JPS6431417A - Reduction projection aligner - Google Patents
Reduction projection alignerInfo
- Publication number
- JPS6431417A JPS6431417A JP18817287A JP18817287A JPS6431417A JP S6431417 A JPS6431417 A JP S6431417A JP 18817287 A JP18817287 A JP 18817287A JP 18817287 A JP18817287 A JP 18817287A JP S6431417 A JPS6431417 A JP S6431417A
- Authority
- JP
- Japan
- Prior art keywords
- dust
- exposure mask
- detected
- exposure
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To inspect automatically dust accumulated on upper and lower surfaces of an exposure mask, by irradiating the lower surface of the exposure mask with exposure rays and by detecting scattered light from the dust by using a CCD camera. CONSTITUTION:A lower surface irradiating device 3 may insert a lens 3e located at the point of a whirling arm 3b between an exposure mask 2 and a reduced projection exposure lens 8 by rotating a rotation axis 3a. If there is dust 6u attached to an upper surface U of the exposure mask 2, scattered lights 5a are detected as images of a CCD camera 4. That is to say, as dust is detected on image plane scanning lines as luminant signals, control signals are automatically outputted to an alarm display or an air blower for blowing away dust when signals exceeding the prescribed level are detected. When dust 6 which is attached to a lower surface L of the exposure mask 2 is detected, lights emitted from a different light source are applied from the lens 3e to the lower surface L of the exposure mask 2 through a mirror 3c of the rotation axis 3a and the mirror 3d located at the point of the whirling arm 3b. If there is dust 6b, the scattered lights 7b are detected as the images of the CCD camera 4.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18817287A JPS6431417A (en) | 1987-07-27 | 1987-07-27 | Reduction projection aligner |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18817287A JPS6431417A (en) | 1987-07-27 | 1987-07-27 | Reduction projection aligner |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6431417A true JPS6431417A (en) | 1989-02-01 |
Family
ID=16219019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18817287A Pending JPS6431417A (en) | 1987-07-27 | 1987-07-27 | Reduction projection aligner |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6431417A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0430513A (en) * | 1990-05-28 | 1992-02-03 | Nec Kyushu Ltd | Reduction projection aligner |
US5399867A (en) * | 1990-01-26 | 1995-03-21 | Canon Kabushiki Kaisha | Foreign particle inspection apparatus |
-
1987
- 1987-07-27 JP JP18817287A patent/JPS6431417A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5399867A (en) * | 1990-01-26 | 1995-03-21 | Canon Kabushiki Kaisha | Foreign particle inspection apparatus |
JPH0430513A (en) * | 1990-05-28 | 1992-02-03 | Nec Kyushu Ltd | Reduction projection aligner |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE3879224D1 (en) | DEVICE FOR OPTICALLY SCANNING THE SURFACE OF AN OBJECT. | |
DE3477836D1 (en) | Thermal deformation measuring system of ceramics and the like | |
KR910015880A (en) | Auto tracking projection | |
GB2328741A (en) | Detection system | |
BR9504479A (en) | Process and device for inspecting objects especially from the bottle nozzle region | |
CA2138059A1 (en) | Measuring and adjusting optical axis of a headlight | |
JPS6431417A (en) | Reduction projection aligner | |
CA2333195A1 (en) | Projection system and projector | |
IL116717A (en) | Optical tracing system | |
DE58905684D1 (en) | Optical arrangement for three-dimensional shape detection. | |
JPS6439543A (en) | Defective inspection device | |
EP0499778A3 (en) | Image processing apparatus | |
ATE133322T1 (en) | EYE OBSERVATION DEVICE | |
JPS617404A (en) | Position detector | |
CA2014370A1 (en) | Opaque projector | |
JPS6472036A (en) | Inspection device for lead joint part | |
EP0653655A3 (en) | Focus detection apparatus | |
JPS647317Y2 (en) | ||
JP2689505B2 (en) | Bonding wire shape inspection device | |
JPS54136888A (en) | Surface defect detecting device | |
JPH0546878A (en) | Illumination position adjustment method and video monitoring device for monitoring video | |
JPH06164833A (en) | Picture reader | |
JPS58182558U (en) | optical scanning device | |
JPS59204386A (en) | Television camera device | |
JPS6488686A (en) | Deficient parts inspecting device for packaged parts |