JPH02104493A - Solder for connection - Google Patents
Solder for connectionInfo
- Publication number
- JPH02104493A JPH02104493A JP25383188A JP25383188A JPH02104493A JP H02104493 A JPH02104493 A JP H02104493A JP 25383188 A JP25383188 A JP 25383188A JP 25383188 A JP25383188 A JP 25383188A JP H02104493 A JPH02104493 A JP H02104493A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- embrittlement
- alloy
- connection
- kinds
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910000679 solder Inorganic materials 0.000 title claims abstract description 57
- 229910052749 magnesium Inorganic materials 0.000 claims abstract description 11
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 10
- 229910052748 manganese Inorganic materials 0.000 claims abstract description 8
- 229910052718 tin Inorganic materials 0.000 claims abstract description 7
- 229910001128 Sn alloy Inorganic materials 0.000 claims abstract description 6
- 239000000463 material Substances 0.000 abstract description 7
- 238000005476 soldering Methods 0.000 abstract description 6
- 230000002542 deteriorative effect Effects 0.000 abstract description 3
- 230000007774 longterm Effects 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 8
- 229910045601 alloy Inorganic materials 0.000 description 7
- 239000000956 alloy Substances 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 229910000978 Pb alloy Inorganic materials 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000007598 dipping method Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 229910000906 Bronze Inorganic materials 0.000 description 2
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 239000010974 bronze Substances 0.000 description 2
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 2
- 230000005496 eutectics Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 238000009736 wetting Methods 0.000 description 2
- 229910017526 Cu-Cr-Zr Inorganic materials 0.000 description 1
- 229910002482 Cu–Ni Inorganic materials 0.000 description 1
- 229910017810 Cu—Cr—Zr Inorganic materials 0.000 description 1
- 229910001096 P alloy Inorganic materials 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- UREBDLICKHMUKA-CXSFZGCWSA-N dexamethasone Chemical compound C1CC2=CC(=O)C=C[C@]2(C)[C@]2(F)[C@@H]1[C@@H]1C[C@@H](C)[C@@](C(=O)CO)(O)[C@@]1(C)C[C@@H]2O UREBDLICKHMUKA-CXSFZGCWSA-N 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000010534 mechanism of action Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000002893 slag Substances 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
- B23K35/262—Sn as the principal constituent
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は電気、電子部品のリードの予備はんだ又は基板
等への接続に用いる改良された接続用はんだに関するも
ので、特に半田濡れ性や外観を劣化させることなく、長
期にわたるはんだ接続の信頼性を確保するものである。[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to an improved connecting solder used for preliminary soldering of electrical and electronic component leads or for connecting to a board, etc., and particularly relates to improved solder wettability and appearance. This ensures long-term reliability of solder connections without deteriorating the solder connection.
一般に電気、電子部品等のワイヤやプリント基板への実
装には、Sn又はSn合金はんだが用いられている。例
えば電子部品である半導体は、パッケージング後基板等
への実装時におけるはんだ付は性を確保するため、あら
かじめ電気メツキや浸漬法によってS n −10v1
%Pb合金はんだを付着せしめ、これを実装メーカーで
プリント基板(PCD)等に共晶はんだ(Sn−40W
1%Pb合金)を用いて接続されている。Generally, Sn or Sn alloy solder is used for mounting electrical and electronic components onto wires and printed circuit boards. For example, semiconductors, which are electronic components, are soldered to S n -10v1 by electroplating or dipping in advance to ensure proper soldering properties when mounted on a board after packaging.
%Pb alloy solder is attached, and this is soldered to a printed circuit board (PCD) etc. by a mounting manufacturer using eutectic solder (Sn-40W).
1% Pb alloy).
この接続において、スルホールを用いる場合には、基板
にセットした後、部品取付けの反対面より溶融はんだを
吹付けて接続(フロー法)し、表面実装の場合には、あ
らかじめ基板の接続部にスクリーン印刷等によってペー
スト状のはんだを塗り、その上に部品リードを置いて赤
外線や有機溶剤の蒸気の潜熱によってはんだの溶融を行
なって接続(リフロー法)するのが−前向である。When using through-holes for this connection, after setting them on the board, connect by spraying molten solder from the opposite side of the component mounting area (flow method), and in the case of surface mounting, screen the connection part of the board in advance. The best method is to apply a paste-like solder by printing or the like, place component leads on top of it, and then melt the solder using infrared rays or the latent heat of organic solvent vapor to make connections (reflow method).
上記方法で接続された部品は、長時間安定に接続されて
いなければならないが、接続される部品のリード材質に
よってははんだとリードの界面に脆弱な相やボイドを形
成し、はんだとの接続が不十分となったり、著しい場合
には部品が欠落する事故が生じる。Components connected using the above method must remain stably connected for a long time, but depending on the lead material of the component being connected, fragile phases or voids may form at the interface between the solder and the lead, making the connection with the solder difficult. If it becomes insufficient or in severe cases, accidents may occur where parts are missing.
このような例としては、リン青銅中の高濃度Pによる脆
化、NiやFe入入金合金例えばCu−Ni、Cu−F
e、Cu−Ni−3n等の合金の脆化、析出強化を行な
う銅合金、例えばCu−Cr−Zr、Cu−Ni−8i
等の合金の脆化が知られている。これ等の合金のうちリ
ン青銅ではPa度を低下することで脆化を防止し、他の
合金ではZnやMgを微量添加することで脆化を防止し
、更にはリードに下地メツキを施す等の対策が知られて
いる。しかしながら改善が不十分な場合や合金本来の特
性を十分に生かせない場合が見られる。Examples of this include embrittlement due to high concentration of P in phosphor bronze, Ni and Fe deposited alloys such as Cu-Ni, Cu-F
Copper alloys for embrittlement and precipitation strengthening of alloys such as e, Cu-Ni-3n, etc., such as Cu-Cr-Zr, Cu-Ni-8i
It is known that alloys such as these are embrittled. Among these alloys, embrittlement can be prevented with phosphor bronze by lowering the Pa degree, and with other alloys, embrittlement can be prevented by adding small amounts of Zn or Mg, and furthermore, by applying base plating to the leads, etc. Countermeasures are known. However, there are cases where the improvement is insufficient or where the inherent properties of the alloy cannot be fully utilized.
最近の基板への表面実装では、この半田脆化による問題
が著しくなっているにもかかわらず、電子部品のリード
材にはその種類や製造メーカーによって種々の材質のも
のが用いられており、基板やシステム全体の信頼性の上
から好ましくないものである。殊に半導体の高集積化や
パッケージの小型化は熱的ストレスを高めるので、問題
が大きくなる傾向にあった。Although the problem of solder embrittlement has become more serious in recent surface mounting on boards, lead materials for electronic components are made of a variety of materials depending on the type and manufacturer. This is undesirable from the viewpoint of reliability of the system as a whole. In particular, higher integration of semiconductors and smaller packages increase thermal stress, which tends to exacerbate the problem.
〔課題を解決するための手段〕
本発明はこれに鑑み鋭意検討の結果、リード材の種類に
かかわらず、上記はんだ脆化を防止することができる接
続用はんだを開発したものである。[Means for Solving the Problems] In view of this, and as a result of intensive studies, the present invention has developed a connecting solder that can prevent the solder embrittlement described above regardless of the type of lead material.
即ち本発明は、Sn又はSn合金はんだに、Zn、Mg
、Mnの何れか1種又は2種以上を合計0.1〜2v1
%含有せしめることを特徴とするものである。That is, the present invention provides Sn or Sn alloy solder with Zn, Mg
, Mn, a total of 0.1 to 2v1 of one or two or more types
%.
本発明において、Sn又はSn合金はんだ中に、Zn、
Mg、Mnの何れか1種又は2種以上を合計01〜2.
(lv1%含有せしめたのは、リード材の種類にかかわ
らず、上記はんだの脆化を防止するためで、その作用機
構は必ずしも明らかではないが、一般にSnとSnの固
相反応時にCu合金側の添加元素のSn中への拡散が極
めて遅いことによって界面にボイドを形成する所謂カー
ケンダール効果に基づくものとされており、拡散性の高
いZn、Mg、Mnの添加により、上記ボイド部分に拡
散してボイドを消失させるためと思われる。In the present invention, Zn,
One or more of Mg and Mn in a total of 01 to 2.
(The lv1% content was made to prevent the solder from becoming embrittled regardless of the type of lead material. Although its mechanism of action is not necessarily clear, generally Cu alloy side This phenomenon is believed to be based on the so-called Kirkendahl effect, in which voids are formed at the interface due to extremely slow diffusion of additive elements into Sn, and the addition of Zn, Mg, and Mn, which have high diffusivity, causes them to diffuse into the voids. This seems to be to eliminate voids.
しかしてSn又はSn合金はんだ中に、Zn。Therefore, Zn is contained in Sn or Sn alloy solder.
Mg、Mnの何れか1種又は2種以上を合計0、 l
〜2. Ov1%含有せしめたのは、0.1w1%未満
では十分な効果が発揮できず、2.GWI%以上ではは
んだ融点の上昇や、これに伴なう流動性の低下やはんだ
付後の滓の発生が見られるため好ましくはないためであ
る。A total of 0, l of any one or two or more of Mg and Mn
~2. The reason why Ov1% was included was because if it was less than 0.1w1%, a sufficient effect could not be exhibited.2. This is because if the solder melting point exceeds GWI%, the melting point of the solder increases, fluidity decreases accordingly, and slag is generated after soldering, which is not preferable.
尚本発明はんだの被着法としては、上記七シ続用はんだ
を溶融し、これを被はんだ物に吹付けるか又は彼はんだ
物を接続用はんだの溶融浴中に浸漬するか、更には上記
接続用はんだをペースト状とし、これを披はんだ物にス
クリーン印刷した後、接続用はんだを溶融すればよい。The method of applying the solder of the present invention includes melting the above-mentioned connection solder and spraying it onto the object to be soldered, or immersing the solder object in a molten bath of the connection solder, or the above-mentioned method. The connection solder may be made into a paste, screen printed on the object to be displayed, and then the connection solder may be melted.
市販の板厚0.25mmのコルソン合金(Cu73.2
w1%N i −0,75w1%Sn)にS n −1
0WI%Pb合金はんだを浸漬法により約5μの厚さに
塗布し、これを幅10+nl11.長さ30mmに切断
した後、第1表に示す組成の共晶はんだ浴にタムラ製作
所製のMH820Vフラックスを用い、230℃で10
秒間浸漬してはんだを付着した後、はんだ粘れ性及びは
んだ外観を調べると共に、はんだ脆化の試験を行なった
。その結果を第1表に併記した。Commercially available Corson alloy (Cu73.2) with a thickness of 0.25 mm
w1%N i -0,75w1%Sn) to S n -1
0WI%Pb alloy solder was applied to a thickness of about 5μ by the dipping method, and this was applied to a width of 10+nl11. After cutting to a length of 30 mm, MH820V flux manufactured by Tamura Manufacturing Co., Ltd. was used in a eutectic solder bath having the composition shown in Table 1, and soldered at 230°C for 10 minutes.
After applying solder by dipping for a second, the solder viscosity and solder appearance were examined, and a test for solder embrittlement was conducted. The results are also listed in Table 1.
はんだ濡れ性はメニスコグラフによる濡れ時間を求め、
はんだ外観は月S C5033条件B方法に準拠し、濡
れ面積95%以上を◎印、90%以上を○印、90%以
下をΔ印で表わすと共に外観良好なものを○印で表わし
た。またはんだ脆化は150℃の恒温槽で所定時間加熱
後、捻回剥離試験を行ない、剥離するまでの加熱時間を
求めた。Solder wettability is determined by wetting time using a meniscograph.
The appearance of the solder was determined in accordance with the Monthly SC5033 Condition B method, and a wetted area of 95% or more is indicated by ◎, 90% or greater is indicated by ○, and 90% or less is indicated by Δ, and those with a good appearance are indicated by ○. Solder embrittlement was determined by heating the solder in a constant temperature bath at 150° C. for a predetermined time and then performing a twisting peel test to determine the heating time until peeling occurred.
第1表から明らかなように、Zn、Mg。As is clear from Table 1, Zn, Mg.
Mn等を添加しない5n−P合金からなる比較はんだN
α11及びZn、Mg、Mn等を添加するも、その含有
量の少ない比較はんだNα12. 14゜16では効果
が小さいのに対し、Zn、Mg。Comparative solder N made of 5n-P alloy without addition of Mn etc.
Although α11 and Zn, Mg, Mn, etc. are added, the comparative solder Nα12. 14°16 has a small effect, whereas Zn and Mg.
Mn等を適量添加した本発明はんだNα1〜10ははん
だ濡れ性、外観、はんだ脆化の何れも良好である。一方
、Zn、Mg、Mnを過剰に添加した比較はんだNa1
3. 15. 17. 18は何れもはんだ脆化は良好
なるも、はんだ濡れ時間が長く、はんだ外観も良くない
ことが判る。The solder Nα1 to Nα10 of the present invention to which an appropriate amount of Mn or the like is added has good solder wettability, appearance, and solder embrittlement. On the other hand, comparative solder Na1 with excessive addition of Zn, Mg, and Mn
3. 15. 17. It can be seen that although the solder embrittlement of No. 18 was good, the solder wetting time was long and the solder appearance was not good.
このように本発明によれば、はんだ濡れ性や外観を劣化
させることなく、はんだ接続の重要なはんだ脆化を防止
することができるもので、特に半導体のプリント基板実
装時に個々の部品材質に注意することなくはんだ付けが
可能となり、長期に亙るはんだ付けの信頼性を確保でき
る等工業上顕著な効果を奏するものである。As described above, according to the present invention, it is possible to prevent solder embrittlement, which is important for solder connections, without deteriorating solder wettability or appearance, and it is possible to prevent solder embrittlement, which is important for solder connections, by paying special attention to the materials of individual components when mounting semiconductor printed circuit boards. This makes it possible to perform soldering without any process, and has significant industrial effects, such as ensuring long-term soldering reliability.
Claims (1)
何れか1種又は2種以上を合計0.1〜2wt%含有せ
しめたことを特徴とする接続用はんだ。(1) A connecting solder characterized in that Sn or Sn alloy solder contains one or more of Zn, Mg, and Mn in a total amount of 0.1 to 2 wt%.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25383188A JPH02104493A (en) | 1988-10-11 | 1988-10-11 | Solder for connection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25383188A JPH02104493A (en) | 1988-10-11 | 1988-10-11 | Solder for connection |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02104493A true JPH02104493A (en) | 1990-04-17 |
Family
ID=17256742
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25383188A Pending JPH02104493A (en) | 1988-10-11 | 1988-10-11 | Solder for connection |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02104493A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102025514B1 (en) | 2018-05-25 | 2019-09-25 | 센주긴조쿠고교 가부시키가이샤 | Solder ball, solder joint and method for bonding |
-
1988
- 1988-10-11 JP JP25383188A patent/JPH02104493A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102025514B1 (en) | 2018-05-25 | 2019-09-25 | 센주긴조쿠고교 가부시키가이샤 | Solder ball, solder joint and method for bonding |
US10780530B2 (en) | 2018-05-25 | 2020-09-22 | Senju Metal Industry Co., Ltd. | Solder ball, solder joint, and joining method |
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