GB2198920B - Apparatus for x-ray studies of crystalline matter - Google Patents

Apparatus for x-ray studies of crystalline matter

Info

Publication number
GB2198920B
GB2198920B GB8630323A GB8630323A GB2198920B GB 2198920 B GB2198920 B GB 2198920B GB 8630323 A GB8630323 A GB 8630323A GB 8630323 A GB8630323 A GB 8630323A GB 2198920 B GB2198920 B GB 2198920B
Authority
GB
United Kingdom
Prior art keywords
ray studies
crystalline matter
crystalline
matter
studies
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB8630323A
Other versions
GB2198920A (en
GB8630323D0 (en
Inventor
Leonid Alexandrovich Aslanov
Gennady Vladimirovich Fetisov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MOSKOVSK, University of
Moskovsky Gosudarstvenny Universitet Imeni M V Lomonosova
Original Assignee
MOSKOVSK, University of
Moskovsky Gosudarstvenny Universitet Imeni M V Lomonosova
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MOSKOVSK, University of, Moskovsky Gosudarstvenny Universitet Imeni M V Lomonosova filed Critical MOSKOVSK, University of
Priority to GB8630323A priority Critical patent/GB2198920B/en
Priority to DE19863643551 priority patent/DE3643551A1/en
Priority to FR8618293A priority patent/FR2609173B1/en
Priority to NL8700048A priority patent/NL8700048A/en
Publication of GB8630323D0 publication Critical patent/GB8630323D0/en
Publication of GB2198920A publication Critical patent/GB2198920A/en
Application granted granted Critical
Publication of GB2198920B publication Critical patent/GB2198920B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB8630323A 1986-12-18 1986-12-18 Apparatus for x-ray studies of crystalline matter Expired - Fee Related GB2198920B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB8630323A GB2198920B (en) 1986-12-18 1986-12-18 Apparatus for x-ray studies of crystalline matter
DE19863643551 DE3643551A1 (en) 1986-12-18 1986-12-19 DEVICE FOR THE X-RAY GENOGRAPHICAL EXAMINATION OF CRYSTALLINE SUBSTANCES
FR8618293A FR2609173B1 (en) 1986-12-18 1986-12-29 DEVICE FOR RADIOGRAPHIC STUDY OF CRYSTALLINE SUBSTANCES
NL8700048A NL8700048A (en) 1986-12-18 1987-01-12 Apparatus for studying crystalline matter with roentgen rays.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8630323A GB2198920B (en) 1986-12-18 1986-12-18 Apparatus for x-ray studies of crystalline matter

Publications (3)

Publication Number Publication Date
GB8630323D0 GB8630323D0 (en) 1987-01-28
GB2198920A GB2198920A (en) 1988-06-22
GB2198920B true GB2198920B (en) 1990-11-14

Family

ID=10609255

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8630323A Expired - Fee Related GB2198920B (en) 1986-12-18 1986-12-18 Apparatus for x-ray studies of crystalline matter

Country Status (4)

Country Link
DE (1) DE3643551A1 (en)
FR (1) FR2609173B1 (en)
GB (1) GB2198920B (en)
NL (1) NL8700048A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITMI20020097A1 (en) * 2002-01-21 2003-07-21 Consorzio Pisa Ricerche DIFFRACTOMETER AND METHOD FOR PERFORMING DIFFRACTOMETRIC ANALYSIS

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1450333A (en) * 1973-02-20 1976-09-22 Technion Research Dev Foundati X-ray spectrodiffractometer low foam iodophor low foam iodophor
US4015125A (en) * 1975-02-28 1977-03-29 Canadian Patents And Development Limited Resolving cone-axis camera
GB2017470A (en) * 1978-03-21 1979-10-03 Philips Nv X-ray spectrometer
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2615136A (en) * 1950-08-03 1952-10-21 Philips Lab Inc X-ray single crystal goniometer
NL139600B (en) * 1968-12-10 1973-08-15 Enraf Nonius GONIOMETRIC DEVICE, ESPECIALLY FOR A DIFFRACTOMETER.
SU1040390A1 (en) * 1982-03-16 1983-09-07 Московский Ордена Ленина,Ордена Октябрьской Революции И Ордена Трудового Красного Знамени Государственный Университет Им.М.В.Ломоносова Monocrystal radiographic investigation method
FR2566533B1 (en) * 1984-06-22 1986-09-26 Centre Nat Rech Scient GONIOMETRIC DEVICE FOR X-RAY OR NEUTRON DIFFRACTOMETRY ON SINGLE CRYSTALS

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1450333A (en) * 1973-02-20 1976-09-22 Technion Research Dev Foundati X-ray spectrodiffractometer low foam iodophor low foam iodophor
US4015125A (en) * 1975-02-28 1977-03-29 Canadian Patents And Development Limited Resolving cone-axis camera
GB2017470A (en) * 1978-03-21 1979-10-03 Philips Nv X-ray spectrometer
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer

Also Published As

Publication number Publication date
DE3643551A1 (en) 1988-07-07
FR2609173A1 (en) 1988-07-01
NL8700048A (en) 1988-08-01
GB2198920A (en) 1988-06-22
GB8630323D0 (en) 1987-01-28
FR2609173B1 (en) 1989-12-15

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19921218