JPS63134145A - Electrostatic chuck - Google Patents

Electrostatic chuck

Info

Publication number
JPS63134145A
JPS63134145A JP61279415A JP27941586A JPS63134145A JP S63134145 A JPS63134145 A JP S63134145A JP 61279415 A JP61279415 A JP 61279415A JP 27941586 A JP27941586 A JP 27941586A JP S63134145 A JPS63134145 A JP S63134145A
Authority
JP
Japan
Prior art keywords
tray
electrode
wafer
electrostatic chuck
cooled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61279415A
Other languages
Japanese (ja)
Other versions
JPH0232093B2 (en
Inventor
Noboru Kuriyama
昇 栗山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokuda Seisakusho Co Ltd
Original Assignee
Tokuda Seisakusho Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokuda Seisakusho Co Ltd filed Critical Tokuda Seisakusho Co Ltd
Priority to JP61279415A priority Critical patent/JPS63134145A/en
Publication of JPS63134145A publication Critical patent/JPS63134145A/en
Publication of JPH0232093B2 publication Critical patent/JPH0232093B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Jigs For Machine Tools (AREA)

Abstract

PURPOSE:To cool a wafer so efficiently, by installing an electristatic chuck electrode in upper and lower surfaces of a tray, impressing DC voltage from an electric conductor of a water cooled electrode, and clamping the tray and the wafer as well as the tray and the water cooled electrode to an electrostatic chuck. CONSTITUTION:The wafer 20 mounted on a tray 19 is conveyed to the inside of a vacuum vessel 1, and mounted on a pin 18 piercing through a flat plate part of a lifting shaft 6 and an electrode 8. And, this lifting shaft 6 is made to go up, and the tray 19 is mounted on the electrode 8, while a peripheral edge of the tray 19 is made contact with a projecting part 2 of the vessel 1 and pressed thereto. Under this state, a conductive spring 14 and an electrostatic chuck electrode 23 of the tray 19 are made contact with each other. At this time, DC voltage is impressed via an electrostatic wire 17, and the wafer 20 is clamped to the tray and, in turn, the tray onto the electrode 8 electrostatically, respectively. Thus, the tray 19 is positively clamped to a water cooled electrode 8, thus positive cooling for the wafer 20 is performable.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は静電チャックに係り、特にトレーと水冷電極と
の密着性を高めるようにした静電チャックに関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to an electrostatic chuck, and particularly to an electrostatic chuck that improves the adhesion between a tray and a water-cooled electrode.

(従来の技術) 従来から、ドライエツチング装置等の真空処理装置にお
いては、ウェハの処理を行なう際に、水冷放電電極にウ
ェハを密着させてウェハの冷却効率を高める手段として
、静電チャックが多く用いられている。
(Prior art) Conventionally, in vacuum processing equipment such as dry etching equipment, electrostatic chucks have often been used as a means to increase the cooling efficiency of the wafer by bringing the wafer into close contact with the water-cooled discharge electrode when processing the wafer. It is used.

上記静電チャックは、ウェハが固定される水冷放電電極
に、誘電体等の絶縁膜により被覆された静電チャック用
電極を接着し、この静電チャック用電極に直流電圧を印
加することによりウェハを静電的に固定するものである
The electrostatic chuck described above attaches an electrostatic chuck electrode coated with an insulating film such as a dielectric material to a water-cooled discharge electrode on which the wafer is fixed, and then applies a DC voltage to the electrostatic chuck electrode. is fixed electrostatically.

(発明が解決しようとする問題点) しかし、発明者らは、放電が安定し均一なエツチングを
行なうことができることから、放電電極を真空容器の下
方に配置し、この電極の上面に、ウェハを載置したトレ
ーを密着させてエツチングを行なうドライエツチング装
置を開発した。そのため、そのトレーの存在により、上
記従来の電極をそのまま適用することができず、しかも
、水冷電極とウェハとの間にトレーがあるため、効率の
よい冷却を行なうことが要求されている。
(Problem to be solved by the invention) However, since the discharge is stable and uniform etching can be performed, the inventors placed the discharge electrode below the vacuum container and placed the wafer on the top surface of this electrode. We have developed a dry etching device that performs etching by placing trays in close contact with each other. Therefore, due to the presence of the tray, the above conventional electrode cannot be applied as is, and since the tray is present between the water-cooled electrode and the wafer, efficient cooling is required.

本発明は上記した点に鑑みてなされたもので、電極を下
方に配置しトレーを用いた場合でも効率よくウェハの冷
却を行なうことができる静電チャックを提供することを
目的とするものである。
The present invention has been made in view of the above-mentioned points, and an object of the present invention is to provide an electrostatic chuck that can efficiently cool a wafer even when an electrode is disposed below and a tray is used. .

〔発明の構成〕[Structure of the invention]

(問題点を解決するための手段) 上記目的を達成するため本発明に係る静電チャックは、
ウェハを載置するとともに、水冷電極の上面に載置され
るトレーの上面および下面にそれぞれ絶縁膜で被覆され
た静電チャック用電極を設け、上記下面の電極に上記水
冷電極の上面に設けられた静電チャックの電源供給用の
導電体が接触するように、上記電極の一部を露出させた
ことをその特徴とするものである。
(Means for solving the problems) In order to achieve the above object, the electrostatic chuck according to the present invention has the following features:
Electrostatic chuck electrodes coated with insulating films are provided on the upper and lower surfaces of the tray placed on the upper surface of the water-cooled electrode, respectively, on which the wafer is placed, and the electrodes on the lower surface are provided with electrostatic chuck electrodes coated on the upper surface of the water-cooled electrode. A feature of the electrostatic chuck is that a portion of the electrode is exposed so as to be in contact with a conductor for supplying power to the electrostatic chuck.

(作 用) 本発明によれば、トレーの上下面に静電チャック用電極
を設け、水冷電極の導電体から直流電圧を印加すること
により、トレーとウェハとを静電チャックにより固定す
るとともに、トレーと水冷電極も静電チャックにより固
定されるので、トレーを水冷電極に確実に密着させるこ
とができ、したがって、トレーを確実に冷却でき、ウェ
ハを効率よく冷却することができるものである。
(Function) According to the present invention, by providing electrostatic chuck electrodes on the upper and lower surfaces of the tray and applying a DC voltage from the conductor of the water-cooled electrode, the tray and the wafer are fixed by the electrostatic chuck, and Since the tray and the water-cooled electrode are also fixed by the electrostatic chuck, the tray can be reliably brought into close contact with the water-cooled electrode, and therefore the tray can be reliably cooled and the wafer can be efficiently cooled.

(実施例) 以下、本発明の実施例を第1図乃至第4図を参照して説
明する。
(Example) Hereinafter, an example of the present invention will be described with reference to FIGS. 1 to 4.

第1図および第2図は本発明に係る静電チャックを適用
したドライエツチング装置の一実施例を示したもので、
上板が脱着自在とされた真空容器1の内部上方には、内
方に突出する突出部2が°形成され、この真空容器1の
下面には、軸支部材3が固着されている。この軸支部材
3には、中心に貫通孔4を有し上端に平板部5が一体に
形成された昇降シャフト6が軸支されており、この昇降
シャフト6の下端部には、エアシリンダ7が接続され、
このエアシリンダ7の駆動により上記昇降シャフト6を
昇降自在としている。上記昇降シャフト6の平板部5の
上面には、冷却板として機能する電極8が固着されてお
り、この電極8の内部には、冷却水通路9が設けられ、
上記電極8の中央部には、下面に開口し上記冷却水通路
9に連通ずる冷却水導入口10および冷却水排出口11
がそれぞれ設けられている。さらに、第3図に示すよう
に、上記電極8の中心部には、中心に導電ビン12が挿
入された絶縁棒13が埋設されており、この絶縁棒13
の上下端部には、上記導電ピン12に接続された導電ば
ね14.14が接続されている。また、上記昇降シャフ
ト6の貫通孔4内には、上記電極8の導入口10および
排出口11に接続された冷却水の導入管15および排出
管16がそれぞれ挿通されるとともに、端部が上記下方
の導電ばね14に接触する静電チャック用電線17が挿
通されている。
FIGS. 1 and 2 show an embodiment of a dry etching apparatus to which an electrostatic chuck according to the present invention is applied.
A protrusion 2 that protrudes inward is formed at the upper part of the interior of the vacuum vessel 1 whose upper plate is removable, and a shaft supporting member 3 is fixed to the lower surface of the vacuum vessel 1 . An elevating shaft 6 having a through hole 4 in the center and a flat plate portion 5 integrally formed at the upper end is supported on the shaft supporting member 3. An air cylinder 7 is attached to the lower end of the elevating shaft 6. is connected,
By driving this air cylinder 7, the elevating shaft 6 can be moved up and down. An electrode 8 functioning as a cooling plate is fixed to the upper surface of the flat plate portion 5 of the lifting shaft 6, and a cooling water passage 9 is provided inside the electrode 8.
At the center of the electrode 8, there is a cooling water inlet 10 and a cooling water outlet 11 that open on the lower surface and communicate with the cooling water passage 9.
are provided for each. Furthermore, as shown in FIG. 3, an insulating rod 13 into which a conductive bottle 12 is inserted is embedded in the center of the electrode 8.
A conductive spring 14.14, which is connected to the conductive pin 12, is connected to the upper and lower ends of. In addition, a cooling water introduction pipe 15 and a cooling water discharge pipe 16 connected to the introduction port 10 and the discharge port 11 of the electrode 8 are inserted into the through hole 4 of the lifting shaft 6, respectively, and the ends thereof are An electrostatic chuck electric wire 17 that contacts the lower conductive spring 14 is inserted.

また、上記真空容器1の下面には、上記昇降シャフト6
の平板部5および電極8を貫通するピン(本実施例では
4本)18.18・・・が取付けられており、真空容器
1の側面には、トレー19に載置されたウェハ20を搬
送する搬送口21が形成されている。
Further, on the lower surface of the vacuum container 1, the elevating shaft 6 is provided.
Pins (four in this example) 18, 18, which pass through the flat plate portion 5 and electrodes 8 of A conveyance port 21 is formed.

このトレー19の上面および下面には、第4図に示すよ
うに、誘電体膜22で被覆された静電チャック用電極2
3が接着され、この上下の電極23は、トレー19の中
心部を貫通して接続されており、下面側の電極23の中
央部は、外部に露出している。さらに、上記静電チャッ
ク用電線17には、直流電源24がフィルタ25を介し
て接続されている。 本実施例においては、図示しない
搬送装置によりトレー19に載置されたウェハ20を搬
送口21から真空容器1内に搬送し、第1図に示すよう
に、上記ビン18の上に載置する。そして、上記エアシ
リンダ7を駆動して昇降シャフト6を上昇させ、上記ト
レー19を電極8上に載せるとともに、第2図に示すよ
うに、このトレー19の周縁部が真空容器1の突出部2
に当接するまでトレー19を上昇させトレー19を押付
ける。この状態で上記導電ばね14と上記トレー19の
静電チャック用電極23とが接触し、静電チャック用電
線17を介して直流電圧を印加することにより、ウェハ
20はトレー19上に静電的に固定されるとともに、ト
レー19は電極8上に静電的に固定される。一方、上記
突出部2とトレー19とにより真空容器1の上方に1つ
の室が形成される。このとき、上記導電ばね14は、ト
レー19の重量により容易に縮む程度の付勢力を有する
ように形成されている。そして、上記電極8に高電圧を
印加することにより、ウェハ20の上面に放電を発生さ
せ、ウェハ20のドライエツチングを行なうようにして
いる。
As shown in FIG.
The upper and lower electrodes 23 are connected through the center of the tray 19, and the center of the lower electrode 23 is exposed to the outside. Further, a DC power source 24 is connected to the electrostatic chuck electric wire 17 via a filter 25. In this embodiment, the wafer 20 placed on the tray 19 is transported by a transport device (not shown) into the vacuum container 1 through the transport port 21, and is placed on the bin 18 as shown in FIG. . Then, the air cylinder 7 is driven to raise the elevating shaft 6, and the tray 19 is placed on the electrode 8. As shown in FIG.
Raise the tray 19 until it comes into contact with the tray 19 and press the tray 19. In this state, the conductive spring 14 and the electrostatic chuck electrode 23 of the tray 19 come into contact, and by applying a DC voltage via the electrostatic chuck wire 17, the wafer 20 is electrostatically placed on the tray 19. At the same time, the tray 19 is electrostatically fixed onto the electrode 8. On the other hand, one chamber is formed above the vacuum container 1 by the protrusion 2 and the tray 19. At this time, the conductive spring 14 is formed to have a biasing force that is easily compressed by the weight of the tray 19. By applying a high voltage to the electrode 8, a discharge is generated on the upper surface of the wafer 20, and the wafer 20 is dry etched.

エツチングが終了したら、昇降シャフト6を下降させ、
トレー19をピン18上に保持させる。
After etching is completed, lower the lifting shaft 6,
The tray 19 is held on the pins 18.

これにより、トレー19の電極23への通電がなくなり
、静電チャックは解除される。
As a result, the current is no longer applied to the electrode 23 of the tray 19, and the electrostatic chuck is released.

したがって、本実施例においては、ウェハ20を確実に
静電チャックにより固定することができ、しかも、トレ
ー19と電極8も静電チャックにより密着するので、電
極8内の冷却水通路9を流れる冷却水により効率よくウ
ェハ20の冷却を行なうことができる。
Therefore, in this embodiment, the wafer 20 can be reliably fixed by the electrostatic chuck, and since the tray 19 and the electrode 8 are also brought into close contact with each other by the electrostatic chuck, the cooling water flowing through the cooling water passage 9 in the electrode 8 The wafer 20 can be efficiently cooled by water.

なお、上記トレーの静電チャック用電極は、プリント印
刷技術を用い、絶縁膜をシルクスクリーンにより印刷す
るとともに、電極としての金属膜を無電界めっきにより
形成することにより形成するようにしてもよい。
The electrostatic chuck electrode of the tray may be formed by printing an insulating film using a silk screen and forming a metal film as an electrode by electroless plating using a printing technique.

〔発明の効果〕〔Effect of the invention〕

以上述べたように本発明に係る静電チャックは、トレー
の上下面に静電チャック用電極を設け、水冷電極の導電
体から直流電圧を印加することにより、トレーとウェハ
とを静電チャックにより固定するとともに、トレーと水
冷電極も静電チャックにより固定するようにしたので、
トレーを水冷電極に確実に密着させることができ、した
がって、トレーを確実に冷却でき、ウェハを効率よく冷
却することができる等の効果を奏する。
As described above, the electrostatic chuck according to the present invention provides electrostatic chuck electrodes on the upper and lower surfaces of the tray, and applies a DC voltage from the conductor of the water-cooled electrode to attach the tray and the wafer using the electrostatic chuck. In addition to fixing the tray, the tray and water-cooled electrode were also fixed using an electrostatic chuck.
The tray can be reliably brought into close contact with the water-cooled electrode, and therefore the tray can be reliably cooled, and the wafer can be efficiently cooled.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第4図はそれぞれ本発明の一実施例を示した
もので、第1図および第2図はそれぞれ縦断面図、第3
図は電極中央部分の縦断面図、第4図はトレ一部分の縦
断面図である。 1・・・真空容器、6・・・昇降シャフト、8・・・電
極、9・・・冷却水通路、10・・・冷却水導入口、1
1・・・冷却水排出口、12・・・導電ピン、14・・
・導電ばね、15・・・導入管、16・・・排出管、1
7・・・静電チャック用電線、18・・・ピン、19・
・・トレー、20・・・ウェハ、23・・・静電チャッ
ク用電極、静電チャック用電源。 出願人代理人  佐  藤  −雄 図面の浄7:(内容に変更なし) 佑 1 図 乃2図 処4 図 手続補正書 昭和61年12月22日
1 to 4 each show an embodiment of the present invention, and FIGS. 1 and 2 are longitudinal cross-sectional views, and FIG.
The figure is a longitudinal cross-sectional view of the central portion of the electrode, and FIG. 4 is a longitudinal cross-sectional view of a portion of the tray. DESCRIPTION OF SYMBOLS 1... Vacuum container, 6... Lifting shaft, 8... Electrode, 9... Cooling water passage, 10... Cooling water inlet, 1
1... Cooling water outlet, 12... Conductive pin, 14...
・Conductive spring, 15...Introduction pipe, 16...Discharge pipe, 1
7... Electric wire for electrostatic chuck, 18... Pin, 19...
... Tray, 20... Wafer, 23... Electrostatic chuck electrode, electrostatic chuck power supply. Applicant's agent Sato - Yu Drawing No. 7: (No change in content) Yu 1 Drawing 2 Drawing 4 Drawing procedure amendment December 22, 1986

Claims (1)

【特許請求の範囲】[Claims] ウェハを載置するとともに、水冷電極の上面に載置され
るトレーの上面および下面にそれぞれ絶縁膜で被覆され
た静電チャック用電極を設け、上記下面の電極に上記水
冷電極の上面に設けられた静電チャックの電源供給用の
導電体が接触するように、上記電極の一部を露出させた
ことを特徴とする静電チャック。
Electrostatic chuck electrodes coated with insulating films are provided on the upper and lower surfaces of the tray placed on the upper surface of the water-cooled electrode, respectively, on which the wafer is placed, and the electrodes on the lower surface are provided with electrostatic chuck electrodes coated on the upper surface of the water-cooled electrode. An electrostatic chuck characterized in that a part of the electrode is exposed so as to be in contact with a conductor for supplying power to the electrostatic chuck.
JP61279415A 1986-11-22 1986-11-22 Electrostatic chuck Granted JPS63134145A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61279415A JPS63134145A (en) 1986-11-22 1986-11-22 Electrostatic chuck

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61279415A JPS63134145A (en) 1986-11-22 1986-11-22 Electrostatic chuck

Publications (2)

Publication Number Publication Date
JPS63134145A true JPS63134145A (en) 1988-06-06
JPH0232093B2 JPH0232093B2 (en) 1990-07-18

Family

ID=17610771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61279415A Granted JPS63134145A (en) 1986-11-22 1986-11-22 Electrostatic chuck

Country Status (1)

Country Link
JP (1) JPS63134145A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006517740A (en) * 2003-01-17 2006-07-27 ゼネラル・エレクトリック・カンパニイ Wafer processing apparatus and manufacturing method thereof
JP2009164620A (en) * 2009-02-13 2009-07-23 Canon Anelva Corp Sputtering apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006517740A (en) * 2003-01-17 2006-07-27 ゼネラル・エレクトリック・カンパニイ Wafer processing apparatus and manufacturing method thereof
JP2009164620A (en) * 2009-02-13 2009-07-23 Canon Anelva Corp Sputtering apparatus

Also Published As

Publication number Publication date
JPH0232093B2 (en) 1990-07-18

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