JPS57133644A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS57133644A
JPS57133644A JP1931181A JP1931181A JPS57133644A JP S57133644 A JPS57133644 A JP S57133644A JP 1931181 A JP1931181 A JP 1931181A JP 1931181 A JP1931181 A JP 1931181A JP S57133644 A JPS57133644 A JP S57133644A
Authority
JP
Japan
Prior art keywords
resistor
terminal
output
shift
circumference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1931181A
Other languages
Japanese (ja)
Inventor
Nobutake Matsumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1931181A priority Critical patent/JPS57133644A/en
Publication of JPS57133644A publication Critical patent/JPS57133644A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To find out the status of output at an arbitrary point using the least external terminals by a method wherein a shift resistor to be exclusively used for testing is provided on the circumference of a semiconductor substrate, and the desired section of the IC of master slice system which is mounted on the substrate is connected to each bit of the resistor, the output of each section is inputted in the resistor in parallel and it is then outputted in series using a shift clock. CONSTITUTION:The shift resistor 40 to be exclusively used for testing is provided on the circumference of the semiconductor substrate 10 on the master slice system IC, and the output terminal 42 of the resistor 40, a shift clock input terminal 44, and the input terminal 46 of the shift switching signal of a load 1 are connected to the shift resistor 40. Also, the output of each section of the IC is led in to each bit of the resistor 40 using wirings l1-ln, an IC logic gate 48 and an FF50 are connected to the resistor 40, and an IC output terminal 52 is provided on the circumference of the substrate 10. Subject device is constituted as above, a signal is sent to the IC from the terminal 12, it is switched to the terminal 46, the output status of the IC is set in the resistor 40 through the intermediary of the wirings l1-ln, a shift clock is added to the terminal 44, and the contents of the resistor 40 are picked out from the terminal 42.
JP1931181A 1981-02-12 1981-02-12 Semiconductor integrated circuit device Pending JPS57133644A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1931181A JPS57133644A (en) 1981-02-12 1981-02-12 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1931181A JPS57133644A (en) 1981-02-12 1981-02-12 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS57133644A true JPS57133644A (en) 1982-08-18

Family

ID=11995865

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1931181A Pending JPS57133644A (en) 1981-02-12 1981-02-12 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS57133644A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60147135A (en) * 1984-01-11 1985-08-03 Hitachi Ltd Logic lsi
JPS60170955A (en) * 1984-02-15 1985-09-04 Sharp Corp Semiconductor device for control of manufacturing process
JPS63120439A (en) * 1986-10-16 1988-05-24 フェアチャイルド　セミコンダクタ　コーポレーション Circuit and system of synchronous array logic
US6487682B2 (en) 1991-09-18 2002-11-26 Fujitsu Limited Semiconductor integrated circuit

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60147135A (en) * 1984-01-11 1985-08-03 Hitachi Ltd Logic lsi
JPS60170955A (en) * 1984-02-15 1985-09-04 Sharp Corp Semiconductor device for control of manufacturing process
JPH0576776B2 (en) * 1984-02-15 1993-10-25 Sharp Kk
JPS63120439A (en) * 1986-10-16 1988-05-24 フェアチャイルド　セミコンダクタ　コーポレーション Circuit and system of synchronous array logic
US6487682B2 (en) 1991-09-18 2002-11-26 Fujitsu Limited Semiconductor integrated circuit

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