JP6429731B2 - Impulse voltage cutting wave test equipment - Google Patents

Description

  The present invention relates to an impulse voltage cutting wave test apparatus, and more particularly to an impulse voltage cutting wave test apparatus that applies an impulse voltage cutting wave to a test device.

  The lightning impulse withstand voltage test, which verifies the dielectric strength of the EUT against lightning strikes, includes a full-wave voltage test in which the impulse voltage is applied to the EUT as it is, and a chopped wave voltage that is applied to the EUT after the impulse voltage is cut. There is a test (see FIGS. 2A and 2B).

  In the conventional impulse voltage cutting wave testing device, when a start signal is output from the start signal generator, a start high voltage pulse is output from the start high voltage pulse generator to the impulse voltage generator, and a delayed high voltage pulse is generated after a certain time has elapsed. A delayed high voltage pulse is output from the device to the cutting device. In the impulse voltage generator, the discharge switch is turned on in response to the start high voltage pulse, and an impulse voltage is generated. The cutting device cuts the impulse voltage in response to the delayed high voltage pulse (see, for example, Patent Document 1).

JP-A-57-135690

  However, the conventional impulse voltage cutting wave test apparatus has a problem that the discharge start time of the gap between the electrodes of the discharge switch included in the impulse voltage generator varies and the output start time of the impulse voltage varies. If the impulse voltage output start time is delayed from the cutting timing by the cutting device, the impulse voltage is applied to the EUT without being cut. Since the test voltage of the cutting wave is often set to about 110% of the test voltage of the full wave, if the cutting fails, excessive stress may be applied to the EUT and the EUT may be damaged. There is.

  SUMMARY OF THE INVENTION Therefore, a main object of the present invention is to provide an impulse voltage cutting wave test apparatus capable of generating an impulse voltage cutting wave even when the output start time of the impulse voltage varies.

  The impulse voltage cutting wave test apparatus according to the present invention is an impulse voltage cutting wave test apparatus that applies an impulse voltage cutting wave to a test equipment, and an impulse voltage generator that outputs an impulse voltage in response to a start signal; A first signal generator that outputs a first cutting signal obtained by delaying a start signal by a predetermined time; a second signal generator that outputs a second cutting signal in response to an impulse voltage; And a cutting device that cuts the impulse voltage when one of the first and second cutting signals is output when the impulse voltage is output.

  In the impulse voltage cutting wave test apparatus according to the present invention, the first signal generator that outputs the first cutting signal obtained by delaying the start signal by a predetermined time, and the second cutting in response to the impulse voltage. A second signal generator for outputting a signal, and the cutting device is configured to output a cutting signal of any one of the first and second cutting signals when the impulse voltage is output. Cut the impulse voltage. Therefore, even when the impulse voltage cannot be cut in response to the first cutting signal, the impulse voltage can be cut in response to the second cutting signal. Therefore, even when the output start time of the impulse voltage varies, the impulse voltage cutting wave can be generated.

It is a circuit block diagram which shows the structure of the impulse voltage cutting wave test apparatus by Embodiment 1 of this invention. It is a figure which shows the waveform of an impulse voltage full wave, and the waveform of an impulse voltage cutting wave. It is a time chart which shows operation | movement of the impulse voltage cutting wave test apparatus shown in FIG. It is a time chart which shows the other operation | movement of the impulse voltage cutting wave test apparatus shown in FIG. It is a circuit block diagram which shows the structure of the impulse voltage cutting wave test apparatus by Embodiment 2 of this invention. It is a circuit block diagram which shows the structure of the impulse voltage cutting wave test apparatus by Embodiment 3 of this invention. It is a circuit block diagram which shows the structure of the impulse voltage cutting wave test apparatus by Embodiment 4 of this invention. It is a circuit block diagram which shows the structure of the impulse voltage cutting wave test apparatus by Embodiment 5 of this invention.

[Embodiment 1]
1 is a circuit block diagram showing a configuration of an impulse voltage cutting wave test apparatus according to Embodiment 1 of the present invention. In FIG. 1, the impulse voltage cutting wave test apparatus includes a start signal generator 1, high voltage pulse generators 2 and 5, cutting signal generators 3 and 4, impulse voltage generating apparatus 10, cutting apparatus 15, and output terminals T1 and T2. , And a voltage divider 18. The EUT 17 is connected between the output terminals T1 and T2. The test equipment 17 is a transformer, for example.

  The start signal generator 1 outputs the start signal S1 to the high voltage pulse generator 2 and the cutting signal generator 3. The high voltage pulse generator 2 outputs the first high voltage pulse P1 to the impulse voltage generator 10 in response to the start signal S1. The cutting signal generator 3 outputs a first cutting signal S2 obtained by delaying the start signal S1 by a predetermined time Td. The cutting signal generator 4 outputs a second cutting signal S3 in response to the output of the impulse voltage VIP from the impulse voltage generator 10. The high voltage pulse generator 5 outputs the second high voltage pulse P2 in response to the first cutting signal S2, and outputs the third high voltage pulse P3 in response to the second cutting signal S3.

  The impulse voltage generator 10 includes a charging capacitor 11, a discharge switch 12, a discharging resistor 13, and a braking resistor 14. The positive electrode of charging capacitor 11 is connected to one electrode of discharge switch 12, and the negative electrode thereof receives ground voltage GND. Discharge resistor 13 is connected between the other electrode of discharge switch 12 and the line of ground voltage GND. The braking resistor 14 is connected between the other electrode of the discharge switch 12 and the output terminal T1. Output terminal T2 receives ground voltage GND.

  Charging capacitor 11 is charged to a predetermined voltage for each test. The discharge switch 12 includes two electrodes arranged at a predetermined interval. A discharge gap is formed between the two electrodes. Once the discharge gap is discharged, the discharge is maintained as long as a current greater than a certain value flows, and the discharge switch 12 is maintained in a conductive state. When the current becomes smaller than a certain value, the discharge in the discharge gap disappears and the discharge switch 12 becomes nonconductive.

  When the charging capacitor 11 is charged to a predetermined voltage and the first high voltage pulse P1 is output from the high voltage pulse generator 2, the discharge gap is discharged and the discharge switch 12 is conducted. When the discharge switch 12 becomes conductive, a current flows from the charging capacitor 11 to the EUT 17 via the discharge switch 12 and the resistors 13 and 14. The voltage between the output terminals T1 and T2 becomes the impulse voltage VIP.

  The discharging resistor 13 is provided to adjust the current flowing from the positive electrode of the charging capacitor 11 to the ground voltage GND line. The discharging resistor 13 includes a voltage divider. The voltage divider divides the voltage (voltage between terminals of the discharging resistor 13) given from the charging capacitor 11 via the discharging switch 12 and outputs the divided voltage to the output terminal 13a. The voltage at the output terminal 13 a is supplied to the cutting signal generator 4. The cutting signal generator 4 outputs a second cutting signal S3 when the voltage of the output terminal 13a exceeds a predetermined threshold voltage. The braking resistor 14 is provided to adjust the current flowing from the positive electrode of the charging capacitor 11 to the output terminal T1.

  The cutting device 15 includes a discharge switch 16. The discharge switch 16 includes two electrodes arranged at a predetermined interval. A discharge gap is formed between the two electrodes. The two electrodes are connected to the output terminals T1 and T2, respectively. When the impulse voltage VIP between the output terminals T1 and T2 is a high voltage and the high voltage pulse P2 or P3 is output from the high voltage pulse generator 5, the discharge gap is discharged and the discharge switch 16 is turned on. When the discharge switch 16 is turned on, the impulse voltage VIP rapidly drops from a high voltage to 0V.

  The voltage divider 18 includes two circuit elements 19 and 20 connected in series between the output terminals T1 and T2, and an output terminal 18a connected between the circuit elements 19 and 20, and an impulse between the output terminals T1 and T2. The voltage VIP is divided and output to the output terminal 18a. Each of circuit elements 19 and 20 includes, for example, a resistance element, a capacitor, a reactor, or a combination thereof. The voltage at the output terminal 18a is recorded in a recorder (not shown) and used to check whether the test has been performed normally.

  FIG. 2A is a diagram showing the waveform of the impulse voltage full wave. The impulse voltage full wave is the impulse voltage VIP itself generated by the impulse voltage generator 10 when the cutting device 15 is not provided. In FIG. 2A, the impulse voltage VIP rises steeply from 0V to the peak value, and then gradually falls. The time obtained by dividing the time required for the impulse voltage VIP to rise from 30% to 90% of the peak value by 0.6 is called the wavefront length. The time required for the impulse voltage VIP to rise from the convention origin and to drop to 50% of the peak value via the peak value is called the wave tail length. The wavefront length can be adjusted by adjusting the resistance value of the braking resistor 14, and the wavetail length can be adjusted by adjusting the resistance value of the discharging resistor 13. Therefore, the waveform of the impulse voltage full wave can be adjusted by adjusting the resistance values of the resistors 13 and 14. The discharging resistor 13 may be connected between the output terminals T1 and T2.

  FIG. 2B is a diagram illustrating a waveform of the impulse voltage cutting wave. The impulse voltage cutting wave is obtained by cutting the impulse voltage VIP generated by the impulse voltage generator 10 by the cutting device 15. In FIG. 2 (b), the impulse voltage cutting wave rises sharply from 0V to the peak value, then slowly falls, and suddenly drops to 0V at a certain timing.

  The peak value when applying the impulse voltage cutting wave to the EUT 17 is often set to about 110% of the peak value when applying the entire impulse voltage wave to the EUT 17. Therefore, when cutting of the impulse voltage VIP fails and an impulse voltage full wave having a large peak value is applied to the EUT 17, there is a possibility that the EUT 17 may be damaged by applying excessive stress. In the first embodiment, this problem can be solved.

  Next, the operation of this impulse voltage cutting wave test apparatus will be described. FIG. 3 is a time chart showing a case where the discharge gap of the discharge switch 12 is discharged without delay in response to the first high-voltage pulse P1. It is assumed that charging capacitor 11 is charged to a predetermined voltage. First, when the start signal S1 which is a positive pulse is output from the start signal generator 1, the first high voltage pulse P1 is output from the high voltage pulse generator 2 after the circuit response time Tr1 has elapsed.

  In response to the first high-voltage pulse P1, the discharge gap of the discharge switch 12 of the impulse voltage generator 10 is immediately discharged, the discharge switch 12 becomes conductive, and a current flows from the charging capacitor 11 to the EUT 17. As a result, the impulse voltage VIP, which is the voltage between the output terminals T1 and T2, rapidly increases from 0 V toward the peak value.

  In addition, after the start signal S1 is output from the start signal generator 1, the first cut signal S2 that is a positive pulse is output from the cut signal generator 3 after the delay time Td of the cut signal generator 3 has elapsed. When the first cutting signal S2 is output from the cutting signal generator 3, the second high-voltage pulse P2 is output from the high-voltage pulse generator 5 after the circuit response time Tr2 has elapsed.

  In response to the second high-voltage pulse P2, the discharge gap of the discharge switch 16 of the cutting device 15 is discharged, the discharge switch 12 is turned on to cut the impulse voltage VIP, and the impulse voltage VIP is changed from a positive voltage close to the peak value to 0V. Suddenly drops. Thereby, the impulse voltage cutting wave is applied to the EUT 17.

  When the voltage at the output terminal 13a of the discharging resistor 13 exceeds a predetermined threshold voltage in accordance with the impulse voltage VIP, the cutting signal generator 4 outputs a second cutting signal S3 that is a positive pulse. . When the second cutting signal S3 is output, the third high voltage pulse P3 is output from the high voltage pulse generator 5 after the circuit response time Tr3 has elapsed. In the example of FIG. 3, when the third high-voltage pulse P3 is output, the cutting is already completed and the voltage VIP between the output terminals T1 and T2 is 0 V. Therefore, in response to the third high-voltage pulse P3, The discharge gap of the discharge switch 16 of the cutting device 15 is not discharged.

  Thus, when the discharge gap of the discharge switch 12 of the impulse voltage generator 10 discharges in a relatively short time in response to the first high-voltage pulse P1, the cutting device responds to the second high-voltage pulse P2. The 15 discharge switches 16 are turned on to cut the impulse voltage VIP, and the impulse voltage cutting wave is normally applied to the EUT 17.

  FIG. 4 is a time chart showing a case where the discharge gap of the discharge switch 12 is delayed and discharged in response to the first high-voltage pulse P1. It is assumed that charging capacitor 11 is charged to a predetermined voltage. First, when the start signal S1 which is a positive pulse is output from the start signal generator 1, the first high voltage pulse P1 is output from the high voltage pulse generator 2 after the circuit response time Tr1 has elapsed.

  In this example, as a result of delaying discharge of the discharge gap of the discharge switch 12, the first cutting signal S2 is output from the cutting signal generator 3 and the high voltage pulse generator 5 is output during the period when the impulse voltage VIP is still 0V. The second high voltage pulse P2 is output. Even when the second high-voltage pulse P2 is output, the impulse voltage VIP is 0 V, so that the discharge gap of the discharge switch 16 of the cutting device 15 is not discharged and the discharge switch 16 is not conducted.

  In the example of FIG. 4, the discharge gap of the discharge switch 12 of the impulse voltage generator 10 is discharged after a relatively long time TD has elapsed since the first high-voltage pulse P1 is output from the high-voltage pulse generator 2, and the discharge switch 12 Is conducted. When the discharge switch 12 is turned on, the impulse voltage VIP increases rapidly from 0V toward the peak value.

  As the impulse voltage VIP rises, the voltage at the output terminal 13a of the discharging resistor 13 rises and exceeds a predetermined threshold voltage, and then the second cutting signal which is a positive pulse from the cutting signal generator 4. S3 is output. When the second cutting signal S3 is output, the third high-voltage pulse P3 is output after the circuit response time Tr3 has elapsed. At this time, since the impulse voltage VIP is high, the discharge gap of the discharge switch 16 of the cutting device 15 is discharged in response to the third high-voltage pulse P3, and the discharge switch 16 becomes conductive. As a result, the impulse voltage VIP rapidly decreases from a high voltage to 0 V, and an impulse voltage cutting wave is applied to the EUT 17.

  In the first embodiment, the start signal S1 is delayed to generate the first cutting signal S2, and the second cutting signal S3 is generated in response to the impulse voltage VIP, and the first and second cutting signals are generated. The impulse voltage VIP is cut in response to one of the cutting signals S2 and S3. Therefore, even when the cutting of the impulse voltage VIP by the first cutting signal S2 fails, the impulse voltage VIP can be cut in response to the second cutting signal S3. Therefore, even when the output start time of the impulse voltage VIP varies, the impulse voltage cutting wave can be generated, and the impulse wave full wave having a high peak value is applied to the EUT 17 and the EUT 17 is damaged. Can be prevented.

[Embodiment 2]
FIG. 5 is a circuit block diagram showing a configuration of an impulse voltage cutting wave test apparatus according to Embodiment 2 of the present invention, and is a figure to be compared with FIG. Referring to FIG. 5, this impulse voltage cutting wave test apparatus is different from the impulse voltage cutting wave test apparatus of FIG. 1 in that cutting signal generator 4 is replaced with cutting signal generator 21.

  The cutting signal generator 21 sends a second cutting signal S3, which is a positive pulse, to the high voltage pulse generator 5 in response to the voltage at the output terminal 18a of the voltage divider 18 exceeding a predetermined threshold voltage. Output. Since other configurations and operations are the same as those in the first embodiment, description thereof will not be repeated. Also in this second embodiment, the same effect as in the first embodiment can be obtained.

[Embodiment 3]
6 is a circuit block diagram showing a configuration of an impulse voltage cutting wave test apparatus according to Embodiment 3 of the present invention, and is a figure to be compared with FIG. Referring to FIG. 6, the impulse voltage cutting wave test apparatus is different from the impulse voltage cutting wave test apparatus of FIG. 1 in that a current detector 22 is added and the cutting signal generator 4 is replaced by a cutting signal generator 23. It is a point that has been.

  The EUT 17 and the current detector 22 are connected in series between the output terminals T1 and T2. The current detector 22 detects a current that flows when the impulse voltage VIP is applied to the EUT 17 and outputs a signal indicating the detected value to the cutting signal generator 23. The cutting signal generator 23 sends a second cutting signal S3, which is a positive pulse, to the high voltage pulse generator 5 in response to the current value detected by the current detector 22 exceeding a predetermined threshold current. Output.

  Since other configurations and operations are the same as those in the first embodiment, description thereof will not be repeated. In the third embodiment, the same effect as in the first embodiment can be obtained.

[Embodiment 4]
FIG. 7 is a circuit block diagram showing a configuration of an impulse voltage cutting wave test apparatus according to Embodiment 4 of the present invention, and is a figure to be compared with FIG. Referring to FIG. 7, the impulse voltage cutting wave test apparatus is different from the impulse voltage cutting wave test apparatus of FIG. 1 in that a photodetector 24 is added and the cutting signal generator 4 is replaced with a cutting signal generator 25. It is a point that has been.

  The discharge gap of the discharge switch 12 of the impulse voltage generator 10 emits light during discharge. The photodetector 24 is disposed in the vicinity of the discharge gap of the discharge switch 12, detects whether the discharge gap emits light, and outputs a signal indicating the detection result to the cutting signal generator 25. The cutting signal generator 25 outputs a second cutting signal S3, which is a positive pulse, to the high-voltage pulse generator 5 in response to the signal indicating that the discharge gap emits light being output from the photodetector 24. .

  Since other configurations and operations are the same as those in the first embodiment, description thereof will not be repeated. In the fourth embodiment, the same effect as in the first embodiment can be obtained. In the fourth embodiment, the second cutting signal S3 is less susceptible to noise caused by the impulse voltage VIP, so that the cutting reliability is higher than that in the first embodiment.

[Embodiment 5]
In the first to fourth embodiments, depending on the impedance of the EUT 17, high-frequency vibration is generated in the impulse voltage cutting wave test device, and the high-frequency vibration voltage is superimposed on the impulse voltage VIP, so that the discharge switch 16 included in the cutting device 15 A problem that the voltage between the electrodes vibrates at a high frequency is assumed. The gap length (interelectrode distance) of the discharge switch 16 is set to an appropriate value according to the impulse voltage VIP when cutting. When the voltage between the electrodes of the discharge switch 16 vibrates, the relationship between the gap length of the discharge switch 16 and the impulse voltage VIP at the time of cutting is not optimal, and the reliability of cutting is reduced. In the fifth embodiment, this problem can be solved.

  FIG. 8 is a circuit block diagram showing a configuration of an impulse voltage cutting wave test apparatus according to the fifth embodiment of the present invention, and is a figure compared with FIG. Referring to FIG. 8, this impulse voltage cutting wave test apparatus is different from the impulse voltage cutting wave test apparatus of FIG. 1 in that cutting apparatus 15 is replaced with cutting apparatus 30. The cutting device 30 includes an impedance element 31 and a discharge switch 16 connected in series between the output terminals T1 and T2.

  The impedance element 31 is an element having a large impedance for a high-frequency oscillation voltage and a small impedance for a low-frequency voltage. The high frequency oscillating voltage superimposed on the impulse voltage VIP cannot pass through the impedance element 31, and only the low frequency component of the impulse voltage VIP passes through the impedance element 31 and is applied to the discharge switch 16. The impedance element 31 includes, for example, an inductor and a resistance element.

  Therefore, in the fifth embodiment, even when the high frequency oscillating voltage is superimposed on the impulse voltage VIP, the high frequency oscillating voltage is cut off by the impedance element 16, so that the high frequency oscillating voltage is applied between the electrodes of the discharge switch 16. Can be suppressed, and the reliability of cutting can be improved.

  In the fifth embodiment, the case where the cutting device 15 of the impulse voltage cutting wave test device of FIG. 1 is replaced with the cutting device 30 is described, but the present invention is not limited to this, and FIGS. It goes without saying that the cutting device 15 of the impulse voltage cutting wave test apparatus may be replaced with the cutting device 30.

  The embodiment disclosed this time should be considered as illustrative in all points and not restrictive. The scope of the present invention is defined by the terms of the claims, rather than the description above, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

  DESCRIPTION OF SYMBOLS 1 Start signal generator, 2, 5 High voltage pulse generator, 3, 4, 21, 23, 25 Cutting signal generator, 10 Impulse voltage generator, 11 Charging capacitor, 12, 16 Discharge switch, 13 Discharge resistor , 14 Braking resistor, 15, 30 Cutting device, T1, T2 output terminal, 17 Test equipment, 18 Voltage divider, 19, 20 Circuit element, 22 Current detector, 24 Photo detector, 31 Impedance element.

Claims (6)

An impulse voltage cutting wave test apparatus for applying an impulse voltage cutting wave to a test equipment,
An impulse voltage generator that outputs an impulse voltage in response to a start signal;
A first signal generator for outputting a first cutting signal obtained by delaying the start signal by a predetermined time;
A second signal generator for outputting a second cutting signal in response to the impulse voltage;
An impulse voltage cutting wave test comprising: a cutting device that cuts the impulse voltage when any one of the first and second cutting signals is output when the impulse voltage is output; apparatus. Comprising first and second output terminals for connecting the EUT;
The second output terminal receives a ground voltage;
The impulse voltage generator is
A capacitor charged to a predetermined voltage;
A first discharge switch that conducts in response to the start signal and flows current from the positive electrode of the capacitor to the first output terminal;
A resistor that adjusts the waveform of the impulse voltage by causing a part of the current flowing from the positive electrode of the capacitor to flow to the first output terminal to flow to the ground voltage line;
When the impulse voltage is applied between the first and second output terminals, the cutting device includes the first and second cutting signals from the first and second signal generators. The impulse voltage cutting wave testing device according to claim 1, further comprising a second discharge switch that conducts in response to any of the cutting signals being output. The resistor has a voltage divider, and the voltage divider divides and outputs a voltage between terminals of the resistor,
The impulse voltage cut according to claim 2, wherein the second signal generator outputs the second cut signal in response to an output voltage of the voltage divider exceeding a predetermined threshold voltage. Wave testing equipment. And a voltage divider for dividing and outputting a voltage between the first and second output terminals,
The impulse voltage cut according to claim 2, wherein the second signal generator outputs the second cut signal in response to an output voltage of the voltage divider exceeding a predetermined threshold voltage. Wave testing equipment. The first discharge switch has a discharge gap that emits light during discharge;
Furthermore, a photodetector for detecting whether or not the discharge gap emits light,
3. The impulse voltage cutting according to claim 2, wherein the second signal generator outputs the second cutting signal in response to detecting that the discharge gap emits light by the photodetector. 4. Wave testing equipment. The cutting device includes an impedance element connected in series between the first and second output terminals and the second discharge switch,
The impedance element has a large impedance with respect to a high-frequency oscillation voltage superimposed on the impulse voltage, has a small impedance with respect to a low-frequency component of the impulse voltage, and the high-frequency oscillation voltage is the second discharge switch. suppressing be applied between the electrodes, impulse voltage chopped wave test device according to claim 2 in any one of claims 5.

Images