JP2008103536A - Semiconductor package and manufacturing method thereof - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a semiconductor package, along with its manufacturing method, capable of reducing difference in thermal expansion from that of a semiconductor chip by using an inorganic core, for extended life of a semiconductor device. <P>SOLUTION: A semiconductor package 100 has a multilayer wiring structure consisting of a base wiring layer with a metal plate 14 processed and a build-up wiring layer 22 thereon, on both surfaces of an inorganic core 10. The base wiring layers on both surfaces are connected together by jointing machined projections 16 of the metal plate, on both surfaces, within a through hole 12 of the inorganic core or by jointing the metal plate on both surfaces and both ends of a separate metal pin penetrating the through hole of the inorganic core. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a semiconductor package capable of reducing the difference in thermal expansion from a semiconductor chip to be mounted and improving the life of a semiconductor device, and a method for manufacturing the same.

  At present, the mainstream of core materials used in CPU and MPU semiconductor packages, particularly plastic packages, is an organic core typified by a glass epoxy substrate in which an epoxy resin is impregnated into a glass cloth. A build-up wiring layer is formed on both or one side of the core by a subtractive method, an additive method, or a semi-additive method to form a semiconductor package having a multilayer wiring structure. In order to cope with higher speed and higher integration of semiconductor devices, the core is made thinner or has a coreless structure.

  Under such circumstances, generation of thermal stress is inevitable at the junction between the semiconductor chip and the semiconductor package to be mounted due to the difference in thermal expansion. Since this thermal stress further acts as stress (chip stress) from the bonded portion to the in-chip wiring layer (ILD), there is a possibility that not only the bonded portion but also the semiconductor chip itself may have a fatal effect on the life of the semiconductor device. .

  In particular, since it is inevitable that semiconductor chips become mechanically fragile with higher speed and higher integration, it is extremely important to reduce chip stress in order to improve the life of semiconductor devices.

  In order to reduce the thermal stress, it is necessary to reduce the difference in thermal expansion between the semiconductor chip and the semiconductor package. However, the thermal expansion coefficient of silicon, which is the main component of the semiconductor chip, is 3.4 ppm / ° C. Even if the expansion coefficient is low, it is about 10 ppm / ° C., and there is a limit to improvement as long as the glass epoxy core is used.

  Therefore, it is conceivable to use an inorganic core instead of an organic core such as a conventional glass epoxy substrate. In other words, by using the same silicon as the semiconductor chip material, or glass or ceramics having a thermal expansion coefficient equivalent to that of silicon as the inorganic core, the thermal expansion coefficient can be made closer to that of the semiconductor chip than the conventional organic core. it can.

  However, when such an inorganic core is used, bonding of the build-up layer to the resin and formation of surface wiring and through wiring have not been performed so far, and new technical development for that purpose has been required.

  Patent Document 1 proposes a method in which a metal wiring board is arranged on both surfaces of an organic core using a resin, and both the metal plates are locally joined through a through hole of the organic core to form a through wiring. Yes. However, since the organic core is still used, the difference in thermal expansion from the semiconductor chip cannot be reduced. In addition, when the inorganic core is used, the build-up layer is bonded to the resin, and surface wiring and through wiring are formed. There is no new suggestion that contributes to.

Japanese Patent Laid-Open No. 11-251705

  SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor package and a method for manufacturing the same that can reduce the difference in thermal expansion from a semiconductor chip by using an inorganic core and thereby improve the life of a semiconductor device.

  In order to achieve the above object, a semiconductor package according to a first aspect of the present invention includes a multilayer wiring structure including a base wiring layer processed with a metal plate and a build-up wiring layer formed thereon on both surfaces of an inorganic core. ) By joining the processed projections of the metal plates on both sides in the through hole of the inorganic core, or (2) both ends of separate metal pins penetrating the inside of the through hole of the inorganic core and the metal plates on both sides The above-described base wiring layers on both sides are connected to each other by bonding.

  In order to achieve the above object, the following methods A, B, and C are provided according to the second invention as a method of manufacturing the semiconductor package of the first invention.

<Method A>
A method for manufacturing a semiconductor package of a first invention, comprising:
A process of opening a through hole in an inorganic core,
Forming a base wiring layer by processing a metal plate into a planar pattern in the plate surface;
The inorganic core having the through hole is held between the two processed metal plates from both sides, and the metal plate on both sides is pressed at the position of the through hole of the inorganic core to form a processed projection. A step of forming and joining the base wiring layers on both sides to each other by crimping and / or welding the two processing projections in the through-hole and forming the joining state of (1) of the first invention,
A method for manufacturing a semiconductor package, comprising:

<Method B>
A method for manufacturing a semiconductor package of a first invention, comprising:
A process of opening a through hole in an inorganic core,
Forming a base wiring layer by processing the first metal plate into a planar pattern in the plate surface, and forming a male processing protrusion by pressing at a position corresponding to the through hole;
Forming a base wiring layer by processing the second metal plate into a planar pattern, and forming a female projection on the head by pressing at a position corresponding to the through hole;
The inorganic core having the through hole is held in a state in which the processed projections of the male and head female molds of the processed first and second metal plates are aligned with the through hole and sandwiched from both sides. , The step of crimping the processing projections of the male mold and the female head mold to form the joined state of (1) of the first invention,
A method for manufacturing a semiconductor package, comprising:

<Method C>
A method for manufacturing a semiconductor package of a first invention, comprising:
A process of opening a through hole in an inorganic core,
Forming a base wiring layer by processing a metal plate into a planar pattern in a plate surface including an opening at a position corresponding to the through hole;
The inorganic core having the through hole is held in a state in which the openings of the two processed metal plates are aligned with the through hole and sandwiched from both sides, and the metal pin is inserted into the through hole through the opening. And joining both ends of the metal pin and the opening of the two metal plates by press working or welding to obtain the joined state of (2) of the first invention,
A method for manufacturing a semiconductor package, comprising:

  In the semiconductor package of the first invention, by using an inorganic core having a low thermal expansion compared to the organic core, the difference in thermal expansion from the semiconductor chip can be greatly reduced as compared with the conventional semiconductor package using the organic core.

  In the method for manufacturing a semiconductor package of the second invention, the metal plate wiring layers on the upper and lower surfaces are electrically and mechanically strengthened in the through hole of the inorganic core by using press working and welding as necessary. The low thermal expansion of the inorganic core can be reflected in the entire semiconductor package.

  The semiconductor package of the present invention comprises (1) bonding of the processing protrusions of the metal plates on both sides in the through hole of the inorganic core, or (2) separate metal pins penetrating through the through hole of the inorganic core. Since the base wiring layers on both sides are connected to each other by bonding the both ends and the metal plates on both sides, the thermal expansion of the base wiring layers on both sides and the build-up wiring layer formed thereon is Constrained by thermal expansion and exhibiting thermal expansion close to that of the inorganic core as a whole semiconductor package, the thermal expansion difference from the mounted semiconductor chip can be significantly reduced.

  When the manufacturing method of the present invention uses press working, welding is also used as necessary, and by joining the metal plate wiring layers on the upper and lower surfaces within the through-holes of the inorganic core, it is possible to ensure good electrical bonding. At the same time, joints with high strength and rigidity can be formed mechanically, so that the thermal expansion of the build-up wiring layer on the inorganic core is effectively constrained by the inorganic core, and the thermal expansion difference from the semiconductor chip as a whole semiconductor package Can be significantly reduced, and the lifetime of the semiconductor device can be improved.

  The inorganic core used in the present invention can typically be selected from the following materials.

<Example of the material of the inorganic core of the present invention>
[Material] [Coefficient of thermal expansion (CTE)]
Silicon 3.4ppm / ° C (same as silicon of semiconductor chip)
Glass 4-6ppm / ° C
Ceramics Alumina 5-7ppm / ° C
Aluminum nitride 4.5ppm / ℃
Barium titanate 6ppm / ° C
Titanium oxide 7ppm / ℃
The above is a typical example, and any inorganic material having a thermal expansion coefficient close to that of silicon of a semiconductor chip may be used.

[Example 1]
With reference to FIG. 1, an example of a process for manufacturing a semiconductor package according to a desirable embodiment of the method A of the present invention will be described.

  In the step (1A), the inorganic core 10 made of the material described above is typically prepared.

  In the step (2A), a predetermined through-hole 12 is opened in the inorganic core 10 by a drill, laser, reactive ion etching RIE, Bosch process or the like.

  In parallel, in the step (1B), the lead frame 14 is prepared as a metal plate for forming the base wiring layer. The material of the lead frame 14 is not particularly limited, and may be a conventionally used Cu, Ni—Fe alloy, or the like.

  In the step (2B), the lead frame 14 is patterned by stamping or etching to form a base wiring layer.

  Next, in the step (3), the inorganic core 10 having the through-holes 12 is held by being sandwiched from above and below by two patterned lead frames 14.

  In the step (4), in the above state, the lead frame 14 is stamped by the punch P (shown in the drawing of the step (3)) at the position of the through hole 12 of the inorganic core 10, and the upper and lower leads are formed in the through hole 12. The processed projections 16 of the frame 14 are caulked and joined (or welded).

  Through the steps so far, the base wiring layers composed of the lead frames 14 are formed on both surfaces of the inorganic core 10, and the base wiring layers 14 on both surfaces are electrically connected to each other by bonding of the processing protrusions 16 in the through holes 12 of the inorganic core 10. And a mechanically and mechanically connected structure is obtained.

  Hereinafter, formation of the insulating layer 18 (step (5)), opening of the via hole 20 (step (6)), and formation of the wiring layer 22 (step (7) by the build-up process shown in steps (5) to (7). )) Is repeated as many times as necessary to form a predetermined multilayer wiring layer, and then the solder resist layer 24 is formed in step (8) to complete the semiconductor package 100.

  The semiconductor chip 200 is mounted on the semiconductor package 100 as indicated by the phantom line in the drawing of the step (8). This is performed by bonding the electrode terminal 202 of the semiconductor chip 200 to the semiconductor package 100 and filling the underfill 204.

  FIG. 2 shows a semiconductor device 300 in which the semiconductor chip 200 is mounted on the semiconductor package 100. An example of typical dimensions and dimension ranges of each part in the figure is as follows.

Inorganic core 10: thickness 200 μm (5 μm to 5 mm)
Lead frame 14: thickness 50 μm (3 μm to 300 μm)
Insulating layer 18: thickness 20 μm (3 μm to 300 μm)
Solder resist layer 24: thickness 15 μm (5 μm to 50 μm)
Through-hole diameter T: 300 μm (10 μm to 5 mm)
Semiconductor package size X: 50 mm (1 mm to 200 mm)
Semiconductor chip size Y: 25 mm (1 mm to 150 mm)
Since the semiconductor package 100 is in a state in which the thermal expansion is constrained by the inorganic core 10 as a whole, it exhibits a thermal expansion coefficient equivalent to that of the inorganic core 10, and thus has a thermal expansion coefficient close to that of the mounted semiconductor chip 200. That is, since the thermal stress caused by the difference in thermal expansion between the semiconductor package 100 and the semiconductor chip 200 can be significantly reduced, it is possible to effectively prevent the damage due to the stress load on the joint portion between them and the wiring in the chip. And the lifetime of the semiconductor device can be significantly improved.

  Since the completed semiconductor package 100 is held on the lead frame 14, it can be conveyed and processed by a reel-to-reel together with the lead frame. Of course, by separating the semiconductor package 100 from the reel and arranging it on the resin substrate, it is possible to convey and process the large-sized sheet used in the plastic substrate process. Therefore, the secondary effect that the process can be speeded up, divided into labor, and cost can be reduced is also obtained.

[Example 2]
With reference to FIG. 3, an example of a process for manufacturing a semiconductor package according to a desirable embodiment of the method B of the present invention will be described.

  In the step (1A), the inorganic core 10 made of the material described above is typically prepared.

  In the step (2A), a predetermined through-hole 12 is opened in the inorganic core 10 by a drill, laser, reactive ion etching RIE, Bosch process or the like.

  In parallel, in the step (1B), the lead frame 14 is prepared as a metal plate for forming the base wiring layer. The material of the lead frame 14 is not particularly limited, and may be a conventionally used Cu, Ni—Fe alloy, or the like.

  In step (2B), the lead frame 14X is patterned by stamping or etching to form a base wiring layer, and a male processing protrusion 26X is formed by pressing at a position corresponding to the through hole 12 of the inorganic core 10. Similarly, the lead frame 14Y is patterned by stamping or etching to form a base wiring layer, and at the position corresponding to the through hole 12 of the inorganic core 10, a processing protrusion 26Y having a female head is formed by pressing. (See figure in step (3)).

  Next, in the step (3), the inorganic core 10 having the through hole 12 is aligned with the through hole 12 by aligning the male processing protrusion 26X of the lead frames 14X and 14Y and the female processing protrusion 26Y of the head. Hold between the top and bottom surfaces.

  Then, in the step (4), the male processing projections 26X and the head female processing projections 26Y are fitted to each other by press working and crimped.

  Through the steps so far, the base wiring layers composed of the lead frames 14X and 14Y are formed on both surfaces of the inorganic core 10, respectively. The base wiring layers 14X and 14Y on both surfaces are formed into the processing protrusions 26X in the through holes 12 of the inorganic core 10. And 26Y are joined together electrically and mechanically.

  Thereafter, the formation of the insulating layer 18, the via 20, and the wiring layer 22 is repeated as many times as necessary by a build-up process similar to the steps (5) to (7) of the first embodiment shown in FIG. After forming the layer, the solder resist layer 24 is formed to complete the semiconductor package 110.

  The semiconductor package 110 manufactured in this example has the same structure as the semiconductor package 100 of Example 1 except that the bonding form in the through hole 12 is different.

Example 3
With reference to FIG. 4, an example of a process for manufacturing a semiconductor package according to a desirable embodiment of the method B of the present invention will be described.

  In the step (1A), typically, the inorganic core material 10 having the above-described material is prepared.

  In the step (2A), a predetermined through-hole 12 is opened in the inorganic core 10 by a drill, laser, reactive ion etching RIE, Bosch process or the like.

  In parallel, in the step (1B), the lead frame 14 is prepared as a metal plate for forming the base wiring layer. The material of the lead frame 14 is not particularly limited, and may be a conventionally used Cu, Ni—Fe alloy, or the like.

  In the step (2B), the lead frame 14 is patterned by stamping or etching to form a base wiring layer having a planar pattern including the opening 28 at a position corresponding to the through hole 12 of the inorganic core 10.

  Next, in the step (3), the inorganic core 10 having the through holes 12 is held in a state where the openings 28 of the two processed lead frames 14 are aligned with the through holes 12 and sandwiched from both sides. At that time, a metal pin 30 for bonding is disposed at the position of the through hole 12.

  In step (4), the metal pins 30 are inserted into the through holes 12 through the openings 28, and both ends of the metal pins 30 and the openings of the two lead frames 14 are formed by pressing (crushing the heads of the pins 30) or welding. 28 is joined.

  Through the steps so far, the base wiring layers 14 on both sides are electrically connected to each other by joining the both ends of separate metal pins 30 penetrating through the through holes 12 of the inorganic core 10 and the lead frames 14 on both sides of the inorganic core 10. A mechanically connected structure is obtained.

  Thereafter, the formation of the insulating layer 18, the via 20, and the wiring layer 22 is repeated as many times as necessary by a build-up process similar to the steps (5) to (7) of the first embodiment shown in FIG. After forming the layers, the solder resist layer 24 is formed to complete the semiconductor package 120.

  The semiconductor package 120 manufactured in this example has the same structure as the semiconductor package 100 of Example 1 except that the bonding configuration of the base wiring layers 14 via the through holes 12 is different.

  In the above embodiment, the base wiring layer 14 is formed by the lead frame. However, the base wiring layer 14 is not limited to the lead frame, and any metal plate or metal foil suitable for forming the base wiring layer 14 may be used.

  ADVANTAGE OF THE INVENTION According to this invention, the semiconductor package which reduces the thermal expansion difference with a semiconductor chip and enables the lifetime improvement of a semiconductor device by using an inorganic core, and its manufacturing method are provided.

Sectional drawing which shows an example of the process of manufacturing the semiconductor package of this invention using an inorganic core by desirable embodiment of the method A of this invention. Sectional drawing which shows the state which mounted the semiconductor chip in the semiconductor package manufactured by the manufacturing process of FIG. Sectional drawing which shows an example of the process of manufacturing the semiconductor package of this invention using an inorganic core by desirable embodiment of the method B of this invention. Sectional drawing which shows an example of the process of manufacturing the semiconductor package of this invention using an inorganic core by desirable embodiment of the method C of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Inorganic core 12 Through-hole 14, 14X, 14Y Lead frame 16 Process protrusion 18 Insulating layer 20 Via (via hole)
DESCRIPTION OF SYMBOLS 22 Wiring layer 24 Solder-resist layer 26X Male process protrusion 26Y Female head process protrusion 28 Opening 30 Metal pin 100,110,120 Semiconductor package 200 Semiconductor chip 202 Electrode terminal 204 Underfill 300 Semiconductor device

Claims (6)

  A multilayer wiring structure comprising a base wiring layer obtained by processing a metal plate and a build-up wiring layer thereon is provided on both surfaces of the inorganic core, and (1) the base wiring layers on both surfaces in the through-hole of the inorganic core. The two-sided base wiring layers are connected to each other by joining the processing protrusions or (2) joining both ends of a separate metal pin penetrating through the through-hole of the inorganic core and the two-sided base wiring layers. A semiconductor package characterized by that.   2. The semiconductor package according to claim 1, wherein the inorganic core is made of an inorganic material selected from silicon, ceramics, and glass.   3. The semiconductor package according to claim 1, wherein the metal plate is a lead frame. A method for manufacturing a semiconductor package according to any one of claims 1 to 3,
A process of opening a through hole in an inorganic core,
Forming a base wiring layer by processing a metal plate into a planar pattern in the plate surface;
The inorganic core having the through hole is held between the two processed metal plates from both sides, and the metal plate on both sides is pressed at the position of the through hole of the inorganic core to form a processed projection. Forming and joining the base wiring layers on both sides by caulking and / or welding the two processing projections in the through-hole,
A method for manufacturing a semiconductor package, comprising: A method for manufacturing a semiconductor package according to any one of claims 1 to 3,
A process of opening a through hole in an inorganic core,
Forming a base wiring layer by processing the first metal plate into a planar pattern in the plate surface, and forming a male processing projection by pressing at a position corresponding to the through hole;
Forming a base wiring layer by processing the second metal plate into a planar pattern in the plate surface, and forming a female projection on the head by pressing at a position corresponding to the through hole;
The inorganic core having the through hole is held in a state in which the processed projections of the male and head female molds of the processed first and second metal plates are aligned with the through hole and sandwiched from both sides. , The step of caulking and joining the projections of the male and head female molds by pressing,
A method for manufacturing a semiconductor package, comprising: A method for manufacturing a semiconductor package according to any one of claims 1 to 3,
A process of opening a through hole in an inorganic core,
Forming a base wiring layer by processing a metal plate into a planar pattern in a plate surface including an opening at a position corresponding to the through hole;
The inorganic core having the through hole is held in a state in which the openings of the two processed metal plates are aligned with the through hole and sandwiched from both sides, and the metal pin is inserted into the through hole through the opening. And joining both ends of the metal pin and the opening of the two metal plates by press working or welding,
A method for manufacturing a semiconductor package, comprising:

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