JPH0568980B2 - - Google Patents

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Publication number
JPH0568980B2
JPH0568980B2 JP63206124A JP20612488A JPH0568980B2 JP H0568980 B2 JPH0568980 B2 JP H0568980B2 JP 63206124 A JP63206124 A JP 63206124A JP 20612488 A JP20612488 A JP 20612488A JP H0568980 B2 JPH0568980 B2 JP H0568980B2
Authority
JP
Japan
Prior art keywords
circuit
thickness direction
signal
aperture control
wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP63206124A
Other languages
Japanese (ja)
Other versions
JPH0255049A (en
Inventor
Wataru Takano
Takao Jibiki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Healthcare Japan Corp
Original Assignee
Yokogawa Medical Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Medical Systems Ltd filed Critical Yokogawa Medical Systems Ltd
Priority to JP63206124A priority Critical patent/JPH0255049A/en
Publication of JPH0255049A publication Critical patent/JPH0255049A/en
Publication of JPH0568980B2 publication Critical patent/JPH0568980B2/ja
Granted legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はフエイズドアレイ超音波診断装置に関
し、更に詳しくは配列形振動子の厚み方向に分割
された振動子の厚み方向に対する開口制御の方法
を改良した超音波診断装置に関する。
Detailed Description of the Invention (Industrial Field of Application) The present invention relates to a phased array ultrasonic diagnostic device, and more specifically, it improves a method for controlling the aperture in the thickness direction of a transducer that is divided in the thickness direction of an array type transducer. The present invention relates to an ultrasonic diagnostic device.

(従来の技術) フエイズドアレイ超音波診断装置において用い
られている音場走査の方式は、多数の圧電振動子
を有する超音波探触子に与える高周波電気信号の
位相又は遅延時間を制御して、超音波探触子から
送波される超音波の送波方向を変更して走査し、
受波されて電気信号に変換された信号を送波の場
合とは逆の処理を行つて復元するものである。こ
の超音波診断装置の従来の送受波回路の一例を第
3図に示す。図において、1はは電気信号を超音
波信号に変換して送波し、反射波を受波して電気
信号に変換する多数の振動子で構成される探触子
で、厚み方向に外側の振動子列2A,2B及び真
中の中央振動子列3により構成され、配列方向に
複数の振動子を有する構造に成つている。振動子
列2Aと2Bとは同一の送波回路4Aと受波回路
4Bから成る送受波回路に接続され、中央振動子
列3は送波回路5Aと受波回路5Bから成る送受
波回路に接続されている。このように厚み方向の
両端の振動子列2A,2Bと中央振動子列3とを
別々に制御して、中央振動子列3のみを動作させ
るか、全振動子列を動作させるかの動作モードを
選択することにより、焦点を近距離に合わす場合
と、遠距離に合わす場合とに区別して用いること
ができるようになつている。
(Prior art) The sound field scanning method used in phased array ultrasound diagnostic equipment controls the phase or delay time of a high-frequency electrical signal applied to an ultrasound probe having a large number of piezoelectric transducers. Scanning is performed by changing the direction of ultrasound transmitted from a sonic probe.
The signal that is received and converted into an electrical signal is restored by performing the opposite processing to that used in the case of transmission. An example of a conventional wave transmitting/receiving circuit of this ultrasonic diagnostic apparatus is shown in FIG. In the figure, 1 is a probe consisting of many transducers that convert electrical signals into ultrasonic signals and transmit them, and receive reflected waves and convert them into electrical signals. It is composed of vibrator rows 2A, 2B and a central vibrator row 3 in the middle, and has a structure having a plurality of vibrators in the arrangement direction. The transducer rows 2A and 2B are connected to the same transmitting/receiving circuit consisting of a transmitting circuit 4A and a receiving circuit 4B, and the central transducer row 3 is connected to a transmitting/receiving circuit consisting of a transmitting circuit 5A and a receiving circuit 5B. has been done. In this way, the transducer rows 2A and 2B at both ends in the thickness direction and the central transducer row 3 are controlled separately, and the operation mode determines whether only the central transducer row 3 is operated or all the transducer rows are operated. By selecting , it is possible to distinguish between focusing on short distances and focusing on long distances.

(発明が解決しようとする課題) ところで、第3図の従来の装置では、厚み方向
の開口の制御に2系統の送受波回路を用いている
ため、全送受波回路の規模が非常に大きくなり、
従つてそれに付随する信号線の数が送受波回路に
相応して多くなつている。厚み方向に更に多段階
に分割された場合には一層送受波回路及び信号線
が多く必要になつて大規模なものとなり、装置の
大型化及びコストの増大は免れない。
(Problem to be Solved by the Invention) By the way, in the conventional device shown in FIG. 3, two systems of wave transmitting and receiving circuits are used to control the aperture in the thickness direction, so the scale of the entire wave transmitting and receiving circuit becomes extremely large. ,
Therefore, the number of signal lines associated therewith has increased in proportion to the number of wave transmitting/receiving circuits. If the device is further divided into multiple stages in the thickness direction, more wave transmitting/receiving circuits and signal lines will be required, resulting in a larger scale, which inevitably increases the size and cost of the device.

本発明は上記の点に鑑みてなされたもので、そ
の目的は、厚み方向の開口制御を簡単な回路で行
うことができ、必要な送受波回路、信号線等を少
なくすることのできるフエイズドアレイ超音波診
断装置を実現することにある。
The present invention has been made in view of the above points, and its purpose is to control the aperture in the thickness direction with a simple circuit, and to reduce the number of necessary transmitting/receiving circuits, signal lines, etc. The objective is to realize a sonic diagnostic device.

(問題点を解決するための手段) 前記の課題を解決する本発明の代表的なもの
は、厚み方向に複数の振動子が配列されて一つの
チヤンネルが構成されるフエイズドアレイ超音波
診断装置において、送波回路および受波回路は、
前記複数の振動子に共通に使用されるようになつ
ており、前記複数の診動子のうちの一部は、前記
送波回路および受波回路に、厚み方向の開口制御
回路を介して接続され、また、前記複数の振動子
のその他のものは、前記厚み方向の開口制御回路
を介することなく前記送波回路および受波回路に
接続されており、前記厚み方向の開口制御回路
は、制御信号によつて内部抵抗値を制御可能な可
変抵抗手段と、この可変抵抗手段と並列に接続さ
れ、送波信号に対しては低インピーダンスとな
り、受波信号に対しては高インピーダンスとな
る、電圧依存性を有する非線形のインピーダンス
手段とで構成されていることを特徴とするもので
ある。
(Means for Solving the Problems) A typical example of the present invention for solving the above-mentioned problems is a phased array ultrasonic diagnostic apparatus in which a plurality of transducers are arranged in the thickness direction to form one channel. The transmitting circuit and receiving circuit are
The plurality of transducers are commonly used, and some of the plurality of diagnostic elements are connected to the wave transmitting circuit and the wave receiving circuit via a thickness direction aperture control circuit. Further, the other ones of the plurality of vibrators are connected to the wave transmitting circuit and the wave receiving circuit without going through the thickness direction aperture control circuit, and the thickness direction aperture control circuit controls A variable resistance means whose internal resistance value can be controlled by a signal, and a voltage connected in parallel with the variable resistance means, which has a low impedance for the transmitted signal and a high impedance for the received signal. It is characterized in that it is composed of nonlinear impedance means having dependence.

(作用) 送波回路からの送波信号は厚み方向に配置され
た全振動子を励振して超音波を送波し、反射体か
らの反射波の内、開口制御手段が挿入されている
振動子で受波された受波信号は開口制御手段の制
御信号により受波回路への入力を制御され、前記
の制御信号入力により受波時に厚み方向の開口制
御が行われる。
(Function) The transmission signal from the transmission circuit excites all the transducers arranged in the thickness direction to transmit ultrasonic waves, and among the reflected waves from the reflector, the vibration in which the aperture control means is inserted is transmitted. The input of the received signal received by the child to the receiving circuit is controlled by the control signal of the aperture control means, and the aperture control in the thickness direction is performed at the time of wave reception by the input of the control signal.

(実施例) 以下、図面を参照して本発明の実施例を詳細に
説明する。
(Example) Hereinafter, an example of the present invention will be described in detail with reference to the drawings.

第1図は本発明の一実施例の回路図である。図
において、第3図と同等な部分には同一の符号を
付してある。第1図の探触子1は厚み方向に3列
の振動子列を有し、横方向には用途に応じて異な
る多数の振動子の内1チヤネルのみを表示したも
のである。11A,11Bは厚み方向に外側に設
けた振動子で、両者は並列に接続されている。1
2は厚み方向の中央に設けた振動子で、送波回路
4Aと受波回路4Bの接続点に接続されている。
13は高電圧で動作するダイオードを逆並列に接
続されて、送波信号である高圧信号を通過させる
が、微弱な受波信号は通過させない高圧通過用ダ
イオード回路、14は制御信号の制御によりその
内部インピーダンスを変化させて微弱な受波信号
の通過を制御するFETで、高圧通過用ダイオー
ド回路13に並列に接続され、振動11A,11
Bと、送波回路4Aと受波回路4Bの接続点との
間に挿入されている。15は各振動子に蓄積され
る電荷の放電のための固定抵抗である。
FIG. 1 is a circuit diagram of an embodiment of the present invention. In the figure, parts equivalent to those in FIG. 3 are given the same reference numerals. The probe 1 shown in FIG. 1 has three rows of transducers in the thickness direction, and only one channel of a large number of transducers, which differ depending on the application, is shown in the horizontal direction. 11A and 11B are vibrators provided outside in the thickness direction, and both are connected in parallel. 1
Reference numeral 2 denotes a vibrator provided at the center in the thickness direction, and is connected to a connection point between the wave transmitting circuit 4A and the wave receiving circuit 4B.
13 is a high-voltage passing diode circuit in which diodes that operate at high voltage are connected in antiparallel to allow a high-voltage signal, which is a transmitting signal, to pass through, but not to pass a weak receiving signal; This is a FET that controls the passage of weak received signals by changing the internal impedance, and is connected in parallel to the high voltage passage diode circuit 13.
B and the connection point between the wave transmitting circuit 4A and the wave receiving circuit 4B. 15 is a fixed resistor for discharging the charges accumulated in each vibrator.

次に上記のように構成された実施例の動作を説
明する。送波回路4Aで増幅その他の処理を受け
た送波信号は、高圧通過用ダイオード回路13を
経て振動子11A及び11Bを励振し、又、振動
子12を直接励振して、厚み方向の3振動子から
同時に超音波を送波させる。目的物から反射され
て振動子11A,11B及び12に戻つて来た反
射信号の内、振動子12で受波された信号はその
まま受波回路4Bに入り、振動子11A,11B
で受波された信号はFET14に入力される。受
波信号は微弱なため高圧通過用ダイオード回路1
3を通過することはできない。FET14はゲー
トに入力される制御信号によつてドレイン−ソー
ス間の内部抵抗が変化し、受波信号に対しオン・
オフ制御を行う。FET14がオンのときは受波
信号は通過して受波回路4Bに入力され、FET
14がオフのときは受波信号は通過せず、3個の
振動子の内、中央の振動子12の受波信号のみが
受波回路4Bに入力される。従つてFET14を
制御信号により制御することにより、実効的に探
触子1の厚み方向の開口値を制御することができ
る。
Next, the operation of the embodiment configured as described above will be explained. The transmitted signal that has been amplified and otherwise processed by the transmitting circuit 4A passes through the high voltage passing diode circuit 13 to excite the vibrators 11A and 11B, and also directly excites the vibrator 12 to generate three vibrations in the thickness direction. Ultrasonic waves are transmitted from the child at the same time. Among the reflected signals reflected from the target object and returned to the transducers 11A, 11B, and 12, the signal received by the transducer 12 enters the receiving circuit 4B as it is, and is transmitted to the transducers 11A, 11B.
The received signal is input to FET14. Since the received signal is weak, high voltage passing diode circuit 1 is used.
It is not possible to pass 3. The internal resistance between the drain and the source of the FET 14 changes depending on the control signal input to the gate, and the FET 14 turns on and off in response to the received signal.
Performs off control. When FET14 is on, the received signal passes through and is input to the receiving circuit 4B, and the FET14 is turned on.
14 is off, the received signal does not pass through, and only the received signal from the central vibrator 12 among the three vibrators is input to the wave receiving circuit 4B. Therefore, by controlling the FET 14 with a control signal, the aperture value of the probe 1 in the thickness direction can be effectively controlled.

尚、本発明は上記実施例に限定されるものでは
ない。第2図は本発明の他の実施例の回路を示す
図、イ図はその回路図、ロ図はイ図の回路中、開
口制御回路の詳細を示す図である。図において、
第1図と同等の部分には同一の符号を付してあ
る。図中、16A,16Bは探触子1の厚み方向
に振動子11A,11Bの外側に設けられた振動
子、17Aは振動子11Aと11Bの並列回路に
直例に接続された開口制御回路、17Bは振動子
16Aと16Bの並列回路に直列に接続された開
口制御回路である。開口制御回路17A,17B
はロ図の開口制御回路17に示すように高圧通過
用ダイオード回路13とFET14の並列回路で
構成され、この回路とアース間に固定抵抗8を挿
入したものである。この実施例の回路は探触子1
が厚み方向に多段階に分割された場合の例を示し
ており、中央の振動子12を中心としてその両側
の振動子11A,11Bを開口制御回路17A
に、振動子16A,16Bを開口制御回路17B
に接続したものである。開口制御回路17A,1
7Bをそれぞれ制御することにより探触子1の開
口値を変化させることができる。第2図で明らか
なように厚み方向の分割が増す毎に開口制御回路
を増やせばよい。開口制御回路17の高圧通過用
ダイオード回路13は高電圧に対して低インピー
ダンスになる回路であれば何を用いてもよく、
又、FET14は制御信号により制御される可変
抵抗回路であれば他の回路を用いてもよい。
Note that the present invention is not limited to the above embodiments. FIG. 2 is a diagram showing a circuit according to another embodiment of the present invention, FIG. 2 is a circuit diagram thereof, and FIG. In the figure,
Components equivalent to those in FIG. 1 are given the same reference numerals. In the figure, 16A and 16B are transducers provided outside the transducers 11A and 11B in the thickness direction of the probe 1, and 17A is an aperture control circuit directly connected to the parallel circuit of the transducers 11A and 11B. 17B is an aperture control circuit connected in series to the parallel circuit of vibrators 16A and 16B. Aperture control circuit 17A, 17B
As shown in the aperture control circuit 17 in Fig. 1, it is composed of a parallel circuit of a high voltage passing diode circuit 13 and an FET 14, and a fixed resistor 8 is inserted between this circuit and the ground. The circuit in this example is for probe 1.
is divided into multiple stages in the thickness direction, and the transducers 11A and 11B on both sides of the central transducer 12 are connected to the aperture control circuit 17A.
, the transducers 16A and 16B are connected to the aperture control circuit 17B.
It is connected to. Aperture control circuit 17A, 1
By controlling each of 7B, the aperture value of the probe 1 can be changed. As is clear from FIG. 2, the number of aperture control circuits may be increased each time the number of divisions in the thickness direction increases. The high voltage passing diode circuit 13 of the aperture control circuit 17 may be any circuit as long as it has low impedance against high voltage.
Further, the FET 14 may be any other circuit as long as it is a variable resistance circuit controlled by a control signal.

以上説明したように本実施例によれば配列方向
の1チヤネルに対して1つの送受波回路を用いる
だけで厚み方向の開口制御を行うことができ、厚
み方向に分割されていない配列振動子の送受波回
路と同じ構成で実現できる。
As explained above, according to this embodiment, aperture control in the thickness direction can be performed by using only one transmitter/receiver circuit for one channel in the array direction, and the This can be realized with the same configuration as the transmitter/receiver circuit.

配列方向の全チヤネルの同一厚み方向の振動子
に対して、同一制御信号で制御することができ、
送受波信号及び開口制御信号を従来に比べて少な
い構成で実現できる。
Vibrators in the same thickness direction in all channels in the arrangement direction can be controlled with the same control signal.
Transmission/reception signals and aperture control signals can be realized with fewer configurations than in the past.

(発明の効果) 以上詳細に説明したように本発明によれば、線
形素子と非線型素子の並列回路と送受波のレベル
差を利用して、送波時と受波時とでパスを自動的
に切り換えることにより、厚み方向の開口制御を
簡単に行うことができる。すなわち、送受波回路
の数やそれに伴う信号線の数を減らすことがで
き、実用上の効果は大きい。
(Effects of the Invention) As explained in detail above, according to the present invention, paths are automatically established between transmitting and receiving waves by using the parallel circuit of linear elements and nonlinear elements and the level difference between transmitting and receiving waves. By switching the thickness direction, it is possible to easily control the opening in the thickness direction. That is, the number of wave transmitting/receiving circuits and the number of signal lines associated therewith can be reduced, which has a great practical effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の回路図、第2図は
本発明の他の実施例の回路図、第3図は従来の送
受波回路の図である。 1……探触子、4A,5A……送波回路、4
B,5B……受波回路、11A,11B,12,
16A,16B……振動子、13……高圧通過用
ダイオード回路、14……FET、15……固定
抵抗、17,17A,17B……開口制御回路。
FIG. 1 is a circuit diagram of one embodiment of the present invention, FIG. 2 is a circuit diagram of another embodiment of the present invention, and FIG. 3 is a diagram of a conventional wave transmitting/receiving circuit. 1... Probe, 4A, 5A... Transmission circuit, 4
B, 5B... Receiving circuit, 11A, 11B, 12,
16A, 16B... vibrator, 13... diode circuit for high voltage passage, 14... FET, 15... fixed resistor, 17, 17A, 17B... aperture control circuit.

Claims (1)

【特許請求の範囲】 1 厚み方向に複数の振動子が配列されて一つの
チヤンネルが構成されるフエイズドアレイ超音波
診断装置において、 送波回路および受波回路は、前記複数の振動子
に共通に使用されるようになつており、 前記複数の振動子のうちの一部は、前記送波回
路および受波回路に、厚み方向の開口制御回路を
介して接続され、また、前記複数の振動子のその
他のものは、前記厚み方向の開口制御回路を介す
ることなく前記送波回路および受波回路に接続さ
れており、 前記厚み方向の開口制御回路は、制御信号によ
つて内部抵抗値を制御可能な可変抵抗手段と、こ
の可変抵抗手段と並列に接続され、送波信号に対
しては低インピーダンスとなり、受波信号に対し
ては高インピーダンスとなる、電圧依存性を有す
る非線形のインピーダンス手段とで構成されてい
ることを特徴とするフエイズドアレイ超音波診断
装置。 2 厚み方向に直交する方向の全チヤネルに対
し、同一の制御信号により、可変抵抗手段の抵抗
値制御を行うことを特徴とする請求項1記載のフ
エイズドアレイ超音波診断装置。
[Scope of Claims] 1. In a phased array ultrasonic diagnostic apparatus in which a plurality of transducers are arranged in the thickness direction to form one channel, a wave transmitting circuit and a wave receiving circuit are commonly used for the plurality of transducers. Some of the plurality of vibrators are connected to the wave transmitting circuit and the wave receiving circuit via a thickness direction aperture control circuit, and some of the plurality of vibrators are connected to the wave transmitting circuit and the wave receiving circuit via a thickness direction aperture control circuit. Others are connected to the wave transmitting circuit and the wave receiving circuit without going through the thickness direction aperture control circuit, and the thickness direction aperture control circuit can control an internal resistance value by a control signal. variable resistance means, and a voltage-dependent nonlinear impedance means that is connected in parallel with the variable resistance means and has a low impedance for the transmitted signal and a high impedance for the received signal. A phased array ultrasonic diagnostic device comprising: 2. The phased array ultrasonic diagnostic apparatus according to claim 1, wherein the resistance value of the variable resistance means is controlled by the same control signal for all channels in a direction perpendicular to the thickness direction.
JP63206124A 1988-08-19 1988-08-19 Phased array ultrasonic diagnostic device Granted JPH0255049A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63206124A JPH0255049A (en) 1988-08-19 1988-08-19 Phased array ultrasonic diagnostic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63206124A JPH0255049A (en) 1988-08-19 1988-08-19 Phased array ultrasonic diagnostic device

Publications (2)

Publication Number Publication Date
JPH0255049A JPH0255049A (en) 1990-02-23
JPH0568980B2 true JPH0568980B2 (en) 1993-09-30

Family

ID=16518190

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63206124A Granted JPH0255049A (en) 1988-08-19 1988-08-19 Phased array ultrasonic diagnostic device

Country Status (1)

Country Link
JP (1) JPH0255049A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56144699A (en) * 1980-03-17 1981-11-11 Siemens Ag Supersonic wave array
JPS5920157A (en) * 1982-07-28 1984-02-01 アロカ株式会社 Ultrasonic diagnostic apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56144699A (en) * 1980-03-17 1981-11-11 Siemens Ag Supersonic wave array
JPS5920157A (en) * 1982-07-28 1984-02-01 アロカ株式会社 Ultrasonic diagnostic apparatus

Also Published As

Publication number Publication date
JPH0255049A (en) 1990-02-23

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