JPS5738498A - Testing system for active matrix substrate - Google Patents

Testing system for active matrix substrate

Info

Publication number
JPS5738498A
JPS5738498A JP11503280A JP11503280A JPS5738498A JP S5738498 A JPS5738498 A JP S5738498A JP 11503280 A JP11503280 A JP 11503280A JP 11503280 A JP11503280 A JP 11503280A JP S5738498 A JPS5738498 A JP S5738498A
Authority
JP
Japan
Prior art keywords
active matrix
matrix substrate
testing system
testing
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11503280A
Other languages
Japanese (ja)
Other versions
JPH0136118B2 (en
Inventor
Shinji Morozumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suwa Seikosha KK
Original Assignee
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suwa Seikosha KK filed Critical Suwa Seikosha KK
Priority to JP11503280A priority Critical patent/JPS5738498A/en
Publication of JPS5738498A publication Critical patent/JPS5738498A/en
Publication of JPH0136118B2 publication Critical patent/JPH0136118B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP11503280A 1980-08-21 1980-08-21 Testing system for active matrix substrate Granted JPS5738498A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11503280A JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11503280A JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Publications (2)

Publication Number Publication Date
JPS5738498A true JPS5738498A (en) 1982-03-03
JPH0136118B2 JPH0136118B2 (en) 1989-07-28

Family

ID=14652517

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11503280A Granted JPS5738498A (en) 1980-08-21 1980-08-21 Testing system for active matrix substrate

Country Status (1)

Country Link
JP (1) JPS5738498A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924265A (en) * 1982-07-31 1984-02-07 Canon Inc Apparatus for measuring current consumption
JPS60501307A (en) * 1983-05-17 1985-08-15 リツエンツイア　パテント−フエルヴアルツングス−ゲゼルシヤフト　ミツト　ベシユレンクテル　ハフツング Distribution section for flat mail items such as letters
JPS6267479A (en) * 1985-09-20 1987-03-27 Sharp Corp Dot matrix system display unit
JPS63125986A (en) * 1986-11-14 1988-05-30 松下電器産業株式会社 Inspection of thin film transistor array
JPS63182696A (en) * 1987-01-23 1988-07-27 松下電器産業株式会社 Defect detection for liquid crystal display unit
JPS63272046A (en) * 1987-04-21 1988-11-09 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ Method of testing display device and display device
JPH01129295A (en) * 1987-11-13 1989-05-22 Matsushita Electric Ind Co Ltd Segment drive ic for liquid crystal display panel
JPH01241598A (en) * 1988-03-23 1989-09-26 Matsushita Electron Corp Method for inspecting picture display device
JPH0355570U (en) * 1989-10-05 1991-05-29
JPH03142499A (en) * 1989-10-30 1991-06-18 Matsushita Electron Corp Image display device and inspection method thereof
US5506516A (en) * 1991-06-28 1996-04-09 Sharp Kabushiki Kaisha Method of inspecting an active matrix substrate
WO2003019504A1 (en) * 2001-08-03 2003-03-06 Sony Corporation Inspecting method, semiconductor device, and display
US7271793B2 (en) 1995-02-01 2007-09-18 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54111298A (en) * 1978-02-20 1979-08-31 Matsushita Electric Ind Co Ltd Driving circuit of liquid crystal display device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54111298A (en) * 1978-02-20 1979-08-31 Matsushita Electric Ind Co Ltd Driving circuit of liquid crystal display device

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924265A (en) * 1982-07-31 1984-02-07 Canon Inc Apparatus for measuring current consumption
JPS60501307A (en) * 1983-05-17 1985-08-15 リツエンツイア　パテント−フエルヴアルツングス−ゲゼルシヤフト　ミツト　ベシユレンクテル　ハフツング Distribution section for flat mail items such as letters
JPS6267479A (en) * 1985-09-20 1987-03-27 Sharp Corp Dot matrix system display unit
JPS63125986A (en) * 1986-11-14 1988-05-30 松下電器産業株式会社 Inspection of thin film transistor array
JPS63182696A (en) * 1987-01-23 1988-07-27 松下電器産業株式会社 Defect detection for liquid crystal display unit
JPS63272046A (en) * 1987-04-21 1988-11-09 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ Method of testing display device and display device
JPH01129295A (en) * 1987-11-13 1989-05-22 Matsushita Electric Ind Co Ltd Segment drive ic for liquid crystal display panel
JPH01241598A (en) * 1988-03-23 1989-09-26 Matsushita Electron Corp Method for inspecting picture display device
JPH0355570U (en) * 1989-10-05 1991-05-29
JPH03142499A (en) * 1989-10-30 1991-06-18 Matsushita Electron Corp Image display device and inspection method thereof
US5506516A (en) * 1991-06-28 1996-04-09 Sharp Kabushiki Kaisha Method of inspecting an active matrix substrate
US7271793B2 (en) 1995-02-01 2007-09-18 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
US7782311B2 (en) 1995-02-01 2010-08-24 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
US7932886B2 (en) 1995-02-01 2011-04-26 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection for liquid crystal display devices
US7940244B2 (en) 1995-02-01 2011-05-10 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
US8704747B2 (en) 1995-02-01 2014-04-22 Seiko Epson Corporation Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devices
WO2003019504A1 (en) * 2001-08-03 2003-03-06 Sony Corporation Inspecting method, semiconductor device, and display
US7009418B2 (en) 2001-08-03 2006-03-07 Sony Corporation Inspecting method, semiconductor device, and display apparatus
US7123044B2 (en) 2001-08-03 2006-10-17 Sony Corporation Testing method, semiconductor device, and display apparatus

Also Published As

Publication number Publication date
JPH0136118B2 (en) 1989-07-28

Similar Documents

Publication Publication Date Title
GB2081018B (en) Active matrix assembly for display device
GB2118311B (en) Testing system
AU531207B2 (en) Purging system
AU8245482A (en) Sicileous support matrix
GB8333028D0 (en) Microbiological test
DE3171862D1 (en) Test system
DE3372774D1 (en) Modified oligosaccharides used as substrate for measuring alpha-amylase activity
GB2088052B (en) An assay method for amylase activity
JPS57132191A (en) Active matrix substrate
GB8430997D0 (en) Weighing system
JPS5738498A (en) Testing system for active matrix substrate
JPS57100467A (en) Ic substrate for active matrix display body
JPS5730882A (en) Active matrix substrate
JPS5798412A (en) Device for distributing egg
SG72285G (en) Test system
GB8427133D0 (en) Matrix coating system
JPS5730881A (en) Active matrix substrate
JPS57146172A (en) Transistor testing system
AU528272B2 (en) Testing anti-block system
ZA804669B (en) An anti-lock system
JPS5632788A (en) Substrate selecting system
JPS5786880A (en) Active matrix substrate
JPS5734581A (en) Active matrix substrate
JPS5785083A (en) Active matrix substrate
GB2071454B (en) Testing display systems