JPS6091302A - Exposure mask and method for producing different-period diffraction grating pattern - Google Patents

Exposure mask and method for producing different-period diffraction grating pattern

Info

Publication number
JPS6091302A
JPS6091302A JP20040583A JP20040583A JPS6091302A JP S6091302 A JPS6091302 A JP S6091302A JP 20040583 A JP20040583 A JP 20040583A JP 20040583 A JP20040583 A JP 20040583A JP S6091302 A JPS6091302 A JP S6091302A
Authority
JP
Japan
Prior art keywords
mask
diffraction grating
exposure
exposure mask
interference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20040583A
Other languages
Japanese (ja)
Inventor
Kazuhisa Kaede
楓 和久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP20040583A priority Critical patent/JPS6091302A/en
Publication of JPS6091302A publication Critical patent/JPS6091302A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)

Abstract

PURPOSE:To form diffraction grating patterns with different periods on the same substrate in single-time exposure by using a transparent plate having a taper plate variation part at >=1 places as a mask for exposure. CONSTITUTION:The exposure mask 201 has the 1st - the 3rd tapered thickness variation parts 202, 204 and 205 partially. The mask 200 is made of glass by using a ceramic mold having the tapered thickness variation parts. The mask 201 is used to form an interference pattern on an interference-exposed surface 101. The mask 201 and an exposure system are placed in air. Pieces 102 and 102' of luminous flux passes through the mask 201 without changing in traveling direction when passing through the variation parts 202 in a section A-A'.

Description

【発明の詳細な説明】 本発明は一つの基板上に異なった周期の回折格子パター
ンを形成するだめの露光マスク及び露光方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an exposure mask and an exposure method for forming diffraction grating patterns with different periods on one substrate.

近年、半導体レーザや光回路製造技術のもしい向上に伴
ない、発振波長の異なった半導体レーザを一つの基板上
に一体化した光集積回路、あるいは波長の異なった光の
多重分波を行なう多数個の多重分波回路を一つの基板−
)YZ集積回路等が注目δれている。2 回路に おいて、たとえば発振波長の異なった半導体レーザの一
つの基板上への一体化を分布帰還型レーザで実現しよう
とすると、異なった発振波長に対応する異なった周期の
回折格子を一つの基板上に形成する必要がある。従来、
回抽格子を形成する場2合第1図に示すような三光束干
渉法を用いていた。
In recent years, with improvements in semiconductor laser and optical circuit manufacturing technology, optical integrated circuits that integrate semiconductor lasers with different oscillation wavelengths on a single substrate, or multiplexing and demultiplexing light with different wavelengths have become popular. Multiple demultiplexing circuits on one board
) YZ integrated circuits are attracting attention. 2 In a circuit, for example, when attempting to integrate semiconductor lasers with different oscillation wavelengths on one substrate using a distributed feedback laser, it is necessary to integrate diffraction gratings with different periods corresponding to different oscillation wavelengths on one substrate. It is necessary to form the Conventionally,
In the case of forming a double grating, a three-beam interferometry method as shown in FIG. 1 was used.

ここで、101は被干渉露光面、102,102’は被
干渉露光面101で回折格子パターンを形成する光束、
103,103’は反射鏡、104はハーフミラ−51
05はビーム径変換レンズ、106はレーザ光源である
。しかし、この二光束干渉法において被干渉露光面10
1の上に形成される回折格子パターンは唯一の周期のみ
であるので、同一基板上に異なった周期の回折格子パタ
ーンを一度の露光で形成することはできないという欠点
があった。
Here, 101 is an interference exposed surface, 102 and 102' are light beams forming a diffraction grating pattern on the interference exposed surface 101,
103, 103' are reflecting mirrors, 104 is a half mirror 51
05 is a beam diameter conversion lens, and 106 is a laser light source. However, in this two-beam interference method, the interference exposed surface 10
Since the diffraction grating pattern formed on the same substrate has only one period, there is a drawback that diffraction grating patterns with different periods cannot be formed on the same substrate by one exposure.

本発明の目的は上述の欠点を除去し、一度の露光で同一
基板上に異なった周期の回折格子パターンを形成するこ
とができる異周期回折格子パターン作成用露光マスク及
び露光方法を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an exposure mask and an exposure method for creating diffraction grating patterns with different periods, which can eliminate the above-mentioned drawbacks and form diffraction grating patterns with different periods on the same substrate with one exposure. be.

本発明のh光用マスクは、−加所以上のテーパ状厚み変
化部を有する透明板(少なくも露光用の光に対して透明
)で構成されている。又、本発明の無光方法は、互いに
可干渉な2つの光束を被露光面上で交差させて回折格子
状干渉パターンを形成するZ光束干渉露光系の前記2つ
の光束の交差部に前記露光マスクを設置して干渉露光を
行なう方法である。
The h-light mask of the present invention is constituted by a transparent plate (transparent at least to exposure light) having a tapered thickness changing portion of - or more. Further, the non-light method of the present invention is a Z-beam interference exposure system that forms a diffraction grating-like interference pattern by intersecting two mutually coherent light beams on the surface to be exposed. This method involves installing a mask and performing interference exposure.

以下、図面全参照して本発明の詳細な説明する。Hereinafter, the present invention will be described in detail with reference to all the drawings.

第2図は本発明による異周期回折格子パターン作成用露
光マスクの一実施例の斜視図、第3図は第2図に示した
斜視図の破断線A−A’における断面図、第4図は本発
明による異周期回す1格子パタ一ン作成方法の一実施例
を示す干渉露光系である。
FIG. 2 is a perspective view of an embodiment of an exposure mask for creating a different-period diffraction grating pattern according to the present invention, FIG. 3 is a sectional view taken along the breaking line AA' of the perspective view shown in FIG. 2, and FIG. 1 is an interference exposure system showing an embodiment of a method for creating a single grating pattern by rotating at different periods according to the present invention.

第2図において201は露光マスクであり、その一部に
第1.第2.第3のテーパ状厚み変化部202.204
.205を有している。この露光マスク201はテーパ
状厚み変化部を型どったセラミック鋳型を用いて、ガラ
スによシ作られている。この露光マスク201を用いて
第4図に示すような露光系で被干渉露光向101の上に
干渉パターンを作成する。ここで、第2図の露光マスク
201は、その断面A−A’が第4図の紙面内にるるよ
うに設置されており、また路光マスク201及び露光系
は空気中に設置されている。このとき、第4図の光束1
02,102’は、第4図の露光マスク201の断面A
−A’においては、第3図に示すように、テーパ状厚み
変化部202を通るとき、その進行方向を曲げられ、平
面部203を通るときその進行方向を曲げられることな
く露光マスク201を透過する。
In FIG. 2, 201 is an exposure mask, a part of which has a first mask. Second. Third tapered thickness change portion 202.204
.. 205. This exposure mask 201 is made of glass using a ceramic mold in which a tapered thickness change portion is molded. Using this exposure mask 201, an interference pattern is created on the interference exposure direction 101 using an exposure system as shown in FIG. Here, the exposure mask 201 in FIG. 2 is installed so that its cross section AA' falls within the plane of the paper in FIG. 4, and the path light mask 201 and the exposure system are installed in the air. . At this time, the luminous flux 1 in Fig. 4
02, 102' is the cross section A of the exposure mask 201 in FIG.
-A', as shown in FIG. 3, when passing through the tapered thickness changing part 202, its traveling direction is bent, and when passing through the flat part 203, it passes through the exposure mask 201 without being bent. do.

次に一度の露光で4種類の異なった周期の回折格子パタ
ーンを作成できることを説明する。
Next, it will be explained that four types of diffraction grating patterns with different periods can be created by one exposure.

まず、初めに断面A−A’を用いて、テーパ角δを有す
るテーパ状厚み変化部と平面部に入射する2つの光束に
対してマスクに対する入射角と出射角の間で一般に成シ
立つ関係を説明する。さて、テーパ状厚み変化部202
において、2つの光束102.102’が平面部203
での平面に対する垂線301に対し、それぞれ角度θ及
びθ′で入射したとき、それぞれの出射角α、βは、空
気の屈折率を1、ガラスの屈折率をnとして次の関係式
が成シ立つ。
First, using the cross section A-A', a relationship generally holds between the incident angle and the outgoing angle with respect to the mask for two light beams incident on the tapered thickness change part having the taper angle δ and the flat part. Explain. Now, the tapered thickness changing portion 202
, the two light beams 102 and 102' are on the flat surface 203
When the incident angles are θ and θ', respectively, with respect to the perpendicular 301 to the plane at stand.

α= 5in−’ [n5ln [−δ十gin”(s
in(δ十〇))〕) 11)さらに、上記出射角α、
βで露光マスク201を透過した光は被干渉露光面10
1上で次式で表わされる周期Aの回折格子状干渉パター
ンを生じる。即ち となる。ここでλは光源の波長である。さて、本実施例
においては2つの光束102,102’の入射角θ、θ
′はいずれも45°、ガラスの屈折率n=1.5゜光源
の波長λ=325OA、第1.第2.第3のテーパ状厚
み変化部202,204.2050テーバ角δはそれぞ
れ10°、5°、15°、また平面部203はテーパ角
δ=0°であるから、(1)〜(3)式を用いて、第1
、第2.第3のテーパ状厚み変化部202 、204 
α= 5in-' [n5ln [-δ0gin"(s
in(δ10))]) 11) Furthermore, the above emission angle α,
The light transmitted through the exposure mask 201 at β is the interference exposed surface 10
1, a diffraction grating-like interference pattern with a period A expressed by the following equation is produced. That is to say. Here, λ is the wavelength of the light source. Now, in this embodiment, the incident angles θ and θ of the two light beams 102 and 102' are
' are both 45°, refractive index of glass n = 1.5°, wavelength of light source λ = 325OA, 1st. Second. The third tapered thickness changing portions 202, 204, and 2050 have taper angles δ of 10°, 5°, and 15°, respectively, and the taper angle δ of the flat portion 203 is 0°, so equations (1) to (3) using the first
, 2nd. Third tapered thickness changing portion 202 , 204
.

205及び平面部203を通った2つの光束102゜1
02′によシ形成された干渉パターンの格子の周期はそ
れぞれ2331A、2306A、2374A。
205 and the two light beams 102°1 that passed through the flat part 203
The grating periods of the interference patterns formed by 02' are 2331A, 2306A, and 2374A, respectively.

2298Aとなる。It becomes 2298A.

したがって1本実施例による露光マスクを用いれば一度
の露光で4種類の異なった周期の回折格子パターンを′
作成できる。
Therefore, if the exposure mask according to this embodiment is used, four types of diffraction grating patterns with different periods can be produced in one exposure.
Can be created.

なお、本露光マスク2010表面には無反射コーティン
グが施してあシ、余分な干渉パターンが生しないように
している。
Note that a non-reflection coating is applied to the surface of the main exposure mask 2010 to prevent unnecessary interference patterns from occurring.

以上、本発明による異周期回折格子パターン作成用露光
マスク及び異周期回折格子パターン作成方法の一実施例
について述べた。ここで第2図に示しだ異周期回折格子
パターン作成用露光マスクの実施例において、テーバ状
厚み変化部は3箇所としたが、1箇所以上であれば伺箇
所あってもよい。また、第1 、m2.第3のテーバ状
厚み変化部202,204.205のテーバ角δをそれ
ぞれ10°。
An embodiment of the exposure mask for creating a different periodic diffraction grating pattern and the method for creating a different periodic diffraction grating pattern according to the present invention has been described above. In the embodiment of the exposure mask for creating a different periodic diffraction grating pattern shown in FIG. 2, there are three tapered thickness changing portions, but there may be one or more tapered thickness changing portions. Also, the first, m2. The taper angle δ of the third tapered thickness changing portions 202, 204, and 205 is each 10°.

5°、15°としたが、その値に限定されないことは明
らかである。さらに、テーバ状厚み変化部は突起状とし
だが浸み状としてもよい。また、霧光マスク201の形
成はテーバ状厚み変化部を型どったセラミック鋳型を用
いて行なったが、研摩により形成したテーバ状のガラス
板を平板ガラスに貼シ付けて形成したシしてもよい。ま
た、露光マスク201はガラスで作ったが、プラスチ、
りなど他の透明材料でおってもよく、その場合は射出成
型で作ってもよい。
Although the angles are set to 5° and 15°, it is clear that the angles are not limited to these values. Further, the tapered thickness changing portion may be in the shape of a protrusion or a dip. In addition, although the fog light mask 201 was formed using a ceramic mold in which a tapered thickness change part was modeled, it could also be formed by pasting a tapered glass plate formed by polishing onto a flat glass. good. In addition, although the exposure mask 201 was made of glass, plastic
It may also be made of other transparent materials such as resin, in which case it may be made by injection molding.

なお、@4図に示しだ異周期回折格子パターン作成方法
の実施例において、露光マスク201と被干渉露光面1
01との間に間げきを設けたが、マツチングオイルを満
たしたり、密着させて用いてもよい。その場合、マツチ
ングオイル、又は被干渉露光面の屈折率をn。とじて式
+1) 、 (21はそれぞれα−5in−’ C” 
slnllg−δ+S石−1(sin(δ+U) l 
3 J (1)’n。
In addition, in the embodiment of the different periodic diffraction grating pattern creation method shown in Figure @4, the exposure mask 201 and the interference exposed surface 1
01, but it may be used by filling it with matching oil or by bringing it into close contact. In that case, the refractive index of the matching oil or the interference exposed surface is n. The expression +1) and (21 are α-5in-'C" respectively)
slnllg-δ+S stone-1(sin(δ+U) l
3 J (1)'n.

となるが、これ以外は同様に干渉パターンを形成できる
However, other than this, the interference pattern can be formed in the same way.

最後に本発明による異周期回折格子パターン作成用露光
マスク及び異周期回折格子パターン作成方法の特徴を列
挙すれ―、一度の非光で異なった周期の回折格子パター
ンを形成できること、従来とelぼ同様の干渉籍光糸に
適用できること等である。
Finally, the features of the exposure mask for creating a diffraction grating pattern with different periods and the method of creating a diffraction grating pattern with different periods according to the present invention are as follows: Diffraction grating patterns with different periods can be formed by one non-irradiation process, which is almost the same as the conventional one. It can be applied to interference-based optical fibers.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の#半パターン形成法全示す図、第2図は
本発明による異周期回折格子パターン作成用無光マスク
の斜視図、第3図は第2図に示した斜視図の破断線A−
A’における断面図、第4図は本発明による一実施例を
用いた三光束干渉露光系である。図において、 101・・・被干渉露光面、 102,102’・・・
光束、103.103’・・・反射鏡、 104・・・
ハーフミラ−5105・・・レンズ、 106・・・レ
ーザ光源、201・・露光マスク、 202.204.205・テーバ状厚み変化部、203
・・・平面部、 301・・・垂 線である。 代理人弁理士 内原
Fig. 1 is a diagram showing the entire conventional # half pattern forming method, Fig. 2 is a perspective view of a lightless mask for forming a different periodic diffraction grating pattern according to the present invention, and Fig. 3 is a cutaway view of the perspective view shown in Fig. 2. Line A-
The cross-sectional view at A' in FIG. 4 shows a three-beam interference exposure system using an embodiment of the present invention. In the figure, 101... interference exposed surface, 102, 102'...
Luminous flux, 103.103'...Reflector, 104...
Half mirror 5105...Lens, 106...Laser light source, 201...Exposure mask, 202.204.205.Taber-shaped thickness change part, 203
. . . Plane portion, 301 . . . Perpendicular line. Representative Patent Attorney Uchihara

Claims (2)

【特許請求の範囲】[Claims] (1) −’d所以上のテーパ状厚み変化部を有する透
明板(少なくも露光光に対して透明)であることを特徴
とする異周期回折格子パターン作成用露光マスク。
(1) An exposure mask for creating a different periodic diffraction grating pattern, which is a transparent plate (transparent at least to exposure light) having a tapered thickness change part of -'d or more.
(2)互いに可干渉な2つの光束を被露光面上で交差さ
せて回折格子状干渉パターンを生成する2光数備えてい
る透明板(少なくも露光光に対して透明)を設置して、
この透明板を介して干渉パターンを生成・無光すること
を特徴とする異周期回折格子パターン作成方法。
(2) Installing a transparent plate (transparent at least to the exposure light) having two beams that generates a diffraction grating interference pattern by intersecting two mutually coherent beams on the exposed surface,
A method for creating a different periodic diffraction grating pattern, which is characterized by generating and eliminating an interference pattern through this transparent plate.
JP20040583A 1983-10-26 1983-10-26 Exposure mask and method for producing different-period diffraction grating pattern Pending JPS6091302A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20040583A JPS6091302A (en) 1983-10-26 1983-10-26 Exposure mask and method for producing different-period diffraction grating pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20040583A JPS6091302A (en) 1983-10-26 1983-10-26 Exposure mask and method for producing different-period diffraction grating pattern

Publications (1)

Publication Number Publication Date
JPS6091302A true JPS6091302A (en) 1985-05-22

Family

ID=16423766

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20040583A Pending JPS6091302A (en) 1983-10-26 1983-10-26 Exposure mask and method for producing different-period diffraction grating pattern

Country Status (1)

Country Link
JP (1) JPS6091302A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6218503A (en) * 1985-07-17 1987-01-27 Fujitsu Ltd Manufacture of diffraction grating
JPH0561397A (en) * 1991-08-29 1993-03-12 Fujitsu Ltd Hologram plotting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6218503A (en) * 1985-07-17 1987-01-27 Fujitsu Ltd Manufacture of diffraction grating
JP2537596B2 (en) * 1985-07-17 1996-09-25 富士通株式会社 Method of manufacturing diffraction grating
JPH0561397A (en) * 1991-08-29 1993-03-12 Fujitsu Ltd Hologram plotting device

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