DM內且照明形成在圓筒光罩DM之外周面之光罩圖案之照明機構IU、及對準顯微鏡AM1,AM2,該對準顯微鏡AM1,AM2,為了使圓筒光罩DM之光罩圖案之一部分之像與基板P在藉由旋轉筒DR5支承成圓筒面狀之基板P之一部分相對地對準,檢測預先形成在基板P之對準標記等。 Further, in the processing apparatus U3, a transmissive cylindrical mask DM, an illumination mechanism IU provided in the cylindrical mask DM and illuminating a mask pattern formed on the outer peripheral surface of the cylindrical mask DM, and a pair are provided. The quasi-microscopes AM1, AM2, the alignment microscopes AM1, AM2, in order to make the image of a portion of the mask pattern of the cylindrical mask DM and the substrate P in a portion of the substrate P supported by the rotating cylinder DR5 in a cylindrical shape The alignment is performed, and an alignment mark or the like formed in advance on the substrate P is detected.
處理裝置U4係對從處理裝置U3搬送而來之基板P之感光性機能層進行濕式顯影處理、化學鍍處理等之各種濕式處理之至少一個之濕式處理裝置。在處理裝置U4內設有在Z軸方向階層化之三個處理槽BT1,BT2,BT3、彎折基板P並搬送之複數個捲筒、及夾持之驅動捲筒DR8等。 The processing apparatus U4 is a wet processing apparatus which performs at least one of various wet processing such as wet development processing and electroless plating processing on the photosensitive functional layer of the substrate P transferred from the processing apparatus U3. In the processing apparatus U4, three processing tanks BT1, BT2, BT3 which are layered in the Z-axis direction, a plurality of reels which are conveyed by bending the substrate P, and a driving reel DR8 which is sandwiched are provided.
處理裝置U5係將從處理裝置U4搬送而來之基板P加熱並將因濕式製程濕的基板P之水分含有量調整成既定值之加熱乾燥裝置,但省略詳細說明。之後,經過幾個處理裝置並通過一連串製程之最後之處理裝置Un之基板P,透過夾持之驅動捲筒DR10捲繞至回收捲筒RR2。在捲繞時亦以基板P之Y軸方向(寬度方向)之中心、或Y軸方向之基板端在Y軸方向不偏差之方式,藉由邊緣位置控制器EPC2依序修正控制驅動捲筒DR10與回收捲筒RR2之Y軸方向之相對位置。 The processing apparatus U5 is a heating and drying apparatus that heats the substrate P conveyed from the processing apparatus U4 and adjusts the moisture content of the substrate P wetted by the wet process to a predetermined value, but detailed description thereof will be omitted. Thereafter, the substrate P passing through several processing apparatuses and passing through the last processing apparatus Un of the series of processes is wound up to the recovery reel RR2 through the nip drive DR10. At the time of winding, the center of the Y-axis direction (width direction) of the substrate P or the substrate end of the Y-axis direction is not deviated in the Y-axis direction, and the drive position reel DR10 is sequentially modified by the edge position controller EPC2. The position relative to the Y-axis direction of the recovery reel RR2.
上述圖6之元件製造系統中,與各處理裝置U1,U2,U3,U4,U5,…Un之處理速度對應,處理速度慢之處理單元複線化且並置複數台,且在該處理裝置之前設置切斷機構CU10,設置用以將基板投入複數個處理 裝置之任一個之選擇投入機構ST1。 In the component manufacturing system of FIG. 6 described above, corresponding to the processing speed of each processing device U1, U2, U3, U4, U5, ... Un, the processing unit with a slow processing speed is doubled and juxtaposed, and is set before the processing device. Cutting mechanism CU10, configured to put the substrate into a plurality of processes Any one of the devices is selected to be input to the mechanism ST1.
又,在處理速度慢之複數台處理裝置之後設置將從各處理裝置搬出之複數個基板依序接合之接合機構PU10,藉此即使依序施加處理速度大幅不同之複數個處理之情形,不會受到處理速度最低之處理步驟之限制,可謀求產率提升。 Further, after the plurality of processing apparatuses that are slow in processing speed, the bonding mechanism PU10 that sequentially joins the plurality of substrates carried out from the processing apparatuses is provided, and even if a plurality of processing processes having substantially different processing speeds are sequentially applied, Limited by the processing steps with the lowest processing speed, the yield can be improved.
圖6所示之生產線之情形,進行加熱處理之處理裝置U2極力地將基板P之搬送速度抑制較低,可縮小室部HA1,HA2之容積,相對應地,具有可削減使用電力且亦可降低裝置設置之設置面積之優點。 In the case of the production line shown in Fig. 6, the processing device U2 that performs the heat treatment suppresses the transfer speed of the substrate P as much as possible, and the volume of the chamber portions HA1 and HA2 can be reduced, and accordingly, the power can be reduced and the power can be reduced. The advantage of reducing the set area of the device settings.
另一方面,在緊鄰處理裝置U2之前之處理裝置U1,將感光性機能液圖案化並印刷塗布在基板P表面之情形,使用圖案印刷用之版體(凹版或凸版)捲筒,在此捲筒塗布感光性機能液作為油墨後,使基板P抵接於版體捲筒以轉印圖案。此情形,為了使從版體捲筒至基板P之圖案轉印特性良好,必須以某種程度快之速度輸送基板P。 On the other hand, in the case of the processing device U1 immediately before the processing device U2, the photosensitive functional liquid is patterned and printed on the surface of the substrate P, and the plate (gravure or relief) roll for pattern printing is used. After the cylinder is coated with the photosensitive functional liquid as an ink, the substrate P is brought into contact with the plate cylinder to transfer the pattern. In this case, in order to make the pattern transfer characteristics from the plate roll to the substrate P good, it is necessary to transport the substrate P at a certain speed.
如上述,在處理裝置U1與處理裝置U2,視裝置性能有可能所欲之基板搬送速度(處理速度)大幅地不同。是以,在此種情形,將處理裝置U1設為圖1中之處理單元UA,將處理裝置U2如圖1中之處理單元UB1~UB3般複線化,則可構築高效率且產率高之生產線。 As described above, in the processing device U1 and the processing device U2, the substrate transfer speed (process speed) which is likely to be desired depending on the device performance is largely different. Therefore, in this case, the processing device U1 is set as the processing unit UA in FIG. 1, and the processing device U2 is doubled as in the processing units UB1 to UB3 in FIG. 1, so that high efficiency and high yield can be constructed. production line.
此處,在之前之圖1之處理系統(生產線)之情形,相較於習知單線化處理,期盼多少程度之作業時間提升,根據圖7所示之模型例,參照圖8之時序圖進行說明。 Here, in the case of the processing system (production line) of the previous FIG. 1, compared with the conventional single-line processing, how much work time is expected to be improved, according to the model example shown in FIG. 7, referring to the timing chart of FIG. Be explained.
圖7(a)係顯示使處理三個步驟A、B、C之各個之處理單元 UA,UB,UC各為一台而進行單線化處理之情形之模型例。此處,在供應輥RRA捲繞有全長1200m之基板P。又,各處理單元UA~UC之裝置之性能假設具有以下處理能力。亦即,處理單元UA具有以最大15cm/s輸送基板P並進行處理之能力,處理單元UB具有以最大5cm/s輸送基板P並進行處理之能力,處理單元UC具有以最大15cm/s輸送基板P並進行處理之能力。 Figure 7 (a) shows the processing unit that causes each of the three steps A, B, and C to be processed. A model example of a case where each of UA, UB, and UC is single-line processing. Here, the substrate P having a total length of 1200 m is wound around the supply roller RRA. Further, the performance of the devices of the respective processing units UA to UC assumes the following processing capabilities. That is, the processing unit UA has the ability to transport and process the substrate P at a maximum of 15 cm/s, the processing unit UB has the ability to transport and process the substrate P at a maximum of 5 cm/s, and the processing unit UC has a substrate transported at a maximum of 15 cm/s. P and the ability to process.
上述單線化之情形,生產線整體之基板P之搬送速度與最慢之處理單元UB之速度5cm/s一致,因此生產作業時間時間(對1200m之基板施加步驟處理A、B、C全部之時間)成為400分(6小時40分)。 In the case of the above-described single-line, the transport speed of the substrate P of the entire production line is the same as the speed of the slowest processing unit UB of 5 cm/s, so the production operation time (the time for applying the steps A, B, and C to the substrate of 1200 m) Become 400 points (6 hours and 40 minutes).
相對於此,圖7(b)係顯示如之前圖1般複線化之生產線之模型例。各處理單元UA,UB(UB1~UB3),UC之各性能與圖7(a)之說明相同。與上述圖1同樣地,使處理處理步驟B之處理單元UB複線化,設置三台處理單元UB1~UB3,設包含處理單元UA後之切斷機構CU10之切斷處理時間與選擇投入機構ST1進行之子輥更換時間等之準備時間為3分,設包含處理單元UC前之接合機構PU10之接合處理時間與選擇投入機構ST2進行之子輥更換時間等之準備時間為3分。 On the other hand, Fig. 7(b) shows a model example of a production line which is doubled as in the previous Fig. 1. The performance of each processing unit UA, UB (UB1 to UB3), UC is the same as that described in Fig. 7(a). Similarly to the above-described FIG. 1, the processing unit UB of the processing step B is doubled, three processing units UB1 to UB3 are provided, and the cutting processing time of the cutting unit CU10 including the processing unit UA is performed with the selection input mechanism ST1. The preparation time of the sub-roller replacement time or the like is 3 minutes, and the preparation time including the joining processing time of the joining mechanism PU10 before the processing unit UC and the sub-roller changing time by the selective input mechanism ST2 is set to 3 minutes.
又,如圖7(b)般,由於使處理速度慢之處理單元UB複線化,因此處理單元UA,UC設定成以各自之性能所保障之最大速度15cm/s搬送基板P。 Further, as shown in Fig. 7(b), since the processing unit UB having a slow processing speed is doubled, the processing units UA, UC are set to transport the substrate P at a maximum speed of 15 cm/s guaranteed by the respective performances.
圖8之時序圖係估計圖7(b)之模型例之作業時間,使生產線S1,S2,S3假設地與三個處理單元UB1~UB3之各個對應,顯示各處理時間者。在處理開始時,來自供應輥RRA之基板P雖以處理單元UA處理,但 基板P在切斷機構CU10被分割成全長1200m之1/3。因此,投入處理單元UA之基板之第一個400m,如生產線S1所示,以約44.4分處理後,在切斷機構CU10經過3分之準備時間,被送至處理單元UB1。 The timing chart of Fig. 8 estimates the operation time of the model example of Fig. 7(b), and the production lines S1, S2, and S3 are assumed to correspond to each of the three processing units UB1 to UB3, and the respective processing times are displayed. At the beginning of the process, the substrate P from the supply roller RRA is processed by the processing unit UA, but The substrate P is divided into 1/3 of a total length of 1200 m in the cutting mechanism CU10. Therefore, the first 400 m of the substrate put into the processing unit UA is processed at about 44.4 minutes as indicated by the production line S1, and then sent to the processing unit UB1 after the cutting mechanism CU10 has passed the preparation time of 3 minutes.
處理單元UB1,處理400m之基板P之作業時間時間為133.3分。之後,作為既定準備時間(子輥之安裝等)經過約3分後,第一個400m之基板被投入處理單元UC,以搬送速度15cm/s進行處理。處理單元UC之400m之基板之作業時間時間為44.4分。 The processing unit UB1 processes the substrate P of 400 m for a working time of 133.3 minutes. After that, after about three minutes as a predetermined preparation time (mounting of the sub-roller, etc.), the first 400 m substrate is put into the processing unit UC, and the processing is performed at a conveying speed of 15 cm/s. The working time of the 400 m substrate of the processing unit UC was 44.4 minutes.
在此期間,如生產線S2所示,處理單元UA持續約44.4分之第2個400m之基板之處理,接著,如生產線S3所示,以搬送速度15cm/s持續約44.4分之第3個400m之基板之處理。第2個400m之基板在切斷機構CU10之準備時間3分後輸送至處理單元UB2,此處處理約133.3分。 During this period, as indicated by the production line S2, the processing unit UA continues the processing of the second 400 m substrate of about 44.4 minutes, and then, as shown by the production line S3, the third 400 m which is about 44.4 minutes at a conveying speed of 15 cm/s. The processing of the substrate. The second 400 m substrate is transported to the processing unit UB2 after the preparation time of the cutting mechanism CU10 for 3 minutes, where the processing is about 133.3 minutes.
在處理單元UC,第一個400m之基板之處理完成為開始時點起算228.1分後。然而,在此之前,第2個400m之基板之處理在處理單元UB2完成,第2個400m之基板透過接合機構PU10、選擇投入機構ST2在約3分之準備時間之後接合於第一個400m之基板之終端部分。 In the processing unit UC, the processing of the first 400 m substrate is completed after 228.1 minutes from the start point. However, before this, the processing of the second 400m substrate is completed in the processing unit UB2, and the second 400m substrate is bonded to the first 400m through the bonding mechanism PU10 and the selection input mechanism ST2 after about 3 minutes of preparation time. The terminal portion of the substrate.
之後,處理單元UC以搬送速度15cm/s持續處理接合於第一個400m之基板之第2個400m之基板。 Thereafter, the processing unit UC continuously processed the second 400 m substrate bonded to the first 400 m substrate at a transport speed of 15 cm/s.
同樣地,如生產線S3所示,以切斷機構CU10切斷之第3個(最後一個)400m之基板,在處理單元UA之處理完成後,投入處理單元UB3,在133.3分後捲繞至子輥RRB32。第3個400m之基板,在處理單元UC中第2個400m之基板之處理完成前,在處理單元UB3之處理完成。 Similarly, as shown in the production line S3, the third (last) 400 m substrate cut by the cutting mechanism CU10 is processed into the processing unit UB3, and then wound into the sub-process after 133.3 minutes. Roller RRB32. The third 400 m substrate is processed in the processing unit UB3 before the processing of the second 400 m substrate in the processing unit UC is completed.
在處理單元UC第2個400m之基板被處理之期間,第3個400m之基板透過接合機構PU10、選擇投入機構ST2在約3分之準備時間之後接合於第二個400m之基板之終端部分。之後,處理單元UC以搬送速度15cm/s持續處理接合於第二個400m之基板之第三個400m之基板。 While the second 400 m substrate of the processing unit UC is being processed, the third 400 m substrate transmission bonding mechanism PU10 and the selective input mechanism ST2 are bonded to the terminal portion of the second 400 m substrate after about three minutes of preparation time. Thereafter, the processing unit UC continuously processed the third 400 m substrate bonded to the second 400 m substrate at a transport speed of 15 cm/s.
如上述,藉由使處理步驟B之單元複線化,1200m之基板P之處理在317分(5小時17分)結束。相較於圖7(a)所示之單線化處理之模型例,為約20%之作業時間提升(生產時間之縮短)。 As described above, by repeating the unit of the processing step B, the processing of the substrate P of 1200 m is completed at 317 minutes (5 hours and 17 minutes). Compared with the model example of the single-line processing shown in Fig. 7(a), the working time is increased by about 20% (the production time is shortened).
圖7(b)所示之模型例中,雖設捲繞至作為親輥之供應輥RRA之基板P之全長為1200m,但即使為更長之長度,只要以每400m進行在切斷機構CU10之基板之分割,即可使投入生產線之基板連續地持續輸送至最後之處理步驟C。 In the model example shown in Fig. 7 (b), the total length of the substrate P wound up to the supply roller RRA as the pro-roller is 1200 m, but even if it is a longer length, the cutting mechanism CU10 is performed every 400 m. By dividing the substrate, the substrate placed on the production line can be continuously conveyed continuously to the final processing step C.
此外,圖7(b)所示之模型例中,雖以相同處理速度(5cm/s)一起運轉三台處理單元UB1~UB3,但在可調整範圍使各單元UB1~UB3之基板之搬送速度微量不同亦可。 Further, in the model example shown in FIG. 7(b), although the three processing units UB1 to UB3 are operated together at the same processing speed (5 cm/s), the transfer speed of the substrates of the respective units UB1 to UB3 is adjustable in the adjustable range. Minor is also different.
以上,參照圖式說明本發明較佳實施形態,但本發明並不限於此。上述例中所示之各構成構件之諸形狀或組合等為一例,在不脫離本發明主旨之範圍內可根據設計要求等進行各種變更。 The preferred embodiments of the present invention have been described above with reference to the drawings, but the present invention is not limited thereto. The shapes, combinations, and the like of the respective constituent members shown in the above examples are merely examples, and various modifications can be made according to design requirements and the like without departing from the gist of the invention.
例如,上述實施形態中,為設置三台處理單元UB1~UB3之構成,但只要依據處理速度之比設定,為設置二台或四台以上之構成亦可。 For example, in the above-described embodiment, the configuration of the three processing units UB1 to UB3 is provided. However, it is also possible to provide two or four or more units depending on the ratio of the processing speeds.
又,上述實施形態中,使以單線構成之生產線中之一部分步驟複線化。然而,即使是原本之生產線(生產相同產品、種類)從最初步驟至 最後步驟複線化之情形,亦可為應用上述實施形態之構成。 Further, in the above embodiment, one of the steps of the production line composed of a single wire is doubled. However, even the original production line (production of the same product, type) from the initial step to In the case where the final step is doubled, the configuration of the above embodiment may be applied.
例如,原本,圖7(a)之單線化處理之生產線並置二條之情形,在二台處理單元UA(UA1,UA2)之各個之後設置切斷機構CU10(CU101,CU102),之後之二台低作業時間之處理單元UB則追加三台作為五台單元UB1~UB5而複線化,接著,在之後設置二台接合機構PU10(PU101,PU102),在之後設置二台處理單元UC(UC1,UC2)亦可。 For example, in the case where the production line of the single-line processing of Fig. 7(a) is juxtaposed, the cutting mechanism CU10 (CU101, CU102) is set after each of the two processing units UA (UA1, UA2), and the second two are low. The processing unit UB of the work time adds three units as the five units UB1 to UB5 and doubles, and then sets two joint mechanisms PU10 (PU101, PU102), and then sets two processing units UC (UC1, UC2). Also.
上述構成中,以切斷機構CU101,CU102之任一個切斷之單位長度(例如400m)之基板輸送至五台處理單元UB1~UB5中之空的任一個單元之方式,構成選擇投入機構ST2,以接合機構PU101,PU102之各個接受五台處理單元UB1~UB5之任一個處裡過之單位長度(例如400m)之基板之方式,構成選擇投入機構ST2。 In the above configuration, the substrate having a unit length (for example, 400 m) cut by any one of the cutting mechanisms CU101 and CU102 is transported to any one of the five processing units UB1 to UB5, thereby constituting the selective input mechanism ST2. The selective input mechanism ST2 is configured such that each of the bonding mechanisms PU101 and PU102 receives a substrate having a unit length (for example, 400 m) passing through any one of the five processing units UB1 to UB5.
又,在最初之處理單元UA1,UA2之處理,為了使處理單元UA以單位長度(例如400m)處理來自供應輥RRA之基板後處理單元UA2開始來自供應輥RRA之基板之處理,意圖地賦予時間差較佳。 Further, in the processing of the first processing units UA1, UA2, in order to cause the processing unit UA to process the substrate from the supply roller RRA by the processing unit UA by a unit length (for example, 400 m), the processing from the substrate of the supply roller RRA is started, and the time difference is intentionally given. Preferably.
如此,可避免在二台處理單元UA1,UA2之各個同時地安裝親輥(RRA)之輥更換作業(產生生產之暫時中斷),且使各處理單元有效率地運轉。 In this way, it is possible to avoid the roller replacement operation (producing a temporary interruption of production) of the pro-roller (RRA) at the same time in each of the two processing units UA1, UA2, and to operate the processing units efficiently.
(第2實施形態) (Second embodiment)
以下,參照圖9至圖25說明本發明之基板處理裝置及基板處理方法之實施形態。本實施形態中,針對與上述實施形態相同之構成要素賦予相同符號以簡化或省略其說明。 Hereinafter, embodiments of the substrate processing apparatus and the substrate processing method of the present invention will be described with reference to Figs. 9 to 25 . In the present embodiment, the same components as those in the above-described embodiments are denoted by the same reference numerals, and the description thereof will be simplified or omitted.
圖9係顯示作為本實施形態之基板處理裝置之元件製造系統(可撓性顯示器生產線)SYS之一部分之構成之圖。此處,顯示下述例子,元件製造系統SYS具備安裝供應輥(第1輥)RR1之第1安裝部RS1、安裝供應輥(第2輥)RR2之第2安裝部RS2(保持部)、安裝回收輥(第3輥)RR3之第3安裝部RS3、安裝回收輥(第4輥)RR4之第4安裝部RS4,從供應輥RR1,RR2之任一方引出之可撓性基板P(片、膜等)依序經過第1接帶器部(基板接續更換機構)CSa、第1緩衝機構BF1、n台處理裝置U1,U2,U3,U4,U5,…Un、第2緩衝機構BF2、第2接帶器部(第2基板接續更換機構)CSb,捲繞至回收輥RR3,RR4之任一方。 FIG. 9 is a view showing a configuration of a part of a component manufacturing system (flexible display production line) SYS of the substrate processing apparatus of the embodiment. Here, the component manufacturing system SYS is provided with the first mounting portion RS1 on which the supply roller (first roller) RR1 is attached, the second mounting portion RS2 (holding portion) on which the supply roller (second roller) RR2 is attached, and the mounting. The third mounting portion RS3 of the collecting roller (third roller) RR3, and the fourth mounting portion RS4 to which the collecting roller (fourth roller) RR4 is attached, the flexible substrate P drawn from one of the supply rollers RR1 and RR2 (sheet, The film or the like passes through the first splicer portion (substrate connection replacement mechanism) CSa, the first buffer mechanism BF1, the n processing devices U1, U2, U3, U4, U5, ... Un, and the second buffer mechanism BF2. The 2 splicer portion (second substrate splicing replacement mechanism) CSb is wound around one of the recovery rollers RR3 and RR4.
此外,本實施形態中,將作為處理基板投入第1、第2緩衝機構BF1,BF2、處理裝置U1…Un之基板適當地稱為基板P來說明。將在投入前從供應輥RR1,RR2引出之基板適當地稱為基板P1,P2來說明。將處理裝置U1…Un處理後以回收輥RR3,RR4回收之基板適當地稱為基板P3,P4來說明。 In the present embodiment, the substrate into which the first and second buffer mechanisms BF1, BF2 and the processing devices U1 to Un are processed as the processing substrate is appropriately referred to as a substrate P. The substrate taken out from the supply rolls RR1, RR2 before being input is appropriately referred to as a substrate P1, P2. After the processing apparatus U1...Un is processed, the recovery rolls RR3 and the substrates recovered by RR4 are appropriately referred to as substrates P3 and P4.
上位控制裝置CONT(控制部、第2控制部)統籌控制構成生產線之各處理裝置U1~Un、及第1、第2接帶器部CSa,CSb、第1、第2緩衝機構BF1,BF2。又,上位控制裝置CONT控制在第1安裝部RS1安裝在供應輥RR1之馬達軸MT1之旋轉驅動、及在第2安裝部RS2安裝在供應輥RR2之馬達軸MT2之旋轉驅動。又,上位控制裝置CONT包含使基板P1(第1基板)之切斷動作與在第1緩衝機構BF1(緩衝機構)之基板P1之儲存量連動之連動控制部。又,上位控制裝置CONT包含使基板P(處理基板)之切斷 動作與在第2緩衝機構BF2之基板P之儲存量連動之連動控制部。 The upper control unit CONT (control unit, second control unit) collectively controls the processing units U1 to Un and the first and second adapter units CSa and CSb and the first and second buffer units BF1 and BF2 that constitute the production line. Further, the upper control device CONT controls the rotational driving of the motor shaft MT1 attached to the supply roller RR1 in the first mounting portion RS1 and the rotational driving of the motor shaft MT2 attached to the supply roller RR2 in the second mounting portion RS2. Further, the higher-level control device CONT includes an interlocking control unit that interlocks the cutting operation of the substrate P1 (first substrate) with the storage amount of the substrate P1 of the first buffer mechanism BF1 (buffer mechanism). Further, the upper control device CONT includes cutting off the substrate P (processing substrate) The interlocking control unit is operated in conjunction with the storage amount of the substrate P of the second buffer mechanism BF2.
又,如圖10所示,在第1安裝部RS1之附近設有檢測在供應輥RR1之基板P1之供應狀況之供應感測器S1。供應感測器S1,在檢測出基板P1之供應結束時,將結束訊號輸出至上位控制裝置CONT。同樣地,在第2安裝部RS2之附近設有檢測在供應輥RR2之基板P2之供應狀況之供應感測器S2。供應感測器S2,在檢測出基板P2之供應結束時,將結束訊號輸出至上位控制裝置CONT。 Further, as shown in FIG. 10, a supply sensor S1 that detects the supply state of the substrate P1 on the supply roller RR1 is provided in the vicinity of the first mounting portion RS1. The supply sensor S1 outputs an end signal to the upper control unit CONT when it detects that the supply of the substrate P1 is completed. Similarly, a supply sensor S2 that detects the supply state of the substrate P2 on the supply roller RR2 is provided in the vicinity of the second mounting portion RS2. The supply sensor S2 outputs an end signal to the upper control unit CONT when it detects that the supply of the substrate P2 is completed.
圖9中,正交座標系XYZ設定成基板P之表面(或背面)與XZ面垂直,與基板P之搬送方向(長帶方向)正交之寬度方向設定成Y軸方向。此外,該基板P係預先藉由既定前置處理將其表面改質活性化者,或在表面形成有精密圖案化用之微細之分隔壁構造(凹凸構造)者亦可。 In FIG. 9, the orthogonal coordinate system XYZ is set such that the surface (or the back surface) of the substrate P is perpendicular to the XZ plane, and the width direction orthogonal to the transport direction (long strip direction) of the substrate P is set to the Y-axis direction. In addition, the substrate P may be modified in advance by a predetermined pre-treatment, or a fine partition structure (concave-convex structure) for precise patterning may be formed on the surface.
圖10係顯示第1接帶器部CSa及第1緩衝機構BF1之概略構成之圖。 FIG. 10 is a view showing a schematic configuration of the first splicer portion CSa and the first damper mechanism BF1.
第1接帶器部CSa將從供應輥RR1,RR2之任一方引出並送出至第1緩衝機構BF1之基板接替成從供應輥RR1,RR2之另一方引出之基板,具備夾持驅動捲筒NR1、切斷接合單元CU1,CU2。又,第1接帶器部CSa(基板接續更換機構)具備以將從供應輥RR2(第2輥)供應之基板P2(第2基板)之前端部接合在切斷之基板P1(第1基板)之終端部位置後將基板P1(第1基板)切斷之方式控制切斷動作及接合動作之控制部。 The first splicer portion CSa takes the substrate that is taken out from one of the supply rollers RR1 and RR2 and is sent out to the first buffer mechanism BF1, and is replaced by a substrate that is taken out from the other of the supply rollers RR1 and RR2, and has a nip drive NR1. The joint units CU1 and CU2 are cut off. In addition, the first tape connector portion CSa (substrate connection replacement mechanism) is provided with a substrate P1 (first substrate) joined to the front end portion of the substrate P2 (second substrate) supplied from the supply roller RR2 (second roller) After the terminal portion is positioned, the substrate P1 (first substrate) is cut, and the control unit for the cutting operation and the joining operation is controlled.
夾持驅動捲筒NR1,在上位控制裝置CONT之控制下,保持基板P1或基板P2並輸送至第1緩衝機構BF1或停止基板P之輸送,在Z 軸方向配置在第1安裝部RS1與第2安裝部RS2之大致中間位置。 Holding the drive reel NR1, under the control of the upper control device CONT, holding the substrate P1 or the substrate P2 and transporting it to the first buffer mechanism BF1 or stopping the transport of the substrate P, in Z The axial direction is disposed at a substantially intermediate position between the first mounting portion RS1 and the second mounting portion RS2.
切斷接合單元CU1,CU2以與通過夾持驅動捲筒NR1之Z軸方向之位置之XY平面平行之假想接合面VF1為中心在Z軸方向對稱地配置。切斷接合單元CU1在面對假想接合面VF1之位置具備吸附墊1A、刀具2A、及張力捲筒3A。又,切斷接合單元CU1藉由未圖示之旋轉機構,在圖10中實線所示之切斷接合單元CU2與吸附墊1A對向之接合位置與圖10中二點鏈線所示之吸附墊1A與第1安裝部RS1對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU1,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF1(亦即切斷接合單元CU2)離開/接近之方向移動。吸附墊1A,在切斷接合單元CU1位於接合位置時,配置在較刀具2A靠基板P(基板P1)之輸送方向之下游側(+X軸側)。 The cutting joining unit CU1 and CU2 are arranged symmetrically in the Z-axis direction around the virtual joint surface VF1 which is parallel to the XY plane passing through the position of the Z-axis direction of the nip drive spool NR1. The cutting and joining unit CU1 is provided with a suction pad 1A, a cutter 2A, and a tension reel 3A at a position facing the virtual joint surface VF1. Further, the cutting and joining unit CU1 is rotated by a mechanism (not shown), and the joint position of the cutting joining unit CU2 and the suction pad 1A shown by the solid line in FIG. 10 is shown by the two-dot chain line in FIG. The suction pad 1A is rotationally moved (oscillated) between the attachment positions of the first mounting portion RS1 and the first mounting portion RS1. Further, the cutting unit CU1 is moved in a direction away from/close to the virtual joint surface VF1 (that is, the cut joint unit CU2) by a moving mechanism (not shown) at the joint position. The suction pad 1A is disposed on the downstream side (+X-axis side) of the substrate P (substrate P1) in the transport direction of the cutter 2A when the cutting and joining unit CU1 is at the joint position.
同樣地,切斷接合單元CU2在面對假想接合面VF1之位置具備吸附墊1B、刀具2B、及張力捲筒3B。又,切斷接合單元CU2藉由未圖示之旋轉機構,在圖10中實線所示之切斷接合單元CU1與吸附墊1B對向之接合位置與圖10中二點鏈線所示之吸附墊1B與第1安裝部RS2對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU2,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF1(亦即切斷接合單元CU1)離開/接近之方向移動。吸附墊1B,在切斷接合單元CU2位於接合位置時,配置在較刀具2B靠基板P(基板P2)之輸送方向之下游側(+X軸側)。 Similarly, the cutting and joining unit CU2 is provided with the suction pad 1B, the cutter 2B, and the tension reel 3B at a position facing the virtual joint surface VF1. Further, the cutting and joining unit CU2 is rotated by a rotation mechanism (not shown), and the joint position of the cutting joining unit CU1 and the suction pad 1B shown by the solid line in FIG. 10 is as shown by the two-dot chain line in FIG. The adsorption pad 1B is rotationally moved (oscillated) between the positions where the first mounting portion RS2 is opposed to the attachment position. Further, the cutting unit CU2 is moved in a direction away from/close to the virtual joint surface VF1 (that is, the cut joint unit CU1) by a moving mechanism (not shown) at the joint position. When the cutting and joining unit CU2 is at the joining position, the suction pad 1B is disposed on the downstream side (+X-axis side) of the substrate P (substrate P2) in the transport direction.
此等切斷接合單元CU1,CU2之移動係藉由上位控制裝置CONT控制。 The movement of the cut-off joining units CU1, CU2 is controlled by the upper control unit CONT.
第1緩衝機構BF1配置在處理裝置(處理機構)U1與第1接帶器部CSa之間,將從第1接帶器部CSa輸送之基板P在既定最長儲存範圍內暫時儲存後往處理裝置U1送出,具備張力捲筒機構DR1與夾持驅動捲筒NR2。 The first buffer mechanism BF1 is disposed between the processing device (processing mechanism) U1 and the first splicer portion CSa, and the substrate P transported from the first splicer portion CSa is temporarily stored in the predetermined longest storage range, and then processed to the processing device. U1 is sent out, and has a tension reel mechanism DR1 and a grip drive reel NR2.
夾持驅動捲筒NR2保持以第1緩衝機構BF1儲存之基板P並輸送至處理裝置U1,在較張力捲筒機構DR1靠基板P之輸送方向下游側與夾持驅動捲筒NR1配置在大致相同之Z軸位置。 The chucking drive reel NR2 holds the substrate P stored in the first buffer mechanism BF1 and transports it to the processing apparatus U1, and is disposed substantially the same as the nip drive reel NR1 on the downstream side in the transport direction of the substrate P by the tension reel mechanism DR1. Z-axis position.
張力捲筒機構DR1,升降範圍相對地位於上方之複數個上段捲筒RJ1與升降範圍相對地位於下方之下段捲筒RK1交互排列在X方向,且各捲筒RJ1,RK1分別可獨立地往Z軸方向移動。上段捲筒RJ1之上死點位置JU1及下死點位置JD1設定在下段捲筒RK1之上死點位置JU2及下死點位置JD2上方之位置。此等張力捲筒機構DR1之動作亦藉由上位控制裝置CONT控制。 The tension reel mechanism DR1, the plurality of upper reels RJ1 with the lifting range relatively located above and the lifting range relatively lower than the lower portion of the reel RK1 are alternately arranged in the X direction, and each of the reels RJ1, RK1 can independently go to the Z Move in the direction of the axis. The upper dead center position JU1 and the lower dead center position JD1 of the upper reel RJ1 are set at positions above the upper dead center position JU2 and the lower dead center position JD2 of the lower reel RK1. The action of the tension reel mechanisms DR1 is also controlled by the upper control unit CONT.
圖11係顯示第2接帶器部CSb及第2緩衝機構BF2之概略構成之圖。 FIG. 11 is a view showing a schematic configuration of the second belt unit CSb and the second buffer unit BF2.
第2緩衝機構BF2配置在處理裝置(處理機構)Un與第2接帶器部CSb之間,將從處理裝置Un輸送之基板P在既定最長儲存範圍內暫時儲存後往第2接帶器部CSb送出,具備夾持驅動捲筒NR3與張力捲筒機構DR2。 The second buffer mechanism BF2 is disposed between the processing device (processing means) Un and the second splicer portion CSb, and the substrate P transported from the processing device Un is temporarily stored in the predetermined longest storage range and then moved to the second splicer portion. The CSb is delivered with a clamping drive reel NR3 and a tension reel mechanism DR2.
張力捲筒機構DR2,升降範圍相對地位於上方之複數個上段捲筒RJ2與升降範圍相對地位於下方之下段捲筒RK2交互排列在X軸方向,且各捲筒RJ2,RK2分別可獨立地往Z軸方向移動。上段捲筒RJ2之上 死點位置JU3及下死點位置JD3設定在下段捲筒RK2之上死點位置JU4及下死點位置JD4上方之位置。此等張力捲筒機構DR2之動作亦藉由上位控制裝置CONT控制。 The tension reel mechanism DR2, the plurality of upper reels RJ2 with the lifting range relatively located above and the lifting range are located opposite to the lower portion of the reel RK2 are arranged in the X-axis direction, and the reels RJ2, RK2 can be independently Move in the Z axis direction. Above the reel RJ2 The dead point position JU3 and the bottom dead center position JD3 are set at positions above the dead center position JU4 and the bottom dead center position JD4 of the lower stage winding RK2. The action of the tension reel mechanisms DR2 is also controlled by the upper control unit CONT.
第2接帶器部CSb將從第2緩衝機構BF2輸送並以回收輥RR3,RR4之任一方回收之基板P接替成回收至回收輥RR3,RR4之另一方,具備夾持驅動捲筒NR4、切斷接合單元CU3,CU4。 The second splicer portion CSb is transported from the second buffer mechanism BF2 and the substrate P recovered by one of the recovery rollers RR3 and RR4 is replaced by the other of the recovery rollers RR3 and RR4, and the nip drive roller NR4 is provided. The joining units CU3, CU4 are cut.
夾持驅動捲筒NR4,在上位控制裝置CONT之控制下,使從第2緩衝機構BF2輸送之基板P朝向切斷接合單元CU3,CU4輸送或停止基板P之輸送,Z軸方向之位置配置在第3安裝部RS3與第4安裝部RS4之大致中間位置且與XY平面平行之假想接合面VF2之位置。 Under the control of the upper control unit CONT, the substrate P transported from the second buffer mechanism BF2 is transported to or from the cut-and-join unit CU3, CU4, and the substrate P is transported, and the position in the Z-axis direction is placed. The position of the virtual joint surface VF2 which is substantially at the intermediate position between the third mounting portion RS3 and the fourth mounting portion RS4 and parallel to the XY plane.
切斷接合單元CU3,CU4以假想接合面VF2為中心在Z軸方向對稱地配置。切斷接合單元CU3在面對假想接合面VF2之位置具備吸附墊1C、刀具2C、及張力捲筒3C。又,切斷接合單元CU3藉由未圖示之旋轉機構,在圖11中實線所示之切斷接合單元CU4與吸附墊1C對向之接合位置與圖11中二點鏈線所示之吸附墊1C與第3安裝部RS3對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU3,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF2(亦即切斷接合單元CU4)離開/接近之方向移動。 The joining unit CU3 is cut, and CU4 is symmetrically arranged in the Z-axis direction around the virtual joint surface VF2. The cutting and joining unit CU3 is provided with a suction pad 1C, a cutter 2C, and a tension reel 3C at a position facing the virtual joint surface VF2. Moreover, the cutting joining unit CU3 is shown by the rotation mechanism (not shown), and the joining position of the cutting joining unit CU4 and the suction pad 1C shown by the solid line in FIG. 11 is the same as the two-dot chain line in FIG. The suction pad 1C is rotationally moved (oscillated) between the positions where the third mounting portion RS3 is opposed to the attachment position. Further, the cutting unit CU3 is moved in a direction away from/close to the virtual joint surface VF2 (that is, the cut joint unit CU4) by a moving mechanism (not shown) at the joint position.
吸附墊1C,在切斷接合單元CU3位於接合位置時,配置在較刀具2C靠基板P之輸送方向之上游側(-X軸側)。 The suction pad 1C is disposed on the upstream side (the −X-axis side) of the substrate 2 in the transport direction of the substrate P when the cutting and joining unit CU3 is at the joint position.
同樣地,切斷接合單元CU4在面對假想接合面VF2之位置 具備吸附墊1D、刀具2D、及張力捲筒3D。又,切斷接合單元CU4藉由未圖示之旋轉機構,在圖11中實線所示之切斷接合單元CU3與吸附墊1D對向之接合位置與圖11中二點鏈線所示之吸附墊1D與第4安裝部RS4對向之貼設位置之間旋轉移動(擺動)。再者,切斷接合單元CU4,在接合位置,藉由未圖示之移動機構,往相對於假想接合面VF2(亦即切斷接合單元CU3)離開/接近之方向移動。吸附墊1D,在切斷接合單元CU4位於接合位置時,配置在較刀具2D靠基板P之輸送方向之上游側(-X軸側)。 Similarly, the position of the splicing unit CU4 facing the imaginary joint surface VF2 is cut. The adsorption pad 1D, the cutter 2D, and the tension reel 3D are provided. Moreover, the cutting joining unit CU4 is shown by the rotation mechanism (not shown), and the joining position of the cutting joining unit CU3 and the adsorption pad 1D shown by the solid line in FIG. 11 is the same as the two-dot chain line in FIG. The adsorption pad 1D is rotationally moved (oscillated) between the attachment positions of the fourth mounting portion RS4 and the attachment position. Further, the cutting unit CU4 is moved in a direction away from/close to the virtual joint surface VF2 (that is, the cut joint unit CU3) by a moving mechanism (not shown) at the joint position. The suction pad 1D is disposed on the upstream side (the −X-axis side) of the substrate 2D in the transport direction of the substrate P when the cutting and joining unit CU4 is at the joint position.
此等切斷接合單元CU3,CU4之移動係藉由上位控制裝置CONT控制。 The movement of the cut-off joining units CU3, CU4 is controlled by the upper control unit CONT.
如圖11所示,在第3安裝部RS3回收捲筒RR3安裝在馬達軸MT3。在第4安裝部RS4回收捲筒RR4安裝在馬達軸MT4。馬達軸MT3之旋轉驅動及馬達軸MT4之旋轉驅動係藉由上位控制裝置CONT控制。 As shown in FIG. 11, the recovery drum RR3 is attached to the motor shaft MT3 in the third attachment portion RS3. The retracting spool RR4 is attached to the motor shaft MT4 in the fourth mounting portion RS4. The rotary drive of the motor shaft MT3 and the rotational drive of the motor shaft MT4 are controlled by the upper control unit CONT.
又,如圖11所示,在第3安裝部RS3之附近設有檢測在回收捲筒RR3之基板P3之捲繞狀況之捲繞感測器S3。捲繞感測器S3,在檢測出基板P3之捲繞結束時,將結束訊號輸出至上位控制裝置CONT。同樣地,在第4安裝部RS4之附近設有檢測在回收捲筒RR4之基板P4之捲繞狀況之捲繞感測器S4。捲繞感測器S4,在檢測出基板P4之捲繞結束時,將結束訊號輸出至上位控制裝置CONT。 Moreover, as shown in FIG. 11, the winding sensor S3 which detects the winding state of the board|substrate P3 of the collection roll RR3 is provided in the vicinity of the 3rd mounting part RS3. The winding sensor S3 outputs an end signal to the upper control unit CONT when it is detected that the winding of the substrate P3 is completed. Similarly, a winding sensor S4 that detects the winding state of the substrate P4 of the recovery reel RR4 is provided in the vicinity of the fourth mounting portion RS4. The winding sensor S4 outputs an end signal to the upper control unit CONT when it is detected that the winding of the substrate P4 is completed.
回收捲筒RR3,RR4具備前端部連接在輥芯且終端部接合有基板P3或基板P4之引入用引入基板(第3基板)PK(圖11中,僅圖示回收捲筒RR4之基板PK)。作為基板PK,與進行處理裝置U1~Un之處理之基板P相同材料亦可,與基板P大致相同厚度且材質不同亦可。 The recovery reel RR3 and the RR4 include a lead-in introduction substrate (third substrate) PK in which the front end portion is connected to the roll core and the end portion is joined to the substrate P3 or the substrate P4 (in FIG. 11, only the substrate PK of the recovery reel RR4 is illustrated) . The substrate PK may be made of the same material as the substrate P subjected to the processing of the processing apparatuses U1 to Un, and may have substantially the same thickness and different materials as the substrate P.
本實施形態之處理裝置U5為將從處理裝置U4搬送而來之基板P加熱並將因濕式製程濕的基板P之水分含有量調整成既定值或施加半導體材料之結晶化或包含金屬奈米粒子之油墨之溶劑除去等用之熱回火(200℃以下)之加熱乾燥裝置,但省略詳細說明。之後,經過幾個處理裝置且通過一連串製程之最後之處理裝置Un之基板P,在第2緩衝機構BF2暫時地儲存,以第2接帶器部CSb適當地進行接替,捲繞至回收輥RR3或回收輥RR4。 The processing apparatus U5 of the present embodiment heats the substrate P transferred from the processing apparatus U4, adjusts the moisture content of the substrate P wetted by the wet process to a predetermined value, or crystallizes the applied semiconductor material or contains metal nanoparticles. A heat drying device for heat tempering (200 ° C or lower) for solvent removal of particles of ink, but detailed description thereof will be omitted. Thereafter, the substrate P that has passed through several processing apparatuses and passed through the processing apparatus Un of the last series of processes is temporarily stored in the second buffer mechanism BF2, and is appropriately replaced by the second adapter unit CSb, and wound up to the recovery roller RR3. Or recycle roller RR4.
接著,參照圖12至圖19說明上述構成之元件製造系統SYS之基板P之處理中之第1接帶器部CSa及第1緩衝機構BF1之動作。此外,構成元件製造系統SYS之各種處理裝置、構成機器等之動作雖藉由上位控制裝置CONT控制,但在以下說明中,省略關於上位控制裝置CONT控制之記載。 Next, the operation of the first splicer portion CSa and the first damper mechanism BF1 in the process of the substrate P of the component manufacturing system SYS having the above configuration will be described with reference to Figs. 12 to 19 . In addition, the operations of various processing devices and components constituting the component manufacturing system SYS are controlled by the higher-level control device CONT, but in the following description, the description of the control of the higher-level control device CONT is omitted.
圖12係從供應輥RR1引出之基板P1透過切斷接合單元CU1之捲筒3A及夾持驅動捲筒NR1作為第1基板輸送至第1緩衝機構BF1且在第1緩衝機構BF1暫時地儲存之圖。如圖12所示,在第1緩衝機構BF1,上段捲筒RJ1位於上死點位置JU1,下段捲筒RK1位於下死點位置JD2,藉此基板P在第1緩衝機構BF1儲存接近最長之長度。 12, the substrate P1 drawn from the supply roller RR1 passes through the reel 3A of the cutting and joining unit CU1 and the nip drive reel NR1 as the first substrate, and is transported to the first buffer mechanism BF1, and temporarily stored in the first buffer mechanism BF1. Figure. As shown in FIG. 12, in the first buffer mechanism BF1, the upper reel RJ1 is located at the top dead center position JU1, and the lower reel RK1 is located at the bottom dead center position JD2, whereby the substrate P is stored in the first buffer mechanism BF1 to be near the longest length. .
在第2安裝部RS2,捲繞有在供應輥RR1之基板P1用盡之情形接替之基板P2之供應輥RR2安裝在馬達軸MT2後,使切斷接合單元CU2旋動以使吸附墊1B移動至貼設位置。使基板P2之前端部吸附(連結或連接)固定於位於貼設位置之吸附墊1B,之後,在與吸附側相反側之面貼設 兩面帶T。 In the second mounting portion RS2, after the supply roller RR2 of the substrate P2 that has been wound up after the substrate P1 of the supply roller RR1 is used up is mounted on the motor shaft MT2, the cutting engagement unit CU2 is rotated to move the adsorption pad 1B. To the placement location. The front end portion of the substrate P2 is adsorbed (connected or connected) to the adsorption pad 1B at the placement position, and then attached to the surface opposite to the adsorption side. T with both sides.
上述基板P2吸附於吸附墊1B及兩面帶之貼設係藉由操作員進行或使用機器手等進行。 The attachment of the substrate P2 to the adsorption pad 1B and the double-sided tape is performed by an operator or by using a robot or the like.
貼設有兩面帶T之基板P2對吸附墊1B之吸附固定完成後,如圖13所示,使切斷接合單元CU2旋動以使基板P2移動至接合位置,且藉由馬達軸MT2之旋轉驅動使供應輥RR2往與基板P2之供應方向相反方向(圖13中逆時針方向)旋轉,藉此對基板P2賦予既定張力。 After the adsorption and fixation of the adsorption pad 1B with the substrate P2 on both sides of the T is attached, as shown in FIG. 13, the cutting and joining unit CU2 is rotated to move the substrate P2 to the engaged position, and the rotation is performed by the motor shaft MT2. The supply roller RR2 is rotated in a direction opposite to the supply direction of the substrate P2 (counterclockwise in FIG. 13), thereby imparting a predetermined tension to the substrate P2.
另一方面,供應感測器S1檢測來自供應輥RR1之基板P1之供應結束後,停止夾持驅動捲筒NR1之驅動,且使馬達軸MT1往與基板P1之輸送方向相反方向旋轉驅動,藉此對夾持驅動捲筒NR1與供應輥RR1之間之基板P1賦予弱張力。 On the other hand, after the supply sensor S1 detects the supply of the substrate P1 from the supply roller RR1, the driving of the chucking drive spool NR1 is stopped, and the motor shaft MT1 is rotationally driven in the opposite direction to the conveying direction of the substrate P1. This imparts a weak tension to the substrate P1 between the chuck driving reel NR1 and the supply roller RR1.
夾持驅動捲筒NR1之驅動停止後夾持驅動捲筒NR2亦持續驅動。因此,張力捲筒機構DR1作動,與夾持驅動捲筒NR2之驅動對應,適當地進行上段捲筒RJ1之下降及下段捲筒RK1之上升。藉此,儲存在第1緩衝機構BF1之基板P藉由夾持驅動捲筒NR2往處理裝置U1以一定速度持續輸送。 After the driving of the grip driving reel NR1 is stopped, the grip driving reel NR2 is also continuously driven. Therefore, the tension reel mechanism DR1 is actuated to appropriately lower the upper reel RJ1 and the lower reel RK1 in accordance with the driving of the nip drive reel NR2. Thereby, the substrate P stored in the first buffer mechanism BF1 is continuously transported to the processing device U1 at a constant speed by the chucking drive reel NR2.
接著,如圖14所示,使切斷接合單元CU1,CU2往彼此接近方向移動,在介有兩面帶T之狀態下將基板P1,P2一定時間壓接在吸附墊1A,1B間。藉此,基板P2在後續步驟被切斷,在基板P1之終端部之位置透過兩面帶T與基板P1貼合而接合。 Next, as shown in FIG. 14, the cutting joining units CU1 and CU2 are moved in the approaching direction, and the substrates P1 and P2 are pressure-bonded between the adsorption pads 1A and 1B for a predetermined period of time with the two-side tape T interposed therebetween. Thereby, the substrate P2 is cut in the subsequent step, and is bonded to the substrate P1 through the both surface tapes T at the position of the end portion of the substrate P1.
此外,在進行基板P1,P2之接合處理之期間,夾持驅動捲筒 NR2及張力捲筒機構DR1亦持續驅動,儲存在第1緩衝機構BF1之基板P藉由夾持驅動捲筒NR2往處理裝置U1以一定速度持續輸送。 Further, during the bonding process of the substrates P1, P2, the driving drive reel is held. The NR 2 and the tension reel mechanism DR1 are also continuously driven, and the substrate P stored in the first buffer mechanism BF1 is continuously conveyed to the processing device U1 at a constant speed by the nip drive reel NR2.
基板P1與基板P2接合後,使在切斷接合單元CU2之吸附墊1B開放於大氣,之後,如圖15所示,使切斷接合單元CU2往離開切斷接合單元CU1之方向(+Z軸方向)移動。藉此,從供應輥RR2引出之基板P2之前端部,在藉由兩面帶T接合(連結或連接)於基板P1之狀態下,吸附保持於切斷接合單元CU1之吸附墊1A。 After the substrate P1 is bonded to the substrate P2, the adsorption pad 1B of the cutting and joining unit CU2 is opened to the atmosphere, and then, as shown in FIG. 15, the cutting and joining unit CU2 is moved away from the cutting and joining unit CU1 (+Z axis). Direction) move. Thereby, the front end portion of the substrate P2 drawn from the supply roller RR2 is adsorbed and held by the adsorption pad 1A of the cutting and joining unit CU1 while being joined (connected or connected) to the substrate P1 by the double-sided tape T.
之後,在切斷接合單元CU1與供應輥RR1之間對基板P1賦予張力之狀態下,藉由在切斷接合單元CU1之刀具2A將對向之基板P1切斷。作為刀具2A,可採用例如使刃尖往基板P1之寬度方向(Y軸方向)滑動以切斷基板P1之構成。 Thereafter, in a state where tension is applied to the substrate P1 between the cutting and joining unit CU1 and the supply roller RR1, the opposing substrate P1 is cut by the cutter 2A that cuts the joining unit CU1. As the cutter 2A, for example, a configuration in which the blade edge is slid in the width direction (Y-axis direction) of the substrate P1 to cut the substrate P1 can be employed.
在進行基板P1之切斷處理之期間,夾持驅動捲筒NR2及張力捲筒機構DR1亦持續驅動,儲存在第1緩衝機構BF1之基板P藉由夾持驅動捲筒NR2往處理裝置U1以一定速度持續輸送。 While the cutting process of the substrate P1 is being performed, the pinch drive reel NR2 and the tension reel mechanism DR1 are continuously driven, and the substrate P stored in the first buffer mechanism BF1 is held by the chuck NR2 to the processing device U1. Continuous delivery at a certain speed.
基板P1被切斷後,使在切斷接合單元CU1之吸附墊1A開放於大氣,之後,如圖16所示,使切斷接合單元CU1往離開切斷接合單元CU2(假想接合面VF1)之方向(-Z軸方向)移動。藉此,從供應輥RR1引出之基板P1,藉由與供應輥RR1之輸送方向相反方向之旋轉,捲繞至此供應輥RR1。 After the substrate P1 is cut, the adsorption pad 1A of the cutting and joining unit CU1 is opened to the atmosphere, and then, as shown in FIG. 16, the cutting and joining unit CU1 is moved away from the cutting and joining unit CU2 (imaginary joint surface VF1). (-Z axis direction) moves. Thereby, the substrate P1 drawn from the supply roller RR1 is wound around the supply roller RR1 by rotation in a direction opposite to the conveying direction of the supply roller RR1.
又,關於供應輥RR2,藉由與供應輥RR2之輸送方向相反方向之旋轉力矩,基板P2在旋轉輥RR2與夾持驅動捲筒NR1(及捲筒3B) 之間被賦予張力。藉此,連接於儲存在第1緩衝機構BF1之基板P之基板切換至作為從供應輥RR2引出之第2基板之基板P2。作為第2基板之基板P2,具有與基板P1(第1基板)同等之規格亦可。 Further, regarding the supply roller RR2, the substrate P2 is on the rotating roller RR2 and the nip driving reel NR1 (and the reel 3B) by the rotational moment in the opposite direction to the conveying direction of the supply roller RR2. Tension is given between. Thereby, the substrate connected to the substrate P stored in the first buffer mechanism BF1 is switched to the substrate P2 which is the second substrate taken out from the supply roller RR2. The substrate P2 as the second substrate may have the same specifications as the substrate P1 (first substrate).
之後,夾持驅動捲筒NR1以較夾持驅動捲筒NR2稍快之速度旋轉,在張力捲筒機構DR1,如圖17所示,與夾持驅動捲筒NR1之驅動對應,適當地進行上段捲筒RJ1之上升及下段捲筒RK1之下降。又,藉由馬達軸MT2往輸送方向旋轉驅動,從供應輥RR2引出之基板P2被送入,在第1緩衝機構BF1之基板P之儲存長度增加。 Thereafter, the grip driving reel NR1 is rotated at a slightly faster speed than the grip driving reel NR2, and the tension reel mechanism DR1, as shown in Fig. 17, corresponds to the driving of the grip driving reel NR1, and the upper portion is appropriately performed. The rise of the reel RJ1 and the lower roll RK1. Further, the motor shaft MT2 is rotationally driven in the transport direction, and the substrate P2 drawn from the supply roller RR2 is fed, and the storage length of the substrate P of the first buffer mechanism BF1 is increased.
接著,在第1緩衝機構BF1之基板P之儲存長度成為大致最大後,夾持驅動捲筒NR1以與夾持驅動捲筒NR2相同速度旋轉,藉此在第1緩衝機構BF1之基板P之儲存長度均衡。又,基板P1大致用盡之供應輥RR1,從第1安裝部RS1移除(可拆裝),如圖18所示,安裝捲繞有基板P5之另一供應輥RR5。 Then, after the storage length of the substrate P of the first buffer mechanism BF1 is substantially maximized, the drive reel NR1 is held at the same speed as the nip drive reel NR2, thereby storing on the substrate P of the first buffer mechanism BF1. The length is balanced. Further, the supply roller RR1, which is substantially used up by the substrate P1, is removed (removable) from the first mounting portion RS1, and as shown in Fig. 18, the other supply roller RR5 around which the substrate P5 is wound is mounted.
安裝供應輥RR5後,根據供應感測器S2之檢測結果,在供應輥RR2之基板P2用盡前,如圖18所示,使切斷接合單元CU1旋動以使吸附墊1A移動至貼設位置。使基板P5之前端部吸附固定(連結或連接)於位於貼設位置之吸附墊1A,之後,在與吸附側相反側之面貼設兩面帶T。 After the supply roller RR5 is mounted, according to the detection result of the supply sensor S2, before the substrate P2 of the supply roller RR2 is used up, as shown in FIG. 18, the cutting engagement unit CU1 is rotated to move the adsorption pad 1A to the attachment. position. The front end portion of the substrate P5 is suction-fixed (connected or connected) to the adsorption pad 1A at the placement position, and then the double-sided tape T is attached to the surface opposite to the adsorption side.
之後,藉由馬達軸MT1之旋轉驅動使供應輥RR5往與基板P5之供應方向相反方向(圖18中逆時針方向)旋轉,藉此對基板P5賦予既定張力並同時使切斷接合單元CU1旋動,如圖19所示,移動至接合位置。 Thereafter, the supply roller RR5 is rotated in the opposite direction to the supply direction of the substrate P5 (counterclockwise in FIG. 18) by the rotational driving of the motor shaft MT1, thereby imparting a predetermined tension to the substrate P5 while simultaneously rotating the cut-and-join unit CU1. Move, as shown in Figure 19, to the engaged position.
接著,供應感測器S2檢測在供應輥RR2之基板P2之供應 結束後,停止夾持驅動捲筒NR1之驅動,且與上述步驟同樣地,使切斷接合單元CU1,CU2往彼此接近方向移動,在介在有兩面帶T之狀態下,在吸附墊1A,1B間將基板P2,P5壓接一定時間,再者,藉由在切斷接合單元CU2之刀具2B將基板P2切斷。藉此,連接於儲存在第1緩衝機構BF1之基板P之基板切換至從供應輥RR5引出之基板P5。 Next, the supply sensor S2 detects the supply of the substrate P2 at the supply roller RR2. After the completion, the driving of the grip driving reel NR1 is stopped, and the cutting and joining units CU1 and CU2 are moved in the approaching direction in the same manner as the above-described steps, and in the state in which the double-sided tape T is interposed, in the adsorption pad 1A, 1B. The substrates P2 and P5 are pressure-bonded for a predetermined period of time, and the substrate P2 is cut by the cutter 2B that cuts the joint unit CU2. Thereby, the substrate connected to the substrate P stored in the first buffer mechanism BF1 is switched to the substrate P5 drawn from the supply roller RR5.
如上述,依序切換之基板P,在施加處理裝置U1之感光性機能液之塗布處理、處理裝置U2之加熱處理、處理裝置U3之圖案曝光處理、處理裝置U4之濕式處理、及處理裝置U5之加熱乾燥處理後,依序送至第2緩衝機構BF2、第2接帶器部CSb,回收至回收輥RR3或回收輥RR4。 As described above, the substrate P sequentially switched, the coating process of the photosensitive functional liquid applied to the processing apparatus U1, the heat treatment of the processing apparatus U2, the pattern exposure processing of the processing apparatus U3, the wet processing of the processing apparatus U4, and the processing apparatus After the heat drying treatment of U5, it is sequentially sent to the second buffer mechanism BF2 and the second belt receiver portion CSb, and is collected in the recovery roller RR3 or the recovery roller RR4.
接著,參照圖20至圖25說明上述構成之元件製造系統SYS之基板P之處理中之回收輥側之第2接帶器部CSb及第2緩衝機構BF2之動作。 Next, the operation of the second accommodator portion CSb and the second damper mechanism BF2 on the recovery roller side in the process of the substrate P of the component manufacturing system SYS having the above configuration will be described with reference to Figs. 20 to 25 .
圖20係處理基板即基板P透過夾持驅動捲筒NR3輸送至第2緩衝機構BF2並儲存,從第2緩衝機構BF2透過夾持驅動捲筒NR4輸送(排出)之基板P透過切斷接合單元CU3之捲筒3C回收至安裝在第3安裝部RS3之回收輥RR3之圖。又,如圖20所示,在第2緩衝機構BF2,上段捲筒RJ2位於下死點位置JD3,下段捲筒RK2位於上死點位置JU4,藉此基板P以接近最短之長度儲存在第2緩衝機構BF2。 20, the substrate P, which is a processing substrate, is transported to the second buffer mechanism BF2 through the pinch drive reel NR3, and is stored, and the substrate P that is transported (discharged) from the second buffer mechanism BF2 through the pinch drive reel NR4 passes through the cutting and joining unit. The reel 3C of the CU3 is recovered to the recovery roller RR3 attached to the third mounting portion RS3. Further, as shown in Fig. 20, in the second buffer mechanism BF2, the upper reel RJ2 is located at the bottom dead center position JD3, and the lower reel RK2 is located at the top dead center position JU4, whereby the substrate P is stored in the second shortest length. Buffer mechanism BF2.
在第4安裝部RS4,在回收輥RR3之捲繞回收完成後,回收基板P之回收輥RR4安裝在馬達軸MT4,之後,使切斷接合單元CU4旋動以使吸附墊1D移動至貼設位置。使前端部連接於回收輥RR4之引入基板 PK(以下,僅稱為基板PK)之終端部吸附固定(連結或連接)於位於貼設位置之吸附墊1D,之後,在與吸附側相反側之面貼設兩面帶T。在基板PK貼設兩面帶T之後,使切斷接合單元CU4旋動以移動至接合位置,且藉由馬達軸MT4之旋轉驅動,使回收輥RR4往基板PK(基板P)之回收方向(圖20中順時針方向)旋轉,藉此對基板PK賦予既定張力。 After the winding of the recovery roller RR3 is completed in the fourth mounting portion RS4, the recovery roller RR4 for collecting the substrate P is attached to the motor shaft MT4, and then the cutting engagement unit CU4 is rotated to move the adsorption pad 1D to the attachment. position. Connecting the front end portion to the introduction substrate of the recovery roller RR4 The end portion of PK (hereinafter, simply referred to as substrate PK) is suction-fixed (connected or connected) to the adsorption pad 1D at the placement position, and then the double-sided tape T is attached to the surface opposite to the adsorption side. After the double-sided tape T is attached to the substrate PK, the cut-and-join unit CU4 is rotated to move to the joint position, and the recovery roller RR4 is returned to the substrate PK (substrate P) by the rotational driving of the motor shaft MT4 (Fig. Rotating clockwise in 20), thereby imparting a predetermined tension to the substrate PK.
接著,捲繞感測器S3檢測回收輥RR3之基板P之回收結束後,停止夾持驅動捲筒NR4之驅動,且使張力捲筒機構DR2作動,適當地進行上段捲筒RJ2之上升及下段捲筒RK2之下降。藉此,從處理裝置U5藉由夾持驅動捲筒NR3輸送之基板P,在第2緩衝機構BF2之儲存長度係以一定量(與在生產線之基板P之搬送速度對應之輸送量)增加並同時儲存。 Next, after the winding sensor S3 detects the recovery of the substrate P of the recovery roller RR3, the driving of the nip drive roller NR4 is stopped, and the tension reel mechanism DR2 is actuated to appropriately raise the upper and lower reels RJ2. The drop of the reel RK2. Thereby, the storage length of the second buffer mechanism BF2 is increased by a certain amount (the amount of conveyance corresponding to the conveyance speed of the substrate P at the production line) by the substrate P transported by the processing unit U5 by the chucking roller NR3. Store at the same time.
另一方面,回收輥RR3之基板P之回收結束後,如圖21所示,使切斷接合單元CU3,CU4往彼此接近方向移動,在介在有兩面帶T之狀態下,在吸附墊1C,1D間將基板P,PK壓接一定時間。藉此,基板PK之終端部,在成為後續步驟中基板P被切斷時之前端部之位置,透過兩面帶T與基板P貼合並接合(連結或連接)。 On the other hand, after the recovery of the substrate P of the recovery roll RR3 is completed, as shown in FIG. 21, the cutting and joining units CU3 and CU4 are moved in the approaching direction, and in the state in which the double-sided tape T is present, in the adsorption pad 1C, The substrates P and PK are crimped for a certain time between 1D. Thereby, the end portion of the substrate PK is bonded (joined or connected) to the substrate P through the double-sided tape T at the position of the end portion before the substrate P is cut in the subsequent step.
基板P與基板PK接合後,使在切斷接合單元CU4之吸附墊1D開放於大氣,之後,如圖22所示,使切斷接合單元CU4往離開切斷接合單元CU3之方向(+Z軸方向)移動。藉此,基板PK之前端部,在藉由兩面帶T接合於基板P之狀態下,吸附保持於切斷接合單元CU3之吸附墊1C。 After the substrate P is bonded to the substrate PK, the adsorption pad 1D of the cutting and joining unit CU4 is opened to the atmosphere, and then, as shown in FIG. 22, the cutting and joining unit CU4 is moved away from the cutting and joining unit CU3 (+Z axis). Direction) move. Thereby, the front end portion of the substrate PK is adsorbed and held by the adsorption pad 1C of the cutting and joining unit CU3 while being bonded to the substrate P by the double-sided tape T.
之後,在切斷接合單元CU3與回收輥RR3之間對基板P賦予張力之狀態下,藉由在切斷接合單元CU3之刀具2C,將對向之基板P切 斷。基板P被切斷後,使在切斷接合單元CU3之吸附墊1C開放於大氣,之後,如圖23所示,使切斷接合單元CU3往離開切斷接合單元CU4之方向(-Z軸方向)移動。藉此,從第2緩衝機構BF2輸送之基板P(亦即,在處理裝置U1~Un進行處理之基板P)之回收對象切換至回收輥RR4。 Thereafter, in a state where tension is applied to the substrate P between the cutting and joining unit CU3 and the recovery roller RR3, the opposing substrate P is cut by cutting the cutter 2C of the joining unit CU3. Broken. After the substrate P is cut, the adsorption pad 1C of the cutting and joining unit CU3 is opened to the atmosphere, and then, as shown in FIG. 23, the cutting and joining unit CU3 is moved away from the cutting and joining unit CU4 (-Z-axis direction). mobile. Thereby, the object to be recovered of the substrate P conveyed from the second buffer mechanism BF2 (that is, the substrate P processed by the processing apparatuses U1 to Un) is switched to the recovery roller RR4.
在上述第2接帶器部CSb之接合處理及切斷處理進行之期間,亦適當地進行第2緩衝機構BF2內之上段捲筒RJ2之上升及下段捲筒RK2之下降,從處理裝置U5藉由夾持驅動捲筒NR3輸送之基板P,在第2緩衝機構BF2之儲存長度係以一定量增加並同時儲存。 During the joining process and the cutting process of the second nipper portion CSb, the rise of the upper reel RJ2 and the lower reel RK2 in the second damper mechanism BF2 are appropriately performed, and the processing device U5 is borrowed from the processing device U5. The substrate P conveyed by the chuck driving reel NR3 is increased in a certain amount by the storage length of the second buffer mechanism BF2 and simultaneously stored.
接著,往回收輥RR4之基板P之回收對象切換完成後,夾持驅動捲筒NR4以較夾持驅動捲筒NR3稍快之速度旋轉,在張力捲筒機構DR2,與夾持驅動捲筒NR4之驅動對應,適當地進行上段捲筒RJ2之下降及下段捲筒RK2之上升,在第2接帶器部CSb之接合處理及切斷處理之期間,使儲存在第2緩衝機構BF2之基板P之長度減少,成為初始狀態即大致最小之儲存長度(參照圖24)。儲存在第2緩衝機構BF2之基板P之長度成為大致最小後,使夾持驅動捲筒NR4以與夾持驅動捲筒NR3相同之速度旋轉。 Then, after the switching of the object to be recovered by the substrate P of the recovery roller RR4 is completed, the chucking drive reel NR4 is rotated at a slightly faster speed than the gripping drive reel NR3, at the tension reel mechanism DR2, and the gripping drive reel NR4. In response to the drive, the lower stage reel RJ2 is lowered and the lower stage reel RK2 is raised, and the substrate P stored in the second buffer mechanism BF2 is placed during the joining process and the cutting process of the second splicer portion CSb. The length is reduced to become the initial state, that is, the storage length which is substantially the smallest (refer to Fig. 24). After the length of the substrate P stored in the second buffer mechanism BF2 is substantially minimized, the pinch drive reel NR4 is rotated at the same speed as the pinch drive reel NR3.
另一方面,在基板P之回收完成後之第3安裝部RS3,移除回收輥RR3,如圖24所示,將連接(連結或接合)有引入基板PK2(以下,僅稱為基板PK2)之前端部之回收輥RR6安裝在馬達軸MT3,且使基板PK2之終端部吸附固定在於貼設位置旋動之切斷接合單元CU3之吸附墊1C,之後,在與吸附側相反側之面貼設兩面帶T。 On the other hand, in the third mounting portion RS3 after the completion of the recovery of the substrate P, the recovery roller RR3 is removed, and as shown in FIG. 24, the introduction substrate PK2 (hereinafter, simply referred to as the substrate PK2) is connected (joined or bonded). The recovery roller RR6 at the front end is attached to the motor shaft MT3, and the end portion of the substrate PK2 is suction-fixed to the adsorption pad 1C of the cutting engagement unit CU3 which is rotated at the attachment position, and then the surface opposite to the adsorption side is attached. Set two sides with T.
在基板PK2貼設兩面帶T後,使切斷接合單元CU3旋動以移動至接合位置,且藉由馬達軸MT3之旋轉驅動使回收輥RR6往基板PK2(基板P)之回收方向(圖25中順時針方向)旋轉,藉此,在對基板PK2賦予既定張力之狀態下,待機至捲繞感測器S4檢測出回收輥RR3之回收結束為止。 After the double-sided tape T is attached to the substrate PK2, the cut-and-join unit CU3 is rotated to move to the joint position, and the recovery roller RR6 is driven to the recovery direction of the substrate PK2 (substrate P) by the rotational driving of the motor shaft MT3 (FIG. 25). By rotating in the clockwise direction, the predetermined tension is applied to the substrate PK2, and the winding sensor S4 waits until the recovery of the recovery roller RR3 is completed.
如以上說明,本實施形態中,在第1緩衝機構BF1暫時儲存基板P並送至處理裝置U1之期間,將從新的供應輥RR2引出之基板P2接替基板P,輸送至第1緩衝機構BF1。因此,不停止處理裝置U1~Un之各處理即可變更作為供應來源之輥。是以,本實施形態中,可避免在供應輥之變更時點投入處理裝置U1~Un之基板P浪費而導致成本增加之事態。 As described above, in the present embodiment, while the first buffer mechanism BF1 temporarily stores the substrate P and sends it to the processing apparatus U1, the substrate P2 taken out from the new supply roller RR2 takes over the substrate P and is transported to the first buffer mechanism BF1. Therefore, the roller as the supply source can be changed without stopping the respective processes of the processing devices U1 to Un. Therefore, in the present embodiment, it is possible to avoid a situation in which the substrate P which is put into the processing apparatuses U1 to Un at the time of the change of the supply roller is wasted and the cost is increased.
再者,本實施形態中,在從處理裝置Un輸送之基板P在第2緩衝機構BF2暫時儲存之期間,切換基板之回收對象。因此,在變更基板P之回收對象時亦可避免在變更時點投入處理裝置U1~Un之基板P浪費而導致成本增加之事態。 In the present embodiment, the substrate P transported from the processing apparatus Un is switched while the second buffer mechanism BF2 is temporarily stored. Therefore, when the object to be collected of the substrate P is changed, it is possible to avoid a situation in which the substrate P that is put into the processing devices U1 to Un at the time of the change is wasted and the cost is increased.
又,本實施形態中,在第1接帶器部CSa及第2接帶器部CSb,將新的基板接合於之前已使用之基板後,將之前之基板切斷。因此,在先執行切斷之情形,不會因賦予之張力在切斷時基板分離而產生妨礙接合等之缺陷,能穩定地執行基板處理。 Further, in the present embodiment, after the new substrate is bonded to the previously used substrate in the first tape connector portion CSa and the second tape connector portion CSb, the previous substrate is cut. Therefore, in the case where the cutting is performed first, the substrate is not separated by the tension applied, and defects such as the adhesion are prevented from occurring, and the substrate processing can be stably performed.
以上,參照圖式說明本發明較佳實施形態,但本發明並不限於上述例。在上述例所示之各構成構件之諸形狀或組合等為一例,在不脫離本發明主旨之範圍內,可依據設計要求等進行各種變更。 The preferred embodiments of the present invention have been described above with reference to the drawings, but the present invention is not limited to the above examples. The shapes, combinations, and the like of the respective constituent members shown in the above-described examples are merely examples, and various modifications can be made depending on design requirements and the like without departing from the gist of the invention.
例如,上述實施形態中,例示處理機構具備複數個處理裝置U1~Un之構成。然而,並不限於此,在一個處理裝置設置上述基板接續更換機構之構成亦可。 For example, in the above embodiment, the example processing means includes a plurality of processing means U1 to Un. However, the configuration is not limited thereto, and the configuration of the substrate connection/replacement mechanism may be provided in one processing device.
又,上述實施形態中,為另外具備連接有引入基板PK之回收輥之構成。然而,例如,為使用已用過且前端部之基板被切斷之供應輥之構成亦可。 Moreover, in the above embodiment, the configuration further includes a recovery roller to which the introduction substrate PK is connected. However, for example, a configuration may be adopted in which a supply roller that has been used and the substrate at the front end portion is cut is used.
又,上述實施形態中,為在供應側及回收側分別具備二個輥安裝部之構成。然而,分別具備三個以上之輥安裝部亦可。 Further, in the above embodiment, the two roller attachment portions are provided on the supply side and the recovery side. However, it is also possible to have three or more roller attachment portions.
上述實施形態中,從二個供應輥之一方供應之基板成為輥終端之前,自動地接足來自另一輥之基板,可不停止生產線持續進行處理。若在生產線之某處,在形成在基板上之圖案產生缺陷或產生製造裝置之缺陷,則會有作出大量不良品之虞。 In the above embodiment, before the substrate supplied from one of the two supply rollers becomes the roller end, the substrate from the other roller is automatically connected, and the processing can be continued without stopping the production line. Somewhere in the production line, defects in the pattern formed on the substrate or defects in the manufacturing apparatus can cause a large number of defective products.
因此,為下述生產線(工廠)構成亦可,即在最終產品完成前之生產線,將長帶基板之狀態進行製程之多數個步驟劃分成幾個區塊,在各區塊內進行輥對輥之連續處理,在下一個步驟區塊,以捲繞有形成半完成品之基板之輥單位進行搬送,安裝在既定安裝部(RS1或RS2)。此情形,基板搬送能以步驟區塊單位連續地進行,即使在某個步驟區塊產生問題(圖案缺陷或裝置缺陷等)之情形,僅使該步驟區塊暫時停止即可,可減少不良品大量產生。 Therefore, it is possible to configure the following production line (factory), that is, in the production line before the completion of the final product, the majority of the steps of the process of the long substrate are divided into several blocks, and the roll-to-roll is performed in each block. The continuous processing is carried out in a unit of a roll in which a substrate for forming a semi-finished product is wound in the next step, and is attached to a predetermined mounting portion (RS1 or RS2). In this case, the substrate transfer can be continuously performed in the step block unit, and even if a problem occurs in a certain step block (pattern defect or device defect, etc.), only the step block can be temporarily stopped, and the defective product can be reduced. Produced in large quantities.
又,上述實施形態中,安裝在二個安裝部RS1,RS2之各個之供應輥RR1,RR2,產品製造用之片狀基板捲繞相同長度量,在來自一供 應輥RR1之基板供應結束(輥終端)之前一刻,接替成另一供應輥RR2之基板,供應輥RR2之基板用盡前持續進行處理。然而,安裝在安裝部RS1,RS2之一方之供應輥,僅在將成為輥終端之另一方之供應輥更換成新的輥之期間,對處理裝置U1~Un持續供應基板之使用方法亦可。 Further, in the above-described embodiment, the supply rollers RR1 and RR2 attached to each of the two mounting portions RS1 and RS2 are wound by the same length of the sheet substrate for product manufacture. Immediately before the end of the supply of the substrate of the roller RR1 (roller end), the substrate of the other supply roller RR2 is replaced, and the substrate of the supply roller RR2 is continuously processed before it is used up. However, the supply roller attached to one of the mounting portions RS1 and RS2 may be used to continuously supply the substrate to the processing devices U1 to Un while the supply roller that is the other of the roller terminals is replaced with a new one.
此情形,例如,設成為輥終端之供應輥為RR2,將該輥RR2從安裝部RS2移除,將新的供應輥安裝在安裝部RS2,設在第1接帶器部CSa之接合準備完成之狀態(圖13之狀態)前之準備時間為180秒,在此期間,從另一方之供應輥RR1投入處理裝置U1(生產線)之基板(P1)之長度,設處理中之基板之輸送速度為50mm/秒,則成為9m。 In this case, for example, the supply roller which is the roller end is RR2, the roller RR2 is removed from the mounting portion RS2, the new supply roller is attached to the mounting portion RS2, and the joining of the first adapter portion CSa is completed. The preparation time before the state (state of Fig. 13) is 180 seconds, during which the length of the substrate (P1) of the processing device U1 (production line) is supplied from the other supply roller RR1, and the conveying speed of the substrate during processing is set. When it is 50 mm/sec, it becomes 9 m.
因此,該9m量之基板(P1)從另一方之供應輥RR1供應後,立刻藉由第1接帶器部CSa,將來自安裝在安裝部RS2之新的供應輥RR2之基板(P2)之前端接合(連結或連接)於從供應輥RR1僅投入處理裝置U1大致9m之基板(P1)之位置,此外,將該基板(P1)切斷,替換成來自供應輥RR2之基板(P2)亦可。 Therefore, immediately after the supply of the 9 m-thick substrate (P1) from the other supply roller RR1, the substrate (P2) from the new supply roller RR2 mounted on the mounting portion RS2 is used by the first splicer portion CSa. The front end is joined (connected or connected) to a position where the supply roller RR1 is placed only on the substrate (P1) of the processing device U1 by approximately 9 m, and the substrate (P1) is cut and replaced with the substrate (P2) from the supply roller RR2. can.
又,如上述,將來自安裝在安裝部RS1之供應輥RR1之基板(P1)利用為暫時性接替基板(例如約9m)之情形,關於對該基板(P1)進行之處理,設為各處理裝置U1~Un之條件決定或維護管理用之引導處理,在此形成之元件不使用為最終產品亦可。 In addition, as described above, the substrate (P1) from the supply roller RR1 attached to the mounting portion RS1 is used as a temporary replacement substrate (for example, about 9 m), and the processing for the substrate (P1) is performed as each processing. The conditions of the devices U1 to Un are determined or maintained for the management process, and the components formed here are not used as the final product.
再者,利用為暫時性接替基板(例如約9m)之情形,不須將該基板(P1)預先捲繞於供應輥RR1,將例如切斷成10m之長度之枚葉式基板折疊後保管於箱子等,從該箱子逐一取出基板(10m)並供應至第1接帶器部 CSa亦可。 Further, in the case of temporarily replacing the substrate (for example, about 9 m), the substrate (P1) is not required to be wound around the supply roller RR1 in advance, and the leaf-shaped substrate cut into a length of, for example, 10 m is folded and stored in the substrate. Box, etc., the substrate (10m) is taken out one by one from the box and supplied to the first belt unit CSa is also available.
此外,本發明之技術範圍並不限於上述各實施形態。例如,上述各實施形態說明之要素之一個以上有省略之情形。又,上述各實施形態說明之要素可適當地組合。 Further, the technical scope of the present invention is not limited to the above embodiments. For example, one or more of the elements described in the above embodiments may be omitted. Further, the elements described in the above embodiments can be combined as appropriate.
BF1‧‧‧第1緩衝機構(第1緩衝部、緩衝機構) BF1‧‧‧1st buffer mechanism (1st buffer part, buffer mechanism)
BF2‧‧‧第2緩衝機構(第2緩衝部) BF2‧‧‧2nd buffer mechanism (2nd buffer part)
CSa‧‧‧第1接帶器部(基板接續更換機構) CSa‧‧1 first strap unit (substrate connection replacement mechanism)
CSb‧‧‧第2接帶器部(第2基板接續更換機構) CSb‧‧‧2nd strap unit (2nd board connection replacement mechanism)
CU10‧‧‧切斷機構 CU10‧‧‧ cutting mechanism
DR1,DR2‧‧‧張力捲筒機構 DR1, DR2‧‧‧ tension reel mechanism
P‧‧‧基板 P‧‧‧Substrate
PU10‧‧‧接合機構 PU10‧‧‧ joint mechanism
RR1‧‧‧供應輥(第1輥) RR1‧‧‧Supply Roller (1st Roll)
RR2‧‧‧供應輥(第2輥) RR2‧‧‧Supply Roller (2nd Roller)
RRA‧‧‧供應輥 RRA‧‧‧ supply roller
RRB11~RRB31‧‧‧輥 RRB11~RRB31‧‧‧ Roll
RRB12~RRB32‧‧‧輥 RRB12~RRB32‧‧‧ Roll
RRC‧‧‧回收輥 RRC‧‧‧Recycling roller
RSA,RSC‧‧‧輥安裝部 RSA, RSC‧‧‧ Roll Mounting Department
RSB11~RSB31‧‧‧安裝部 RSB11~RSB31‧‧‧Installation Department
RSB12~RSB32‧‧‧安裝部 RSB12~RSB32‧‧‧Installation Department
ST1,ST2‧‧‧選擇投入機構 ST1, ST2‧‧‧Selected input institutions
UA,UB,UB1~UB3,UC‧‧‧處理單元 UA, UB, UB1~UB3, UC‧‧‧ processing unit
8‧‧‧保持部 8‧‧‧ Keeping Department
Claims (12)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261650712P | 2012-05-23 | 2012-05-23 | |
US61/650,712 | 2012-05-23 | ||
US201261654500P | 2012-06-01 | 2012-06-01 | |
US61/654,500 | 2012-06-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201717268A true TW201717268A (en) | 2017-05-16 |
TWI634595B TWI634595B (en) | 2018-09-01 |
Family
ID=49623585
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW105139460A TWI634595B (en) | 2012-05-23 | 2013-05-16 | Substrate processing method |
TW108111321A TWI733096B (en) | 2012-05-23 | 2013-05-16 | Substrate processing system |
TW102117313A TWI587380B (en) | 2012-05-23 | 2013-05-16 | A cutting mechanism, a substrate processing system, a substrate processing device, and a substrate processing method |
TW107125904A TWI659462B (en) | 2012-05-23 | 2013-05-16 | Cutting or bonding device for substrate |
Family Applications After (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108111321A TWI733096B (en) | 2012-05-23 | 2013-05-16 | Substrate processing system |
TW102117313A TWI587380B (en) | 2012-05-23 | 2013-05-16 | A cutting mechanism, a substrate processing system, a substrate processing device, and a substrate processing method |
TW107125904A TWI659462B (en) | 2012-05-23 | 2013-05-16 | Cutting or bonding device for substrate |
Country Status (6)
Country | Link |
---|---|
JP (6) | JP6156369B2 (en) |
KR (5) | KR101945684B1 (en) |
CN (3) | CN105479737B (en) |
IN (1) | IN2014DN10546A (en) |
TW (4) | TWI634595B (en) |
WO (1) | WO2013175882A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI774876B (en) * | 2017-12-28 | 2022-08-21 | 日商三星鑽石工業股份有限公司 | breaking device |
TWI782169B (en) * | 2018-01-23 | 2022-11-01 | 日商東京威力科創股份有限公司 | Joining system and joining method |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101945684B1 (en) * | 2012-05-23 | 2019-02-07 | 가부시키가이샤 니콘 | Cutting mechanism, joining mechanism, substrate processing system, substrate processing device, and substrate processing method |
DE102014116615A1 (en) * | 2014-11-13 | 2016-05-19 | Packsys Global Ag | Substrate feeding device for a packaging tube manufacturing process and substrate feeding method |
WO2017057427A1 (en) * | 2015-09-29 | 2017-04-06 | 株式会社ニコン | Production system |
JP6645157B2 (en) * | 2015-12-10 | 2020-02-12 | 株式会社ニコン | Substrate processing equipment |
KR102412451B1 (en) * | 2016-08-08 | 2022-06-24 | 가부시키가이샤 니콘 | Substrate processing apparatus and substrate processing method |
JP6829870B2 (en) * | 2016-11-25 | 2021-02-17 | 三星ダイヤモンド工業株式会社 | Board division system |
JP6376483B2 (en) * | 2017-01-10 | 2018-08-22 | 大日本印刷株式会社 | Vapor deposition mask manufacturing method, vapor deposition mask device manufacturing method, and vapor deposition mask quality determination method |
JP7015987B2 (en) * | 2017-10-03 | 2022-02-04 | パナソニックIpマネジメント株式会社 | Manufacturing method of component mounting equipment and mounting board |
JP7064885B2 (en) * | 2018-01-05 | 2022-05-11 | 東京エレクトロン株式会社 | Board gripping mechanism, board transfer device and board processing system |
WO2020012862A1 (en) * | 2018-07-09 | 2020-01-16 | 大日本印刷株式会社 | Vapor-deposition mask defective determination method, vapor-deposition mask manufacturing method, vapor deposition mask device manufacturing method, vapor-deposition mask selection method, and vapor-deposition mask |
JP7454837B2 (en) | 2020-02-03 | 2024-03-25 | 三光機械株式会社 | Packaging film joining equipment and packaging film automatic exchange equipment |
KR20220142640A (en) | 2021-04-15 | 2022-10-24 | 주식회사 엘지에너지솔루션 | Device supplying raw material for separator of secondary bettery |
KR102553891B1 (en) * | 2022-09-05 | 2023-07-11 | 주식회사 스타테크 | Roll to roll apparatus |
WO2024053441A1 (en) * | 2022-09-05 | 2024-03-14 | 株式会社瑞光 | Splice device and method |
Family Cites Families (49)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4157934A (en) * | 1977-07-18 | 1979-06-12 | Compensating Tension Controls, Inc. | Low tension lap slicer unit |
JPS625327Y2 (en) * | 1980-06-02 | 1987-02-06 | ||
JPS6019037A (en) | 1983-07-14 | 1985-01-31 | Nissan Motor Co Ltd | Preparation of catalyst for treating exhaust gas |
JPS6019037U (en) | 1983-07-18 | 1985-02-08 | 株式会社リコー | exposure equipment |
JPH07176507A (en) * | 1993-12-20 | 1995-07-14 | Hitachi Ltd | Wet treatment device and method thereof |
JPH08157112A (en) * | 1994-10-06 | 1996-06-18 | Kyodo Printing Co Ltd | Device and method for winding web |
JPH08152718A (en) * | 1994-11-28 | 1996-06-11 | Nippon Seiko Kk | Exposure device |
JPH08239144A (en) * | 1995-03-03 | 1996-09-17 | Canon Inc | Method for replacing work raw material during manufacture of article made from continuous material |
JPH08330205A (en) * | 1995-05-29 | 1996-12-13 | Matsushita Electron Corp | Alignment method |
JPH10279142A (en) * | 1997-04-09 | 1998-10-20 | Takao Eng Kk | Tape material bonding device |
JP3586582B2 (en) * | 1999-04-09 | 2004-11-10 | 三菱重工業株式会社 | Web splicing apparatus and spliced web generating method |
JP4328460B2 (en) * | 2000-11-09 | 2009-09-09 | 株式会社トパック | Film feeder |
JP2002313880A (en) * | 2001-04-19 | 2002-10-25 | Hitachi Ltd | Method for manufacturing semiconductor integrated circuit device |
JP2003024865A (en) * | 2001-07-11 | 2003-01-28 | Minolta Co Ltd | Wet treating method of film substrate and wet treating device thereof |
CA2709475C (en) * | 2002-03-22 | 2012-01-10 | Magnum Manufacturing Limited | Method and apparatus for overlapping sheets in a sheet feeder and providing the overlapped sheets to a printing press |
JP2003327354A (en) * | 2002-05-10 | 2003-11-19 | Zuiko Corp | Web splicing method and device |
JP3965329B2 (en) * | 2002-06-20 | 2007-08-29 | 東洋鋼鈑株式会社 | Resin film connecting method and connecting device |
JP4475864B2 (en) * | 2002-09-11 | 2010-06-09 | 大日本印刷株式会社 | Mixed flow production line system |
JP2004182353A (en) * | 2002-11-29 | 2004-07-02 | Rengo Co Ltd | Web splicing device |
JP2004186469A (en) * | 2002-12-04 | 2004-07-02 | Nippon Telegr & Teleph Corp <Ntt> | Strip-shaped continuous substrate, semiconductor device using the same, and method for manufacturing the same |
JP2004189379A (en) * | 2002-12-10 | 2004-07-08 | Rengo Co Ltd | Web connection device |
JP4259882B2 (en) * | 2003-01-15 | 2009-04-30 | シチズンファインテックミヨタ株式会社 | Tape sticking method and tape sticking apparatus |
US20050241774A1 (en) * | 2004-04-30 | 2005-11-03 | Kimberly-Clark Worldwide, Inc. | Apparatus and process for aligning materials during a splice |
JP2005347618A (en) | 2004-06-04 | 2005-12-15 | Fuji Photo Film Co Ltd | Photosensitive web unit, and manufacturing apparatus and method of photosensitive laminate |
JP2006060066A (en) * | 2004-08-20 | 2006-03-02 | Mitsubishi Electric Corp | Method for forming silicon oxide film and film forming apparatus |
JP4515331B2 (en) * | 2005-05-30 | 2010-07-28 | 東京エレクトロン株式会社 | Substrate processing system |
US8383330B2 (en) * | 2005-09-07 | 2013-02-26 | Fujifilm Corporation | Pattern exposure method and pattern exposure apparatus |
JP4224479B2 (en) * | 2005-09-07 | 2009-02-12 | 富士フイルム株式会社 | Pattern exposure method and apparatus |
JP4861778B2 (en) * | 2005-09-08 | 2012-01-25 | 富士フイルム株式会社 | Pattern exposure method and apparatus |
JP4360684B2 (en) * | 2006-02-22 | 2009-11-11 | 日東電工株式会社 | Adhesive tape pasting method for semiconductor wafer and apparatus using the same |
JP2008001429A (en) * | 2006-05-22 | 2008-01-10 | Sanko Kikai Kk | Automatic film splicing device of filling and packaging machine |
JP5059382B2 (en) | 2006-11-20 | 2012-10-24 | ディップ株式会社 | System and method for automatically creating job history |
JP5234523B2 (en) * | 2007-04-13 | 2013-07-10 | 株式会社ニコン | Display element manufacturing method, display element manufacturing apparatus, and sheet substrate for display element manufacturing |
DE112008001389B4 (en) * | 2007-05-25 | 2024-01-18 | Hamamatsu Photonics K.K. | Cutting processing method |
JP4894010B2 (en) * | 2007-06-12 | 2012-03-07 | 株式会社トーモク | Paper splicing method and paper splicing device in corrugating machine |
JP2009023301A (en) * | 2007-07-23 | 2009-02-05 | Fujifilm Corp | Applying process of laminated film |
TW200919117A (en) * | 2007-08-28 | 2009-05-01 | Tokyo Electron Ltd | Coating-developing apparatus, coating-developing method and storage medium |
US8782234B2 (en) | 2008-05-05 | 2014-07-15 | Siemens Industry, Inc. | Arrangement for managing data center operations to increase cooling efficiency |
KR101015227B1 (en) * | 2008-08-06 | 2011-02-18 | 세메스 주식회사 | Substrate processing apparatus and method for transferring substrate of the same |
KR101181560B1 (en) * | 2008-09-12 | 2012-09-10 | 다이닛뽕스크린 세이조오 가부시키가이샤 | Substrate processing apparatus and substrate conveying apparatus for use in the same |
JP2010113268A (en) * | 2008-11-10 | 2010-05-20 | Kyodo Printing Co Ltd | Method for manufacturing shield material, and photomask |
US8541163B2 (en) * | 2009-06-05 | 2013-09-24 | Nikon Corporation | Transporting method, transporting apparatus, exposure method, and exposure apparatus |
JP5630113B2 (en) | 2009-07-17 | 2014-11-26 | 株式会社ニコン | Pattern forming apparatus, pattern forming method, and device manufacturing method |
JP5465944B2 (en) | 2009-07-30 | 2014-04-09 | 日東電工株式会社 | How to apply protective tape |
JP4503689B1 (en) * | 2009-10-13 | 2010-07-14 | 日東電工株式会社 | Method and apparatus for continuous production of liquid crystal display elements |
JP5313945B2 (en) | 2010-02-25 | 2013-10-09 | パナソニック株式会社 | Tape sticking device, protective sheet unit, and protective sheet feeding method |
JP5708179B2 (en) * | 2010-04-13 | 2015-04-30 | 株式会社ニコン | Exposure apparatus, substrate processing apparatus, and device manufacturing method |
JP5830233B2 (en) * | 2010-09-17 | 2015-12-09 | 日東電工株式会社 | Sheet bonded body manufacturing method and sheet bonded body manufacturing apparatus |
KR101945684B1 (en) * | 2012-05-23 | 2019-02-07 | 가부시키가이샤 니콘 | Cutting mechanism, joining mechanism, substrate processing system, substrate processing device, and substrate processing method |
-
2013
- 2013-04-09 KR KR1020187023690A patent/KR101945684B1/en active IP Right Grant
- 2013-04-09 KR KR1020177031494A patent/KR101903927B1/en active IP Right Grant
- 2013-04-09 KR KR1020207012687A patent/KR102266662B1/en active IP Right Grant
- 2013-04-09 CN CN201510795438.8A patent/CN105479737B/en active Active
- 2013-04-09 KR KR1020147032598A patent/KR101802025B1/en active IP Right Grant
- 2013-04-09 CN CN201380025725.XA patent/CN104303110B/en active Active
- 2013-04-09 JP JP2014516716A patent/JP6156369B2/en active Active
- 2013-04-09 KR KR1020187037867A patent/KR102108498B1/en active IP Right Grant
- 2013-04-09 IN IN10546DEN2014 patent/IN2014DN10546A/en unknown
- 2013-04-09 CN CN201510795430.1A patent/CN105467627A/en active Pending
- 2013-04-09 WO PCT/JP2013/060705 patent/WO2013175882A1/en active Application Filing
- 2013-05-16 TW TW105139460A patent/TWI634595B/en active
- 2013-05-16 TW TW108111321A patent/TWI733096B/en active
- 2013-05-16 TW TW102117313A patent/TWI587380B/en active
- 2013-05-16 TW TW107125904A patent/TWI659462B/en active
-
2016
- 2016-02-03 JP JP2016018903A patent/JP6107986B2/en active Active
-
2017
- 2017-05-30 JP JP2017106405A patent/JP2017160057A/en active Pending
-
2018
- 2018-05-21 JP JP2018096942A patent/JP6597835B2/en active Active
-
2019
- 2019-09-26 JP JP2019175442A patent/JP6753501B2/en active Active
-
2020
- 2020-08-20 JP JP2020139661A patent/JP2020201505A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI774876B (en) * | 2017-12-28 | 2022-08-21 | 日商三星鑽石工業股份有限公司 | breaking device |
TWI782169B (en) * | 2018-01-23 | 2022-11-01 | 日商東京威力科創股份有限公司 | Joining system and joining method |
Also Published As
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI587380B (en) | A cutting mechanism, a substrate processing system, a substrate processing device, and a substrate processing method | |
JP5308433B2 (en) | Component mounting apparatus and method | |
JP2008139523A (en) | Optical film-pasting method, optical film-pasting device, and manufacturing method of display panel | |
JP2008015041A (en) | Alignment lamination device and alignment lamination method | |
JP2006264906A (en) | Tape adhering device | |
KR20190098083A (en) | System and apparatus for laminating optical film | |
TWI383718B (en) | An anisotropic conductive film (ACF) sticking device, a flat panel display (FPD) manufacturing apparatus, and a flat panel display | |
JP5969247B2 (en) | Continuous manufacturing method of optical display panel, continuous manufacturing system thereof, switching method and feeding device | |
JP2004047554A (en) | Apparatus and method for supplying acf | |
WO2010053081A1 (en) | Apparatus for adhering anisotropic conductive film | |
JP2012033612A (en) | Fpd module assembly apparatus |