KR100693969B1 - 고체 소자 디바이스 및 그 제조 방법 - Google Patents
고체 소자 디바이스 및 그 제조 방법 Download PDFInfo
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- KR100693969B1 KR100693969B1 KR1020057016878A KR20057016878A KR100693969B1 KR 100693969 B1 KR100693969 B1 KR 100693969B1 KR 1020057016878 A KR1020057016878 A KR 1020057016878A KR 20057016878 A KR20057016878 A KR 20057016878A KR 100693969 B1 KR100693969 B1 KR 100693969B1
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- light emitting
- glass
- solid element
- led element
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
- H01L33/56—Materials, e.g. epoxy or silicone resin
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C27/00—Joining pieces of glass to pieces of other inorganic material; Joining glass to glass other than by fusing
- C03C27/06—Joining glass to glass by processes other than fusing
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/24—Fusion seal compositions being frit compositions having non-frit additions, i.e. for use as seals between dissimilar materials, e.g. glass and metal; Glass solders
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/17—Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B23/00—Re-forming shaped glass
- C03B23/20—Uniting glass pieces by fusing without substantial reshaping
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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Abstract
Description
Claims (34)
- 플립 칩 실장되는 고체 소자와,상기 고체 소자에 대하여 전력의 수공급을 행하는 전력 수공급부와,상기 고체 소자를 밀봉하는 무기 밀봉 재료를 갖는 것을 특징으로 하는 고체 소자 디바이스.
- 고체 소자와,상기 고체 소자에 대하여 전력의 수공급을 행하는 전력 수공급부와,상기 고체 소자의 전기 접속부와 상기 전력 수공급부의 일부를 피복하는 내열 부재와,상기 내열 부재를 포함하는 상기 고체 소자를 밀봉하는 무기 밀봉 재료를 갖는 것을 특징으로 하는 고체 소자 디바이스.
- 고체 소자와,상기 고체 소자에 대하여 전력의 수공급을 행하는 전력 수공급부와,상기 고체 소자를 밀봉하는 SiO2-Nb2O5계, B2O3-F계, P2O5-F계, P2O5-ZnO계, SiO2-B2O3-La2O3계, 및 SiO2-B2O3계로부터 선택되는 저융점 글래스를 이용한 글래스 밀봉부를 갖는 것을 특징으로 하는 고체 소자 디바이스.
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- 삭제
- 삭제
- 고체 소자와,상기 고체 소자에 대하여 전력의 수공급을 행하는 무기 재료 기판으로 이루어지는 전력 수공급부와,상기 고체 소자를 밀봉하고, 상기 무기 재료 기판과의 열팽창률이 동등한 무기 밀봉 재료를 갖는 것을 특징으로 하는 고체 소자 디바이스.
- 제1항, 제2항 또는 제8항 중 어느 한 항에 있어서,상기 무기 밀봉 재료는, 무기 밀봉 글래스 재료인 것을 특징으로 하는 고체 소자 디바이스.
- 제9항에 있어서,상기 무기 밀봉 글래스 재료는, SiO2-Nb2O5계, B2O3-F계, P2O5-F계, P2O5-ZnO계, SiO2-B2O3-La2O3계, 및 SiO2-B2O3계로부터 선택되는 저융점 글래스인 것을 특징으로 하는 고체 소자 디바이스.
- 삭제
- 삭제
- 제1항 내지 제3항 또는 제8항 중 어느 한 항에 있어서,상기 전력 수공급부는, 도전 패턴이 형성된 무기 재료 기판으로 이루어지고, 상기 무기 재료 기판은, 상기 무기 밀봉 재료와 동등한 열팽창률을 갖는 것을 특징으로 하는 고체 소자 디바이스.
- 제13항에 있어서,상기 무기 밀봉 재료는, 상기 무기 재료 기판보다 열팽창률이 작은 것을 특징으로 하는 고체 소자 디바이스.
- 제13항에 있어서,상기 무기 재료 기판은, 상기 무기 밀봉 재료와 화학 반응 접합하는 것에 기초하여 상기 고체 소자를 밀봉하는 것을 특징으로 하는 고체 소자 디바이스.
- 제8항에 있어서,상기 무기 밀봉 재료는, 열팽창률이 15×10-6/℃ 이하인 것을 특징으로 하는 고체 소자 디바이스.
- 제8항에 있어서,상기 무기 재료 기판은, 금속층을 가지고, 상기 무기 재료 기판과 상기 무기 밀봉 재료는, 상기 금속층의 산화물을 통하여 접합되어 있는 것을 특징으로 하는 고체 소자 디바이스.
- 제8항에 있어서,상기 무기 재료 기판에 형성되는 도전 패턴은, 상기 고체 소자를 마운트하는 측의 패턴, 그 이면 측의 패턴, 및 그 양측을 전기적으로 접속하는 패턴을 갖는 것을 특징으로 하는 고체 소자 디바이스.
- 제8항에 있어서,상기 무기 재료 기판은, 디바이스 분할용의 홈이 표면에 형성되어 있는 것을 특징으로 하는 고체 소자 디바이스.
- 제8항에 있어서,상기 무기 재료 기판은, 글래스 함유 Al2O3, Al2O3, 또는 AlN으로 이루어지는 것을 특징으로 하는 고체 소자 디바이스.
- 제1항 내지 제3항 또는 제8항 중 어느 한 항에 있어서,상기 무기 밀봉 재료는, 표면에 내습, 내산, 내알칼리를 위한 코팅 처리가 실시되어 있는 것을 특징으로 하는 고체 소자 디바이스.
- 제1항 내지 제3항 또는 제8항 중 어느 한 항에 있어서,상기 고체 소자는, 광학 소자이고, 또한, 상기 무기 밀봉 재료는 투광성 재료인 것을 특징으로 하는 고체 소자 디바이스.
- 제22항에 있어서,상기 광학 소자는, 발광 소자인 것을 특징으로 하는 고체 소자 디바이스.
- 삭제
- 제22항에 있어서,상기 광학 소자는, 수광 소자인 것을 특징으로 하는 고체 소자 디바이스.
- 제1항 내지 제3항 또는 제8항 중 어느 한 항에 있어서,상기 무기 밀봉 재료는, 표면에 무기 밀봉 재료와 공기와의 계면 반사 경감을 위한 코팅 처리가 실시되어 있는 것을 특징으로 하는 고체 소자 디바이스.
- 제1항 내지 제3항 또는 제8항 중 어느 한 항에 있어서,상기 무기 밀봉 재료는, 표면에 수지에 의한 오버 몰드가 실시되어 있는 것을 특징으로 하는 고체 소자 디바이스.
- 고체 소자를 전력 수공급부에 실장하는 실장 공정과,산소 차단 분위기, 무기 밀봉 재료의 굴복점 이상의 온도로 상기 고체 소자의 무기 밀봉 재료를 가압함으로써 밀봉 가공을 행하는 밀봉 공정을 갖는 것을 특징으로 하는 고체 소자 디바이스의 제조 방법.
- 제28항에 있어서,상기 실장 공정은, 플립 실장인 것을 특징으로 하는 고체 소자 디바이스의 제조 방법.
- 제28항에 있어서,상기 실장 공정은, 와이어 본딩을 실시하고, 내열 부재에 의해서 고체 소자로 하는 와이어 본딩부를 피복하는 공정을 포함하는 것을 특징으로 하는 고체 소자 디바이스의 제조 방법.
- 삭제
- 제28항에 있어서,상기 밀봉 공정은, 상기 무기 밀봉 재료를 106포아즈 이상의 고점도 조건으로 가공하는 것을 특징으로 하는 고체 소자 디바이스의 제조 방법.
- 제28항에 있어서,상기 전력 수공급부는, 상기 고체 소자가 실장되는 이면에 전극이 인출된 무기 재료 기판이고, 해당 무기 재료 기판에 복수의 고체 소자를 실장하고, 무기 밀봉 재료가 밀봉 부착됨으로써 밀봉 가공되고, 밀봉 후에 분리되는 것을 특징으로 하는 고체 소자 디바이스의 제조 방법.
- 제33항에 있어서,상기 무기 밀봉 재료는, 프리포밍된 글래스를 이용하는 것을 특징으로 하는 고체 소자 디바이스의 제조 방법.
Applications Claiming Priority (14)
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JP2003160867A JP2006086138A (ja) | 2003-06-05 | 2003-06-05 | 光デバイス |
JPJP-P-2003-00160867 | 2003-06-05 | ||
JP2003160855 | 2003-06-05 | ||
JPJP-P-2003-00160855 | 2003-06-05 | ||
JPJP-P-2003-00193182 | 2003-07-07 | ||
JP2003193182A JP2006086139A (ja) | 2003-07-07 | 2003-07-07 | 発光装置 |
JP2003342705A JP4303550B2 (ja) | 2003-09-30 | 2003-09-30 | 発光装置 |
JPJP-P-2003-00342706 | 2003-09-30 | ||
JPJP-P-2003-00342705 | 2003-09-30 | ||
JP2003342706A JP4016925B2 (ja) | 2003-09-30 | 2003-09-30 | 発光装置 |
JP2004010385A JP4029843B2 (ja) | 2004-01-19 | 2004-01-19 | 発光装置 |
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Country Status (6)
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101051489B1 (ko) | 2009-03-17 | 2011-07-25 | 주식회사 두성에이텍 | 발광 다이오드 유닛의 제조 방법과, 이 방법에 의하여 제조된 발광 다이오드 유닛 |
Families Citing this family (327)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7550777B2 (en) * | 2003-01-10 | 2009-06-23 | Toyoda Gosei, Co., Ltd. | Light emitting device including adhesion layer |
JP4029843B2 (ja) * | 2004-01-19 | 2008-01-09 | 豊田合成株式会社 | 発光装置 |
US7824937B2 (en) * | 2003-03-10 | 2010-11-02 | Toyoda Gosei Co., Ltd. | Solid element device and method for manufacturing the same |
US9142740B2 (en) | 2003-07-04 | 2015-09-22 | Epistar Corporation | Optoelectronic element and manufacturing method thereof |
US9000461B2 (en) * | 2003-07-04 | 2015-04-07 | Epistar Corporation | Optoelectronic element and manufacturing method thereof |
US10686106B2 (en) | 2003-07-04 | 2020-06-16 | Epistar Corporation | Optoelectronic element |
US20050116235A1 (en) * | 2003-12-02 | 2005-06-02 | Schultz John C. | Illumination assembly |
JP2006066868A (ja) | 2004-03-23 | 2006-03-09 | Toyoda Gosei Co Ltd | 固体素子および固体素子デバイス |
JP5141608B2 (ja) * | 2004-03-23 | 2013-02-13 | 豊田合成株式会社 | 固体素子デバイスの製造方法 |
CN1998077B (zh) * | 2004-05-20 | 2010-06-16 | 斯班逊有限公司 | 半导体装置的制造方法及半导体装置 |
JP2006100787A (ja) | 2004-08-31 | 2006-04-13 | Toyoda Gosei Co Ltd | 発光装置および発光素子 |
US7417220B2 (en) * | 2004-09-09 | 2008-08-26 | Toyoda Gosei Co., Ltd. | Solid state device and light-emitting element |
US7470926B2 (en) | 2004-09-09 | 2008-12-30 | Toyoda Gosei Co., Ltd | Solid-state optical device |
JP4747726B2 (ja) * | 2004-09-09 | 2011-08-17 | 豊田合成株式会社 | 発光装置 |
JP4747704B2 (ja) * | 2005-07-20 | 2011-08-17 | 豊田合成株式会社 | 蛍光体層付き発光装置の製造方法 |
JP4630629B2 (ja) * | 2004-10-29 | 2011-02-09 | 豊田合成株式会社 | 発光装置の製造方法 |
JP4394036B2 (ja) * | 2004-09-09 | 2010-01-06 | 豊田合成株式会社 | 固体素子デバイス |
US7842526B2 (en) | 2004-09-09 | 2010-11-30 | Toyoda Gosei Co., Ltd. | Light emitting device and method of producing same |
JP2006086469A (ja) * | 2004-09-17 | 2006-03-30 | Matsushita Electric Ind Co Ltd | 半導体発光装置、照明モジュール、照明装置及び半導体発光装置の製造方法 |
US7745832B2 (en) * | 2004-09-24 | 2010-06-29 | Epistar Corporation | Semiconductor light-emitting element assembly with a composite substrate |
DE102004050371A1 (de) * | 2004-09-30 | 2006-04-13 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement mit einer drahtlosen Kontaktierung |
US7419839B2 (en) | 2004-11-12 | 2008-09-02 | Philips Lumileds Lighting Company, Llc | Bonding an optical element to a light emitting device |
US7344902B2 (en) * | 2004-11-15 | 2008-03-18 | Philips Lumileds Lighting Company, Llc | Overmolded lens over LED die |
US7714335B2 (en) * | 2004-11-19 | 2010-05-11 | Koninklijke Philips Electronics N.V. | Light-emitting device with inorganic housing |
JP2006156668A (ja) * | 2004-11-29 | 2006-06-15 | Nichia Chem Ind Ltd | 発光装置及びその製造方法 |
WO2006059728A1 (ja) * | 2004-12-03 | 2006-06-08 | Sony Corporation | 光取出しレンズ、発光素子組立体、面状光源装置、及び、カラー液晶表示装置組立体 |
KR100867515B1 (ko) * | 2004-12-06 | 2008-11-07 | 삼성전기주식회사 | 발광소자 패키지 |
TWI420686B (zh) * | 2004-12-10 | 2013-12-21 | Panasonic Corp | 半導體發光裝置、發光模組及照明裝置 |
DE112005002889B4 (de) * | 2004-12-14 | 2015-07-23 | Seoul Viosys Co., Ltd. | Licht emittierendes Bauelement mit einer Mehrzahl Licht emittierender Zellen und Baugruppen-Montage desselben |
TWI317829B (en) * | 2004-12-15 | 2009-12-01 | Epistar Corp | Led illumination device and application thereof |
JP2006179572A (ja) * | 2004-12-21 | 2006-07-06 | Sharp Corp | 発光ダイオード、バックライト装置および発光ダイオードの製造方法 |
US7906788B2 (en) * | 2004-12-22 | 2011-03-15 | Panasonic Corporation | Semiconductor light emitting device, illumination module, illumination apparatus, method for manufacturing semiconductor light emitting device, and method for manufacturing semiconductor light emitting element |
KR100862457B1 (ko) * | 2004-12-29 | 2008-10-08 | 삼성전기주식회사 | 금속컬럼을 이용한 발광소자의 플립칩 본딩 구조체 |
JP5109226B2 (ja) * | 2005-01-20 | 2012-12-26 | 豊田合成株式会社 | 発光装置 |
JP4492378B2 (ja) * | 2005-02-03 | 2010-06-30 | 豊田合成株式会社 | 発光装置およびその製造方法 |
US20060171152A1 (en) * | 2005-01-20 | 2006-08-03 | Toyoda Gosei Co., Ltd. | Light emitting device and method of making the same |
KR101197046B1 (ko) | 2005-01-26 | 2012-11-06 | 삼성디스플레이 주식회사 | 발광다이오드를 사용하는 2차원 광원 및 이를 이용한 액정표시 장치 |
US7405433B2 (en) | 2005-02-22 | 2008-07-29 | Avago Technologies Ecbu Ip Pte Ltd | Semiconductor light emitting device |
JP2006245336A (ja) * | 2005-03-03 | 2006-09-14 | Koito Mfg Co Ltd | 発光装置 |
JP4645240B2 (ja) * | 2005-03-10 | 2011-03-09 | 豊田合成株式会社 | 面状発光装置 |
EP2280430B1 (en) | 2005-03-11 | 2020-01-01 | Seoul Semiconductor Co., Ltd. | LED package having an array of light emitting cells coupled in series |
WO2006112417A1 (ja) | 2005-04-15 | 2006-10-26 | Asahi Glass Company, Limited | ガラス封止発光素子、ガラス封止発光素子付き回路基板およびそれらの製造方法 |
JP4604819B2 (ja) * | 2005-04-28 | 2011-01-05 | 豊田合成株式会社 | 発光装置 |
TWI260798B (en) * | 2005-05-02 | 2006-08-21 | Ind Tech Res Inst | Highly heat-dissipating light-emitting diode |
TWI260800B (en) * | 2005-05-12 | 2006-08-21 | Epitech Technology Corp | Structure of light-emitting diode and manufacturing method thereof |
JP2006332365A (ja) * | 2005-05-26 | 2006-12-07 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子およびそれを用いた発光装置 |
JP4679267B2 (ja) * | 2005-06-29 | 2011-04-27 | シーアイ化成株式会社 | 発光ダイオード複合素子 |
JP4679268B2 (ja) * | 2005-06-29 | 2011-04-27 | シーアイ化成株式会社 | 発光ダイオード複合素子 |
DE102005031523B4 (de) * | 2005-06-30 | 2015-11-05 | Schott Ag | Halbleiterlichtquelle mit Lichtkonversionsmedium aus Glaskeramik |
DE102005038698A1 (de) | 2005-07-08 | 2007-01-18 | Tridonic Optoelectronics Gmbh | Optoelektronische Bauelemente mit Haftvermittler |
JP2007027278A (ja) * | 2005-07-13 | 2007-02-01 | Shinko Electric Ind Co Ltd | 半導体装置および半導体装置の製造方法 |
WO2007013664A1 (en) * | 2005-07-27 | 2007-02-01 | Showa Denko K.K. | Light-emitting diode light source |
JP2007059894A (ja) * | 2005-07-27 | 2007-03-08 | Showa Denko Kk | 発光ダイオード素子搭載光源 |
KR100629496B1 (ko) | 2005-08-08 | 2006-09-28 | 삼성전자주식회사 | Led 패키지 및 그 제조방법 |
US7847302B2 (en) * | 2005-08-26 | 2010-12-07 | Koninklijke Philips Electronics, N.V. | Blue LED with phosphor layer for producing white light and different phosphor in outer lens for reducing color temperature |
JP2007067300A (ja) * | 2005-09-01 | 2007-03-15 | Asahi Glass Co Ltd | 発光装置およびその製造方法 |
JP2007073575A (ja) * | 2005-09-05 | 2007-03-22 | Matsushita Electric Ind Co Ltd | 半導体発光装置 |
JP4961887B2 (ja) * | 2005-09-07 | 2012-06-27 | 豊田合成株式会社 | 固体素子デバイス |
JP2007080884A (ja) * | 2005-09-09 | 2007-03-29 | Asahi Glass Co Ltd | 発光装置の製造方法、発光装置および発光装置の中間部品 |
JP2007081234A (ja) | 2005-09-15 | 2007-03-29 | Toyoda Gosei Co Ltd | 照明装置 |
CN100594623C (zh) * | 2005-09-20 | 2010-03-17 | 松下电工株式会社 | 发光二极管照明器具 |
JP2007109743A (ja) * | 2005-10-11 | 2007-04-26 | Kaneka Corp | 発光ダイオード |
KR20080074948A (ko) * | 2005-11-04 | 2008-08-13 | 더 리전츠 오브 더 유니버시티 오브 캘리포니아 | 광추출 효율이 높은 발광 다이오드 |
JP2007140179A (ja) * | 2005-11-18 | 2007-06-07 | Seiko Epson Corp | 光モジュールおよびその製造方法 |
US7728437B2 (en) * | 2005-11-23 | 2010-06-01 | Fairchild Korea Semiconductor, Ltd. | Semiconductor package form within an encapsulation |
US20090268450A1 (en) * | 2005-11-28 | 2009-10-29 | Katsutoshi Kojoh | Lighting device and method of producing the same |
JP4922607B2 (ja) * | 2005-12-08 | 2012-04-25 | スタンレー電気株式会社 | Led光源装置 |
JP2007165811A (ja) | 2005-12-16 | 2007-06-28 | Nichia Chem Ind Ltd | 発光装置 |
KR100653645B1 (ko) * | 2005-12-27 | 2006-12-05 | 삼성전자주식회사 | 발광소자 패키지 및 발광소자 패키지 제조방법 |
JP2007201420A (ja) * | 2005-12-27 | 2007-08-09 | Sharp Corp | 半導体発光装置、半導体発光素子、および半導体発光装置の製造方法 |
US7521728B2 (en) * | 2006-01-20 | 2009-04-21 | Cree, Inc. | Packages for semiconductor light emitting devices utilizing dispensed reflectors and methods of forming the same |
WO2007088909A1 (ja) * | 2006-01-31 | 2007-08-09 | Kyocera Corporation | 発光装置および発光モジュール |
JPWO2007099796A1 (ja) * | 2006-02-22 | 2009-07-16 | 日本板硝子株式会社 | 発光ユニット、照明装置及び画像読取装置 |
KR100780196B1 (ko) * | 2006-02-27 | 2007-11-27 | 삼성전기주식회사 | 발광다이오드 패키지, 발광다이오드 패키지용 회로기판 및그 제조방법 |
JP4756349B2 (ja) * | 2006-03-16 | 2011-08-24 | 旭硝子株式会社 | 発光装置の製造方法 |
CN101410994B (zh) * | 2006-03-29 | 2011-06-15 | 京瓷株式会社 | 发光装置 |
KR100799864B1 (ko) * | 2006-04-21 | 2008-01-31 | 삼성전기주식회사 | Led 패키지 |
US7521727B2 (en) * | 2006-04-26 | 2009-04-21 | Rohm And Haas Company | Light emitting device having improved light extraction efficiency and method of making same |
US7365407B2 (en) * | 2006-05-01 | 2008-04-29 | Avago Technologies General Ip Pte Ltd | Light emitting diode package with direct leadframe heat dissipation |
US7423297B2 (en) * | 2006-05-03 | 2008-09-09 | 3M Innovative Properties Company | LED extractor composed of high index glass |
CN101443922B (zh) * | 2006-05-18 | 2011-01-12 | 旭硝子株式会社 | 发光装置的制造方法及发光装置 |
US20090314534A1 (en) * | 2006-06-15 | 2009-12-24 | Yoichi Matsuoka | Electronic component |
KR101314713B1 (ko) * | 2006-06-16 | 2013-10-07 | 신꼬오덴기 고교 가부시키가이샤 | 반도체 장치, 그 제조 방법, 및 기판 |
KR100809263B1 (ko) * | 2006-07-10 | 2008-02-29 | 삼성전기주식회사 | 직하 방식 백라이트 장치 |
TWI321857B (en) * | 2006-07-21 | 2010-03-11 | Epistar Corp | A light emitting device |
JP4930830B2 (ja) * | 2006-07-27 | 2012-05-16 | 日亜化学工業株式会社 | 発光装置 |
JP5307364B2 (ja) * | 2006-08-03 | 2013-10-02 | 豊田合成株式会社 | 蛍光体含有ガラスの製造方法及び固体素子デバイスの製造方法 |
US20080035942A1 (en) | 2006-08-08 | 2008-02-14 | Lg Electronics Inc. | Light emitting device package and method for manufacturing the same |
KR100866879B1 (ko) * | 2006-12-19 | 2008-11-04 | 엘지전자 주식회사 | 발광 소자 패키지 및 그 제조방법 |
US7439548B2 (en) * | 2006-08-11 | 2008-10-21 | Bridgelux, Inc | Surface mountable chip |
JP4855869B2 (ja) * | 2006-08-25 | 2012-01-18 | 日亜化学工業株式会社 | 発光装置の製造方法 |
JP4650378B2 (ja) * | 2006-08-31 | 2011-03-16 | 日亜化学工業株式会社 | 発光装置の製造方法 |
US20080074574A1 (en) * | 2006-09-09 | 2008-03-27 | Topson Optoelectronics Semi-Conductor Co., Ltd. | Background light module with oval lenses |
JP4905009B2 (ja) * | 2006-09-12 | 2012-03-28 | 豊田合成株式会社 | 発光装置の製造方法 |
WO2008035283A2 (en) | 2006-09-22 | 2008-03-27 | Koninklijke Philips Electronics N.V. | Light emitting device with tension relaxation |
DE102007021009A1 (de) * | 2006-09-27 | 2008-04-10 | Osram Opto Semiconductors Gmbh | Leuchtdiodenanordnung und Verfahren zur Herstellung einer solchen |
US10873002B2 (en) * | 2006-10-20 | 2020-12-22 | Cree, Inc. | Permanent wafer bonding using metal alloy preform discs |
JP4905069B2 (ja) * | 2006-11-09 | 2012-03-28 | 豊田合成株式会社 | 発光装置及びその製造方法 |
JP2008124267A (ja) * | 2006-11-13 | 2008-05-29 | Toyoda Gosei Co Ltd | 発光装置 |
US7964892B2 (en) * | 2006-12-01 | 2011-06-21 | Nichia Corporation | Light emitting device |
KR100845856B1 (ko) * | 2006-12-21 | 2008-07-14 | 엘지전자 주식회사 | 발광 소자 패키지 및 그 제조방법 |
CN101257066B (zh) * | 2007-02-28 | 2011-11-23 | 宏齐科技股份有限公司 | 高散热的发光二极管制作方法及其结构 |
US8610143B2 (en) | 2007-03-12 | 2013-12-17 | Nichia Corporation | High output power light emitting device and package used therefor |
KR20080085399A (ko) * | 2007-03-19 | 2008-09-24 | 엘지이노텍 주식회사 | Led 모듈 및 이를 구비하는 백라이트 유닛 |
JP4266234B2 (ja) * | 2007-03-29 | 2009-05-20 | 株式会社東芝 | 半導体発光装置の製造方法 |
JP5104490B2 (ja) | 2007-04-16 | 2012-12-19 | 豊田合成株式会社 | 発光装置及びその製造方法 |
EP1983571B1 (en) | 2007-04-18 | 2019-01-02 | Nichia Corporation | Light emission device |
JP2008270563A (ja) * | 2007-04-20 | 2008-11-06 | Toyoda Gosei Co Ltd | 発光装置、光源装置及び発光装置の製造方法 |
EP2151872A4 (en) | 2007-05-30 | 2012-12-05 | Asahi Glass Co Ltd | Glass for covering an optical device, glass-sheathed light-emitting element and glass-sheathed light-emitting device |
JP5233170B2 (ja) * | 2007-05-31 | 2013-07-10 | 日亜化学工業株式会社 | 発光装置、発光装置を構成する樹脂成形体及びそれらの製造方法 |
JPWO2008152945A1 (ja) * | 2007-06-15 | 2010-08-26 | ローム株式会社 | 半導体発光装置及びその製造方法 |
KR101380385B1 (ko) * | 2007-06-29 | 2014-04-10 | 서울반도체 주식회사 | 일괄 봉지 기술을 이용하는 led 패키지 제조방법 |
KR20090015734A (ko) | 2007-08-09 | 2009-02-12 | 엘지이노텍 주식회사 | 광원 장치 |
JP5251038B2 (ja) | 2007-08-23 | 2013-07-31 | 豊田合成株式会社 | 発光装置 |
JP2009059883A (ja) * | 2007-08-31 | 2009-03-19 | Toyoda Gosei Co Ltd | 発光装置 |
JPWO2009031684A1 (ja) * | 2007-09-07 | 2010-12-16 | 旭硝子株式会社 | ガラス被覆発光素子及びガラス被覆発光装置 |
KR101381762B1 (ko) * | 2007-09-28 | 2014-04-10 | 삼성전자주식회사 | 발광 장치 |
DE102008005345A1 (de) * | 2007-09-28 | 2009-04-02 | Osram Opto Semiconductors Gmbh | Halbleiterbasiertes Bauelement, Aufnahme für ein halbleiterbasiertes Bauelement und Verfahren zur Herstellung eines halbleiterbasierten Bauelements |
CN101821867B (zh) * | 2007-10-23 | 2012-01-04 | 松下电器产业株式会社 | 半导体发光器件及使用它的半导体发光装置以及该半导体发光装置的制造方法 |
TWI358110B (en) * | 2007-10-26 | 2012-02-11 | Lite On Technology Corp | Light emitting diode |
CN101431132B (zh) * | 2007-11-07 | 2012-04-25 | 光宝科技股份有限公司 | 发光二极管 |
JP5109620B2 (ja) * | 2007-11-26 | 2012-12-26 | 豊田合成株式会社 | 発光装置、基板装置及び発光装置の製造方法 |
KR100998233B1 (ko) | 2007-12-03 | 2010-12-07 | 서울반도체 주식회사 | 슬림형 led 패키지 |
KR100922309B1 (ko) * | 2007-12-12 | 2009-10-21 | 앰코 테크놀로지 코리아 주식회사 | 웨이퍼 레벨 반도체 패키지 제조 방법 |
JP5311281B2 (ja) * | 2008-02-18 | 2013-10-09 | 日本電気硝子株式会社 | 波長変換部材およびその製造方法 |
DE102008021436A1 (de) * | 2008-04-29 | 2010-05-20 | Schott Ag | Optik-Konverter-System für (W)LEDs |
DE102008021435A1 (de) * | 2008-04-29 | 2009-11-19 | Schott Ag | Gehäuse für LEDs mit hoher Leistung |
CN101587887A (zh) * | 2008-05-23 | 2009-11-25 | 富准精密工业(深圳)有限公司 | 发光二极管结构 |
KR101438826B1 (ko) | 2008-06-23 | 2014-09-05 | 엘지이노텍 주식회사 | 발광장치 |
US8159131B2 (en) * | 2008-06-30 | 2012-04-17 | Bridgelux, Inc. | Light emitting device having a transparent thermally conductive layer |
TW201011936A (en) * | 2008-09-05 | 2010-03-16 | Advanced Optoelectronic Tech | Light emitting device and fabrication thereof |
US8008845B2 (en) * | 2008-10-24 | 2011-08-30 | Cree, Inc. | Lighting device which includes one or more solid state light emitting device |
JP5375041B2 (ja) | 2008-11-13 | 2013-12-25 | 日亜化学工業株式会社 | 発光装置およびその製造方法 |
TWI380483B (en) * | 2008-12-29 | 2012-12-21 | Everlight Electronics Co Ltd | Led device and method of packaging the same |
TWI473246B (zh) * | 2008-12-30 | 2015-02-11 | Epistar Corp | 發光二極體晶粒等級封裝 |
JP5061139B2 (ja) * | 2009-02-12 | 2012-10-31 | 株式会社住田光学ガラス | 発光装置の製造方法 |
KR101064026B1 (ko) * | 2009-02-17 | 2011-09-08 | 엘지이노텍 주식회사 | 발광 디바이스 패키지 및 그 제조방법 |
KR100969146B1 (ko) * | 2009-02-18 | 2010-07-08 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
US8642369B2 (en) * | 2009-03-03 | 2014-02-04 | Zn Technology, Inc. | Vertically structured LED by integrating nitride semiconductors with Zn(Mg,Cd,Be)O(S,Se) and method for making same |
JP5298987B2 (ja) | 2009-03-17 | 2013-09-25 | 豊田合成株式会社 | 発光装置および発光装置の製造方法 |
JP5327042B2 (ja) * | 2009-03-26 | 2013-10-30 | 豊田合成株式会社 | Ledランプの製造方法 |
JP5343831B2 (ja) * | 2009-04-16 | 2013-11-13 | 日亜化学工業株式会社 | 発光装置 |
JPWO2010131498A1 (ja) * | 2009-05-12 | 2012-11-01 | 三菱電機株式会社 | レーザダイオード素子 |
US20100320497A1 (en) * | 2009-06-18 | 2010-12-23 | Han-Ming Lee | LED bracket structure |
WO2010151600A1 (en) | 2009-06-27 | 2010-12-29 | Michael Tischler | High efficiency leds and led lamps |
JP5585013B2 (ja) | 2009-07-14 | 2014-09-10 | 日亜化学工業株式会社 | 発光装置 |
US8265487B2 (en) * | 2009-07-29 | 2012-09-11 | Avago Technologies Fiber Ip (Singapore) Pte. Ltd. | Half-duplex, single-fiber (S-F) optical transceiver module and method |
US20110209908A1 (en) * | 2009-08-06 | 2011-09-01 | Advanced Chip Engineering Technology Inc. | Conductor package structure and method of the same |
US20110180891A1 (en) * | 2009-08-06 | 2011-07-28 | Advanced Chip Engineering Technology Inc. | Conductor package structure and method of the same |
US9000466B1 (en) | 2010-08-23 | 2015-04-07 | Soraa, Inc. | Methods and devices for light extraction from a group III-nitride volumetric LED using surface and sidewall roughening |
US8933644B2 (en) | 2009-09-18 | 2015-01-13 | Soraa, Inc. | LED lamps with improved quality of light |
JP2011071272A (ja) | 2009-09-25 | 2011-04-07 | Toshiba Corp | 半導体発光装置及びその製造方法 |
CN102598322B (zh) * | 2009-10-29 | 2016-10-26 | 日亚化学工业株式会社 | 发光装置及其制造方法 |
TW201117428A (en) * | 2009-11-12 | 2011-05-16 | Ind Tech Res Inst | Method of manufacturing light emitting diode packaging |
JP5659519B2 (ja) * | 2009-11-19 | 2015-01-28 | 豊田合成株式会社 | 発光装置、発光装置の製造方法、発光装置の実装方法及び光源装置 |
US9420707B2 (en) | 2009-12-17 | 2016-08-16 | Intel Corporation | Substrate for integrated circuit devices including multi-layer glass core and methods of making the same |
US8207453B2 (en) | 2009-12-17 | 2012-06-26 | Intel Corporation | Glass core substrate for integrated circuit devices and methods of making the same |
US8545083B2 (en) * | 2009-12-22 | 2013-10-01 | Sumita Optical Glass, Inc. | Light-emitting device, light source and method of manufacturing the same |
US8653539B2 (en) | 2010-01-04 | 2014-02-18 | Cooledge Lighting, Inc. | Failure mitigation in arrays of light-emitting devices |
EP2526572B1 (en) | 2010-01-19 | 2019-08-14 | LG Innotek Co., Ltd. | Package and manufacturing method of the same |
TW201128756A (en) * | 2010-02-02 | 2011-08-16 | Forward Electronics Co Ltd | Semiconductor package structure |
US8905588B2 (en) | 2010-02-03 | 2014-12-09 | Sorra, Inc. | System and method for providing color light sources in proximity to predetermined wavelength conversion structures |
US10147850B1 (en) | 2010-02-03 | 2018-12-04 | Soraa, Inc. | System and method for providing color light sources in proximity to predetermined wavelength conversion structures |
KR101763972B1 (ko) * | 2010-02-09 | 2017-08-01 | 니치아 카가쿠 고교 가부시키가이샤 | 발광 장치 |
CN102157660A (zh) * | 2010-02-11 | 2011-08-17 | 福华电子股份有限公司 | 半导体封装结构 |
KR100986560B1 (ko) * | 2010-02-11 | 2010-10-07 | 엘지이노텍 주식회사 | 발광소자 및 그 제조방법 |
KR101020974B1 (ko) | 2010-03-17 | 2011-03-09 | 엘지이노텍 주식회사 | 발광 소자, 발광 소자 제조방법 및 발광 소자 패키지 |
TWI492422B (zh) | 2010-03-18 | 2015-07-11 | Everlight Electronics Co Ltd | 具有螢光粉層之發光二極體晶片的製作方法 |
US8486761B2 (en) * | 2010-03-25 | 2013-07-16 | Koninklijke Philips Electronics N.V. | Hybrid combination of substrate and carrier mounted light emitting devices |
US8319247B2 (en) * | 2010-03-25 | 2012-11-27 | Koninklijke Philips Electronics N.V. | Carrier for a light emitting device |
JP5515946B2 (ja) * | 2010-03-29 | 2014-06-11 | コニカミノルタ株式会社 | 発光ダイオードユニットの製造方法 |
JP5370238B2 (ja) * | 2010-03-30 | 2013-12-18 | 豊田合成株式会社 | 発光装置の製造方法 |
US8507940B2 (en) * | 2010-04-05 | 2013-08-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Heat dissipation by through silicon plugs |
CN102237455B (zh) * | 2010-04-27 | 2013-03-13 | 国立中央大学 | 发光二极管结构 |
JP5528900B2 (ja) | 2010-04-30 | 2014-06-25 | ローム株式会社 | 発光素子モジュール |
JP5449039B2 (ja) | 2010-06-07 | 2014-03-19 | 株式会社東芝 | 半導体発光装置及びその製造方法 |
JP5343040B2 (ja) * | 2010-06-07 | 2013-11-13 | 株式会社東芝 | 半導体発光装置 |
JP5759790B2 (ja) * | 2010-06-07 | 2015-08-05 | 株式会社東芝 | 半導体発光装置の製造方法 |
CN102959708B (zh) | 2010-06-29 | 2016-05-04 | 柯立芝照明有限公司 | 具有易弯曲基板的电子装置 |
US8901586B2 (en) * | 2010-07-12 | 2014-12-02 | Samsung Electronics Co., Ltd. | Light emitting device and method of manufacturing the same |
CN101980392B (zh) * | 2010-07-16 | 2013-10-23 | 宁波市瑞康光电有限公司 | 一种led封装方法、封装结构、led灯及照明设备 |
CN102959747A (zh) * | 2010-07-23 | 2013-03-06 | 夏普株式会社 | 发光装置及其制造方法 |
CN101931042B (zh) * | 2010-07-29 | 2012-12-12 | 江西省昌大光电科技有限公司 | Led电极引线的打线方法及封装结构和显示、发光器件 |
JP2012033823A (ja) * | 2010-08-02 | 2012-02-16 | Stanley Electric Co Ltd | 発光装置およびその製造方法 |
CN102347420A (zh) * | 2010-08-04 | 2012-02-08 | 展晶科技(深圳)有限公司 | 发光二极管制造方法 |
JP2012054270A (ja) | 2010-08-31 | 2012-03-15 | Toyoda Gosei Co Ltd | 発光装置の製造方法 |
JP2012064787A (ja) | 2010-09-16 | 2012-03-29 | Toyoda Gosei Co Ltd | 発光装置の製造方法 |
US9070851B2 (en) | 2010-09-24 | 2015-06-30 | Seoul Semiconductor Co., Ltd. | Wafer-level light emitting diode package and method of fabricating the same |
KR101144351B1 (ko) | 2010-09-30 | 2012-05-11 | 서울옵토디바이스주식회사 | 웨이퍼 레벨 발광다이오드 패키지 및 그 제조방법 |
JP5767062B2 (ja) * | 2010-09-30 | 2015-08-19 | 日東電工株式会社 | 発光ダイオード封止材、および、発光ダイオード装置の製造方法 |
TWI446590B (zh) | 2010-09-30 | 2014-07-21 | Everlight Electronics Co Ltd | 發光二極體封裝結構及其製作方法 |
TWI476965B (zh) * | 2010-10-22 | 2015-03-11 | Advanced Optoelectronic Tech | 發光二極體封裝結構 |
KR101707532B1 (ko) * | 2010-10-29 | 2017-02-16 | 엘지이노텍 주식회사 | 발광 소자 |
KR20120052160A (ko) * | 2010-11-15 | 2012-05-23 | 엔지케이 인슐레이터 엘티디 | 복합 기판 및 복합 기판의 제조 방법 |
US8896235B1 (en) | 2010-11-17 | 2014-11-25 | Soraa, Inc. | High temperature LED system using an AC power source |
KR101591991B1 (ko) | 2010-12-02 | 2016-02-05 | 삼성전자주식회사 | 발광소자 패키지 및 그 제조 방법 |
JP5693940B2 (ja) * | 2010-12-13 | 2015-04-01 | 株式会社トクヤマ | セラミックスビア基板、メタライズドセラミックスビア基板、これらの製造方法 |
CN102593302B (zh) * | 2011-01-10 | 2014-10-15 | 展晶科技(深圳)有限公司 | 发光二极管封装结构及其制造方法 |
TW201230417A (en) * | 2011-01-11 | 2012-07-16 | Lextar Electronics Corp | Leadframe, packaging cup incorporating the leadframe and light emitting diode lamp having the leadframe |
KR101766299B1 (ko) * | 2011-01-20 | 2017-08-08 | 삼성전자 주식회사 | 발광소자 패키지 및 그 제조 방법 |
KR101778161B1 (ko) * | 2011-01-26 | 2017-09-13 | 엘지이노텍 주식회사 | 발광소자 |
TWI462348B (zh) * | 2011-01-27 | 2014-11-21 | 矽品精密工業股份有限公司 | 發光裝置及其製法 |
KR101761834B1 (ko) * | 2011-01-28 | 2017-07-27 | 서울바이오시스 주식회사 | 웨이퍼 레벨 발광 다이오드 패키지 및 그것을 제조하는 방법 |
US8941137B2 (en) * | 2011-03-06 | 2015-01-27 | Mordehai MARGALIT | Light emitting diode package and method of manufacture |
TWI557953B (zh) * | 2011-03-25 | 2016-11-11 | 鴻海精密工業股份有限公司 | 發光二極體覆晶封裝結構及其製造方法 |
JP2012212733A (ja) | 2011-03-30 | 2012-11-01 | Toyoda Gosei Co Ltd | 発光装置 |
US20130062633A1 (en) * | 2011-04-18 | 2013-03-14 | Randolph Cary Demuynck | LED Array Having Embedded LED and Method Therefor |
US9245874B2 (en) | 2011-04-18 | 2016-01-26 | Cree, Inc. | LED array having embedded LED and method therefor |
US8901578B2 (en) | 2011-05-10 | 2014-12-02 | Rohm Co., Ltd. | LED module having LED chips as light source |
JP2013033890A (ja) | 2011-08-03 | 2013-02-14 | Toyoda Gosei Co Ltd | 発光装置 |
CN102280563A (zh) * | 2011-08-08 | 2011-12-14 | 上海理工大学 | 一种高功率led柔性封装 |
US9488324B2 (en) | 2011-09-02 | 2016-11-08 | Soraa, Inc. | Accessories for LED lamp systems |
US9117941B2 (en) * | 2011-09-02 | 2015-08-25 | King Dragon International Inc. | LED package and method of the same |
US20150001570A1 (en) * | 2011-09-02 | 2015-01-01 | King Dragon International Inc. | LED Package and Method of the Same |
JP2013077798A (ja) | 2011-09-14 | 2013-04-25 | Toyoda Gosei Co Ltd | ガラス封止ledランプ及びその製造方法 |
TWI455381B (zh) * | 2011-09-15 | 2014-10-01 | Lextar Electronics Corp | 半導體發光元件的封裝結構 |
JP2013069960A (ja) * | 2011-09-26 | 2013-04-18 | Toyoda Gosei Co Ltd | 発光装置および発光装置の製造方法 |
CN103137843A (zh) * | 2011-11-24 | 2013-06-05 | 展晶科技(深圳)有限公司 | 发光二极管装置 |
TWI484674B (zh) * | 2011-12-08 | 2015-05-11 | Genesis Photonics Inc | 電子元件 |
JP2013153051A (ja) * | 2012-01-25 | 2013-08-08 | Tokuyama Corp | メタライズドセラミックスビア基板及びその製造方法 |
JP6207402B2 (ja) | 2012-02-02 | 2017-10-04 | シチズン時計株式会社 | 発光装置 |
KR101273363B1 (ko) * | 2012-02-24 | 2013-06-17 | 크루셜텍 (주) | 글래스와 사파이어가 일체화된 led 모듈 제조용 기판 및 이를 이용한 led 모듈, 그리고 그 led 모듈 제조방법 |
WO2013133827A1 (en) | 2012-03-07 | 2013-09-12 | Intel Corporation | Glass clad microelectronic substrate |
US20130242538A1 (en) * | 2012-03-13 | 2013-09-19 | Shenzhen China Star Optoelectronics Technology Co Ltd. | Led light bar and backlight module |
KR101873220B1 (ko) | 2012-03-14 | 2018-07-05 | 삼성전자주식회사 | 발광소자 모듈을 위한 발광소자 접합 방법 |
JP5776599B2 (ja) * | 2012-03-26 | 2015-09-09 | 東芝ライテック株式会社 | 発光モジュール及び照明装置 |
US10222032B2 (en) | 2012-03-30 | 2019-03-05 | Cree, Inc. | Light emitter components and methods having improved electrical contacts |
US9735198B2 (en) * | 2012-03-30 | 2017-08-15 | Cree, Inc. | Substrate based light emitter devices, components, and related methods |
CN103363363B (zh) * | 2012-03-30 | 2016-03-23 | 展晶科技(深圳)有限公司 | 发光二极管灯条 |
KR101891257B1 (ko) * | 2012-04-02 | 2018-08-24 | 삼성전자주식회사 | 반도체 발광장치 및 그 제조방법 |
KR101291092B1 (ko) * | 2012-04-06 | 2013-08-01 | 주식회사 씨티랩 | 반도체 소자 구조물을 제조하는 방법 |
WO2013151390A1 (ko) * | 2012-04-06 | 2013-10-10 | 주식회사 씨티랩 | 반도체 소자 구조물을 제조하는 방법 |
WO2013151391A1 (ko) * | 2012-04-06 | 2013-10-10 | 주식회사 씨티랩 | 반도체 소자 구조물을 제조하는 방법 및 이를 이용한 반도체 소자 구조물 |
KR101360324B1 (ko) * | 2013-01-23 | 2014-02-11 | 주식회사 씨티랩 | 반도체 소자 구조물을 제조하는 방법 |
WO2013151387A1 (ko) * | 2012-04-06 | 2013-10-10 | 주식회사 씨티랩 | 반도체 소자 구조물을 제조하는 방법 |
US8985794B1 (en) | 2012-04-17 | 2015-03-24 | Soraa, Inc. | Providing remote blue phosphors in an LED lamp |
JP6135213B2 (ja) * | 2012-04-18 | 2017-05-31 | 日亜化学工業株式会社 | 半導体発光素子 |
TW201344979A (zh) * | 2012-04-27 | 2013-11-01 | Delta Electronics Inc | 發光裝置及其製造方法 |
US8735189B2 (en) * | 2012-05-17 | 2014-05-27 | Starlite LED Inc | Flip light emitting diode chip and method of fabricating the same |
US10439112B2 (en) * | 2012-05-31 | 2019-10-08 | Cree, Inc. | Light emitter packages, systems, and methods having improved performance |
US8877561B2 (en) | 2012-06-07 | 2014-11-04 | Cooledge Lighting Inc. | Methods of fabricating wafer-level flip chip device packages |
TW201405861A (zh) * | 2012-07-09 | 2014-02-01 | Ceramtec Gmbh | Led用途之反射光的基材 |
JP5609925B2 (ja) | 2012-07-09 | 2014-10-22 | 日亜化学工業株式会社 | 発光装置 |
DE102012213343B4 (de) | 2012-07-30 | 2023-08-03 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | VERFAHREN ZUM HERSTELLEN EINES OPTOELEKTRONISCHES HALBLEITERBAUTEILs MIT SAPHIR-FLIP-CHIP |
KR20140020446A (ko) * | 2012-08-08 | 2014-02-19 | 삼성디스플레이 주식회사 | 백라이트 어셈블리 및 이를 갖는 표시 장치 |
JP5792694B2 (ja) * | 2012-08-14 | 2015-10-14 | 株式会社東芝 | 半導体発光素子 |
US9001520B2 (en) * | 2012-09-24 | 2015-04-07 | Intel Corporation | Microelectronic structures having laminated or embedded glass routing structures for high density packaging |
US9978904B2 (en) | 2012-10-16 | 2018-05-22 | Soraa, Inc. | Indium gallium nitride light emitting devices |
US9159699B2 (en) * | 2012-11-13 | 2015-10-13 | Delta Electronics, Inc. | Interconnection structure having a via structure |
US9209164B2 (en) | 2012-11-13 | 2015-12-08 | Delta Electronics, Inc. | Interconnection structure of package structure and method of forming the same |
US9761763B2 (en) | 2012-12-21 | 2017-09-12 | Soraa, Inc. | Dense-luminescent-materials-coated violet LEDs |
DE102012113014A1 (de) * | 2012-12-21 | 2014-06-26 | Epcos Ag | Bauelementträger und Bauelementträgeranordnung |
EP2954566B1 (en) * | 2013-02-11 | 2020-04-08 | Lumileds Holding B.V. | Led module with hermetic seal of wavelength conversion material |
TWI483434B (zh) * | 2013-02-18 | 2015-05-01 | Lextar Electronics Corp | 發光二極體的轉置基材與使用該轉置基材的發光裝置製造方法 |
JP2014175354A (ja) * | 2013-03-06 | 2014-09-22 | Disco Abrasive Syst Ltd | 発光ダイオード |
TWI651871B (zh) * | 2013-06-27 | 2019-02-21 | 晶元光電股份有限公司 | 發光組件及製作方法 |
CN104282817B (zh) * | 2013-07-01 | 2019-08-06 | 晶元光电股份有限公司 | 发光二极管组件及制作方法 |
US8994033B2 (en) | 2013-07-09 | 2015-03-31 | Soraa, Inc. | Contacts for an n-type gallium and nitrogen substrate for optical devices |
CN105580144B (zh) * | 2013-07-24 | 2019-08-02 | 晶元光电股份有限公司 | 包含波长转换材料的发光管芯及相关方法 |
KR102096053B1 (ko) * | 2013-07-25 | 2020-04-02 | 삼성디스플레이 주식회사 | 유기발광표시장치의 제조방법 |
JP2015028997A (ja) * | 2013-07-30 | 2015-02-12 | 日亜化学工業株式会社 | 発光装置及びその製造方法 |
KR102135352B1 (ko) * | 2013-08-20 | 2020-07-17 | 엘지전자 주식회사 | 표시장치 |
US9419189B1 (en) | 2013-11-04 | 2016-08-16 | Soraa, Inc. | Small LED source with high brightness and high efficiency |
US10403801B2 (en) * | 2013-11-13 | 2019-09-03 | Rohinni, LLC | Substrate insert molding with deposited light-generating sources |
JP2015103561A (ja) * | 2013-11-21 | 2015-06-04 | パナソニックIpマネジメント株式会社 | 発光装置 |
KR102075984B1 (ko) * | 2013-12-06 | 2020-02-11 | 삼성전자주식회사 | 반도체 발광소자 및 이를 구비한 반도체 발광장치 |
JP2015207754A (ja) * | 2013-12-13 | 2015-11-19 | 日亜化学工業株式会社 | 発光装置 |
TW201526310A (zh) * | 2013-12-20 | 2015-07-01 | Genesis Photonics Inc | 發光二極體之封裝結構 |
JP6428249B2 (ja) | 2013-12-25 | 2018-11-28 | 日亜化学工業株式会社 | 発光装置 |
TWI609151B (zh) * | 2014-02-25 | 2017-12-21 | 綠點高新科技股份有限公司 | Lighting device and its manufacturing method |
JP2015173177A (ja) * | 2014-03-11 | 2015-10-01 | 株式会社東芝 | 半導体発光素子 |
CN104104009B (zh) * | 2014-07-08 | 2017-12-01 | 北京工业大学 | 一种p型金属电极制备焊料的半导体激光器 |
US9930750B2 (en) * | 2014-08-20 | 2018-03-27 | Lumens Co., Ltd. | Method for manufacturing light-emitting device packages, light-emitting device package strip, and light-emitting device package |
CN113380928B (zh) * | 2014-10-22 | 2024-07-12 | 波主有限公司 | 半导体装置的制造方法 |
JP6518936B2 (ja) * | 2014-11-14 | 2019-05-29 | パナソニックIpマネジメント株式会社 | 部品実装装置 |
JP6555907B2 (ja) * | 2015-03-16 | 2019-08-07 | アルパッド株式会社 | 半導体発光装置 |
DE112016001935T5 (de) * | 2015-04-27 | 2018-02-15 | Citizen Electronics Co., Ltd. | LED-Baugruppe, Licht emittierende Vorrichtung und Verfahren zur Herstellung der LED-Baugruppe |
KR20180013907A (ko) * | 2015-05-28 | 2018-02-07 | 스미또모 가가꾸 가부시키가이샤 | Led 디바이스, led 모듈 및 자외선 발광 장치 |
KR102346643B1 (ko) | 2015-06-30 | 2022-01-03 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 발광 소자, 발광 소자 제조방법 및 발광 모듈 |
US10170455B2 (en) * | 2015-09-04 | 2019-01-01 | PlayNitride Inc. | Light emitting device with buffer pads |
US10627672B2 (en) * | 2015-09-22 | 2020-04-21 | Samsung Electronics Co., Ltd. | LED package, backlight unit and illumination device including same, and liquid crystal display including backlight unit |
KR20170036243A (ko) * | 2015-09-24 | 2017-04-03 | 삼성전자주식회사 | 발광 소자 실장 기판 및 이를 이용한 발광 패키지, 상기 발광 소자 실장 기판의 제조 방법 및 이를 이용한 발광 장치 제조 방법 |
KR102413224B1 (ko) | 2015-10-01 | 2022-06-24 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 발광 소자, 발광 소자 제조방법 및 발광 모듈 |
JP2017073411A (ja) * | 2015-10-05 | 2017-04-13 | ソニー株式会社 | 発光装置 |
US9954133B1 (en) * | 2016-01-15 | 2018-04-24 | Hrl Laboratories, Llc | P-type chalcogenide and N-type silicon heterojunction infrared photodiodes and method of manufacturing thereof |
US10797209B2 (en) * | 2016-02-05 | 2020-10-06 | Maven Optronics Co., Ltd. | Light emitting device with beam shaping structure and manufacturing method of the same |
CN109196667B (zh) * | 2016-03-07 | 2022-02-25 | 世迈克琉明有限公司 | 半导体发光元件及其制造方法 |
JP6547661B2 (ja) * | 2016-03-09 | 2019-07-24 | 豊田合成株式会社 | 発光装置 |
CN205944139U (zh) | 2016-03-30 | 2017-02-08 | 首尔伟傲世有限公司 | 紫外线发光二极管封装件以及包含此的发光二极管模块 |
JP6771308B2 (ja) | 2016-05-02 | 2020-10-21 | 三菱電機株式会社 | 回路基板および半導体集積回路の実装構造 |
US9754914B1 (en) * | 2016-05-10 | 2017-09-05 | Rosemount Aerospace Inc. | Method to provide die attach stress relief using gold stud bumps |
KR102708997B1 (ko) * | 2017-01-10 | 2024-09-25 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 반도체 소자 패키지 및 그 제조 방법 |
TWI620352B (zh) * | 2017-01-20 | 2018-04-01 | 大光能源科技有限公司 | 覆晶發光二極體及其製造方法 |
KR102369820B1 (ko) * | 2017-03-22 | 2022-03-03 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 반도체 소자 패키지 및 조명 시스템 |
US10672957B2 (en) | 2017-07-19 | 2020-06-02 | Cree, Inc. | LED apparatuses and methods for high lumen output density |
JP6960268B2 (ja) * | 2017-07-26 | 2021-11-05 | 旭化成株式会社 | 半導体発光装置 |
US10559723B2 (en) * | 2017-08-25 | 2020-02-11 | Rohm Co., Ltd. | Optical device |
JP7012489B2 (ja) * | 2017-09-11 | 2022-01-28 | ローム株式会社 | 半導体装置 |
KR102111642B1 (ko) * | 2018-05-02 | 2020-05-15 | 주식회사 세미콘라이트 | 반도체 발광소자 |
US20190267525A1 (en) | 2018-02-26 | 2019-08-29 | Semicon Light Co., Ltd. | Semiconductor Light Emitting Devices And Method Of Manufacturing The Same |
KR102121409B1 (ko) * | 2018-05-02 | 2020-06-10 | 주식회사 세미콘라이트 | 반도체 발광소자 |
CN109461805B (zh) * | 2018-03-07 | 2021-08-10 | 普瑞光电股份有限公司 | 具有位于包含荧光体的玻璃转换板上的玻璃透镜的汽车led光源 |
KR102513954B1 (ko) * | 2018-05-10 | 2023-03-27 | 주식회사 루멘스 | 박막 패드를 구비하는 발광 소자 패키지 및 그 제조 방법 |
US12034015B2 (en) | 2018-05-25 | 2024-07-09 | Meta Platforms Technologies, Llc | Programmable pixel array |
US11174157B2 (en) * | 2018-06-27 | 2021-11-16 | Advanced Semiconductor Engineering Inc. | Semiconductor device packages and methods of manufacturing the same |
KR102557981B1 (ko) | 2018-08-20 | 2023-07-24 | 삼성디스플레이 주식회사 | 발광 장치, 그의 제조 방법, 및 이를 구비한 표시 장치 |
KR102654494B1 (ko) * | 2018-09-03 | 2024-04-04 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 반도체 소자 패키지 |
US10810932B2 (en) * | 2018-10-02 | 2020-10-20 | Sct Ltd. | Molded LED display module and method of making thererof |
US11888002B2 (en) | 2018-12-17 | 2024-01-30 | Meta Platforms Technologies, Llc | Dynamically programmable image sensor |
US11962928B2 (en) | 2018-12-17 | 2024-04-16 | Meta Platforms Technologies, Llc | Programmable pixel array |
JP7071648B2 (ja) | 2019-05-16 | 2022-05-19 | 日亜化学工業株式会社 | 発光装置及び発光装置の製造方法 |
JP7226131B2 (ja) * | 2019-06-25 | 2023-02-21 | 豊田合成株式会社 | 発光装置及びその製造方法 |
US12108141B2 (en) | 2019-08-05 | 2024-10-01 | Meta Platforms Technologies, Llc | Dynamically programmable image sensor |
US11935291B2 (en) | 2019-10-30 | 2024-03-19 | Meta Platforms Technologies, Llc | Distributed sensor system |
US11948089B2 (en) | 2019-11-07 | 2024-04-02 | Meta Platforms Technologies, Llc | Sparse image sensing and processing |
US11362251B2 (en) | 2019-12-02 | 2022-06-14 | Facebook Technologies, Llc | Managing thermal resistance and planarity of a display package |
TW202137483A (zh) | 2019-12-12 | 2021-10-01 | 立陶宛商布羅利思感測科技公司 | 用於發光及偵測之具有平面外配置之光學裝置 |
JP7117684B2 (ja) * | 2020-01-31 | 2022-08-15 | 日亜化学工業株式会社 | 面状光源の製造方法 |
US11592166B2 (en) | 2020-05-12 | 2023-02-28 | Feit Electric Company, Inc. | Light emitting device having improved illumination and manufacturing flexibility |
US11825228B2 (en) | 2020-05-20 | 2023-11-21 | Meta Platforms Technologies, Llc | Programmable pixel array having multiple power domains |
DE102020114368A1 (de) * | 2020-05-28 | 2021-12-02 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronisches halbleiterbauteil und verfahren zur herstellung von optoelektronischen halbleiterbauteilen |
KR20230019404A (ko) * | 2020-06-03 | 2023-02-08 | 니치아 카가쿠 고교 가부시키가이샤 | 면상 광원 및 그 제조 방법 |
US11876042B2 (en) | 2020-08-03 | 2024-01-16 | Feit Electric Company, Inc. | Omnidirectional flexible light emitting device |
US12075175B1 (en) | 2020-09-08 | 2024-08-27 | Meta Platforms Technologies, Llc | Programmable smart sensor with adaptive readout |
US11935844B2 (en) * | 2020-12-31 | 2024-03-19 | Texas Instruments Incorporated | Semiconductor device and method of the same |
CN113327759B (zh) * | 2021-05-30 | 2022-11-15 | 南京工业职业技术大学 | 一种基于宽禁带异质结结构的平面变压器 |
JP7545085B2 (ja) | 2022-01-07 | 2024-09-04 | 日亜化学工業株式会社 | 発光装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11177129A (ja) * | 1997-12-16 | 1999-07-02 | Rohm Co Ltd | チップ型led、ledランプおよびledディスプレイ |
JP2002094123A (ja) * | 2000-09-14 | 2002-03-29 | Citizen Electronics Co Ltd | 表面実装型発光ダイオード及びその製造方法 |
JP2002134792A (ja) * | 2000-10-25 | 2002-05-10 | Matsushita Electric Ind Co Ltd | 白色半導体発光装置の製造方法 |
Family Cites Families (145)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2801375A (en) * | 1955-08-01 | 1957-07-30 | Westinghouse Electric Corp | Silicon semiconductor devices and processes for making them |
DE1252806B (de) * | 1963-12-23 | 1967-10-26 | Nippon Electric Co | In Glas eingeschmolzenes Halbleiterbauelement und Verfahren zu dessen Herstellung |
US3615319A (en) * | 1967-12-11 | 1971-10-26 | Anchor Hocking Corp | Ion exchange strengthening of glasses with lithium vapor |
GB1163258A (en) * | 1968-08-15 | 1969-09-04 | Standard Telephones Cables Ltd | Diode Lamp |
US3596136A (en) * | 1969-05-13 | 1971-07-27 | Rca Corp | Optical semiconductor device with glass dome |
US3723835A (en) * | 1971-07-28 | 1973-03-27 | Motorola Inc | Glasses for encapsulating semiconductor devices |
JPS5227995B2 (ko) * | 1971-08-18 | 1977-07-23 | ||
JPS5429866B2 (ko) | 1972-03-03 | 1979-09-26 | ||
JPS4953387A (ko) * | 1972-09-27 | 1974-05-23 | ||
US4018613A (en) * | 1976-02-06 | 1977-04-19 | Corning Glass Works | Diode encapsulation glass |
US4129692A (en) * | 1976-03-11 | 1978-12-12 | Chloride Group Limited | Electric storage batteries |
JPS5433683A (en) * | 1977-07-08 | 1979-03-12 | Hitachi Ltd | Air seal mounting for light emitting element |
US4186023A (en) * | 1978-05-01 | 1980-01-29 | Technology Glass Corporation | Sealing glass composition |
KR860001491B1 (ko) | 1981-10-30 | 1986-09-27 | 코오닝 그라아스 와아크스 | 정밀유리제품의 성형방법 |
EP0109073B1 (en) * | 1982-11-11 | 1988-04-13 | Showa Denko Kabushiki Kaisha | Polymerizable compositions |
JPS59191388A (ja) * | 1983-04-14 | 1984-10-30 | Victor Co Of Japan Ltd | 半導体装置 |
CA1207421A (en) * | 1983-11-14 | 1986-07-08 | Ottilia F. Toth | High efficiency stable cds cu.sub.2s solar cells manufacturing process using thick film methodology |
US4680617A (en) * | 1984-05-23 | 1987-07-14 | Ross Milton I | Encapsulated electronic circuit device, and method and apparatus for making same |
US4872825A (en) * | 1984-05-23 | 1989-10-10 | Ross Milton I | Method and apparatus for making encapsulated electronic circuit devices |
JPS6167971A (ja) * | 1984-09-11 | 1986-04-08 | Nec Corp | Dhd型発光ダイオ−ド |
JPS6196780A (ja) | 1984-10-17 | 1986-05-15 | Stanley Electric Co Ltd | Ledチツプのコ−テイング方法 |
DE3442131A1 (de) * | 1984-11-17 | 1986-05-22 | Messerschmitt-Bölkow-Blohm GmbH, 8012 Ottobrunn | Verfahren zum einkapseln von mikroelektronischen halbleiter- und schichtschaltungen |
JPS6331557A (ja) | 1986-07-23 | 1988-02-10 | 川崎重工業株式会社 | 振動ミル |
JPS6331557U (ko) * | 1986-08-14 | 1988-03-01 | ||
JPS6367792A (ja) | 1986-09-09 | 1988-03-26 | Fujitsu Ltd | 光電子部品の実装構造 |
US4940677A (en) * | 1988-10-17 | 1990-07-10 | Corning Incorporated | Zinc-containing phosphate glasses |
US5022921A (en) * | 1990-10-19 | 1991-06-11 | Corning Incorporated | Phosphate glasses for glass molds |
US5122484A (en) * | 1991-05-23 | 1992-06-16 | Corning Incorporated | Zinc phosphate low temperature glasses |
JPH05315652A (ja) | 1992-04-02 | 1993-11-26 | Nec Corp | 光半導体装置 |
JPH05343744A (ja) | 1992-06-05 | 1993-12-24 | Nisshin Steel Co Ltd | ダイボンド型発光ダイオード及びその製造方法 |
WO1994001794A1 (en) * | 1992-07-14 | 1994-01-20 | Seiko Epson Corporation | Polarizing element and optical element, and optical head |
JPH06289321A (ja) | 1993-04-01 | 1994-10-18 | Seiko Epson Corp | 検光子及び光学素子及び受光素子及び光ヘッド及び光磁気信号検出手段及び位置誤差信号検出手段及び光学素子製造方法 |
US5485037A (en) * | 1993-04-12 | 1996-01-16 | Amkor Electronics, Inc. | Semiconductor device having a thermal dissipator and electromagnetic shielding |
US5641997A (en) * | 1993-09-14 | 1997-06-24 | Kabushiki Kaisha Toshiba | Plastic-encapsulated semiconductor device |
JP3287436B2 (ja) | 1993-09-27 | 2002-06-04 | キヤノン株式会社 | 半導体装置の作製方法 |
US5391523A (en) * | 1993-10-27 | 1995-02-21 | Marlor; Richard C. | Electric lamp with lead free glass |
JP3150025B2 (ja) | 1993-12-16 | 2001-03-26 | シャープ株式会社 | 発光ダイオードの製造方法 |
US5478402A (en) * | 1994-02-17 | 1995-12-26 | Ase Americas, Inc. | Solar cell modules and method of making same |
US5476553A (en) * | 1994-02-18 | 1995-12-19 | Ase Americas, Inc. | Solar cell modules and method of making same |
JP3329573B2 (ja) | 1994-04-18 | 2002-09-30 | 日亜化学工業株式会社 | Ledディスプレイ |
US5607886A (en) * | 1994-05-20 | 1997-03-04 | Kabushiki Kaisya Ohara | Optical glass for mold pressing having softening capability at low temperature |
US5814533A (en) * | 1994-08-09 | 1998-09-29 | Rohm Co., Ltd. | Semiconductor light emitting element and manufacturing method therefor |
JP2600616B2 (ja) * | 1994-09-08 | 1997-04-16 | 日本電気株式会社 | 光結合装置 |
US5873921A (en) * | 1994-09-09 | 1999-02-23 | Hoya Precisions Inc. | Process for manufacturing glass optical elements |
JPH08102553A (ja) | 1994-09-30 | 1996-04-16 | Rohm Co Ltd | 素子封止型発光デバイス |
JP3127195B2 (ja) | 1994-12-06 | 2001-01-22 | シャープ株式会社 | 発光デバイスおよびその製造方法 |
DE19508222C1 (de) * | 1995-03-08 | 1996-06-05 | Siemens Ag | Optoelektronischer Wandler und Herstellverfahren |
JPH08250771A (ja) | 1995-03-08 | 1996-09-27 | Hiyoshi Denshi Kk | 発光色可変led装置およびled発光色制御装置 |
JP3420399B2 (ja) * | 1995-07-28 | 2003-06-23 | キヤノン株式会社 | 発光素子 |
JP3656316B2 (ja) | 1996-04-09 | 2005-06-08 | 日亜化学工業株式会社 | チップタイプled及びその製造方法 |
BRPI9715293B1 (pt) * | 1996-06-26 | 2016-11-01 | Osram Ag | elemento de cobertura para um elemento de construção optoeletrônico |
TW383508B (en) * | 1996-07-29 | 2000-03-01 | Nichia Kagaku Kogyo Kk | Light emitting device and display |
US6096155A (en) * | 1996-09-27 | 2000-08-01 | Digital Optics Corporation | Method of dicing wafer level integrated multiple optical elements |
JP3672280B2 (ja) | 1996-10-29 | 2005-07-20 | 株式会社シチズン電子 | スルーホール電極付き電子部品の製造方法 |
JPH10190190A (ja) * | 1996-10-31 | 1998-07-21 | Hoya Corp | 基板およびその製造方法 |
JP2762993B2 (ja) * | 1996-11-19 | 1998-06-11 | 日本電気株式会社 | 発光装置及びその製造方法 |
US6274890B1 (en) * | 1997-01-15 | 2001-08-14 | Kabushiki Kaisha Toshiba | Semiconductor light emitting device and its manufacturing method |
JPH118414A (ja) * | 1997-06-18 | 1999-01-12 | Sony Corp | 半導体装置および半導体発光装置 |
JP3257455B2 (ja) | 1997-07-17 | 2002-02-18 | 松下電器産業株式会社 | 発光装置 |
US5962971A (en) * | 1997-08-29 | 1999-10-05 | Chen; Hsing | LED structure with ultraviolet-light emission chip and multilayered resins to generate various colored lights |
US6340824B1 (en) * | 1997-09-01 | 2002-01-22 | Kabushiki Kaisha Toshiba | Semiconductor light emitting device including a fluorescent material |
US6163106A (en) * | 1997-09-09 | 2000-12-19 | Asahi Glass Company Ltd. | Color cathode ray tube and water resistant glass frit |
JPH11116275A (ja) | 1997-10-13 | 1999-04-27 | Ohara Inc | 低温封着用組成物 |
DE19751911A1 (de) * | 1997-11-22 | 1999-06-02 | Vishay Semiconductor Gmbh | Leuchtdiode mit einem hermetisch dichten Gehäuse und Verfahren zu deren Herstellung |
JP2924961B1 (ja) | 1998-01-16 | 1999-07-26 | サンケン電気株式会社 | 半導体発光装置及びその製法 |
DE19803936A1 (de) * | 1998-01-30 | 1999-08-05 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Ausdehnungskompensiertes optoelektronisches Halbleiter-Bauelement, insbesondere UV-emittierende Leuchtdiode und Verfahren zu seiner Herstellung |
JP3500304B2 (ja) | 1998-04-23 | 2004-02-23 | 京セラ株式会社 | 半導体素子支持部材及びこれを用いた半導体素子収納用パッケージ |
JP2000147750A (ja) | 1998-11-18 | 2000-05-26 | Mitsui Chemicals Inc | ペリクル |
JP3367096B2 (ja) | 1999-02-02 | 2003-01-14 | 日亜化学工業株式会社 | 発光ダイオードの形成方法 |
KR100434977B1 (ko) * | 1999-02-12 | 2004-06-09 | 도판 인사츠 가부시키가이샤 | 플라즈마 디스플레이 패널, 그 제조방법 및 그 제조장치 |
JP4262818B2 (ja) * | 1999-02-22 | 2009-05-13 | 株式会社東芝 | 鉄−ニッケル系合金部材およびガラス封止部品 |
US6521916B2 (en) * | 1999-03-15 | 2003-02-18 | Gentex Corporation | Radiation emitter device having an encapsulant with different zones of thermal conductivity |
JP2000340876A (ja) | 1999-03-23 | 2000-12-08 | Furukawa Electric Co Ltd:The | 光半導体素子用パッケージおよびその製造方法 |
US6306331B1 (en) * | 1999-03-24 | 2001-10-23 | International Business Machines Corporation | Ultra mold for encapsulating very thin packages |
JP3503131B2 (ja) * | 1999-06-03 | 2004-03-02 | サンケン電気株式会社 | 半導体発光装置 |
JP3723698B2 (ja) | 1999-06-30 | 2005-12-07 | 京セラ株式会社 | 光素子キャリア及びその実装構造 |
JP3540215B2 (ja) * | 1999-09-29 | 2004-07-07 | 株式会社東芝 | エポキシ樹脂組成物及び樹脂封止型半導体装置 |
JP2000233939A (ja) * | 1999-11-26 | 2000-08-29 | Asahi Techno Glass Corp | 固体撮像素子パッケージ用窓ガラス |
TW465123B (en) | 2000-02-02 | 2001-11-21 | Ind Tech Res Inst | High power white light LED |
US6534346B2 (en) * | 2000-05-16 | 2003-03-18 | Nippon Electric Glass Co., Ltd. | Glass and glass tube for encapsulating semiconductors |
JP4601128B2 (ja) | 2000-06-26 | 2010-12-22 | 株式会社光波 | Led光源およびその製造方法 |
JP4239439B2 (ja) * | 2000-07-06 | 2009-03-18 | セイコーエプソン株式会社 | 光学装置およびその製造方法ならびに光伝送装置 |
TW459403B (en) * | 2000-07-28 | 2001-10-11 | Lee Jeong Hoon | White light-emitting diode |
JP2002055211A (ja) | 2000-08-10 | 2002-02-20 | Sony Corp | マイクロプリズムおよび光学素子の製造方法 |
JP3425750B2 (ja) | 2000-09-05 | 2003-07-14 | 日本電気硝子株式会社 | 封着材料 |
JP4763122B2 (ja) | 2000-09-20 | 2011-08-31 | スタンレー電気株式会社 | 発光ダイオード及びその製造方法 |
JP2002134821A (ja) | 2000-10-23 | 2002-05-10 | Furukawa Electric Co Ltd:The | 光素子用容器およびその製造方法 |
JP5110744B2 (ja) * | 2000-12-21 | 2012-12-26 | フィリップス ルミレッズ ライティング カンパニー リミテッド ライアビリティ カンパニー | 発光装置及びその製造方法 |
JP2002299694A (ja) | 2001-03-29 | 2002-10-11 | Mitsubishi Electric Lighting Corp | 照明用led光源デバイス及び照明器具 |
US6417019B1 (en) * | 2001-04-04 | 2002-07-09 | Lumileds Lighting, U.S., Llc | Phosphor converted light emitting diode |
DE10118630A1 (de) * | 2001-04-12 | 2002-10-17 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren zur Herstellung eines optoelektronischen Halbleiter-Bauelements |
US6686676B2 (en) * | 2001-04-30 | 2004-02-03 | General Electric Company | UV reflectors and UV-based light sources having reduced UV radiation leakage incorporating the same |
JP2002348133A (ja) | 2001-05-24 | 2002-12-04 | Canon Inc | 光学ガラス成形品および光学素子の製造方法 |
US6596195B2 (en) * | 2001-06-01 | 2003-07-22 | General Electric Company | Broad-spectrum terbium-containing garnet phosphors and white-light sources incorporating the same |
JP2002368277A (ja) | 2001-06-05 | 2002-12-20 | Rohm Co Ltd | チップ型半導体発光装置 |
JP4034589B2 (ja) * | 2001-06-06 | 2008-01-16 | 株式会社オハラ | 光学ガラス |
JP4114331B2 (ja) | 2001-06-15 | 2008-07-09 | 豊田合成株式会社 | 発光装置 |
JP2003008071A (ja) | 2001-06-22 | 2003-01-10 | Stanley Electric Co Ltd | Led基板アセンブリを使用したledランプ |
JP4789358B2 (ja) | 2001-07-03 | 2011-10-12 | 株式会社オハラ | 光学ガラス |
JP4067802B2 (ja) | 2001-09-18 | 2008-03-26 | 松下電器産業株式会社 | 照明装置 |
JP3948650B2 (ja) * | 2001-10-09 | 2007-07-25 | アバゴ・テクノロジーズ・イーシービーユー・アイピー(シンガポール)プライベート・リミテッド | 発光ダイオード及びその製造方法 |
CN1323441C (zh) | 2001-10-12 | 2007-06-27 | 日亚化学工业株式会社 | 发光装置及其制造方法 |
JP4058933B2 (ja) | 2001-10-26 | 2008-03-12 | 松下電工株式会社 | 高熱伝導性立体基板の製造方法 |
WO2003037813A1 (fr) * | 2001-10-30 | 2003-05-08 | Sumita Optical Glass,Inc. | Verre optique destine a la formation de moules |
US7595017B2 (en) * | 2002-01-31 | 2009-09-29 | Stmicroelectronics, Inc. | Method for using a pre-formed film in a transfer molding process for an integrated circuit |
JP2003273400A (ja) | 2002-03-14 | 2003-09-26 | Japan Science & Technology Corp | 半導体発光素子 |
CN100430456C (zh) * | 2002-03-22 | 2008-11-05 | 日亚化学工业株式会社 | 氮化物荧光体,其制造方法及发光装置 |
US6962834B2 (en) * | 2002-03-22 | 2005-11-08 | Stark David H | Wafer-level hermetic micro-device packages |
JP3707688B2 (ja) * | 2002-05-31 | 2005-10-19 | スタンレー電気株式会社 | 発光装置およびその製造方法 |
US6809471B2 (en) * | 2002-06-28 | 2004-10-26 | General Electric Company | Phosphors containing oxides of alkaline-earth and Group-IIIB metals and light sources incorporating the same |
KR101030068B1 (ko) | 2002-07-08 | 2011-04-19 | 니치아 카가쿠 고교 가부시키가이샤 | 질화물 반도체 소자의 제조방법 및 질화물 반도체 소자 |
JP2004071710A (ja) | 2002-08-02 | 2004-03-04 | Nippon Leiz Co Ltd | 光源装置の製造方法および該方法により製造された光源装置 |
JP2004171710A (ja) | 2002-11-22 | 2004-06-17 | Tdk Corp | 基材保持部材および光記録媒体製造装置 |
DE10259946A1 (de) * | 2002-12-20 | 2004-07-15 | Tews, Walter, Dipl.-Chem. Dr.rer.nat.habil. | Leuchtstoffe zur Konversion der ultravioletten oder blauen Emission eines lichtemittierenden Elementes in sichtbare weiße Strahlung mit sehr hoher Farbwiedergabe |
DE10259945A1 (de) * | 2002-12-20 | 2004-07-01 | Tews, Walter, Dipl.-Chem. Dr.rer.nat.habil. | Leuchtstoffe mit verlängerter Fluoreszenzlebensdauer |
US6998777B2 (en) * | 2002-12-24 | 2006-02-14 | Toyoda Gosei Co., Ltd. | Light emitting diode and light emitting diode array |
EP1455398A3 (en) * | 2003-03-03 | 2011-05-25 | Toyoda Gosei Co., Ltd. | Light emitting device comprising a phosphor layer and method of making same |
US7824937B2 (en) * | 2003-03-10 | 2010-11-02 | Toyoda Gosei Co., Ltd. | Solid element device and method for manufacturing the same |
JP2004273798A (ja) * | 2003-03-10 | 2004-09-30 | Toyoda Gosei Co Ltd | 発光デバイス |
JP4029843B2 (ja) * | 2004-01-19 | 2008-01-09 | 豊田合成株式会社 | 発光装置 |
US20040201990A1 (en) * | 2003-04-10 | 2004-10-14 | Meyer William E. | LED lamp |
JP2004356506A (ja) * | 2003-05-30 | 2004-12-16 | Stanley Electric Co Ltd | ガラス封止型発光ダイオード |
CN100511732C (zh) * | 2003-06-18 | 2009-07-08 | 丰田合成株式会社 | 发光器件 |
JP2003347586A (ja) | 2003-07-08 | 2003-12-05 | Toshiba Corp | 半導体発光素子 |
US7391153B2 (en) * | 2003-07-17 | 2008-06-24 | Toyoda Gosei Co., Ltd. | Light emitting device provided with a submount assembly for improved thermal dissipation |
JP2005070413A (ja) * | 2003-08-25 | 2005-03-17 | Alps Electric Co Ltd | ホルダ付光学素子及びその製造方法 |
KR100546372B1 (ko) * | 2003-08-28 | 2006-01-26 | 삼성전자주식회사 | 웨이퍼 레벨 칩 사이즈 패키지의 제조방법 |
US6842503B1 (en) * | 2003-09-02 | 2005-01-11 | Cisco Technology, Inc. | Support of TTY systems in voice over data networks |
DE112004002083T5 (de) * | 2003-10-31 | 2008-03-20 | Toyoda Gosei Co., Ltd. | Lichtemittierende Vorrichtung |
JP2005252219A (ja) * | 2004-02-06 | 2005-09-15 | Toyoda Gosei Co Ltd | 発光装置及び封止部材 |
US20050181128A1 (en) * | 2004-02-12 | 2005-08-18 | Nikolov Anguel N. | Films for optical use and methods of making such films |
US20050179049A1 (en) * | 2004-02-13 | 2005-08-18 | Ying-Ming Ho | Light emitting diode |
JP2006100787A (ja) * | 2004-08-31 | 2006-04-13 | Toyoda Gosei Co Ltd | 発光装置および発光素子 |
JP4254669B2 (ja) * | 2004-09-07 | 2009-04-15 | 豊田合成株式会社 | 発光装置 |
US7842526B2 (en) * | 2004-09-09 | 2010-11-30 | Toyoda Gosei Co., Ltd. | Light emitting device and method of producing same |
US7470926B2 (en) * | 2004-09-09 | 2008-12-30 | Toyoda Gosei Co., Ltd | Solid-state optical device |
JP4747726B2 (ja) * | 2004-09-09 | 2011-08-17 | 豊田合成株式会社 | 発光装置 |
US7417220B2 (en) * | 2004-09-09 | 2008-08-26 | Toyoda Gosei Co., Ltd. | Solid state device and light-emitting element |
JP2006156668A (ja) * | 2004-11-29 | 2006-06-15 | Nichia Chem Ind Ltd | 発光装置及びその製造方法 |
US20060171152A1 (en) * | 2005-01-20 | 2006-08-03 | Toyoda Gosei Co., Ltd. | Light emitting device and method of making the same |
JP2006310204A (ja) * | 2005-04-28 | 2006-11-09 | Toyoda Gosei Co Ltd | Led灯具 |
US7999398B2 (en) * | 2006-08-03 | 2011-08-16 | Toyoda Gosei Co., Ltd. | Solid state device |
JP4979299B2 (ja) * | 2006-08-03 | 2012-07-18 | 豊田合成株式会社 | 光学装置及びその製造方法 |
JP2008060542A (ja) * | 2006-08-03 | 2008-03-13 | Toyoda Gosei Co Ltd | 発光装置、発光装置の製造方法、及びこれを備えた光源装置 |
JP4905009B2 (ja) * | 2006-09-12 | 2012-03-28 | 豊田合成株式会社 | 発光装置の製造方法 |
-
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11177129A (ja) * | 1997-12-16 | 1999-07-02 | Rohm Co Ltd | チップ型led、ledランプおよびledディスプレイ |
JP2002094123A (ja) * | 2000-09-14 | 2002-03-29 | Citizen Electronics Co Ltd | 表面実装型発光ダイオード及びその製造方法 |
JP2002134792A (ja) * | 2000-10-25 | 2002-05-10 | Matsushita Electric Ind Co Ltd | 白色半導体発光装置の製造方法 |
Non-Patent Citations (3)
Title |
---|
11177129 |
14094123 |
14134792 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101051489B1 (ko) | 2009-03-17 | 2011-07-25 | 주식회사 두성에이텍 | 발광 다이오드 유닛의 제조 방법과, 이 방법에 의하여 제조된 발광 다이오드 유닛 |
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EP2596948B1 (en) | 2020-02-26 |
EP1603170B1 (en) | 2018-08-01 |
KR20050116373A (ko) | 2005-12-12 |
CN101789482B (zh) | 2013-04-17 |
CN101789482A (zh) | 2010-07-28 |
US7824937B2 (en) | 2010-11-02 |
CN1759492B (zh) | 2010-04-28 |
US8154047B2 (en) | 2012-04-10 |
TWI246780B (en) | 2006-01-01 |
US20060261364A1 (en) | 2006-11-23 |
US8685766B2 (en) | 2014-04-01 |
EP1603170A4 (en) | 2010-09-22 |
WO2004082036A1 (ja) | 2004-09-23 |
US20110101399A1 (en) | 2011-05-05 |
TW200505050A (en) | 2005-02-01 |
EP2596948A2 (en) | 2013-05-29 |
EP2596948A3 (en) | 2017-03-15 |
EP1603170A1 (en) | 2005-12-07 |
CN1759492A (zh) | 2006-04-12 |
US20120171789A1 (en) | 2012-07-05 |
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