JPS6483170A - Test pattern generator - Google Patents

Test pattern generator

Info

Publication number
JPS6483170A
JPS6483170A JP62242140A JP24214087A JPS6483170A JP S6483170 A JPS6483170 A JP S6483170A JP 62242140 A JP62242140 A JP 62242140A JP 24214087 A JP24214087 A JP 24214087A JP S6483170 A JPS6483170 A JP S6483170A
Authority
JP
Japan
Prior art keywords
register
exor gate
stages
test pattern
inputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62242140A
Other languages
Japanese (ja)
Other versions
JPH0682148B2 (en
Inventor
Masaaki Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62242140A priority Critical patent/JPH0682148B2/en
Publication of JPS6483170A publication Critical patent/JPS6483170A/en
Publication of JPH0682148B2 publication Critical patent/JPH0682148B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To reduce an overhead of a test pattern generator and to decrease the scale of a circuit added for a test, by providing a feedback shift register which supplies circuits to be tested with the respective outputs of registers stages adjacent to each other. CONSTITUTION:In a test pattern generator of eight stages which supplies a test pattern to two circuits 11 and 12 of 4-bit input to be tested, a linear feedback shift register 10 has eight register stages S1, S2,..., S8 and is equipped with an EXOR gate 21 receiving outputs of the register stages S6 and S8 as inputs, an EXOR gate 22 receiving an output of the register stage S5 and an output of the EXOR gate 21 as inputs, and an EXOR gate 23 receiving an output of the register stage S4 and an output of the EXOR gate 22 as inputs. Besides, another feedback loop is formed through a NOR gate 25 receiving outputs of the register stages S1, S2,...,S7 as inputs, and an input is made therefrom to the register stage S1 through an EXOR gate 24. By this constitution, the respective outputs of the register stages adjacent to each other can be supplied to the different circuits 11 and 12 to be tested.
JP62242140A 1987-09-25 1987-09-25 Test pattern generator Expired - Lifetime JPH0682148B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62242140A JPH0682148B2 (en) 1987-09-25 1987-09-25 Test pattern generator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62242140A JPH0682148B2 (en) 1987-09-25 1987-09-25 Test pattern generator

Publications (2)

Publication Number Publication Date
JPS6483170A true JPS6483170A (en) 1989-03-28
JPH0682148B2 JPH0682148B2 (en) 1994-10-19

Family

ID=17084907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62242140A Expired - Lifetime JPH0682148B2 (en) 1987-09-25 1987-09-25 Test pattern generator

Country Status (1)

Country Link
JP (1) JPH0682148B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03296676A (en) * 1990-04-16 1991-12-27 Nec Corp On-chip memory test circuit and testing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03296676A (en) * 1990-04-16 1991-12-27 Nec Corp On-chip memory test circuit and testing method

Also Published As

Publication number Publication date
JPH0682148B2 (en) 1994-10-19

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